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CLASS 702, | DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING |
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SECTION I - CLASS DEFINITION
This class provides for apparatus and corresponding methods wherein the data processing system or calculating computer is designed for or utilized in an environment relating to a specific or generic measurement system, a calibration or correction system, or a testing system.
This class is structured into four main parts:
1. Data processing for a measurement system in a specific environment.
2. Data processing for a calibration or correction system.
3. Data processing for a testing system.
4. Data processing for a generic measurement system.
See Subclass References to the Current Class for these specific subclasses.
Scope of the class:
A. MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT
This class is limited to data processing and calculating computer apparatus and corresponding methods for measuring in a specific environment. There must be significant claim recitation of the data processing system, process or calculating computer and nominal recitation of the specific environment. When significant structure of the device or process pertinent to the specific environment is claimed, classification is in the appropriate device or process class. Control system for specific application adapted for a sole purpose of measuring is classified in this class. This class does not includes data processing in combination with a specific application control system for controlling a device or apparatus (see References To Other Classes below for a generic or specific electrical computers and data processing control systems).
B. CALIBRATION OR CORRECTION SYSTEM
This class includes subject matter directed to data processing for calibration or correction system disclosed or claimed in plural art devices such as geometrical instrument, mechanical system, timing apparatus, fluid flow or fluid measurement, etc. (see References To Other Classes below).
C. TESTING SYSTEM
This class includes subject matter directed to data processing for testing system disclosed in plural art devices such as electrical circuit and components testing, sensing apparatus testing, signal converting, shaping or generating (see References To Other Classes below).
This outdent excludes a mere monitoring system for determining performance of a device or process under normal operation without subjecting the device or process to a specific testing procedure or signal.
D. GENERIC MEASUREMENT SYSTEM
This class is limited to data processing and calculating computer apparatus and corresponding methods for measuring that are not strictly adapted to one particular environment. Such apparatus and corresponding methods for measuring could extend to several different applications. There must be significant claim recitation of the data processing system, process or calculating computer. A generic control system adapted for a sole purpose of measuring is classified in this class. This class does not includes data processing in combination with a generic control system for controlling a device or apparatus (see References To Other Classes below for a generic or specific electrical computers and data processing control systems).
SECTION II - SUBCLASS REFERENCES TO THE CURRENT CLASS
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 1, | through 84, for data processing for a measurement system in a specific environment. |
| 85, | through 107, for a calibration or correction system. |
| 108, | through 126, for data processing for a testing system. |
| 127, | through 199, for data processing for a generic measurement system. |
SECTION III - REFERENCES TO OTHER CLASSES
SEE OR SEARCH CLASS:
| 29, | Metal Working, subclass 25.35 for the electrical measuring, testing or sensing of piezoelectric crystals combined with the manufacture thereof, and subclasses 25.41+ for the electrical measuring, testing or sensing of condensers combined with the manufacture thereof. |
| 33, | Geometrical Instruments, appropriate subclasses for geometrical instrument or calibration/correction thereof, subclasses 300+ for magnetic field direction sensing and indicating, and subclasses 700+ for the determination of distance. |
| 73, | Measuring and Testing, appropriate subclasses for nonelectrical measuring and testing, instrument calibrating, and for electrical measuring and testing of the following types: gas analysis by electrical thermal determination, subclasses 23.2+ ; moisture determination by conductivity, subclass 75; stress and strain gauge, subclass 760; surface and cutting edge determination by sliding pick-up subclasses 104+; subclasses 112.01 - 112.06 for turbine engine testing, 114.01 - 116.81 for internal combustion engine measuring and testing; liquid level gauge(immersible electrode type, subclass 304, float type, subclasses 305+); fluid pressure (e.g., Pirani type), subclass 755; and speed, subclasses 488+. |
| 100, | Presses, subclass 99 for presses having electrical measuring, testing, or sensing means. |
| 166, | Wells, appropriate subclasses for well processes or apparatus including measuring or testing means. |
| 177, | Weighing Scales, appropriate subclasses, particularly subclasses 25.11+ for weighing apparatus in combination with computer means. |
| 178, | Telegraphy, appropriate subclasses, particularly subclass 69 for telegraphy combined with electrical measuring, testing, or sensing. |
| 181, | Acoustics, appropriate subclasses for sound wave measurement. |
| 198, | Conveyors, subclasses 502.1+ for conveyor combined with alarm or indicator. |
| 205, | Electrolysis: Processes, Compositions Used Therein, and Methods of Preparing the Compositions, appropriate subclasses for electrolysis utilized for electrochemistry and especially subclasses 775+ as the residual home for a process of electrolytic analysis or testing, per se. |
| 209, | Classifying, Separating, and Assorting Solids, appropriate subclasses. |
| 250, | Radiant Energy, subclass 250 for wave meters for measuring the wavelength of radio or microwaves, subclass 281 for methods and apparatus for ionic separation or analysis, subclasses 302+ for fluorescent and radioactive tracer methods, subclasses 336.1+ for the detection of invisible radiation or the examination of material by invisible radiation using radiant energy responsive electric signalling means, subclasses 428+ for fluent material containing, support, or transfer means with or without an irradiating source or radiating fluent material, subclasses 453.11+ for supports for objects of irradiation, subclasses 458.1+ for luminophor irradiation, subclasses 472.1+ for nonelectric invisible radiation detectors, and subclasses 493.1+ for radiant energy generation and sources. |
| 314, | Electric Lamp and Discharge Devices: Consumable Electrodes, appropriate subclasses, particularly subclass 9 for the subject matter of that class combined with measuring, testing, or sensing. |
| 320, | Electricity: Battery or Capacitor Charging and Discharging, subclass 48 for battery charging and discharging systems having indicating, signaling, or testing means. |
| 324, | Electricity: Measuring and Testing, appropriate subclasses for testing to determine electrical properties by electrical means, or for determination of non-electrical properties by measuring electric properties, or for the measurement of electricity, per se, particularly subclasses 74+ for calibration of electric meters, subclass 130 for self-calibration, subclasses 200+ for magnetic measuring and testing, subclasses 500+ for fault testing in electrical circuits and components, and subclass 601 for calibration of impedance, admittance, or other quantities representative of electrical stimulus/response relationships. |
| 327, | Miscellaneous Active Electrical Nonlinear Devices, Circuits, and Systems, appropriate subclasses, particularly subclasses 100+ for signal converting, shaping, or generating, and subclasses 291+ for clock or pulse waveform generating. |
| 330, | Amplifiers, appropriate subclasses, for amplifiers, generally, which may be used in electrical measuring and testing circuits, particularly subclass 2 for amplifier condition testing or measuring. |
| 331, | Oscillators, subclass 44 for oscillator systems provided with frequency calibrating or testing means. |
| 340, | Communications: Electrical, appropriate subclasses for testing associated with a communication system. |
| 342, | Communications: Directive Radio Wave Systems and Devices (e.g., Radar, Radio Navigation), appropriate subclasses for reflected or otherwise returned radio wave energy measuring, testing, and sensing systems, such as radar and transponder systems. |
| 348, | Television, subclasses 180+ for monitoring, testing, or measuring television signals or apparatus. |
| 356, | Optics: Measuring and Testing, for measuring and testing light. |
| 368, | Horology: Time Measuring Systems or Devices, subclasses 155+ for time measuring by clocks having electrical features. |
| 374, | Thermal Measuring and Testing, appropriate subclasses for a measurement or test of a thermal quantity. |
| 376, | Induced Nuclear Reactions: Processes, Systems, and Elements, subclasses 245+ for processes or device for testing, measuring, etc., of a condition of a nuclear reactor during its operation. |
| 378, | X-Ray or Gamma Ray System or Devices, appropriate subclasses, particularly subclasses 44+ , 51+, or 70+ for X-ray systems used in testing. |
| 379, | Telephonic Communications, appropriate subclasses, particularly subclasses 1.01 through 35for telephone combined with electrical measuring, testing, or sensing. |
| 429, | Chemistry: Electrical Current Producing Apparatus, Product and Process, subclasses 90+ for battery having measuring, testing, and indicating means. |
| 434, | Education and Demonstration, appropriate subclasses, for electrical measuring, testing, or sensing in combination with education. |
| 455, | Telecommunication, appropriate subclasses for radio systems having electrical measuring, testing, or sensing means for indicating the operative condition of the radio system. |
| 505, | Superconductor Technology: Apparatus, Material, Process, subclasses 160+ for measuring or testing a system or device, and subclass 310 for a process of measuring or testing a superconductive property. |
| 506, | Combinatorial Chemistry Technology: Method, Library, Apparatus, for in silico screening of a chemical or biological library. |
| 700, | Data Processing: Generic Control Systems or Specific Applications, subclasses 1 through 89for a data processing generic control system, apparatus, or process; and subclasses 90-306 for a data processing specific application, apparatus, or process. |
| 714, | Error Detection/Correction and Fault Detection/Recovery, appropriate subclasses for error detection, correction, recovery or prevention in pulse code data or computers. |
SECTION IV - GLOSSARY
CALCULATING OPERATIONS
Arithmetic or some limited logic operations performed upon or with signals representing numbers or values.
DATA PROCESSING
For the purpose of this class, data processing is defined as a systematic operation on data in accordance with a set of rules which results in a significant change in the data.
SUBCLASSES
1 | MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT | ||||||||||||||||||||
| This subclass is indented under the class definition. Subject matter wherein the data processing system or calculating
computer includes a measurement system or process designed for or utilized
in a particular art device or application.
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2 | Earth science: | ||||||
| This subclass is indented under subclass 1. Subject matter wherein the measurement system or process
is designed for or utilized in an area directed to the earth or
its related sciences.
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3 | Weather: | ||||
This subclass is indented under subclass 2. Subject matter including the study of an atmospheric phenomenon
of a region (e.g., rain, storm, snow, wind, etc.).
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4 | Lightning: | ||||
| This subclass is indented under subclass 3. Subject matter wherein the atmospheric phenomenon is the
flashing of light produced by electricity discharged in the air.
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5 | Topography (e.g., land mapping): | ||
| This subclass is indented under subclass 2. Subject matter wherein the related sciences including the
study of set of data related to natural or man-made features of
an area (e.g., gravity data, terrain data, sea floor, etc.) to present,
usually on maps or charts, their relative positions and elevations.
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6 | Well logging or borehole study: | ||||||||||||||||
| This subclass is indented under subclass 2. Subject matter including a drill rigging apparatus or measuring
tool for penetrating an earth formation to form a well bore or for
investigating physical condition or a parameter related to the apparatus,
the tool, the well bore or the earth formation.
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7 | By induction or resistivity logging tool: | ||
| This subclass is indented under subclass 6. Subject matter comprising means having transmitter and receiver
coils or electrodes arranged for taking measurements, at various
depth of the borehole, representing electrical characteristic of
the earth formations or planar layers surrounding the borehole
(e.g., conductivity, resistivity, dielectric constant).
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8 | By radiation (e.g., nuclear, gamma, X-ray): | ||||||||||||||
| This subclass is indented under subclass 6. Subject matter comprising (a) means for irradiating the
earth formation with rays containing radiation particles (i.e.,
alpha, beta, gamma, neutrons, photon, etc.) such as those in nuclear, gamma,
X-ray, etc. and (b) means for detecting and processing resultant
signals for logging measurements.
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9 | Drilling: | ||||||||
This subclass is indented under subclass 6. Subject matter including borehole equipment having a movable
tool for penetrating through the subterranean formations of the
earth to make a long cylindrical hollow to obtain particular parameters
of interest.
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10 | Dipmeter: | ||
| This subclass is indented under subclass 6. Subject matter comprising means for determining a dip angle
or dip direction of subsurface formations intercepted by a well
borehole.
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11 | Formation characteristic: | ||||||||
| This subclass is indented under subclass 6. Subject matter comprising detail of means for determining
physical properties (temperature, pressure, fracture, etc.) related
to the earth formations.
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12 | Fluid flow investigation: | ||||||||||||||||
| This subclass is indented under subclass 11. Subject matter comprising means for evaluating fluid flow
controlling parameters or properties (e.g., porosity, permeability,
etc.) related to the nature and movement of a flowing fluid in the
well bore or from a potential producing zone in the earth formations.
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13 | Hydrocarbon prospecting: |
| This subclass is indented under subclass 12. Subject matter wherein means for evaluating includes means for determining the location or volume of an accumulation of hydrocarbon deposits within the potential producing zone. | |
14 | Seismology: | ||||||||||
| This subclass is indented under subclass 2. Subject matter comprising means for detecting and recording
a seismic reflected or refracted signal representative of earth
vibrations.
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15 | Earthquake or volcanic activity: | ||
| This subclass is indented under subclass 14. Subject matter including a seismic strong-motion recording
means for monitoring or exploring shaking of the earth or a volcanic phenomenon.
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16 | Specific display (e.g., mapping, profiling): | ||||||||
| This subclass is indented under subclass 14. Subject matter including (a) means for carrying out a series
of steps in a sequence (e.g., mapping, profiling, etc.) to generate
a visual presentation of data or (b) structural details of means
for displaying data.
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17 | Filtering or noise reduction/removal: | ||||||||
| This subclass is indented under subclass 14. Subject matter comprising means for removing certain frequency
components of the seismic signal or means for lessening or eliminating disturbance
in the seismic signal.
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18 | Velocity of seismic wave: |
| This subclass is indented under subclass 14. Subject matter comprising means for measuring seismic wave parameter over time to compute speed of propagation of seismic wave. | |
19 | Biological or biochemical: | ||||||||||
| This subclass is indented under subclass 1. Subject matter wherein the data processing system or calculating
computer is designed for or utilized in a measurement system directed
to an environment of life or chemical compound or process in a living
system.
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20 | Gene sequence determination: | ||
| This subclass is indented under subclass 19. Subject matter including a chemical process which determines
genetic information including the chains of a set of sequencing
fragments (e.g., DNA sequence information) used to define identity
of biological species.
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21 | Cell count or shape or size analysis (e.g., blood cell): | ||
| This subclass is indented under subclass 19. Subject matter comprising a measuring means for determining
quantity, geometric, or proportional dimensions of a particular
biological particle.
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22 | Chemical analysis: | ||||||||||||||||
| This subclass is indented under subclass 1. Subject matter including means for analyzing a sample through
study of its chemical aspect.
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23 | Quantitative determination (e.g., mass, concentration, density): |
| This subclass is indented under subclass 22. Subject matter comprising means to determine an amount or proportion of a component in the sample. | |
24 | Gaseous mixture (e.g., solid-gas, gas-liquid, gas-gas): | ||||
This subclass is indented under subclass 23. Subject matter wherein the component is a constituent in
a solid-gas, gas-liquid, or gas-gas mixture.
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25 | Liquid mixture (e.g., solid-liquid, liquid-liquid): | ||||
This subclass is indented under subclass 23. Subject matter wherein the component is a constituent that
a solid-liquid or a liquid-liquid mixture.
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26 | By particle count: | ||
| This subclass is indented under subclass 23. Subject matter wherein the amount or proportion of the component
is determined by totalizing quantity of particles in the component.
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27 | Molecular structure or composition determination: |
| This subclass is indented under subclass 22. Subject matter comprising means to determine structure of a sample on the molecular level or means to identify different components making up an unknown sample. | |
28 | Using radiant energy: | ||||||||||||
| This subclass is indented under subclass 27. Subject matter comprising a radiation source (e.g., X-ray,
infrared light source, spectrophotometer) for irradiating the sample
with a beam to determine its structure or composition.
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29 | Particle size determination: | ||
| This subclass is indented under subclass 22. Subject matter wherein means for analyzing the sample includes
means for generating signals having amplitude proportional to the
size of respective particles of the sample.
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30 | Chemical |