CPC Definition - Subclass G01R
This place covers:
Measuring electric variables or properties.
Measuring electric variables directly, e.g. electromechanical instruments (see Glossary of terms) where the measured electric variables directly effect the indication of the measured value.
Measuring electric variables by derivation from other electric variables, i.e. arrangements (see Glossary of terms) involving circuitry to obtain an indication of a measured value by deriving, calculating or otherwise processing electric variables, e.g. by comparison with another value.
Measuring or investigating electric properties of materials.
Electric testing of analogue or digital electric devices, apparatus or networks, or measuring their characteristics.
Indicating presence or sign of current or voltage.
The following technical subjects are therefore covered, the list being non-exhaustive:
Measuring time integral of electric power or current (i.e. Energy), e.g. Of consumption
Displaying electric variables or waveforms
Measuring currents or voltages or for indicating presence or sign thereof
Measuring electric power or power factor
Measuring time integral of electric power or current, e.g. By electronic methods
Measuring frequencies (of electric signals); measuring and analysing frequency spectra (of electric signals)
Measuring phase angle between a voltage and a current or between voltages or currents
Measuring resistance, reactance, impedance, or electric characteristics derived therefrom
Testing electric properties of apparatus, e.g. Discharge tubes, amplifiers, transistors, integrated circuits
Locating electric faults
Electrical testing characterised by what is being tested not provided for elsewhere
Testing for digital signal parameters (delay, skew, signal level) and characterization of device performance by use of test patterns; test apparatus or integrated test circuits therefor; methods for test pattern generation
Details, testing or calibrating of G01R related instruments or arrangements
Measuring magnetic variables or properties
Measuring magnetic variables.
Measuring or investigating magnetic properties of materials.
The following technical subjects are therefore covered, the list being non-exhaustive:
Measuring direction or amount of magnetic fields, or measuring characteristics of magnetic materials
Apparatus based on magnetic resonance, e.g. Nmr, mri, epr (i.e. Esr) (see synonyms and keywords) and not specially adapted for a particular application
Details, testing or calibrating of related instruments or arrangements
Investigating electric variables or properties
This subclass covers measuring or investigating electric properties of materials, whereas measuring or investigating non-electric or non-magnetic properties of materials by the use of electric means or based on electrical variables is covered by e.g. group G01N 27/00.
Investigating magnetic variable or properties
This subclass also covers, under group G01R 33/00, measuring or investigating magnetic properties of materials, whereas measuring or investigating non-magnetic or non-electric properties of materials by the use of magnetic means is covered by group G01N 27/72.
In particular, group G01R 33/20 covers measuring magnetic variables/properties by using magnetic resonance, e.g. NMR, EPR or other spin effects, whereas investigating or analysing materials by using such spin effects is covered by group G01N 24/00.
Examples of places where the subject matter of this place is covered when specially adapted, used for a particular purpose, or incorporated in a larger system:
Medical diagnosis by means of magnetic fields, e.g. involving ESR, NMR or MRI | |
Medical diagnosis by electric means, e.g. by measuring bioelectric currents or voltages, or the impedance of a part of the body | |
Monitoring electric consumption of electrically-propelled vehicles | |
Ascertaining earth's true or magnetic north for navigation or surveying purposes | |
Magnetic resonance gyrometers | |
Investigating or analysing materials by using NMR, EPR (i.e. ESR) or other spin effects | |
Investigating non-electric or non-magnetic properties of materials by the use of electric means | |
Investigating non-electric or non-magnetic properties of materials by the use of magnetic means | |
Electric prospecting or detecting | |
Measuring direction or magnitude of the magnetic earth's field; Magnetic prospecting or detecting, e.g. well logging involving NMR | |
Measuring atmospheric potential differences, e.g. due to electrical charges in clouds | |
Indicating correct tuning of resonant circuits |
Examples of places in relation to which this place is residual:
Electrical testing characterised by what is being tested not provided for elsewhere | |
Electric testing of control systems | |
Testing computers during standby operation or idle time | |
Testing of switches in structural association with the switches themselves | |
Testing discharge tubes during manufacture | |
Testing or measuring semiconductors or solid state devices during manufacture or treatment | H01L21/66 |
Accumulators with integrated arrangements for testing condition | |
Testing of A/D or D/A conversion | |
Testing line transmission systems | |
Testing arrangements of data switching networks | |
Testing arrangements of telephone substation equipments | |
Testing of television systems or details thereof | |
Testing arrangements of loudspeakers, microphones or similar electromechanical transducers | |
Testing lamps structurally associated with light source circuit arrangements for detecting lamp failure |
Attention is drawn to the following places, which may be of interest for search:
Electrotherapy | |
Magnetotherapy | |
Measuring not specially adapted for a specific variable | |
Tariff metering apparatus | |
Measuring temperature based on the use of electric elements directly sensitive to heat | |
Measuring temperature based on the use of magnetic elements directly sensitive to heat | |
Systems for regulating electric variables | |
Systems for regulating magnetic variables | |
Image data processing or generation | |
Monitoring of signal or alarm line circuits, e.g. signalling of line faults | |
Superconducting magnetsMagnets | |
Electric switches; Emergency protective devices | |
Cathode-ray tubes | |
Thermo-electric solid state devices | |
Thermo-magnetic solid state devices | |
Devices using galvano-magnetic or similar magnetic effects, e.g. Hall effect | |
Aerials | |
Emergency protective circuit arrangements | |
Circuit arrangements for charging, or depolarising batteries or for supplying loads from batteries | |
Methods or apparatus specially adapted for manufacturing, assembling, maintaining or repairing dynamo-electric machines | |
Generation of oscillations | |
Modulation | |
Frequency discriminators; Phase discriminators | |
Amplifiers | |
Impedance networks, e.g. resonant circuits; Resonators | |
Tuning resonant circuits; Selecting resonant circuits | |
Pulse technique | |
A/D or D/A conversion | |
Housings for electric apparatus | |
Screening of electric apparatus or components against electric fields | |
Screening of electric apparatus or components against magnetic fields | |
Arrangements for monitoring manufacture of assemblages of electric components |
Concerning the "measuring of electric variables" part, the following applies when classifying: The most pertinent group is given as an EC. If several groups are equally pertinent (so if it is not clear which EC to allocate), several EC's or an EC and additional Indexing Codes are given.
General remark: G01R (electric part) is a big subclass with many low level subgroups. When classifying at group or subgroup level, care should taken to see to it that the document(s) really concern the measuring of an electric variable and that all higher level (subclass, group, subgroup) definitions are met with.
The scheme was created at a time when electromechanical instruments were common. The groups closely linked to such instruments are rarely used for classifying measuring or testing devices that fall under G01R.
It means what it says; many groups of G01R are not used any more, because the definitions are outdated (contrary to other fields we do not "bend" EC interpretations to fit present days technology.
In this place, the following terms or expressions are used with the meaning indicated:
Measuring properties | can also be interpreted as investigating propertiesRemark: Measuring "properties" is rarely a subject for patenting in G01R. |
Instruments or measuring instruments | means electro-mechanical measuring mechanisms Remark: This rule is of little relevance, as electromechanical devices are basically obsolete. |
DUT | Device Under Test |
Arrangements for measuring | means apparatus, circuits, or methods for measuring |
In patent documents, the following abbreviations are often used:
EPR | Electron paramagnetic resonance |
ESR | Electron spin resonance |
NMR | Nuclear magnetic resonance |
MRI | Magnetic resonance imaging |
MRS | Magnetic resonance spectroscopy |
NQR | Nuclear quadrupole resonance |
This place covers:
Structural, tangible details of devices.
This place does not cover:
Constructional details common to different types of electric apparatus |
Details concerning arrangements of terminals for the testing of circuits, which do not fit into the definitions of G01R 1/04 and dependent subgroups, are classified in G01R 31/2886. Examples: Contacting devices or procedures without clear mechanical or geometrical features (as defined in the subgroups of G01R 1/04).
This place covers:
Test clips, which are contacting devices that clip onto the integrated circuit to be tested.
This place covers:
Probes for connecting to electric devices for measuring or testing purposes.
Connecting devices or methods for the testing of electrical circuits which do not fit into G01R 1/067 or a subgroup of G01R 1/067 are classified in G01R 31/2886.
Sockets, and details of sockets such as contacts, for receiving integrated circuits for testing are classified in G01R 1/0433.
This place covers:
Constructional details of individual probe elements or tips.
This place does not cover:
Contact pieces of test sockets |
Attention is drawn to the following places, which may be of interest for search:
End pieces terminating in a probe |
This place covers:
Geometric details where the dimensions are of microscopic dimensions, corresponding to features of integrated elements.
This place covers:
Details related to the material as such (alloy, heat treatment, surface deposit...)
This place covers:
Circuits being part of or closely linked to a probe, such as amplifiers, filters or power supplies integrated in a probe.
This place covers:
Probes adapted for the measuring of high frequencies, for example by having low inductance leads, low loss or linear frequency properties.
This place covers:
Probes specially adapted for measuring high voltages.
This place covers:
Probes having multiple contacting points
This place covers:
Probes mounted on a flexible membrane, such as so called "membrane probes".
This place covers:
Probes having long needles, which flex when pressed against the DUT.
This place does not cover:
Probes with spring loaded pogo pins |
In this place, the following terms or expressions are used with the meaning indicated:
DUT | Device under test |
This place covers:
Features related to geometrical adaption between probe tips and probe output, e.g. using an adapter board.
This place covers:
Manipulation of one or more individual probe elements, e.g. the tip part.
Attention is drawn to the following places, which may be of interest for search:
Manipulating a single (i.e. single contact) probe. | |
Manipulating a complete "multi probe" |
Attention is drawn to the following places, which may be of interest for search:
Screening of electrical apparatus or components in general |
This place covers:
Instruments classified in this group may be used as indicating instruments for electric or non-electric variables.
This place does not cover:
Instruments employing mechanical resonance |
This place covers:
Electromechanical arrangements for measuring time integral of electric power or current such as conventional electromechanical electricity meters, i.e. comprising a rotating disk.
This place does not cover:
Electronic power meters are classified | |
Electronic electricity (energy) meters | |
Monitoring electric consumption of electrically-propelled vehicles | |
Tariff metering apparatus, e.g. for measuring gas or water consumption but also for general metering where the type of consumption is not of interest; utility meters | |
Remote reading of utility meters | |
Boards, panels, desks (and parts or accessories therefor) for energy meters |
This place covers:
Unless one of the subgroups apply, add-ons, such as electronic counters or optical ports, are seen as "constructional details".
This place covers:
Housings for electromechanical electricity meters. "Supporting racks" are the internal supports for holding the Ferraris wheels, decade counters, transformers and other internal components of the electromechanical electricity meters. See e.g. US4791362, CH158284.
Housings which are used only for electronic meters are classified in G01R 22/065.
Supporting, cabinets comprising installation places for electricity meters but also other installation places e.g. for circuit breakers are classified in H02B 1/03.
If the arrangement for avoiding or indicating fraudulent use is related to electronic electricity meters the document should be classified in the corresponding subgroups of G01R 22/066 .
If the arrangement for indicating or signalling faults is related to electronic electricity meters the document should be classified in the corresponding subgroups of G01R 22/068 .
This place does not cover:
Preventing tampering with detection circuits in signalling or alarm circuits | |
Seals |
Attention is drawn to the following places, which may be of interest for search:
Tariff metering in general |
This place does not cover:
Over-consumption meters, e.g. measuring consumption while a predetermined level of power is exceeded |
This place covers:
Oscilloscopes and the like for measuring and displaying waveforms.
If the document is directed to aspects of measuring of current or voltage (e.g. A/D conversion, signal conditioning) the classes G01R 19/2506 and lower take preference.
Modular arrangements for computer based systems (e.g. virtual systems) are classified in G01R 19/2516 (when the document is related to the measuring part).
Recording frequency spectrum is classified in G01R 23/18
This place does not cover:
Recognising patterns in signals | |
Control arrangements or circuits for visual indicators common to CRT indicators and other visual indicators (image data processing or generation, in general G06T) |
This place covers:
All digital oscilloscopes.
Older type cathode-ray oscilloscopes using digital processors and intermediate A.D. and D.A. converters are classified in G01R 13/345.
If the emphasis is set on the current or voltage measuring part, e.g. signal conditioning, details concerning sampling, digitizing G01R 19/2506 and lower, as well as G01R 19/252, G01R 19/255 and G01R 19/257 take preference.
Modular arrangements for computer based systems are classified in G01R 19/2516.
When the type of the display is of importance, e.g. LCD display G01R 13/403 is used.
This place does not cover:
LCD display of oscilloscopes | |
Two or three dimensional representation of values | |
General arrangements for monitoring or analysing measured signals, using A.D. convertersmeasuring current or voltage using digital measurement techniques | |
Modular arrangements for computer based systems for measuring current or voltage |
Attention is drawn to the following places, which may be of interest for search:
Cathode-ray oscilloscopes with intermediate digital signal processing (note: older digital oscilloscopes are also partly classified here although they should be classified in G01R 13/02 and lower) | |
Data acquisition and logging in general | |
Counters | |
Analogue/digital conversion in general |
This place covers:
Systems for displaying a waveform by a table or the like with numerical values. Other characterising values, even single values, of waveforms are also covered here.
Displaying charts of waveforms are classified in G01R 13/0218 and lower and in G01R 13/029 or in the parent class G01R 13/02.
This place does not cover:
Detection of starting points in a waveform, when the waveform is not displayed | |
Ultrasonic measurements for analysing materials | |
Determination of distance by electromagnetic or acoustic wave reflection |
This place covers:
Details of sampling circuits when they are used only in digital oscilloscopes.
More general details of sampling are classified in G01R 19/2506 and lower. These classes can in cases of interest also be given in parallel.
This place does not cover:
Details of sampling and waveform capturing which are not part of digital oscilloscopes | G01R 19/2506, G01R 19/2509, G01R 19/252, G01R 19/255, G01R 19/257 |
A.D. converters |
This place covers:
Software used in digital oscilloscopes and the like.
This place does not cover:
Detection of starting points in a waveform, when the waveform is not displayed | |
Ultrasonic measurements for analysing materials | |
Determination of distance by electromagnetic or acoustic wave reflection |
If the software calculates a trigger event an additional class is given in G01R 13/0254 (although the title thereof relates to circuits). Similarly the other groups of G01R 13/0218 are given in parallel to G01R 13/029.
This place covers:
Analogue oscilloscopes with cathode-ray screens or oscilloscopes which have an intermediate digital part but which use a traditional cathode-ray screen.
Digital oscilloscopes are classified in G01R 13/02 and lower. If the type of display is of interest, G01R 13/40 and lower is used, e.g. G01R 13/403 for liquid crystal displays (LCD).
This place does not cover:
Digital oscilloscopes | |
LCD displays of oscilloscopes | |
Control arrangements or circuits for cathode-ray tube indicators | |
Cathode ray tubes |
This place does not cover:
Luminescent screens for CRT provided with permanent marks or references | |
Optical or photographic arrangements combined with CRT vessels |
This place does not cover:
Optical or photographic arrangements combined with CRT vessel |
This place does not cover:
Two or three dimensional representation of measured values in general | |
Stereoscopic T.V. |
This place does not cover:
Circuits for generating pulses, e.g. saw-tooth waveforms |
This place covers:
Circuits of analogue storage oscilloscopes.
This place does not cover:
Brilliance control in general |
This place does not cover:
Electronic switches |
This place does not cover:
Sample and hold arrangements in general |
This place does not cover:
For displaying sampled signals by using digital processors by intermediate A.D. and D.A. convertors |
This place covers:
Cathode-ray oscilloscopes whereby the intermediary signal processing is performed by a digital processor but the resulting waveform is converted back to an analogue signal to be displayed on the cathode-ray screen.
This place does not cover:
Digital oscilloscopes |
This place does not cover:
Discharge tubes in general |
This place covers:
Documents where the type of the display of the oscilloscope is of interest.
Cathode ray oscilloscopes are classified in G01R 13/20 and lower. Digital oscilloscopes wherein the type of display is not of importance are classified in G01R 13/02 and lower.
This place does not cover:
Visual indication of correct tuning |
This place does not cover:
Instruments using length of spark discharge e.g. by measuring maximum separation of electrodes to produce spark |
This place covers:
Documents where the type of the display of the oscilloscope is of interest.
Cathode ray oscilloscopes are classified in G01R 13/20 and lower. Digital oscilloscopes wherein the type of display is not of importance are classified in G01R 13/02 and lower.
Attention is drawn to the following places, which may be of interest for search:
Analogue/digital conversion |
This place does not cover:
Two or three dimensional representation of measured values |
This place does not cover:
Two or three dimensional representation of measured values |
Attention is drawn to the following places, which may be of interest for search:
Altering a transfer function when measuring not specially adapted for a specific (e.g. electric) variable |
Attention is drawn to the following places, which may be of interest for search:
Range change when measuring not specially adapted for a specific (e.g. electric) variable |
This place covers:
Measuring of voltage or through capacitive coupling with the conductor to be measured.
This place does not cover:
Measuring an electric field as such |
This place covers:
Measuring current or voltage using coils or transformers (having interacting windings; the primary winding can be made up by a straight conductor surrounded by the secondary).
This place does not cover:
Measuring a current via the magnetic field, using a coil as sensor |
Attention is drawn to the following places, which may be of interest for search:
Transformers and inductances as such |
This place does not cover:
Measuring magnetic fields as such, using galvano-magnetic devices |
In this place, the following terms or expressions are used with the meaning indicated:
Galvano magnetic device | Having an interaction between a current and a magnetic field in the device itself |
Attention is drawn to the following places, which may be of interest for search:
Hall effect devices as such |
Attention is drawn to the following places, which may be of interest for search:
Measuring an electric field as such, using electro-optical modulation |
This place does not cover:
Instruments for converting a single current or a single voltage into a mechanical displacement |
Attention is drawn to the following places, which may be of interest for search:
When not specially adapted for a specific variable |
Attention is drawn to the following places, which may be of interest for search:
Logic circuits characterised by logic function |
Attention is drawn to the following places, which may be of interest for search:
Measuring RMS values when not specially adapted for a current or voltage measurement | |
Analogue computers for evaluating mean square values. | G07G7/20 |
This place covers:
Measuring of amplitude of periodic voltage or current is also covered.
Attention is drawn to the following places, which may be of interest for search:
Peak detectors for pulses. |
This place covers:
Threshold detectors as such, when seen as a measurement circuit (for current or voltage).
Attention is drawn to the following places, which may be of interest for search:
Transition or edge detectors for pulses |
Attention is drawn to the following places, which may be of interest for search:
Zero-crossing detectors for pulses |
Attention is drawn to the following places, which may be of interest for search:
Analogue/digital conversion |
Attention is drawn to the following places, which may be of interest for search:
Analog to digital converters as such |
Attention is drawn to the following places, which may be of interest for search:
Analogue to digital converters as such |
Attention is drawn to the following places, which may be of interest for search:
Analogue to digital converters as such |
This place covers:
Adaptations where the measured signals have wavelengths in the order of magnitude of the circuits present, i.e. high frequencies (theoretically, signals on very long conductors are also covered, but such applications are unusual).
Attention is drawn to the following places, which may be of interest for search:
Testing of microwave or radiofrequency circuits |
This place covers:
Analogue and digital measurements of power or power factor.
Also measurements of power for high frequency signals.
This group covers additionally the measurement of power when it is an essential aspect of a measurement of electric energy (time integral of power).
Electronic measurements of energy (time integral of power) is classified in G01R 22/06 when the power measurement therein is not the essential part.
This place does not cover:
Arrangements for monitoring electric power systems | |
Arrangements for AC mains network controlling | |
Arrangements for providing remote indication of network conditions |
This place does not cover:
In circuits having distributed constants | |
By thermal methods | |
By using galvanomagnetic effect devices | |
By using square-law characteristics of circuit elements | |
By using pulse modulation | |
Measurements of real or reactive component or of apparent energy measured by digital technique |
This place does not cover:
Measurements of real component measured by digital technique |
This place does not cover:
Measurements of reactive component measured by digital technique |
This place does not cover:
Measurements of apparent energy measured by digital technique |
This place does not cover:
In circuits having distributed constants | |
By thermal methods | |
By using galvanomagnetic effect devices | |
By using square-law characteristics of circuit elements | |
By using pulse modulation | |
Digital meters adapted for special tariff measuring |
This place covers:
maximum load or demand monitors.
This place covers:
Power measurements whereby the wavelength comes into the geometrical order of the underlying medium, i.e. for very high frequencies.
This place does not cover:
Arrangements for monitoring electric power systems, logging | |
By thermal methods | |
By measuring current and voltage | |
By using galvanomagnetic effect devices | |
By using square-law characteristics of circuit elements | |
Arrangements for providing remote indication of network conditions |
This place covers:
Power measurements by thermal methods for high frequency signals.
This place covers:
Power measurements by thermal methods whereby the wavelength comes into the geometrical order of the underlying medium, i.e. for very high frequencies.
This place does not cover:
By using: galvanomagnetic effect devices; square-law characteristics of circuit elements; pulse modulation; digital techniques |
This place covers:
Power measurements by using voltage and current measurements whereby the wavelength comes into the geometrical order of the underlying medium, i.e. for very high frequencies.
This place does not cover:
By using galvanomagnetic effect devices, in circuits having distributed constants |
This place does not cover:
Galvano-magnetic effect devices, e.g. Hall effect devices, for current measurements only | |
Hall effect devices per se |
This place covers:
Power measurements by using galvano-magnetic effect devices whereby the wavelength comes into the geometrical order of the underlying medium, i.e. for very high frequencies.
This place covers:
Power measurement for high frequency signals which use such square-law characteristics of circuit elements.
This place does not cover:
By thermal methods |
This place covers:
Power measurements by using square-law characteristics of circuit elements whereby the wavelength comes into the geometrical order of the underlying medium, i.e. for very high frequencies.
This place does not cover:
By using digital tecnhique | |
Digital multiplication via delta sigma modulation |
This place covers:
Power meters using a digital processor.
Additionally measurements of power in meters for electric energy (time integral of power) when the measurement of power is the essential aspect.
Digital energy meters (time integral of power) are classified in G01R 22/10 when the power measuring part thereof is not of main importance. However if the power measuring aspect in such digital energy meters is of main interest then it is classified here in G01R 21/133 and lower.
Digital measurements of voltages or currents in electric power systems are classified in G01R 19/2513, e.g. for monitoring the quality of the power signal.
This place does not cover:
Electromechanical arrangements for measuring time integral of power or current | |
Arrangements for monitoring electric power systems by using digital measurement techniques | |
Electronic energy meters | |
Digital energy meters | |
Monitoring electric consumption of electrically-propelled vehicles | |
Coin-freed apparatus with meter-controlled dispensing of electricity | |
Arrangements for AC mains network controlling | |
Arrangements for providing remote indication of network conditions |
This place covers:
Maximum load or maximum demand power meters.
This place covers:
Methods other than electromechanical for measuring time integral of electric power.
An arrangement for measuring time integral of electric power is classified in group G01R 21/00 if the essential characteristic is the measuring of electric power.
This place does not cover:
Electromechanical arrangements for measuring time integral of power or current | |
Arrangements for measuring electric power | |
Monitoring electric consumption of electrically-propelled vehicles | |
Coin freed devices | |
Arrangements for AC mains network controlling | |
Arrangements for providing remote indication of network conditions |
This place covers:
Electronic methods for measuring time integral of power, whereby analogue or digital techniques can be used.
This place covers:
Aspects of electricity meters for remote reading in the sense that the meter has special adaptations which go beyond standard communication systems.
Managing power networks by using distributed power monitors and using standard communication protocols is classified in H02J 13/00.
If the communication protocol as such is of interest the document is classified in H04B 1/00.
This place does not cover:
Remote reading of utility meters | |
Telemetrie | |
Circuit arrangements for providing remote indication of network conditions | |
Data transmission systems |
This place covers:
Housings specially adapted (or used only) for electronic electricity meters.
This group also covers adaptations to the housing of an electronic electricity meter in order to add a certain functionality and whereby mechanical aspects of this adaptation are of importance.
This place does not cover:
Cabinets which also can be used for electricity meters Distribution boards or subassemblies, which may comprise installation places for electricity meters but which also have installation places for other units such as circuit breakers etc. | |
Casings, cabinets or drawers for electric apparatus |
This place does not cover:
Arrangements for avoiding or indication of fraudulent use in electromechanical electricity meters | |
Security arrangements for protecting computers against unauthorized activity |
This place covers:
Electricity meters which are based on an analogue electronic circuit.
This place does not cover:
Electromechanical electricity meters |
This place covers:
Digital arrangements for measuring time integral of electric power, such as electricity meters, whereby the digital processing is of importance.
Details relating to measuring of electric power are classified in G01R 21/133.
Digital measurements of voltages or currents in electric power systems are classified in G01R 19/2513, e.g. for monitoring the quality of the power signal.
This place covers:
Arrangements for measuring frequencies of electrical signals as such.
arrangements for analysing frequency spectra of electric signals if the analysis thereof comprises aspects of the determination of frequency components.
The mere use of known frequency measurement or analysis methods or devices is classified in the appropriate application class, such as G01N 27/00 or G01N 22/00.
This place does not cover:
Investigating materials by use of microwaves | |
Investigating materials by use of electric or magnetic means | |
Frequency discriminators | |
Demodulation of frequency modulated signals | |
Receivers for broadcast information | |
Digital receivers | |
Frequency measurement of non electric signals. Frequency analysis, e.g. analytical spectometry.Algorithms for spectral analysis as such. |
This place does not cover:
By heterodyning; by beat-frequency comparison | |
Indicating that frequency of pulses is either above or below a predetermined value or within or outside a predetermined range of values, by making use of non-linear or digital elements | |
Circuits for comparing the frequencies of two mutually independent oscillations |
This place covers:
Measurements of frequencies whereby the wavelength comes into the geometrical order of the underlying medium, i.e. for very high frequencies.
This place covers:
Measuring instruments using a resonant frequency, e.g. an oscillator output energy which changes in the vicinity of a resonant circuit which is tuned to the frequency the oscillator generates.
This place does not cover:
Radiation-measuring instruments in which pulses generated by a radiation detector are integrated |
This place covers:
Frequency measurements wherein signals of different frequencies are combined in order to generate intermediate frequencies / interference signals which are used for the measurement (heterodyning).
Also frequency measurements based on a comparison to a signal of a similar reference frequency.
This place does not cover:
Generation of oscillations by beating unmodulated signals of different frequencies |
This place covers:
Frequency measurements wherein the reference signal is a harmonic signal of an (adjustable) oscillator.
This place covers:
Also digital determinations of a single frequency.
This place covers:
Spectrum-analysers and the like, e.g. digital spectrum analysers using algorithms performed on a microprocessor whereby the electric signal measurement apparatus, and not only a pure mathematical algorithm, is of interest.
Digital spectrum analysers are normally classified in this class unless one or more of the subgroups are relevant. The subgroups are however directed to devices for spectrum analysis which were not based on algorithm performed on microprocessors.
Determination of a single frequency is classified in G01R 23/15. Frequency selective measuring of voltage level is classified in G01R 19/04.
This place does not cover:
Investigating materials by use of microwaves | |
Investigating materials by use of electric or magnetic means | |
Computing with Fourier series or Walsh functions | |
Feature extraction from signals | |
Demodulation of frequency modulated signals | |
Receivers for broadcast information | |
Digital receivers |
In patent documents, the following abbreviations are often used:
FFT | Fast Fourier Transformation |
DFT | Discrete Fourier Transformation |
This place covers:
Spectrum analysis for frequencies whereby the wavelength comes into the geometrical order of the underlying medium, i.e. for very high frequencies.
This place does not cover:
For measuring a single frequency in circuits having distributed constants |
Digital spectrum analysers using an algorithm performed on a microprocessor are classified in G01R 23/16.
This place does not cover:
Panoramic receivers per se |
This place covers:
For example devices which such provisions for recording in order to display the result on a screen.
This place covers:
The measurement of non-linear distortion by frequency analysis.
This place does not cover:
Measurement of phase shift of four pole networks | |
Measurement of noise figure, signal-to-noise ratio or jitter (phase noise) | |
Testing of individual semiconductor devices | |
Testing (or characterizing) of electronic circuits | |
Analysis of signal quality |
This place covers:
Phase measurements of electrical signals as such.
This place does not cover:
Measuring power factor | |
Measuring position of individual pulses in a pulse train | |
Circuits for comparing the phase of two mutually independent oscillations | |
Phase locked loops |
Examples of places where the subject matter of this place is covered when specially adapted, used for a particular purpose, or incorporated in a larger system:
Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means | |
Automatic control of frequency or phase; Synchronisation | |
Phase-modulated carrier systems, i.e. using phase-shift keying |
This place does not cover:
Phase locked loops |
This place covers:
Phase measurements whereby the wavelength comes into the geometrical order of the underlying medium, i.e. for very high frequencies.
This place does not cover:
Measuring position of individual pulses in a pulse train | |
Measuring time intervals |
This place covers:
Measurements of resistance, reactance or impedance as such whereby the measurement comprises aspects which are not generally known in the art.
The use of such measurements is classified in the appropriate application places.
This place does not cover:
Measuring superconductive properties |
Examples of places where the subject matter of this place is covered when specially adapted, used for a particular purpose, or incorporated in a larger system:
Measuring contours by electric means | |
Flow measurements | |
Temperature measurements | |
Pressure/ Force measurements | |
Analysing materials by investigating resistance | |
Analysing materials by investigating capacitance | |
Acceleration measurements |
This place covers:
Measurements of complex impedance.
Groups G01R 27/02 - G01R 27/22 cover variables that directly or indirectly can be measured over two poles of a component or a Thevenin two-pole equivalent. Subgroup G01R 27/26 also covers other techniques, e.g. using electro-magnetic waves or network analyzers.
Measurements of capacitance only is classified in G01R 27/2605.
Measurements of inductance only is classified in G01R 27/2611.
This place does not cover:
Measuring phase angle only |
This place does not cover:
Measuring resistance to earth | |
Testing dielectric strength of cable insulation | |
Testing of leakage or ground faults |
This place covers:
Impedance measurements whereby the wavelength comes into the geometrical order of the underlying medium, i.e. for very high frequencies.
This place does not cover:
Measuring dielectric loss, e.g. loss angle |
This place does not cover:
Measuring impedance of element or network through which a current is passing from another source | |
Measuring earth resistance; Measuring contact resistance | |
Measuring resistance of fluids |
This place covers:
Measurements of resistance between a high voltage line and ground when current from another source is passing the high voltage line.
This place does not cover:
Measurement of isolation resistance | |
Testing of leakage or ground faults |
This place covers:
Measurements of resistance of lines which are intended for grounding, such as the resistance of the PE line or of the resistance of the earth as such.
This place does not cover:
Testing of continuity | |
Testing of connections |
This place covers:
Contact resistance measurements, e.g. of earth connections, but also of other connections, e.g. between terminal blades and sockets.
This place does not cover:
Testing of continuity | |
Testing of connections |
This place does not cover:
Measuring vessels, electrodes for the Measuring resistance of fluids |
The group G01R 27/26 represents only a parent-class which is not actively used. Instead the groups G01R 27/2605 - G01R 27/2688 are used.
In cases where an impedance with a real and an imaginary part is determined, and none of the groups listed hereabove are relevant, the group G01R 27/02 is used.
This place covers:
Measurements of capacitance as such in the sense that particular steps of the measurement or particular features thereof are disclosed.
Only in very rare and exceptional cases where the capacity measurement has particular aspects capacitive sensors may be classified here.
Examples of places where the subject matter of this place is covered when specially adapted, used for a particular purpose, or incorporated in a larger system:
Sensors using a capacitive element | |
Flow measurements | |
Temperature measurements | |
Pressure/ Force measurements | |
Analysing materials by capacitive methods | |
Acceleration measurements | |
Proximity switches |
The mere use of an existing capacity measurement method or device should not be classified in this group. In particular no sensors which are based on capacitance effects are classified here. Such sensors are classified in the classes of the corresponding applications.
This place covers:
Measurements of inductance as such in the sense that particular steps of the measurement or particular features thereof are disclosed.
Only in very rare and exceptional cases where the inductance measurement has particular aspects, sensors may be classified here.
Examples of places where the subject matter of this place is covered when specially adapted, used for a particular purpose, or incorporated in a larger system:
Sensors using an inductive element | |
Flow measurements | |
Temperature measurements | |
Pressure/ Force measurements | |
Analysing materials by investigating the impedance | |
Acceleration measurements |
This place covers:
Measurements of the relative permittivity or electric susceptibility Xe
or the like of a dielectric material.
This place does not cover:
Measuring quality factor or dielectric loss, e.g. loss angle, or power factor | |
Testing dielectric strength | |
Detecting insulation faults | |
Analysing materials by use of microwaves | |
Analysing materials by use of electric or magnetic means |
This place does not cover:
Sample holders, electrodes or excitation arrangements | |
Using optical methods or electron beams |
This place does not cover:
Bridges for measuring loss angle |
This place does not cover:
Sample holders, electrodes or excitation arrangements of coaxial or concentric type | |
Optical methods |
This place covers:
Dielectric loss measurements e.g. of cables.
This place does not cover:
Power factor related to power measurements | |
Measuring reflection coefficients, measuring standing-wave ratio | |
Testing capacitors |
This place covers:
For example hf network analysers.
Calibrations of network analysers are classified in G01R 35/005 and G01R 27/28 in parallel if the network analyser differs from known network analysers.
The use of known network analysers for special applications is classified in the corresponding classes of the applications, e.g. for analysis of materials in G01N 27/00.
This place does not cover:
Measuring attenuation, gain, phase shift in line transmission systems |
This place covers:
Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks whereby the wavelength comes into the geometrical order of the underlying medium, i.e. for very high frequencies, and this fact is essential for the invention.
This place does not cover:
Measuring peak values | |
Clock generators with changeable/programmable clock frequency | |
Manipulating pulses using a chain of active delay devices | |
Monitoring pattern of pulse trains |
This place does not cover:
Measuring rate of change |
This place does not cover:
Measuring effective values, i.e. root-mean square values |
This place does not cover:
Monitoring, testing of transmission systems |
This place does not cover:
Measuring electromagnetic field characteristics for determining a voltage or a current in a high voltage line, e.g. by using Hall elements | |
Measuring electrostatic fields | |
Measuring magnetic fields | |
Measuring or estimating channel quality parameters |
Attention is drawn to the following places, which may be of interest for search:
EMC, EMI and similar testing in general |
This place does not cover:
Rooms and test sites for testing antennas |
This place does not cover:
Locating faults in cables, transmission lines or networks | |
Testing of electric apparatus, lines or components for short circuits, discontinuities or leakage | |
Identification of wires in a multi-core cable | |
Electric or magnetic prospecting, e.g. for detecting hidden cables in walls |
This place does not cover:
Nuclear radiation dosimetry |
This place does not cover:
Warning devices | |
Sensors; antennas; probes; detectors | |
Details related to signal analysis or treatment; presenting results |
This place does not cover:
Wave guide measuring sections |
This place covers:
Testing of antennas and/or measurements of radiation diagrams of aerials.
Attention is drawn to the following places, which may be of interest for search:
Analysing the shape of a waveform | |
Antennas in general | |
Phased-array testing or checking devices |
This place does not cover:
Test sites used for measuring on other objects than aerials | |
Wave absorbing devices |
This place does not cover:
Analysing materials by investigating electrostatic variables |
This place does not cover:
Measuring radiation diagrams of antennas | |
Analysing materials by investigating electrostatic variables |
This place does not cover:
Testing AC power supplies, e.g. frequency converters |
This place covers:
Indicating phase sequence or Indicating synchronism of power supply networks.
This place does not cover:
Arrangements for synchronizing receiver with transmitter in communication networks |
This place does not cover:
Testing of transformers for e.g. short circuits | |
Testing of electric windings | |
Testing or calibrating of instrument transformers | |
Transformers in general |
This place does not cover:
Piezo-electric devices in general |
The measurement of charge often goes together with the measurement of the electrostatic field.
The classes G01R 29/12, G01R 15/165 and G01R 5/28 should therefore also be considered and in cases where the measurement of the electrostatic field as such is also of particular interest one of these classes can be given in parallel to G01R 29/24. Otherwise G01R 29/24 takes precedence for charge measurements.
This place does not cover:
Electrostatic instruments | |
Measuring electrostatic potential, e.g. with electrostatic voltmeters or electrometers, when the design of the sensor is essential | |
Indicating presence of current | |
Electrolytic meters, calorimetric meters, for measuring time integral of electric current | |
Measuring electrostatic fields |
This place covers:
The measurement of noise figure, signal-to-noise ratio and of jitter (phase noise).
This place does not cover:
Measurement of non-linear distortion, e.g. relation of harmonics to input signal | |
Analysis of signal quality or jitter of digital circuits |
This place covers:
Electric testing of electric devices.
This place does not cover:
Measuring superconductive properties | |
Testing or measuring semiconductors or solid state devices during manufacture | |
Testing line transmission systems |
Attention is drawn to the following places, which may be of interest for search:
Measuring leads or measuring probes | |
Testing or monitoring of control systems | |
Indicating electrical condition of switchgear or protective devices | |
Testing substation equipment, e.g. mobile phones |
In patent documents, the following abbreviations are often used:
DUT | device under test |
This place covers:
Stress and burn-in testing, subjecting the DUT to hot or cold temperatures, radiation, vibration or similar.
Attention is drawn to the following places, which may be of interest for search:
Safety, indicating or supervising devices for combustion engines. |
Attention is drawn to the following places, which may be of interest for search:
Testing or inspecting aircraft components or systems |
This place does not cover:
Testing dielectric strength or breakdown voltage | |
Testing of cables continuously passing the testing apparatus |
Attention is drawn to the following places, which may be of interest for search:
Testing, measuring or monitoring the electrical condition of accumulators or electric batteries | |
Sorting according to electric or electromagnetic properties |
Attention is drawn to the following places, which may be of interest for search:
Other testing of capacitors |
This place covers:
Determining the exact location of a fault on a cable, transmission line or network.
Attention is drawn to the following places, which may be of interest for search:
Testing of circuits | |
Installing, maintaining, repairing or dismantling electric cables or lines | |
Emergency protective circuit arrangements | |
Testing LAN's |
In this place, the following terms or expressions are used with the meaning indicated:
Transmission line | Line, such as an aerial line, for transmitting electric power, e.g. from power plants to consumers. |
This place covers:
Time domain and frequency domain reflectometry.
In patent documents, the following abbreviations are often used:
TDR | time domain reflectometry |
This place does not cover:
Measuring in plasmas | |
Measuring dielectric properties, e.g. constants | |
ESD, EMC or EMP stesting of circuits | |
Locating faults in cables, transmission lines, or networks | |
Testing of circuit interrupters, switches or circuit-breakers of high voltage or medium voltage devices | |
Testing of electric windings |
In this place, the following terms or expressions are used with the meaning indicated:
Dielectric strength or breakdown voltage | in addition to the immediate meaning, also: effectiveness or level of insulation; faulty insulation, e.g. so as to produce arcing faults. |
This place does not cover:
Testing or measuring during manufacture or treatment | |
Testing of photovoltaic devices |
Attention is drawn to the following places, which may be of interest for search:
Testing of integrated circuits | |
Measurement of impurity content of materials |
In this place, the following terms or expressions are used with the meaning indicated:
Individual semiconductor device | Basic semiconductor component or building block such as a diode or a transistor. |
A raw wafer, not having any circuits or parts of circuits on it, is considered as an individual semiconductor element.
This place covers:
Testing of printed circuits, integrated and hard-wired circuits.
This place does not cover:
ESD, EMC, or EMP testing of circuits | |
Testing of electric apparatus, lines, cables or components | |
Checking computers or computer components | |
Checking static stores for correct operation | |
Testing transmission (electric communication) systems |
Attention is drawn to the following places, which may be of interest for search:
Multiple probes | |
Testing arrangements in data switching networks | |
Arrangements for testing substation (telephonic equipment) equipment |
This place does not cover:
Contactless testing | |
Board Level Test | |
Testing contacts or connections |
Attention is drawn to the following places, which may be of interest for search:
Monitoring of manufacture of assemblages of electric components |
In patent documents, the following abbreviations are often used:
PCB | Printed Circuit Board |
MCP | multichip packages |
This place covers:
Statistical aspects of IC testing. Quality control procedures for IC testing.
This place does not cover:
Logistic aspects |
Attention is drawn to the following places, which may be of interest for search:
Electric programme-control systems for total factory control | |
Data processing systems or methods for administration or managment |
This place covers:
Testing of integrated circuit packages as such, i.e. not involving the solid state circuits they surround.
In this place, the following terms or expressions are used with the meaning indicated:
IC package | IC encapsulation |
This place does not cover:
Testing computers during standby operation or idle time |
This place covers:
Testing of electric aspects of electronic circuits using contact-less exchange of information or energy, e.g. contact-less exciting or signal-sampling.
This place does not cover:
Testing of connections, e.g. of plugs or non-disconnectable joints |
Attention is drawn to the following places, which may be of interest for search:
Investigating flaws by inspecting patterns on the surface of objects | |
Image analysis |
This place covers:
Wireless exchange of information between tester apparatus and DUT during electronic testing of integrated circuits.
Attention is drawn to the following places, which may be of interest for search:
Electromagnetic sensing of record carriers | |
Wireless transmission of measured values or control signals |
Attention is drawn to the following places, which may be of interest for search:
Testing contacts of switches, e.g. wear indicators | |
Gas insulated switchgear with means for detecting mechanical or electrical defects | |
Indication of state of electronic switch |
This place covers:
The testing, measuring or monitoring ̶ through electrical means ̶ of accumulators or electric batteries.
G01R 31/36 covers the testing, measuring or monitoring of accumulators or electric batteries taking place through electrical measurements. The testing, measuring or monitoring of batteries making use of other variables, e.g. ultrasonic measurements or chemical analysis of electrolyte, is covered in other subclasses, in particular subclasses G01N or H01M.
In particular, testing or monitoring of fuel cells by analysing reactants or residues is classified in subclass H01M.
Furthermore, electric testing arrangements structurally associated with the batteries are covered by H01M as shown by the references out of the residual place G01R 31/36.
Examples of places in relation to which this place is residual:
Arrangements for measuring, testing or indicating condition structurally associated with primary cells | |
Detection or assessment of electric variables for controlling fuel cells | |
Detection of failure or abnormal function in fuel cells | |
Structurally associated with secondary cells |
Attention is drawn to the following places, which may be of interest for search:
Current or voltage threshold detection in batteries. | |
Recording operating variables of electrically-propelled vehicles | |
Removing batteries from vehicles |
In patent documents, the following abbreviations are often used:
SoC | State of charge |
SoH | State of health |
This place covers:
The software aspect of testing of accumulators or electric batteries, e.g. computational or data processing aspects.
Examples include:
- use of self-learning or adaptive systems, e.g. neural networks;
- use of look-up tables or fuzzy logic;
- Kalman filters;
- testing characterized by battery modelling.
Examples of places where the subject matter of this place is covered when specially adapted, used for a particular purpose, or incorporated in a larger system:
Acquisition or processing of data to test or to monitor individual cells or groups of cells within a battery |
Attention is drawn to the following places, which may be of interest for search:
Processes for controlling fuel cells or fuel cell systems characterised by the implementation of mathematical or computational algorithms, e.g. feedback control loops, fuzzy logic, neural networks or artificial intelligence |
This place covers:
The testing, measuring or monitoring of accumulators or electric batteries where the electric-variable sensing and the display of the result occur in different locations, characterized by different environmental parameters, e.g. temperature, pressure, noise.
The display can be a system with another main function, e.g. a mobile phone, provided that that system does not encompass the battery-sensing element(s), although it could perform a controlling function on these elements.
Another example of subject matter covered in this group is an indicator mounted on a vehicle's dashboard, indicating the electrical condition of the vehicle's battery.
In this place, the following terms or expressions are used with the meaning indicated:
Remote | Taking place in a different environment than the sensing |
Examples of places in relation to which this place is residual:
Monitoring battery variables by comparing with a reference voltage |
This place does not cover:
Monitoring of batteries |
This place covers:
Methods to assess the condition of an individual cell or group or cells in a multi-cell battery, in which data are transmitted to processing means outside the battery, allowing the condition of a subset of cells (e.g. one) within the battery to be determined without dismantling the battery.
When electrochemical cells are tested or monitored through integrated means, as if they were stand-alone cells, classification is made in subclass H01M. G01R 31/396 covers the collecting and use or processing of data taking place outside the battery, but leading to knowledge of the condition of cells within the battery, without intrusive measurements.
This place does not cover:
Testing photovoltaic devices |
Attention is drawn to the following places, which may be of interest for search:
Comparing current or voltage with a reference level in AC or DC supplies |
This place does not cover:
Testing of sparking plugs |
Attention is drawn to the following places, which may be of interest for search:
Measuring resistance to earth | |
Measuring electromagnetic field leakage | |
Locating faults in cables, transmission lines, or networks | |
Testing dielectric strength or breakdown voltage | |
Testing of discharge tubes | |
Testing of circuit interrupters, switches or circuit-breakers | |
Testing dynamo-electric machines | |
Testing of individual semiconductor devices | |
Apparatus for testing electrical condition of accumulators or electric batteries | |
Testing power supplies | |
Testing lamps | |
Testing of electric windings | |
Checking or monitoring of signalling or alarm systems |
This place covers:
Tests for open circuits (lack of continuity) .
Attention is drawn to the following places, which may be of interest for search:
Testing lamps |
This place covers:
Testing line connections, e.g. for correctness or for electrical characteristics.
Attention is drawn to the following places, which may be of interest for search:
Testing of circuits | |
Installing, maintaining, repairing or dismantling electric cables or lines | |
Emergency protective circuit arrangements |
In patent documents, the following words/expressions are often used with the meaning indicated:
Transmission line | Line, such as an aerial line, for transmitting electric power, e.g. from power plants to consumers. |
This place does not cover:
Testing of electric windings |
Attention is drawn to the following places, which may be of interest for search:
Testing of insulation of cables | |
Testing line transmission systems |
Attention is drawn to the following places, which may be of interest for search:
Measuring of capacitance | |
Go/no-go testing of capacitors |
This place does not cover:
Testing for incorrect line connections |
Attention is drawn to the following places, which may be of interest for search:
Testing of connections in integrated circuits, chip-to lead connections, bond wires | |
Interconnect testing |
This place covers:
Testing to validate the correct position or placement of conductors or connections, e.g. in a wiring loom.
This place does not cover:
Testing of transformers |
Attention is drawn to the following places, which may be of interest for search:
Measuring number of turns | |
Testing of armature or field windings | |
Monitoring or fail-safe circuits |
This place covers:
Magnetic sensors and measuring aspects for measuring all kind of magnetic variables.
NMR is classified in the subgroups of G01R 33/20, but general aspects of measuring magnetic variables is classified in G01R 33/0005-M.
This place covers:
The different types of magnetic sensors.
G01R 33/0005 - G01R 33/0052 concern general aspects of measuring magnetic variables and may also be given as additional class to the sub-classes of G01R 33/02.
This place covers:
Apparatus and methods concerning measurements with charged or magnetic particles.
This place covers:
Devices using compensation measurements.
This place covers:
Magnetometers using the relationship between currents, magnetic fields and/or magnetic force.
This place covers:
All kind of MEMS devices.
This place covers:
All kind of magneto-optical devices and methods, e.g. Cotton-Mouton (magnetic double refraction in liquid, caused by lining-up of anisotropic molecules in magnetic field. Analogue of ELECTRO-optic Kerr effect, not related to Zeeman effect.)
This place covers:
e.g. Faraday effect (rotation of polarization plane of plane-polarized light, consequence of longitudinal Zeeman effect, field parallel to light beam); e.g. Voigt effect (magnetic double refraction, different diffraction for polarization parallel to field and polarization perpendicular to field, consequence of transverse Zeeman effect, field perpendicular to light beam)
This place covers:
E.g. Kerr magneto-optic effect (normally incident plane-polarized light becomes elliptically polarized in magnetic field. To be distinguished from ordinary elliptical polarization under oblique incidence and from electro-optical Kerr effect).
This place covers:
All aspects concerning the relationship between strain/stress/shape/volume of a material and a magnetic field/the magnetic properties of the material.
This place covers:
SQUIDs and superconductive magneto-resistance.
This place covers:
Magnetometers using the magneto-resistance in superconductors.
This place covers:
Microfluxgate sensors, e.g. manufactured in CMOS technology.
This place covers:
Aspects concerning magneto-impedance.
This place covers:
This class does not concern the sensors as such, but the adaptation of their environment for specific applications.
This place covers:
This class does not concern the sensors as such, but the adaptation of their environment for specific applications.
This place covers:
GMR, spin valve and AMR sensors.
This place covers:
TMR sensors.
This place covers:
Imaging of magnetic variables.
This place covers:
Aspects of measuring the different magnetic variables and may be classified in addition to the sub-classes of G01R 33/02.
G01R 33/0005 - G01R 33/0052 may be considered additionally.
This place covers:
Qualification of hard disks and MRAMs.
This place covers:
Investigation of magnetic properties and critical current of superconductors is classified.
This place covers:
Magnetic Biosensors.
This place covers:
Spintronics devices.
This place covers:
Aspects concerning domain wall analysis and racetrack memories.
This place covers:
Hysteresis measurements.
This place covers:
Aspects concerning magnetic susceptibility measurements.
This place covers:
Equipment for making measurements involving magnetic resonance such as nuclear magnetic resonance [NMR], magnetic resonance imaging [MRI], electron paramagnetic resonance [EPR], nuclear quadrupole resonance [NQR] or other spin resonance effects;
Technical details of the equipment;
Testing or calibrating of the equipment;
Activities involved in making the measurements or in processing the signals collected during the measurements.
The following places may also be relevant for classification:
A61B 5/055: Detecting, measuring or recording for diagnostic purposes
involving electronic or nuclear magnetic resonance
There is an overlap between the scope of G01R 33/20 (or its relevant subgroup) and A61B 5/055 in the sense that, depending on the disclosure of a given document, the document may have to be classified in G01R 33/20 (or its relevant subgroup) only, in A61B 5/055 only or in both places.
For instance, if the invention information of a document to be classified was primarily directed to the MR process as such (e.g. a novel pulse sequence which, according to the document, facilitates the diagnosis of a disease on the basis of the resulting MR images wherein the document merely mentions the diagnosis but does not specifically disclose its implementation in detail), the document should be classified in G01R 33/20 (or its relevant subgroup) and the additional information related to the diagnosis may be classified using the appropriate Indexing Code corresponding to A61B 5/055.
However, if the invention information of the document was primarily directed to the diagnosis as such (e.g. a novel way of processing MRI data in order to enable the diagnosis of a disease wherein the MRI data was acquired using a commonly known standard MRI technique), the document should be classified in A61B 5/055 only.
G01N 24/00 : Investigating or analysing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects
There is an overlap between the scope of G01R 33/20 (or its relevant subgroup) and G01N 24/00 (or its relevant subgroup) in the sense that, depending on the disclosure of a given document, the document may have to be classified in G01R 33/20 (or its relevant subgroup) only, in G01N 24/00 (or its relevant subgroup) only or in both places.
For instance, if the invention information of a document to be classified was primarily directed to the MR process as such (e.g. a novel pulse sequence which, according to the document, can be applied for analyzing materials wherein the document merely mentions this application but does not specifically disclose its implementation in detail), the document should be classified in G01R 33/20 (or its relevant subgroup) and the additional information related to the potential application for analyzing materials may be classified using the appropriate Indexing Code corresponding to G01N 24/00 (or its relevant subgroup).
However, if the invention information of the document was primarily directed to the analysis of a material using a known standard MR technique, the document should be classified in G01N 24/00 (or its relevant subgroup) only.
G01V 3/32: Electric or magnetic prospecting or detecting specially adapted for well-logging operating with electron or nuclear magnetic resonance
There is an overlap between the scope of G01R 33/20 (or its relevant subgroup) and G01V 3/32 in the sense that, depending on the disclosure of a given document, the document may have to be classified in G01R 33/20 (or its relevant subgroup) only, in G01V 3/32 only or in both places.
For instance, if the invention information of a document to be classified was primarily directed to the MR process as such (e.g. a novel pulse sequence which, according to the document, can be applied for MR in a borehole wherein the document merely mentions this application but does not specifically disclose its implementation in detail), the document should be classified in G01R 33/20 (or its relevant subgroup) and the additional information related to the potential application in the borehole may be classified using the appropriate Indexing Code of G01V 3/32.
However, if the invention information of the document was primarily directed to geophysics aspects or the application of MR in a borehole, the document should be classified in G01V 3/32 only.
This place does not cover:
In vivo contrast agents | |
Magnetic resonance gyrometers | |
Omegatrons using ion cyclotron resonance |
Examples of places where the subject matter of this place is covered when specially adapted, used for a particular purpose, or incorporated in a larger system:
Investigating or analyzing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects |
Attention is drawn to the following places, which may be of interest for search:
Detecting, measuring or recording for diagnostic purposes involving electronic or nuclear magnetic resonance | |
Investigating or analyzing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects | |
Electric or magnetic prospecting or detecting specially adapted for well-logging operating with electron or nuclear magnetic resonance | |
Two dimensional image generation, reconstruction from projection, e.g. tomography | |
Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties | |
Cores, Yokes, or armatures | |
Coils | |
Superconducting magnets | |
Permanent magnets | |
Electromagnets | |
Aerials | |
Screening of an apparatus or of components against electric or magnetic fields |
In this subgroup, classification of additional information, i.e. non-invention information, is compulsory using the appropriate Indexing Code (G01R 33/20 ... G01R 33/64).
Comments on subgroups:
G01R 33/323: For the purpose of classification in this subgroup, the expression "RF" is to be interpreted as referring to an RF magnetic field. Therefore, a document disclosing a technique of detecting MR using an RF electric field should be classified in this subgroup.
G01R 33/34046: For the purpose of classification in this subgroup, a "volume type coil" is to be understood as a coil which encloses the object to be investigated (in contrast to a surface coil which is positioned on a surface of the object to be investigated rather than enclosing the object).
G01R 33/34053: For the purpose of classification in this subgroup, a single-turn solenoid coil encircling the trunk of a patient to be investigated is understood as a volume type coil and therefore classified in subgroup G01R 33/34053.
In contrast thereto, a single-turn surface coil being placed on a surface of a patient is not understood as a volume type coil and should therefore not be classified in subgroup G01R 33/34053. Rather, classification symbol G01R 33/341 (or its subgroup G01R 33/3415) should be assigned in that case.
G01R 33/34061: For the purpose of classification in this subgroup, a Helmholtz coil is to be understood as any arrangement wherein two coils are placed symmetrically one on each side of the experimental area along a common axis.
Even if these coils are realized in the form of surface coils, the classification symbol G01R 33/341 should normally not be assigned.
G01R 33/34084 Implantable coils or coils being geometrically adaptable to the sample.
This subgroup does also cover coil assemblies with mutually movable parts, e.g. a Helmholtz coil assembly comprising two coils located on opposite sides of the trunk of a patient wherein the distance between the two coils can be adapted to the size of the trunk.
However, a single rigid surface coil which is mounted on a flexible mechanical support (e.g. a flexible arm) should not be classified in subgroup G01R 33/34084. Rather, classification symbol G01R 33/34007 should be assigned in that case.
G01R 33/3628: An RF coil being inductively matched to the transceiver in the sense that the RF coil is not galvanically connected to the transceiver, but only coupled to the transceiver via mutual inductance or mutual capacitance between the RF coil and a further coupling element (e.g. a driving coil), should not be classified in subgroup G01R 33/3628. Rather, classification symbol G01R 33/3642 should be assigned.
G01R 33/365 See comment under G01R 33/3657.
G01R 33/3657: For the purpose of classification in this subgroup as well as subgroup G01R 33/365, the "function" of the multiple RF coils is defined in relation to their use for spin excitation, MR signal reception or both.
For instance, an RF coil being used for exciting proton spins and another RF coil being used for exciting fluorine spins are therefore understood to perform the same function in MR, namely spin excitation.
G01R 33/4828: This group does not cover fat suppression which is to be classified under subgroup G01R 33/5607.
G01R 33/565: This subgroup does also cover the prevention of image distortions.
For instance, an RF coil being manufactured from susceptibility compensated wire, thereby preventing image distortions due to magnetic susceptibility variations, should be classified in the appropriate subgroup of G01R 33/565, probably using the corresponding Indexing Code (G01R 33/56536 in the example given above).
G01R 33/62: This subgroup covers the combined use of at least two different spin resonance techniques, e.g. the combined use of NMR and NQR.
This group does not cover RF coils being resonant at two distinct Larmor frequencies. Rather, such RF coils are covered by subgroup G01R 33/3635.
In this place, the following terms or expressions are used with the meaning indicated:
NMR | nuclear magnetic resonance |
EMR | electron magnetic resonance |
EPR | electron paramagnetic resonance |
ESR | electron spin resonance |
MRI | magnetic resonance imaging |
NQR | nuclear quadrupole resonance |
This place does not cover:
Calibration of tester hardware for testing digital circuits |
This place covers:
Calibrating of measuring devices such as network analysers, but also other measuring devices of the preceding groups.
This place does not cover:
Calibration of single magnetic sensors |
This place covers:
Standards or reference devices comprising new aspects and being new over standards known in the art.
Attention is drawn to the following places, which may be of interest for search:
Measuring number of turns, measuring transformation ratio | |
Testing of electric windings |
Attention is drawn to the following places, which may be of interest for search:
Electromechanical arrangements for measuring time integral of electric power or current | |
Other arrangements for measuring time integral of electric power or current, e.g. by electronic methods |