CPC Definition - Subclass G01R
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| MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (measuring physical variables of any kind by conversion into electric variables, see Note (4) following the title of class G01; measuring diffusion of ions in an electric field, e.g. electrophoresis, electro-osmosis G01N; investigating non-electric or non-magnetic properties of materials by using electric or magnetic methods G01N; indicating correct tuning of resonant circuits H03J 3/12; monitoring electronic pulse counters H03K 21/40; monitoring operation of communication systems H04) Definition statement This place covers: Measuring electric variables or properties. Measuring electric variables directly, e.g. electromechanical instruments (see Glossary of terms) where the measured electric variables directly effect the indication of the measured value. Measuring electric variables by derivation from other electric variables, i.e. arrangements (see Glossary of terms) involving circuitry to obtain an indication of a measured value by deriving, calculating or otherwise processing electric variables, e.g. by comparison with another value. Measuring or investigating electric properties of materials. Electric testing of analogue or digital electric devices, apparatus or networks, or measuring their characteristics. Indicating presence or sign of current or voltage. The following technical subjects are therefore covered, the list being non-exhaustive: Measuring time integral of electric power or current (i.e. Energy), e.g. Of consumption Displaying electric variables or waveforms Measuring currents or voltages or for indicating presence or sign thereof Measuring electric power or power factor Measuring time integral of electric power or current, e.g. By electronic methods Measuring frequencies (of electric signals); measuring and analysing frequency spectra (of electric signals) Measuring phase angle between a voltage and a current or between voltages or currents Measuring resistance, reactance, impedance, or electric characteristics derived therefrom Testing electric properties of apparatus, e.g. Discharge tubes, amplifiers, transistors, integrated circuits Locating electric faults Electrical testing characterised by what is being tested not provided for elsewhere Testing for digital signal parameters (delay, skew, signal level) and characterization of device performance by use of test patterns; test apparatus or integrated test circuits therefor; methods for test pattern generation Details, testing or calibrating of G01R related instruments or arrangements Measuring magnetic variables or properties Measuring magnetic variables. Measuring or investigating magnetic properties of materials. The following technical subjects are therefore covered, the list being non-exhaustive: Measuring direction or amount of magnetic fields, or measuring characteristics of magnetic materials Apparatus based on magnetic resonance, e.g. Nmr, mri, epr (i.e. Esr) (see synonyms and keywords) and not specially adapted for a particular application Details, testing or calibrating of related instruments or arrangements Relationships with other classification places Investigating electric variables or properties This subclass covers measuring or investigating electric properties of materials, whereas measuring or investigating non-electric or non-magnetic properties of materials by the use of electric means or based on electrical variables is covered by e.g. group G01N 27/00. Investigating magnetic variable or properties This subclass also covers, under group G01R 33/00, measuring or investigating magnetic properties of materials, whereas measuring or investigating non-magnetic or non-electric properties of materials by the use of magnetic means is covered by group G01N 27/72. In particular, group G01R 33/20 covers measuring magnetic variables/properties by using magnetic resonance, e.g. NMR, EPR or other spin effects, whereas investigating or analysing materials by using such spin effects is covered by group G01N 24/00. References Application-oriented references Examples of places where the subject matter of this place is covered when specially adapted, used for a particular purpose, or incorporated in a larger system:
References out of a residual place Examples of places in relation to which this place is residual:
Informative references Attention is drawn to the following places, which may be of interest for search:
Special rules of classification Concerning the "measuring of electric variables" part, the following applies when classifying: The most pertinent group is given as an EC. If several groups are equally pertinent (so if it is not clear which EC to allocate), several EC's or an EC and additional Indexing Codes are given. General remark: G01R (electric part) is a big subclass with many low level subgroups. When classifying at group or subgroup level, care should taken to see to it that the document(s) really concern the measuring of an electric variable and that all higher level (subclass, group, subgroup) definitions are met with. The scheme was created at a time when electromechanical instruments were common. The groups closely linked to such instruments are rarely used for classifying measuring or testing devices that fall under G01R. It means what it says; many groups of G01R are not used any more, because the definitions are outdated (contrary to other fields we do not "bend" EC interpretations to fit present days technology. Glossary of terms In this place, the following terms or expressions are used with the meaning indicated:
Synonyms and Keywords In patent documents, the following abbreviations are often used:
General constructional details (details of a kind applicable to measuring arrangements not specially adapted for a specific variable G01D 7/00) Definition statement This place covers: Structural, tangible details of devices. References Limiting references This place does not cover:
Housings; Supporting members; Arrangements of terminals ("burn-in" aspects G01R 31/286; terminals H01R; terminal strips or boards H02B; housings for electrical apparatus H05K) Relationships with other classification places Details concerning arrangements of terminals for the testing of circuits, which do not fit into the definitions of G01R 1/04 and dependent subgroups, are classified in G01R 31/2886. Examples: Contacting devices or procedures without clear mechanical or geometrical features (as defined in the subgroups of G01R 1/04). {Test clips, e.g. for IC's} Definition statement This place covers: Test clips, which are contacting devices that clip onto the integrated circuit to be tested. Measuring probes {(plugs, sockets or clips G01R 1/0408; testing of connections G01R 31/04; contacting IC's for test purposes when probe design is not the essential feature G01R 31/2886; using radiation beam as probe G01R 31/302; end pieces for wires terminating in a probe H01R 11/18)} Definition statement This place covers: Probes for connecting to electric devices for measuring or testing purposes. Relationships with other classification places Connecting devices or methods for the testing of electrical circuits which do not fit into G01R 1/067 or a subgroup of G01R 1/067 are classified in G01R 31/2886. Sockets, and details of sockets such as contacts, for receiving integrated circuits for testing are classified in G01R 1/0433. {Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins} Definition statement This place covers: Constructional details of individual probe elements or tips. References Limiting references This place does not cover:
Informative references Attention is drawn to the following places, which may be of interest for search:
{Microprobes, i.e. having dimensions as IC details} Definition statement This place covers: Geometric details where the dimensions are of microscopic dimensions, corresponding to features of integrated elements. {Material aspects} Definition statement This place covers: Details related to the material as such (alloy, heat treatment, surface deposit...) {Input circuits therefor} Definition statement This place covers: Circuits being part of or closely linked to a probe, such as amplifiers, filters or power supplies integrated in a probe. {High frequency probes} Definition statement This place covers: Probes adapted for the measuring of high frequencies, for example by having low inductance leads, low loss or linear frequency properties. {High voltage probes} Definition statement This place covers: Probes specially adapted for measuring high voltages. Definition statement This place covers: Probes having multiple contacting points {arranged on a flexible frame or film} Definition statement This place covers: Probes mounted on a flexible membrane, such as so called "membrane probes". {with flexible bodies, e.g. buckling beams} Definition statement This place covers: Probes having long needles, which flex when pressed against the DUT. References Limiting references This place does not cover:
Glossary of terms In this place, the following terms or expressions are used with the meaning indicated:
{with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch} Definition statement This place covers: Features related to geometrical adaption between probe tips and probe output, e.g. using an adapter board. {manipulating each probe element or tip individually} Definition statement This place covers: Manipulation of one or more individual probe elements, e.g. the tip part. References Informative references Attention is drawn to the following places, which may be of interest for search:
Screening arrangements against electric or magnetic fields, e.g. against earth's field {(measuring shielding efficiency H05K 9/0069)} References Informative references Attention is drawn to the following places, which may be of interest for search:
Instruments for converting a single current or a single voltage into a mechanical displacement (vibration galvanometers G01R 9/02) Definition statement This place covers: Instruments classified in this group may be used as indicating instruments for electric or non-electric variables. Instruments capable of converting two or more currents or voltages into a single mechanical displacement (G01R 9/00 takes precedence) Definition statement This place covers: Instruments classified in this group may be used as indicating instruments for electric or non-electric variables. References Limiting references This place does not cover:
Electromechanical arrangements for measuring time integral of electric power {, i.e. electric energy} or current, e.g. of consumption ({other arrangements for measuring time integral of electric power or current G01R 22/00; boards, panels, desks for energy meters, H02B 1/03}; monitoring electric consumption of electrically-propelled vehicles B60L 3/00) Definition statement This place covers: Electromechanical arrangements for measuring time integral of electric power or current such as conventional electromechanical electricity meters, i.e. comprising a rotating disk. References Limiting references This place does not cover:
Constructional details (applicable to electric measuring instruments in general G01R 1/00) Definition statement This place covers: Unless one of the subgroups apply, add-ons, such as electronic counters or optical ports, are seen as "constructional details". Housings; Supporting racks; Arrangements of terminals Definition statement This place covers: Housings for electromechanical electricity meters. "Supporting racks" are the internal supports for holding the Ferraris wheels, decade counters, transformers and other internal components of the electromechanical electricity meters. See e.g. US4791362, CH158284. Relationships with other classification places Housings which are used only for electronic meters are classified in G01R 22/065. Supporting, cabinets comprising installation places for electricity meters but also other installation places e.g. for circuit breakers are classified in H02B 1/03. References Limiting references Arrangements for avoiding or indicating fraudulent use {(measures against unauthorised operation of bolts, nuts or pins F16B 41/005; security seals G09F 3/03; preventing of tampering with detection circuits in signaling or alarm circuits G08B 29/046)} Relationships with other classification places If the arrangement for avoiding or indicating fraudulent use is related to electronic electricity meters the document should be classified in the corresponding subgroups of G01R 22/066 . Arrangements for indicating or signalling faults (seals G09F 3/03; preventing tampering with detection circuits in signalling or alarm circuits G08B 29/046) Relationships with other classification places If the arrangement for indicating or signalling faults is related to electronic electricity meters the document should be classified in the corresponding subgroups of G01R 22/068 . References Limiting references This place does not cover:
Special tariff meters (tariff metering in general G01D 4/00) References Informative references Attention is drawn to the following places, which may be of interest for search:
Multi-rate meters (G01R 11/63 takes precedence) References Limiting references This place does not cover:
Arrangements for displaying electric variables or waveforms (display by mechanical displacement only G01R 5/00, G01R 7/00, G01R 9/00; recording frequency spectrum G01R 23/18) Definition statement This place covers: Oscilloscopes and the like for measuring and displaying waveforms. Relationships with other classification places If the document is directed to aspects of measuring of current or voltage (e.g. A/D conversion, signal conditioning) the classes G01R 19/2506 and lower take preference. Modular arrangements for computer based systems (e.g. virtual systems) are classified in G01R 19/2516 (when the document is related to the measuring part). Recording frequency spectrum is classified in G01R 23/18 References Limiting references This place does not cover:
for displaying measured electric variables in digital form ({using LCD's or LED's G01R 13/40} ; counters G06M; analogue/digital conversion in general H03M 1/00) Definition statement This place covers: All digital oscilloscopes. Relationships with other classification places Older type cathode-ray oscilloscopes using digital processors and intermediate A.D. and D.A. converters are classified in G01R 13/345. If the emphasis is set on the current or voltage measuring part, e.g. signal conditioning, details concerning sampling, digitizing G01R 19/2506 and lower, as well as G01R 19/252, G01R 19/255 and G01R 19/257 take preference. Modular arrangements for computer based systems are classified in G01R 19/2516. When the type of the display is of importance, e.g. LCD display G01R 13/403 is used. References Limiting references This place does not cover:
Informative references Attention is drawn to the following places, which may be of interest for search:
{in numerical form} Definition statement This place covers: Systems for displaying a waveform by a table or the like with numerical values. Other characterising values, even single values, of waveforms are also covered here. Relationships with other classification places Displaying charts of waveforms are classified in G01R 13/0218 and lower and in G01R 13/029 or in the parent class G01R 13/02. {for triggering, synchronisation} References Limiting references This place does not cover:
{for sampling} Definition statement This place covers: Details of sampling circuits when they are used only in digital oscilloscopes. Relationships with other classification places More general details of sampling are classified in G01R 19/2506 and lower. These classes can in cases of interest also be given in parallel. References Limiting references This place does not cover:
{Software therefor} Definition statement This place covers: Software used in digital oscilloscopes and the like. References Limiting references This place does not cover:
Special rules of classification If the software calculates a trigger event an additional class is given in G01R 13/0254 (although the title thereof relates to circuits). Similarly the other groups of G01R 13/0218 are given in parallel to G01R 13/029. Cathode-ray oscilloscopes {; Oscilloscopes using other screens than CRT's, e.g. LCD's; (control arrangements or circuits for cathode-ray tube indicators G09G 1/00; cathode ray tubes H01J 31/00)} Definition statement This place covers: Analogue oscilloscopes with cathode-ray screens or oscilloscopes which have an intermediate digital part but which use a traditional cathode-ray screen. Relationships with other classification places Digital oscilloscopes are classified in G01R 13/02 and lower. If the type of display is of interest, G01R 13/40 and lower is used, e.g. G01R 13/403 for liquid crystal displays (LCD). References Limiting references This place does not cover:
{Non-electric appliances, e.g. scales, masks (luminescent screens for CRT provided with permanent marks or references H01J 29/34; optical or photographic arrangements combined with CRT vessels H01J 29/89)} References Limiting references This place does not cover:
{Using means for generating permanent registrations, e.g. photographs (optical or photographic arrangements combined with CRT vessel H01J 29/89)} References Limiting references This place does not cover:
{Arrangements for obtaining a 3- dimensional representation (stereoscopic T.V. H04N 13/00)} References Limiting references This place does not cover:
Circuits therefor (circuits for generating pulses, e.g. saw-tooth waveforms H03K 3/00) References Limiting references This place does not cover:
{particularly adapted for storage oscilloscopes} Definition statement This place covers: Circuits of analogue storage oscilloscopes. References Limiting references This place does not cover:
Circuits for simultaneous or sequential presentation of more than one variable (electronic switches H03K 17/00) References Limiting references This place does not cover:
Circuits for representing a single waveform by sampling, e.g. for very high frequencies (sample and hold arrangements G11C 27/02) References Limiting references This place does not cover:
{for displaying periodic H.F. signals (G01R 13/345 takes precedence)} References Limiting references This place does not cover:
{for displaying sampled signals by using digital processors by intermediate A.D. and D.A. convertors (control circuits for CRT indicators)} Definition statement This place covers: Cathode-ray oscilloscopes whereby the intermediary signal processing is performed by a digital processor but the resulting waveform is converted back to an analogue signal to be displayed on the cathode-ray screen. References Limiting references This place does not cover:
{using electro-optic elements} References Limiting references This place does not cover:
using the steady or oscillatory displacement of a light beam by an electromechanical measuring system (such measuring systems per se G01R 5/00, G01R 7/00, G01R 9/00) Relationships with other classification places using modulation of a light beam otherwise than by mechanical displacement, e.g. by Kerr effect {(visual indication of correct tuning H03J 3/14)} Definition statement This place covers: Documents where the type of the display of the oscilloscope is of interest. Relationships with other classification places Cathode ray oscilloscopes are classified in G01R 13/20 and lower. Digital oscilloscopes wherein the type of display is not of importance are classified in G01R 13/02 and lower. References Limiting references This place does not cover:
{using active, i.e. light-emitting display devices, e.g. electroluminescent display (G01R 13/36 and G01R 13/42 take precedence)} References Limiting references This place does not cover:
{using passive display devices, e.g. liquid crystal display or Kerr effect display devices} Definition statement This place covers: Documents where the type of the display of the oscilloscope is of interest. Relationships with other classification places Cathode ray oscilloscopes are classified in G01R 13/20 and lower. Digital oscilloscopes wherein the type of display is not of importance are classified in G01R 13/02 and lower. {for discontinuous display, i.e. display of discrete values (analogue/digital conversion H03M 1/00)} References Informative references Attention is drawn to the following places, which may be of interest for search:
{representing measured value by a dot or a single line (G01R 13/408 takes precedence)} References Limiting references This place does not cover:
{using a plurality of passive display elements, e.g. liquid crystal or Kerr-effect display elements (G01R 13/408 takes precedence)} References Limiting references This place does not cover:
Details of measuring arrangements of the types provided for in groups G01R 17/00 - G01R 29/00 and G01R 33/00 - G01R 35/00 (details of instruments G01R 1/00; overload protection arrangements G01R 1/36) References Limiting references {Circuits for altering the indicating characteristic, e.g. making it non-linear} References Informative references Attention is drawn to the following places, which may be of interest for search:
Circuits for altering the measuring range References Informative references Attention is drawn to the following places, which may be of interest for search:
using capacitive devices {(circuits constituting a voltage divider G01R 15/06)} Definition statement This place covers: Measuring of voltage or through capacitive coupling with the conductor to be measured. References Limiting references This place does not cover:
using inductive devices, e.g. transformers Definition statement This place covers: Measuring current or voltage using coils or transformers (having interacting windings; the primary winding can be made up by a straight conductor surrounded by the secondary). References Limiting references This place does not cover:
Informative references Attention is drawn to the following places, which may be of interest for search:
using galvano-magnetic devices, e.g. Hall-effect devices {, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices (electromechanical such devices, G01R 5/00, G01R 7/00, G01R 9/00; measuring magnetic fields G01R 33/02)} References Limiting references This place does not cover:
Glossary of terms In this place, the following terms or expressions are used with the meaning indicated:
{using Hall-effect devices (Hall elements in arrangements for measuring electrical power G01R 21/08)} References Informative references Attention is drawn to the following places, which may be of interest for search:
{using electro-optical modulators, e.g. electro-absorption (probes containing electro-optic elements G01R 1/071)} References Informative references Attention is drawn to the following places, which may be of interest for search:
Arrangements for measuring currents or voltages or for indicating presence or sign thereof (G01R 5/00 takes precedence; {voltage measurements using secondary electron emission when testing electronic circuits G01R 31/305} ; for measuring bioelectric currents or voltages A61B 5/04) References Limiting references This place does not cover:
{Measuring mean values of current or voltage during a given time interval} References Informative references Attention is drawn to the following places, which may be of interest for search:
{Circuits for comparing several input signals and for indicating the result of this comparison, e.g. equal, different, greater, smaller (comparing pulses or pulse trains according to amplitude)} References Informative references Attention is drawn to the following places, which may be of interest for search:
Measuring effective values, i.e. root-mean-square values References Informative references Attention is drawn to the following places, which may be of interest for search:
Measuring peak values {or amplitude or envelope} of ac or of pulses Definition statement This place covers: Measuring of amplitude of periodic voltage or current is also covered. References Informative references Attention is drawn to the following places, which may be of interest for search:
Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values (circuits with regenerative action, e.g. Schmitt trigger H03K 3/00; threshold switches H03K 17/00) Definition statement This place covers: Threshold detectors as such, when seen as a measurement circuit (for current or voltage). References Informative references Attention is drawn to the following places, which may be of interest for search:
Indicating the instants of passage of current or voltage through a given value, e.g. passage through zero References Informative references Attention is drawn to the following places, which may be of interest for search:
using digital measurement techniques (arrangements for displaying measured electric variables in digital form G01R 13/02 {Analogue/digital conversion H03M}) References Informative references Attention is drawn to the following places, which may be of interest for search:
using analogue/digital converters of the type with conversion of voltage or current into frequency and measuring of this frequency References Informative references Attention is drawn to the following places, which may be of interest for search:
using analogue/digital converters of the type with counting of pulses during a period of time proportional to voltage or current, delivered by a pulse generator with fixed frequency References Informative references Attention is drawn to the following places, which may be of interest for search:
using analogue/digital converters of the type with comparison of different reference values with the value of voltage or current, e.g. using step-by-step method References Informative references Attention is drawn to the following places, which may be of interest for search:
adapted for measuring in circuits having distributed constants Definition statement This place covers: Adaptations where the measured signals have wavelengths in the order of magnitude of the circuits present, i.e. high frequencies (theoretically, signals on very long conductors are also covered, but such applications are unusual). References Informative references Attention is drawn to the following places, which may be of interest for search:
Arrangements for measuring electric power or power factor (G01R 7/12 takes precedence) Definition statement This place covers: Analogue and digital measurements of power or power factor. Also measurements of power for high frequency signals. This group covers additionally the measurement of power when it is an essential aspect of a measurement of electric energy (time integral of power). Relationships with other classification places Electronic measurements of energy (time integral of power) is classified in G01R 22/06 when the power measurement therein is not the essential part. References Limiting references This place does not cover:
{Measuring real or reactive component; Measuring apparent energy (G01R 21/01, G01R 21/02, G01R 21/08, G01R 21/10 and G01R 21/127 take precedence)} References Limiting references This place does not cover:
{Measuring real component} References Limiting references This place does not cover:
{Measuring reactive component} References Limiting references This place does not cover:
{Measuring apparent power} References Limiting references This place does not cover:
{Adapted for special tariff measuring (G01R 21/01, G01R 21/02, G01R 21/08, G01R 21/10, G01R 21/1278 and G01R 21/1333 take precedence)} References Limiting references This place does not cover:
{Measuring maximum demand} Definition statement This place covers: maximum load or demand monitors. in circuits having distributed constants (G01R 21/04, G01R 21/07, G01R 21/09, G01R 21/12 take precedence) Definition statement This place covers: Power measurements whereby the wavelength comes into the geometrical order of the underlying medium, i.e. for very high frequencies. References Limiting references This place does not cover:
by thermal methods {, e.g. calorimetric} Definition statement This place covers: Power measurements by thermal methods for high frequency signals. in circuits having distributed constants Definition statement This place covers: Power measurements by thermal methods whereby the wavelength comes into the geometrical order of the underlying medium, i.e. for very high frequencies. by measuring current and voltage (G01R 21/08 - G01R 21/133 take precedence) References Limiting references This place does not cover:
in circuits having distributed constants (G01R 21/09 takes precedence) Definition statement This place covers: Power measurements by using voltage and current measurements whereby the wavelength comes into the geometrical order of the underlying medium, i.e. for very high frequencies. References Limiting references This place does not cover:
by using galvanomagnetic effect devices, e.g. Hall effect devices (such devices per se H01L; {for current measurements only, see G01R 15/20}) References Limiting references This place does not cover:
in circuits having distributed constants Definition statement This place covers: Power measurements by using galvano-magnetic effect devices whereby the wavelength comes into the geometrical order of the underlying medium, i.e. for very high frequencies. by using square-law characteristics of circuit elements, e.g. diodes, to measure power absorbed by loads of known impedance (G01R 21/02 takes precedence) Definition statement This place covers: Power measurement for high frequency signals which use such square-law characteristics of circuit elements. References Limiting references This place does not cover:
in circuits having distributed constants Definition statement This place covers: Power measurements by using square-law characteristics of circuit elements whereby the wavelength comes into the geometrical order of the underlying medium, i.e. for very high frequencies. by using pulse modulation (G01R 21/133 takes precedence {; digital multiplication via delta sigma modulation G06F 7/60}) References Limiting references This place does not cover:
by using digital technique Definition statement This place covers: Power meters using a digital processor. Additionally measurements of power in meters for electric energy (time integral of power) when the measurement of power is the essential aspect. Relationships with other classification places Digital energy meters (time integral of power) are classified in G01R 22/10 when the power measuring part thereof is not of main importance. However if the power measuring aspect in such digital energy meters is of main interest then it is classified here in G01R 21/133 and lower. Digital measurements of voltages or currents in electric power systems are classified in G01R 19/2513, e.g. for monitoring the quality of the power signal. References Limiting references This place does not cover:
{Measuring maximum demand} Definition statement This place covers: Maximum load or maximum demand power meters. Arrangements for measuring time integral of electric power or current, e.g. by electricity meters {(electromechanical arrangements therefor G01R 11/00; monitoring electric consumption of electrically-propelled vehicles B60L 3/00; coin freed devices G07F 15/00)} Definition statement This place covers: Methods other than electromechanical for measuring time integral of electric power. Relationships with other classification places An arrangement for measuring time integral of electric power is classified in group G01R 21/00 if the essential characteristic is the measuring of electric power. References Limiting references This place does not cover:
by electronic methods Definition statement This place covers: Electronic methods for measuring time integral of power, whereby analogue or digital techniques can be used. {related to remote communication} Definition statement This place covers: Aspects of electricity meters for remote reading in the sense that the meter has special adaptations which go beyond standard communication systems. Relationships with other classification places Managing power networks by using distributed power monitors and using standard communication protocols is classified in H02J 13/00. If the communication protocol as such is of interest the document is classified in H04B 1/00. References Limiting references This place does not cover:
{related to mechanical aspects} Definition statement This place covers: Housings specially adapted (or used only) for electronic electricity meters. This group also covers adaptations to the housing of an electronic electricity meter in order to add a certain functionality and whereby mechanical aspects of this adaptation are of importance. References Limiting references This place does not cover:
{Arrangements for avoiding or indicating fraudulent use} References Limiting references This place does not cover:
using analogue techniques Definition statement This place covers: Electricity meters which are based on an analogue electronic circuit. References Limiting references This place does not cover:
using digital techniques Definition statement This place covers: Digital arrangements for measuring time integral of electric power, such as electricity meters, whereby the digital processing is of importance. Relationships with other classification places Details relating to measuring of electric power are classified in G01R 21/133. Digital measurements of voltages or currents in electric power systems are classified in G01R 19/2513, e.g. for monitoring the quality of the power signal. Arrangements for measuring frequencies; Arrangements for analysing frequency spectra (frequency discriminators H03D; {high frequency probes G01R 1/06772}) Definition statement This place covers: Arrangements for measuring frequencies of electrical signals as such. arrangements for analysing frequency spectra of electric signals if the analysis thereof comprises aspects of the determination of frequency components. Relationships with other classification places The mere use of known frequency measurement or analysis methods or devices is classified in the appropriate application class, such as G01N 27/00 or G01N 22/00. References Limiting references This place does not cover:
{Circuits for comparing several input signals and for indicating the result of this comparison, e.g. equal, different, greater, smaller (comparing phase or frequency of 2 mutually independent oscillations in demodulators)} References Limiting references This place does not cover:
Arrangements for measuring frequency, e.g. pulse repetition rate {(using vibrating reeds G01R 9/04)} Arrangements for measuring period of current or voltage (measuring short-time intervals G04F) References Limiting references adapted for measuring in circuits having distributed constants Definition statement This place covers: Measurements of frequencies whereby the wavelength comes into the geometrical order of the underlying medium, i.e. for very high frequencies. using response of circuits tuned on resonance, e.g. grid-drip meter Definition statement This place covers: Measuring instruments using a resonant frequency, e.g. an oscillator output energy which changes in the vicinity of a resonant circuit which is tuned to the frequency the oscillator generates. using analogue integrators, e.g. capacitors establishing a mean value by balance of input signals and defined discharge signals or leakage (radiation-measuring instruments in which pulses generated by a radiation detector are integrated G01T 1/15) References Limiting references This place does not cover:
by heterodyning; by beat-frequency comparison (generation of oscillations by beating unmodulated signals of different frequencies H03B 21/00) Definition statement This place covers: Frequency measurements wherein signals of different frequencies are combined in order to generate intermediate frequencies / interference signals which are used for the measurement (heterodyning). Also frequency measurements based on a comparison to a signal of a similar reference frequency. References Limiting references This place does not cover:
{by heterodyning or by beat-frequency comparison with the harmonic of an oscillator} Definition statement This place covers: Frequency measurements wherein the reference signal is a harmonic signal of an (adjustable) oscillator. {giving an indication of the number of times this occurs, i.e. multi-channel analysers (for pulse characteristics)} Definition statement This place covers: Also digital determinations of a single frequency. Spectrum analysis; Fourier analysis {(computing with Fourier series or Walsh functions G06F 17/14, G06G 7/19; spectral data processing)} Definition statement This place covers: Spectrum-analysers and the like, e.g. digital spectrum analysers using algorithms performed on a microprocessor whereby the electric signal measurement apparatus, and not only a pure mathematical algorithm, is of interest. Relationships with other classification places Digital spectrum analysers are normally classified in this class unless one or more of the subgroups are relevant. The subgroups are however directed to devices for spectrum analysis which were not based on algorithm performed on microprocessors. Determination of a single frequency is classified in G01R 23/15. Frequency selective measuring of voltage level is classified in G01R 19/04. References Limiting references This place does not cover:
Synonyms and Keywords In patent documents, the following abbreviations are often used:
adapted for measuring in circuits having distributed constants Definition statement This place covers: Spectrum analysis for frequencies whereby the wavelength comes into the geometrical order of the underlying medium, i.e. for very high frequencies. References Limiting references This place does not cover:
with digital filters Relationships with other classification places Digital spectrum analysers using an algorithm performed on a microprocessor are classified in G01R 23/16. Wobbulating devices similar to swept panoramic receivers (panoramic receivers per se H03J 7/32) References Limiting references This place does not cover:
with provision for recording frequency spectrum Definition statement This place covers: For example devices which such provisions for recording in order to display the result on a screen. Measurement of non-linear distortion {, e.g. harmonics or noise, (G01R 31/31708 takes precedence; noise figure G01R 29/26)} Definition statement This place covers: The measurement of non-linear distortion by frequency analysis. References Limiting references This place does not cover:
Arrangements for measuring phase angle between a voltage and a current, or between voltages or currents (measuring power factor G01R 21/00; measuring position of individual pulses in a pulse train G01R 29/02; phase discriminators H03D) Definition statement This place covers: Phase measurements of electrical signals as such. References Limiting references This place does not cover:
Application-oriented references Examples of places where the subject matter of this place is covered when specially adapted, used for a particular purpose, or incorporated in a larger system:
{Circuits for comparing several input signals and for indicating the result of this comparison, e.g. equal, different, greater, smaller, or for passing one of the input signals as output signal} References Limiting references This place does not cover:
in circuits having distributed constants Definition statement This place covers: Phase measurements whereby the wavelength comes into the geometrical order of the underlying medium, i.e. for very high frequencies. by counting of standard pulses (measuring time intervals G04F) References Limiting references This place does not cover:
Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom {(measuring superconductive properties G01R 33/1238)} Definition statement This place covers: Measurements of resistance, reactance or impedance as such whereby the measurement comprises aspects which are not generally known in the art. Relationships with other classification places The use of such measurements is classified in the appropriate application places. References Limiting references This place does not cover:
Application-oriented references Examples of places where the subject matter of this place is covered when specially adapted, used for a particular purpose, or incorporated in a larger system:
Informative references Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant (by measuring phase angle only G01R 25/00) Definition statement This place covers: Measurements of complex impedance. Groups G01R 27/02 - G01R 27/22 cover variables that directly or indirectly can be measured over two poles of a component or a Thevenin two-pole equivalent. Subgroup G01R 27/26 also covers other techniques, e.g. using electro-magnetic waves or network analyzers. Measurements of capacitance only is classified in G01R 27/2605. Measurements of inductance only is classified in G01R 27/2611. References Limiting references This place does not cover:
{Measuring very high resistances, e.g. isolation resistances, i.e. megohm-meters} References Limiting references This place does not cover:
in circuits having distributed constants {, e.g. having very long conductors or involving high frequencies} Definition statement This place covers: Impedance measurements whereby the wavelength comes into the geometrical order of the underlying medium, i.e. for very high frequencies. Measuring reflection coefficients; Measuring standing-wave ratio References Limiting references This place does not cover:
Measuring resistance by measuring current or voltage obtained from a reference source (G01R 27/16, G01R 27/20, G01R 27/22 take precedence) References Limiting references This place does not cover:
Measuring resistance to earth {, i.e. line to ground} Definition statement This place covers: Measurements of resistance between a high voltage line and ground when current from another source is passing the high voltage line. References Limiting references This place does not cover:
Measuring earth resistance; Measuring contact resistance, {e.g.} of earth connections, e.g. plates Definition statement This place covers: Measurements of resistance of lines which are intended for grounding, such as the resistance of the PE line or of the resistance of the earth as such. References Limiting references This place does not cover:
{Measuring contact resistance of connections, e.g. of earth connections} Definition statement This place covers: Contact resistance measurements, e.g. of earth connections, but also of other connections, e.g. between terminal blades and sockets. References Limiting references This place does not cover:
Measuring resistance of fluids (measuring vessels, electrodes therefor G01N 27/07) References Limiting references This place does not cover:
Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants {; Measuring impedance or related variables} Special rules of classification The group G01R 27/26 represents only a parent-class which is not actively used. Instead the groups G01R 27/2605 - G01R 27/2688 are used. In cases where an impedance with a real and an imaginary part is determined, and none of the groups listed hereabove are relevant, the group G01R 27/02 is used. {Measuring capacitance (capacitive sensors G01D 5/24)} Definition statement This place covers: Measurements of capacitance as such in the sense that particular steps of the measurement or particular features thereof are disclosed. Only in very rare and exceptional cases where the capacity measurement has particular aspects capacitive sensors may be classified here. References Application-oriented references Examples of places where the subject matter of this place is covered when specially adapted, used for a particular purpose, or incorporated in a larger system:
Special rules of classification The mere use of an existing capacity measurement method or device should not be classified in this group. In particular no sensors which are based on capacitance effects are classified here. Such sensors are classified in the classes of the corresponding applications. {Measuring inductance} Definition statement This place covers: Measurements of inductance as such in the sense that particular steps of the measurement or particular features thereof are disclosed. Only in very rare and exceptional cases where the inductance measurement has particular aspects, sensors may be classified here. References Application-oriented references Examples of places where the subject matter of this place is covered when specially adapted, used for a particular purpose, or incorporated in a larger system:
{Measuring dielectric properties, e.g. constants (testing dielectric strength G01R 31/12; detecting insulation faults G01R 31/025; G01R 27/2688 takes precedence)} Definition statement This place covers: Measurements of the relative permittivity  or the like of a dielectric material. References Limiting references This place does not cover:
{Measuring-systems or electronic circuits (G01R 27/2635, G01R 27/2682 take precedence)} References Limiting references This place does not cover:
{Bridge circuits (bridges for measuring loss angle G01R 27/2694)} References Limiting references This place does not cover:
{Cavities, resonators, free space arrangements, reflexion or interference arrangements (G01R 27/2647 takes precedence; optical methods G01R 27/2682)} References Limiting references This place does not cover:
{Measuring quality factor or dielectric loss, e.g. loss angle, or power factor (power factor related to power measurements G01R 21/006; testing capacitors G01R 31/016)} Definition statement This place covers: Dielectric loss measurements e.g. of cables. References Limiting references This place does not cover:
Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks {using network analysers} Measuring transient response (in line transmission systems H04B 3/46) Definition statement This place covers: For example hf network analysers. Relationships with other classification places Calibrations of network analysers are classified in G01R 35/005 and G01R 27/28 in parallel if the network analyser differs from known network analysers. The use of known network analysers for special applications is classified in the corresponding classes of the applications, e.g. for analysis of materials in G01N 27/00. References Limiting references This place does not cover:
in circuits having distributed constants {, e.g. having very long conductors or involving high frequencies} Definition statement This place covers: Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks whereby the wavelength comes into the geometrical order of the underlying medium, i.e. for very high frequencies, and this fact is essential for the invention. Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time, duration (of amplitude G01R 19/00; of repetition rate G01R 23/00; of phase difference of two cyclic pulse trains G01R 25/00; monitoring pattern of pulse trains H03K 5/19) References Limiting references This place does not cover:
{the pulse characteristic being rise time (measuring rate of change G01R 19/12)} References Limiting references This place does not cover:
Measuring form factor, i.e. quotient of root-mean-square value and arithmetic mean of instantaneous value; Measuring peak factor, i.e. quotient of maximum value and root-mean-square value References Limiting references This place does not cover:
Measuring depth of modulation References Limiting references This place does not cover:
Measuring electromagnetic field characteristics {(measuring electrostatic fields G01R 29/12; for determining a voltage G01R 15/14; measuring magnetic fields G01R 33/00; measuring or estimating received signal strength H04B 17/318)} References Limiting references This place does not cover:
{Field measurements related to measuring influence on or from apparatus, components or humans (EMC, EMI and similar testing in general G01R 31/001), e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning} References Informative references Attention is drawn to the following places, which may be of interest for search:
{rooms and test sites therefor, e.g. anechoic chambers, open field sites or TEM cells (for testing antennas G01R 29/105)} References Limiting references This place does not cover:
{for detecting presence or location of electric lines or cables (fault detection G01R 31/02; fault location G01R 31/08)} References Limiting references This place does not cover:
{Dosimetry, i.e. measuring the time integral of radiation intensity; Level warning devices for personal safety use (nuclear radiation dosimetry G01T)} References Limiting references This place does not cover:
{characterised by constructional or functional features (not used, see subgroups)} Special rules of classification This group is not used, only the subgroups thereof are used. {Complete apparatus or systems; circuits, e.g. receivers or amplifiers (G01R 29/0878, G01R 29/0892 take precedence; dosimeters, warning devices G01R 29/0857)} References Limiting references This place does not cover:
{Sensors; antennas; probes; detectors (wave guide measuring sections G01R 1/24)} References Limiting references This place does not cover:
Radiation diagrams of antennas Definition statement This place covers: Testing of antennas and/or measurements of radiation diagrams of aerials. References Informative references Attention is drawn to the following places, which may be of interest for search:
{using anechoic chambers; Chambers or open field sites used therefor (test sites used for measuring on other objects than aerials G01R 29/0828; wave absorbing devices H01Q 17/00)} References Limiting references This place does not cover:
Measuring electrostatic fields {or voltage-potential} References Limiting references This place does not cover:
Measuring field distribution References Limiting references This place does not cover:
Measuring asymmetry of polyphase networks References Limiting references This place does not cover:
Indicating phase sequence; Indicating synchronism Definition statement This place covers: Indicating phase sequence or Indicating synchronism of power supply networks. References Limiting references This place does not cover:
Measuring number of turns; Measuring transformation ratio or coupling factor of windings ({testing or} calibrating instrument transformers G01R 35/02) References Limiting references This place does not cover:
Measuring piezo-electric properties References Limiting references This place does not cover:
Arrangements for measuring quantities of charge (electrostatic instruments G01R 5/28; indicating presence of current G01R 19/15; electrolytic meters, calorimetric meters, for measuring time integral of electric current G01R 22/02, G01R 22/04) Relationships with other classification places The measurement of charge often goes together with the measurement of the electrostatic field. The classes G01R 29/12, G01R 15/165 and G01R 5/28 should therefore also be considered and in cases where the measurement of the electrostatic field as such is also of particular interest one of these classes can be given in parallel to G01R 29/24. Otherwise G01R 29/24 takes precedence for charge measurements. References Limiting references This place does not cover:
Measuring noise figure; Measuring signal-to-noise ratio {Measuring jitter, i.e. phase noise, (distortion G01R 23/20; noise measuring in individual transistors G01R 31/2616, G01R 31/2626)} Definition statement This place covers: The measurement of noise figure, signal-to-noise ratio and of jitter (phase noise). References Limiting references This place does not cover:
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere ({measuring superconductive properties G01R 33/1238;} testing or measuring semiconductors or solid state devices during manufacture {H01L 22/00}; testing line transmission systems H04B 3/46) Definition statement This place covers: Electric testing of electric devices. References Limiting references This place does not cover:
Informative references Attention is drawn to the following places, which may be of interest for search:
Special rules of classification When the testing concern circuits, one or more subgroup(s) of G01R 31/28 have priority. Synonyms and Keywords In patent documents, the following abbreviations are often used:
{Environmental or reliability tests (of individual semiconductors G01R 31/2642; of PCB's G01R 31/2817; of IC's G01R 31/2855; of other circuits G01R 31/2849)} Definition statement This place covers: Stress and burn-in testing, subjecting the DUT to hot or cold temperatures, radiation, vibration or similar. {Testing of electric installations on transport means} References Informative references Attention is drawn to the following places, which may be of interest for search:
{on air- or spacecraft, railway rolling stock or sea-going vessels} References Informative references Attention is drawn to the following places, which may be of interest for search:
Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station (G01R 31/18 takes precedence {; for testing batteries G01R 31/36}) References Informative references Attention is drawn to the following places, which may be of interest for search:
{Testing of capacitors (measuring capacitance G01R 27/2605)} References Informative references Attention is drawn to the following places, which may be of interest for search:
Testing of electric apparatus, lines or components, for short-circuits, discontinuities, leakage {of current}, or incorrect line connection {(G01R 31/001, G01R 31/005, G01R 31/01, G01R 31/08, G01R 31/12, G01R 31/24, G01R 31/26, G01R 31/28, G01R 31/327, G01R 31/34, G01R 31/36, G01R 31/40, G01R 31/44 take precedence; measuring electromagnetic field leakage G01R 29/0821; testing of sparking plugs H01T 13/58)} References Limiting references This place does not cover:
Informative references Attention is drawn to the following places, which may be of interest for search:
{Testing of cables or conductors (testing of electric windings G01R 31/06; testing of insulation of cables G01R 31/1272; testing LANs H04L 43/50; testing line transmission systems H04B 3/46)} References Informative references Attention is drawn to the following places, which may be of interest for search:
Special rules of classification The groups G01R 31/021, G01R 31/024, G01R 31/08 and G01R 31/12 are overlapping when it comes to testing of cables. An EC should be given in the most pertinent (sub)group, and additional EC's and or Indexing Code's in other valid places. {Testing continuity (G01R 31/44 takes precedence)} Definition statement This place covers: Tests for open circuits (lack of continuity) are classified here. References Limiting references This place does not cover:
{Testing of capacitors} References Limiting references This place does not cover:
Informative references Attention is drawn to the following places, which may be of interest for search:
Locating faults in cables, transmission lines, or networks (emergency protective circuit arrangements H02H {; installing, maintaining, repairing or dismantling electric cables or lines H02G 1/00; testing LAN's H04L 43/50}) Definition statement This place covers: Determining the exact location of a fault on a cable, transmission line or network. References Informative references Attention is drawn to the following places, which may be of interest for search:
Glossary of terms In this place, the following terms or expressions are used with the meaning indicated:
using pulse reflection methods Definition statement This place covers: Time domain and frequency domain reflectometry. Synonyms and Keywords In patent documents, the following abbreviations are often used:
Testing dielectric strength or breakdown voltage {; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing (G01R 31/06, G01R 31/08 and G01R 31/327 take precedence; measuring in plasmas G01R 19/0061; measuring dielectric constants G01R 27/2617; ESD, EMC or EMP testing of circuits G01R 31/002)} References Limiting references This place does not cover:
Glossary of terms In this place, the following terms or expressions are used with the meaning indicated:
Testing of individual semiconductor devices (testing or measuring during manufacture or treatment {H01L 22/00}; testing of photovoltaic devices H02S 50/10) References Limiting references This place does not cover:
Informative references Attention is drawn to the following places, which may be of interest for search:
Glossary of terms In this place, the following terms or expressions are used with the meaning indicated:
{Characterising semiconductor materials (testing of materials or semi-finished products G01R 31/2831; testing during manufacture H01L 22/00)} Special rules of classification A raw wafer, not having any circuits or parts of circuits on it, is considered as an individual semiconductor element. Testing of electronic circuits, e.g. by signal tracer ({EMC, EMP or similar testing of electronic circuits G01R 31/002} ; testing for short-circuits, discontinuities, leakage or incorrect line connection G01R 31/02; checking computers {or computer components} G06F 11/00; checking static stores for correct operation G11C 29/00; {testing receivers or transmitters of transmission systems H04B 17/00}) Definition statement This place covers: Testing of printed circuits, integrated and hard-wired circuits. References Limiting references This place does not cover:
Informative references Attention is drawn to the following places, which may be of interest for search:
{Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] (G01R 31/318508 takes precedence; contactless testing G01R 31/302; testing contacts or connections G01R 31/04)} References Limiting references This place does not cover:
Informative references Attention is drawn to the following places, which may be of interest for search:
Synonyms and Keywords In patent documents, the following abbreviations are often used:
{Aspects of quality control [QC] (G01R 31/31718 takes precedence; program control for QC G05B 19/41875)} Definition statement This place covers: Statistical aspects of IC testing. Quality control procedures for IC testing. References Limiting references This place does not cover:
Informative references Attention is drawn to the following places, which may be of interest for search:
{Testing of IC packages; Test features related to IC packages (containers per se H01L 23/02, encapsulations per se H01L 23/28)} Definition statement This place covers: Testing of integrated circuit packages as such, i.e. not involving the solid state circuits they surround. Glossary of terms In this place, the following terms or expressions are used with the meaning indicated:
Contactless testing (non contact-making probes G01R 1/07 ){(G01R 31/04 takes precedence)} Definition statement This place covers: Testing of electric aspects of electronic circuits using contact-less exchange of information or energy, e.g. contact-less exciting or signal-sampling. References Limiting references This place does not cover:
{Wireless interface with the DUT} Definition statement This place covers: Wireless exchange of information between tester apparatus and DUT during electronic testing of integrated circuits. References Informative references Attention is drawn to the following places, which may be of interest for search:
Testing of circuit interrupters, switches or circuit-breakers (structural association with switches H01H; {detecting faults in encased switchgear H02B 13/065; monitoring in addition to disconnection by a protective circuit H02H 3/04}) References Informative references Attention is drawn to the following places, which may be of interest for search:
Apparatus for testing electrical condition of accumulators or electric batteries, e.g. capacity or charge condition (accumulators combined with arrangements for measuring, testing or indicating condition H01M 10/48; circuit arrangements for charging, or depolarising batteries or for supplying loads from batteries H02J 7/00; {Coulomb meters G01R 22/00; indicating the condition of the power supply in clocks or watches G04C 10/04; methods for controlling fuel cells H01M 8/04298}) Definition statement This place covers: Testing of electrical conditions such as state of charge. References Informative references Attention is drawn to the following places, which may be of interest for search:
Special rules of classification The most specific subgroup is given priority, and other valid subgroups are added so that the document can be found by crossing subgroups. Synonyms and Keywords
Testing power supplies (testing photovoltaic devices H02S 50/10) References Limiting references This place does not cover:
Informative references Attention is drawn to the following places, which may be of interest for search:
Arrangements or instruments for measuring magnetic variables Definition statement This place covers: Magnetic sensors and measuring aspects for measuring all kind of magnetic variables. Special rules of classification NMR is classified in the subgroups of G01R 33/20, but general aspects of measuring magnetic variables is classified in G01R 33/0005-M. Measuring direction or magnitude of magnetic fields or magnetic flux (G01R 33/20 takes precedence; measuring direction or magnitude of the earth's field for navigation or surveying G01C; for prospecting, for measuring the magnetic field of the earth G01V 3/00) Definition statement This place covers: The different types of magnetic sensors. Special rules of classification G01R 33/0005 - G01R 33/0052 concern general aspects of measuring magnetic variables and may also be given as additional class to the sub-classes of G01R 33/02. {Three-component magnetometers} Definition statement This place covers: 3D Magnetometers. {using deviation of charged particles by the magnetic field} Definition statement This place covers: Apparatus and methods concerning measurements with charged or magnetic particles. Compensating stray fields {(compensating compasses G01C 17/38) (G01R 33/0017 takes precedence)} Definition statement This place covers: Devices using compensation measurements. Electrodynamic magnetometers Definition statement This place covers: Magnetometers using the relationship between currents, magnetic fields and/or magnetic force. {comprising microelectromechanical systems [MEMS] (MEMS devices in general B81B)} Definition statement This place covers: All kind of MEMS devices. using magneto-optic devices, e.g. Faraday {, Cotton-Mouton effect (magneto-optics in general G02F 1/09)} Definition statement This place covers: All kind of magneto-optical devices and methods, e.g. Cotton-Mouton (magnetic double refraction in liquid, caused by lining-up of anisotropic molecules in magnetic field. Analogue of ELECTRO-optic Kerr effect, not related to Zeeman effect.) {using the Faraday or Voigt effect} Definition statement This place covers: e.g. Faraday effect (rotation of polarization plane of plane-polarized light, consequence of longitudinal Zeeman effect, field parallel to light beam); e.g. Voigt effect (magnetic double refraction, different diffraction for polarization parallel to field and polarization perpendicular to field, consequence of transverse Zeeman effect, field perpendicular to light beam) {using the Kerr effect} Definition statement This place covers: E.g. Kerr magneto-optic effect (normally incident plane-polarized light becomes elliptically polarized in magnetic field. To be distinguished from ordinary elliptical polarization under oblique incidence and from electro-optical Kerr effect). {with application of magnetostriction} Definition statement This place covers: All aspects concerning the relationship between strain/stress/shape/volume of a material and a magnetic field/the magnetic properties of the material. using superconductive devices {(manufacture of superconducting elements H01L 39/00)} Definition statement This place covers: SQUIDs and superconductive magneto-resistance. {Superconductive magneto-resistances} Definition statement This place covers: Magnetometers using the magneto-resistance in superconductors. in thin-film element Definition statement This place covers: Microfluxgate sensors, e.g. manufactured in CMOS technology. {Magneto-impedance sensors; Nanocristallin sensors} Definition statement This place covers: Aspects concerning magneto-impedance. {Constructional adaptation of the sensor to specific applications} Definition statement This place covers: This class does not concern the sensors as such, but the adaptation of their environment for specific applications. {Constructional adaptation of the sensor to specific applications} Definition statement This place covers: This class does not concern the sensors as such, but the adaptation of their environment for specific applications. {using multilayer structures, e.g. giant magnetoresistance sensors (thin magnetic films H01F 10/00)} Definition statement This place covers: GMR, spin valve and AMR sensors. {comprising tunnel junctions, e.g. tunnel magnetoresistance sensors} Definition statement This place covers: TMR sensors. Plotting field distribution {; Measuring field distribution} Definition statement This place covers: Imaging of magnetic variables. Measuring magnetic properties of articles or specimens of solids or fluids (involving magnetic resonance G01R 33/20 {; using magnetic-optic devices G01R 33/032}) Definition statement This place covers: Aspects of measuring the different magnetic variables and may be classified in addition to the sub-classes of G01R 33/02. Special rules of classification G01R 33/0005 - G01R 33/0052 may be considered additionally. {Testing individual magnetic storage devices, e.g. records carriers or digital storage elements (functional testing G06F 11/00, G06F 11/28)} Definition statement This place covers: Qualification of hard disks and MRAMs. {Measuring critical current} Definition statement This place covers: Investigation of magnetic properties and critical current of superconductors is classified. {of molecules labeled with magnetic beads (magnetic particles for bio assay G01N 33/54326)} Definition statement This place covers: Magnetic Biosensors. {Spin resolved measurements; Influencing spins during measurements, e.g. in spintronics devices (G01R 33/093 takes precedence; semiconductor devices using spin polarized carriers H01L 29/66984)} Definition statement This place covers: Spintronics devices. {Measuring domain wall position or domain wall motion} Definition statement This place covers: Aspects concerning domain wall analysis and racetrack memories. Measuring or plotting hysteresis curves {(G01R 33/1207 takes precedence)} Definition statement This place covers: Hysteresis measurements. Measuring susceptibility {(G01R 33/1238 takes precedence)} Definition statement This place covers: Aspects concerning magnetic susceptibility measurements. involving magnetic resonance (medical aspects A61B 5/055; magnetic resonance gyrometers G01C 19/00 {; investigating materials using NMR G01N 24/00; prospecting or detecting using NMR G01V 3/00}) Definition statement This place covers: Equipment for making measurements involving magnetic resonance such as nuclear magnetic resonance [NMR], magnetic resonance imaging [MRI], electron paramagnetic resonance [EPR], nuclear quadrupole resonance [NQR] or other spin resonance effects; Technical details of the equipment; Testing or calibrating of the equipment; Activities involved in making the measurements or in processing the signals collected during the measurements. Relationships with other classification places The following places may also be relevant for classification: A61B 5/055: Detecting, measuring or recording for diagnostic purposes involving electronic or nuclear magnetic resonance There is an overlap between the scope of G01R 33/20 (or its relevant subgroup) and A61B 5/055 in the sense that, depending on the disclosure of a given document, the document may have to be classified in G01R 33/20 (or its relevant subgroup) only, in A61B 5/055 only or in both places. For instance, if the invention information of a document to be classified was primarily directed to the MR process as such (e.g. a novel pulse sequence which, according to the document, facilitates the diagnosis of a disease on the basis of the resulting MR images wherein the document merely mentions the diagnosis but does not specifically disclose its implementation in detail), the document should be classified in G01R 33/20 (or its relevant subgroup) and the additional information related to the diagnosis may be classified using the appropriate Indexing Code corresponding to A61B 5/055. However, if the invention information of the document was primarily directed to the diagnosis as such (e.g. a novel way of processing MRI data in order to enable the diagnosis of a disease wherein the MRI data was acquired using a commonly known standard MRI technique), the document should be classified in A61B 5/055 only. G01N 24/00 : Investigating or analysing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects There is an overlap between the scope of G01R 33/20 (or its relevant subgroup) and G01N 24/00 (or its relevant subgroup) in the sense that, depending on the disclosure of a given document, the document may have to be classified in G01R 33/20 (or its relevant subgroup) only, in G01N 24/00 (or its relevant subgroup) only or in both places. For instance, if the invention information of a document to be classified was primarily directed to the MR process as such (e.g. a novel pulse sequence which, according to the document, can be applied for analyzing materials wherein the document merely mentions this application but does not specifically disclose its implementation in detail), the document should be classified in G01R 33/20 (or its relevant subgroup) and the additional information related to the potential application for analyzing materials may be classified using the appropriate Indexing Code corresponding to G01N 24/00 (or its relevant subgroup). However, if the invention information of the document was primarily directed to the analysis of a material using a known standard MR technique, the document should be classified in G01N 24/00 (or its relevant subgroup) only. G01V 3/32: Electric or magnetic prospecting or detecting specially adapted for well-logging operating with electron or nuclear magnetic resonance There is an overlap between the scope of G01R 33/20 (or its relevant subgroup) and G01V 3/32 in the sense that, depending on the disclosure of a given document, the document may have to be classified in G01R 33/20 (or its relevant subgroup) only, in G01V 3/32 only or in both places. For instance, if the invention information of a document to be classified was primarily directed to the MR process as such (e.g. a novel pulse sequence which, according to the document, can be applied for MR in a borehole wherein the document merely mentions this application but does not specifically disclose its implementation in detail), the document should be classified in G01R 33/20 (or its relevant subgroup) and the additional information related to the potential application in the borehole may be classified using the appropriate Indexing Code of G01V 3/32. However, if the invention information of the document was primarily directed to geophysics aspects or the application of MR in a borehole, the document should be classified in G01V 3/32 only. References Limiting references This place does not cover:
Application-oriented references Examples of places where the subject matter of this place is covered when specially adapted, used for a particular purpose, or incorporated in a larger system:
Informative references Attention is drawn to the following places, which may be of interest for search:
Special rules of classification In this subgroup, classification of additional information, i.e. non-invention information, is compulsory using the appropriate Indexing Code (G01R 33/20 ... G01R 33/64). Comments on subgroups: G01R 33/323: For the purpose of classification in this subgroup, the expression "RF" is to be interpreted as referring to an RF magnetic field. Therefore, a document disclosing a technique of detecting MR using an RF electric field should be classified in this subgroup. G01R 33/34046: For the purpose of classification in this subgroup, a "volume type coil" is to be understood as a coil which encloses the object to be investigated (in contrast to a surface coil which is positioned on a surface of the object to be investigated rather than enclosing the object). G01R 33/34053: For the purpose of classification in this subgroup, a single-turn solenoid coil encircling the trunk of a patient to be investigated is understood as a volume type coil and therefore classified in subgroup G01R 33/34053. In contrast thereto, a single-turn surface coil being placed on a surface of a patient is not understood as a volume type coil and should therefore not be classified in subgroup G01R 33/34053. Rather, classification symbol G01R 33/341 (or its subgroup G01R 33/3415) should be assigned in that case. G01R 33/34061: For the purpose of classification in this subgroup, a Helmholtz coil is to be understood as any arrangement wherein two coils are placed symmetrically one on each side of the experimental area along a common axis. Even if these coils are realized in the form of surface coils, the classification symbol G01R 33/341 should normally not be assigned. G01R 33/34084 Implantable coils or coils being geometrically adaptable to the sample. This subgroup does also cover coil assemblies with mutually movable parts, e.g. a Helmholtz coil assembly comprising two coils located on opposite sides of the trunk of a patient wherein the distance between the two coils can be adapted to the size of the trunk. However, a single rigid surface coil which is mounted on a flexible mechanical support (e.g. a flexible arm) should not be classified in subgroup G01R 33/34084. Rather, classification symbol G01R 33/34007 should be assigned in that case. G01R 33/3628: An RF coil being inductively matched to the transceiver in the sense that the RF coil is not galvanically connected to the transceiver, but only coupled to the transceiver via mutual inductance or mutual capacitance between the RF coil and a further coupling element (e.g. a driving coil), should not be classified in subgroup G01R 33/3628. Rather, classification symbol G01R 33/3642 should be assigned. G01R 33/365 See comment under G01R 33/3657. G01R 33/3657: For the purpose of classification in this subgroup as well as subgroup G01R 33/365, the "function" of the multiple RF coils is defined in relation to their use for spin excitation, MR signal reception or both. For instance, an RF coil being used for exciting proton spins and another RF coil being used for exciting fluorine spins are therefore understood to perform the same function in MR, namely spin excitation. G01R 33/4828: This group does not cover fat suppression which is to be classified under subgroup G01R 33/5607. G01R 33/565: This subgroup does also cover the prevention of image distortions. For instance, an RF coil being manufactured from susceptibility compensated wire, thereby preventing image distortions due to magnetic susceptibility variations, should be classified in the appropriate subgroup of G01R 33/565, probably using the corresponding Indexing Code (G01R 33/56536 in the example given above). G01R 33/62: This subgroup covers the combined use of at least two different spin resonance techniques, e.g. the combined use of NMR and NQR. This group does not cover RF coils being resonant at two distinct Larmor frequencies. Rather, such RF coils are covered by subgroup G01R 33/3635. Glossary of terms In this place, the following terms or expressions are used with the meaning indicated:
Testing or calibrating of apparatus covered by the preceding groups {(G01R 31/31901 takes precedence)} References Limiting references This place does not cover:
{Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references (G01R 33/0035, G01R 35/002 take precedence)} Definition statement This place covers: Calibrating of measuring devices such as network analysers, but also other measuring devices of the preceding groups. References Limiting references This place does not cover:
{Standards or reference devices, e.g. voltage or resistance standards, "golden references"} Definition statement This place covers: Standards or reference devices comprising new aspects and being new over standards known in the art. of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating References Informative references Attention is drawn to the following places, which may be of interest for search:
of instruments for measuring time integral of power or current References Informative references Attention is drawn to the following places, which may be of interest for search:
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