CPC Definition - Subclass G01B
This place covers:
Instruments and methods for measuring:
- linear dimensions of objects such as length, thickness, width, height, depth, diameter, coordinates of points of objects, distance or clearance between spaced objects or spaced apertures;
- angles or tapers;
- alignment of axes;
- areas;
- contours, curvatures or profiles;
- roughness or irregularities of surfaces;
- deformation in a solid.
Methods of measuring geometrical parameters of objects (e.g. shape or surface configuration, measurement of volume, coordinates, height, length, width, thickness, contours, surface roughness or evenness, diameters, roundness, eccentricity, angles, alignment, deformation, displacement), devices for carrying out these methods and related calibration aspects.
Classification within G01B into the main groups is to a large extent based on the underlying measurement principle:
Optical | |
Using fluid | |
Use of radiation | |
Use of subsonic, sonic, ultrasonic vibrations | |
If no particular measurement principle prevails or if more than one of the above-mentioned underlying measurement principles equally apply | |
Mechanical | |
Electric or magnetic |
An exception is G01B 1/00, where documents should be classified which have aspects related to the material selected for the geometrical parameter measuring instrument.
Another exception is G01B 9/00, which is a hardware group mainly containing interferometers. Only when a distance or displacement measurement is concerned (or a related measurement, such as an orientation measurement based on distance measurements to various locations on the object), then an interferometer should be classified in G01B 9/00.
Small, hand-held mechanical devices (such as those available in hardware stores) are classified in G01B 3/00, whereas large mechanical set-ups (industrial machines, such as coordinate measuring machines) are classified in G01B 5/00.
To further support the user in consulting the main groups of this subclass, the following table summarises the properties of the electromagnetic spectrum together with the potentially relevant main groups.
Electromagnetic spectrum | Main groups | |||
Radiation | Wavelength (m) | Frequency (Hz) | Energy (eV) | |
Gamma rays | < 0.01 nm | > 30 EHz | > 124 keV | |
X-rays | 0.01 nm – 10 nm | 30 EHz – 30 PHz | 124 keV – 124 eV | |
Extreme Ultraviolet [EUV] | 10 nm – 100 nm | 30 PHz – 3 PHz | 124 eV – 12.4 eV | |
Ultraviolet | 100 nm – 390 nm | 3 PHz – 770 THz | 12.4 eV – 3.2 eV | |
Visible light | 390 nm – 750 nm | 770 THz – 400 THz | 3.2 eV – 1.7 eV | |
Infrared | 750 nm – 100 µm | 400 THz – 3 THz | 1.7 eV – 12.4 meV | |
Sub-millimetre wave (i.e. terahertz wave or waveband within Infrared) | 100 µm - 1 mm | 3 THz - 300 GHz | 12.4 meV – 1.24 meV | |
Microwave | 1 mm – 1 m | 300 GHz – 300 MHz | 1.24 meV – 1.24 µeV | |
Radio | 1 m – 100 km | 300 MHz – 3 kHz | 1.24 µeV – 12.4 peV |
Only documents with the emphasis on details of the actual geometrical measurement method, measurement apparatus and/or calibration aspects are to be classified in G01B. Documents covering devices or methods which themselves do not belong in G01B, but which use or incorporate geometrical measuring devices or steps should normally not be classified in G01B, but rather in the respective field of their application. A drill, for example, in combination with a device for measuring the distance from the drill to the object being drilled should not be classified as a distance measuring device, as long as the actual way of distance measuring is not presented as the invention. Similarly, a document about a machine for sorting articles according to their diameter should not be classified with diameter determination as long as details of the diameter determination are not the invention.
If investigating or analysing an object is concerned (e.g. determination of material properties or defect analysis for quality control purposes), then G01N has to be considered for classification.
If testing an object or apparatus is concerned, then G01M has to be considered for classification.
The general subject matters of measuring linear dimensions, distances, or angles is covered by several subclasses besides G01B:
G01C: measuring distances, levels, or bearings; surveying; navigation; gyroscopic instruments; photogrammetry or videogrammetry.
G01S: radio direction finding; radio navigation; determining distance or velocity by use of radio waves; locating or presence detecting by use of the reflection or reradiation of radio waves; analogous arrangements using other waves.
When propagation effects of waves are relevant for such measurements G01S is in general the appropriate subclass.
For measuring ground distance between points in geodesy, surveying, and navigation G01C is the appropriate subclass when no radio waves are used or when propagation effects of waves other than radio waves are not relevant.
Examples of places where the subject matter of this place is covered when specially adapted, used for a particular purpose, or incorporated in a larger system:
Measuring human body, see the relevant places, where such exist, e.g. | |
Measuring appliances combined with walking-sticks | |
Measuring methods or devices specially adapted for metal-rolling mills | |
Measuring, gauging or adjusting equipment for machines for working metal or other material | |
Measuring or gauging equipment specially adapted for grinding or polishing operations | |
Combinations of measuring devices with writing-implements | |
Devices for metering predetermined lengths of running material | |
Measuring devices for spinning or twisting machines | |
Measuring devices for determining the length of threads in sewing machines | |
Devices for checking, measuring, recording existing surfacing of roads or like structures, e.g. profilographs | |
Measuring diameter of boreholes or wells | |
Geodetical, nautical or aeronautical measuring, surveying, rangefinding | |
Photogrammetry or videogrammetry | |
Investigating or analysing particle size, investigating or analysing surface area of porous material | |
Radio direction-finding, determining distance or velocity by use of propagation effects, e.g. Doppler effect, propagation time, of radio waves, analogous arrangements using other waves | |
Measuring length or roll diameter of film in cameras or projectors | |
Methods or arrangements for converting the position of a manually-operated writing or tracing member into an electrical signal | |
Measuring elapsed travel of recording medium in recording or playback equipment, sensing diameter of record in autochange gramophones | |
Means structurally associated with electric rotary current collectors for indicating brush wear | |
Indicating consumption of electrodes in arc lamps |
Attention is drawn to the following places, which may be of interest for search:
Human body, dentistry | |
Ball games | |
Sorting according to dimensions | |
Gears | |
Machine tools | |
Robotics | |
Writing, drawing | |
Vehicles | |
Micromechanical devices (MEMS) | |
Nanotechnology | |
Yarns | |
Marking textile materials; Marking in combination with metering or inspection | |
Paper webs, currency | |
Building | |
Measuring in boreholes or wells | |
Turbines | |
Bearings | |
Pigs, moles | |
Range finders, inclinometers, photogrammetry, surveying, gyroscopes | G01C 3/00, G01C 9/00, G01C 11/00, G01C 13/00, G01C 15/00, G01C 19/00 |
Transducers not specially adapted for a specific variable | |
Measuring volume flow or level of fluids or fluent solid material | |
Methods or apparatus for determining the capacity of containers or cavities, or the volume of solid bodies | |
Spectroscopy | |
Measuring force, stress, torque, pressure | |
Measuring force or stress, in general | |
Testing static or dynamic balance of machines or structures; Testing structures or apparatus not otherwise provided for | |
Investigating/analysing | |
Optical coherence tomography (OCT) | |
Speed, acceleration | |
Investigating or analysing surface structures in atomic ranges using scanning-probe techniques | |
Measuring electric or magnetic variables | |
Trackers | |
Radio direction-finding, determining distance or velocity and locating or detecting by use of radio waves | |
Geophysical measuring | |
Optical elements | |
Scales (e.g. Vernier) | |
Spectacle frames | |
Cameras | |
Lithography (including interferometric stage position measurement) | |
Holography | |
Combination of measuring devices with means for controlling or regulating | |
Numerical control | |
Joysticks | |
Computer input devices (such as mice, touch pads) | |
Hand-manipulated analogue computing devices | |
Commerce | |
Image analysis | |
Electron/ion microscopes | |
Interferometer aspects not relating to distance or displacement measurements (e.g. signal modulation) | |
Semiconductor devices |
In this subclass, the groups are distinguished by the technique of measurement which is of major importance. Thus the mere application of other techniques or means for giving a final indication does not affect the classification.
Machines operated on similar principles to the hand-held devices specified in this subclass are classified with these devices.
One or more G01B 3/00 breakdown Indexing Codes should be given when information is concerned which is more detailed than the corresponding G01B 3/00 or when assigning a G01B 3/00 is not appropriate (i.e. in cases where the geometrical measurement information is only of additional nature).
At least one G01B 2210/00 Indexing Code is compulsory for wheel alignment (G01B 2210/10), calliper-like sensors (G01B 2210/40) as well as in the following cases:
Using chromatic effects to achieve wavelength-dependent depth resolution | |
Combining partially overlapping images to an overall image | |
Measuring geometric parameters of semiconductor structures, such as for example profile, critical dimensions (CD) or trench depth | |
Wireless transmission of information between a sensor or probe and a control or evaluation unit | |
Unique sensor ID to enable sensors to be recognised and appropriate amplification or error compensation or calibration curves etc. to be used (e.g. by resistor value across connector terminals) |
In this place, the following terms or expressions are used with the meaning indicated:
Propagation effects | are relevant if the outcome of a measurement depends on the actual value of a physical quantity characterising the propagation of the wave, i.e. its wavelength, frequency, velocity, or phase. The mere presence or direction of a wave are not considered a propagation effect or to contribute to a propagation effect. To put it in another way, propagation effects are irrelevant, if the radiation may be looked upon as a beam of radiation whose wave nature can be ignored. Examples of measurements where propagation effects are relevant include, e.g. measurements of propagation time, phase difference, phase delay, measurements using the Doppler effect or interference. |
Measuring areas | quantifying, by measurement, the size of areas (not: the act of measuring in certain spatial regions or the spatial regions where measurements are taken) |
Irregularities of surfaces | smaller-scale surface textures |
Contour | envelope-like description of (part of) the shape of an object |
In patent documents, the following abbreviations are often used:
CMM | Coordinate Measuring Machine |
In patent documents, the following words/expressions are often used as synonyms:
- "warp", "warpage", "waviness" and "evenness"
This place covers:
Sensors which are characterised only or in part by the material from which they are made.
This place covers:
Small, hand-held mechanical devices, such as those available in retail stores.
Machines operating on similar principles to the hand-held devices specified in this group are also classified here with these devices. For example, arrangements for controlling a measuring force are classified in G01B 3/008, even if they are not hand-held.
Attention is drawn to the following places, which may be of interest for search:
Measuring arrangements characterised by the use of mechanical means, usually (aspects of) large mechanical set-ups (industrial machines, such as coordinate measuring machines) | |
Marking or setting out work | |
Straightedges, triangles | |
Winding/unwinding | |
Devices of general interest specially adapted or mounted for storing and repeatedly paying-out and re-storing lengths of material | |
Templates for mounting doors or windows | |
Protractors for use in geodesy |
This place covers:
Large mechanical set-ups, such as industrial machines or coordinate measuring machines, and aspects of the large mechanical set-ups.
Attention is drawn to the following places, which may be of interest for search:
Instruments as specified in the subgroups and characterised by the use of mechanical measuring means, usually small, hand-held mechanical devices, such as those available in hardware stores. | |
Machine tools, probe magazines | |
Robotics, manipulators | |
Supports in general |
At least one G01B 2210/00 Indexing Code has to be given when G01B 5/255 is given.
G01B 5/0011, G01B 5/0018, G01B 5/0023, G01B 5/0025, G01B 5/003, G01B 5/0035 and G01B 5/0037 also contain methods and devices other than mechanical methods and devices.
G01B 5/0035 also contains measurements of plants. Measuring of logs is not included.
G01B 5/016 covers constructional details of contacts, which are meant to refer to the actual switch contacts within the probe head (not: the probe tip for contacting an object to be measured).
G01B 5/255 also contains vehicle frame and ride height measurement.
When classifying in this group at least one G01B 2210/00 Indexing Code has to be given.
This place covers:
Electric, magnetic and electro-magnetic (e.g. using eddy-currents) measuring principles. Frequencies up to approximately 100 MHz.
Attention is drawn to the following places, which may be of interest for search:
Measuring thickness during the manufacture of coatings | |
Angle or position sensing | |
Measuring electric or magnetic variables | |
Radio direction-finding, determining distance or velocity and locating or detecting by use of radio waves | |
Electric or magnetic detecting or prospecting | |
Manufacture of piezoelectric or electrostrictive resonators for obtaining desired frequency |
At least one G01B 2210/00 Indexing Code has to be given when G01B 7/315 is given.
G01B 7/001 and G01B 7/002 concern measuring heads which are not for coordinate measuring machines, whereas G01B 7/012 is for heads for coordinate measuring machines.
G01B 7/003 and G01B 7/30 should not be assigned to linear and rotary encoders or transducers, respectively. Encoders and transducers are in G01D.
G01B 7/016 covers constructional details of contacts, which are meant to refer to the actual switch contacts within the probe head (not: the probe tip for contacting an object to be measured).
If "height" is specifically mentioned as parameter being measured, then G01B 7/082 and G01B 7/102 take precedence over G01B 7/023.
G01B 7/315 also contains vehicle frame and ride height measurement.
When classifying in this group at least one G01B 2210/00 Indexing Code has to be given.
With roughness or irregularity (G01B 7/34) smaller-scale surface textures are meant, whereas with evenness (G01B 7/345) a larger-scale surface structure is meant.
This place covers:
Interferometers, measuring microscopes, optical projection comparators and goniometers for measuring angles between surfaces.
Attention is drawn to the following places, which may be of interest for search:
Arrangements for measuring particular parameters other than displacement | |
Interferometers for medical use | |
Diffraction gratings in sensors for measuring physical entities | |
Interferometers for spectral analysis | |
Interferometers for optical coherence tomography | |
Microscopes in general | |
Telescopes in general | |
Interferometers for lithography | |
Holography in general |
When classifying in G01B 9/10, also G01B 11/26 has to be considered for classification.
Examples of places where the subject matter of this place is covered when specially adapted, used for a particular purpose, or incorporated in a larger system:
Apparatus for testing the eyes; Instruments for examining the eyes | |
Fabry-Perot interferometers | |
Interferometric spectrometry | |
Using interferometric methods to measure optical phase difference, determine degree of coherence or measure optical wavelength | |
Investigating or analysing materials using interferometric methods involving refractivity or phase-affecting properties | |
Interference filters | |
Devices for the control of the intensity, phase, polarisation or colour, by interference | |
Depth or shape recovery in image analysis from laser ranging, e.g. using interferometry |
Attention is drawn to the following places, which may be of interest for search:
Transducers not specially adapted for a specific variable, using optical means with attenuation or whole or partial obturation of beams of light detected by photocells, by influencing the transmission properties of an optical fibre | |
Systems measuring distance only of a target using transmission of continuous electromagnetic waves other than radio waves, whether unmodulated, amplitude-, phase- or frequency-modulated, with phase comparison between the received signal and the contemporaneously transmitted signal |
This place covers:
Optical measuring principles operating between far infrared (inclusive) and ultraviolet (inclusive), e.g. for volume measurement.
Attention is drawn to the following places, which may be of interest for search:
Instruments of the types covered by group G01B 9/00 per se | |
Investigating, analysing materials by the use of optical means | |
Image analysis for depth or shape recovery |
At least one G01B 2210/00 Indexing Code has to be given when G01B 11/275 or G01B 11/2755 is given.
"Pose" measurements (i.e. position plus orientation) go into G01B 11/002.
G01B 11/0625 - G01B 11/0683 should be given when the pertinent measurement principle applies, even when the object being measured is not a coating (G01B 11/0616), but, for example, a pipe wall.
G01B 11/26 should not be assigned to encoders or transducers, which are in G01D.
G01B 11/275 and G01B 11/2755 also contain vehicle frame and ride height measurement. When classifying in this group at least one G01B 2210/00 Indexing Code has to be given.
The expressions "using interferometry" G01B 11/0675, "by interferometric means" in G01B 11/161 and "using interferometry" in G01B 11/2441 are meant to refer to using an interferometric measurement arrangement, i.e. with a measurement and reference path that combine into one path to a detector (not: measuring interfering reflections from different reflectors within an object being measured). To be used if no emphasis on particular interferometer details.
G01B 11/0658 contains measurement of emissivity or reradiation, which is meant to cover fluorescence and Raman scattering.
G01B 11/0666 is meant to cover measuring thickness by exciting an object with a laser beam that generates an ultrasonic beam into the object. Reflections of the ultrasonic beam are then analysed, often using an interferometer.
G01B 11/165 contains deformation measurement by means of a grating deformed by the object. This is meant to refer to a grating being arranged on the object and its optical properties being measured as a function of deformation of the object (not: fiber Bragg gratings in general).
G01B 11/18 contains Bragg gratings in general being used for measuring deformation.
The expression "contours or curvatures" in G01B 11/24 is meant to refer to an envelope-like description of the shape or part of the shape of an object.
Attention is drawn to the following places, which may be of interest for search:
Integrators in general |
This place covers:
Measuring principles using fluids.
Attention is drawn to the following places, which may be of interest for search:
Volume measurement | |
Lithography | |
Pressure regulation |
At least one G01B 2210/00 Indexing Code has to be given when G01B 13/195 is given.
The expression "contours or curvatures" in G01B 13/16 is meant to refer to an envelope-like description of the shape or part of the shape of an object.
When classifying in G01B 13/195 at least one G01B 2210/00 Indexing Code has to be given
With roughness or irregularity (G01B 13/22) smaller-scale surface textures are meant.
In this place, the following terms or expressions are used with the meaning indicated:
Fluid | liquid or gas |
Attention is drawn to the following places, which may be of interest for search:
Integrators in general |
This place covers:
Measuring principles using wave or particle radiation, such as e- (beta), e+ (positron), gamma, X-ray, neutron, radar, microwaves, millimeter waves. Anything from about 100 MHz to far infrared as well as with a frequency higher than ultraviolet.
This place does not cover:
Measuring arrangements by optical means |
Attention is drawn to the following places, which may be of interest for search:
Measuring arrangements by acoustic vibrations | |
Investigating, analysing | |
Scanning electron microscopes | |
Radar | |
Electron microscopes |
In case of measuring a distance or clearance between spaced objects or apertures, G01B 15/00 as well as G01B 7/14 should be assigned.
The expression "contours or curvatures" in G01B 15/04 is meant to refer to an envelope-like description of the shape or part of the shape of an object.
This place covers:
Measuring principles using acoustic energy, e.g. for short range distance measurement.
Attention is drawn to the following places, which may be of interest for search:
Measuring object thickness (e.g. pipe wall) by exciting an object with a laser beam that generates an ultrasonic beam into the object. Reflections of the ultrasonic beam are then analysed, often using an interferometer | |
Investigating, analysing materials by the use of subsonic, sonic or ultrasonic vibrations | |
Sonar or long range distance measurements |
The expression "contours or curvatures" in G01B 17/06 is meant to refer to an envelope-like description of the shape or part of the shape of an object.
This place covers:
Measurements based on unspecified measurement principles or on principles covered by two or more of groups G01B 3/00 - G01B 17/00.
Attention is drawn to the following places, which may be of interest for search:
Machine tools | |
Unwinding or rewinding apparatus incorporating length measuring devices | |
Internal diameters of boreholes or wells | |
Numerical control | |
Digital computing, data processing | |
Three-dimensional modelling |
At least one G01B 2210/00 Indexing Code has to be given when G01B 21/26 is given.
G01B 21/04 covers processing of measurement data, e.g. outlier processing.
G01B 21/042 covers calibration and calibration artifacts, which are meant as artifacts and methods used or applied before actual measurement of the workpiece.
G01B 21/045 covers correction of measurements, which is meant as artifacts and methods used or applied during or after actual measurement of the workpiece.
When classifying in G01B 21/26 at least one G01B 2210/00 Indexing Code has to be given.
Attention is drawn to the following places, which may be of interest for search:
Integrators in general |