1. CPC Sections
  2. CPC Section G
  3. CPC Class G01
  4. CPC Subclass G01Q
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CPC
COOPERATIVE PATENT CLASSIFICATION
​
G01Q
SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM] [2018-05]
NOTE

  • In this subclass, the first place priority rule is applied, i.e. at each hierarchical level, in the absence of an indication to the contrary, classification is made in the first appropriate place.
G01Q 10/00
Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe [2013-01]
G01Q 10/02
.
Coarse scanning or positioning [2013-01]
G01Q 10/04
.
Fine scanning or positioning [2013-01]
G01Q 10/045
. .
{Self-actuating probes, i.e. wherein the actuating means for driving are part of the probe itself, e.g. piezoelectric means on a cantilever probe} [2013-01]
G01Q 10/06
. .
Circuits or algorithms therefor [2013-01]
G01Q 10/065
. . .
{Feedback mechanisms, i.e. wherein the signal for driving the probe is modified by a signal coming from the probe itself} [2013-01]
G01Q 20/00
Monitoring the movement or position of the probe [2013-01]
G01Q 20/02
.
by optical means [2013-01]
G01Q 20/04
.
Self-detecting probes, i.e. wherein the probe itself generates a signal representative of its position, e.g. piezoelectric gauge [2023-08]
G01Q 30/00
Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices [2013-01]
G01Q 30/02
.
Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope [2013-01]
G01Q 30/025
. .
{Optical microscopes coupled with SPM} [2013-01]
G01Q 30/04
.
Display or data processing devices [2013-01]
G01Q 30/06
. .
for error compensation [2013-01]
G01Q 30/08
.
Means for establishing or regulating a desired environmental condition within a sample chamber [2013-01]
G01Q 30/10
. .
Thermal environment [2013-01]
G01Q 30/12
. .
Fluid environment [2013-01]
G01Q 30/14
. . .
Liquid environment [2013-01]
G01Q 30/16
. .
Vacuum environment [2013-01]
G01Q 30/18
.
Means for protecting or isolating the interior of a sample chamber from external environmental conditions or influences, e.g. vibrations or electromagnetic fields [2013-01]
G01Q 30/20
.
Sample handling devices or methods [2017-08]
G01Q 40/00
Calibration, e.g. of probes [2013-01]
G01Q 40/02
.
Calibration standards and methods of fabrication thereof [2013-01]
G01Q 60/00
Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof [2017-08]
G01Q 60/02
.
Multiple-type SPM, i.e. involving more than one SPM techniques [2017-08]
G01Q 60/04
. .
STM [Scanning Tunnelling Microscopy] combined with AFM [Atomic Force Microscopy] [2013-01]
G01Q 60/06
. .
SNOM [Scanning Near-field Optical Microscopy] combined with AFM [Atomic Force Microscopy] [2013-01]
G01Q 60/08
. .
MFM [Magnetic Force Microscopy] combined with AFM [Atomic Force Microscopy [2013-01]
G01Q 60/10
.
STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes [2013-01]
G01Q 60/12
. .
STS [Scanning Tunnelling Spectroscopy] [2013-01]
G01Q 60/14
. .
STP [Scanning Tunnelling Potentiometry] [2013-01]
G01Q 60/16
. .
Probes, their manufacture, or their related instrumentation, e.g. holders [2013-01]
G01Q 60/18
.
SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes [2013-01]
G01Q 60/20
. .
Fluorescence [2013-01]
G01Q 60/22
. .
Probes, their manufacture, or their related instrumentation, e.g. holders [2013-01]
G01Q 60/24
.
AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes [2013-01]
G01Q 60/26
. .
Friction force microscopy [2013-01]
G01Q 60/28
. .
Adhesion force microscopy [2013-01]
G01Q 60/30
. .
Scanning potential microscopy [2013-01]
G01Q 60/32
. .
AC mode [2013-01]
G01Q 60/34
. . .
Tapping mode [2013-01]
G01Q 60/36
. .
DC mode [2013-01]
G01Q 60/363
. . .
{Contact-mode AFM} [2013-01]
G01Q 60/366
. . .
{Nanoindenters, i.e. wherein the indenting force is measured} [2013-01]
G01Q 60/38
. .
Probes, their manufacture, or their related instrumentation, e.g. holders [2013-01]
G01Q 60/40
. . .
Conductive probes [2013-01]
G01Q 60/42
. . .
Functionalisation [2017-08]
G01Q 60/44
.
SICM [Scanning Ion-Conductance Microscopy] or apparatus therefor, e.g. SICM probes [2013-01]
G01Q 60/46
.
SCM [Scanning Capacitance Microscopy] or apparatus therefor, e.g. SCM probes [2013-01]
G01Q 60/48
. .
Probes, their manufacture, or their related instrumentation, e.g. holders [2013-01]
G01Q 60/50
.
MFM [Magnetic Force Microscopy] or apparatus therefor, e.g. MFM probes [2013-01]
G01Q 60/52
. .
Resonance [2013-01]
G01Q 60/54
. .
Probes, their manufacture, or their related instrumentation, e.g. holders [2013-01]
G01Q 60/56
. . .
Probes with magnetic coating [2013-01]
G01Q 60/58
.
SThM [Scanning Thermal Microscopy] or apparatus therefor, e.g. SThM probes [2013-01]
G01Q 60/60
.
SECM [Scanning Electro-Chemical Microscopy] or apparatus therefor, e.g. SECM probes [2013-01]
G01Q 70/00
General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q 60/00 [2013-01]
G01Q 70/02
.
Probe holders [2013-01]
G01Q 70/04
. .
with compensation for temperature or vibration induced errors [2013-01]
G01Q 70/06
.
Probe tip arrays [2013-01]
G01Q 70/08
.
Probe characteristics [2013-01]
G01Q 70/10
. .
Shape or taper [2013-01]
G01Q 70/12
. . .
Nanotube tips [2017-08]
G01Q 70/14
. .
Particular materials [2013-01]
G01Q 70/16
.
Probe manufacture [2013-01]
G01Q 70/18
. .
Functionalisation [2017-08]
G01Q 80/00
Applications, other than SPM, of scanning-probe techniques (manufacture or treatment of nanostructures B82B 3/00; recording or reproducing information using near-field interaction G11B 9/12, G11B 11/24, G11B 13/08) [2017-08]
G01Q 90/00
Scanning-probe techniques or apparatus not otherwise provided for [2013-01]