Cooperative Patent Classification

Indent Level

Version: 2016.11
CPC
COOPERATIVE PATENT CLASSIFICATION
G01Q
SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM] [2013-01]
NOTE

  • In this subclass, the first place priority rule is applied, i.e. at each hierarchical level, classification is made in the first appropriate place.
G01Q 10/00
Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe [2013-01]
G01Q 10/02
.
Coarse scanning or positioning [2013-01]
G01Q 10/04
.
Fine scanning or positioning [2013-01]
G01Q 10/045
. .
{Self-actuating probes, i.e. wherein the actuating means for driving are part of the probe itself, e.g. piezoelectric means on a cantilever probe} [2013-01]
G01Q 10/06
. .
Circuits or algorithms therefor [2013-01]
G01Q 10/065
. . .
{Feedback mechanisms, i.e. wherein the signal for driving the probe is modified by a signal coming from the probe itself} [2013-01]
G01Q 20/00
Monitoring the movement or position of the probe [2013-01]
G01Q 20/02
.
by optical means [2013-01]
G01Q 20/04
.
Self-detecting probes, i.e. wherein the probe itself generates a signal representative of its position, e.g. piezo-electric gauge [2013-01]
G01Q 30/00
Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices [2013-01]
G01Q 30/02
.
Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope [2013-01]
G01Q 30/025
. .
{Optical microscopes coupled with SPM} [2013-01]
G01Q 30/04
.
Display or data processing devices [2013-01]
G01Q 30/06
. .
for error compensation [2013-01]
G01Q 30/08
.
Means for establishing or regulating a desired environmental condition within a sample chamber [2013-01]
G01Q 30/10
. .
Thermal environment [2013-01]
G01Q 30/12
. .
Fluid environment [2013-01]
G01Q 30/14
. . .
Liquid environment [2013-01]
G01Q 30/16
. .
Vacuum environment [2013-01]
G01Q 30/18
.
Means for protecting or isolating the interior of a sample chamber from external environmental conditions or influences, e.g. vibrations or electromagnetic fields [2013-01]
G01Q 30/20
.
Sample handling device or method [2013-01]
G01Q 40/00
Calibration, e.g. of probes [2013-01]
G01Q 40/02
.
Calibration standards and methods of fabrication thereof [2013-01]
G01Q 60/00
Particular type of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof [2013-01]
G01Q 60/02
.
Multiple-type SPM, i.e. involving more than one SPM technique [2013-01]
G01Q 60/04
. .
STM [Scanning Tunnelling Microscopy] combined with AFM [Atomic Force Microscopy] [2013-01]
G01Q 60/06
. .
SNOM [Scanning Near-field Optical Microscopy] combined with AFM [Atomic Force Microscopy] [2013-01]
G01Q 60/08
. .
MFM [Magnetic Force Microscopy] combined with AFM [Atomic Force Microscopy [2013-01]
G01Q 60/10
.
STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes [2013-01]
G01Q 60/12
. .
STS [Scanning Tunnelling Spectroscopy] [2013-01]
G01Q 60/14
. .
STP [Scanning Tunnelling Potentiometry] [2013-01]
G01Q 60/16
. .
Probes, their manufacture, or their related instrumentation, e.g. holders [2013-01]
G01Q 60/18
.
SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes [2013-01]
G01Q 60/20
. .
Fluorescence [2013-01]
G01Q 60/22
. .
Probes, their manufacture, or their related instrumentation, e.g. holders [2013-01]
G01Q 60/24
.
AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes [2013-01]
G01Q 60/26
. .
Friction force microscopy [2013-01]
G01Q 60/28
. .
Adhesion force microscopy [2013-01]
G01Q 60/30
. .
Scanning potential microscopy [2013-01]
G01Q 60/32
. .
AC mode [2013-01]
G01Q 60/34
. . .
Tapping mode [2013-01]
G01Q 60/36
. .
DC mode [2013-01]
G01Q 60/363
. . .
{Contact-mode AFM} [2013-01]
G01Q 60/366
. . .
{Nanoindenters, i.e. wherein the indenting force is measured} [2013-01]
G01Q 60/38
. .
Probes, their manufacture, or their related instrumentation, e.g. holders [2013-01]
G01Q 60/40
. . .
Conductive probes [2013-01]
G01Q 60/42
. . .
Functionalization [2013-01]
G01Q 60/44
.
SICM [Scanning Ion-Conductance Microscopy] or apparatus therefor, e.g. SICM probes [2013-01]
G01Q 60/46
.
SCM [Scanning Capacitance Microscopy] or apparatus therefor, e.g. SCM probes [2013-01]
G01Q 60/48
. .
Probes, their manufacture, or their related instrumentation, e.g. holders [2013-01]
G01Q 60/50
.
MFM [Magnetic Force Microscopy] or apparatus therefor, e.g. MFM probes [2013-01]
G01Q 60/52
. .
Resonance [2013-01]
G01Q 60/54
. .
Probes, their manufacture, or their related instrumentation, e.g. holders [2013-01]
G01Q 60/56
. . .
Probes with magnetic coating [2013-01]
G01Q 60/58
.
SThM [Scanning Thermal Microscopy] or apparatus therefor, e.g. SThM probes [2013-01]
G01Q 60/60
.
SECM [Scanning Electro-Chemical Microscopy] or apparatus therefor, e.g. SECM probes [2013-01]
G01Q 70/00
General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q 60/00 [2013-01]
G01Q 70/02
.
Probe holders [2013-01]
G01Q 70/04
. .
with compensation for temperature or vibration induced errors [2013-01]
G01Q 70/06
.
Probe tip arrays [2013-01]
G01Q 70/08
.
Probe characteristics [2013-01]
G01Q 70/10
. .
Shape or taper [2013-01]
G01Q 70/12
. . .
Nano-tube tips [2013-01]
G01Q 70/14
. .
Particular materials [2013-01]
G01Q 70/16
.
Probe manufacture [2013-01]
G01Q 70/18
. .
Functionalization [2013-01]
G01Q 80/00
Applications, other than SPM, of scanning-probe techniques (manufacture or treatment of nano-structures B82B 3/00; recording or reproducing information using near-field interaction G11B 9/12, G11B 11/24, G11B 13/08) [2013-01]
G01Q 90/00
Scanning-probe techniques or apparatus not otherwise provided for [2013-01]