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CPC
COOPERATIVE PATENT CLASSIFICATION
G11C
STATIC STORES (semiconductor memory devices H10B) [2023-02]
NOTES

  • This subclass covers devices or arrangements for storage of digital or analogue information:
    • in which no relative movement takes place between an information storage element and a transducer;
    • which incorporate a selecting-device for writing-in or reading-out the information into or from the store.
  • This subclass does not cover elements not adapted for storage and not provided with such means as referred to in Note (3) below, which elements are classified in the appropriate subclass, e.g. of H01, H03K.
  • In this subclass, the following terms are used with the meaning indicated:
    • "storage element" is an element which can hold at least one item of information and is provided with means for writing-in or reading-out this information;
    • "memory" is a device, including storage elements, which can hold information to be extracted when desired.
WARNINGS

  • The following IPC groups are not in the CPC scheme. The subject matter for these IPC groups is classified in the following CPC groups:
    G11C8/02 covered by G11C 8/00, H03K 17/00
    G11C11/4193 covered by G11C 11/00
    G11C11/4195 covered by G11C 11/00
    G11C11/4197 covered by G11C 11/00
  • In this subclass non-limiting references (in the sense of paragraph 39 of the Guide to the IPC) may still be displayed in the scheme.
G11C 5/00
Details of stores covered by group G11C 11/00 [2021-02]
G11C 5/005
.
{Circuit means for protection against loss of information of semiconductor storage devices} [2021-02]
G11C 5/02
.
Disposition of storage elements, e.g. in the form of a matrix array [2013-01]
G11C 5/025
. .
{Geometric lay-out considerations of storage- and peripheral-blocks in a semiconductor storage device (geometrical lay-out of the components in integrated circuits, H01L 27/0207)} [2013-01]
G11C 5/04
. .
Supports for storage elements {, e.g. memory modules}; Mounting or fixing of storage elements on such supports [2018-05]
G11C 5/05
. . .
Supporting of cores in matrix [2013-01]
G11C 5/06
.
Arrangements for interconnecting storage elements electrically, e.g. by wiring [2013-01]
G11C 5/063
. .
{Voltage and signal distribution in integrated semi-conductor memory access lines, e.g. word-line, bit-line, cross-over resistance, propagation delay} [2013-01]
G11C 5/066
. .
{Means for reducing external access-lines for a semiconductor memory clip, e.g. by multiplexing at least address and data signals} [2016-08]
G11C 5/08
. .
for interconnecting magnetic elements, e.g. toroidal cores [2013-01]
G11C 5/10
. .
for interconnecting capacitors [2013-01]
G11C 5/12
.
Apparatus or processes for interconnecting storage elements, e.g. for threading magnetic cores [2013-01]
G11C 5/14
.
Power supply arrangements {, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels} [2021-02]
G11C 5/141
. .
{Battery and back-up supplies} [2021-02]
G11C 5/142
. .
{Contactless power supplies, e.g. RF, induction, or IR} [2021-02]
G11C 5/143
. .
{Detection of memory cassette insertion or removal; Continuity checks of supply or ground lines; Detection of supply variations, interruptions or levels (G11C 5/148 takes precedence); Switching between alternative supplies (G11C 5/141 takes precedence)} [2021-02]
G11C 5/144
. . .
{Detection of predetermined disconnection or reduction of power supply, e.g. power down or power standby} [2013-01]
G11C 5/145
. .
{Applications of charge pumps; Boosted voltage circuits; Clamp circuits therefor (G11C 5/141 takes precedence)} [2021-02]
G11C 5/146
. . .
{Substrate bias generators (G11C 5/141 takes precedence)} [2021-02]
G11C 5/147
. .
{Voltage reference generators, voltage or current regulators; Internally lowered supply levels; Compensation for voltage drops (G11C 5/141 takes precedence)} [2021-02]
G11C 5/148
. .
{Details of power up or power down circuits, standby circuits or recovery circuits} [2013-01]
G11C 7/00
Arrangements for writing information into, or reading information out from, a digital store (G11C 5/00 takes precedence; auxiliary circuits for stores using semiconductor devices G11C 11/4063, G11C 11/413) [2021-02]
G11C 7/005
.
{with combined beam-and individual cell access} [2013-01]
G11C 7/02
.
with means for avoiding parasitic signals [2016-11]
G11C 7/04
.
with means for avoiding disturbances due to temperature effects [2016-11]
G11C 7/06
.
Sense amplifiers; Associated circuits {, e.g. timing or triggering circuits} [2021-02]
G11C 7/062
. .
{Differential amplifiers of non-latching type, e.g. comparators, long-tailed pairs} [2013-01]
G11C 7/065
. .
{Differential amplifiers of latching type} [2013-01]
G11C 7/067
. .
{Single-ended amplifiers} [2013-01]
G11C 7/08
. .
Control thereof [2016-11]
G11C 7/10
.
Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers [2018-05]
G11C 7/1003
. .
{Interface circuits for daisy chain or ring bus memory arrangements} [2013-01]
G11C 7/1006
. .
{Data managing, e.g. manipulating data before writing or reading out, data bus switches or control circuits therefor} [2013-01]
G11C 7/1009
. . .
{Data masking during input/output} [2013-01]
G11C 7/1012
. . .
{Data reordering during input/output, e.g. crossbars, layers of multiplexers, shifting or rotating} [2013-01]
G11C 7/1015
. .
{Read-write modes for single port memories, i.e. having either a random port or a serial port} [2013-01]
G11C 7/1018
. . .
{Serial bit line access mode, e.g. using bit line address shift registers, bit line address counters, bit line burst counters} [2013-01]
G11C 7/1021
. . . .
{Page serial bit line access mode, i.e. using an enabled row address stroke pulse with its associated word line address and a sequence of enabled column address stroke pulses each with its associated bit line address} [2013-01]
G11C 7/1024
. . . . .
{Extended data output [EDO] mode, i.e. keeping output buffer enabled during an extended period of time} [2013-01]
G11C 7/1027
. . . .
{Static column decode serial bit line access mode, i.e. using an enabled row address stroke pulse with its associated word line address and a sequence of enabled bit line addresses} [2013-01]
G11C 7/103
. . .
{using serially addressed read-write data registers (G11C 7/1036 takes precedence)} [2013-01]
G11C 7/1033
. . . .
{using data registers of which only one stage is addressed for sequentially outputting data from a predetermined number of stages, e.g. nibble read-write mode} [2013-01]
G11C 7/1036
. . .
{using data shift registers} [2013-01]
G11C 7/1039
. . .
{using pipelining techniques, i.e. using latches between functional memory parts, e.g. row/column decoders, I/O buffers, sense amplifiers} [2013-01]
G11C 7/1042
. . .
{using interleaving techniques, i.e. read-write of one part of the memory while preparing another part} [2013-01]
G11C 7/1045
. . .
{Read-write mode select circuits} [2013-01]
G11C 7/1048
. .
{Data bus control circuits, e.g. precharging, presetting, equalising} [2013-01]
G11C 7/1051
. .
{Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits} [2013-01]
G11C 7/1054
. . .
{Optical output buffers} [2013-01]
G11C 7/1057
. . .
{Data output buffers, e.g. comprising level conversion circuits, circuits for adapting load} [2013-01]
G11C 7/106
. . .
{Data output latches} [2013-01]
G11C 7/1063
. . .
{Control signal output circuits, e.g. status or busy flags, feedback command signals} [2013-01]
G11C 7/1066
. . .
{Output synchronization} [2013-01]
G11C 7/1069
. . .
{I/O lines read out arrangements} [2021-02]
G11C 7/1072
. .
{for memories with random access ports synchronised on clock signal pulse trains, e.g. synchronous memories, self timed memories} [2013-01]
G11C 7/1075
. .
{for multiport memories each having random access ports and serial ports, e.g. video RAM} [2013-01]
G11C 7/1078
. .
{Data input circuits, e.g. write amplifiers, data input buffers, data input registers, data input level conversion circuits} [2013-01]
G11C 7/1081
. . .
{Optical input buffers} [2013-01]
G11C 7/1084
. . .
{Data input buffers, e.g. comprising level conversion circuits, circuits for adapting load} [2013-01]
G11C 7/1087
. . .
{Data input latches} [2013-01]
G11C 7/109
. . .
{Control signal input circuits} [2013-01]
G11C 7/1093
. . .
{Input synchronization} [2013-01]
G11C 7/1096
. . .
{Write circuits, e.g. I/O line write drivers} [2013-01]
G11C 7/12
.
Bit line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, equalising circuits, for bit lines [2013-01]
G11C 7/14
.
Dummy cell management; Sense reference voltage generators [2013-01]
G11C 7/16
.
Storage of analogue signals in digital stores using an arrangement comprising analogue/digital [A/D] converters, digital memories and digital/analogue [D/A] converters  [2018-05]
G11C 7/18
.
Bit line organisation; Bit line lay-out [2013-01]
G11C 7/20
.
Memory cell initialisation circuits, e.g. when powering up or down, memory clear, latent image memory [2021-02]
G11C 7/22
.
Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management  [2018-05]
G11C 7/222
. .
{Clock generating, synchronizing or distributing circuits within memory device} [2013-01]
G11C 7/225
. .
{Clock input buffers} [2013-01]
G11C 7/227
. .
{Timing of memory operations based on dummy memory elements or replica circuits} [2013-01]
G11C 7/24
.
Memory cell safety or protection circuits, e.g. arrangements for preventing inadvertent reading or writing; Status cells; Test cells [2013-01]
G11C 8/00
Arrangements for selecting an address in a digital store (for stores using transistors G11C 11/407, G11C 11/413) [2021-02]
G11C 8/005
.
{with travelling wave access} [2013-01]
G11C 8/04
.
using a sequential addressing device, e.g. shift register, counter [2021-02]
G11C 8/06
.
Address interface arrangements, e.g. address buffers [2021-02]
G11C 8/08
.
Word line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, for word lines [2013-01]
G11C 8/10
.
Decoders [2013-01]
G11C 8/12
.
Group selection circuits, e.g. for memory block selection, chip selection, array selection [2021-02]
G11C 8/14
.
Word line organisation; Word line lay-out [2013-01]
G11C 8/16
.
Multiple access memory array, e.g. addressing one storage element via at least two independent addressing line groups [2021-02]
G11C 8/18
.
Address timing or clocking circuits; Address control signal generation or management, e.g. for row address strobe [RAS] or column address strobe [CAS] signals [2013-01]
G11C 8/20
.
Address safety or protection circuits, i.e. arrangements for preventing unauthorized or accidental access [2021-02]
G11C 11/00
Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor (G11C 14/00 - G11C 21/00 take precedence) [2021-01]
NOTE

G11C 11/005
.
{comprising combined but independently operative RAM-ROM, RAM-PROM, RAM-EPROM cells} [2021-01]
G11C 11/02
.
using magnetic elements [2021-02]
G11C 11/04
. .
using storage elements having cylindrical form, e.g. rod, wire (G11C 11/12, G11C 11/14 take precedence) [2021-02]
G11C 11/06
. .
using single-aperture storage elements, e.g. ring core; using multi-aperture plates in which each individual aperture forms a storage element [2013-01]
G11C 11/06007
. . .
{using a single aperture or single magnetic closed circuit} [2013-01]
NOTE

  • Provisionally contains the following details; control write -, read -, address circuitry (pulse generators in general H03K 5/00, H03K 17/00 ); arrangements for temperature compensation; checking of the correct functioning and repair arrangements (checking methods in general G06F 11/00, G06F 11/28; testing magnetic elements per se G01R 33/00 ); magnetic properties, choice of materials or the like (materials per se H01F 1/00 )
G11C 11/06014
. . . .
{using one such element per bit} [2018-05]
G11C 11/06021
. . . . .
{with destructive read-out} [2013-01]
G11C 11/06028
. . . . . .
{Matrixes} [2013-01]
G11C 11/06035
. . . . . . .
{Bit core selection for writing or reading, by at least two coincident partial currents, e.g. "bit"- organised, 2L/2D, or 3D} [2021-02]
G11C 11/06042
. . . . . . .
{"word"-organised, e.g. 2D organisation or linear selection, i.e. full current selection through all the bit-cores of a word during reading} [2013-01]
G11C 11/0605
. . . . .
{with non-destructive read-out} [2013-01]
G11C 11/06057
. . . . . .
{Matrixes} [2013-01]
G11C 11/06064
. . . . . . .
{"bit"-organised (2 1/2D, 3D or similar organisation)} [2013-01]
G11C 11/06071
. . . . . . .
{"word"-organised (2D organisation or linear selection)} [2013-01]
G11C 11/06078
. . . .
{using two or more such elements per bit} [2021-02]
G11C 11/06085
. . .
{Multi-aperture structures or multi-magnetic closed circuits, each aperture storing a "bit", realised by rods, plates, grids, waffle-irons,(i.e. grooved plates) or similar devices} [2013-01]
G11C 11/06092
. . .
{Multi-aperture structures or multi-magnetic closed circuits using two or more apertures per bit} [2013-01]
G11C 11/061
. . .
using elements with single aperture or magnetic loop for storage, one element per bit, and for destructive read-out {(contains no documents, see G11C 11/06007, G11C 11/06014, G11C 11/06021, G11C 11/06028)} [2017-08]
G11C 11/063
. . . .
bit organised, such as 2 1/2D, 3D organisation, i.e. for selection of an element by means of at least two coincident partial currents both for reading and for writing {(contains no documents; see G11C 11/06035)} [2017-08]
G11C 11/065
. . . .
word organised, such as 2D organisation, or linear selection, i.e. for selection of all the elements of a word by means of a single full current for reading {(contains no documents; see G11C 11/06042)} [2013-01]
G11C 11/067
. . .
using elements with single aperture or magnetic loop for storage, one element per bit, and for non-destructive read-out {(contains no documents, see G11C 11/0605 - G11C 11/06071)} [2016-05]
G11C 11/08
. .
using multi-aperture storage elements, e.g. using transfluxors; using plates incorporating several individual multi-aperture storage elements (G11C 11/10 takes precedence) [2021-02]
G11C 11/10
. .
using multi-axial storage elements [2013-01]
G11C 11/12
. .
using tensors; using twistors, i.e. elements in which one axis of magnetisation is twisted [2013-01]
G11C 11/14
. .
using thin-film elements [2013-01]
G11C 11/15
. . .
using multiple magnetic layers (G11C 11/155 takes precedence) [2013-01]
G11C 11/155
. . .
with cylindrical configuration [2013-01]
G11C 11/16
. .
using elements in which the storage effect is based on magnetic spin effect [2021-02]
G11C 11/161
. . .
{details concerning the memory cell structure, e.g. the layers of the ferromagnetic memory cell} [2013-01]
G11C 11/165
. . .
{Auxiliary circuits} [2013-01]
G11C 11/1653
. . . .
{Address circuits or decoders} [2013-01]
G11C 11/1655
. . . . .
{Bit-line or column circuits} [2013-01]
G11C 11/1657
. . . . .
{Word-line or row circuits} [2013-01]
G11C 11/1659
. . . .
{Cell access} [2013-01]
G11C 11/1673
. . . .
{Reading or sensing circuits or methods} [2013-01]
G11C 11/1675
. . . .
{Writing or programming circuits or methods} [2013-01]
G11C 11/1677
. . . .
{Verifying circuits or methods} [2013-01]
G11C 11/1693
. . . .
{Timing circuits or methods} [2013-01]
G11C 11/1695
. . . .
{Protection circuits or methods} [2013-01]
G11C 11/1697
. . . .
{Power supply circuits} [2013-01]
G11C 11/18
.
using Hall-effect devices [2013-01]
G11C 11/19
.
using non-linear reactive devices in resonant circuits [2019-05]
G11C 11/20
. .
using parametrons [2021-02]
G11C 11/21
.
using electric elements [2013-01]
G11C 11/22
. .
using ferroelectric elements [2021-02]
G11C 11/221
. . .
{using ferroelectric capacitors} [2013-01]
G11C 11/223
. . .
{using MOS with ferroelectric gate insulating film} [2013-01]
G11C 11/225
. . .
{Auxiliary circuits} [2013-01]
G11C 11/2253
. . . .
{Address circuits or decoders} [2013-01]
G11C 11/2255
. . . . .
{Bit-line or column circuits} [2013-01]
G11C 11/2257
. . . . .
{Word-line or row circuits} [2013-01]
G11C 11/2259
. . . .
{Cell access} [2013-01]
G11C 11/2273
. . . .
{Reading or sensing circuits or methods} [2013-01]
G11C 11/2275
. . . .
{Writing or programming circuits or methods} [2013-01]
G11C 11/2277
. . . .
{Verifying circuits or methods} [2013-01]
G11C 11/2293
. . . .
{Timing circuits or methods} [2013-01]
G11C 11/2295
. . . .
{Protection circuits or methods} [2013-01]
G11C 11/2297
. . . .
{Power supply circuits} [2013-01]
G11C 11/23
. .
using electrostatic storage on a common layer, e.g. Forrester-Haeff tubes {or William tubes}(G11C 11/22 takes precedence) [2021-02]
G11C 11/24
. .
using capacitors (G11C 11/22 takes precedence; using a combination of semiconductor devices and capacitors G11C 11/34, e.g. G11C 11/40) [2013-01]
G11C 11/26
. .
using discharge tubes [2021-02]
G11C 11/265
. . .
{counting tubes, e.g. decatrons or trochotrons} [2021-02]
G11C 11/28
. . .
using gas-filled tubes [2021-02]
G11C 11/30
. . .
using vacuum tubes (G11C 11/23 takes precedence) [2021-02]
G11C 11/34
. .
using semiconductor devices [2021-02]
G11C 11/35
. . .
with charge storage in a depletion layer, e.g. charge coupled devices [2021-02]
G11C 11/36
. . .
using diodes, e.g. as threshold elements {, i.e. diodes assuming a stable ON-stage when driven above their threshold (S- or N-characteristic)} [2017-08]
G11C 11/38
. . . .
using tunnel diodes [2013-01]
G11C 11/39
. . .
using thyristors {or the avalanche or negative resistance type, e.g. PNPN, SCR, SCS, UJT} [2013-01]
G11C 11/40
. . .
using transistors [2013-01]
G11C 11/401
. . . .
forming cells needing refreshing or charge regeneration, i.e. dynamic cells [2018-05]
G11C 11/402
. . . . .
with charge regeneration individual to each memory cell, i.e. internal refresh [2013-01]
G11C 11/4023
. . . . . .
{using field effect transistors} [2013-01]
G11C 11/4026
. . . . . .
{using bipolar transistors} [2013-01]
G11C 11/403
. . . . .
with charge regeneration common to a multiplicity of memory cells, i.e. external refresh [2013-01]
G11C 11/404
. . . . . .
with one charge-transfer gate, e.g. MOS transistor, per cell [2013-01]
G11C 11/4045
. . . . . . .
{using a plurality of serially connected access transistors, each having a storage capacitor} [2020-05]
G11C 11/405
. . . . . .
with three charge-transfer gates, e.g. MOS transistors, per cell [2013-01]
G11C 11/406
. . . . .
Management or control of the refreshing or charge-regeneration cycles [2013-01]
G11C 11/40603
. . . . . .
{Arbitration, priority and concurrent access to memory cells for read/write or refresh operations} [2013-01]
G11C 11/40607
. . . . . .
{Refresh operations in memory devices with an internal cache or data buffer} [2013-01]
G11C 11/40611
. . . . . .
{External triggering or timing of internal or partially internal refresh operations, e.g. auto-refresh or CAS-before-RAS triggered refresh} [2013-01]
G11C 11/40615
. . . . . .
{Internal triggering or timing of refresh, e.g. hidden refresh, self refresh, pseudo-SRAMs} [2013-01]
G11C 11/40618
. . . . . .
{Refresh operations over multiple banks or interleaving} [2013-01]
G11C 11/40622
. . . . . .
{Partial refresh of memory arrays} [2013-01]
G11C 11/40626
. . . . . .
{Temperature related aspects of refresh operations} [2013-01]
G11C 11/4063
. . . . .
Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing [2013-01]
G11C 11/4067
. . . . . .
for memory cells of the bipolar type [2013-01]
G11C 11/407
. . . . . .
for memory cells of the field-effect type [2013-01]
G11C 11/4072
. . . . . . .
Circuits for initialization, powering up or down, clearing memory or presetting [2021-02]
G11C 11/4074
. . . . . . .
Power supply or voltage generation circuits, e.g. bias voltage generators, substrate voltage generators, back-up power, power control circuits [2013-01]
G11C 11/4076
. . . . . . .
Timing circuits (for regeneration management G11C 11/406) [2013-01]
G11C 11/4078
. . . . . . .
Safety or protection circuits, e.g. for preventing inadvertent or unauthorised reading or writing; Status cells; Test cells (protection of memory contents during checking or testing G11C 29/52) [2013-01]
G11C 11/408
. . . . . . .
Address circuits [2013-01]
G11C 11/4082
. . . . . . . .
{Address Buffers; level conversion circuits} [2013-01]
G11C 11/4085
. . . . . . . .
{Word line control circuits, e.g. word line drivers, - boosters, - pull-up, - pull-down, - precharge} [2013-01]
G11C 11/4087
. . . . . . . .
{Address decoders, e.g. bit - or word line decoders; Multiple line decoders} [2013-01]
G11C 11/409
. . . . . . .
Read-write [R-W] circuits  [2018-05]
G11C 11/4091
. . . . . . . .
Sense or sense/refresh amplifiers, or associated sense circuitry, e.g. for coupled bit-line precharging, equalising or isolating [2013-01]
G11C 11/4093
. . . . . . . .
Input/output [I/O] data interface arrangements, e.g. data buffers [2018-05]
G11C 11/4094
. . . . . . . .
Bit-line management or control circuits [2013-01]
G11C 11/4096
. . . . . . . .
Input/output [I/O] data management or control circuits, e.g. reading or writing circuits, I/O drivers or bit-line switches  [2018-05]
G11C 11/4097
. . . . . . . .
Bit-line organisation, e.g. bit-line layout, folded bit lines [2013-01]
G11C 11/4099
. . . . . . . .
Dummy cell treatment; Reference voltage generators [2013-01]
G11C 11/41
. . . .
forming {static} cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger [2013-01]
G11C 11/411
. . . . .
using bipolar transistors only [2013-01]
G11C 11/4113
. . . . . .
{with at least one cell access to base or collector of at least one of said transistors, e.g. via access diodes, access transistors} [2013-01]
G11C 11/4116
. . . . . .
{with at least one cell access via separately connected emittors of said transistors or via multiple emittors, e.g. T2L, ECL} [2013-01]
G11C 11/412
. . . . .
using field-effect transistors only [2021-02]
G11C 11/4125
. . . . . .
{Cells incorporating circuit means for protecting against loss of information} [2021-02]
G11C 11/413
. . . . .
Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction [2021-02]
G11C 11/414
. . . . . .
for memory cells of the bipolar type [2013-01]
G11C 11/415
. . . . . . .
Address circuits [2013-01]
G11C 11/416
. . . . . . .
Read-write [R-W] circuits  [2018-05]
G11C 11/417
. . . . . .
for memory cells of the field-effect type [2013-01]
G11C 11/418
. . . . . . .
Address circuits [2013-01]
G11C 11/419
. . . . . . .
Read-write [R-W] circuits [2018-05]
G11C 11/42
. .
using opto-electronic devices, i.e. light-emitting and photoelectric devices electrically- or optically- coupled {or feedback-coupled} [2021-02]
G11C 11/44
. .
using super-conductive elements, e.g. cryotron [2021-02]
G11C 11/46
.
using thermoplastic elements [2013-01]
G11C 11/48
.
using displaceable coupling elements, e.g. ferromagnetic cores, to produce change between different states of mutual or self-inductance {(contains no documents; see G11C 17/00 and subgroups)} [2013-01]
G11C 11/50
.
using actuation of electric contacts to store the information [2021-02]
G11C 11/52
. .
using electromagnetic relays [2013-01]
G11C 11/54
.
using elements simulating biological cells, e.g. neuron [2013-01]
G11C 11/56
.
using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency [2021-02]
G11C 11/5607
. .
{using magnetic storage elements} [2013-01]
G11C 11/5614
. .
{using conductive bridging RAM [CBRAM] or programming metallization cells [PMC]} [2013-01]
G11C 11/5621
. .
{using charge storage in a floating gate} [2013-01]
G11C 11/5628
. . .
{Programming or writing circuits; Data input circuits} [2013-01]
G11C 11/5635
. . . .
{Erasing circuits} [2013-01]
G11C 11/5642
. . .
{Sensing or reading circuits; Data output circuits} [2013-01]
G11C 11/565
. .
{using capacitive charge storage elements} [2013-01]
G11C 11/5657
. .
{using ferroelectric storage elements} [2013-01]
G11C 11/5664
. .
{using organic memory material storage elements} [2013-01]
G11C 11/5671
. .
{using charge trapping in an insulator} [2013-01]
G11C 11/5678
. .
{using amorphous/crystalline phase transition storage elements} [2013-01]
G11C 11/5685
. .
{using storage elements comprising metal oxide memory material, e.g. perovskites} [2013-01]
G11C 11/5692
. .
{read-only digital stores using storage elements with more than two stable states} [2013-01]
G11C 13/00
Digital stores characterised by the use of storage elements not covered by groups G11C 11/00, G11C 23/00, or G11C 25/00 [2021-02]
G11C 13/0002
.
{using resistive RAM [RRAM] elements} [2018-05]
G11C 13/0004
. .
{comprising amorphous/crystalline phase transition cells} [2013-01]
G11C 13/0007
. .
{comprising metal oxide memory material, e.g. perovskites} [2013-01]
G11C 13/0009
. .
{RRAM elements whose operation depends upon chemical change} [2013-01]
G11C 13/0011
. . .
{comprising conductive bridging RAM [CBRAM] or programming metallization cells [PMCs]} [2013-01]
G11C 13/0014
. . .
{comprising cells based on organic memory material} [2013-01]
G11C 13/0016
. . . .
{comprising polymers} [2013-01]
G11C 13/0019
. . . .
{comprising bio-molecules} [2013-01]
G11C 13/0021
. .
{Auxiliary circuits} [2013-01]
G11C 13/0023
. . .
{Address circuits or decoders} [2013-01]
G11C 13/0026
. . . .
{Bit-line or column circuits} [2013-01]
G11C 13/0028
. . . .
{Word-line or row circuits} [2013-01]
G11C 13/003
. . .
{Cell access} [2013-01]
G11C 13/0033
. . .
{Disturbance prevention or evaluation; Refreshing of disturbed memory data} [2013-01]
G11C 13/0035
. . .
{Evaluating degradation, retention or wearout, e.g. by counting writing cycles} [2013-01]
G11C 13/0038
. . .
{Power supply circuits} [2013-01]
G11C 13/004
. . .
{Reading or sensing circuits or methods} [2013-01]
G11C 2013/0042
. . . .
{Read using differential sensing, e.g. bit line [BL] and bit line bar [BLB]} [2013-01]
G11C 2013/0045
. . . .
{Read using current through the cell} [2013-01]
G11C 2013/0047
. . . .
{Read destroying or disturbing the data} [2013-01]
G11C 2013/005
. . . .
{Read using potential difference applied between cell electrodes} [2013-01]
G11C 2013/0052
. . . .
{Read process characterized by the shape, e.g. form, length, amplitude of the read pulse} [2013-01]
G11C 2013/0054
. . . .
{Read is performed on a reference element, e.g. cell, and the reference sensed value is used to compare the sensed value of the selected cell} [2013-01]
G11C 2013/0057
. . . .
{Read done in two steps, e.g. wherein the cell is read twice and one of the two read values serving as a reference value} [2013-01]
G11C 13/0059
. . .
{Security or protection circuits or methods} [2013-01]
G11C 13/0061
. . .
{Timing circuits or methods} [2013-01]
G11C 13/0064
. . .
{Verifying circuits or methods} [2013-01]
G11C 2013/0066
. . . .
{Verify correct writing whilst writing is in progress, e.g. by detecting onset or cessation of current flow in cell and using the detector output to terminate writing} [2013-01]
G11C 13/0069
. . .
{Writing or programming circuits or methods} [2013-01]
G11C 2013/0071
. . . .
{Write using write potential applied to access device gate} [2013-01]
G11C 2013/0073
. . . .
{Write using bi-directional cell biasing} [2013-01]
G11C 2013/0076
. . . .
{Write operation performed depending on read result} [2013-01]
G11C 2013/0078
. . . .
{Write using current through the cell} [2013-01]
G11C 2013/008
. . . .
{Write by generating heat in the surroundings of the memory material, e.g. thermowrite} [2013-01]
G11C 2013/0083
. . . .
{Write to perform initialising, forming process, electro forming or conditioning} [2013-01]
G11C 2013/0085
. . . .
{Write a page or sector of information simultaneously, e.g. a complete row or word line} [2013-01]
G11C 2013/0088
. . . .
{Write with the simultaneous writing of a plurality of cells} [2013-01]
G11C 2013/009
. . . .
{Write using potential difference applied between cell electrodes} [2013-01]
G11C 2013/0092
. . . .
{Write characterized by the shape, e.g. form, length, amplitude of the write pulse} [2013-01]
G11C 2013/0095
. . . .
{Write using strain induced by, e.g. piezoelectric, thermal effects} [2013-01]
G11C 13/0097
. . .
{Erasing, e.g. resetting, circuits or methods} [2013-01]
G11C 13/02
.
using elements whose operation depends upon chemical change {(G11C 13/0009 takes precedence)} [2021-02]
G11C 13/025
. .
{using fullerenes, e.g. C60, or nanotubes, e.g. carbon or silicon nanotubes} [2013-01]
G11C 13/04
.
using optical elements {; using other beam accessed elements, e.g. electron or ion beam} [2021-02]
G11C 13/041
. .
{using photochromic storage elements (G11C 13/042 takes precedence)} [2013-01]
G11C 13/042
. .
{using information stored in the form of interference pattern} [2021-02]
G11C 13/043
. . .
{using magnetic-optical storage elements} [2013-01]
G11C 13/044
. . .
{using electro-optical elements} [2013-01]
G11C 13/045
. . .
{using photochromic storage elements} [2013-01]
G11C 13/046
. . .
{using other storage elements storing information in the form of an interference pattern} [2013-01]
G11C 13/047
. .
{using electro-optical elements (G11C 13/042 takes precedence)} [2013-01]
G11C 13/048
. .
{using other optical storage elements} [2013-01]
G11C 13/06
. .
using magneto-optical elements {(G11C 13/042 takes precedence)} [2021-02]
G11C 14/00
Digital stores characterised by arrangements of cells having volatile and non-volatile storage properties for back-up when the power is down [2021-02]
G11C 14/0009
.
{in which the volatile element is a DRAM cell} [2013-01]
G11C 14/0018
. .
{whereby the nonvolatile element is an EEPROM element, e.g. a floating gate or metal-nitride-oxide-silicon [MNOS] transistor} [2018-05]
G11C 14/0027
. .
{and the nonvolatile element is a ferroelectric element} [2013-01]
G11C 14/0036
. .
{and the nonvolatile element is a magnetic RAM [MRAM] element or ferromagnetic cell} [2013-01]
G11C 14/0045
. .
{and the nonvolatile element is a resistive RAM element, i.e. programmable resistors, e.g. formed of phase change or chalcogenide material} [2016-05]
G11C 14/0054
.
{in which the volatile element is a SRAM cell} [2013-01]
G11C 14/0063
. .
{and the nonvolatile element is an EEPROM element, e.g. a floating gate or MNOS transistor} [2013-01]
G11C 14/0072
. .
{and the nonvolatile element is a ferroelectric element} [2013-01]
G11C 14/0081
. .
{and the nonvolatile element is a magnetic RAM [MRAM] element or ferromagnetic cell} [2013-01]
G11C 14/009
. .
{and the nonvolatile element is a resistive RAM element, i.e. programmable resistors, e.g. formed of phase change or chalcogenide material} [2016-05]
G11C 15/00
Digital stores in which information comprising one or more characteristic parts is written into the store and in which information is read-out by searching for one or more of these characteristic parts, i.e. associative or content-addressed stores [2021-02]
G11C 15/02
.
using magnetic elements [2013-01]
G11C 15/04
.
using semiconductor elements [2013-01]
G11C 15/043
. .
{using capacitive charge storage elements} [2013-01]
G11C 15/046
. .
{using non-volatile storage elements} [2013-01]
G11C 15/06
.
using cryogenic elements [2013-01]
G11C 16/00
Erasable programmable read-only memories (G11C 14/00 takes precedence) [2013-01]
G11C 16/02
.
electrically programmable [2021-02]
G11C 16/04
. .
using variable threshold transistors, e.g. FAMOS [2013-01]
G11C 16/0408
. . .
{comprising cells containing floating gate transistors (G11C 16/0483, G11C 16/0491 take precedence)} [2013-01]
G11C 16/0416
. . . .
{comprising cells containing a single floating gate transistor and no select transistor, e.g. UV EPROM} [2013-01]
G11C 16/0425
. . . .
{comprising cells containing a merged floating gate and select transistor} [2015-10]
G11C 16/0433
. . . .
{comprising cells containing a single floating gate transistor and one or more separate select transistors} [2013-01]
G11C 16/0441
. . . .
{comprising cells containing multiple floating gate devices, e.g. separate read-and-write FAMOS transistors with connected floating gates} [2013-01]
G11C 16/045
. . . . .
{Floating gate memory cells with both P and N channel memory transistors, usually sharing a common floating gate} [2013-01]
G11C 16/0458
. . . . .
{comprising two or more independent floating gates which store independent data} [2021-02]
G11C 16/0466
. . .
{comprising cells with charge storage in an insulating layer, e.g. metal-nitride-oxide-silicon [MNOS], silicon-oxide-nitride-oxide-silicon [SONOS] (G11C 16/0483, G11C 16/0491 take precedence)} [2018-05]
G11C 16/0475
. . . .
{comprising two or more independent storage sites which store independent data} [2021-02]
G11C 16/0483
. . .
{comprising cells having several storage transistors connected in series} [2013-01]
G11C 16/0491
. . .
{Virtual ground arrays} [2013-01]
G11C 16/06
. .
Auxiliary circuits, e.g. for writing into memory [2021-02]
G11C 16/08
. . .
Address circuits; Decoders; Word-line control circuits [2013-01]
G11C 16/10
. . .
Programming or data input circuits [2013-01]
G11C 16/102
. . . .
{External programming circuits, e.g. EPROM programmers; In-circuit programming or reprogramming; EPROM emulators} [2013-01]
G11C 16/105
. . . . .
{Circuits or methods for updating contents of nonvolatile memory, especially with 'security' features to ensure reliable replacement, i.e. preventing that old data is lost before new data is reliably written} [2013-01]
G11C 16/107
. . . .
{Programming all cells in an array, sector or block to the same state prior to flash erasing} [2013-01]
G11C 16/12
. . . .
Programming voltage switching circuits [2013-01]
G11C 16/14
. . . .
Circuits for erasing electrically, e.g. erase voltage switching circuits [2013-01]
G11C 16/16
. . . . .
for erasing blocks, e.g. arrays, words, groups [2013-01]
G11C 16/18
. . . .
Circuits for erasing optically [2013-01]
G11C 16/20
. . . .
Initialising; Data preset; Chip identification [2013-01]
G11C 16/22
. . .
Safety or protection circuits preventing unauthorised or accidental access to memory cells [2013-01]
G11C 16/225
. . . .
{Preventing erasure, programming or reading when power supply voltages are outside the required ranges} [2013-01]
G11C 16/24
. . .
Bit-line control circuits [2013-01]
G11C 16/26
. . .
Sensing or reading circuits; Data output circuits [2013-01]
G11C 16/28
. . . .
using differential sensing or reference cells, e.g. dummy cells [2013-01]
G11C 16/30
. . .
Power supply circuits [2013-01]
G11C 16/32
. . .
Timing circuits [2013-01]
G11C 16/34
. . .
Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention [2013-01]
G11C 16/3404
. . . .
{Convergence or correction of memory cell threshold voltages; Repair or recovery of overerased or overprogrammed cells} [2013-01]
G11C 16/3409
. . . . .
{Circuits or methods to recover overerased nonvolatile memory cells detected during erase verification, usually by means of a "soft" programming step} [2013-01]
G11C 16/3413
. . . . .
{Circuits or methods to recover overprogrammed nonvolatile memory cells detected during program verification, usually by means of a "soft" erasing step} [2013-01]
G11C 16/3418
. . . .
{Disturbance prevention or evaluation; Refreshing of disturbed memory data} [2013-01]
G11C 16/3422
. . . . .
{Circuits or methods to evaluate read or write disturbance in nonvolatile memory, without steps to mitigate the problem} [2013-01]
G11C 16/3427
. . . . .
{Circuits or methods to prevent or reduce disturbance of the state of a memory cell when neighbouring cells are read or written} [2013-01]
G11C 16/3431
. . . . .
{Circuits or methods to detect disturbed nonvolatile memory cells, e.g. which still read as programmed but with threshold less than the program verify threshold or read as erased but with threshold greater than the erase verify threshold, and to reverse the disturbance via a refreshing programming or erasing step} [2013-01]
G11C 16/3436
. . . .
{Arrangements for verifying correct programming or erasure} [2013-01]
G11C 16/344
. . . . .
{Arrangements for verifying correct erasure or for detecting overerased cells} [2013-01]
G11C 16/3445
. . . . . .
{Circuits or methods to verify correct erasure of nonvolatile memory cells} [2013-01]
G11C 16/345
. . . . . .
{Circuits or methods to detect overerased nonvolatile memory cells, usually during erasure verification} [2013-01]
G11C 16/3454
. . . . .
{Arrangements for verifying correct programming or for detecting overprogrammed cells} [2013-01]
G11C 16/3459
. . . . . .
{Circuits or methods to verify correct programming of nonvolatile memory cells} [2013-01]
G11C 16/3463
. . . . . .
{Circuits or methods to detect overprogrammed nonvolatile memory cells, usually during program verification} [2013-01]
G11C 16/3468
. . . . .
{Prevention of overerasure or overprogramming, e.g. by verifying whilst erasing or writing} [2013-01]
G11C 16/3472
. . . . . .
{Circuits or methods to verify correct erasure of nonvolatile memory cells whilst erasing is in progress, e.g. by detecting onset or cessation of current flow in cells and using the detector output to terminate erasure} [2013-01]
G11C 16/3477
. . . . . .
{Circuits or methods to prevent overerasing of nonvolatile memory cells, e.g. by detecting onset or cessation of current flow in cells and using the detector output to terminate erasing} [2013-01]
G11C 16/3481
. . . . . .
{Circuits or methods to verify correct programming of nonvolatile memory cells whilst programming is in progress, e.g. by detecting onset or cessation of current flow in cells and using the detector output to terminate programming} [2013-01]
G11C 16/3486
. . . . . .
{Circuits or methods to prevent overprogramming of nonvolatile memory cells, e.g. by detecting onset or cessation of current flow in cells and using the detector output to terminate programming} [2013-01]
G11C 16/349
. . . .
{Arrangements for evaluating degradation, retention or wearout, e.g. by counting erase cycles} [2013-01]
G11C 16/3495
. . . . .
{Circuits or methods to detect or delay wearout of nonvolatile EPROM or EEPROM memory devices, e.g. by counting numbers of erase or reprogram cycles, by using multiple memory areas serially or cyclically} [2013-01]
G11C 17/00
Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards [2021-02]
G11C 17/005
.
{with a storage element common to a large number of data, e.g. perforated card (G11C 17/02, G11C 17/04 take precedence)} [2013-01]
G11C 17/02
.
using magnetic or inductive elements (G11C 17/14 takes precedence) [2018-05]
G11C 17/04
.
using capacitive elements (G11C 17/06, G11C 17/14 take precedence) [2013-01]
G11C 17/06
.
using diode elements (G11C 17/14 takes precedence) [2013-01]
G11C 17/08
.
using semiconductor devices, e.g. bipolar elements (G11C 17/06, G11C 17/14 take precedence) [2013-01]
G11C 17/10
. .
in which contents are determined during manufacturing by a predetermined arrangement of coupling elements, e.g. mask-programmable ROM [2013-01]
G11C 17/12
. . .
using field-effect devices [2013-01]
G11C 17/123
. . . .
{comprising cells having several storage transistors connected in series} [2013-01]
G11C 17/126
. . . .
{Virtual ground arrays} [2013-01]
G11C 17/14
.
in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM [2013-01]
G11C 17/143
. .
{using laser-fusible links} [2013-01]
G11C 17/146
. .
{Write once memory, i.e. allowing changing of memory content by writing additional bits} [2013-01]
G11C 17/16
. .
using electrically-fusible links [2013-01]
G11C 17/165
. . .
{Memory cells which are electrically programmed to cause a change in resistance, e.g. to permit multiple resistance steps to be programmed rather than conduct to or from non-conduct change of fuses and antifuses (digital stores using resistance random access memory elements G11C 13/0002)} [2013-01]
G11C 17/18
. .
Auxiliary circuits, e.g. for writing into memory [2021-02]
G11C 19/00
Digital stores in which the information is moved stepwise, e.g. shift registers [2021-02]
G11C 19/005
.
{with ferro-electric elements (condensers)} [2013-01]
G11C 19/02
.
using magnetic elements (G11C 19/14 takes precedence) [2013-01]
G11C 19/04
. .
using cores with one aperture or magnetic loop [2013-01]
G11C 19/06
. .
using structures with a number of apertures or magnetic loops, e.g. transfluxors {laddic} [2013-01]
G11C 19/08
. .
using thin films in plane structure [2021-02]
G11C 19/0808
. . .
{using magnetic domain propagation} [2013-01]
G11C 19/0816
. . . .
{using a rotating or alternating coplanar magnetic field} [2013-01]
G11C 19/0825
. . . .
{using a variable perpendicular magnetic field} [2013-01]
G11C 19/0833
. . . .
{using magnetic domain interaction} [2013-01]
G11C 19/0841
. . . .
{using electric current} [2013-01]
G11C 19/085
. . .
{Generating magnetic fields therefor, e.g. uniform magnetic field for magnetic domain stabilisation} [2021-02]
G11C 19/0858
. . .
{Generating, replicating or annihilating magnetic domains (also comprising different types of magnetic domains, e.g. "Hard Bubbles") (G11C 19/0866 takes precedence)} [2013-01]
G11C 19/0866
. . .
{Detecting magnetic domains} [2021-02]
G11C 19/0875
. . .
{Organisation of a plurality of magnetic shift registers} [2021-02]
G11C 19/0883
. . . .
{Means for switching magnetic domains from one path into another path, i.e. transfer switches, swap gates or decoders} [2021-02]
G11C 19/0891
. . . . .
{using hybrid structure, e.g. ion doped layers} [2013-01]
G11C 19/10
. .
using thin films on rods; with twistors [2013-01]
G11C 19/12
.
using non-linear reactive devices in resonant circuits {, e.g. parametrons; magnetic amplifiers with overcritical feedback} [2017-08]
G11C 19/14
.
using magnetic elements in combination with active elements, e.g. discharge tubes, semiconductor elements {(contains no documents, see provisionally G11C 19/02 - G11C 19/10)} [2016-05]
G11C 19/18
.
using capacitors as main elements of the stages {(if capacitors are used as auxiliary stage in between main stages with other elements, the latter take precedence; G11C 19/005 takes precedence)} [2013-01]
G11C 19/182
. .
{in combination with semiconductor elements, e.g. bipolar transistors, diodes} [2013-01]
G11C 19/184
. . .
{with field-effect transistors, e.g. MOS-FET} [2013-01]
G11C 19/186
. . . .
{using only one transistor per capacitor, e.g. bucket brigade shift register} [2013-01]
G11C 19/188
. . .
{Organisation of a multiplicity of shift registers, e.g. regeneration, timing or input-output circuits} [2021-02]
G11C 19/20
.
using discharge tubes (G11C 19/14 takes precedence) [2013-01]
G11C 19/202
. .
{with vacuum tubes (G11C 19/207 takes precedence)} [2013-01]
G11C 19/205
. .
{with gas-filled tubes (G11C 19/207 takes precedence)} [2013-01]
G11C 19/207
. .
{with counting tubes} [2013-01]
G11C 19/28
.
using semiconductor elements (G11C 19/14, G11C 19/36 take precedence) [2021-02]
G11C 19/282
. .
{with charge storage in a depletion layer, i.e. charge coupled devices [CCD]} [2018-05]
G11C 19/285
. . .
{Peripheral circuits, e.g. for writing into the first stage; for reading-out of the last stage} [2013-01]
G11C 19/287
. .
{Organisation of a multiplicity of shift registers} [2021-02]
G11C 19/30
.
using opto-electronic devices, i.e. light-emitting and photoelectric devices electrically- or optically-coupled [2021-02]
G11C 19/32
.
using super-conductive elements [2021-02]
G11C 19/34
.
using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency [2021-02]
G11C 19/36
. .
using {multistable} semiconductor elements [2013-01]
G11C 19/38
.
two-dimensional, e.g. horizontal and vertical shift registers [2013-01]
G11C 21/00
Digital stores in which the information circulates {continuously}(stepwise G11C 19/00) [2013-01]
G11C 21/005
.
{using electrical delay lines} [2021-02]
G11C 21/02
.
using electromechanical delay lines, e.g. using a mercury tank [2021-02]
G11C 21/023
. .
{using piezoelectric transducers, e.g. mercury tank} [2023-08]
G11C 21/026
. .
{using magnetostriction transducers, e.g. nickel delay line} [2013-01]
G11C 23/00
Digital stores characterised by movement of mechanical parts to effect storage, e.g. using balls; Storage elements therefor [2021-02]
G11C 25/00
Digital stores characterised by the use of flowing media; Storage elements therefor [2021-02]
G11C 27/00
Electric analogue stores, e.g. for storing instantaneous values [2021-02]
G11C 27/005
.
{with non-volatile charge storage, e.g. on floating gate or MNOS} [2013-01]
G11C 27/02
.
Sample-and-hold arrangements (G11C 27/04 takes precedence) [2021-02]
G11C 27/022
. .
{using a magnetic memory element} [2013-01]
G11C 27/024
. .
{using a capacitive memory element (G11C 27/04 takes precedence)} [2013-01]
G11C 27/026
. . .
{associated with an amplifier (G11C 27/028 takes precedence)} [2013-01]
G11C 27/028
. . .
{Current mode circuits, e.g. switched current memories} [2013-01]
G11C 27/04
.
Shift registers [2021-02]
G11C 29/00
Checking stores for correct operation {; Subsequent repair}; Testing stores during standby or offline operation [2021-02]
G11C 29/003
.
{in serial memories} [2013-01]
G11C 29/006
.
{at wafer scale level, i.e. wafer scale integration [WSI]} [2021-02]
G11C 29/02
.
Detection or location of defective auxiliary circuits, e.g. defective refresh counters [2013-01]
G11C 29/021
. .
{in voltage or current generators} [2013-01]
G11C 29/022
. .
{in I/O circuitry} [2013-01]
G11C 29/023
. .
{in clock generator or timing circuitry} [2013-01]
G11C 29/024
. .
{in decoders} [2013-01]
G11C 29/025
. .
{in signal lines} [2013-01]
G11C 29/026
. .
{in sense amplifiers} [2013-01]
G11C 29/027
. .
{in fuses} [2013-01]
G11C 29/028
. .
{with adaption or trimming of parameters} [2013-01]
G11C 29/04
.
Detection or location of defective memory elements {, e.g. cell constructio details, timing of test signals} [2017-08]
G11C 2029/0401
. .
{in embedded memories} [2013-01]
G11C 2029/0403
. .
{during or with feedback to manufacture} [2013-01]
G11C 2029/0405
. .
{comprising complete test loop} [2013-01]
G11C 2029/0407
. .
{on power on} [2013-01]
G11C 2029/0409
. .
{Online test} [2013-01]
G11C 2029/0411
. .
{Online error correction} [2013-01]
G11C 29/06
. .
Acceleration testing [2013-01]
G11C 29/08
. .
Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing [2013-01]
G11C 29/10
. . .
Test algorithms, e.g. memory scan [MScan] algorithms; Test patterns, e.g. checkerboard patterns  [2018-05]
G11C 29/12
. . .
Built-in arrangements for testing, e.g. built-in self testing [BIST] {or interconnection details} [2013-01]
G11C 29/12005
. . . .
{comprising voltage or current generators} [2013-01]
G11C 29/1201
. . . .
{comprising I/O circuitry} [2013-01]
G11C 29/12015
. . . .
{comprising clock generation or timing circuitry} [2013-01]
G11C 2029/1202
. . . .
{Word line control} [2013-01]
G11C 2029/1204
. . . .
{Bit line control} [2013-01]
G11C 2029/1206
. . . .
{Location of test circuitry on chip or wafer} [2013-01]
G11C 2029/1208
. . . .
{Error catch memory} [2013-01]
G11C 29/14
. . . .
Implementation of control logic, e.g. test mode decoders [2013-01]
G11C 29/16
. . . . .
using microprogrammed units, e.g. state machines [2013-01]
G11C 29/18
. . . .
Address generation devices; Devices for accessing memories, e.g. details of addressing circuits [2013-01]
G11C 2029/1802
. . . . .
{Address decoder} [2013-01]
G11C 2029/1804
. . . . .
{Manipulation of word size} [2013-01]
G11C 2029/1806
. . . . .
{Address conversion or mapping, i.e. logical to physical address} [2013-01]
G11C 29/20
. . . . .
using counters or linear-feedback shift registers [LFSR] [2013-01]
G11C 29/22
. . . . .
Accessing serial memories [2013-01]
G11C 29/24
. . . . .
Accessing extra cells, e.g. dummy cells or redundant cells [2013-01]
G11C 29/26
. . . . .
Accessing multiple arrays (G11C 29/24 takes precedence) [2013-01]
G11C 2029/2602
. . . . . .
{Concurrent test} [2013-01]
G11C 29/28
. . . . . .
Dependent multiple arrays, e.g. multi-bit arrays [2013-01]
G11C 29/30
. . . . .
Accessing single arrays [2013-01]
G11C 29/32
. . . . . .
Serial access; Scan testing [2013-01]
G11C 2029/3202
. . . . . .
{Scan chain} [2013-01]
G11C 29/34
. . . . . .
Accessing multiple bits simultaneously [2013-01]
G11C 29/36
. . . .
Data generation devices, e.g. data inverters [2013-01]
G11C 2029/3602
. . . . .
{Pattern generator} [2013-01]
G11C 29/38
. . . .
Response verification devices [2013-01]
G11C 29/40
. . . . .
using compression techniques [2013-01]
G11C 2029/4002
. . . . . .
{Comparison of products, i.e. test results of chips or with golden chip} [2013-01]
G11C 29/42
. . . . .
using error correcting codes [ECC] or parity check [2013-01]
G11C 29/44
. . . .
Indication or identification of errors, e.g. for repair [2013-01]
G11C 29/4401
. . . . .
{for self repair} [2013-01]
G11C 2029/4402
. . . .
{Internal storage of test result, quality data, chip identification, repair information} [2013-01]
G11C 29/46
. . . .
Test trigger logic [2013-01]
G11C 29/48
. . .
Arrangements in static stores specially adapted for testing by means external to the store, e.g. using direct memory access [DMA] or using auxiliary access paths [2021-02]
G11C 29/50
. .
Marginal testing, e.g. race, voltage or current testing [2013-01]
G11C 29/50004
. . .
{of threshold voltage} [2013-01]
G11C 29/50008
. . .
{of impedance} [2013-01]
G11C 29/50012
. . .
{of timing} [2013-01]
G11C 29/50016
. . .
{of retention} [2013-01]
G11C 2029/5002
. . .
{Characteristic} [2013-01]
G11C 2029/5004
. . .
{Voltage} [2013-01]
G11C 2029/5006
. . .
{Current} [2013-01]
G11C 29/52
.
Protection of memory contents; Detection of errors in memory contents [2013-01]
G11C 29/54
.
Arrangements for designing test circuits, e.g. design for test [DFT] tools [2013-01]
G11C 29/56
.
External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor [2013-01]
G11C 29/56004
. .
{Pattern generation} [2013-01]
G11C 29/56008
. .
{Error analysis, representation of errors} [2013-01]
G11C 29/56012
. .
{Timing aspects, clock generation, synchronisation} [2013-01]
G11C 29/56016
. .
{Apparatus features} [2013-01]
G11C 2029/5602
. .
{Interface to device under test} [2013-01]
G11C 2029/5604
. .
{Display of error information} [2013-01]
G11C 2029/5606
. .
{Error catch memory} [2013-01]
G11C 29/70
.
{Masking faults in memories by using spares or by reconfiguring} [2013-01]
G11C 29/702
. .
{by replacing auxiliary circuits, e.g. spare voltage generators, decoders or sense amplifiers, to be used instead of defective ones} [2013-01]
G11C 29/72
. .
{with optimized replacement algorithms} [2013-01]
G11C 29/74
. .
{using duplex memories, i.e. using dual copies} [2013-01]
G11C 29/76
. .
{using address translation or modifications} [2013-01]
G11C 29/765
. . .
{in solid state disks} [2013-01]
G11C 29/78
. .
{using programmable devices} [2013-01]
G11C 29/781
. . .
{combined in a redundant decoder} [2013-01]
G11C 29/783
. . .
{with refresh of replacement cells, e.g. in DRAMs} [2013-01]
G11C 29/785
. . .
{with redundancy programming schemes} [2013-01]
G11C 29/787
. . . .
{using a fuse hierarchy} [2021-02]
G11C 29/789
. . . .
{using non-volatile cells or latches} [2021-02]
G11C 29/80
. . .
{with improved layout} [2013-01]
G11C 29/802
. . . .
{by encoding redundancy signals} [2013-01]
G11C 29/804
. . . .
{to prevent clustered faults} [2013-01]
G11C 29/806
. . . .
{by reducing size of decoders} [2013-01]
G11C 29/808
. . . .
{using a flexible replacement scheme} [2013-01]
G11C 29/81
. . . .
{using a hierarchical redundancy scheme} [2013-01]
G11C 29/812
. . . .
{using a reduced amount of fuses} [2013-01]
G11C 29/814
. . . .
{for optimized yield} [2013-01]
G11C 29/816
. . . .
{for an application-specific layout} [2013-01]
G11C 29/818
. . . . .
{for dual-port memories} [2013-01]
G11C 29/82
. . . . .
{for EEPROMs} [2013-01]
G11C 29/822
. . . . .
{for read only memories} [2013-01]
G11C 29/824
. . . . .
{for synchronous memories} [2013-01]
G11C 29/83
. . .
{with reduced power consumption} [2013-01]
G11C 29/832
. . . .
{with disconnection of faulty elements} [2013-01]
G11C 29/835
. . .
{with roll call arrangements for redundant substitutions} [2013-01]
G11C 29/838
. . .
{with substitution of defective spares} [2013-01]
G11C 29/84
. . .
{with improved access time or stability} [2013-01]
G11C 29/842
. . . .
{by introducing a delay in a signal path} [2013-01]
G11C 29/844
. . . .
{by splitting the decoders in stages} [2013-01]
G11C 29/846
. . . .
{by choosing redundant lines at an output stage} [2013-01]
G11C 29/848
. . . .
{by adjacent switching} [2013-01]
G11C 29/86
. .
{in serial access memories, e.g. shift registers, CCDs, bubble memories} [2013-01]
G11C 29/88
. .
{with partially good memories} [2013-01]
G11C 29/883
. . .
{using a single defective memory device with reduced capacity, e.g. half capacity} [2016-08]
G11C 29/886
. . .
{combining plural defective memory devices to provide a contiguous address range, e.g. one device supplies working blocks to replace defective blocks in another device} [2016-08]
G11C 99/00
Subject matter not provided for in other groups of this subclass [2013-01]
G11C 2207/00
Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store [2013-01]
G11C 2207/002
.
Isolation gates, i.e. gates coupling bit lines to the sense amplifier [2013-01]
G11C 2207/005
.
Transfer gates, i.e. gates coupling the sense amplifier output to data lines, I/O lines or global bit lines [2016-05]
G11C 2207/007
.
Register arrays [2013-01]
G11C 2207/06
.
Sense amplifier related aspects [2013-01]
G11C 2207/061
. .
Sense amplifier enabled by a address transition detection related control signal [2013-01]
G11C 2207/063
. .
Current sense amplifiers [2013-01]
G11C 2207/065
. .
Sense amplifier drivers [2013-01]
G11C 2207/066
. .
Frequency reading type sense amplifier [2013-01]
G11C 2207/068
. .
Integrator type sense amplifier [2013-01]
G11C 2207/10
.
Aspects relating to interfaces of memory device to external buses [2013-01]
G11C 2207/101
. .
Analog or multilevel bus [2013-01]
G11C 2207/102
. .
Compression or decompression of data before storage [2013-01]
G11C 2207/104
. .
Embedded memory devices, e.g. memories with a processing device on the same die or ASIC memory designs [2013-01]
G11C 2207/105
. .
Aspects related to pads, pins or terminals [2013-01]
G11C 2207/107
. .
Serial-parallel conversion of data or prefetch [2013-01]
G11C 2207/108
. .
Wide data ports [2013-01]
G11C 2207/12
.
Equalization of bit lines [2013-01]
G11C 2207/16
.
Solid state audio (deprecated, only for historical reasons, G06F 3/16, G11B) [2013-01]
G11C 2207/22
.
Control and timing of internal memory operations [2013-01]
G11C 2207/2209
. .
Concurrent read and write (for multi-port memory G11C 7/1075) [2013-01]
G11C 2207/2218
. .
Late write [2013-01]
G11C 2207/2227
. .
Standby or low power modes [2013-01]
G11C 2207/2236
. .
Copy [2013-01]
G11C 2207/2245
. .
Memory devices with an internal cache buffer [2013-01]
G11C 2207/2254
. .
Calibration [2013-01]
G11C 2207/2263
. .
Write conditionally, e.g. only if new data and old data differ [2013-01]
G11C 2207/2272
. .
Latency related aspects [2013-01]
G11C 2207/2281
. .
Timing of a read operation (sense amplifier timing G11C 7/06, G11C 7/08) [2013-01]
G11C 2207/229
. .
Timing of a write operation (sense amplifier timing G11C 7/06, G11C 7/08) [2013-01]
G11C 2211/00
Indexing scheme relating to digital stores characterized by the use of particular electric or magnetic storage elements; Storage elements therefor [2013-01]
G11C 2211/401
.
Indexing scheme relating to cells needing refreshing or charge regeneration, i.e. dynamic cells [2013-01]
G11C 2211/4013
. .
Memory devices with multiple cells per bit, e.g. twin-cells [2013-01]
G11C 2211/4016
. .
Memory devices with silicon-on-insulator cells [2013-01]
G11C 2211/406
. .
Refreshing of dynamic cells [2013-01]
G11C 2211/4061
. . .
Calibration or ate or cycle tuning [2013-01]
G11C 2211/4062
. . .
Parity or ECC in refresh operations [2013-01]
G11C 2211/4063
. . .
Interleaved refresh operations [2013-01]
G11C 2211/4065
. . .
Low level details of refresh operations [2013-01]
G11C 2211/4066
. . .
Pseudo-SRAMs [2013-01]
G11C 2211/4067
. . .
Refresh in standby or low power modes [2016-05]
G11C 2211/4068
. . .
Voltage or leakage in refresh operations [2013-01]
G11C 2211/56
.
Indexing scheme relating to G11C 11/56 and sub-groups for features not covered by these groups [2013-01]
G11C 2211/561
. .
Multilevel memory cell aspects [2013-01]
G11C 2211/5611
. . .
Multilevel memory cell with more than one control gate [2013-01]
G11C 2211/5612
. . .
Multilevel memory cell with more than one floating gate [2013-01]
G11C 2211/5613
. . .
Multilevel memory cell with additional gates, not being floating or control gates [2013-01]
G11C 2211/5614
. . .
Multilevel memory cell comprising negative resistance, quantum tunneling or resonance tunneling elements [2013-01]
G11C 2211/5615
. . .
Multilevel magnetic memory cell using non-magnetic non-conducting interlayer, e.g. MTJ [2013-01]
G11C 2211/5616
. . .
Multilevel magnetic memory cell using non-magnetic conducting interlayer, e.g. GMR, SV, PSV [2013-01]
G11C 2211/5617
. . .
Multilevel ROM cell programmed by source, drain or gate contacting [2013-01]
G11C 2211/562
. .
Multilevel memory programming aspects [2013-01]
G11C 2211/5621
. . .
Multilevel programming verification [2013-01]
G11C 2211/5622
. . .
Concurrent multilevel programming of more than one cell [2013-01]
G11C 2211/5623
. . .
Concurrent multilevel programming and reading [2013-01]
G11C 2211/5624
. . .
Concurrent multilevel programming and programming verification [2013-01]
G11C 2211/5625
. . .
Self-converging multilevel programming [2013-01]
G11C 2211/563
. .
Multilevel memory reading aspects [2013-01]
G11C 2211/5631
. . .
Concurrent multilevel reading of more than one cell [2013-01]
G11C 2211/5632
. . .
Multilevel reading using successive approximation [2013-01]
G11C 2211/5633
. . .
Mixed concurrent serial multilevel reading [2013-01]
G11C 2211/5634
. . .
Reference cells [2013-01]
G11C 2211/564
. .
Miscellaneous aspects [2013-01]
G11C 2211/5641
. . .
Multilevel memory having cells with different number of storage levels [2013-01]
G11C 2211/5642
. . .
Multilevel memory with buffers, latches, registers at input or output [2013-01]
G11C 2211/5643
. . .
Multilevel memory comprising cache storage devices [2013-01]
G11C 2211/5644
. . .
Multilevel memory comprising counting devices [2013-01]
G11C 2211/5645
. . .
Multilevel memory with current-mirror arrangements [2013-01]
G11C 2211/5646
. . .
Multilevel memory with flag bits, e.g. for showing that a "first page" of a word line is programmed but not a "second page" [2013-01]
G11C 2211/5647
. . .
Multilevel memory with bit inversion arrangement [2013-01]
G11C 2211/5648
. . .
Multilevel memory programming, reading or erasing operations wherein the order or sequence of the operations is relevant [2013-01]
G11C 2211/5649
. . .
Multilevel memory with plate line or layer, e.g. in order to lower programming voltages [2013-01]
G11C 2211/565
. . .
Multilevel memory comprising elements in triple well structure [2013-01]
G11C 2213/00
Indexing scheme relating to G11C 13/00 for features not covered by this group [2013-01]
G11C 2213/10
.
Resistive cells; Technology aspects [2013-01]
G11C 2213/11
. .
Metal ion trapping, i.e. using memory material including cavities, pores or spaces in form of tunnels or channels wherein metal ions can be trapped but do not react and form an electro-deposit creating filaments or dendrites [2013-01]
G11C 2213/12
. .
Non-metal ion trapping, i.e. using memory material trapping non-metal ions given by the electrode or another layer during a write operation, e.g. trapping, doping [2013-01]
G11C 2213/13
. .
Dissociation, i.e. using memory material including molecules which, during a write operation, are dissociated in ions which migrate further in the memory material [2013-01]
G11C 2213/14
. .
Use of different molecule structures as storage states, e.g. part of molecule being rotated [2013-01]
G11C 2213/15
. .
Current-voltage curve [2013-01]
G11C 2213/16
. .
Memory cell being a nanotube, e.g. suspended nanotube [2013-01]
G11C 2213/17
. .
Memory cell being a nanowire transistor [2013-01]
G11C 2213/18
. .
Memory cell being a nanowire having RADIAL composition [2013-01]
G11C 2213/19
. .
Memory cell comprising at least a nanowire and only two terminals [2013-01]
G11C 2213/30
.
Resistive cell, memory material aspects [2013-01]
G11C 2213/31
. .
Material having complex metal oxide, e.g. perovskite structure [2013-01]
G11C 2213/32
. .
Material having simple binary metal oxide structure [2013-01]
G11C 2213/33
. .
Material including silicon [2013-01]
G11C 2213/34
. .
Material includes an oxide or a nitride [2013-01]
G11C 2213/35
. .
Material including carbon, e.g. graphite, grapheme [2016-08]
G11C 2213/50
.
Resistive cell structure aspects [2013-01]
G11C 2213/51
. .
Structure including a barrier layer preventing or limiting migration, diffusion of ions or charges or formation of electrolytes near an electrode [2013-01]
G11C 2213/52
. .
Structure characterized by the electrode material, shape, etc. [2013-01]
G11C 2213/53
. .
Structure wherein the resistive material being in a transistor, e.g. gate [2013-01]
G11C 2213/54
. .
Structure including a tunneling barrier layer, the memory effect implying the modification of tunnel barrier conductivity [2013-01]
G11C 2213/55
. .
Structure including two electrodes, a memory active layer and at least two other layers which can be a passive or source or reservoir layer or a less doped memory active layer [2013-01]
G11C 2213/56
. .
Structure including two electrodes, a memory active layer and a so called passive or source or reservoir layer which is NOT an electrode, wherein the passive or source or reservoir layer is a source of ions which migrate afterwards in the memory active layer to be only trapped there, to form conductive filaments there or to react with the material of the memory active layer in redox way [2013-01]
G11C 2213/70
.
Resistive array aspects [2013-01]
G11C 2213/71
. .
Three dimensional array [2013-01]
G11C 2213/72
. .
Array wherein the access device being a diode [2013-01]
G11C 2213/73
. .
Array where access device function, e.g. diode function, being merged with memorizing function of memory element [2013-01]
G11C 2213/74
. .
Array wherein each memory cell has more than one access device [2013-01]
G11C 2213/75
. .
Array having a NAND structure comprising, for example, memory cells in series or memory elements in series, a memory element being a memory cell in parallel with an access transistor [2013-01]
G11C 2213/76
. .
Array using an access device for each cell which being not a transistor and not a diode [2013-01]
G11C 2213/77
. .
Array wherein the memory element being directly connected to the bit lines and word lines without any access device being used [2013-01]
G11C 2213/78
. .
Array wherein the memory cells of a group share an access device, all the memory cells of the group having a common electrode and the access device being not part of a word line or a bit line driver [2013-01]
G11C 2213/79
. .
Array wherein the access device being a transistor [2013-01]
G11C 2213/80
. .
Array wherein the substrate, the cell, the conductors and the access device are all made up of organic materials [2013-01]
G11C 2213/81
. .
Array wherein the array conductors, e.g. word lines, bit lines, are made of nanowires [2016-08]
G11C 2213/82
. .
Array having, for accessing a cell, a word line, a bit line and a plate or source line receiving different potentials [2013-01]
G11C 2216/00
Indexing scheme relating to G11C 16/00 and subgroups, for features not directly covered by these groups [2013-01]
G11C 2216/02
.
Structural aspects of erasable programmable read-only memories [2013-01]
G11C 2216/04
. .
Nonvolatile memory cell provided with a separate control gate for erasing the cells, i.e. erase gate, independent of the normal read control gate [2013-01]
G11C 2216/06
. .
Floating gate cells in which the floating gate consists of multiple isolated silicon islands, e.g. nanocrystals [2013-01]
G11C 2216/08
. .
Nonvolatile memory wherein data storage is accomplished by storing relatively few electrons in the storage layer, i.e. single electron memory [2013-01]
G11C 2216/10
. .
Floating gate memory cells with a single polysilicon layer [2013-01]
G11C 2216/12
.
Reading and writing aspects of erasable programmable read-only memories [2013-01]
G11C 2216/14
. .
Circuits or methods to write a page or sector of information simultaneously into a nonvolatile memory, typically a complete row or word line in flash memory [2013-01]
G11C 2216/16
. .
Flash programming of all the cells in an array, sector or block simultaneously [2013-01]
G11C 2216/18
. .
Flash erasure of all the cells in an array, sector or block simultaneously [2013-01]
G11C 2216/20
. .
Suspension of programming or erasing cells in an array in order to read other cells in it [2013-01]
G11C 2216/22
. .
Nonvolatile memory in which reading can be carried out from one memory bank or array whilst a word or sector in another bank or array is being erased or programmed simultaneously [2013-01]
G11C 2216/24
. .
Nonvolatile memory in which programming can be carried out in one memory bank or array whilst a word or sector in another bank or array is being erased simultaneously [2013-01]
G11C 2216/26
. .
Floating gate memory which is adapted to be one-time programmable [OTP], e.g. containing multiple OTP blocks permitting limited update ability [2013-01]
G11C 2216/28
. .
Floating gate memory programmed by reverse programming, e.g. programmed with negative gate voltage and erased with positive gate voltage or programmed with high source or drain voltage and erased with high gate voltage [2013-01]
G11C 2216/30
. .
Reduction of number of input/output pins by using a serial interface to transmit or receive addresses or data, i.e. serial access memory [2013-01]
G11C 2229/00
Indexing scheme relating to checking stores for correct operation, subsequent repair or testing stores during standby or offline operation [2013-01]
G11C 2229/70
.
Indexing scheme relating to G11C 29/70, for implementation aspects of redundancy repair [2013-01]
G11C 2229/72
. .
Location of redundancy information [2013-01]
G11C 2229/723
. . .
Redundancy information stored in a part of the memory core to be repaired [2016-05]
G11C 2229/726
. . .
Redundancy information loaded from the outside into the memory [2013-01]
G11C 2229/74
. .
Time at which the repair is done [2013-01]
G11C 2229/743
. . .
After packaging [2013-01]
G11C 2229/746
. . .
Before packaging [2013-01]
G11C 2229/76
. .
Storage technology used for the repair [2013-01]
G11C 2229/763
. . .
E-fuses, e.g. electric fuses or antifuses, floating gate transistors [2013-01]
G11C 2229/766
. . .
Laser fuses [2013-01]