US 12,181,423 C1 (13,403rd)
Secondary image removal using high resolution x-ray transmission sources
Sylvia Jia Yun Lewis, San Francisco, CA (US); Sheraz Gul, San Ramon, CA (US); and Wenbing Yun, Walnut Creek, CA (US)
Filed by Sigray, Inc., Concord, CA (US)
Assigned to SIGRAY, INC., Concord, CA (US)
Reexamination Request No. 90/015,889, Jan. 15, 2026.
Reexamination Certificate for Patent 12,181,423, issued Dec. 31, 2024, Appl. No. 18/406,851, Jan. 8, 2024.
Claims priority of provisional application 63/581,225, filed on Sep. 7, 2023.
Ex Parte Reexamination Certificate issued on Oct. 1, 2026.
Int. Cl. G01N 23/04 (2018.01); G01N 23/00 (2006.01); G01N 23/083 (2018.01)
CPC G01N 23/04 (2013.01) [G01N 23/083 (2013.01); G01N 2223/20 (2013.01); G01N 2223/317 (2013.01); G01N 2223/3306 (2013.01); G01N 2223/505 (2013.01)]
OG exemplary drawing
AS A RESULT OF REEXAMINATION, IT HAS BEEN DETERMINED THAT:
The patentability of claims 1-25 is confirmed.
At the time of issuance and publication of this certificate, the patent remains subject to pending reissue application number 19/308,130 filed Aug. 22, 2025. The claim content of the patent may be subsequently revised if a reissue patent is issued from the reissue application.
At the time of issuance and publication of this certificate, the patent remains subject to pending reexamination control number 19/677,110 filed May 14, 2026. The claim content of the patent may be subsequently revised if a reexamination certificate issues from the reexamination proceeding.
21. An apparatus comprising:
a transmission x-ray source configured to generate a primary x-ray beam having a first cone angle Θ1 and a secondary x-ray beam having a second cone angle Θ2 less than the first cone angle Θ1, both the primary x-ray beam and the secondary x-ray beam diverging and symmetric about an x-ray axis;
a sample stage configured to support and controllably move a sample; and
at least one x-ray detector having a region configured to receive x-rays transmitted from the transmission x-ray source and through a region-of-interest of the sample along a beam axis at a non-zero angle Φ relative to the x-ray axis, the at least one x-ray detector configured to generate electrical signals indicative of the x-rays received at the region.