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You are viewing a USPC Schedule.

1

SCANNING OR POSITIONING ARRANGEMENTS, I.E., ARRANGEMENTS FOR ACTIVELY CONTROLLING THE MOVEMENT OR POSITION OF THE PROBE (EPO)

2

Coarse scanning or positioning (EPO)

3

Fine scanning or positioning (EPO)

4

Circuits or algorithms therefor(EPO)

5

MONITORING THE MOVEMENT OR POSITION OF THE PROBE RESPONSIVE TO INTERACTION WITH THE SAMPLE (EPO)

6

By optical means (EPO)

7

Self-detecting probes (EPO)

8

AUXILIARY MEANS SERVING TO ASSIST OR IMPROVE THE SCANNING PROBE TECHNIQUES OR APPARATUS, E.G., DISPLAY OR DATA PROCESSING DEVICES (EPO)

9

Non-SPM analyzing devices, e.g., Scanning Electron Microscope [SEM], spectrometer or optical microscope (EPO)

10

Display or data processing devices (EPO)

11

For error compensation (EPO)

12

Means for establishing or regulating a desired environmental condition within a sample chamber (EPO)

13

Thermal environment (EPO)

14

Fluid environment (EPO)

15

Liquid environment (EPO)

16

Vacuum environment (EPO)

17

Means for protecting or isolating the interior of a sample chamber from external environmental conditions or influences, e.g., vibrations or electromagnetic fields (EPO)

18

Sample handling device or method(EPO)

19

CALIBRATION ASPECT, E.G., CALIBRATION OF PROBES (EPO)

20

Calibration standards and methods of fabrication thereof(EPO)

21

PARTICULAR TYPE OF SCANNING PROBE MICROSCOPY [SPM] OR MICROSCOPE; ESSENTIAL COMPONENTS THEREOF (EPO)

22

Multiple-type SPM, i.e., involving two or more SPM techniques (EPO)

23

Scanning Tunnelling Microscopy [STM] combined with Atomic Force Microscopy [AFM](EPO)

24

Scanning Near-field Optical Microscopy [SNOM] combined with Atomic Force Microscopy [AFM] (EPO)

25

Magnetic Force Microscopy [MFM] combined with Atomic Force Microscopy [AFM] (EPO)

26

Scanning Tunnelling Microscopy [STM] or apparatus therefor, e.g., STM probes (EPO)

27

Scanning Tunnelling Spectroscopy [STS] (EPO)

28

Scanning tunnelling potentiometry [STP] (EPO)

29

Probes, their manufacture, or their related instrumentation, e.g., holders (EPO)

30

Scanning Near-Field Optical Microscopy [SNOM] or apparatus therefor, e.g., SNOM probes (EPO)

31

Fluorescence (EPO)

32

Probes, their manufacture, or their related instrumentation, e.g., holders (EPO)

33

Atomic Force Microscopy [AFM] or apparatus therefor, e.g., AFM probes(EPO)

34

Friction force microscopy (EPO)

35

Adhesion force microscopy (EPO)

36

Scanning potential microscopy (EPO)

37

AC mode (EPO)

38

Tapping mode (EPO)

39

DC mode (EPO)

40

Probes, their manufacture, or their related instrumentation, e.g., holders (EPO)

41

Conductive probes (EPO)

42

Functionalization (EPO)

43

Scanning Ion-Conductance Microscopy [SICM] or apparatus therefor, e.g., SICM probes(EPO)

44

Scanning Capacitance Microscopy [SCM] or apparatus therefor, e.g., SCM probes (EPO)

45

Probes, their manufacture, or their instrumentation, e.g., holders (EPO)

46

Magnetic Force Microscopy [MFM] or apparatus therefor, e.g., MFM probes (EPO)

47

Resonance (EPO)

48

Probes, their manufacture, or their related instrumentation, e.g., holders (EPO)

49

Probes with magnetic coating (EPO)

50

Scanning Thermal Microscopy [SThM] or apparatus therefor, e.g., SThM probes (EPO)

51

Scanning Electro-Chemical Microscopy [SECM] or apparatus therefor, e.g., SECM probes (EPO)

52

GENERAL ASPECTS OF SPM PROBES, THEIR MANUFACTURE, OR THEIR RELATED INSTRUMENTATION, INSOFAR AS THEY ARE NOT SPECIALLY ADAPTED TO A SINGLE SPECIFIC SPM TECHNIQUE (EPO)

53

Probe holders (EPO)

54

With compensation for temperature or vibration induced errors (EPO)

55

Probe tip arrays (EPO)

56

Probe characteristics (EPO)

57

Shape or taper (EPO)

58

Nanotube tips (EPO)

59

Particular materials (EPO)

60

Probe manufacture (EPO)

61

Functionalization (EPO)

62

APPLICATIONS OF SCANNING-PROBE TECHNIQUES OTHER THAN SPM (EPO)

63

SCANNING-PROBE TECHNIQUES OR APPARATUS NOT OTHERWISE PROVIDED FOR (EPO)

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