|
|
Class Numbers & Titles | Class Numbers Only | USPC Index | International | HELP |
You are viewing a USPC Schedule. |
Class 702 | DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING |
Click here for a printable version of this file |
1 | MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT |
2 | Earth science |
3 | Weather |
5 | Topography (e.g., land mapping) |
6 | Well logging or borehole study |
7 | By induction or resistivity logging tool |
8 | By radiation (e.g., nuclear, gamma, X-ray) |
9 | Drilling |
10 | Dipmeter |
11 | Formation characteristic |
14 | Seismology |
19 | Biological or biochemical |
22 | Chemical analysis |
23 | Quantitative determination (e.g., mass, concentration, density) |
24 | Gaseous mixture (e.g., solid-gas, liquid-gas, gas-gas) |
25 | Liquid mixture (e.g., solid-liquid, liquid-liquid) |
26 | By particle count |
27 | Molecular structure or composition determination |
29 | Particle size determination |
30 | Chemical property analysis |
31 | Specific operation control system |
32 | Specific signal data processing |
33 | Mechanical measurement system |
34 | Wear or deterioration evaluation |
35 | Flaw or defect detection |
36 | Location |
38 | Electromagnetic (e.g., eddy current) |
39 | Sound energy (e.g., ultrasonic) |
40 | Radiant energy (e.g., X-ray, infrared, laser) |
41 | Force or torque measurement |
45 | Flow metering |
50 | Fluid measurement (e.g., mass, pressure, viscosity) |
51 | Leak detecting |
52 | Capacitive sensor |
53 | Resistive sensor |
54 | Acoustic or vibration sensor |
55 | Liquid level or volume determination |
56 | Vibration detection |
57 | Electrical signal parameter measurement system |
58 | For electrical fault detection |
60 | Power parameter |
64 | Voltage or current |
66 | Waveform analysis |
67 | Display of waveform |
69 | Signal quality (e.g., timing jitter, distortion, signal-to-noise ratio) |
70 | Waveform extraction |
71 | Waveform-to-waveform comparison |
75 | Frequency |
79 | Time-related parameter (e.g., pulse-width, period, delay, etc.) |
80 | Specified memory location generation for storage |
81 | Quality evaluation |
85 | CALIBRATION OR CORRECTION SYSTEM |
86 | Linearization of measurement |
87 | Zeroing (e.g., null) |
88 | Zero-full scaling |
89 | Timing (e.g., delay, synchronization) |
90 | Error due to component compatibility |
92 | Direction (e.g., compass) |
94 | Position measurement |
96 | Speed |
97 | Length, distance, or thickness |
98 | Pressure |
99 | Temperature |
100 | Fluid or fluid flow measurement |
101 | Weight |
103 | Acoustic |
104 | Sensor or transducer |
105 | For mechanical system |
106 | Signal frequency or phase correction |
107 | Circuit tuning (e.g., potentiometer, amplifier) |
108 | TESTING SYSTEM |
109 | For transfer function determination |
110 | Binary signal stimulus (e.g., pulse) |
111 | Noise signal stimulus (e.g., white noise) |
112 | Sinusoidal signal stimulus |
113 | Of mechanical system |
116 | Of sensing device |
117 | Of circuit |
118 | Testing multiple circuits |
119 | Including program initialization (e.g., program loading) or code selection (e.g., program creation) |
120 | Including input/output or test mode selection means |
121 | Including multiple test instruments |
122 | Including specific communication means |
123 | Including program set up |
124 | Signal generation or waveform shaping |
127 | MEASUREMENT SYSTEM |
128 | Article count or size distribution |
130 | Temperature measuring system |
131 | Body temperature |
132 | Thermal protection |
133 | By resistive means |
134 | By radiant energy |
136 | Thermal related property |
137 | Density |
138 | Pressure |
141 | Accelerometer |
142 | Speed |
150 | Orientation or position |
155 | Dimensional determination |
156 | Area or volume |
157 | Radius or diameter |
158 | Linear distance or length |
159 | By reflected signal (e.g., ultrasonic, light, laser) |
160 | Pedometer |
161 | Electronic ruler |
162 | Micrometer |
163 | By rotary encoding means |
166 | Height or depth |
167 | Contouring |
170 | Thickness or width |
173 | Weight |
176 | Time duration or rate |
177 | Due time monitoring (e.g., medication clock, maintenance interval) |
178 | Timekeeping (e.g., clock, calendar, stopwatch) |
179 | Statistical measurement |
182 | Performance or efficiency evaluation |
187 | History logging or time stamping |
188 | Remote supervisory monitoring |
189 | Measured signal processing |
FOREIGN ART COLLECTIONS | ||
FOR000 | CLASS-RELATED FOREIGN DOCUMENTS |
Any foreign patents or non-patent literature from subclasses that have been reclassified have been transferred directly to FOR Collections listed below. These Collections contain ONLY foreign patents or non-patent literature. The parenthetical references in the Collection titles refer to the abolished subclasses from which these Collections were derived. | ||
APPLICATIONS (364/400) |
FOR100 | Earth sciences (e.g., weather) (364/420) |
FOR103 | Electrical/electronic engineering (364/480) |
Electrical/electronic engineering (364/480) |
FOR115 | Chemical and engineering sciences (364/496) |
FOR116 | Chemical analysis (364/497) |
FOR119 | Chemical process control (364/500) |
FOR123 | Mechanical and civil engineering (364/505) |
FOR130 | Physics (364/524) |
FOR134 | MEASURING, TESTING, OR MONITORING (364/550) |
FOR135 | Measuring and evaluating (e.g., performance) (364/551.01) |
FOR136 | Of machine tool (364/551.02) |
FOR137 | Quality control determinations (364/552) |
FOR138 | Transfer function evaluation (364/553) |
FOR139 | Statistical data (e.g., stochastic variable) (364/554) |
FOR140 | Particle count, distribution, size (364/555) |
FOR141 | For basic measurements (364/556) |
FOR142 | Temperature (364/557) |
FOR143 | Pressure or density (364/558) |
FOR144 | Orientation (364/559) |
FOR145 | Dimension (364/560) |
FOR150 | Rate of change of dimension (e.g., speed) (364/565) |
FOR151 | Acceleration and further derivatives (364/566) |
FOR152 | Weight (364/567) |
FOR154 | Time or time intervals (364/569) |
FOR155 | Operations performed (364/570) |
FOR156 | Calibration or compensation |
FOR157 | Having mathematical operation on initial measurement data (364/571.02) |
FOR158 | Including environmental factors (e.g., temperature) (364/571.03) |
FOR159 | Including predetermined stored data (364/571.04) |
FOR160 | Using difference involving initial measurement data (364/571.05) |
FOR161 | Using analog calculating elements (364/571.06) |
FOR162 | By table look-up (364/571.07) |
FOR163 | Using operator provided data (364/571.08) |
FOR164 | Filtering (364/572) |
FOR165 | Linearization (364/573) |
FOR166 | Noise reduction (364/574) |
FOR167 | Averaging (364/575) |
FOR168 | Fourier analysis (364/576) |
FOR169 | Interpolation/extrapolation (364/577) |
FOR170 | With control of testing or measuring apparatus (364/579) |
FOR171 | Programmed testing conditions (364/580) |
FOR172 | Weighting (364/581) |
FOR173 | Normalization (364/582) |
This page is produced by the Office of Classification Support (Office of Patent Classification) for the Reference Tools Project.
Please send questions and comments to usptoinfo@uspto.gov .
Note: The Patent and Trademark Depository Library Program (PTDLP) administers a nationwide network of public, state and academic libraries designated as Patent and Trademark Depository Libraries authorized by 35 U.S.C. 13 to: Disseminate Patent and Trademark Information Support Diverse Intellectual Property Needs of the Public. PTDL Contact Information
Note: For information/comments on electronic information products, such as purchasing USPTO data, or to discuss system requirements for magnetic tape products, contact:
Information Products Division -- U.S. Patent and Trademark Office
Information Products Division
Contact Information
Or, browse
their on-line catalog.
The Inventors Assistance Center is available to help you on patent matters.Send questions about USPTO programs and services to the USPTO Contact Center (UCC). You can suggest USPTO webpages or material you would like featured on this section by E-mail to the webmaster@uspto.gov. While we cannot promise to accommodate all requests, your suggestions will be considered and may lead to other improvements on the website. |
|