| Patents > Guidance, Tools, and Manuals > Classification > Class Schedule |
|
|
|
| Class Numbers & Titles | Class Numbers Only | USPC Index | International | HELP |
|
| You are viewing a USPC Schedule. |
|
| Class 356 | OPTICS: MEASURING AND TESTING |
| Click here for a printable version of this file | |
![[List of Pre Grant Publications for class 356 subclass 2]](../as.gif) | ![[List of Patents for class 356 subclass 2]](../ps.gif) | 2 | CONTOUR PLOTTING |
| | 3 | RANGE OR REMOTE DISTANCE FINDING |
| | 3.01 |  Triangulation ranging to a point with one projected beam |
| | 3.02 |  Using photodetection with a fixed axial line of sight |
| | 3.03 | Using a source beam with a fixed axial direction or plane |
| | 3.04 |  With a single staring photodetector having one element |
| | 3.06 | With a single photodetector having multiple elements |
| | 3.08 | With at least one paired set of staring photodetectors |
| | 3.09 | Requiring scanning of a source beam |
| | 3.1 | Triangulation ranging to a point with two or more projected beams |
| | 3.11 | Using photodetection at the source station(s) |
| | 3.12 | Using photodetection remote from the source station(s) |
| | 3.13 | Triangulation ranging with photodetection, but with no projected beam |
| | 4.01 | With photodetection |
| | 4.02 | Of a simulation or test |
| | 4.03 | Of focused image size or dimensions |
| | 4.04 | Of degree of defocus |
| | 4.05 | Of focal point search |
| | 4.06 | Of differential amplitude at two source or detector distances |
| | 4.07 | Of intensity proportional to distance |
| | 4.08 | Of height relative to a light plane |
| | 4.09 | Of light interference fringes |
| | 5.01 | Of pulse transit time |
| | 5.02 | Having return coincide with swept display or detector |
| | 5.03 | Having one or more return pulse gates or windows |
| | 5.05 | Having pulse transmission trigger significance |
| | 5.09 | Of frequency difference |
| | 5.1 | Of CW phase delay |
| | 6 | Instrument condition testing or indicating |
| | 7 | Periscope or offset type |
| | 8 | With view finder |
| | 9 | Base line instrument (i.e., base is a part of instrument) |
| | 10 | With filter or light valve |
| | 11 | Range finder combined with height finder |
| | 12 | Stereoscopic |
| | 15 | Length of base line variable |
| | 16 | Image displaced by moving refracting element |
| | 17 | Image displaced by rotating reflecting element |
| | 18 | With mounting, supporting, adjusting, or folding structure |
| | 19 | Prism structure for determining coincidence |
| | 20 | External basis type |
| | 23 | MOTION STOPPING (E.G., STROBOSCOPES) |
| | 24 | Periodically moving reflecting or refracting element |
| | 25 | Periodically moving light interrupting element |
| | 27 | VELOCITY OR VELOCITY/HEIGHT MEASURING |
| | 29 | OPTICAL ELEMENT OR RETICLE RESPONDS TO RELATIVE VELOCITY OF REMOTE OBJECT |
| | 30 | CRYSTAL OR GEM EXAMINATION |
| | 32 | MATERIAL STRAIN ANALYSIS |
| | 36 | WITH SAMPLE PREPARATION |
| | 39 | BLOOD ANALYSIS |
| | 43 | OPTICAL PYROMETERS |
| | 51 | INFRARED AND ULTRAVIOLET |
| | 52 | EGG CANDLING |
| | 53 | Photoelectric |
| | 54 | With counting, marking, or weighing |
| | 55 | With egg transfer |
| | 62 | With light shading chamber |
| | 64 | With light box |
| | 68 | Lamp attachments |
| | 69 | CUTTING BLADE SHARPNESS |
| | 70 | OIL TESTING (E.G., CONTAMINATION) |
| | 71 | DOCUMENT PATTERN ANALYSIS OR VERIFICATION |
| | 72 | WITH PLURAL DIVERSE TEST OR ART |
| | 73 | PLURAL TEST |
| | 73.1 | FOR OPTICAL FIBER OR WAVEGUIDE INSPECTION |
| | 300 | BY DISPERSED LIGHT SPECTROSCOPY |
| | 301 | With Raman type light scattering |
| | 302 | For spectrographic (i.e., photographic) investigation |
| | 306 | With internal standard comparison |
| | 307 | With background radiation comparison |
| | 308 | With synchronized spectrum repetitive scanning (e.g., cathode-ray readout) |
| | 310 | With aperture mask |
| | 311 | With sample excitation (e.g., burning) |
| | 312 | By electrical resistance heating (e.g., graphite tube) |
| | 313 | By arc or spark |
| | 315 | By flame |
| | 316 | By high frequency field (e.g., plasma discharge) |
| | 317 | By light |
| | 319 | Utilizing a spectrophotometer (i.e., plural beam) |
| | 326 | Utilizing a spectrometer |
| | 327 | Having light polarizing means |
| | 328 | Having diffraction grating means |
| | 330 | Having optical gating means |
| | 331 | With monochromator structure |
| | 335 | FOR SIZE OF PARTICLES |
| | 337 | BY PARTICLE LIGHT SCATTERING |
| | 344 | BY ELECTROPHORESIS |
| | 450 | BY LIGHT INTERFERENCE (E.G., INTERFEROMETER) |
| | 451 | Spectroscopy |
| | 452 | Having particular linear mirror drive or configuration |
| | 453 | Polarization |
| | 454 | Fabry-Perot type or Etalon Type |
| | 455 | Having a rotating, pendulous, or wedge scanning element |
| | 456 | Imaging |
| | 457 | Holography |
| | 459 | Rotation rate (e.g., ring laser gyros) |
| | 460 | By fiber or waveguide interferometer (e.g., Sagnac effect) |
| | 461 | Resonant loop |
| | 462 | Multi-axis (X-Y-Z) having multiplexing |
| | 463 | Multiple harmonic output |
| | 464 | Having null feedback loop |
| | 465 | Fiber coil winding |
| | 466 | Having m x n loop coupler where (m is greater than 2) and (n is greater than or equal to 2) (e.g., passive bias) |
| | 467 | Four frequency, multi-oscillator, non-planar cavity |
| | 468 | Cavity output beam combiner |
| | 469 | Cavity mirror details |
| | 470 | Passive cavity (laser source outside cavity) |
| | 471 | Multi-axis cavity |
| | 472 | Lock-in prevention |
| | 477 | Using fiber or waveguide interferometer |
| | 478 | Multiplexed sensor array |
| | 479 | Having a short coherence length source |
| | 480 | Resonant cavity |
| | 481 | Refraction indexing |
| | 482 | For distance or displacement measurement |
| | 483 | Plural counter-propagating beams (e.g., non-motion Sagnac device) |
| | 484 | Having light beams of different frequencies (e.g., heterodyning) |
| | 491 | Having polarization |
| | 496 | For dimensional measurement |
| | 497 | Having short coherence length source |
| | 498 | Displacement or distance |
| | 499 | Having wavefront division (e.g., by diffraction) |
| | 500 | X-Y and/or Z table |
| | 501 | Of probe head (e.g., atomic force microscope) |
| | 502 | Surface displacement due to acoustic wave propagation) |
| | 503 | Thickness |
| | 505 | Gap |
| | 508 | For orientation or alignment |
| | 511 | Contour or profile |
| | 517 | For refractive indexing |
| | 519 | Having partially reflecting plates in series (e.g., Fabry-Perot type) |
| | 520 | Having shearing |
| | 521 | Having wavefront division (by diffraction) |
| | 364 | BY POLARIZED LIGHT EXAMINATION |
| | 365 | With birefringent element |
| | 366 | With polariscopes |
| | 369 | Of surface reflection |
| | 370 | With light attenuation |
| | 121 | LAMP BEAM DIRECTION OR PATTERN |
| | 123 | FOCAL POSITION OF LIGHT SOURCE |
| | 124 | LENS OR REFLECTIVE IMAGE FORMER TESTING |
| | 124.5 | For optical transfer function |
| | 125 | Focal length measuring |
| | 127 | Optical center, cylinder axis, or prism measuring or determining |
| | 128 | REFRACTION TESTING (E.G., REFRACTOMETERS) |
| | 129 | Schlieren effect |
| | 130 | Differential |
| | 133 | Refractive rod engages specimen |
| | 134 | Prism forming fluid specimen container |
| | 135 | Prism engaging specimen |
| | 138 | ANGLE MEASURING OR ANGULAR AXIAL ALIGNMENT |
| | 139 | Plural scales or different portions of same scale simultaneously observable |
| | 139.01 | Star/Sun/Satellite position indication with photodetection |
| | 139.03 | Relative attitude indication along 3 axes with photodetection |
| | 139.04 | Automatic following or aligning while indicating measurement |
| | 139.05 | With optical elements moving relative to fixed housing to follow or align |
| | 139.06 | With optical housing moving to follow or align |
| | 139.07 | With photodetection of reflected beam angle with respect to a unidirectional source beam |
| | 139.09 | Wheel alignment with photodetection |
| | 139.1 | Photodetection of inclination from level or vertical |
| | 140 | Apex of angle at observing or detecting station |
| | 141.1 | With photodetection of reflected beam angle with respect to a unidirectional source beam |
| | 141.2 | With photodetection |
| | 141.3 | With unidirectional or planar source beam directed at the photodetecting station |
| | 141.4 | With optical scanning of light beam or detector |
| | 141.5 | With at least 2-dimensional sensitivity |
| | 142 | Scale and remote point simultaneously observable |
| | 144 | With plural images |
| | 145 | Lines of sight relatively adjustable with two degrees of freedom |
| | 146 | Two or more lines of sight deflected |
| | 147 | Measurement in two planes (e.g., azimuth and elevation; hour angle and declination) |
| | 148 | Artificial reference |
| | 150 | Sides of angle or axes being aligned transverse to optical axis (e.g., drift meter) |
| | 152.1 | With photodetection remote from measured angle |
| | 152.2 | With reflection of a unidirectional source beam from a planar or nonretroreflective surface |
| | 152.3 | With reflection of a unidirectional source beam from a retroreflector |
| | 153 | Alignment of axes nominally coaxial |
| | 154 | With screen |
| | 600 | SURFACE ROUGHNESS |
| | 601 | SHAPE OR SURFACE CONFIGURATION |
| | 602 | Triangulation |
| | 609 | By focus detection |
| | 610 | By projection of coded pattern |
| | 611 | By stereo |
| | 612 | By specular reflection |
| | 613 | Silhouette |
| | 614 | POSITION OR DISPLACEMENT |
| | 615 | Position transverse to viewing axis |
| | 616 | Having scale or grid |
| | 620 | Special mark or target on object |
| | 621 | Occulting a projected light beam |
| | 622 | Position of detected arrangement relative to projected beam |
| | 623 | Triangulation |
| | 624 | Focus |
| | 625 | DIMENSION |
| | 388 | BY CONFIGURATION COMPARISON |
| | 389 | With photosensitive film or plate |
| | 390 | With two images of single article compared |
| | 391 | With projection on viewing screen |
| | 394 | With comparison to master, desired shape, or reference voltage |
| | 395 | With relatively movable optical grids |
| | 396 | With scale or optical grid displaced relative to remote fiducial mark |
| | 397 | With object being compared and scale superimposed |
| | 398 | With object being compared and light beam moved relative to each other (e.g., scanning) |
| | 399 | BY ALIGNMENT IN LATERAL DIRECTION |
| | 402 | BY SHADE OR COLOR |
| | 403 | With merging colors or patterns (e.g., Maxwell disc) |
| | 404 | Photography |
| | 405 | Tristimulus examination |
| | 406 | Trichromatic examination |
| | 407 | With sample responsive to plural colors applied simultaneously |
| | 408 | With sequential comparison of sample and standard |
| | 409 | Fluid color transmission examination |
| | 410 | Of flowing liquids |
| | 412 | With ionic determination |
| | 413 | With variable light path length |
| | 414 | With color transmitting filter |
| | 416 | With color transmitting filter |
| | 417 | Included with sample excitation |
| | 418 | Including rotating sequential filters |
| | 419 | Including multicolor filters |
| | 420 | Included with colored light sources |
| | 421 | With reflective multicolor chart or standard |
| | 425 | With color determination by light intensity comparison |
| | 426 | BY INSPECTION WITH AGITATION OR ROTATION |
| | 429 | BY MONITORING OF WEBS OR THREAD |
| | 432 | FOR LIGHT TRANSMISSION OR ABSORPTION |
| | 433 | By comparison |
| | 436 | Of fluent material |
| | 443 | Of photographic film |
| | 445 | OF LIGHT REFLECTION (E.G., GLASS) |
| | 213 | PHOTOMETERS |
| | 214 | Pupillary |
| | 215 | Integrating |
| | 216 | Heat absorbing (e.g., radiometers) |
| | 217 | Modulating (e.g., flicker beam) |
| | 218 | Photoelectric |
| | 219 | Simultaneous sighting and reading measurement |
| | 220 | Multiple housings |
| | 221 | Responsive to incident or back lighting |
| | 222 | Plural detectors |
| | 223 | Logarithmic |
| | 224 | Multisensitivity range |
| | 225 | With predetector light modifier (e.g., diaphragm) |
| | 226 | Detector and indicator electrical coupling (e.g., amplifying or attenuating) |
| | 227 | With particular indicator |
| | 229 | Comparison |
| | 233 | With variable light aperture size |
| | 234 | Light absorbing |
| | 236 | Integrating spheres |
| | 237.1 | INSPECTION OF FLAWS OR IMPURITIES |
| | 238.1 | Textile inspection |
| | 238.2 | Elongated textile product (e.g., thread, yarn, etc.) |
| | 238.3 | Detection of foreign material (e.g., trash, splinters, contaminants, etc.) |
| | 239.1 | Transparent or translucent material |
| | 239.2 | Optical element (e.g., contact lens, prism, filter, lens, etc.) |
| | 239.3 | Patterned surface |
| | 239.4 | Containers (e.g., bottles) |
| | 239.7 | Surface condition |
| | 240.1 | Containers or enclosures (e.g., packages, cans, etc.) |
| | 241.1 | Bore inspection (e.g., borescopes, intrascope, etc.) |
| | 241.2 | Firearm bore inspection |
| | 241.3 | With adjustable head |
| | 241.4 | Flexible |
| | 241.5 | Specific construction of distal end |
| | 241.6 | Having guiding means |
| | 237.2 | Surface condition |
| | 237.3 | Detection of object or particle on surface |
| | 237.5 | On patterned or topographical surface (e.g., wafer, mask, circuit board) |
| | 237.6 | Having predetermined light transmission regions (e.g., holes, aperture, multiple material articles) |
| | 242.1 | THREAD COUNTING |
| | 243.1 | STANDARD |
| | 244 | SAMPLE, SPECIMEN, OR STANDARD HOLDER OR SUPPORT (E.G., PLATES OR SLIDES) |
| | 247 | FIDUCIAL INSTRUMENTS |
| | 256 | MISCELLANEOUS |
| CROSS-REFERENCE ART COLLECTIONS | ||
| | 900 | INTERFEROMETERS (GO1B 9/02) |
| | 901 | Involving fiber optics or integrated optics (GO1B 9/02F) |
| | 902 | Involving diffraction gratings (GO1B 9/02G) |
| | 903 | Using holographic techniques (GO1B 9/021) |
| | 904 | MEASURING MICROSCOPES (GO1B 9/04) |
| | 905 | MEASURING TELESCOPES (GO1B 9/06) |
| | 906 | OPTICAL PROJECTION COMPARATORS, E.G., FOR PROFILE (GO1B 9/08) |
| | 907 | GONIOMETERS (GO1B 9/10) |
| | 908 | MEASURING LENGTH, WIDTH, OR THICKNESS (GO1B 11/02) |
| | 911 | MEASURING THE DEFORMATION IN A SOLID, E.G., OPTICAL STRAIN GAUGE (GO1B 11/16) |
| | 912 | MEASURING ANGLES (GO1C 1/00) |
| | 916 | ALTIMETERS FOR AIRCRAFT (GO1C 5/00A) |
| | 917 | MEASURING INCLINATION, E.G., BY CLINOMETERS, BY LEVELS (GO1C 9/00) |
| | 918 | PHOTOGRAMMETRY; PHOTOGRAPHIC SURVEYING (GO1C 11/00) |
| | 919 | Picture taking arrangements specially adapted for photogrammetry or photographic surveying, e.g., controlling overlapping of pictures (GO1C 11/02) |
| | 921 | Interpretation of pictures (GO1C 11/04) |
| | 922 | PHOTOMETRY, E.G., PHOTOGRAPHIC EXPOSURE METER (GO1J 11/04) |
| | 923 | RADIATION PYROMETRY (GOLJ 5/00) |
| | 924 | MEASURING VELOCITY OF LIGHT (GOLJ 7/00) |
| | 925 | MEASURING OPTICAL PHASE DIFFERENCE: MEASURING OPTICAL WAVELENGTH (GO1J 9/00) |
| | 926 | MEASURING THE CHARACTERISTICS OF INDIVIDUAL OPTICAL PULSES OR OF OPTICAL PULSE TRAINS (GO1J 11/00) |
| | 927 | MEASURING VARIATIONS OF OPTICAL PROPERTIES OF MATERIAL WHEN IT IS STRESSED, E.G., BY PHOTOELASTIC STRESS ANALYSIS USING INFRA-RED, VISIBLE LIGHT, ULTRA-VIOLET (GO1L 1/24) |
| | 928 | INVESTIGATING OR ANALYZING MATERIALS BY THE USE OF OPTICAL MEANS, I.E., USING INFRA-RED, VISIBLE, OR ULTRA-VIOLET LIGHT (GO1N 21/00) |
| | 929 | Arrangements, or apparatus for facilitating the optical investigation (GO1N 21/01) |
| | 931 | Systems in which incident light is modified in accordance with the properties of material investigated (GO1N 21/17) |
| | 932 | With opto-acoustic detection, e.g., for gases or analyzing solids (GO1N 21/17B) |
| | 933 | With calorimetric detection, e.g., with thermal lens detection (GO1N 21/17C) |
| | 934 | With modulation of one or more physical properties of the sample during optical investigation, e.g., Electra reflectance (GO1N 21/17M) |
| | 935 | Dichroism (GO1N 21/19) |
| | 936 | Polarization-affecting properties (GO1N 21/21) |
| | 939 | Color; spectral properties, i,e., comparison of effect of material on the light at two or more different wavelengths or wavelength bands (GO1N 21/25) |
| | 940 | Colorimeters (GO1N 21/25B) |
| | 942 | Arrangements using two alternating lights and one detector (GO1N 21/25D) |
| | 943 | Using photo-electric detection (GO1N 21/27) |
| | 945 | Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g., atomic absorption spectrometry (GO1N 21/31) |
| | 946 | Holographic interferometry (GO1N 21/45B) |
| | 947 | Scattering, i.e., diffuse reflection (GO1N 21/47F) |
| | 948 | Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light (GO1N 21/62) |
| | 953 | Probe photometers (GO1N 21/85B) |
| | 955 | MEASURING LINEAR OR ANGULAR SPEED UTILIZING DEVICES CHARACTERIZED BY THE USE OF OPTICAL MEANS, E.G., USING INFRA-RED, VISIBLE, OR ULTRA-VIOLET LIGHT (GO1P 3/36) |
| | 956 | Using a ring laser (GO1P 3/36B) |
| | 957 | Using diffraction of light (GO1P 3/36C) |
| | 958 | Using photographic means (GO1P 3/38) |
| FOREIGN ART COLLECTIONS | ||
| FOR000 | CLASS-RELATED FOREIGN DOCUMENTS |
| Any foreign patents or non-patent literature from subclasses that have been reclassified have been transferred directly to FOR Collections listed below. These Collections contain ONLY foreign patents or non-patent literature. The parenthetical references in the Collection titles refer to the abolished subclasses from which these Collections were derived. | ||
| FOR100 | INSPECTION FOR FLAWS OR IMPERFECTIONS (356/237) |
| FOR101 | Cloth or thread inspection (356/238) |
| FOR102 | Passing light through a transparent or translucent article (356/239) |
| FOR104 | Bore inspection (e.g., borescopes) (356/241) |
| FOR105 | THREAD COUNTING (356/242) |
| FOR106 | STANDARDS (356/243) |
| FOR107 | BY LIGHT INTERFERENCE (E.G., INTERFEROMETERS) (356/345) |
| FOR108 | Spectroscopy (356/346) |
| FOR109 | Holography (356/347) |
| FOR111 | With light beams of different frequency (e.g., heterodyning) (356/349) |
| FOR113 | With polarization (356/351) |
| FOR114 | With partially reflecting plates in series (e.g., Fabry-Perot type) (356/352) |
| FOR115 | With shearing (356/353) |
| FOR116 | With wavefront division (e.g., by diffraction) (356/354) |
| FOR119 | For dimensional measurement (e.g., thickness) (356/357) |
| FOR121 | For optical configuration (356/359) |
| FOR123 | For refractive indexing (356/361) |
| FOR125 | For orientation and alignment (356/363) |
| FOR126 | FOR FLATNESS (356/371) |
| FOR127 | BY MENSURATION (356/372) |
| FOR128 | Of article displacement (356/373) |
| FOR130 | Of position (356/375) |
| FOR131 | Of contour or profile (356/376) |
| FOR133 | Of cavities (356/378) |
| FOR134 | Of area or volume (356/379) |
| FOR136 | Of thickness (356/381) |
| FOR138 | Of length (356/383) |
| FOR139 | Of width or diameter (356/384) |
This page is produced by the Office of Classification Support (Office of Patent Classification) for the Reference Tools Project.
Please send questions and comments to usptoinfo@uspto.gov .
Note: The Patent and Trademark Depository Library Program (PTDLP) administers a nationwide network of public, state and academic libraries designated as Patent and Trademark Depository Libraries authorized by 35 U.S.C. 13 to: Disseminate Patent and Trademark Information Support Diverse Intellectual Property Needs of the Public. PTDL Contact Information
Note: For information/comments on electronic information products, such as purchasing USPTO data, or to discuss system requirements for magnetic tape products, contact:
Information Products Division -- U.S. Patent and Trademark Office
Information Products Division
Contact Information
Or, browse
their on-line catalog.
The Inventors Assistance Center is available to help you on patent matters.Send questions about USPTO programs and services to the USPTO Contact Center (UCC). You can suggest USPTO webpages or material you would like featured on this section by E-mail to the webmaster@uspto.gov. While we cannot promise to accommodate all requests, your suggestions will be considered and may lead to other improvements on the website. |
|
|
=online
business system 
=fees 
=forms
=help 
=laws/regulations 
=definition
(glossary)