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Class Numbers & Titles | Class Numbers Only | USPC Index | International | HELP |
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Class 324 | ELECTRICITY: MEASURING AND TESTING |
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300 | PARTICLE PRECESSION RESONANCE |
301 | Using a magnetometer |
303 | Using well logging device |
304 | Using optical pumping or sensing device |
306 | Determine fluid flow rate |
307 | Using a nuclear resonance spectrometer system |
308 | Including a test sample and control sample |
309 | To obtain localized resonance within a sample |
310 | By scanning sample frequency spectrum |
311 | With signal decoupling |
312 | By spectrum storage and analysis |
313 | Including polarizing magnetic field/radio frequency tuning |
314 | With conditioning of transmitter signal |
315 | With sample resonant frequency and temperature interdependence |
316 | Using an electron resonance spectrometer system |
318 | Spectrometer components |
323 | OF GEOPHYSICAL SURFACE OR SUBSURFACE IN SITU |
324 | Including borehole fluid investigation |
326 | For small object detection or location |
330 | By aerial survey |
332 | With radiant energy or nonconductive-type transmitter |
344 | With radiant energy or nonconductive-type receiver |
345 | By magnetic means |
347 | Using electrode arrays, circuits, structure, or supports |
348 | For detecting naturally occurring fields, currents, or potentials |
354 | Coupled to artificial current source |
376 | OF SUBSURFACE CORE SAMPLE |
378 | INTERNAL-COMBUSTION ENGINE IGNITION SYSTEM OR DEVICE |
379 | With analysis of displayed waveform |
380 | Electronic ignition system |
383 | By simulating or substituting for a component under test |
384 | Using plural tests in a conventional ignition system |
385 | Distributor |
388 | Coil |
389 | Magneto |
390 | Low or high tension lead |
391 | Ignition timing |
393 | In situ testing of spark plug |
394 | With cathode-ray tube display |
395 | Using an illuminating device to indicate spark plug condition |
396 | With an air gap in series with spark plug to indicate spark plug condition |
397 | By shorting the plug to ground to indicate spark plug condition |
399 | Wherein a measured electric quantity indicates spark plug condition |
400 | Spark plug removed or tested in a test fixture |
402 | Apparatus for coupling a measuring instrument to an ignition system |
403 | ELECTRIC LAMP OR DISCHARGE DEVICE |
404 | Cathode-ray tube |
405 | Vacuum tube |
406 | Plural tubes in the testing circuit |
407 | Testing circuit for diverse-type tube |
408 | Circuit for making diverse test |
409 | Testing discharge space characteristic (e.g., emission) |
413 | Shock testing |
414 | Electric lamp |
415 | ELECTROMECHANICAL SWITCHING DEVICE |
416 | Voltage regulator |
417 | Thermostat switch |
418 | Relay |
419 | Reed switch |
420 | To evaluate contact chatter |
421 | To evaluate contact resistance |
422 | To evaluate contact sequence of operation |
423 | To evaluate contact response time |
424 | Circuit breaker |
425 | ELECTROLYTE PROPERTIES |
426 | Using a battery testing device |
427 | To determine ampere-hour charge capacity |
429 | To determine load/no-load voltage |
430 | To determine internal battery impedance |
431 | With temperature compensation of measured condition |
432 | To determine battery electrolyte condition |
433 | To compare battery voltage with a reference voltage |
434 | To determine plural cell condition |
435 | Having particular meter scale or indicator |
436 | Including oscillator in measurement circuit |
437 | Including probe structure |
438 | Using a pH determining device |
439 | Using a conductivity determining device |
440 | Which includes a dropping mercury cell |
441 | Which includes a temperature responsive element |
442 | Which includes an oscillator |
443 | Having a bridge circuit |
444 | Which includes current and voltage electrodes |
445 | Having inductance probe structure |
446 | Having conductance probe structure |
447 | With movable or adjustable electrode |
448 | With concentric electrodes |
449 | With axially arranged electrodes |
450 | Which includes particular cell container structure |
451 | A MATERIAL PROPERTY USING THERMOELECTRIC PHENOMENON |
452 | A MATERIAL PROPERTY USING ELECTROSTATIC PHENOMENON |
457 | ELECTROSTATIC FIELD |
459 | USING IONIZATION EFFECTS |
200 | MAGNETIC |
201 | Susceptibility |
202 | Calibration |
203 | Curie point determination |
204 | Fluid material examination |
205 | Permanent magnet testing |
206 | Movable random length material measurement |
207.11 | Displacement |
207.12 | Compensation for measurement |
207.13 | Having particular sensor means |
207.14 | Diverse sensors |
207.15 | Inductive |
207.2 | Hall effect |
207.21 | Magnetoresistive |
207.22 | Having particular sensed object |
207.23 | Plural measurements (e.g., linear and rotary) |
207.24 | Linear |
207.25 | Rotary |
207.26 | Approach or retreat |
209 | Stress in material measurement |
210 | Magnetic information storage element testing |
213 | Magnetic recording medium on magnetized object records object field |
214 | By paramagnetic particles |
217 | Railroad rail flaw testing |
219 | Magnetic sensor within material |
222 | Hysteresis or eddy current loss testing |
223 | Hysteresis loop curve display or recording |
224 | With temperature control of material or element of test circuit |
225 | With compensation for test variable |
226 | Combined |
227 | Plural tests |
228 | With means to create magnetic field to test material |
229 | Thickness measuring |
232 | Plural magnetic fields in material |
233 | With phase sensitive element |
234 | Electrically energized nonforce type sensor |
239 | Induced voltage-type sensor |
244 | Magnetometers |
244.1 | Optical |
245 | Plural sensor axis misalignment correction |
246 | With means to align field sensor with magnetic field sensed |
247 | Nonparallel plural magnetic sensors |
248 | Superconductive magnetometers |
249 | Thin film magnetometers |
250 | Electronic tube or microwave magnetometers |
251 | Hall plate magnetometers |
252 | Semiconductor type solid-state or magnetoresistive magnetometers |
253 | Saturable core magnetometers |
256 | Energized movable sensing coil magnetometers |
257 | Moving coil magnetometer |
258 | Fixed coil magnetometer |
259 | Movable magnet or magnetic member interacts with magnetic field |
260 | Magnetic field detection devices |
262 | Magnetic test structure elements |
263 | Current through test material forms test magnetic field |
500 | FAULT DETECTING IN ELECTRIC CIRCUITS AND OF ELECTRIC COMPONENTS |
501 | Using radiant energy |
502 | In an ignitor or detonator |
503 | In vehicle wiring |
506 | Combined with a flashlight |
508 | With electric power receptacle for line wire testing |
509 | Of ground fault indication |
511 | Of electrically operated apparatus (power tool, appliance, machine, etc.) |
512 | For fault location |
513 | Where component moves while under test |
514 | By exposing component to liquid or gas while under test |
515 | Using a particular sensing electrode |
519 | By capacitance measuring |
520 | By frequency sensitive or responsive detection |
521 | By phase sensitive or responsive detection |
522 | By voltage or current measuring |
525 | By resistance or impedance measuring |
527 | By applying a test signal |
534 | By reflection technique |
535 | By time measuring |
536 | By spark or arc discharge |
537 | Of individual circuit component or element |
750.01 | Measurement or control of test condition |
750.14 | Environmental control |
750.15 | With identification on device under test (DUT) |
750.16 | Relative positioning or alignment of device under test and test structure |
750.17 | By capacitive means |
750.18 | By information on device under test |
750.19 | Adjustable support for device under test |
750.22 | Testing device mounted for multi-directional movement |
750.23 | Using optical means |
750.24 | By electrical contact means |
750.25 | By mechanical means |
750.26 | Shielding or casing of device under test or of test structure |
750.3 | Built-in test circuit |
754.01 | Test probe techniques |
754.02 | Hand-held |
754.03 | Contact probe |
754.04 | Liquid state |
754.05 | Kelvin probe |
754.06 | Waveguide probe |
754.07 | Probe or probe card with build-in circuit element |
754.08 | In or on support for device under test |
754.1 | Probe contact confirmation |
754.11 | Probe contact enhancement or compensation |
754.12 | Biasing means |
754.18 | With interpose |
754.19 | With recording of test result |
754.2 | Penetrative |
754.21 | Non-contact probe |
755.01 | Probe structure |
755.02 | Coaxial |
755.03 | Rigid |
755.04 | Force absorption |
755.07 | Cantilever |
755.08 | Elastomeric |
755.09 | Membrane |
755.1 | Dendritic structure |
755.11 | Elongated pin or probe |
756.01 | Support for device under test or test structure |
756.02 | DUT socket or carrier |
756.03 | Probe card |
756.04 | Pin fixture |
756.05 | With electrical connectors |
756.06 | With impedance matching |
756.07 | Board or plate |
757.01 | Transporting or conveying the device under test to the testing station |
757.02 | Printed circuit board |
757.03 | Wafer |
757.04 | Packaged IC or unpackaged die or dice |
757.05 | Multiple chip module |
758.01 | Cleaning probe or device under test |
759.01 | After-test activity |
760.01 | Test of liquid crystal device |
761.01 | Test of solar cell |
762.01 | Test of semiconductor device |
762.02 | Packaged integrated circuits |
762.03 | Integrated circuit die |
762.05 | Semiconductor wafer |
762.06 | Multiple chip module |
762.07 | Diode |
762.08 | Bipolar transistor |
762.09 | Field effect transistor |
762.1 | With barrier layer |
763.01 | Printed circuit board |
764.01 | Power supply |
765.01 | Motor or generator fault |
538 | Electrical connectors |
539 | Multiconductor cable |
543 | Single conductor cable |
545 | Armature or rotor |
546 | Winding or coil |
548 | Capacitor |
549 | Resistor |
550 | Fuse |
551 | Insulation |
555 | Instruments and devices for fault testing |
557 | FOR INSULATION FAULT OF NONCIRCUIT ELEMENTS |
558 | Where element moves while under test |
559 | Where a moving sensing electrode scans a stationary element under test |
600 | IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS |
601 | Calibration |
602 | With auxiliary means to condition stimulus/response signals |
603 | For excitation |
605 | For response signal evaluation or processing |
606 | Including a signal comparison circuit |
607 | Including a conversion (e.g., A->D or D-> A) process |
608 | Including a ratiometric function |
609 | For sensing |
612 | Parameter related to the reproduction or fidelity of a signal affected by a circuit under test |
613 | Noise |
615 | Transfer function type characteristics |
616 | Gain or attenuation |
617 | Response time or phase delay |
618 | Transient response or transient recovery time (e.g., damping) |
619 | Selective type characteristics |
620 | Distortion |
621 | Envelope delay |
622 | Phase |
623 | Harmonic |
624 | Intermodulation |
625 | Dissymmetry or asymmetry |
626 | Nonlinearity |
627 | Shielding effectiveness (SE) |
629 | Distributive type parameters |
630 | Plural diverse parameters |
631 | Using wave polarization (e.g., field rotation) |
632 | Using particular field coupling type (e.g., fringing field) |
633 | Using resonant frequency |
634 | To determine water content |
635 | To determine dimension (e.g., distance or thickness) |
636 | With a resonant cavity |
637 | Using transmitted or reflected microwaves |
638 | Scattering type parameters (e.g., complex reflection coefficient) |
639 | Where energy is transmitted through a test substance |
642 | Where energy is reflected (e.g., reflectometry) |
647 | Using a comparison or difference circuit |
649 | Lumped type parameters |
650 | Using phasor or vector analysis |
652 | Of a resonant circuit |
653 | For figure of merit or Q value |
654 | Using inductive type measurement |
658 | Using capacitive type measurement |
659 | With loss characteristic evaluation |
660 | With variable electrode area |
661 | With variable distance between capacitor electrodes |
663 | Where a material or object forms part of the dielectric being measured |
664 | To determine water content |
665 | By comparison or difference circuit |
667 | By frequency signal response, change or processing circuit |
669 | With compensation means |
671 | To determine dimension (e.g., dielectric thickness) |
672 | By comparison or difference circuit |
674 | By frequency signal response, change or processing circuit |
676 | With pulse signal processing circuit |
679 | With comparison or difference circuit |
681 | With frequency signal response, change or processing circuit |
683 | With phase signal processing circuit |
684 | With compensation means |
686 | With a capacitive sensing means |
691 | Using resistance or conductance measurement |
692 | With living organism condition determination using conductivity effects |
693 | With object or substance characteristic determination using conductivity effects |
694 | To determine water content |
697 | For interface |
698 | To determine oil qualities |
699 | To determine dimension (e.g., distance or thickness) |
701 | Where the object moves while under test |
702 | With radiant energy effects |
704 | With ratio determination |
705 | With comparison or difference circuit |
707 | With frequency response, change or processing circuit |
709 | With phase signal processing circuit |
710 | With pulse signal processing circuit |
713 | With voltage or current signal evaluation |
719 | With semiconductor or IC materials quality determination using conductivity effects |
720 | With compensation means |
722 | Device or apparatus determines conductivity effects |
725 | Using a particular bridge circuit |
726 | Transformer testing (e.g., ratio) |
727 | Piezoelectric crystal testing (e.g., frequency, resistance) |
66 | CONDUCTOR IDENTIFICATION OR LOCATION (E.G., PHASE IDENTIFICATION) |
160 | ELECTRICAL SPEED MEASURING |
161 | Speed comparing means |
162 | With acceleration measuring means |
163 | Including speed analog electrical signal generator |
166 | Including speed-related frequency generator |
167 | Including rotating magnetic field actuated indicator |
168 | Including periodic switch |
172 | Including synchronized recording medium |
173 | Including magnetic detector |
175 | Including radiant energy detector |
176 | Including object displacement varied variable circuit impedance |
177 | Including motor current or voltage sensor |
178 | Including "event" sensing means |
71.1 | DETERMINING NONELECTRIC PROPERTIES BY MEASURING ELECTRIC PROPERTIES |
71.2 | Erosion |
71.3 | Beam of atomic particles |
71.4 | Particle counting |
71.5 | Semiconductors for nonelectrical property |
71.6 | Superconductors |
72 | TESTING POTENTIAL IN SPECIFIC ENVIRONMENT (E.G., LIGHTNING STROKE) |
73.1 | PLURAL, AUTOMATICALLY SEQUENTIAL TESTS |
74 | TESTING AND CALIBRATING ELECTRIC METERS (E.G., WATT-HOUR METERS) |
76.11 | MEASURING, TESTING, OR SENSING ELECTRICITY, PER SE |
76.12 | Analysis of complex waves |
76.13 | Amplitude distribution |
76.14 | Radiometer (e.g., microwave, etc.) |
76.15 | With sampler |
76.16 | With counter |
76.17 | With integrator |
76.18 | With slope detector |
76.19 | Frequency spectrum analyzer |
76.21 | By Fourier analysis |
76.22 | Real-time spectrum analyzer |
76.23 | With mixer |
76.24 | With sampler |
76.25 | With slope detector |
76.26 | Scanning-panoramic receiver |
77.11 | Nonscanning |
76.38 | With sampler |
76.39 | Frequency of cyclic current or voltage (e.g., cyclic counting etc.) |
76.41 | Frequency comparison, (e.g., heterodyne, etc.) |
76.49 | Tuned mechanical resonator (e.g., reed, piezocrystal, etc.) |
76.51 | By tuning (e.g., to resonance,etc.) |
76.52 | By phase comparison |
76.53 | With phase lock |
76.54 | With delay line |
76.55 | Digital output |
76.56 | With microwave frequency detection |
76.57 | With tone detection |
76.58 | With sampler |
76.59 | With multiplexing |
76.61 | With memory |
76.62 | With counter |
76.65 | With space discharge device |
76.66 | With capacitive energy storage |
76.68 | With filtering |
76.69 | Current output proportional to frequency |
76.71 | Nulling circuit |
76.72 | Qualitative output |
76.73 | With saturable device |
76.74 | Deviation measurement |
76.75 | Having inductive sensing |
76.76 | With space discharge device |
76.77 | Phase comparison (e.g., between cyclic pulse voltage and sinusoidal current, etc.) |
76.78 | Quadrature sensing |
76.79 | Feedback control, electrical |
76.81 | Feedback control, mechanical |
76.82 | Digital output |
76.83 | Analog output |
84 | With waveguide (e.g., coaxial cable) |
85 | With frequency conversion |
86 | Polyphase (e.g., phase angle, phase rotation or sequence) |
87 | With nonlinear device (e.g., saturable reactor, rectifier), discharge device (e.g., gas tube) or lamp |
90 | Electrodynamometer instrument |
91 | Synchroscope type |
92 | Fluid (e.g., thermal expansion) |
95 | With waveguide or long line |
96 | Using radiant energy |
98 | Balancing (e.g., known/unknown voltage comparison, bridge, rebalancing) |
101 | Non-rebalancing bridge |
102 | Transient or portion of cyclic |
103R | Demand, excess, maximum or minimum (e.g., separate meters for positive and negative power, peak voltmeter) |
105 | Thermal (e.g., compensation) |
107 | Polyphase |
109 | Electrostatic attraction or piezoelectric |
110 | Meter protection or fraud combatting |
111 | With storage means for voltage or current (e.g., condenser banks) |
113 | Recording |
114 | Plural meters (e.g., plural movements in one case) |
115 | Plural ranges, scales or registration rates |
117R | Magnetic saturation (e.g., in field or in amplifier) |
118 | Modulator/demodulator |
119 | With rectifier (e.g., A.C. to D.C.) |
120 | With voltage or current conversion (e.g., D.C. to A.C., 60 to 1000) |
121R | Cathode ray (e.g., magic eye) |
122 | Gaseous discharge (e.g., spark gap voltmeter) |
123R | With amplifier or space discharge device |
125 | Inertia control, instrument damping and vibration damping |
126 | With coupling means (e.g., attenuator, shunt) |
129 | Polepiece (e.g., split) admits nonunitary input conductor |
130 | Self-calibration |
131 | Suppressed zero |
132 | Nonlinear (e.g., Thyrite) |
133 | Nonquantitative (e.g., hot-line indicator, polarity tester) |
134 | With commutator or reversing or pulsating switch (e.g., D.C. watt-hour meter) |
136 | With rolling wheel or ball (e.g., transmission, integrating) |
137 | Eddy current rotor (e.g., A.C. integrating wattmeter) |
139 | Motor-driven, time-controlled or oscillating (e.g., ratchet) |
140R | Plural inputs (e.g., summation, ratio) |
143 | Plural active motor elements (e.g., for two crossed pointers) |
144 | With electromagnetic field (e.g., dynamometer) |
149 | With probe, prod or terminals |
150 | Eccentrically pivoted coil |
151R | With permanent magnet |
153 | With register |
154R | With rotor (e.g., filar suspension, zero set, balancing) |
156 | Casings |
157 | Combined |
CROSS-REFERENCE ART COLLECTIONS | ||
800 | DIVINING RODS |
FOREIGN ART COLLECTIONS | ||
FOR000 | CLASS-RELATED FOREIGN DOCUMENTS |
Any foreign patents or non-patent literature from subclasses that have been reclassified have been transferred directly to FOR Collections listed below. These Collections contain ONLY foreign patents or non-patent literature. The parenthetical references in the Collection titles refer to the abolished subclasses from which these Collections were derived. | ||
FAULT DETECTING IN ELECTRIC CIRCUITS AND OF ELECTRIC COMPONENTS(324/500) |
OF GEOPHYSICAL SURFACE OR SUBSURFACE IN SITU (324/323) |
Using electrode arrays, circuits, structure, or supports (324/347) |
FOR104 | With probe elements (324/754) |
FOR105 | Internal of or on support for device under test (DUT): (324/755) |
FOR106 | Contact confirmation (324/756) |
FOR107 | Probe contact enhancement (324/757) |
FOR108 | Probe alignment or positioning (324/758) |
FOR109 | With recording of test results on DUT (324/759) |
FOR110 | With temperature control (324/760) |
FOR111 | Pin (324/761) |
FOR112 | Cantilever (324/762) |
FOR113 | DUT including test circuit (324/763) |
FOR114 | With identification of DUT (324/764) |
FOR115 | Test of semiconductor device (324/765) |
FOR120 | Liquid crystal device test (324/770) |
FOR121 | Power supply test (324/771) |
FOR122 | Motor or generator fault tests (324/772) |
FOR123 | MISCELLANEOUS (324/158.1) |
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