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300
301 . (1 indent ) Using a magnetometer
302 .. (2 indent ) To determine direction
303 . (1 indent ) Using well logging device
304 . (1 indent ) Using optical pumping or sensing device
305 .. (2 indent ) Having particular optical cell structure
306 . (1 indent ) Determine fluid flow rate
307 . (1 indent ) Using a nuclear resonance spectrometer system
308 .. (2 indent ) Including a test sample and control sample
309 .. (2 indent ) To obtain localized resonance within a sample
310 .. (2 indent ) By scanning sample frequency spectrum
311 .. (2 indent ) With signal decoupling
312 .. (2 indent ) By spectrum storage and analysis
313 .. (2 indent ) Including polarizing magnetic field/radio frequency tuning
314 .. (2 indent ) With conditioning of transmitter signal
315 .. (2 indent ) With sample resonant frequency and temperature interdependence
316 . (1 indent ) Using an electron resonance spectrometer system
317 .. (2 indent ) Including a test sample and control sample
318 . (1 indent ) Spectrometer components
319 .. (2 indent ) Polarizing field magnet
320 ... (3 indent ) With homogeneity control
321 .. (2 indent ) Sample holder structure
322 .. (2 indent ) Electronic circuit elements
323
324 . (1 indent ) Including borehole fluid investigation
325 .. (2 indent ) To determine fluid entry
326 . (1 indent ) For small object detection or location
327 .. (2 indent ) Using oscillator coupled search head
328 ... (3 indent ) Of the beat frequency type
329 .. (2 indent ) Using movable transmitter and receiver
330 . (1 indent ) By aerial survey
331 .. (2 indent ) For magnetic field detection
332 . (1 indent ) With radiant energy or nonconductive-type transmitter
333 .. (2 indent ) Within a borehole
334 .. (2 indent ) With separate pickup
335 ... (3 indent ) Employing multiple frequencies
336 ... (3 indent ) To detect transient signals
337 ... (3 indent ) To detect return wave signals
338 ... (3 indent ) Within a borehole
339 .... (4 indent ) By induction logging
340 .... • (5 indent ) To measure susceptibility
341 .... • (5 indent ) To measure dielectric constant
342 .... • (5 indent ) Using a toroidal coil
343 .... • (5 indent ) Using angularly spaced coils
344 . (1 indent ) With radiant energy or nonconductive-type receiver
345 . (1 indent ) By magnetic means
346 .. (2 indent ) Within a borehole
347 . (1 indent ) Using electrode arrays, circuits, structure, or supports
348 .. (2 indent ) For detecting naturally occurring fields, currents, or potentials
349 ... (3 indent ) Of the telluric type
350 .... (4 indent ) Including magneto-telluric type
351 ... (3 indent ) Within a borehole
352 .... (4 indent ) Combined with artificial source measurement
353 .... (4 indent ) With fluid movement or pressure variation
354 .. (2 indent ) Coupled to artificial current source
355 ... (3 indent ) Within a borehole
356 .... (4 indent ) While drilling
357 ... (3 indent ) Including separate pickup of generated fields or potentials
358 .... (4 indent ) With three electrodes
359 .... (4 indent ) With nonelectrode pickup means
360 .... (4 indent ) Using a pulse-type current source
361 .... • (5 indent ) With mechanical current reversing means
362 .... • (5 indent ) To measure induced polarization
363 .... (4 indent ) By varying the path of current flow
364 .... • (5 indent ) Using frequency variation
365 .... (4 indent ) Offshore
366 .... (4 indent ) For well logging
367 .... • (5 indent ) Using a pad member
368 .... • (5 indent ) Cased borehole
369 .... • (5 indent ) While drilling
370 .... • (5 indent ) Using surface current electrodes
371 .... • (5 indent ) Using plural fields
372 .... • (5 indent ) Between spaced boreholes
373 .... • (5 indent ) Using current focussing means
374 .... • . (6 indent ) Including a pad member
375 .... • . (6 indent ) Including plural current focussing arrays
376
377 . (1 indent ) For magnetic properties
378
379 . (1 indent ) With analysis of displayed waveform
380 . (1 indent ) Electronic ignition system
381 .. (2 indent ) With magnetically controlled circuit
382 .. (2 indent ) With capacitor discharge circuit
383 . (1 indent ) By simulating or substituting for a component under test
384 . (1 indent ) Using plural tests in a conventional ignition system
385 . (1 indent ) Distributor
386 .. (2 indent ) Dwell (i.e., cam angle)
387 .. (2 indent ) Condenser
389 . (1 indent ) Magneto
390 . (1 indent ) Low or high tension lead
391 . (1 indent ) Ignition timing
392 .. (2 indent ) Using a pulse signal technique
393 . (1 indent ) In situ testing of spark plug
394 .. (2 indent ) With cathode-ray tube display
395 .. (2 indent ) Using an illuminating device to indicate spark plug condition
396 .. (2 indent ) With an air gap in series with spark plug to indicate spark plug condition
397 .. (2 indent ) By shorting the plug to ground to indicate spark plug condition
398 ... (3 indent ) With air gap in ground circuit
399 .. (2 indent ) Wherein a measured electric quantity indicates spark plug condition
400 . (1 indent ) Spark plug removed or tested in a test fixture
401 .. (2 indent ) Using a pressure chamber
402 . (1 indent ) Apparatus for coupling a measuring instrument to an ignition system
403
404 . (1 indent ) Cathode-ray tube
405 . (1 indent ) Vacuum tube
406 .. (2 indent ) Plural tubes in the testing circuit
407 .. (2 indent ) Testing circuit for diverse-type tube
408 .. (2 indent ) Circuit for making diverse test
409 .. (2 indent ) Testing discharge space characteristic (e.g., emission)
410 ... (3 indent ) With application of current or potential to the discharge control means
411 .... (4 indent ) Pulsating or alternating current or potential for the discharge control means
412 .... • (5 indent ) Pulsating or alternating current for the anode
413 .. (2 indent ) Shock testing
414 . (1 indent ) Electric lamp
415
416 . (1 indent ) Voltage regulator
417 . (1 indent ) Thermostat switch
419 .. (2 indent ) Reed switch
420 .. (2 indent ) To evaluate contact chatter
421 .. (2 indent ) To evaluate contact resistance
422 .. (2 indent ) To evaluate contact sequence of operation
423 .. (2 indent ) To evaluate contact response time
424 . (1 indent ) Circuit breaker
425
426 . (1 indent ) Using a battery testing device
427 .. (2 indent ) To determine ampere-hour charge capacity
428 ... (3 indent ) Including an integrating device
429 .. (2 indent ) To determine load/no-load voltage
430 .. (2 indent ) To determine internal battery impedance
431 .. (2 indent ) With temperature compensation of measured condition
432 .. (2 indent ) To determine battery electrolyte condition
433 .. (2 indent ) To compare battery voltage with a reference voltage
434 .. (2 indent ) To determine plural cell condition
435 .. (2 indent ) Having particular meter scale or indicator
436 .. (2 indent ) Including oscillator in measurement circuit
437 .. (2 indent ) Including probe structure
438 . (1 indent ) Using a pH determining device
439 . (1 indent ) Using a conductivity determining device
440 .. (2 indent ) Which includes a dropping mercury cell
441 .. (2 indent ) Which includes a temperature responsive element
442 .. (2 indent ) Which includes an oscillator
443 .. (2 indent ) Having a bridge circuit
444 .. (2 indent ) Which includes current and voltage electrodes
445 .. (2 indent ) Having inductance probe structure
446 .. (2 indent ) Having conductance probe structure
447 ... (3 indent ) With movable or adjustable electrode
448 ... (3 indent ) With concentric electrodes
449 ... (3 indent ) With axially arranged electrodes
450 .. (2 indent ) Which includes particular cell container structure
451
452
453 . (1 indent ) In a liquid
454 . (1 indent ) Frictionally induced
455 . (1 indent ) Corona induced
456 . (1 indent ) For flaw detection
458 . (1 indent ) Using modulation-type electrometer
459
460 . (1 indent ) For monitoring pressure
461 .. (2 indent ) Using a radioactive substance
462 .. (2 indent ) Using thermionic emissions
463 .. (2 indent ) Using a magnetic field
464 . (1 indent ) For analysis of gas, vapor, or particles of matter
465 .. (2 indent ) Using electronegative gas sensor
466 .. (2 indent ) Using a filter
467 .. (2 indent ) Using test material desorption
468 .. (2 indent ) Using thermal ionization
469 .. (2 indent ) Using a radioactive substance
470 .. (2 indent ) Using thermionic emission
201 . (1 indent ) Susceptibility
202 . (1 indent ) Calibration
203 . (1 indent ) Curie point determination
204 . (1 indent ) Fluid material examination
205 . (1 indent ) Permanent magnet testing
206 . (1 indent ) Movable random length material measurement
207.11 . (1 indent ) Displacement
207.12 .. (2 indent ) Compensation for measurement
207.13 .. (2 indent ) Having particular sensor means
207.14 ... (3 indent ) Diverse sensors
207.15 ... (3 indent ) Inductive
207.16 .... (4 indent ) Electrically energized
207.17 .... • (5 indent ) Separate pick-up
207.18 .... • (5 indent ) Differential type (e.g., LVDT)
207.19 .... • (5 indent ) Differential bridge circuit
207.2 ... (3 indent ) Hall effect
207.21 ... (3 indent ) Magnetoresistive
207.22 .. (2 indent ) Having particular sensed object
207.23 .. (2 indent ) Plural measurements (e.g., linear and rotary)
207.26 .. (2 indent ) Approach or retreat
209 . (1 indent ) Stress in material measurement
210 . (1 indent ) Magnetic information storage element testing
211 .. (2 indent ) Memory core storage element testing
212 .. (2 indent ) Dynamic information element testing
213 . (1 indent ) Magnetic recording medium on magnetized object records object field
214 . (1 indent ) By paramagnetic particles
215 .. (2 indent ) With pattern enhancing additive
216 .. (2 indent ) Flaw testing
217 . (1 indent ) Railroad rail flaw testing
218 .. (2 indent ) Rail joint cutout
219 . (1 indent ) Magnetic sensor within material
220 .. (2 indent ) Sensor supported, positioned, or moved within pipe
221 ... (3 indent ) Borehole pipe testing
222 . (1 indent ) Hysteresis or eddy current loss testing
223 . (1 indent ) Hysteresis loop curve display or recording
224 . (1 indent ) With temperature control of material or element of test circuit
225 . (1 indent ) With compensation for test variable
226 . (1 indent ) Combined
227 . (1 indent ) Plural tests
228 . (1 indent ) With means to create magnetic field to test material
229 .. (2 indent ) Thickness measuring
230 ... (3 indent ) Layer or layered material
231 ... (3 indent ) With backing member
232 .. (2 indent ) Plural magnetic fields in material
233 .. (2 indent ) With phase sensitive element
234 .. (2 indent ) Electrically energized nonforce type sensor
235 ... (3 indent ) Noncoil type
236 ... (3 indent ) Oscillator type
237 .... (4 indent ) Material flaw testing
238 ... (3 indent ) Material flaw testing
239 .. (2 indent ) Induced voltage-type sensor
240 ... (3 indent ) Material flaw testing
241 .... (4 indent ) Opposed induced voltage sensors
242 .... (4 indent ) Plural sensors
243 ... (3 indent ) Plural sensors
244 . (1 indent ) Magnetometers
244.1 .. (2 indent ) Optical
245 .. (2 indent ) Plural sensor axis misalignment correction
246 .. (2 indent ) With means to align field sensor with magnetic field sensed
247 .. (2 indent ) Nonparallel plural magnetic sensors
248 .. (2 indent ) Superconductive magnetometers
249 .. (2 indent ) Thin film magnetometers
250 .. (2 indent ) Electronic tube or microwave magnetometers
251 .. (2 indent ) Hall plate magnetometers
252 .. (2 indent ) Semiconductor type solid-state or magnetoresistive magnetometers
253 .. (2 indent ) Saturable core magnetometers
254 ... (3 indent ) Second harmonic type
255 ... (3 indent ) Peak voltage type
256 .. (2 indent ) Energized movable sensing coil magnetometers
257 .. (2 indent ) Moving coil magnetometer
258 .. (2 indent ) Fixed coil magnetometer
259 .. (2 indent ) Movable magnet or magnetic member interacts with magnetic field
260 . (1 indent ) Magnetic field detection devices
261 .. (2 indent ) With support for article
262 . (1 indent ) Magnetic test structure elements
263 . (1 indent ) Current through test material forms test magnetic field
500
501 . (1 indent ) Using radiant energy
502 . (1 indent ) In an ignitor or detonator
503 . (1 indent ) In vehicle wiring
504 .. (2 indent ) With trailer
505 .. (2 indent ) Combined with window glass
506 . (1 indent ) Combined with a flashlight
507 .. (2 indent ) With fuse testing attachment
508 . (1 indent ) With electric power receptacle for line wire testing
509 . (1 indent ) Of ground fault indication
510 .. (2 indent ) Of electrically operated apparatus (power tool, appliance, machine, etc.)
511 . (1 indent ) Of electrically operated apparatus (power tool, appliance, machine, etc.)
512 . (1 indent ) For fault location
513 .. (2 indent ) Where component moves while under test
514 ... (3 indent ) By exposing component to liquid or gas while under test
515 ... (3 indent ) Using a particular sensing electrode
516 .... (4 indent ) Metal chain
517 .... (4 indent ) Wire bristles
518 .... (4 indent ) Metal pellets or beads
519 .. (2 indent ) By capacitance measuring
520 .. (2 indent ) By frequency sensitive or responsive detection
521 .. (2 indent ) By phase sensitive or responsive detection
522 .. (2 indent ) By voltage or current measuring
523 ... (3 indent ) Of an applied test signal
524 ... (3 indent ) Polarity responsive
525 .. (2 indent ) By resistance or impedance measuring
526 ... (3 indent ) Using a bridge circuit
527 .. (2 indent ) By applying a test signal
528 ... (3 indent ) Tracing test signal to fault location
529 .... (4 indent ) Using a magnetic field sensor
530 .... (4 indent ) Using an electric field sensor
531 ... (3 indent ) At fault site
532 ... (3 indent ) Using time measuring
533 .... (4 indent ) Of reflected test signal
534 .. (2 indent ) By reflection technique
535 .. (2 indent ) By time measuring
536 .. (2 indent ) By spark or arc discharge
537 . (1 indent ) Of individual circuit component or element
750.01 .. (2 indent ) Measurement or control of test condition
750.02 ... (3 indent ) Calibration of test equipment
750.03 ... (3 indent ) Thermal preconditioning or temperature control
750.04 .... (4 indent ) Thermal matching of guidance member
750.05 .... (4 indent ) Burn-in
750.06 .... • (5 indent ) With temperature sensing
750.07 .... • . (6 indent ) With feedback control
750.08 .... (4 indent ) By fluid
750.09 .... (4 indent ) By heat sink
750.1 .... • (5 indent ) With biasing means
750.11 .... (4 indent ) Thermoelectric
750.12 .... (4 indent ) Electromagnetic
750.13 .... (4 indent ) Of test device transporting means
750.14 .. (2 indent ) Environmental control
750.15 .. (2 indent ) With identification on device under test (DUT)
750.16 .. (2 indent ) Relative positioning or alignment of device under test and test structure
750.17 ... (3 indent ) By capacitive means
750.18 ... (3 indent ) By information on device under test
750.19 ... (3 indent ) Adjustable support for device under test
750.2 .... (4 indent ) Vacuum support
750.21 .... (4 indent ) Magnetic support
750.22 ... (3 indent ) Testing device mounted for multi-directional movement
750.23 ... (3 indent ) Using optical means
750.24 ... (3 indent ) By electrical contact means
750.25 ... (3 indent ) By mechanical means
750.26 .. (2 indent ) Shielding or casing of device under test or of test structure
750.27 ... (3 indent ) EMI interference
750.28 ... (3 indent ) Temperature effect
750.29 ... (3 indent ) Mechanical effect
750.3 .. (2 indent ) Built-in test circuit
754.01 .. (2 indent ) Test probe techniques
754.02 ... (3 indent ) Hand-held
754.03 ... (3 indent ) Contact probe
754.04 .... (4 indent ) Liquid state
754.05 .... (4 indent ) Kelvin probe
754.06 .... (4 indent ) Waveguide probe
754.07 .... (4 indent ) Probe or probe card with build-in circuit element
754.08 .... (4 indent ) In or on support for device under test
754.09 .... • (5 indent ) Carrier feature
754.1 .... (4 indent ) Probe contact confirmation
754.11 .... (4 indent ) Probe contact enhancement or compensation
754.12 .... (4 indent ) Biasing means
754.13 .... • (5 indent ) Mechanical
754.14 .... • (5 indent ) Spring
754.15 .... • (5 indent ) Fluid pressure
754.16 .... • . (6 indent ) Chamber or bladder
754.17 .... • (5 indent ) Magnetic means
754.18 .... (4 indent ) With interpose
754.19 .... (4 indent ) With recording of test result
754.2 .... (4 indent ) Penetrative
754.21 ... (3 indent ) Non-contact probe
754.22 .... (4 indent ) Electron beam
754.23 .... (4 indent ) Optical beam
754.24 .... (4 indent ) With plasma probe
754.25 .... (4 indent ) Ultrasonic
754.26 .... (4 indent ) Tunnel current probe
754.27 .... (4 indent ) Electrical field
754.28 .... • (5 indent ) Capacitive coupling
754.29 .... (4 indent ) Magnetic field
754.3 .... (4 indent ) Intermolecular
754.31 .... (4 indent ) Radio wave
755.01 .. (2 indent ) Probe structure
755.02 ... (3 indent ) Coaxial
755.04 ... (3 indent ) Force absorption
755.05 .... (4 indent ) Spring
755.06 .... (4 indent ) Buckling
755.07 ... (3 indent ) Cantilever
755.08 ... (3 indent ) Elastomeric
755.09 ... (3 indent ) Membrane
755.1 ... (3 indent ) Dendritic structure
755.11 ... (3 indent ) Elongated pin or probe
756.01 .. (2 indent ) Support for device under test or test structure
756.02 ... (3 indent ) DUT socket or carrier
756.03 ... (3 indent ) Probe card
756.04 ... (3 indent ) Pin fixture
756.05 ... (3 indent ) With electrical connectors
756.06 ... (3 indent ) With impedance matching
756.07 ... (3 indent ) Board or plate
757.01 .. (2 indent ) Transporting or conveying the device under test to the testing station
757.02 ... (3 indent ) Printed circuit board
757.04 ... (3 indent ) Packaged IC or unpackaged die or dice
757.05 ... (3 indent ) Multiple chip module
758.01 .. (2 indent ) Cleaning probe or device under test
758.02 ... (3 indent ) By laser ablation
758.03 ... (3 indent ) By blowing air
758.04 ... (3 indent ) By scraping
758.05 ... (3 indent ) By chemical means
759.01 .. (2 indent ) After-test activity
759.02 ... (3 indent ) Marking tested objects
759.03 ... (3 indent ) Sorting tested objects
760.01 .. (2 indent ) Test of liquid crystal device
760.02 ... (3 indent ) Thin film transistor type (TFT)
761.01 .. (2 indent ) Test of solar cell
762.01 .. (2 indent ) Test of semiconductor device
762.02 ... (3 indent ) Packaged integrated circuits
762.03 ... (3 indent ) Integrated circuit die
762.04 .... (4 indent ) TAB carrier
762.05 ... (3 indent ) Semiconductor wafer
762.06 ... (3 indent ) Multiple chip module
762.08 ... (3 indent ) Bipolar transistor
762.09 ... (3 indent ) Field effect transistor
762.1 ... (3 indent ) With barrier layer
763.01 .. (2 indent ) Printed circuit board
763.02 ... (3 indent ) Both sides
764.01 .. (2 indent ) Power supply
765.01 .. (2 indent ) Motor or generator fault
538 .. (2 indent ) Electrical connectors
539 .. (2 indent ) Multiconductor cable
540 ... (3 indent ) With sequencer
541 ... (3 indent ) For insulation fault
542 ... (3 indent ) Having a light or sound indicator
543 .. (2 indent ) Single conductor cable
544 ... (3 indent ) For insulation fault
545 .. (2 indent ) Armature or rotor
546 .. (2 indent ) Winding or coil
547 ... (3 indent ) Transformer
548 .. (2 indent ) Capacitor
549 .. (2 indent ) Resistor
551 .. (2 indent ) Insulation
552 ... (3 indent ) Bushing
554 ... (3 indent ) Sheet material
555 . (1 indent ) Instruments and devices for fault testing
556 .. (2 indent ) Having a lamp or light indicator
557
558 . (1 indent ) Where element moves while under test
559 . (1 indent ) Where a moving sensing electrode scans a stationary element under test
600
601 . (1 indent ) Calibration
602 . (1 indent ) With auxiliary means to condition stimulus/response signals
603 .. (2 indent ) For excitation
604 ... (3 indent ) Including marker signal generator circuit
605 .. (2 indent ) For response signal evaluation or processing
606 ... (3 indent ) Including a signal comparison circuit
607 ... (3 indent ) Including a conversion (e.g., A->D or D-> A) process
608 ... (3 indent ) Including a ratiometric function
609 .. (2 indent ) For sensing
610 ... (3 indent ) Including a bridge circuit
611 ... (3 indent ) Including a remote type circuit
612 . (1 indent ) Parameter related to the reproduction or fidelity of a signal affected by a circuit under test
614 ... (3 indent ) Signal to noise ratio or noise figure
615 .. (2 indent ) Transfer function type characteristics
616 ... (3 indent ) Gain or attenuation
617 ... (3 indent ) Response time or phase delay
618 ... (3 indent ) Transient response or transient recovery time (e.g., damping)
619 ... (3 indent ) Selective type characteristics
620 .. (2 indent ) Distortion
621 ... (3 indent ) Envelope delay
622 ... (3 indent ) Phase
623 ... (3 indent ) Harmonic
624 ... (3 indent ) Intermodulation
625 ... (3 indent ) Dissymmetry or asymmetry
626 ... (3 indent ) Nonlinearity
627 .. (2 indent ) Shielding effectiveness (SE)
628 ... (3 indent ) Circuit interference (e.g., crosstalk) measurement
629 . (1 indent ) Distributive type parameters
630 .. (2 indent ) Plural diverse parameters
631 .. (2 indent ) Using wave polarization (e.g., field rotation)
632 .. (2 indent ) Using particular field coupling type (e.g., fringing field)
633 .. (2 indent ) Using resonant frequency
634 ... (3 indent ) To determine water content
635 ... (3 indent ) To determine dimension (e.g., distance or thickness)
636 ... (3 indent ) With a resonant cavity
637 .. (2 indent ) Using transmitted or reflected microwaves
638 ... (3 indent ) Scattering type parameters (e.g., complex reflection coefficient)
639 ... (3 indent ) Where energy is transmitted through a test substance
640 .... (4 indent ) To determine water content
641 .... (4 indent ) To determine insertion loss
642 ... (3 indent ) Where energy is reflected (e.g., reflectometry)
643 .... (4 indent ) To determine water content
644 .... (4 indent ) To determine dimension (e.g., distance or thickness)
645 .... (4 indent ) Having standing wave pattern
646 .... (4 indent ) To determine reflection coefficient
647 .. (2 indent ) Using a comparison or difference circuit
648 ... (3 indent ) With a bridge circuit
649 . (1 indent ) Lumped type parameters
650 .. (2 indent ) Using phasor or vector analysis
651 ... (3 indent ) With a bridge circuit
652 .. (2 indent ) Of a resonant circuit
653 .. (2 indent ) For figure of merit or Q value
654 .. (2 indent ) Using inductive type measurement
655 ... (3 indent ) Including a tuned or resonant circuit
656 ... (3 indent ) Including a comparison or difference circuit
657 .... (4 indent ) Using a bridge circuit
658 .. (2 indent ) Using capacitive type measurement
659 ... (3 indent ) With loss characteristic evaluation
660 ... (3 indent ) With variable electrode area
661 ... (3 indent ) With variable distance between capacitor electrodes
662 .... (4 indent ) To determine dimension (e.g., thickness or distance)
663 ... (3 indent ) Where a material or object forms part of the dielectric being measured
664 .... (4 indent ) To determine water content
665 .... • (5 indent ) By comparison or difference circuit
666 .... • . (6 indent ) Including a bridge circuit
667 .... • (5 indent ) By frequency signal response, change or processing circuit
668 .... • . (6 indent ) Including a tuned or resonant circuit
669 .... • (5 indent ) With compensation means
670 .... • . (6 indent ) For temperature variations
671 .... (4 indent ) To determine dimension (e.g., dielectric thickness)
672 .... (4 indent ) By comparison or difference circuit
673 .... • (5 indent ) Including a bridge circuit
674 .... (4 indent ) By frequency signal response, change or processing circuit
675 .... • (5 indent ) Including a tuned or resonant circuit
676 ... (3 indent ) With pulse signal processing circuit
677 .... (4 indent ) Including R/C time constant circuit
678 .... (4 indent ) Including charge or discharge cycle circuit
679 ... (3 indent ) With comparison or difference circuit
680 .... (4 indent ) Including a bridge circuit
681 ... (3 indent ) With frequency signal response, change or processing circuit
682 .... (4 indent ) Including a tuned or resonant circuit
683 ... (3 indent ) With phase signal processing circuit
684 ... (3 indent ) With compensation means
685 .... (4 indent ) For temperature variation
686 ... (3 indent ) With a capacitive sensing means
687 .... (4 indent ) Having fringing field coupling
688 .... (4 indent ) Including a guard or ground electrode
689 .... (4 indent ) To determine water content
690 .... (4 indent ) Including a probe type structure
691 .. (2 indent ) Using resistance or conductance measurement
692 ... (3 indent ) With living organism condition determination using conductivity effects
693 ... (3 indent ) With object or substance characteristic determination using conductivity effects
694 .... (4 indent ) To determine water content
695 .... • (5 indent ) Where the object moves while under test
696 .... • (5 indent ) With a probe structure
697 .... (4 indent ) For interface
698 .... (4 indent ) To determine oil qualities
699 .... (4 indent ) To determine dimension (e.g., distance or thickness)
700 .... • (5 indent ) Including corrosion or erosion
701 .... (4 indent ) Where the object moves while under test
702 ... (3 indent ) With radiant energy effects
703 .... (4 indent ) Including heating
704 ... (3 indent ) With ratio determination
705 ... (3 indent ) With comparison or difference circuit
706 .... (4 indent ) Including a bridge circuit
707 ... (3 indent ) With frequency response, change or processing circuit
708 .... (4 indent ) Including a tuned or resonant circuit
709 ... (3 indent ) With phase signal processing circuit
710 ... (3 indent ) With pulse signal processing circuit
711 .... (4 indent ) Including R/C time constant circuit
712 .... (4 indent ) Including a digital or logic circuit
713 ... (3 indent ) With voltage or current signal evaluation
714 .... (4 indent ) Including a potentiometer
715 .... (4 indent ) Including a particular probing technique (e.g., four point probe)
716 .... • (5 indent ) To determine dimension (e.g., distance or thickness)
717 .... • (5 indent ) To determine material composition
718 .... • (5 indent ) To detect a flaw or defect
719 ... (3 indent ) With semiconductor or IC materials quality determination using conductivity effects
720 ... (3 indent ) With compensation means
721 .... (4 indent ) For temperature variation
722 ... (3 indent ) Device or apparatus determines conductivity effects
723 .... (4 indent ) Potentiometer
724 .... (4 indent ) Using a probe type structure
725 . (1 indent ) Using a particular bridge circuit
726 . (1 indent ) Transformer testing (e.g., ratio)
727 . (1 indent ) Piezoelectric crystal testing (e.g., frequency, resistance)
66
67 . (1 indent ) Inaccessible (at test point) conductor (e.g., buried in wall)
160
161 . (1 indent ) Speed comparing means
162 . (1 indent ) With acceleration measuring means
163 . (1 indent ) Including speed analog electrical signal generator
164 .. (2 indent ) Eddy current generator type (e.g., tachometer)
165 .. (2 indent ) With direction indicator
166 . (1 indent ) Including speed-related frequency generator
167 .. (2 indent ) Including rotating magnetic field actuated indicator
168 .. (2 indent ) Including periodic switch
169 ... (3 indent ) In ignition system
170 .... (4 indent ) High voltage speed signal type
171 ... (3 indent ) With extent-of-travel indicator
172 .. (2 indent ) Including synchronized recording medium
173 .. (2 indent ) Including magnetic detector
174 ... (3 indent ) Permanent magnet type
175 .. (2 indent ) Including radiant energy detector
176 . (1 indent ) Including object displacement varied variable circuit impedance
177 . (1 indent ) Including motor current or voltage sensor
178 . (1 indent ) Including "event" sensing means
179 .. (2 indent ) Magnetic field sensor
180 .. (2 indent ) Mechanically actuated switch
71.1
71.2 . (1 indent ) Erosion
71.3 . (1 indent ) Beam of atomic particles
71.4 . (1 indent ) Particle counting
71.5 . (1 indent ) Semiconductors for nonelectrical property
71.6 . (1 indent ) Superconductors
72
72.5 . (1 indent ) Voltage probe
73.1
74
75 . (1 indent ) By stroboscopic means
76.11
76.12 . (1 indent ) Analysis of complex waves
76.13 .. (2 indent ) Amplitude distribution
76.14 ... (3 indent ) Radiometer (e.g., microwave, etc.)
76.15 ... (3 indent ) With sampler
76.16 ... (3 indent ) With counter
76.17 ... (3 indent ) With integrator
76.18 ... (3 indent ) With slope detector
76.19 .. (2 indent ) Frequency spectrum analyzer
76.21 ... (3 indent ) By Fourier analysis
76.22 ... (3 indent ) Real-time spectrum analyzer
76.23 ... (3 indent ) With mixer
76.24 ... (3 indent ) With sampler
76.25 ... (3 indent ) With slope detector
76.26 ... (3 indent ) Scanning-panoramic receiver
76.27 .... (4 indent ) With particular sweep circuit
77.11 ... (3 indent ) Nonscanning
76.28 .... (4 indent ) Digital filter
76.29 .... (4 indent ) With filtering
76.31 .... • (5 indent ) Parallel filters
76.32 .... • . (6 indent ) With space discharge device
76.33 .... (4 indent ) Correlation
76.34 .... • (5 indent ) With space discharge device
76.35 .... (4 indent ) With delay line
76.36 .... (4 indent ) With optics
76.37 .... • (5 indent ) Bragg cell
76.38 .. (2 indent ) With sampler
76.39 . (1 indent ) Frequency of cyclic current or voltage (e.g., cyclic counting etc.)
76.41 .. (2 indent ) Frequency comparison, (e.g., heterodyne, etc.)
76.42 ... (3 indent ) With sampler
76.43 ... (3 indent ) With plural mixers
76.44 ... (3 indent ) With filtering
76.45 .... (4 indent ) Bandpass
76.46 .... (4 indent ) Plural
76.47 ... (3 indent ) Digital output
76.48 .... (4 indent ) With counter
76.49 .. (2 indent ) Tuned mechanical resonator (e.g., reed, piezocrystal, etc.)
76.51 .. (2 indent ) By tuning (e.g., to resonance,etc.)
76.52 .. (2 indent ) By phase comparison
76.53 ... (3 indent ) With phase lock
76.54 ... (3 indent ) With delay line
76.55 ... (3 indent ) Digital output
76.56 .... (4 indent ) With microwave frequency detection
76.57 .... (4 indent ) With tone detection
76.58 .... (4 indent ) With sampler
76.59 .... (4 indent ) With multiplexing
76.61 .... (4 indent ) With memory
76.62 .... (4 indent ) With counter
76.63 .... • (5 indent ) Using register
76.64 .... • (5 indent ) Plural
76.65 .... (4 indent ) With space discharge device
76.66 ... (3 indent ) With capacitive energy storage
76.67 .... (4 indent ) With space discharge device
76.68 ... (3 indent ) With filtering
76.69 ... (3 indent ) Current output proportional to frequency
76.71 ... (3 indent ) Nulling circuit
76.72 ... (3 indent ) Qualitative output
76.73 ... (3 indent ) With saturable device
76.74 ... (3 indent ) Deviation measurement
76.75 .. (2 indent ) Having inductive sensing
76.76 .. (2 indent ) With space discharge device
76.77 . (1 indent ) Phase comparison (e.g., between cyclic pulse voltage and sinusoidal current, etc.)
76.78 .. (2 indent ) Quadrature sensing
76.79 .. (2 indent ) Feedback control, electrical
76.81 .. (2 indent ) Feedback control, mechanical
76.82 .. (2 indent ) Digital output
76.83 .. (2 indent ) Analog output
84 .. (2 indent ) With waveguide (e.g., coaxial cable)
85 .. (2 indent ) With frequency conversion
86 .. (2 indent ) Polyphase (e.g., phase angle, phase rotation or sequence)
87 .. (2 indent ) With nonlinear device (e.g., saturable reactor, rectifier), discharge device (e.g., gas tube) or lamp
88 ... (3 indent ) Cathode ray
89 ... (3 indent ) Space discharge control means (e.g., grid)
90 .. (2 indent ) Electrodynamometer instrument
91 .. (2 indent ) Synchroscope type
92 . (1 indent ) Fluid (e.g., thermal expansion)
93 .. (2 indent ) Conductive field (e.g., mercury)
94 ... (3 indent ) Electrolytic
95 . (1 indent ) With waveguide or long line
96 . (1 indent ) Using radiant energy
97 .. (2 indent ) Light beam type (e.g., mirror galvanometer, parallax-free scale)
98 . (1 indent ) Balancing (e.g., known/unknown voltage comparison, bridge, rebalancing)
99R .. (2 indent ) Automatic
100 ... (3 indent ) With recording
99D ... (3 indent ) Digital voltmeters
101 . (1 indent ) Non-rebalancing bridge
102 . (1 indent ) Transient or portion of cyclic
103R . (1 indent ) Demand, excess, maximum or minimum (e.g., separate meters for positive and negative power, peak voltmeter)
104 .. (2 indent ) Thermal (e.g., actuation)
103P .. (2 indent ) Peak voltmeters
105 . (1 indent ) Thermal (e.g., compensation)
106 .. (2 indent ) Actuation
107 . (1 indent ) Polyphase
108 .. (2 indent ) Positive, negative or zero sequence
109 . (1 indent ) Electrostatic attraction or piezoelectric
110 . (1 indent ) Meter protection or fraud combatting
111 . (1 indent ) With storage means for voltage or current (e.g., condenser banks)
112 .. (2 indent ) Tape, sheet (e.g., disk) or wire (e.g., magnetic) storage
113 . (1 indent ) Recording
114 . (1 indent ) Plural meters (e.g., plural movements in one case)
115 . (1 indent ) Plural ranges, scales or registration rates
116 .. (2 indent ) With register (e.g., discount type, demand penalty)
117R . (1 indent ) Magnetic saturation (e.g., in field or in amplifier)
117H .. (2 indent ) Hall effect
118 . (1 indent ) Modulator/demodulator
119 . (1 indent ) With rectifier (e.g., A.C. to D.C.)
120 . (1 indent ) With voltage or current conversion (e.g., D.C. to A.C., 60 to 1000)
121R . (1 indent ) Cathode ray (e.g., magic eye)
121E .. (2 indent ) Magic eye indicators
122 . (1 indent ) Gaseous discharge (e.g., spark gap voltmeter)
123R . (1 indent ) With amplifier or space discharge device
124 .. (2 indent ) Inverted amplifier
123C .. (2 indent ) Feedback amplifiers
125 . (1 indent ) Inertia control, instrument damping and vibration damping
126 . (1 indent ) With coupling means (e.g., attenuator, shunt)
127 .. (2 indent ) Transformer (e.g., split core admits conductor carrying unknown current)
128 .. (2 indent ) Selective filter
129 . (1 indent ) Polepiece (e.g., split) admits nonunitary input conductor
130 . (1 indent ) Self-calibration
131 . (1 indent ) Suppressed zero
132 . (1 indent ) Nonlinear (e.g., Thyrite)
133 . (1 indent ) Nonquantitative (e.g., hot-line indicator, polarity tester)
134 . (1 indent ) With commutator or reversing or pulsating switch (e.g., D.C. watt-hour meter)
135 .. (2 indent ) Oscillating
136 . (1 indent ) With rolling wheel or ball (e.g., transmission, integrating)
137 . (1 indent ) Eddy current rotor (e.g., A.C. integrating wattmeter)
138 .. (2 indent ) With phase adjustment
139 . (1 indent ) Motor-driven, time-controlled or oscillating (e.g., ratchet)
140R . (1 indent ) Plural inputs (e.g., summation, ratio)
141 .. (2 indent ) Voltamperes (real or reactive)
140D .. (2 indent ) Ratio
143 . (1 indent ) Plural active motor elements (e.g., for two crossed pointers)
144 . (1 indent ) With electromagnetic field (e.g., dynamometer)
145 .. (2 indent ) Solenoid plunger type
146 .. (2 indent ) With permanent magnet (e.g., field, vane)
147 .. (2 indent ) Soft iron vane
149 . (1 indent ) With probe, prod or terminals
150 . (1 indent ) Eccentrically pivoted coil
151R . (1 indent ) With permanent magnet
152 .. (2 indent ) Drag magnet
151A .. (2 indent ) Permanent magnet core
153 . (1 indent ) With register
154R . (1 indent ) With rotor (e.g., filar suspension, zero set, balancing)
155 .. (2 indent ) With pivot (e.g., internal friction compensation, anticreep)
154PB .. (2 indent ) Pointer and bearing details
156 . (1 indent ) Casings
157 . (1 indent ) Combined
FOR000
Any foreign patents or non-patent literature from subclasses that have been reclassified have been transferred directly to FOR Collections listed below. These Collections contain ONLY foreign patents or non-patent literature. The parenthetical references in the Collection titles refer to the abolished subclasses from which these Collections were derived.
. (1 indent ) Of individual circuit component or element(324/537)
FOR100 .. (2 indent ) System sensing fields adjacent device under test (DUT) (324/750)
FOR101 ... (3 indent ) Using electron beam probe (324/751)
FOR102 ... (3 indent ) Using light probe (324/752)
FOR103 ... (3 indent ) Using electro-optic device (324/753)
. (1 indent ) Using electrode arrays, circuits, structure, or supports (324/347)
FOR104 .. (2 indent ) With probe elements (324/754)
FOR105 ... (3 indent ) Internal of or on support for device under test (DUT): (324/755)
FOR106 ... (3 indent ) Contact confirmation (324/756)
FOR107 ... (3 indent ) Probe contact enhancement (324/757)
FOR108 ... (3 indent ) Probe alignment or positioning (324/758)
FOR109 ... (3 indent ) With recording of test results on DUT (324/759)
FOR110 ... (3 indent ) With temperature control (324/760)
FOR111 ... (3 indent ) Pin (324/761)
FOR112 ... (3 indent ) Cantilever (324/762)
FOR113 .. (2 indent ) DUT including test circuit (324/763)
FOR114 .. (2 indent ) With identification of DUT (324/764)
FOR115 .. (2 indent ) Test of semiconductor device (324/765)
FOR116 ... (3 indent ) With barrier layer (324/766)
FOR117 .... (4 indent ) Diode (324/767)
FOR118 .... (4 indent ) Bipolar transistor (324/768)
FOR119 .... (4 indent ) Field effect transistor (324/769)
FOR120 .. (2 indent ) Liquid crystal device test (324/770)
FOR121 .. (2 indent ) Power supply test (324/771)
FOR122 .. (2 indent ) Motor or generator fault tests (324/772)
FOR123
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