US 9,812,313 B2
Time-of-flight analysis of a continuous beam of ions by a detector array
Robert Alois Grothe, Jr., Campbell, CA (US)
Assigned to DH Technologies Development Pte. Ltd., Singapore (SG)
Appl. No. 15/105,089
Filed by DH Technologies Development Pte. Ltd., Singapore (SG)
PCT Filed Dec. 6, 2014, PCT No. PCT/IB2014/002684
§ 371(c)(1), (2) Date Jun. 16, 2016,
PCT Pub. No. WO2015/101820, PCT Pub. Date Jul. 9, 2015.
Claims priority of provisional application 61/922,696, filed on Dec. 31, 2013.
Prior Publication US 2016/0336161 A1, Nov. 17, 2016
Int. Cl. H01J 49/00 (2006.01); H01J 49/40 (2006.01); H01J 49/02 (2006.01); H01J 49/20 (2006.01); H01J 49/22 (2006.01)
CPC H01J 49/40 (2013.01) [H01J 49/0031 (2013.01); H01J 49/025 (2013.01); H01J 49/20 (2013.01); H01J 49/22 (2013.01)] 17 Claims
OG exemplary drawing
1. A time-of-flight mass (TOF) spectrometer for analyzing a continuous beam of ions using a rotating magnetic field, comprising:
an ion source that ionizes a sample producing a continuous beam of ions;
an accelerator that receives the continuous beam and applies an electric field to the continuous beam of ions producing an accelerated beam of ions;
a two-dimensional detector that records an arrival time and a two-dimensional arrival position of each ion of the accelerated beam impacting the two-dimensional detector; and
a deflector located between the accelerator and the two-dimensional detector that receives the accelerated beam and applies a rotating magnetic field to the accelerated beam to separate ions with different mass-to-charge ratios in the accelerated beam over an area of the two-dimensional detector, wherein the rotating magnetic field is rotated at a constant frequency.