US 9,812,228 B2
X-ray obscuration film and related techniques
Stephen Gonya, Endicott, NY (US); and Jesse Iannon, Binghamton, NY (US)
Assigned to Lockheed Martin Corporation, Bethesda, MD (US)
Filed by Lockheed Martin Corporation, Bethesda, MD (US)
Filed on Dec. 2, 2016, as Appl. No. 15/367,642.
Application 15/367,642 is a continuation of application No. 15/014,160, filed on Feb. 3, 2016, granted, now 9,515,030.
Application 15/014,160 is a continuation of application No. 14/789,885, filed on Jul. 1, 2015, granted, now 9,263,400, issued on Feb. 16, 2016.
Application 14/789,885 is a continuation of application No. 14/325,670, filed on Jul. 8, 2014, granted, now 9,087,617, issued on Jul. 21, 2015.
Application 14/325,670 is a continuation of application No. 13/827,297, filed on Mar. 14, 2013, granted, now 8,772,745, issued on Jul. 8, 2014.
Prior Publication US 2017/0084356 A1, Mar. 23, 2017
This patent is subject to a terminal disclaimer.
Int. Cl. H01L 23/00 (2006.01); G21F 3/00 (2006.01); H05K 1/02 (2006.01); H01L 23/552 (2006.01)
CPC G21F 3/00 (2013.01) [H01L 23/552 (2013.01); H01L 23/573 (2013.01); H05K 1/02 (2013.01); H05K 1/0209 (2013.01); H05K 1/0275 (2013.01); H01L 2924/0002 (2013.01); H05K 2201/0715 (2013.01); H05K 2201/09681 (2013.01)] 19 Claims
OG exemplary drawing
 
1. A method of obscuring circuit lines in a radiographic inspection, comprising:
placing an obscuration film between an electromagnetic radiation source and an electromagnetic radiation detector, the obscuration film being coupled to an electronic device including the circuit lines; and
obscuring the circuit lines using an optical interference pattern of the obscuration film,
wherein the obscuration film includes a plurality of wire mesh each having different sizes with respect to each other, and
wherein the optical interference pattern is created by the plurality of wire mesh.