US 9,811,899 B2
Method, image processing system and computer-readable recording medium for item defect inspection
Hao-Yu Chien, Taoyuan (TW); Chan-Hao Hsu, Hsinchu (TW); and Tzung-Hua Ying, Hsinchu (TW)
Assigned to Powerchip Technology Corporation, Hsinchu (TW)
Filed by Powerchip Technology Corporation, Hsinchu (TW)
Filed on Apr. 15, 2016, as Appl. No. 15/99,609.
Claims priority of application No. 104143977 A (TW), filed on Dec. 28, 2015.
Prior Publication US 2017/0186144 A1, Jun. 29, 2017
Int. Cl. G06T 7/00 (2017.01); G06T 5/00 (2006.01); G06T 5/50 (2006.01)
CPC G06T 7/001 (2013.01) [G06T 5/002 (2013.01); G06T 5/50 (2013.01); G06T 7/0008 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/20021 (2013.01); G06T 2207/20024 (2013.01); G06T 2207/20072 (2013.01); G06T 2207/30148 (2013.01)] 20 Claims
OG exemplary drawing
 
1. An item defect inspection method, adapted to an image processing system, comprising the following steps:
receiving a test image and a reference image of a test item;
obtaining a test block from the test image and obtaining a reference block corresponding to the test block from the reference image to respectively generate a test block image and a reference block image;
partitioning the test block image and the reference block image respectively into a plurality of test sub-blocks and a plurality of reference sub-blocks, wherein each of the test sub-blocks corresponds to each of the reference sub-block;
comparing the test sub-blocks and the reference sub-blocks so as to identify any interfering test sub-bock and any interfering reference sub-block respectively from the test sub-blocks and the reference sub-blocks, wherein each of the interfering test sub-blocks is not similar to any of the interfering reference sub-blocks, and wherein each of the interfering reference sub-blocks is not similar to any of the interfering test sub-blocks;
filtering out the interfering test sub-blocks and the test sub-blocks corresponding to the interfering reference sub-blocks from the test block image to generate a filtered test block image, and filtering out the interfering reference sub-blocks and the reference sub-blocks corresponding to the interfering test sub-blocks from the reference block image to generate a filtered reference block image;
obtaining a shift calibration parameter according to the filtered test block image and the filtered reference block image;
calibrating the test block in the test image according to the shift calibration parameter to obtain a calibrated test block image; and
comparing the calibrated test block image and the reference block image to obtain defect information of the test item corresponding to the test block.