US 9,811,449 B2
Test scenario generation support device and test scenario generation support method
Takahiro Sonoda, Tokyo (JP); Hideyuki Kanuka, Tokyo (JP); Yoichi Nakai, Tokyo (JP); and Gaku Saitou, Tokyo (JP)
Assigned to HITACHI, LTD., Tokyo (JP)
Filed by Hitachi, Ltd., Tokyo (JP)
Filed on Aug. 4, 2016, as Appl. No. 15/228,769.
Claims priority of application No. 2015-163587 (JP), filed on Aug. 21, 2015.
Prior Publication US 2017/0052882 A1, Feb. 23, 2017
Int. Cl. G06F 9/44 (2006.01); G06F 11/36 (2006.01)
CPC G06F 11/3684 (2013.01) 4 Claims
OG exemplary drawing
 
1. A test scenario generation support device comprising:
a storage device configured to hold use case scenarios relating to an application of a test target; and
a computation device includes a processor configured to identify from the use case scenarios a vocabulary relating to a screen display using a predetermined rule, to identify a screen object corresponding to the identified vocabulary for each of the use case scenarios using a predetermined algorithm, and to generate a test scenario based on a test pattern defined in advance for each screen object, wherein
the computation device sets the identified screen object to predetermined screen data corresponding to the use case scenario to generate a screen mock-up and outputs the screen mock-up to a predetermined display device, acquires, from an input device, a content input to the screen object by a user and uses the input content as a test pattern on each screen object, generates an additional test scenario based on the test pattern, and merges the generated additional test scenario and the test scenario to generate a merged test scenario.