US 9,810,932 B2
Driver chip, driver board and test method thereof, and display device
Shuai Xu, Beijing (CN); Zhengxin Zhang, Beijing (CN); and Zhiyong Wang, Beijing (CN)
Assigned to BOE TECHNOLOGY GROUP CO., LTD.; and BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
Appl. No. 14/913,323
Filed by BOE TECHNOLOGY GROUP CO., LTD., Beijing (CN); and BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD., Beijing (CN)
PCT Filed Aug. 12, 2015, PCT No. PCT/CN2015/086761
§ 371(c)(1), (2) Date Feb. 19, 2016,
PCT Pub. No. WO2016/165248, PCT Pub. Date Oct. 20, 2016.
Claims priority of application No. 2015 1 0179895 (CN), filed on Apr. 16, 2015.
Prior Publication US 2017/0059897 A1, Mar. 2, 2017
Int. Cl. G02F 1/13 (2006.01); G09G 3/36 (2006.01); G02F 1/133 (2006.01); G02F 1/1368 (2006.01)
CPC G02F 1/1309 (2013.01) [G02F 1/1368 (2013.01); G02F 1/13306 (2013.01); G09G 3/36 (2013.01); G09G 3/3648 (2013.01); G09G 2310/08 (2013.01)] 19 Claims
OG exemplary drawing
 
1. A driver chip comprising:
a first internal interface;
a second internal interface; and
a test circuit configured to perform a short-circuit detection on the internal interfaces, the test circuit comprising an input unit and a test unit;
wherein the input unit is connected with a test signal input terminal, the test unit and the first internal interface, respectively, and configured to transmit a test signal inputted via the test signal input terminal to the test unit and the first internal interface when the input unit is in an ON state; and
wherein the test unit is connected with the second internal interface and a test signal output terminal, respectively, and configured to prevent a signal outputted by the input unit from being outputted from the test unit to the test signal output terminal and the second internal interface when the test unit is in an OFF state.