US 9,810,894 B2
Tracking and characterizing particles with holographic video microscopy
David G. Grier, New York, NY (US); Sang-Hyuk Lee, Bridgewater, NJ (US); and Fook C. Cheong, Brooklyn, NY (US)
Assigned to NEW YORK UNIVERSITY, New York, NY (US)
Filed on Jul. 29, 2014, as Appl. No. 14/446,306.
Application 14/446,306 is a continuation of application No. 12/740,628, granted, now 8,791,985, previously published as PCT/US2008/081794, filed on Oct. 30, 2008.
Claims priority of provisional application 61/001,023, filed on Oct. 30, 2007.
Claims priority of provisional application 61/073,959, filed on Jun. 19, 2008.
Prior Publication US 2014/0333935 A1, Nov. 13, 2014
This patent is subject to a terminal disclaimer.
Int. Cl. G02B 21/36 (2006.01); G01N 15/02 (2006.01); G01N 15/14 (2006.01); G01P 5/00 (2006.01); G01P 5/20 (2006.01); G03H 1/00 (2006.01); G01B 9/02 (2006.01); G01N 15/10 (2006.01); G01N 15/00 (2006.01); G03H 1/08 (2006.01); G03H 1/04 (2006.01)
CPC G02B 21/361 (2013.01) [G01B 9/02001 (2013.01); G01N 15/0227 (2013.01); G01N 15/10 (2013.01); G01N 15/1463 (2013.01); G01P 5/001 (2013.01); G01P 5/20 (2013.01); G03H 1/0005 (2013.01); G01N 2015/0038 (2013.01); G01N 2015/025 (2013.01); G01N 2015/1075 (2013.01); G03H 1/0866 (2013.01); G03H 2001/005 (2013.01); G03H 2001/0033 (2013.01); G03H 2001/0447 (2013.01); G03H 2001/0825 (2013.01); G03H 2240/56 (2013.01)] 14 Claims
OG exemplary drawing
11. A computer implemented system comprising:
a holographic microscope apparatus comprising a coherent light source with multiple discrete concurrent wavelengths of coherent light beams' a specimen stage, an objective lens, and an image collection device;
a computer module in communication with the holographic microscope apparatus and including a processor and memory, the memory receiving image data from the image collection device and further having a set of instructions for;
selecting multiple wavelengths for a laser;
scattering the laser's beam off the specimen to generate a scattered portion;
generating an interference pattern from an unscattered portion of the collimated laser beam and the scattered portion;
recording the interference pattern for subsequent analysis;
applying a scattering function to analyze the recorded interference pattern wherein the scattering function comprises a Lorenz-Mie function;
normalizing the interference pattern by dividing the interference pattern by a background form of interference pattern;
fitting a calculated hologram to the interference pattern; and
determining an estimate of the specimen's refractive index and radius from the fitted calculated hologram;
wherein the determining of the refractive index of the specimen comprises measuring refractive indices of the specimen at each of the multiple wavelengths.