US 9,810,893 B2
Phase mask imaging with characterization of rotational mobility
Adam S. Backer, Palo Alto, CA (US); Mikael P. Backlund, Palo Alto, CA (US); Alexander R. von Diezmann, Palo Alto, CA (US); and Steffen J. Sahl, Göttingen (DE)
Assigned to The Board of Trustees of the Leland Stanford Junior University, Stanford, CA (US)
Filed by The Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA (US)
Filed on Mar. 26, 2015, as Appl. No. 14/670,193.
Claims priority of provisional application 61/971,338, filed on Mar. 27, 2014.
Prior Publication US 2015/0277092 A1, Oct. 1, 2015
Int. Cl. G02B 21/16 (2006.01); G02B 21/02 (2006.01); G02B 21/36 (2006.01); G01B 11/22 (2006.01); G02B 21/00 (2006.01)
CPC G02B 21/16 (2013.01) [G01B 11/22 (2013.01); G02B 21/0016 (2013.01); G02B 21/02 (2013.01); G02B 21/361 (2013.01)] 19 Claims
OG exemplary drawing
 
1. An apparatus comprising:
a phase mask;
a microscope having
an objective, and
a detection pathway configured and arranged with the phase mask therein and for passing light from the objective; and
circuitry configured and arranged with the phase mask and microscope to characterize the depth of an individual object within a specimen, and to characterize rotational mobility of a feature corresponding to the individual object, based on detected light passed via the microscope and the phase mask, wherein the phase mask is configured and arranged with the microscope to pass the light from the objective with the light in respective lobes spaced apart by a distance, and providing an indication of depth of the object based on the distance.