US 9,810,792 B2
Crystal material, radiation detector, imaging apparatus, nondestructive inspection apparatus, and lighting apparatus
Akira Yoshikawa, Miyagi (JP); Shunsuke Kurosawa, Miyagi (JP); Yuui Yokota, Miyagi (JP); Yasuhiro Shoji, Miyagi (JP); Akira Suzuki, Miyagi (JP); and Toetsu Shishido, Miyagi (JP)
Assigned to TOHOKU UNIVERSITY, Miyagi (JP)
Appl. No. 14/655,666
Filed by TOHOKU UNIVERSITY, Miyagi (JP)
PCT Filed Dec. 26, 2013, PCT No. PCT/JP2013/084980
§ 371(c)(1), (2) Date Jun. 25, 2015,
PCT Pub. No. WO2014/104238, PCT Pub. Date Jul. 3, 2014.
Claims priority of application No. 2012-283465 (JP), filed on Dec. 26, 2012.
Prior Publication US 2015/0346360 A1, Dec. 3, 2015
Int. Cl. G01T 1/20 (2006.01); G01T 1/202 (2006.01); C09K 11/77 (2006.01); C30B 29/32 (2006.01); C30B 29/34 (2006.01); G21K 4/00 (2006.01); C30B 13/00 (2006.01); C30B 15/00 (2006.01); C30B 29/22 (2006.01)
CPC G01T 1/2023 (2013.01) [C09K 11/7769 (2013.01); C09K 11/7774 (2013.01); C09K 11/7775 (2013.01); C30B 13/00 (2013.01); C30B 15/00 (2013.01); C30B 29/22 (2013.01); C30B 29/32 (2013.01); C30B 29/34 (2013.01); G21K 4/00 (2013.01)] 13 Claims
OG exemplary drawing
 
1. A crystal material represented by a general formula (1):
(Gd1-x-y-zLaxMEyREz)2MM2O7  (1)
where ME is at least one selected from Y, Sc, and Lu; RE is at least one selected from Ce or Pr; MM includes at least Si and Ge; and ranges of x, y, and z are represented by the following (i):
(i) 0.0≤x+y+z<1.0, 0.05≤x+z<1.0, 0.0≤y<1.0, and 0.0001≤z<0.05 (where, when RE is Ce, y=0 is an exception).