US 9,810,759 B2
Closed-loop device calibration using a wideband signal
Arup Polley, Richardson, TX (US); Russell Melvin Rosenquist, Plano, TX (US); and Terry Lee Sculley, Lewisville, TX (US)
Filed by Texas Instruments Incorporated, Dallas, TX (US)
Filed on Jan. 14, 2016, as Appl. No. 14/995,521.
Claims priority of provisional application 62/273,033, filed on Dec. 30, 2015.
Prior Publication US 2017/0192078 A1, Jul. 6, 2017
Int. Cl. G01R 35/00 (2006.01); G01R 33/07 (2006.01); G01N 1/00 (2006.01); H04J 1/00 (2006.01)
CPC G01R 35/005 (2013.01) [G01R 33/07 (2013.01); G01N 1/00 (2013.01); G01N 2201/00 (2013.01); H04J 1/00 (2013.01)] 14 Claims
OG exemplary drawing
1. An apparatus comprising:
a signal generator device configured to provide a pseudorandom wideband calibration signal;
a device configured to receive the calibration signal and to provide an output dependent on at least the pseudorandom wideband calibration signal and perturbation effects;
a processing circuit configured to receive the output and a desired device response signal and to provide a compensation signal configured to adjust an operation parameter to counter the perturbation effects for the device based on a comparison of an aspect of the output based on the pseudorandom wideband calibration signal and the desired device response signal;
the device further comprises a magnetic field detector; and
the signal generator device is configured to provide the pseudorandom wideband calibration signal to cause a magnetic field applied to the magnetic field detector to change with the pseudorandom wideband calibration signal.