US 9,810,759 B2
Closed-loop device calibration using a wideband signal
Arup Polley, Richardson, TX (US); Russell Melvin Rosenquist, Plano, TX (US); and Terry Lee Sculley, Lewisville, TX (US)
Assigned to TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US)
Filed by Texas Instruments Incorporated, Dallas, TX (US)
Filed on Jan. 14, 2016, as Appl. No. 14/995,521.
Claims priority of provisional application 62/273,033, filed on Dec. 30, 2015.
Prior Publication US 2017/0192078 A1, Jul. 6, 2017
Int. Cl. G01R 35/00 (2006.01); G01R 33/07 (2006.01); G01N 1/00 (2006.01); H04J 1/00 (2006.01)
CPC G01R 35/005 (2013.01) [G01R 33/07 (2013.01); G01N 1/00 (2013.01); G01N 2201/00 (2013.01); H04J 1/00 (2013.01)] 14 Claims
OG exemplary drawing
 
1. An apparatus comprising:
a signal generator device configured to provide a pseudorandom wideband calibration signal;
a device configured to receive the calibration signal and to provide an output dependent on at least the pseudorandom wideband calibration signal and perturbation effects;
a processing circuit configured to receive the output and a desired device response signal and to provide a compensation signal configured to adjust an operation parameter to counter the perturbation effects for the device based on a comparison of an aspect of the output based on the pseudorandom wideband calibration signal and the desired device response signal;
the device further comprises a magnetic field detector; and
the signal generator device is configured to provide the pseudorandom wideband calibration signal to cause a magnetic field applied to the magnetic field detector to change with the pseudorandom wideband calibration signal.