US 9,810,739 B2
Electronic system, system diagnostic circuit and operation method thereof
Zhong-Ho Chen, Taichung (TW)
Assigned to ANDES TECHNOLOGY CORPORATION, Hsin-Chu (TW)
Filed by ANDES TECHNOLOGY CORPORATION, Hsin-Chu (TW)
Filed on Oct. 27, 2015, as Appl. No. 14/924,682.
Prior Publication US 2017/0115343 A1, Apr. 27, 2017
Int. Cl. G01R 31/28 (2006.01); G01R 31/3177 (2006.01); G01R 31/3185 (2006.01); G11C 29/00 (2006.01)
CPC G01R 31/3177 (2013.01) [G01R 31/318555 (2013.01); G01R 31/318588 (2013.01); G11C 29/00 (2013.01)] 18 Claims
OG exemplary drawing
 
1. A system diagnostic circuit of an electronic system, comprising:
an interface, configured to receive a first test data;
a data register circuit, wherein the data register circuit is an IDCODE register or a bypass register;
an instruction register circuit;
a diagnostic controller circuit, configured to determine to transmit the first test data to the instruction register circuit or the data register circuit according to an operating state;
a control register circuit; and
a detect circuit, configured to update the control register circuit when the first test data transmitted to the data register circuit meets a predefined pattern, wherein the predefined pattern comprises a predefined preamble, and the first test data transmitted to the data register circuit comprises a preamble part, a data part, and an error checking code, and
when the preamble part matches the predefined preamble and a calculation result obtained from calculating the first test data by an error checking calculation matches the error checking code, the first test data transmitted to the data register circuit is determined as meeting the predefined pattern.