US 9,810,629 B2
Recognition of position of crystal in nuclear detector
Nan Li, Shenyang (CN); Guodong Liang, Shenyang (CN); Yuqiu Zhao, Shenyang (CN); Guocheng Wu, Shenyang (CN); and Jian Zhao, Shenyang (CN)
Assigned to Shenyang Neusoft Medical Systems Co., Ltd., Shenyang (CN)
Filed by Shenyang Neusoft Medical Systems Co., Ltd., Shenyang (CN)
Filed on Sep. 27, 2016, as Appl. No. 15/277,304.
Claims priority of application No. 2015 1 0642229 (CN), filed on Sep. 30, 2015.
Prior Publication US 2017/0089833 A1, Mar. 30, 2017
Int. Cl. G01N 21/63 (2006.01); G01T 7/00 (2006.01)
CPC G01N 21/63 (2013.01) [G01T 7/00 (2013.01)] 20 Claims
OG exemplary drawing
 
1. An apparatus for recognizing a position of a crystal in a nuclear detector, comprising:
a silicon semiconductor detector array, comprising a plurality of silicon semiconductor detectors arranged in a form of a crystal array in the nuclear detector, wherein:
each row of the silicon semiconductor detector array is configured to output a sum of voltages outputted by the silicon semiconductor detectors in the row at a row signal output end,
each column of the silicon semiconductor detector array is configured to output a sum of voltages outputted by the silicon semiconductor detectors in the column at a column signal output end,
each of the silicon semiconductor detectors corresponds to a crystal in the crystal array and is coupled to a row signal output end of a row including the silicon semiconductor detector and to a column signal output end of a column including the silicon semiconductor detector;
a plurality of row signal comparing modules each coupled to a respective row signal output end of a respective row of the silicon semiconductor detectors and configured to obtain a row comparison result corresponding to the respective row of the silicon semiconductor detectors by comparing a voltage on the respective row signal output end with a threshold voltage;
a plurality of column signal comparing modules each coupled to a respective column signal output end of a respective column of the silicon semiconductor detector and configured to obtain a column comparison result corresponding to the respective column of the silicon semiconductor detectors by comparing a voltage on the respective column signal output end with the threshold voltage; and
a crystal position recognizing module coupled to each of the row signal comparing modules and each of the column signal comparing modules and configured to recognize a position of a crystal hit by a photon according to row comparison results outputted by the row signal comparing modules and column comparison results outputted by the column signal comparing modules.