US 9,810,553 B2
Measurement system
Yan Bondar, Waldkirch (DE)
Assigned to TDK-Micronas GmbH, Freiburg (DE)
Filed by Micronas GmbH, Freiburg (DE)
Filed on Dec. 15, 2014, as Appl. No. 14/570,645.
Claims priority of application No. 10 2013 020 578 (DE), filed on Dec. 13, 2013.
Prior Publication US 2015/0168124 A1, Jun. 18, 2015
Int. Cl. G01R 33/07 (2006.01); G01D 5/244 (2006.01); G01D 5/14 (2006.01)
CPC G01D 5/24438 (2013.01) [G01D 5/147 (2013.01)] 15 Claims
OG exemplary drawing
 
1. A measurement system comprising:
a first magnetic field sensor; and
a magnet for generating a magnetic field, the magnet having a first pole face extending over a first plane and a second pole face extending over a second plane,
wherein the first plane is parallel to the second plane,
wherein an axis of rotation is substantially perpendicular to the first pole face and substantially perpendicular to the second pole face,
wherein the magnet is supported for rotation about the axis of rotation,
wherein the first magnetic field sensor is arranged facing the first pole face and at a distance from the axis of rotation, and
wherein the magnet has a asymmetry of the flux density about the axis of rotation in a region of the first pole face so that the flux density of the magnet in the first magnetic field sensor is adjustable between a maximum and a minimum by rotation of the magnet about the axis of rotation.