Manual of U.S. Patent Classification
as of June 30, 2000

Class
702
DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

Class definitions may be accessed by clicking on the class title, above.
Subclass definitions may be accessed by clicking on the subclass number, below.

Patents classified in a subclass may be accessed by clicking on the " " icon following the subclass number, below.

( please note that links to definitions and classified patents may not be available for some classes and subclasses )

For search strategies, please refer to the Classification Index Explanation of Data web page.

Subclass		Title
ClassTitle		===> DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING
1		MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT
2		. Earth science
3		. . Weather
4		. . . Lightning
5		. . Topography (e.g., land mapping)
6		. . Well logging or borehole study
7		. . . By induction or resistivity logging tool
8		. . . By radiation (e.g., nuclear, gamma, X-ray)
9		. . . Drilling
10		. . . Dipmeter
11		. . . Formation characteristic
12		. . . . Fluid flow investigation
13		. . . . . Hydrocarbon prospecting
14		. . Seismology
15		. . . Earthquake or volcanic activity
16		. . . Specific display system (e.g., mapping, profiling)
17		. . . Filtering or noise reduction/removal
18		. . . Velocity of seismic wave
19		. Biological or biochemical
20		. . Gene sequence determination
21		. . Cell count or shape or size analysis (e.g., blood cell)
22		. Chemical analysis
23		. . Quantitative determination (e.g., mass, concentration, density)
24		. . . Gaseous mixture (e.g., solid-gas, liquid-gas, gas-gas)
25		. . . Liquid mixture (e.g., solid-liquid, liquid-liquid)
26		. . . By particle count
27		. . Molecular structure or composition determination
28		. . . Using radiant energy
29		. . Particle size determination
30		. . Chemical property analysis
31		. . Specific operation control system
32		. . Specific signal data processing
33		. Mechanical measurement system
34		. . Wear or deterioration evaluation
35		. . Flaw or defect detection
36		. . . Location
38		. . . Electromagnetic (e.g., eddy current)
39		. . . Sound energy (e.g., ultrasonic)
40		. . . Radiant energy (e.g., X-ray, infrared, laser)
41		. . Force or torque measurement
42		. . . Stress or strain measurement
43		. . . . Torsional, shear, tensile, or compression
44		. . . Mechanical work or power measurement
45		. . Flow metering
46		. . . Count or pulse
47		. . . Pressure, resistive, or capacitive sensor
48		. . . Acoustic
49		. . . Radiant energy
50		. . Fluid measurement (e.g., mass, pressure, viscosity)
51		. . . Leak detecting
52		. . . Capacitive sensor
53		. . . Resistive sensor
54		. . . Acoustic or vibration sensor
55		. . . Liquid level or volume determination
56		. . Vibration detection
57		. Electrical signal parameter measurement system
58		. . For electrical fault detection
59		. . . Fault location
60		. . Power parameter
61		. . . Power logging (e.g., metering)
62		. . . . Including communication means
63		. . . Battery monitoring
64		. . Voltage or current
65		. . . Including related electrical parameter
66		. . Waveform analysis
67		. . . Display of waveform
68		. . . . Having specified user interface (e.g., marker, menu)
69		. . . Signal quality (e.g., timing jitter, distortion, signal-to-noise ratio)
70		. . . Waveform extraction
71		. . . Waveform-to-waveform comparison
72		. . . . Phase comparison
73		. . . . Identification of waveform
74		. . . . Signal-in-signal determination
75		. . . Frequency
76		. . . . Frequency spectrum
77		. . . . . Using Fourier method
78		. . . . By count (e.g., pulse)
79		. . Time-related parameter (e.g., pulse-width, period, delay, etc.)
80		. . Specified memory location generation for storage
81		. Quality evaluation
82		. . Having judging means (e.g., accept/reject)
83		. . Sampling Inspection Plan
84		. . Quality control
85		CALIBRATION OR CORRECTION SYSTEM
86		. Linearization of measurement
87		. Zeroing (e.g., null)
88		. Zero-full scaling
89		. Timing (e.g., delay, synchronization)
90		. Error due to component compatibility
91		. . Having interchangeable sensors or probes
92		. Direction (e.g., compass)
93		. . By another sensor
94		. Position measurement
95		. . Coordinate positioning
96		. Speed
97		. Length, distance, or thickness
98		. Pressure
99		. Temperature
100		. Fluid or fluid flow measurement
101		. Weight
102		. . Tare weight adjusted
103		. Acoustic
104		. Sensor or transducer
105		. For mechanical system
106		. Signal frequency or phase correction
107		. Circuit tuning (e.g., potentiometer, amplifier)
108		TESTING SYSTEM
109		. For transfer function determination
110		. . Binary signal stimulus (e.g., pulse)
111		. . Noise signal stimulus (e.g., white noise)
112		. . Sinusoidal signal stimulus
113		. Of mechanical system
114		. . Pneumatic or hydraulic system
115		. . Electromechanical or magnetic system
116		. Of sensing device
117		. Of circuit
118		. . Testing multiple circuits
119		. . Including program initialization (e.g., program loading) or code selection (e.g., program creation)
120		. . Including input/output or test mode selection means
121		. Including multiple test instruments
122		. Including specific communication means
123		. Including program set up
124		. Signal generation or waveform shaping
125		. . Timing signal
126		. . Signal conversion
127		MEASUREMENT SYSTEM
128		. Article count or size distribution
129		. . Quantitative determination by weight
130		. Temperature measuring system
131		. . Body temperature
132		. . Thermal protection
133		. . By resistive means
134		. . By radiant energy
135		. . . Infrared
136		. . Thermal related property
137		. Density
138		. Pressure
139		. . Exerted on or by a living body
140		. . Within an enclosure
141		. Accelerometer
142		. Speed
143		. . By radar or sonar
144		. . Of aircraft
145		. . Rotational speed
146		. . . Averaging performed
147		. . . Specific mathematical operation performed
148		. . . . For wheel speed
149		. . By distance and time measurement
150		. Orientation or position
151		. . Angular position
152		. . 3D position
153		. . . 3D orientation
154		. . Inclinometer
155		. Dimensional determination
156		. . Area or volume
157		. . Radius or diameter
158		. . Linear distance or length
159		. . . By reflected signal (e.g., ultrasonic, light, laser)
160		. . . Pedometer
161		. . . Electronic ruler
162		. . . Micrometer
163		. . . By rotary encoding means
164		. . . . Electronic tape measure
165		. . . . Odometer
166		. . Height or depth
167		. . Contouring
168		. . . By probe (e.g., contact)
169		. . . Center of gravity
170		. . Thickness or width
171		. . . By ultrasonic
172		. . . By radiant energy (e.g., X-ray, light)
173		. Weight
174		. . Payload
175		. . Of moving article
176		. Time duration or rate
177		. . Due time monitoring (e.g., medication clock, maintenance interval)
178		. . Timekeeping (e.g., clock, calendar, stopwatch)
179		. Statistical measurement
180		. . Histogram distribution
181		. . Probability determination
182		. Performance or efficiency evaluation
183		. . Diagnostic analysis
184		. . . Maintenance
185		. . . Cause or fault identification
186		. . Computer and peripheral benchmarking
187		. History logging or time stamping
188		. Remote supervisory monitoring
189		. Measured signal processing
190		. . Signal extraction or separation (e.g., filtering)
191		. . . For noise removal or suppression
193		. . . . By threshold comparison
194		. . . . By mathematical attenuation (e.g., weighting, averaging)
195		. . . . . Subtracting noise component
196		. . . Using matrix operation
197		. . . . Having multiple filtering stages
198		. . Measurement conversion processing (e.g., true-to-RMS value)
199		. . Averaging
		*********************************
		FOREIGN ART COLLECTIONS
		*********************************
		Any foreign patents or non-patent literature from subclasses that have been reclassified have been transferred directly to FOR Collection listed below. These collections contain ONLY foreign patents or nonpatent literature. The parenthetical references in the Collection titles refer to the abolished subclasses from which these Collections were derived.
		APPLICATIONS (364/400)
FOR 100		. Earth sciences (e.g., weather) (364/420)
FOR 101		. . Seismology (364/421)
FOR 102		. . Well logging (364/422)
FOR 103		. Electrical/electronic engineering (364/480)
FOR 104		. . Measuring or testing (364/481)
FOR 105		. . . Impedance (364/482)
FOR 106		. . . Voltage, current, or power (364/483)
FOR 107		. . . Frequency (364/484)
FOR 108		. . . . Frequency spectrum (364/485)
FOR 109		. . . Pulse (364/486)
FOR 110		. . . Waveform (364/487)
		. Electrical/electronic engineering (364/480)
FOR 111		. . Power generation or distribution (364/492)
FOR 112		. . . Economic dispatching (364/493)
FOR 113		. . . Turbine or generator control (364/494)
FOR 114		. . . With model (364/495)
FOR 115		. Chemical and engineering sciences (364/496)
FOR 116		. . Chemical analysis (364/497)
FOR 117		. . . Spectrum analysis (composition) (364/498)
FOR 118		. . . Chemical property (364/499)
FOR 119		. . Chemical process control (364/500)
FOR 120		. . . Distillation (364/501)
FOR 121		. . . Physical mixing or separation (364/502)
FOR 122		. . . Kilns (364/503)
FOR 123		. . Mechanical and civil engineering (364/505)
FOR 124		. . . Measuring or testing (364/506)
FOR 125		. . . . Flaw or defect (364/507)
FOR 126		. . . . Stress, strain, or vibration (364/508)
FOR 127		. . . . Fluid (364/509)
FOR 128		. . . . . Fluid flow (364/510)
FOR 129		. . . . Power (364/511)
FOR 130		. Physics (364/524)
FOR 131		. . Optics or photography (364/525)
FOR 132		. . . Color analysis (364/526)
FOR 133		. . Atomic or nuclear physics (364/527)
FOR 134		MEASURING, TESTING, OR MONITORING (364/550)
FOR 135		. Measuring and evaluating (e.g., performance) (364/551.01)
FOR 136		. . Of machine tool (364/551.02)
FOR 137		. . Quality control determinations (364/552)
FOR 138		. . Transfer function evaluation (364/553)
FOR 139		. . Statistical data (e.g., stochastic variable) (364/554)
FOR 140		. . Particle count, distribution, size (364/555)
FOR 141		. For basic measurements (364/556)
FOR 142		. . Temperature (364/557)
FOR 143		. . Pressure or density (364/558)
FOR 144		. . Orientation (364/559)
FOR 145		. . Dimension (364/560)
FOR 146		. . . Distance (364/561)
FOR 147		. . . . Length or height (364/562)
FOR 148		. . . . Width or thickness (364/563)
FOR 149		. . . Area or volume (364/564)
FOR 150		. . Rate of change of dimension (e.g., speed) (364/565)
FOR 151		. . Acceleration and further derivatives (364/566)
FOR 152		. . Weight (364/567)
FOR 153		. . . Basis weight (364/568)
FOR 154		. . Time or time intervals (364/569)
FOR 155		. Operations performed (364/570)
FOR 156		. . Calibration or compensation
FOR 157		. . . Having mathematical operation on initial measurement data (364/571.02)
FOR 158		. . . . Including environmental factors (e.g., temperature) (364/571.03)
FOR 159		. . . . Including predetermined stored data (364/571.04)
FOR 160		. . . . Using difference involving initial measurement data (364/571.05)
FOR 161		. . . . Using analog calculating elements (364/571.06)
FOR 162		. . . By table look-up (364/571.07)
FOR 163		. . . Using operator provided data (364/571.08)
FOR 164		. . Filtering (364/572)
FOR 165		. . Linearization (364/573)
FOR 166		. . Noise reduction (364/574)
FOR 167		. . Averaging (364/575)
FOR 168		. . Fourier analysis (364/576)
FOR 169		. . Interpolation/extrapolation (364/577)
FOR 170		. . With control of testing or measuring apparatus (364/579)
FOR 171		. . Programmed testing conditions (364/580)
FOR 172		. . Weighting (364/581)
FOR 173		. . Normalization (364/582)

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Last Modified: 6 October 2000