Mark your calendars and join us as the Patent Quality Forum Series makes its first stop in Washington, DC on Thursday, November 3, from 4:30 -7:30 p.m. ET. This Forum is hosted by senior USPTO executives and includes presentations focused on the latest achievements of the Enhanced Patent Quality Initiative (EPQI). Also, hear about patent quality programs that you can participate in today and share your ideas on how we can enhance patent quality in the future.
Agenda Topics
- Update on Patent Quality
- Clarity of the Record
- Post-Prosecution Pilot (P3)
- Post Grant Outcomes Pilot
- Measuring Patent Quality
- Panel Discussion
Speakers
Drew Hirshfeld, Commissioner for Patents
Valencia Martin Wallace, Deputy Commissioner for Patent Quality
Greg Vidovich, Associate Commissioner for Patent Quality
Jack Harvey, Assistant Deputy Commissioner for Patent Operations
Robin Evans, Director of Technology Center 2800
Daniel Sullivan, Director of Technology Center 1600
Bryan Nese, Senior Associate, Mayer Brown LLP and Co-Chair of the Patent Committee, DC Bar P Section Steering Committee
Jason, Harrier, Principal, Kacvinsky Daisak Bluni PLLC
Daniel Shanley, Partner, Andrews Kurth Kenyon
The event is open to the public with limited space. Please register (link is external) here to attend in person or online via Webcast. For inquiries about this event, please email WorldClassPatentQuality@uspto.gov.
More information on how the USPTO is enhancing quality throughout the patent process is available at EPQI.