Independent Study of the Burden of Patent-Related Paperwork
The USPTO retained ICF International (ICF) to perform an independent study of the burden of patent-related paperwork, beginning with a report describing the methodologies for performing such a study (Methodology Report). ICF has now provided the USPTO with its Methodology Report, in which ICF recommends methodologies for addressing various topics about estimating the patent-related burdens imposed on the public as reflected in information collection requests under the Paperwork Reduction Act of 1995 (PRA). The USPTO invited public comment on ICF’s Methodology Report.
ICF's Methodology Report
Public Comment on ICF's Methodology Report
On or prior to April 12, 2010, the organization listed below has submitted comments in response to Request for Comments on Methodology for Conducting an Independent Study of the Burden of Patent-Related Paperwork, which was published in the Federal Register at 75 Fed. Reg. 8649 (February 25, 2010).
It is hoped that the public will review the below list of comments submitted on or prior to April 12, 2010, to determine if it is complete. If any person or organization has submitted comments on or prior to April 12, 2010, but it is not included in this listing, please submit the comment by electronic mail message to firstname.lastname@example.org, or contact Raul Tamayo by telephone at (571) 272-7728.
Please note that the following document is posted as originally received but may contain artifacts of scanning, OCR, or document format conversion.
A. Organizations and Government Agencies
- Regulatory Checkbook [PDF]
B. Corporations and Associations
C. Law Firms
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Federal Register Notice
The Request for Comments on Methodology for Conducting an Independent Study of the Burden of Patent-Related Paperwork notice was signed February 19, 2010, and published on February 25, 2010, at 75 Fed. Reg. 8649 [PDF].
For further information contact Raul Tamayo, Legal Advisor, Office of Patent Legal Administration, Office of the Associate Commissioner for Patent Examination Policy, at (571) 272-7728.