Patent Quality Community Symposium

Empowering innovation through enhanced quality
Wednesday, April 27, 2016
Hosted at USPTO Headquarters in Alexandria, VA and in our regional offices:

Midwest Regional Office (Detroit)
Texas Regional Office (Dallas) 
Rocky Mountain Regional Office (Denver) 
West Coast Regional Office (San Jose)

► View a Recording of the event 
View Presentation Slides


We hosted this Patent Quality Community Symposium to update the public on the status of our quality programs, to introduce some developing programs, collect your feedback and to continue the discussion from a stakeholder’s perspective on what patent applicants and their representatives can do to advance quality.  

For inquiries about the event, please email WorldClassPatentQuality@uspto.gov


Agenda in Alexandria

Q&A was conducted after each agenda segment to collect participant feedback 

Time (ET) Topic Speakers
9:00-9:10

Welcome

Valencia Martin Wallace, Deputy Commissioner for Patent Quality

9:10-9:20

Opening Remarks
Before and After: How Is Enhanced Patent Quality Making a Difference

Michelle Lee, Under Secretary of Commerce for Intellectual Property and Director of the USPTO

9:20-10:00

Search & Training Enhancements
Highlights include: Global Dossier and Clarity of the Record Training

  • Maria Holtmann, Director of International Programs
  • Don Hajec, Assistant Deputy Commissioner for Patent Operations
10:00-10:30

Prosecution Enhancements
Highlights include:  Clarity of the Record Pilot

Robin Evans, Director, Technology Center 2800

10:30-10:45 MORNING BREAK  
10:45-11:05

Post-examination Enhancements
Highlights include:  Post Grant Outcomes

Jack Harvey, Acting Assistant Deputy Commissioner for Patent Operations

11:05-11:45

Improving Evaluation of Examination
Highlights include:  Topic Submission for Case Studies and Big Data

  • Brian Hanlon, Director of the Office of Patent Legal Administration
  • Russ Slifer, Deputy Under Secretary of Commerce for Intellectual Property and Deputy Director of the USPTO
11:45-12:45

LUNCH BREAK (on your own)

 
12:45-1:00

Quality Metrics
Improving Patent Quality Measurement

Marty Rater, Chief Statistician, Office of Patent Quality Assurance

1:00-2:00

Master Review Form (MRF) Hands-On Workshop
Reviewing for Correctness, Clarity, and Consistency

 

  • Sandie Spyrou, Supervisory Review Quality Assurance Specialist
  • Kathleen Bragdon, Senior Advisor to the Deputy Commissioner for Patent Quality
2:00-3:00

MRF Report Out
From the workshop

3:00-3:15

AFTERNOON BREAK

 
3:15-4:15

Panel Discussion
How Applicants Can File and Prosecute a Quality Application

  • Russ Slifer, Deputy Under Secretary of Commerce for Intellectual Property and Deputy Director of the USPTO
  • Rick Nydegger, Workman Nydegger
  • Kevin Noonan, MBHB
  • Bill Bunker, Knobbe Martens
  • Laura Sheridan, Google
  • Tim Wilson, SAS
4:15-4:50

Q&A with Panel

Moderated by Russ Slifer, Deputy Under Secretary and Deputy Director

4:50-5:00

Closing Remarks
USPTO's Commitment to Quality

Drew Hirshfeld, Commissioner for Patents

BIOGRAPHIES


Patent Quality Community Symposium Resources