PATENTS   
Patents > Guidance, Tools, and Manuals > Search Templates > Search Templates By Class > Search Templates Class 356 > Subclass 141.100 - 141.500
Search Templates Class 356/141.100 - 141.500    

Search Templates:


Search Templates Home
Search Templates Updates
Search Templates by Class
Commissioner for Patents

OPTICS: MEASURING AND TESTING

Classification 356/141.100 - 141.500 >> view this class definition


U. S. PATENT RESOURCES

As general guidance, a complete search of U. S. patents in this art area will include the following:

  1. A classified search of the original classification class and subclass for the subject matter and the other highly relevant art areas in the US patent documents
  2. A text search of the US patent documents; patents, PG PUB, and OCR databases:
    • Broad text search for the general inventive concept(s), not limited by classification
    • Narrow text search for the specific claimed invention
    • Boolean text search employing the relevant inventive terms

The resources listed below are internal USPTO search tools. However, the information that they cover is available either commercially, on the USPTO web site, or in the Public Search Facility on the USPTO Headquarters campus and the Patent and Trademark Depository Libraries.

EAST/WEST
EAST Coverage: 1971 - present, Full Text: 1971 - present
WEST Coverage: 1971 - present, Full Text: 1971 - present
Full text patent and inventor searching.

Text search is followed by a classification search. If case is complex, for example involving filters and processing, search the novelty. Forward and backward citation searching is useful for this class.
BRS Search/USOCR Database
EAST Coverage: 1920 - 1970, Full Text: 1920 - 1970
WEST Coverage: 1920 - 1970, Full Text: 1920 - 1970
Full text of U.S. patent grants.

Text search is followed by a classification search. If case is complex, for example involving filters and processing, search the novelty.
PGPUBS
EAST Coverage: 2001 - present, Full Text: 2001 - present
WEST Coverage: 2001 - present, Full Text: 2001 - present
U.S. published applications.

Text search is followed by a classification search. If case is complex, for example involving filters and processing, search the novelty.

FOREIGN PATENT RESOURCES

Searched separately from the U.S. Patent Search. These databases consist of abstract documents. Text searching abstracts requires the use of different search logic e.g. the use of broad Boolean and/or operators instead of narrow proximity operators.

Derwent World Patents Index and the contents of the EPO Abstracts and JPO Abstracts are available commercially.

Derwent World Patents Index, Classification and Text Search
EAST Coverage: 1963 - present, Full Text: - N/A
WEST Coverage: 1963 - present, Full Text: - N/A
English abstracts database of patent documents from more than 40 patent-issuing authorities.

Used for text searching.
EPO Abstracts, Text and Classification Search
EAST Coverage: 1978 - present, Full Text: - N/A
WEST Coverage: 1978 - present, Full Text: - N/A
English abstracts database of patents and published applications from EPO, WO/PCT, United Kingdom, France, Germany, and Switzerland. USPC searching is limited to documents added to the database from 1978 to September 30, 1995.

Used for text searching.
JPO Abstracts, Text and Classification Search
EAST Coverage: 1976 - present, Full Text: - N/A
WEST Coverage: 1976 - present, Full Text: - N/A
English abstracts database of Japanese published unexamined applications. USPC searching is limited to documents added to the database from 1978 to September 30, 1995.

Used for text searching.

NON-PATENT LITERATURE RESOURCES

The resources listed are those that USPTO staff have found consistently yield the most relevant search results. Commercial databases available through a single vendor can generally be searched simultaneously, although it is preferable to search full text and bibliographic databases in separate groupings. In addition to the use of subscription databases and public Internet sites, it is recommended that books, manuals, standards and specifications be considered in the search for prior art.

ACM Digital Library
ACM Coverage: Dates - vary, Full Text: Dates - vary
Citations and full text articles from ACM journals, newsletters, and conference proceedings.

CSA Technology Research Database (TRD)
Dialog Coverage: 1963 - present, Full Text: - N/A
Megafile of the technical bibliographic databases provided by Cambridge Scientific Abstracts.

Indexes and abstracts the literature of materials science, including metals contains journal articles, conference papers, technical reports, books, monographs, standards, and news briefs.
Ei Compendex
Dialog Coverage: 1970 - present, Full Text: - N/A
Questel Orbit Coverage: 1970 - present, Full Text: - N/A
STN Coverage: 1970 - present, Full Text: - N/A
Abstracted information from 4,500 journals plus conference proceedings in engineering and technology.

Gale Group New Product Announcements/Plus (NPA/Plus)
Dialog Coverage: 1985 - present, Full Text: 1985 - present
Full text press releases from all industries covering announcements related to products, with a focus on new products and services.

IBM Technical Disclosure Bulletin
EAST/WEST Coverage: 1958 - 1998, Full Text: -
Defensive disclosure database.

IEEE Xplore
IEEE Coverage: 1952 - present, Full Text: 1988 - present
Full text access to technical literature in electrical engineering, computer science, and electronics.

Text search and page images of IEEE transactions, journals, magazines, and conference proceedings, and all current IEEE standards.
Inspec (The Database for Physics, Electronics and Computing)
Dialog Coverage: 1898 - present, Full Text: - N/A
Dialog DataStar Coverage: 1969 - present, Full Text: - N/A
Questel Orbit Coverage: 1969 - present, Full Text: - N/A
STN Coverage: 1969 - present, Full Text: - N/A
Inspec (The Database for Physics, Electronics and Computing) corresponds to the three Science Abstracts print publications: Physics Abstracts, Electrical and Electronics Abstracts, and Computer and Control Abstracts.

IP.com
IP.com Coverage: 1958 - present, Full Text: 1958 - present
Prior art database.

JICST-EPlus - Japanese Science & Technology
Dialog Coverage: 1985 - present, Full Text: - N/A
STN Coverage: 1985 - present, Full Text: - N/A
English citations and abstracts covering the literature published in Japan on all fields of science, technology, and medicine.

Index to Japanese scientific and technical journals, conferences, and reports, with English citations and abstracts.
Knovel
Knovel Coverage: Dates - vary, Full Text: Dates - vary
Science and engineering books and databases.

Full text engineering and scientific reference books with interactive tables and graphs. Titles include Mark's Standard Handbook for Mechanical Engineers. This resource may be useful in those cases when a material is claimed.
NTIS: National Technical Information Service
Dialog Coverage: 1964 - present, Full Text: - N/A
STN Coverage: 1964 - present, Full Text: - N/A
U.S. government-sponsored research, development, and engineering reports.

PASCAL
Dialog Coverage: 1973 - present, Full Text: - N/A
Questel Orbit Coverage: 1967 - present, Full Text: - N/A
STN Coverage: 1977 - present, Full Text: - N/A
Multidisplinary, multilingual bibliographic database covering the major international literature in science, technology, and medicine.

Produced by the French National Research Council. Index to scientific and technical literature. Each citation includes the original title and usually French- and English-translated titles and indexing terms. Most abstracts are in French.
ProQuest Direct
ProQuest Coverage: Dates - vary, Full Text: 1986 - present
Current periodicals and newspapers, as well as archives of major newspapers.

ScienceDirect®
Elsevier B.V. Coverage: Dates - vary, Full Text: Dates - vary
Full text collection and abstracts database.

SciSearch: A Cited Reference Science Database
Dialog Coverage: 1990 - present, Full Text: - N/A
STN Coverage: 1974 - present, Full Text: - N/A
Cited reference index.

Cited reference index to the literature of science, technology, biomedicine and related disciplines.
SPIE - The International Society for Optical Engineering
SPIE Coverage: - N/A, Full Text: - N/A
Society for the exchange, collection and dissemination of knowledge in optics, photonics and imaging.

xreferplus
xrefer Coverage: - , Full Text: Dates - vary
Online reference collection from over 50 publishers.

Provides definitions, synonyms, and background information.

INTERNET SEARCH TOOLS

An Internet search should be considered when a search of the resources listed above fails to locate relevant prior art. A preliminary Internet search may be performed to obtain an overview of the technology, and to identify additional search terms and related product information.

No resources identified
Coverage: - , Full Text: -




Public Comments on the Search Templates

Public comments on the search templates are invited. Comments should address the points enumerated in the Criteria for Evaluating Recommended Search Resources. Comments can be submitted via the Search Template Project e-mail link on each template page or by mail addressed to:

Mail Stop Patents Search Template Comments
Commissioner for Patents
P.O. Box 1450
Alexandria, VA 22313-1450
Electronic submission is preferred. The Office will respond to comments in writing.

Submit general comments and suggestions to Search Template Project
KEY: e Biz=online business system fees=fees forms=formshelp=help laws and regs=laws/regulations definition=definition (glossary)

The Inventors Assistance Center is available to help you on patent matters. Send questions about USPTO programs and services to the USPTO Contact Center (UCC). You can suggest USPTO webpages or material you would like featured on this section by E-mail to the webmaster@uspto.gov. While we cannot promise to accommodate all requests, your suggestions will be considered and may lead to other improvements on the website.


|.HOME | SITE INDEX| SEARCH | eBUSINESS | HELP | PRIVACY POLICY