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Classification 323/all - subclasses >> view this class definition


U. S. PATENT RESOURCES

As general guidance, a complete search of U. S. patents in this art area will include the following:

  1. A classified search of the original classification class and subclass for the subject matter and the other highly relevant art areas in the US patent documents
  2. A text search of the US patent documents; patents, PG PUB, and OCR databases:
    • Broad text search for the general inventive concept(s), not limited by classification
    • Narrow text search for the specific claimed invention
    • Boolean text search employing the relevant inventive terms

The resources listed below are internal USPTO search tools. However, the information that they cover is available either commercially, on the USPTO web site, or in the Public Search Facility on the USPTO Headquarters campus and the Patent and Trademark Depository Libraries.

EAST/WEST
EAST Coverage: 1971 - present, Full Text: 1971 - present
WEST Coverage: 1971 - present, Full Text: 1971 - present
Full text patent and inventor searching.

This resource can be used for class/subclass, text, inventor, and assignee searching. Queries may include classification parameters combined with other terms. This resource frequently provides highly relevant information from US patents.
PGPUBS
EAST Coverage: 2001 - present, Full Text: 2001 - present
WEST Coverage: 2001 - present, Full Text: 2001 - present
U.S. published applications.

This resource can be used for class/subclass, text, inventor, and assignee searching. Queries may include classification parameters combined with other terms. This resource frequently provides highly relevant information from published US applications.

FOREIGN PATENT RESOURCES

Searched separately from the U.S. Patent Search. These databases consist of abstract documents. Text searching abstracts requires the use of different search logic e.g. the use of broad Boolean and/or operators instead of narrow proximity operators.

Derwent World Patents Index and the contents of the EPO Abstracts and JPO Abstracts are available commercially.

Derwent World Patents Index, Classification and Text Search
EAST Coverage: 1963 - present, Full Text: - N/A
WEST Coverage: 1963 - present, Full Text: - N/A
English abstracts database of patent documents from more than 40 patent-issuing authorities.

DWPI can be used for text, IPC, Derwent Manual Code, and assignee/inventor searching. This resource provides relevant information on US and foreign patents and published applications.
EPO Abstracts, Text and Classification Search
EAST Coverage: 1978 - present, Full Text: - N/A
WEST Coverage: 1978 - present, Full Text: - N/A
English abstracts database of patents and published applications from EPO, WO/PCT, United Kingdom, France, Germany, and Switzerland. USPC searching is limited to documents added to the database from 1978 to September 30, 1995.

This database can be used for text, IPC, ECLA, USPC, and assignee/inventor searching. Queries may include classification parameters combined with other terms to be searched. This resource provides relevant information on foreign patents and published applications.
JPO Abstracts, Text and Classification Search
EAST Coverage: 1976 - present, Full Text: - N/A
WEST Coverage: 1976 - present, Full Text: - N/A
English abstracts database of Japanese published unexamined applications. USPC searching is limited to documents added to the database from 1978 to September 30, 1995.

This database can be used for text, IPC, and assignee/inventor searching. Queries may include classification parameters combined with other terms to be searched. This resource provides relevant information on JPO published unexamined applications.

NON-PATENT LITERATURE RESOURCES

The resources listed are those that USPTO staff have found consistently yield the most relevant search results. Commercial databases available through a single vendor can generally be searched simultaneously, although it is preferable to search full text and bibliographic databases in separate groupings. In addition to the use of subscription databases and public Internet sites, it is recommended that books, manuals, standards and specifications be considered in the search for prior art.

CSA Technology Research Database (TRD)
Dialog Coverage: 1963 - present, Full Text: - N/A
Megafile of the technical bibliographic databases provided by Cambridge Scientific Abstracts.

This resource is a combined database of 17 of the technical bibliographic-abstract databases provided by Cambridge Scientific. This resource may provide information on literature involving this art.
DIALINDEX
Dialog Coverage: - Current, Full Text: - Current
Master index to DIALOG databases.

This database can be text-searched to determine which databases contain references to technology being searched. Databases with the most references are selected for a more detailed search. This resource may provide information on relevant Dialog databases to search.
Ei Compendex
Dialog Coverage: 1970 - present, Full Text: - N/A
Questel Orbit Coverage: 1970 - present, Full Text: - N/A
STN Coverage: 1970 - present, Full Text: - N/A
Abstracted information from 4,500 journals plus conference proceedings in engineering and technology.

This resource may provide information on literature involving this art.
IBM Technical Disclosure Bulletin
EAST/WEST Coverage: 1958 - 1998, Full Text: -
Defensive disclosure database.

This resource may provide information on literature involving this art.
IEEE Xplore
IEEE Coverage: 1952 - present, Full Text: 1988 - present
Full text access to technical literature in electrical engineering, computer science, and electronics.

This resource may provide information on literature involving this art.
Inspec (The Database for Physics, Electronics and Computing)
Dialog Coverage: 1898 - present, Full Text: - N/A
Dialog DataStar Coverage: 1969 - present, Full Text: - N/A
Questel Orbit Coverage: 1969 - present, Full Text: - N/A
STN Coverage: 1969 - present, Full Text: - N/A
Inspec (The Database for Physics, Electronics and Computing) corresponds to the three Science Abstracts print publications: Physics Abstracts, Electrical and Electronics Abstracts, and Computer and Control Abstracts.

This resource may provide information on literature involving this art.
IP.com
IP.com Coverage: 1958 - present, Full Text: 1958 - present
Prior art database.

Electronic source of IBM TDBs with coverage from 1958 to the present. This resource may provide information on literature involving this art.
JICST-EPlus - Japanese Science & Technology
Dialog Coverage: 1985 - present, Full Text: - N/A
STN Coverage: 1985 - present, Full Text: - N/A
English citations and abstracts covering the literature published in Japan on all fields of science, technology, and medicine.

This resource may provide information on the Japanese technical literature in this art.
STNindex
STN Coverage: - Current, Full Text: - Current
Master index to STN databases.

This database can be text-searched to determine which databases contain references to technology being searched. Databases with the most references are selected for a more detailed search. This resource may provide information on relevant STN databases to search.

INTERNET SEARCH TOOLS

An Internet search should be considered when a search of the resources listed above fails to locate relevant prior art. A preliminary Internet search may be performed to obtain an overview of the technology, and to identify additional search terms and related product information.

Google TM
Google Coverage: - N/A, Full Text: - N/A
Internet search engine.

This resource may provide information on broad topics, products, specific companies, devices, individuals, materials, and properties.
Scirus
Elsevier Coverage: - N/A, Full Text: - N/A
Science-specific search engine.

This resource may provide information on broad topics, products, specific companies, devices, individuals, materials, and properties.
Yahoo!
Yahoo! Inc. Coverage: - N/A, Full Text: - N/A
Internet search engine.

This resource may provide information on broad topics, products, specific companies, devices, individuals, materials, and properties.


Public Comments on the Search Templates

Public comments on the search templates are invited. Comments should address the points enumerated in the Criteria for Evaluating Recommended Search Resources. Comments can be submitted via the Search Template Project e-mail link on each template page or by mail addressed to:

Mail Stop Patents Search Template Comments
Commissioner for Patents
P.O. Box 1450
Alexandria, VA 22313-1450
Electronic submission is preferred. The Office will respond to comments in writing.

Submit general comments and suggestions to Search Template Project
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