US D583,334 S
Test switch
Roy Ball, Coral Springs, Fla. (US); Timothy F. Masters, Boca Raton, Fla. (US); Patrick Hugh, Margate, Fla. (US); Richard Lindo, Lauderhill, Fla. (US); and Todd Gentile, Tamarac, Fla. (US)
Assigned to ABB Technology AG, Zurich (Switzerland)
Filed on Jul. 24, 2006, as Appl. No. 29/263,484.
Term of patent 14 Years
LOC (8) Cl. 13 - 03
U.S. Cl. D13—169
OG exemplary drawing
 
We claim the ornamental design for a test switch, as shown and described.