a) providing a model description of the electronic device, the model description defining a victim net and at least one aggressor net capacitively coupled to the victim net, wherein the model description is configured for use in a simulation of the dynamic response behaviour at an output of the victim net with respect to an input signal of the victim net and/or of the at least one aggressor net, wherein the model description corresponds to a transistor-level description of the electronic device;

b) representing a characteristic property of the dynamic response behaviour as an output function of the simulation, the output function having a value depending on at least two input parameters of the simulation, wherein the input parameters comprise a timing of a transition of the input signal of the at least one aggressor net relative to a timing of a transition of the input signal of the victim net, and wherein the output function represents (i) a measure of noise induced in the output signal of the victim net, (ii) a measure of delay of the output signal of the victim net with respect to the input signal of the victim net, or (iii) a measure of the transition time of a signal transition observed at the output of the victim net; and

c) evaluating the output function so as to find an extremum of the output function in a preset range of the input parameters.