| US 7,466,796 B2 | ||
| Condenser zone plate illumination for point X-ray sources | ||
| Scott H. Bloom, Encinitas, Calif. (US) | ||
| Assigned to Gatan, Inc., Warrendale, Pa. (US) | ||
| Filed on Aug. 05, 2005, as Appl. No. 11/161,509. | ||
| Claims priority of provisional application 60/599203, filed on Aug. 05, 2004. | ||
| Prior Publication US 2006/0049355 A1, Mar. 09, 2006 | ||
| Int. Cl. G02B 21/06 (2006.01) | ||
| U.S. Cl. 378—43 [378/70] | 18 Claims |
| 1. A short wavelength compound microscope device comprising:
a condenser zone plate operable to receive short wavelength radiation from a point source and focus the short wavelength radiation
onto a specimen sample;
wherein the sample aligned with an order of diffraction of the condenser zone plate that is greater than one;
and an objective zone plate operable to receive short wavelength radiation that has passed through the specimen sample and
focus the short wavelength radiation onto an imaging device.
|