| US 7,466,141 B2 | ||
| Phase measurement device, method, program, and recording medium | ||
| Makoto Kurosawa, Saitama (Japan); and Juichi Nakada, Gunma (Japan) | ||
| Assigned to Advantest Corporation, Tokyo (Japan) | ||
| Appl. No. 10/597,415 PCT Filed Jan. 19, 2005, PCT No. PCT/JP2005/000933 § 371(c)(1), (2), (4) Date Oct. 31, 2006, PCT Pub. No. WO2005/073738, PCT Pub. Date Aug. 11, 2005. |
||
| Claims priority of application No. 2004-023378 (JP), filed on Jan. 30, 2004. | ||
| Prior Publication US 2008/0018322 A1, Jan. 24, 2008 | ||
| This patent is subject to a terminal disclaimer. | ||
| Int. Cl. G01R 23/20 (2006.01); G01R 23/16 (2006.01) | ||
| U.S. Cl. 324—622 [324/76.21] | 19 Claims |
| 1. A phase measurement device that measures an output from a circuit to be measured upon feeding an input signal having at
least two input frequency components to the circuit to be measured, comprising:
a phase acquisition section that acquires phases of the input frequency components and a distortion component based upon a
local frequency;
a match time measurer that measures a match time at which the phases of the input frequency components match each other based
upon an acquired result of said phase acquisition section; and
a distortion component phase measurer that measures a phase of the distortion component at the match time based upon an acquired
result of said phase acquisition section,
wherein the distortion component includes at least either of a high frequency distortion component that has a frequency higher
than the input frequency components, and a low frequency distortion component that has a frequency lower than the input frequency
components, and
said phase acquisition section acquires both or either of a highest frequency component and a lowest frequency component of
the input frequency components, and a phase of the high frequency distortion component or the low frequency distortion component.
|