LIST OF PATENTEES
TO WHOM
PATENTS WERE ISSUED ON THE 13th DAY OF December, 2011
NOTE--Arranged in accordance with the first significant character or word of the name
(in accordance with city and telephone directory practice).
N.V. Nutricia: See--
Hageman, Robert J. J.
08076282 Cl. 514-2.
Speelmans, Gelske; and Govers, Maria Johanna Adriana Petronella
08076313 Cl. 514-54.
Na, Byoung-Sun: See--
Lee, Hyeok-Jin; Kim, Hee-Seop; Na, Byoung-Sun; Gang, LuJian; Woo, Hwa-Sung; and Kwon, Ji-Hyun
08077265 Cl. 349-39.
Nabar, Rohit U.: See--
Lee, Jungwon; Nabar, Rohit U.; Choi, Jihwan P.; and Lou, Hui-Ling
08077785 Cl. 375-260.
Naccache, David; and Troumelin, Michael, to Compagnie Industrielle et Financiere d'Ingenierie “Ingenico” Payment terminal, and associated method and program
08074872 Cl. 235-379.
Naccache, David; to Compagnie Industrielle et Financiere d'Ingenierie “Ingenico” Terminal, method of checking conformity of at least one removable battery of an electronic payment terminal, and the corresponding removable battery and computer program product
08074888 Cl. 235-472.02.
Nachreiner, Michael William: See--
Waters, Eric Scott; Nachreiner, Michael William; Jacobs, Gregory F.; and Zarynow, John
08074424 Cl. 52-834.
Nachum, Youval: See--
Arad, Carmi; and Nachum, Youval
08077608 Cl. 370-229.
Arad, Carmi; and Nachum, Youval
08077610 Cl. 370-230.
Nada, Naoji; to Sony Corporation Illumination apparatus, color conversion device, and display apparatus
08075148 Cl. 362-84.
Nadjar, Hechem: See--
Laurens, Claire; Nadjar, Hechem; Rebuffatti, Anne Claire; Rodrigues, Catherine; Wang, Kathy; and Soubigou, Chantal
08076399 Cl. 524-77.
Nadler, Barry R.: See--
Noonan, Joseph S.; Nadler, Barry R.; and Insler, Julius R.
08078190 Cl. 455-456.1.
Nadolski, Timothy J.: See--
Scheller, Gregg D.; Auld, Michael D.; and Nadolski, Timothy J.
08075553 Cl. 606-13.
Nadzadi, Mark Ellsworth: See--
Otto, Jason Karl; McKinnon, Brian W.; and Nadzadi, Mark Ellsworth
08078440 Cl. 703-6.
Nag, Soumya K.: See--
Mohamadi, Farrokh; and Nag, Soumya K.
08077072 Cl. 342-22.
Nagadomi, Yasushi; Takashima, Daisaburo; and Hatsuda, Kosuke, to Kabushiki Kaisha Toshiba Semiconductor memory device with error correction
08078923 Cl. 714-706.
Nagai, Haruo: See--
Yamamoto, Masahiro; Ono, Syunsuke; Ozasa, Minoru; Ichibakase, Tsuyoshi; Seki, Tomoyuki; Tsutatani, Takashi; and Nagai, Haruo
08076852 Cl. 313-594.
Nagai, Kouichi: See--
Saigoh, Kaoru; and Nagai, Kouichi
08076780 Cl. 257-760.
Takahashi, Makoto; and Nagai, Kouichi
08076212 Cl. 438-396.
Nagai, Naoshi: See--
Mita, Naruyoshi; Chida, Mitsuaki; Kawaguchi, Masaru; Otsuka, Kengo; Nagai, Naoshi; Yamazaki, Takaaki; and Ichihashi, Tetsuya
08076478 Cl. 544-198.
Nagai, Norihiro: See--
Seki, Yasuharu; Konno, Tatsuya; and Nagai, Norihiro
08079028 Cl. 717-171.
Nagamichi, Yasuhiro: See--
Morichika, Shunji; Morita, Katsuaki; Yamaguchi, Masahiro; Katahira, Kosuke; and Nagamichi, Yasuhiro
08074577 Cl. 104-139.
Nagao, Keisuke: See--
Nomoto, Masakazu; Mochizuki, Yasushi; and Nagao, Keisuke
08077339 Cl. 358-1.16.
Nagao, Manabu; to Kabushiki Kaisha Toshiba Apparatus, method and computer program product for translating speech, and terminal that outputs translated speech
08078449 Cl. 704-8.
Nagao, Naoyuki: See--
Seki, Fujio; and Nagao, Naoyuki
08078917 Cl. 714-38.1.
Nagao, Yoshiki: See--
Matsumoto, Toshihiro; Nagao, Yoshiki; Kusakabe, Hiroki; Kawabata, Norihiko; and Arai, Kenji
08076017 Cl. 429-66.
Nagaoka, Nobuharu: See--
Watanabe, Masahito; Tsuji, Takayuki; Hattori, Hiroshi; Nagaoka, Nobuharu; Takatsudo, Izumi; and Saka, Masakazu
08077909 Cl. 382-100.
Yokochi, Yuji; Nagaoka, Nobuharu; and Taniguchi, Fuminori
08077204 Cl. 348-148.
Nagasawa, Namiko Satoh: See--
Jackson, David Peter; Nagasawa, Namiko Satoh; Sakai, Hajime; and Nagasawa, Nobuhiro
08076141 Cl. 435-468.
Nagasawa, Nobuhiro: See--
Jackson, David Peter; Nagasawa, Namiko Satoh; Sakai, Hajime; and Nagasawa, Nobuhiro
08076141 Cl. 435-468.
Nagasawa, Toshio: See--
Uno, Tomoaki; Shiraishi, Masaki; Matsuura, Nobuyoshi; and Nagasawa, Toshio
08076767 Cl. 257-686.
Nagase, Hisato: See--
Shimohara, Norihide; Nagase, Hisato; and Takahashi, Hidenori
08076392 Cl. 523-160.
Nagase, Takahiro: See--
Inagaki, Naoyuki; Mori, Tatsuya; Ohara, Osamu; and Nagase, Takahiro
08076307 Cl. 514-44A.
Nagashima, Nobuyoshi: See--
Nakagawa, Hidetoshi; Tsubata, Toshihide; Nagashima, Nobuyoshi; and Hisada, Yuhko
08077284 Cl. 349-144.
Nagashima, Syunichi: See--
Yatagai, Hiroomi; and Nagashima, Syunichi
08074971 Cl. 261-106.
Nagata, Hiroshi; and Shingaki, Yoshinori, to Ulvac, Inc. Coating method and apparatus, a permanent magnet, and manufacturing method thereof
08075954 Cl. 427-250.
Nagata, Munetake: See--
Sasaoka, Yoshimasa; Shiraishi, Ryuichi; Kawachidani, Toshio; Nakamura, Tsuyoshi; and Nagata, Munetake
08078093 Cl. 399-405.
Nagata, Tatsuki; and Kawakami, Toshihiro, to OMRON Corporation Seat control device
08078366 Cl. 701-49.
Nagato, Yoshifumi: See--
Shoda, Kazuo; Nomura, Yuki; and Nagato, Yoshifumi
08076890 Cl. 318-599.
Nagatomi, Sheila: See--
Shalaby, Shalaby W; Vaughn, Michael Aaron; Peniston, Shawn J; and Nagatomi, Sheila
08076388 Cl. 523-115.
Nagatsuka, Tetsuro: See--
Iga, Soichiro; Nagatsuka, Tetsuro; and Shinnishi, Makoto
08078988 Cl. 715-800.
Nagayama, Katsuhiro: See--
Otsuka, Masayuki; Nagayama, Katsuhiro; and Kitagawa, Takashi
08078069 Cl. 399-49.
Nagayama, Masatoshi: See--
Ichinose, Hiroaki; and Nagayama, Masatoshi
08076023 Cl. 429-163.
Nagayama, Tomohiko: See--
Yamamoto, Hideo; Hanaki, Naofumi; Teruyama, Katsuyuki; Nagayama, Tomohiko; Sueyoshi, Masahiro; and Hirano, Yoshiaki
08079078 Cl. 726-17.
Nagel, Uwe: See--
Breunig, Achim; and Nagel, Uwe
08077138 Cl. 345-102.
Nagesh, Saresh: See--
Kumar, Pramod; and Nagesh, Saresh
08074955 Cl. 248-519.
Nagle, Greg A.: See--
McKernan, Pat S.; and Nagle, Greg A.
08078315 Cl. 700-228.
Naguib, Ayman Fawzy; and Ji, Tingfang, to QUALCOMM Incorporated Signaling transmission and reception in wireless communication systems
08077596 Cl. 370-208.
Nair, Vijay K.: See--
Suh, Seong-youp; Nair, Vijay K.; and Choudhury, Debabani
08077095 Cl. 343-702.
Naitoh, Kei: See--
Saito, Takuya; Tanaka, Chiaki; Ishii, Masayuki; Watanabe, Naohiro; and Naitoh, Kei
08076051 Cl. 430-137.1.
Naitou, Hidehiro: See--
Kurihara, Norihiko; Iizaka, Hitoshi; Yamada, Yoshiya; Mihara, Hidemi; Tsuchiya, Osamu; and Naitou, Hidehiro
08074881 Cl. 235-383.
Naitou, Takahiro: See--
Tamaki, Hiroto; Naitou, Takahiro; and Murazaki, Yoshinori
08076847 Cl. 313-512.
Naitou, Takashi: See--
Sawai, Yuichi; Shiono, Osamu; Namekawa, Takashi; Naitou, Takashi; Hayashibara, Mitsuo; Kijima, Yuichi; Hirasawa, Shigemi; Asakura, Shunichi; Yamamoto, Hiroki; and Hatori, Akira
08075961 Cl. 428-1.5.
Nakada, Takayuki: See--
Morita, Shinya; Sada, Koichi; Nakada, Takayuki; and Matsuda, Tomoyuki
08076615 Cl. 219-390.
Nakagaito, Tatsuya: See--
Kaneko, Shinjiro; Matsuda, Hiroshi; Kawasaki, Yoshiyasu; Nakagaito, Tatsuya; Suzuki, Yoshitsugu; Fushiwaki, Yusuke; Kawano, Takashi; and Matsuoka, Saiji
08076008 Cl. 428-659.
Nakagaki, Yoshio; to Denso Corporation Failure-diagnosis information collection system
08078355 Cl. 701-35.
Nakagami, Taro: See--
Shimura, Masaru; Nakagami, Taro; and Ohkuri, Kazunobu
08077882 Cl. 381-102.
Nakagawa, Hidetoshi; Tsubata, Toshihide; Nagashima, Nobuyoshi; and Hisada, Yuhko, to Sharp Kabushiki Kaisha Substrate for a display device, a method for repairing the same, a method for repairing a display device and a liquid-crystal display device
08077284 Cl. 349-144.
Nakagawa, Hiroki: See--
Nakamura, Atsushi; Nakagawa, Hiroki; Nakashima, Hiromitsu; Tsuji, Takayuki; Dougauchi, Hiroshi; Kouno, Daita; and Nishimura, Yukio
08076053 Cl. 430-270.1.
Nakagawa, Katsumi: See--
Oda, Kouji; Fuchigami, Hiroyuki; Yamagata, Yusuke; Nakagawa, Katsumi; and Ohyama, Junji
08076844 Cl. 313-506.
Nakagawa, Koichi; Sugihara, Reiko; Shimizu, Tetsuo; and Takagi, Shusaku, to JFE Steel Corporation Hot-rolled high strength steel sheet having excellent ductility, and tensile fatigue properties and method for producing the same
08075711 Cl. 148-328.
Nakagawa, Masamichi: See--
Okamoto, Shusaku; Ishii, Hirofumi; Nakagawa, Masamichi; Nobori, Kunio; and Morimura, Atsushi
08077202 Cl. 348-148.
Nakagawa, Shuichi: See--
Koyama, Masahiro; Ogawa, Hironori; Shibata, Nobuo; Matsushima, Masaru; Kobayashi, Toshinori; and Nakagawa, Shuichi
08076651 Cl. 250-442.11.
Nakahara, Hiroshi: See--
West, Robert C.; Amine, Khalil; Zhang, Zhengcheng; Wang, Qingzheng; Rossi, Nicholas A. A.; Yoon, Sang Young; and Nakahara, Hiroshi
08076032 Cl. 429-313.
Nakahara, Shuichi: See--
Narita, Nobuhiko; Nakahara, Shuichi; Onoyama, Hiroyuki; Tonomura, Hironori; Nakao, Yasushi; and Matsuno, Yoshizumi
08076413 Cl. 525-72.
Nakahara, Tohru: See--
Matsuzaki, Natsume; Yokota, Kaoru; Nonaka, Masao; Inoue, Mitsuhiro; Nakahara, Tohru; and Higashi, Akio
08077980 Cl. 382-209.
Nakai, Masaki: See--
Yamamoto, Yoichi; Nonaka, Kazuhiro; and Nakai, Masaki
08076896 Cl. 318-801.
Nakajima, Akihiro: See--
Kano, Toshihiro; and Nakajima, Akihiro
08078356 Cl. 701-36.
Nakajima, Eiji: See--
Nanjo, Yuzuru; Nakajima, Eiji; Kondo, Akihiro; Ishida, Naoyuki; Gon, Syoukou; and Kasama, Kenichi
08078072 Cl. 399-67.
Nakajima, Genei; to Hitachi Metals, Ltd. Ceramic sintered compact and piezoelectric element
08075996 Cl. 428-402.
Nakajima, Hiroaki; and Ohashi, Toshikazu, to Medikit Co., Ltd. Indwelling needle assembly
08075529 Cl. 604-164.11.
Nakajima, Noriko; Taguchi, Yuichi; and Mizuno, Jun, to Hitachi, Ltd. Power-saving-backup management method
08078815 Cl. 711-162.
Nakajima, Satoshi: See--
Miyata, Yoshinao; Goto, Kazutoshi; Nakajima, Satoshi; Kori, Toshiaki; and Takahashi, Tomoaki
08075106 Cl. 347-71.
Nakajima, Takamitsu: See--
Yamaji, Takahiro; Watanabe, Masahide; Nakajima, Takamitsu; Kamata, Hiroki; and Kimura, Akira
08075324 Cl. 439-188.
Nakajo, Satoshi: See--
Muraji, Akio; Oketani, Kazunobu; Nakajo, Satoshi; Okuno, Hiromitsu; and Nakamura, Hisashi
08077188 Cl. 345-690.
Nakamae, Masato: See--
Nii, Shinsuke; Nakamae, Masato; and Tokoh, Makio
08076433 Cl. 526-304.
Nakamura, Akihiro: See--
Ohmura, Ken; Nakamura, Akihiro; Furuichi, Makoto; and Konishi, Hayato
08078077 Cl. 399-82.
Nakamura, Atsushi: See--
Lim, Kian Kiat; Nakamura, Atsushi; Tan, Kai Pheng; Lim, Eng Soon; Fu, Poh Ling; and Kamimura, Takaaki
08076186 Cl. 438-162.
Nakamura, Atsushi; Nakagawa, Hiroki; Nakashima, Hiromitsu; Tsuji, Takayuki; Dougauchi, Hiroshi; Kouno, Daita; and Nishimura, Yukio, to JSR Corporation Upper layer-forming composition and photoresist patterning method
08076053 Cl. 430-270.1.
Nakamura, Dai; to Kabushiki Kaisha Toshiba Nonvolatile semiconductor memory device
08077525 Cl. 365-185.29.
Nakamura, Daisuke: See--
Fukuoka, Yoshihito; Nakamura, Daisuke; Yamauchi, Hirotoshi; and Hasegawa, Sachiyo
08075357 Cl. 440-88L.
Nakamura, Hajime; Minowa, Takehisa; and Hirota, Koichi, to Shin-Etsu Chemical Co., Ltd. Method for preparing rare earth permanent magnet material
08075707 Cl. 148-122.
Nakamura, Hiroaki: See--
Tomizawa, Yasushi; Harada, Kohsuke; Nakamura, Hiroaki; Ishihara, Yoshiyuki; and Takakura, Shinji
08077425 Cl. 360-75.
Nakamura, Hiroaki; and Ono, Kohichi, to International Business Machines Corporation System and method for verifying operation of a target system
08078915 Cl. 714-37.
Nakamura, Hiroshi: See--
Nakano, Takeshi; Nakamura, Hiroshi; and Hosono, Koji
08077523 Cl. 365-185.23.
Nakamura, Hisashi: See--
Muraji, Akio; Oketani, Kazunobu; Nakajo, Satoshi; Okuno, Hiromitsu; and Nakamura, Hisashi
08077188 Cl. 345-690.
Nakamura, Hitoshi: See--
Ito, Satoru; Nakamura, Hitoshi; Matsui, Taijiro; and Nitta, Michio
08076255 Cl. 501-124.
Nakamura, Kazuto: See--
Nishikawa, Kazuhiro; Kai, Yoshihiro; and Nakamura, Kazuto
08077264 Cl. 349-12.
Nakamura, Kazuyasu: See--
Ohta, So; Ando, Hiroshi; Suzuki, Masayo; Kawamoto, Shinobu; Nakano, Mariko; and Nakamura, Kazuyasu
08076458 Cl. 530-387.1.
Nakamura, Kenji; and Okada, Yoshihiro, to Sharp Kabushiki Kaisha Active matrix substrate having interleaved source and drain electrodes on circle semiconductor and display device including same
08077266 Cl. 349-43.
Nakamura, Kouichi: See--
Nishimura, Takao; Kumagaya, Yoshikazu; Takashima, Akira; Nakamura, Kouichi; and Aiba, Kazuyuki
08076785 Cl. 257-780.
Nakamura, Kunihiko: See--
Yoshizawa, Jun; Sato, Shin-ichi; Nakamura, Kunihiko; and Yamashita, Tomohiro
08075126 Cl. 347-100.
Nakamura, Masato: See--
Tanaka, Yasuhiro; Fukuda, Toshio; and Nakamura, Masato
08075124 Cl. 347-100.
Tanaka, Yasuhiro; Fukuda, Toshio; and Nakamura, Masato
08075125 Cl. 347-100.
Nakamura, Naohiro; and Kuwahara, Shiori, to Olympus Corporation Electric connector for endoscope, endoscope, and method for assembling electric connector
08075477 Cl. 600-132.
Nakamura, Naotoshi: See--
Kumatani, Kazuhiko; Takano, Yoshihisa; Nakamura, Naotoshi; Ogasa, Mototsugu; Nakamura, Takashi; and Iizuka, Minoru
08076576 Cl. 174-50.51.
Nakamura, Shiho: See--
Yanagi, Satoshi; Ohsawa, Yuichi; Nakamura, Shiho; Saida, Daisuke; and Morise, Hirofumi
08077509 Cl. 365-173.
Nakamura, Shoichi; to ACP Japan Co., Ltd. Holder for a surgical knife blade
08074364 Cl. 30-335.
Nakamura, Tadashi; Echigo, Fumio; and Hirai, Shogo, to Panasonic Corporation Multilayer wiring board and its manufacturing method
08076589 Cl. 174-262.
Nakamura, Takao: See--
Maruyama, Takaharu; Nakamura, Takao; Itadani, Hiraku; and Tanaka, Ken-ichi
08076455 Cl. 530-350.
Nakamura, Takashi: See--
Fujita, Tetsuo; Nakamura, Takashi; Suzuki, Shigeru; and Shinoda, Kozo
08075868 Cl. 423-602.
Kumatani, Kazuhiko; Takano, Yoshihisa; Nakamura, Naotoshi; Ogasa, Mototsugu; Nakamura, Takashi; and Iizuka, Minoru
08076576 Cl. 174-50.51.
Tada, Masahiro; Nakamura, Takashi; Hayashi, Hirotaka; Fuchi, Masayoshi; and Imai, Takayuki
08076631 Cl. 250-226.
Nakamura, Tomokazu; to Fujifilm Corporation Apparatus for detecting blinking state of eye
08077215 Cl. 348-222.1.
Nakamura, Toshikazu: See--
Amano, Jun; Ito, Ken-ichi; Yamaura, Kazuhiro; Matsumoto, Kunio; and Nakamura, Toshikazu
08076289 Cl. 514-9.5.
Nakamura, Toshiyuki; Machida, Satoshi; Yabe, Sachiko; and Taguchi, Takashi, to Oki Semiconductor Co., Ltd. Fabrication method for device structure having transparent dielectric substrate
08076220 Cl. 438-479.
Nakamura, Tsuyoshi: See--
Sasaoka, Yoshimasa; Shiraishi, Ryuichi; Kawachidani, Toshio; Nakamura, Tsuyoshi; and Nagata, Munetake
08078093 Cl. 399-405.
Nakamura, Yoshiaki; Sorimachi, Masami; Kimura, Hitoshi; and Matsuyama, Shigeki, to Hitachi Cable, Ltd. Radiation resistant composition, wire and cable
08076408 Cl. 524-515.
Nakamura, Yoshifumi: See--
Ominato, Hiroyuki; Fujino, Hitoshi; Nakamura, Yoshifumi; and Yukawa, Hiroki
08077370 Cl. 359-207.5.
Nakamura, Yoshihiro; Yamada, Etsuo; Takagi, Keiji; and Chiba, Masataka, to Aisin Seiki Kabushiki Kaisha Target position identifying apparatus
08077199 Cl. 348-135.
Nakamura, Yoshinori; Hayashi, Norimitsu; Higashijima, Takanori; Kubota, Hitoshi; and Oka, Kozo, to Mitsubishi Tanabe Pharma Corporation Trisubstituted amine compound
08076364 Cl. 514-374.
Nakanishi, Koji: See--
Takahashi, Hideaki; Kiyono, Takaaki; and Nakanishi, Koji
08075825 Cl. 264-255.
Nakanishi, Nozomu: See--
Minowa, Nobuto; Nakanishi, Nozomu; Mitomi, Masaaki; Nara, Hideki; and Yokozawa, Tohru
08076503 Cl. 560-155.
Nakano, Hiroshi: See--
Kato, Atsushi; and Nakano, Hiroshi
08078081 Cl. 399-101.
Nakano, Itsuki; and Ikeuchi, Akira, to Mitsumi Electric Co., Ltd. Circuit for detecting remaining battery capacity
08076904 Cl. 320-132.
Nakano, Itsuki; and Ikeuchi, Akira, to Mitsumi Electric Co., Ltd. Digital signal processing apparatus
08077768 Cl. 375-239.
Nakano, Mariko: See--
Ohta, So; Ando, Hiroshi; Suzuki, Masayo; Kawamoto, Shinobu; Nakano, Mariko; and Nakamura, Kazuyasu
08076458 Cl. 530-387.1.
Nakano, Takeshi; Nakamura, Hiroshi; and Hosono, Koji, to Kabushiki Kaisha Toshiba Semiconductor memory device with a stacked gate including a charge storage layer and a control gate and method of controlling the same
08077523 Cl. 365-185.23.
Nakano, Teppei: See--
Hosokawa, Junichi; Koguchi, Yuuki; Tashiro, Keizo; and Nakano, Teppei
08077253 Cl. 348-354.
Nakano, Yutaka: See--
Watanabe, Manabu; Nakano, Yutaka; Ueda, Kenji; Kurashige, Mitsuharu; Hasegawa, Yasushi; Morozumi, Hiroyuki; and Itoyama, Sueki
08079014 Cl. 717-100.
Nakanowatari, Takanori: See--
Kakehi, Rumiko; Suzuki, Toshikatsu; and Nakanowatari, Takanori
08079089 Cl. 726-26.
Nakao, Hidetaka; Hayashi, Eisaku; Oishi, Kunio; Hayakawa, Isao; Miyake, Yoshiaki; Tateyama, Yoshikuni; and Ashihara, Takeshi, to Ebara Corporation Polishing apparatus and polishing method
08078306 Cl. 700-121.
Nakao, Masaki: See--
Higashiyama, Tadashi; and Nakao, Masaki
08078232 Cl. 455-566.
Nakao, Yasushi: See--
Narita, Nobuhiko; Nakahara, Shuichi; Onoyama, Hiroyuki; Tonomura, Hironori; Nakao, Yasushi; and Matsuno, Yoshizumi
08076413 Cl. 525-72.
Nakaoka, Hideaki: See--
Masuda, Rikiya; and Nakaoka, Hideaki
08078038 Cl. 386-297.
Nakashima, Hiromitsu: See--
Nakamura, Atsushi; Nakagawa, Hiroki; Nakashima, Hiromitsu; Tsuji, Takayuki; Dougauchi, Hiroshi; Kouno, Daita; and Nishimura, Yukio
08076053 Cl. 430-270.1.
Nakashima, Hisao: See--
Li, Lei; Tao, Zhenning; and Nakashima, Hisao
08078066 Cl. 398-209.
Nakashima, Kensaku: See--
Kodama, Hiroaki; and Nakashima, Kensaku
08078017 Cl. 385-14.
Nakashima, Masataka; Kinoshita, Yoko; and Itoh, Kiyoshi, to Dai Nippon Printing Co., Ltd. Optical layered body and method for producing optical layered body
08076446 Cl. 528-176.
Nakashima, Yoshimitsu; to Sharp Kabushiki Kaisha Solid-state image capturing device, manufacturing method for the same and electronic information device
08076225 Cl. 438-510.
Nakata, Tsuneo: See--
Zhu, Qiang; Iwashita, Hiroaki; Takayama, Koichiro; and Nakata, Tsuneo
08079001 Cl. 716-106.
Nakatsuka, Toshiyuki; Kadobayashi, Yusei; and Takano, Satoshi, to Kabushiki Kaisha Shofu Chemicals mixing container with offset communicating holes
08074794 Cl. 206-222.
Nakaya, Masaki; and Kan, Hirofumi, to Kirin Beer Kabushiki Kaisha Method for producing hermetically sealed container for beverage or food
08075726 Cl. 156-272.8.
Nakayama, Hiroshi: See--
Kinouchi, Satoshi; Takagi, Osamu; Tsueda, Yoshinori; Kitamura, Tetsuo; Nakayama, Hiroshi; Doi, Yohei; Kikuchi, Kazuhiko; Takai, Masanori; Kusaka, Toyoyasu; and Sone, Toshihiro
08078073 Cl. 399-69.
Nakayama, Satoshi; to Canon Kabushiki Kaisha Image pickup apparatus
08077225 Cl. 348-240.1.
Nakayama, Shinobu: See--
Okada, Rie; Nakayama, Shinobu; and Murakami, Toshio
08075836 Cl. 266-44.
Nakayama, Yoshikazu; Haruta, Masato; and Sekine, Hiroyuki, to Advantest Corporation Device, method, program, and recording medium for error factor determination, and output correction device and reflection coefficient measurement device provided with the device
08076947 Cl. 324-601.
Nakazato, Atsuro: See--
Yasuhara, Akito; Sakagami, Kazunari; Ohta, Hiroshi; and Nakazato, Atsuro
08076502 Cl. 560-119.
Nakazato, Syunji: See--
Katayose, Yoshiaki; Hirai, Takaaki; and Nakazato, Syunji
08076054 Cl. 430-306.
Nakazawa, Akira: See--
Silverbrook, Kia; Berry, Norman Micheal; Nakazawa, Akira; Mackey, Paul Ian; and Jackson, Garry Raymond
08075116 Cl. 347-86.
Silverbrook, Kia; Nakazawa, Akira; Hibbard, Christopher; Mackey, Paul Ian; Berry, Norman Micheal; and Jackson, Garry Raymond
08075110 Cl. 347-84.
Nakazawa, Shigeaki; to Fujitsu Limited Switching converter
08076915 Cl. 323-271.
Nakazawa, Takeo; Fujimura, Osamu; Ito, Junichi; and Murakawa, Jun, to Voith Patent GmbH Deflection compensation roll
08075736 Cl. 162-336.
Nakazawa, Yoshito: See--
Numazawa, Sumito; Nakazawa, Yoshito; Kobayashi, Masayoshi; Kudo, Satoshi; Imai, Yasuo; Kubo, Sakae; Shigematsu, Takashi; Ohnishi, Akihiro; Uesawa, Kozo; and Oishi, Kentaro
08076202 Cl. 438-270.
Nalley, Mark Weight plate locking and lifting system
08075458 Cl. 482-98.
Nam, Bo-Young: See--
Lee, Geonho; Nam, Dong-lim; Han, Young-chang; Nam, Bo-Young; and Lee, Jung-Kyung
08075291 Cl. 418-55.5.
Nam, Dong-lim: See--
Lee, Geonho; Nam, Dong-lim; Han, Young-chang; Nam, Bo-Young; and Lee, Jung-Kyung
08075291 Cl. 418-55.5.
Nam, Hui: See--
Kim, Beom-Shik; Nam, Hui; Park, Chan-Young; and Ku, Ja-Seung
08077117 Cl. 345-7.
Nam, Hye-Yeong: See--
Kim, Dae-Joong; Baek, In-Su; Park, Jong-Sang; Nam, Hye-Yeong; and Bai, Chengzhe
08075940 Cl. 427-2.25.
Namekawa, Takashi: See--
Sawai, Yuichi; Shiono, Osamu; Namekawa, Takashi; Naitou, Takashi; Hayashibara, Mitsuo; Kijima, Yuichi; Hirasawa, Shigemi; Asakura, Shunichi; Yamamoto, Hiroki; and Hatori, Akira
08075961 Cl. 428-1.5.
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08078870 Cl. 713-166.
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08078880 Cl. 713-182.
Nangia, Vijay: See--
Sartori, Philippe J.; Baum, Kevin L.; Classon, Brian K.; Love, Robert T.; Nangia, Vijay; and Cudak, Mark Conrad
08077690 Cl. 370-342.
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08078072 Cl. 399-67.
Nankyo Efnica Co., Ltd.: See--
Nannoni, Fabio: See--
Ballerio, Dante; and Nannoni, Fabio
08074921 Cl. 244-17.19.
Nanologica AB: See--
Garcia-Bennett, Alfonso
08075867 Cl. 423-592.1.
Nanoport Technologies: See--
Muray, Andrew Julius; and Muray, Kathleen
08075942 Cl. 427-10.
Nanosi Advanced Technologies, Inc.: See--
Nayfeh, Munir H.; and Alrokayan, Salman A. H.
08076410 Cl. 524-789.
Nanotherapeutics, Inc.: See--
Nanotope, Inc.: See--
Hulvat, James F.; and Guler, Mustafa O.
08076295 Cl. 514-17.7.
Nanya Technology Corp.: See--
Renn, Shing Hwa
08077512 Cl. 365-185.03.
Naoi, Hiroo: See--
Yoshimoto, Yuhsuke; Deguchi, Masanobu; Wakabayashi, Takeshi; Takenouchi, Kohichi; Morimoto, Kiyofumi; and Naoi, Hiroo
08078087 Cl. 399-258.
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08076851 Cl. 313-587.
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08075105 Cl. 347-68.
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08075796 Cl. 252-67.
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08076503 Cl. 560-155.
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Hurwitz, Marni Markell; Narasimhan, Dave; and Buff, Ernest D.
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08075322 Cl. 439-82.
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08077601 Cl. 370-216.
Maze, Frederic; and Nassor, Eric
08078752 Cl. 709-232.
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Nathan, Vaidhi; Gope, Chanden; and Nathan, Anoo
08075499 Cl. 600-587.
Nathan, Vaidhi: See--
Nathan, Vaidhi; Gope, Chanden; and Nathan, Anoo
08075499 Cl. 600-587.
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08075499 Cl. 600-587.
National Central University: See--
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Smith, III, Robert E.
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National Health Research Institutes: See--
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National Instruments Corporation: See--
Fuller, III, David W; Kornerup, Jacob; and Breyer, John R.
08078980 Cl. 715-763.
National Semiconductor Corporation: See--
National Taiwan University: See--
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National Taiwan University of Science and Technology: See--
Guo, Jing-ming; and Liu, Yun-fu
08077355 Cl. 358-3.03.
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08075644 Cl. 44-905.
National University Corporation Chiba University: See--
Imamoto, Tsuneo; Yoshida, Kazuhiro; Nishimura, Miwako; and Koide, Aya
08076480 Cl. 544-353.
National University Corporation Nara Institute of Science and Technology: See--
Inagaki, Naoyuki; Mori, Tatsuya; Ohara, Osamu; and Nagase, Takahiro
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National University Corporation Tokyo University of Marine Science and Technology: See--
Izumi, Mitsuru; and Maki, Naoki
08076894 Cl. 318-716.
National Yang-Ming University: See--
Natsume, Norimitsu: See--
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Natural Beauty Bio-Technology Limited: See--
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08078914 Cl. 714-26.
Navia, Sr., Jose A.: See--
Kassab, Ghassan S.; and Navia, Sr., Jose A.
08075532 Cl. 604-176.
Navilyst Medical, Inc.: See--
Gray, Jeff; and Buiser, Marcia
08075536 Cl. 604-288.01.
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Marek, Ladislav; Zednicek, Stanislav; Tomasko, Jaroslav; and Navratil, Jiri
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Dorum, Ole Henry; Hanson, John; and Kaplan, Lawrence M.
08078572 Cl. 707-603.
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08078912 Cl. 714-22.
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08078140 Cl. 455-405.
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Marriott, Craig D.; Neal, Timothy L.; Swain, Jeff L.; and Raimao, Miguel A.
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Neapco Europe GmbH: See--
NEC (China) Co., Ltd.: See--
Liang, Bangyong; Qi, Hongwei; and Feng, Qiangze
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NEC Corporation: See--
Hamada, Yasuhiro; Kishimoto, Shuya; Maruhashi, Kenichi; Ito, Masaharu; Tanomura, Masahiro; and Orihashi, Naoyuki
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NEC Electronics Corporation: See--
NEC Infrontia Corporation: See--
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Lenglet, Luc Lucien Marie
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08078781 Cl. 710-244.
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Hasegawa, Saburo; Asao, Kimihiko; Makino, Koji; Kato, Takashi; and Negishi, Hideo
08075233 Cl. 411-8.
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Seneski, Mark; Sayde, Richard; Marantz, Joshua D.; Cloutier, Richard J.; Dobbyn, Dylan; and Neifert, William E.
08079022 Cl. 717-135.
Neiger, Gilbert: See--
Bennett, Steven M.; Anderson, Andrew V.; Jeyasingh, Stalinselvaraj; Kägi, Alain; Neiger, Gilbert; Uhlig, Richard; Zou, Xiang; Smith, Lawrence; and Rodgers, Scott
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08078912 Cl. 714-22.
Nektar Therapeutics: See--
Nellcor Puritan Bennett Ireland: See--
Addison, Paul Stanley; Watson, James; and Clifton, David
08077297 Cl. 356-41.
Nellcor Puritan Bennett LLC: See--
Brumer, Rebecca; Chamoun, Nassib G.; Cordero, Rafael M.; Davidson, Marc; and Kiely, James P.
08077039 Cl. 340-572.1.
Mannheimer, Paul D.; Fein, deceased, Michael E.; and Porges, Charles E.
08078246 Cl. 600-323.
Nelson, Cherilyn N.: See--
Hardee, Fred; Radhakrishnan, Gopinath; Carrillo, Marco; Narasimhan, Dave; and Nelson, Cherilyn N.
08074436 Cl. 57-224.
Nelson, James E.: See--
Thompson, Loren M.; Nelson, James E.; and Voltenburg, Jr., Robert R.
08075676 Cl. 96-121.
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Marx, Ryan E.; Nelson, James M.; and Cernohous, Jeffrey J.
08076405 Cl. 524-445.
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Paraschac, Joseph; and Nelson, Lionel M
08074654 Cl. 128-848.
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08078290 Cl. 700-17.
Nelson, Matthew: See--
Maier, John S.; Stewart, Shona; Cohen, Jeffrey; Nelson, Matthew; and Treado, Patrick J
08078268 Cl. 600-476.
Nelson, Randall W.: See--
Tubbs, Kemmons A.; Gruber, Karl F.; and Nelson, Randall W.
08075767 Cl. 210-198.2.
Nemec, Philip: See--
Prada Gomez, Luis Ricardo; Fairfield, Nathaniel; Szybalski, Andy; Nemec, Philip; and Urmson, Christopher
08078349 Cl. 701-23.
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Nemuth, Jens: See--
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Ton-That, Luan; and Neos, Perry
08077422 Cl. 360-75.
Neotecha AG: See--
Zollinger, Peter
08074528 Cl. 73-863.86.
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Ye, Cheng Gang Yap; Ferrer, Jose Joaquin Arias; del Campo, Jose Antonio Alvarado; and Neps, Robert
08078509 Cl. 705-32.
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DelCardayre, Stephen; Tobin, Matthew B.; Stemmer, Willem P. C.; Ness, Jon E.; Minshull, Jeremy S.; Patten, Phillip A.; Subramanian, Venkiteswatan Mani; Castle, Linda A.; Krebber, Claus M.; Bass, Steven H.; Zhang, Ying-Xin; Cox, Anthony R.; Huisman, Gjalt W.; Yuan, Ling; and Affholter, Joseph A.
08076138 Cl. 435-440.
Nestec S.A.: See--
Dworzak, Christoph; Mock, Elmar; Klopfenstein, Andre; Rusch, Christoph; Bitmead, Naomi; Yoakim, Alfred; and Ozanne, Matthieu
08074562 Cl. 99-323.1.
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Goren, Ori; Netanel, Yaron; Livay, Aviel; Moran, Gil; and Neeman, Yossy
08078781 Cl. 710-244.
NetApp, Inc.: See--
Bisson, Timothy C.; Pasupathy, Shankar; and Patel, Yuvraj
08078653 Cl. 707-829.
Thoppai, Omprakaash C.; Rajasekaran, Umeshkumar V.; Driscoll, Alan Stuart; and Shah, Devang
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Capone, Jeffery M.; and Immaneni, Pramod
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Hanson, Aaron D.; Sturniolo, Emil A.; Menn, Anatoly; Olsen, Erik D.; and Savarese, Joseph T.
08078727 Cl. 709-226.
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Nulkar, Chaitanya; Kemp, Jeffrey A.; Grier, James R.; and Mathew, Jose
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08074795 Cl. 206-279.
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Neu, Steven; and Neu, Tammy
08074795 Cl. 206-279.
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Scherer, Stefan; Neuberth, Simone; and Covini, Christian
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Hironimus, Jeannot; Neuerburg, Horst; Stutzmann, Olivier; and Bonnin, David
08074432 Cl. 56-6.
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Motsch, Andreas Peter; Neumann, Matthew Aaron; and Saggar, Ravi K.
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Carl, Udo; Neumann, Uwe; and Holert, Ben
08074937 Cl. 244-194.
Neumayer Tekfor Holding GmbH: See--
Neurim Pharmaceuticals (1991) Ltd.: See--
Zisapel, Nava; and Laudon, Moshe
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Krishnamachari, Srivathsan; Kong, Xuan; Tracey, Brian; and Williams, Michael
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New Way Tools Co., Ltd.: See--
New York Air Brake Corporation: See--
New York University: See--
Pagano, Michele; Skaar, Jeffrey R.; Peschiaroli, Angelo; and Dorrello, N. Valerio
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Ehrenreich, Kevin J.; Newhauser, Richard R.; von Oepen, Randolf; and Stankus, John
08076529 Cl. 604-367.
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Partridge, Colin Jon; and Newland, Paul J.
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Refai, Hakki H.; Petrich, Erik; Sluss, Jr., James J.; Tull, Monte P.; Verma, Pramode; Newman, Gerald K.; and Dreyer, Martina
08075139 Cl. 353-10.
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Magno, Richard; Ancona, Mario; Boos, John Bradley; Champlain, James G; and Newman, Harvey S
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Newron Pharmaceuticals S.p.A.: See--
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Muirhead, Scott A. W.
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Hietaranta, Timo; and Nykänen, Jari
08075941 Cl. 427-8.
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Laster, Maurice Scott; Enzmann, Mark; Dammrose, John Mark; and Nguyen, Annie
08078167 Cl. 455-433.
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Beckman, Andrew T.; Minnelli, Patrick J.; Nguyen, Anthony T.; Baxter, III, Chester O.; and D'Arcangelo, Michele
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Hanlon, Andrew; Huang, Fu-Ying; Huang, Lidu; Nguyen, Antony; and Salehizadeh, Hamid
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Min, Sung Woo; von Oepen, Randolf; Nguyen, Binh T.; Ehrenreich, Kevin J.; Webler, Jr., William E.; Lumauig, Rommel; Chan, Gregory W.; Coffey, Lorcan J.; Yribarren, Travis R.; and Magana, Jesus
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Fitzpatrick, Michael E.; Nguyen, Chuc Tu; Brtko, Wayne J.; and Salisbury, Brian A.
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Rosine, Steven David; Nguyen, Khang V.; and Mills, Michael Scott
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Nguyen, Khoa: See--
Nodianos, Kristopher; Blachek, Laura; Nguyen, Khoa; Oyelowo, Adedayo; Tran, Tan; Sanford, Bernice; and Cochran, Kevin
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Bergeron, Michael A.; Nishikawa, Yuko; Nguyen, Nga Marie Phan; and Diaz, Ronaldo
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Blauch, Matthew E.; Welton, Thomas D.; and Nguyen, Philip D.
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Wasserblat, Moshe; Zigel, Yaniv; and Pereg, Oren
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Nichia Corporation: See--
Narukawa, Yukio; Mitani, Tomotsugu; Ichikawa, Masatsugu; Kitano, Akira; and Misaki, Takao
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Nichiban Co., Ltd.: See--
Sekiya, Nobuyuki; Yamaguchi, Masatsugu; Tanaka, Masashi; and Kawakami, Takashi
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Nicholls, Leon E.: See--
Ansari, Amir; Cowgill, George A.; Nicholls, Leon E.; Raissyan, Atousa; Ramayya, Jude P.; and Masina, Ramprakash
08078688 Cl. 709-217.
Nichols, Jeffrey William: See--
Barton, John Joseph; Hua, Zhigang; and Nichols, Jeffrey William
08078694 Cl. 709-219.
Nichols, Jr., James P.: See--
Wall, Daniel P.; Leasure, Jeremy D.; Carroll, Craig A.; Jones, Julie L.; Weston, Jeffrey D.; Mooty, Thomas A.; Nichols, Jr., James P.; and Schnell, John W.
08075374 Cl. 451-355.
Nichols, Michelle; Atwood, Todd; Heddleson, James; and Cargle, Steve, to Bank of America Corporation Cash supply chain surveillance
08078534 Cl. 705-39.
Nichols, Tony; to Webroot Software, Inc. Method and system for rendering harmless a locked pestware executable object
08079032 Cl. 718-100.
Nickelson, David A. Safety ladder
08074771 Cl. 182-195.
Nidec Corporation: See--
Hanaoka, Satoru; Sugiyama, Tomotsugu; Tabata, Shinya; and Tsukada, Takashi
08074344 Cl. 29-598.
Nidumolu, Kalyan Chakravarthy: See--
Parthasarathy, Anand; Holankar, Manali Chandrakant; Nidumolu, Kalyan Chakravarthy; and Kondamuri, Chandra Sekhar
08078903 Cl. 714-4.11.
Nie, Xiaoning: See--
Lin, Jinan; Nie, Xiaoning; Itjeshorst, Ralf; Giese, Tilman; Deng, Xianming; Brem, Denny; Mott, Klaus; and Kella, Tideya
08077644 Cl. 370-310.
Niebling, Peter: See--
Heim, Jens; Dlugai, Darius; Niebling, Peter; and Mock, Christian
08075194 Cl. 384-448.
Mock, Christian; Niebling, Peter; and Heiss, Ralf
08075195 Cl. 384-512.
Nieco Corporation: See--
Baker, Edward D.; Baker, Matthew J.; Baker, Patrick D.; Sarfehjoo, Mohsen; and Magner, Erik
08076614 Cl. 219-388.
Nied, Roland: See--
Nied, Roland; and Sickel, Hermann
08074907 Cl. 241-5.
Nied, Roland; and Sickel, Hermann, to Nied, Roland Method for generating finest particles and jet mill therefor as well as classifier and operating method thereof
08074907 Cl. 241-5.
Nielsen Company (US), LLC, The: See--
Srinivasan, Venugopal
08078301 Cl. 700-94.
Nielsen, Michael Gunther: See--
Nielsen, Per Gorm Gunther; and Nielsen, Michael Gunther
08075480 Cl. 600-185.
Nielsen, Ole: See--
Lopez de Diego, Heidi; Nielsen, Ole; Munch Ringgard, Lone; Svane, Henrik; Dahl, Allan Carsten; Howells, Mark; Bang-Andersen, Benny; and Lyngso, Lars Ole
08076342 Cl. 514-255.03.
Rock, Michael Harold; De Diego, Heidi Lopez; Christensen, Kim Lasse; Nielsen, Ole; Buur, Anders; and Howells, Mark
08076320 Cl. 514-211.08.
Nielsen, Per Gorm Gunther; and Nielsen, Michael Gunther, to Techmin Pty Limited Apparatus for reducing cross-contamination
08075480 Cl. 600-185.
Nielsen, Stevan: See--
Solem, Jan Otto; Kimblad, Per Ola; von Oepen, Randolf; Quint, Bodo; Seibold, Gerd; Michlitsch, Kenneth J.; Ha, Suk-Woo; Eckert, Karl-Ludwig; Joergensen, Ib; and Nielsen, Stevan
08075616 Cl. 623-2.37.
Nielsen, Theodor; Kristensen, Anders; and Hansen, Ole, to Nil Technology APS Flexible nano-imprint stamp
08075298 Cl. 425-385.
Nielson, Daniel B.: See--
Ashcroft, Benjamin N.; Nielson, Daniel B.; and Doll, Daniel W.
08075715 Cl. 149-2.
Niemann, Holger; and Juenemann, Thorsten, to Robert Bosch GmbH Monitoring system for a hybrid drive
08074527 Cl. 73-862.193.
Nieminen, Gregory: See--
Gordon, Lucas S.; Mathis, Mark L.; and Nieminen, Gregory
08075608 Cl. 623-1.11.
Nien, Ya-Fang: See--
Wu, Ming-Tsang; Yin, Hao-Hui; Yu, Chih-Ching; Yang, Tzu-Ching; Nien, Ya-Fang; Huang, Ying-Feng; and Liu, Pi-Hai
08077564 Cl. 369-44.27.
Nies, Jacob Johannes; and Hemmelmann, Jan Erich, to General Electric Company Wind energy system with fluid-working machine with non-symmetric actuation
08074450 Cl. 60-398.
Niessen, William Frederick: See--
Bovaird, Lorie Jean; Niessen, William Frederick; Haydu, Jr., William Andrew; Enix, Daniel Dale; and Daniel, Jr., McAllister
08075032 Cl. 294-74.
Nieto, John W.: See--
Furman, William N.; and Nieto, John W.
08077813 Cl. 375-341.
Niewiadomski, Walter: See--
Lam, David Y.; Niewiadomski, Walter; Mowry, Steve; and Klingler, Eric
08077080 Cl. 342-174.
Niggemann, Matthias: See--
Heggemann, Christian; Oesterhaus, Jens; Boensch, Matthias; Niggemann, Matthias; Lenschen, Michael; Fehling, Stephan; and Diekmann, Torsten
08075350 Cl. 439-680.
Nihon Dempa Kogyo Co., Ltd.: See--
Kikegawa, Shinya; Nishi, Toshimasa; and Takada, Motoo
08075947 Cl. 427-162.
Nii, Shinsuke; Nakamae, Masato; and Tokoh, Makio, to Kuraray Co., Ltd. Vinyl alcohol-based polymer and film containing the same
08076433 Cl. 526-304.
Niida, Mitsuo; to Canon Kabushiki Kaisha Image processing apparatus to transmit moving image data
08077222 Cl. 348-231.3.
Niijima, Takayuki: See--
Kashiwagi, Tsuyoshi; and Niijima, Takayuki
08077395 Cl. 359-625.
Niitsuma, Kenichi: See--
Omori, Misao; and Niitsuma, Kenichi
08075052 Cl. 297-216.12.
Niizuma, Kazuo; to Shibuya Kogyo Co., Ltd. Conductive ball mounting apparatus
08074867 Cl. 228-175.
Nijhawan, Vijay; and Rangarajan, Madhusudhan, to Dell Products L.L.P. System and method for providing memory performance states in a computing system
08078890 Cl. 713-320.
Nijmeijer, Gerrit Johannes: See--
Hoogendam, Christiaan Alexander; Nijmeijer, Gerrit Johannes; Cuperus, Minne; and Van Eijck, Petrus Anton Willern Cornelia Maria
08077291 Cl. 355-77.
Nijssen, Raymond: See--
Manohar, Rajit; Kelly, Clinton W.; Ekanayake, Virantha; LaFrieda, Christopher; Tam, Hong; Ganusov, Ilya; Nijssen, Raymond; and Van der Goot, Marcel
08078899 Cl. 713-375.
Nike, Inc.: See--
Fleming, John C.; and Mixon, Thomas D.
08078478 Cl. 705-1.1.
Reichow, Alan W.; and Yoo, Herb
08075135 Cl. 351-203.
Smith, Todd; Reichow, Alan W.; and Citek, Karl
08075431 Cl. 473-604.
Stites, John T.; and Franklin, David N.
08075416 Cl. 473-238.
Thomas, James S.; and Lukasiewicz, Jr., Robert
08075417 Cl. 473-246.
Nikitin, Pavel; Rao, KVS (Venkata Kodukula); and Lam, Sander, to Intermec IP Corp. RFID tags with enhanced range and bandwidth obtained by spatial antenna diversity
08077044 Cl. 340-572.7.
Nikolic, Nebojsa; Frey, Michaela; Grabmayer, Wolfgang; Jancik, Thomas; Fried, Matthias; Tschetschkowitsch, Klaus; Schnecker, Kurt; Riegler, Barbara; and Kasapovic, Alma, to Baxter International Inc. Counter-pressure filtration of proteins
08075781 Cl. 210-651.
Nikolic, Nebojsa; Frey, Michaela; Grabmayer, Wolfgang; Jancik, Thomas; Fried, Matthias; Tschetschkowitsch, Klaus; Schnecker, Kurt; Riegler, Barbara; and Kasapovic, Alma, to Baxter International Inc. Counter-pressure filtration of proteins
08075782 Cl. 210-651.
Nikon Corporation: See--
Hagiwara, Kosuke; and Mikamoto, Eiji
08078042 Cl. 396-55.
Niksch, Barbara A.: See--
Tu, Hosheng; Smedley, Gregory T.; Haffner, David; and Niksch, Barbara A.
08075511 Cl. 604-8.
Nil Technology APS: See--
Nielsen, Theodor; Kristensen, Anders; and Hansen, Ole
08075298 Cl. 425-385.
Niles Co., Ltd: See--
Ohata, Tomoyuki; and Watanabe, Shigeo
08076887 Cl. 318-444.
Nilsson, C. Michael: See--
Stahurski, Terrance; and Nilsson, C. Michael
08075597 Cl. 606-260.
Nilsson, Malin: See--
Källèn, Elisabeth; and Nilsson, Malin
08074600 Cl. 119-14.04.
Niman, Murray Jerel: See--
Agnew, Martin Joseph; Panaghiston, Gary David; Niman, Murray Jerel; and Chandler, Nicholas
08076591 Cl. 174-350.
Ning, Ke: See--
Wang, Xiaolin; Wu, Qian; Marshall, Benjamin; Wang, Fugui; Ning, Ke; and Pitarys, Gregory
08078833 Cl. 712-15.
Ning, Tian: See--
Ning, Tian; to Ning, Tian Flame-retardant and fireproof cigarette
08074663 Cl. 131-365.
Ninic, Mario: See--
Harney, Michael; Ninic, Mario; Howard, Rory; and Mansfield, Kim
08075342 Cl. 439-620.01.
Nintendo, Co., Ltd.: See--
Miyamoto, Shigeru; and Eguchi, Katsuya
08075401 Cl. 463-37.
Sasaki, Tetsuya; and Araki, Tsutomu
08075405 Cl. 463-42.
Niogi, Sumit Narayan; and McCandliss, Bruce D., to Cornell University Reproducible objective quantification method to segment white matter structures
08077937 Cl. 382-128.
Nippon Paint Co., Ltd.: See--
Matsukawa, Masahiko; Makino, Kazuhiro; Shimakura, Toshiaki; Futsuhara, Masanobu; and Yang, Jiping
08075708 Cl. 148-247.
Nippon Sheet Glass Company, Limited: See--
Shimmo, Katsuhide; Sato, Shiro; and Mamada, Haruhiko
08077407 Cl. 359-811.
Nippon Shokubai Co., Ltd: See--
Yoneda, Atsuro; and Michitaka, Daisuke
08076434 Cl. 526-312.
Nippon Shokubai Co., Ltd.: See--
Kasuga, Hiroto; Matsunami, Etsushige; and Sugio, Masafumi
08076509 Cl. 562-532.
Nippon Soken, Inc.: See--
Kawakita, Shinichiro; Ohshima, Keiji; and Nishijima, Yoshiaki
08074444 Cl. 60-286.
Nippon Steel Corporation: See--
Ito, Satoru; Nakamura, Hitoshi; Matsui, Taijiro; and Nitta, Michio
08076255 Cl. 501-124.
Nippon Telegraph and Telephone Corporation: See--
Takatori, Yasushi; Cho, Keizo; Hori, Toshikazu; and Nishimori, Kentaro
08078113 Cl. 455-63.4.
Nippon Valqua Industries, Ltd.: See--
Nippon Zenyaku Kogyo Co., Ltd.: See--
Tsukui, Toshihiro; Tsujimoto, Hajime; and Iwabuchi, Shigehiro
08075898 Cl. 424-185.1.
Nishi, Tomohiro: See--
Kuroki, Yoshihiko; and Nishi, Tomohiro
08077172 Cl. 345-213.
Nishi, Toshimasa: See--
Kikegawa, Shinya; Nishi, Toshimasa; and Takada, Motoo
08075947 Cl. 427-162.
Nishida, Hirokazu: See--
Kawasaki, Takafumi; Mimura, Seiichi; Nishida, Hirokazu; and Yoshida, Yasuhiro
08075647 Cl. 51-307.
Nishida, Katsutoshi: See--
Valko, Andras; Turanyi, Zoltan; Keszei, Csaba; Iwasaki, Atsushi; and Nishida, Katsutoshi
08077648 Cl. 370-311.
Nishida, Yoshiyasu: See--
Miyashita, Takeshi; Kobayashi, Hirokazu; Iwata, Mitsuru; and Nishida, Yoshiyasu
08077231 Cl. 348-272.
Nishihara, Seiichi: See--
Iwanaga, Toshiyuki; Motoki, Akihiro; Ogawa, Makoto; Kawasaki, Kenichi; Takeuchi, Shunsuke; Nishihara, Seiichi; and Matsumoto, Shuji
08077445 Cl. 361-309.
Nishihara, Takashi; Sakaue, Yoshitaka; and Kojima, Rie, to Panasonic Corporation Information recording medium and method for manufacturing the same
08075973 Cl. 428-64.1.
Nishihara, Yuka: See--
Kojima, Katsumi; Nishihara, Yuka; Kubo, Hiroshi; Yasue, Yoshihiko; Oshima, Yasuhide; and Iwasa, Hiroki
08074483 Cl. 72-379.4.
Nishiie, Takehiro: See--
Honda, Kazuki; Murakami, Kazushi; Ichikawa, Hiroaki; Nishiie, Takehiro; Kura, Yasuhito; Onuki, Yoshio; and Komiya, Takaaki
08075474 Cl. 600-106.
Honda, Kazuki; Murakami, Kazushi; Ichikawa, Hiroaki; Nishiie, Takehiro; Kura, Yasuhito; Onuki, Yoshio; and Komiya, Takaaki
08075475 Cl. 600-106.
Nishijima, Yoshiaki: See--
Kawakita, Shinichiro; Ohshima, Keiji; and Nishijima, Yoshiaki
08074444 Cl. 60-286.
Nishikawa, Kazuhiro; Kai, Yoshihiro; and Nakamura, Kazuto, to Nissha Printing Co., Ltd. Touch input function-equipped protection panel for electronic device display window
08077264 Cl. 349-12.
Nishikawa, Seiichiro: See--
Suzuki, Yusaku; and Nishikawa, Seiichiro
08074504 Cl. 73-114.38.
Nishikawa, Shizuo: See--
Fujishima, Makoto; Kashihara, Keizo; and Nishikawa, Shizuo
08077327 Cl. 356-614.
Nishikawa, Tomoki; to Panasonic Corporation OFDM demodulation device
08077784 Cl. 375-260.
Nishikawa, Yoshiteru: See--
Ochi, Makoto; Nishikawa, Yoshiteru; and Tao, Kozo
08074976 Cl. 270-58.09.
Nishikawa, Yuko: See--
Bergeron, Michael A.; Nishikawa, Yuko; Nguyen, Nga Marie Phan; and Diaz, Ronaldo
08078036 Cl. 386-278.
Nishimori, Kentaro: See--
Takatori, Yasushi; Cho, Keizo; Hori, Toshikazu; and Nishimori, Kentaro
08078113 Cl. 455-63.4.
Nishimori, Yasuhiro: See--
Watanabe, Seiichi; Yasui, Naoki; Tauchi, Susumu; and Nishimori, Yasuhiro
08075733 Cl. 156-345.41.
Nishimoto, deceased, Ikuo: See--
Chiba, Tomohiro; Kita, Yoshiko; Matsuoka, Masaaki; Terashita, Kenzo; Aiso, Sadakazu; and Nishimoto, deceased, Ikuo
08076449 Cl. 530-300.
Nishimoto, legal representative, Tomo: See--
Chiba, Tomohiro; Kita, Yoshiko; Matsuoka, Masaaki; Terashita, Kenzo; Aiso, Sadakazu; and Nishimoto, deceased, Ikuo
08076449 Cl. 530-300.
Nishimoto, Tomotaka; Okada, Yasuhiro; Igarashi, Chihiro; Yoshitake, Takanori; and Watanabe, Nobuhisa, to Panasonic Corporation Component crimping apparatus control method, component crimping apparatus, and measuring tool
08078310 Cl. 700-206.
Nishimura, Hiromichi: See--
Jabri, Khaled; Arai, Atsushi; Nishimura, Hiromichi; Noro, Yoshihiko; and Takeda, Dai
08077389 Cl. 359-487.02.
Nishimura, Kenichi; to Panasonic Corporation Semiconductor device
08076695 Cl. 257-170.
Nishimura, Michiyo: See--
Teramoto, Yoji; Fujiwara, Ryoji; Nishimura, Michiyo; Nomura, Kazushi; and Murakami, Shunsuke
08075360 Cl. 445-51.
Nishimura, Miwako: See--
Imamoto, Tsuneo; Yoshida, Kazuhiro; Nishimura, Miwako; and Koide, Aya
08076480 Cl. 544-353.
Nishimura, Takao; and Kumagaya, Yoshikazu, to Fujitsu Semiconductor Limited Semiconductor device and manufacturing method of semiconductor device
08076769 Cl. 257-688.
Nishimura, Takao; Kumagaya, Yoshikazu; Takashima, Akira; Nakamura, Kouichi; and Aiba, Kazuyuki, to Fujitsu Semiconductor Limited Semiconductor device
08076785 Cl. 257-780.
Nishimura, Yukio: See--
Nakamura, Atsushi; Nakagawa, Hiroki; Nakashima, Hiromitsu; Tsuji, Takayuki; Dougauchi, Hiroshi; Kouno, Daita; and Nishimura, Yukio
08076053 Cl. 430-270.1.
Nishino, Hidehiko; and Hirano, Yoshihiro, to Shin-Etsu Handotai Co., Ltd. Cylindrical grinding apparatus and method for grinding
08074544 Cl. 82-122.
Nishino, Hironori: See--
Uchiyama, Yasuhito; and Nishino, Hironori
08076740 Cl. 257-431.
Nishino, Hisashi: See--
Mabuchi, Tomoki; and Nishino, Hisashi
08074762 Cl. 180-309.
Nishio, Akihiko: See--
Kuri, Kenichi; Nishio, Akihiko; Fukuoka, Masaru; and Miyoshi, Kenichi
08077667 Cl. 370-329.
Matsumoto, Atsushi; Miyoshi, Kenichi; and Nishio, Akihiko
08077598 Cl. 370-208.
Nishio, Kazunori; and Mizouchi, Hayato, to Rinnai Corporation Warm air furnace
08074636 Cl. 126-116A.
Nishio, Tetsushi: See--
Minamio, Masanori; Nishio, Tetsushi; and Tsuji, Kenji
08077248 Cl. 348-340.
Nishiwaki, Fumitoshi: See--
Hasegawa, Hiroshi; Matsui, Masaru; Ogata, Takeshi; Nishiwaki, Fumitoshi; Taguchi, Hidetoshi; Sakima, Fuminori; and Wada, Masanobu
08074471 Cl. 62-498.
Nishiwaki, Seiji; to Panasonic Corporation Imaging photodetection device
08076745 Cl. 257-434.
Nishiwaki, Tsuyoshi; Ootsuka, Yosuke; and Kiso, Satoshi, to Asics Corporation Shoe sole with reinforcement structure
08074377 Cl. 36-25R.
Nishiyama, Kazuhiro; and Sasaki, Tsutomu, to Seiko Epson Corporation Liquid developer transport device and image forming apparatus
08078086 Cl. 399-238.
Nishizawa, Takashi: See--
Soma, Gen-Ichiro; Kohchi, Chie; Inagawa, Hiroyuki; Nishizawa, Takashi; and Takahashi, Yukinori
08075928 Cl. 424-750.
Nishtala, Vasu; Davis, Michele Gandy; Bracken, Ronald L.; and Hine, Robert M., to C. R. Bard, Inc. Waste management system
08075539 Cl. 604-328.
Nissan Diesel Motor Co., Ltd.: See--
Nissan Motor Co., Ltd.: See--
Shimamura, Osamu; Hosaka, Kenji; Watanabe, Kyoichi; Abe, Takaaki; Kinoshita, Takuya; Horie, Hideaki; Sato, Hajime; and Senbokuya, Ryouichi
08076021 Cl. 429-149.
Sugano, Takashi; and Etori, Nariaki
08078382 Cl. 701-96.
Nissha Printing Co., Ltd.: See--
Nishikawa, Kazuhiro; Kai, Yoshihiro; and Nakamura, Kazuto
08077264 Cl. 349-12.
Nitschke, David B.; Nitschke, Dean M.; Reinhart, Cristin J.; and Shetterly, Donivan M., to Glasstech, Inc. Method for quenching formed glass sheets
08074473 Cl. 65-114.
Nitschke, Dean M.: See--
Nitschke, David B.; Nitschke, Dean M.; Reinhart, Cristin J.; and Shetterly, Donivan M.
08074473 Cl. 65-114.
Nitta, Michio: See--
Ito, Satoru; Nakamura, Hitoshi; Matsui, Taijiro; and Nitta, Michio
08076255 Cl. 501-124.
Nitto Denko Corporation: See--
Ikeda, Koichi; Ueda, Tsubasa; and Tamai, Hironori
08075970 Cl. 428-40.1.
Konishi, Tatsuya; and Mori, Kenjiro
08076383 Cl. 521-61.
Nashiki, Tomotake; and Sugawara, Hideo
08075948 Cl. 427-167.
Niu, Li; Huang, Zhen; Shi, Hua; and Lis, John T., to Research Foundation of State University of New York, The Nucleic acid inhibitors of glutamate receptors
08076467 Cl. 536-23.1.
Niwa, Atsumi; Matsumoto, Tomohiro; and Moue, Takashi, to Sony Corporation ΔΣ modulator
08077066 Cl. 341-143.
Nobori, Kunio: See--
Okamoto, Shusaku; Ishii, Hirofumi; Nakagawa, Masamichi; Nobori, Kunio; and Morimura, Atsushi
08077202 Cl. 348-148.
Noda, Akihiko: See--
Mori, Akihito; and Noda, Akihiko
08077333 Cl. 358-1.15.
Noda, Chosaku: See--
Watabe, Kazuo; Usui, Takashi; Yusu, Keiichiro; Noda, Chosaku; Kuroda, Kazuto; Kaji, Nobuaki; and Saito, Masahiro
08077586 Cl. 369-116.
Noda, Hideyuki: See--
Dosaka, Katsumi; Arimoto, Kazutami; Saito, Kazunori; and Noda, Hideyuki
08077492 Cl. 365-49.1.
Noda, Kazuya; and Miyoshi, Takaaki, to Asahi Kasei Chemicals Corporation Method for producing conductive masterbatch
08075805 Cl. 252-502.
Noda, Makoto: See--
Yamagishi, Hiroyuki; and Noda, Makoto
08078936 Cl. 714-755.
Noda, Ryusuke: See--
Fujishima, Yoshikazu; and Noda, Ryusuke
08078033 Cl. 386-250.
Node, Yasunobu: See--
Machimura, Masanori; Kondo, Tetsujiro; Ando, Kazutaka; Node, Yasunobu; Obana, Michimasa; Hiraizumi, Kei; and Akao, Masato
08077978 Cl. 382-190.
Nodianos, Kristopher; Blachek, Laura; Nguyen, Khoa; Oyelowo, Adedayo; Tran, Tan; Sanford, Bernice; and Cochran, Kevin, to United States of America as represented by the Secretary of the Navy, The Self-regulating power supply for micro electronic mechanical systems thermal actuators
08076921 Cl. 323-304.
Noegel, John J.: See--
Ramme, Bruce W.; Noegel, John J.; and Rohatgi, Pradeep K.
08074804 Cl. 209-133.
Nogami, Syusaku; and Baba, Tomohiko, to Kayaba Industry Co., Ltd. Vehicle height adjusting device
08074974 Cl. 267-64.17.
Nogami, Toshizo: See--
Onodera, Takashi; Nogami, Toshizo; and Tsuboi, Hidekazu
08077782 Cl. 375-260.
Noguchi, Hiromichi: See--
Shimomura, Masako; and Noguchi, Hiromichi
08075094 Cl. 347-45.
Noguchi, Ryota; to Hitachi, Ltd. Computer system provided with hypervisor
08078765 Cl. 710-5.
Noh, Sok-Won; Kang, Tae-Min; Seong, Jin-Wook; Lee, Sang-Bong; Lee, Seung-Mook; Park, Jin-Woo; Kim, Sun-Hoe; and Jung, Myung-Jong, to Samsung Mobile Display Co., Ltd. Crucible heating apparatus and deposition apparatus including the same
08075693 Cl. 118-726.
Nohmi Bosai Ltd.: See--
Noji, Nobuharu: See--
Hatakeyama, Masahiro; Watanabe, Kenji; Murakami, Takeshi; Satake, Tohru; and Noji, Nobuharu
08076654 Cl. 250-492.1.
Nojima, Shigeki: See--
Izuha, Kyoko; Nojima, Shigeki; Kotani, Toshiya; and Tanaka, Satoshi
08078996 Cl. 716-53.
Nokia Coporation: See--
Syrjarinne, Jari; and Valio, Harri
08077084 Cl. 342-357.43.
Nokia Corporation: See--
Ahmavaara, Kalle; and Vesterinen, Seppo
08077681 Cl. 370-338.
Koskinen, Juha-Pekka; and Vallinen, Juha R.
08078142 Cl. 455-406.
Kuure, Pekka; Jouppi, Jarkko; and Ala-Tauriala, Erkka
08077653 Cl. 370-328.
Maunuksela, Jaako; Vepsäläinen, Jussi; and Kahola, Mika
08077799 Cl. 375-296.
Mizutani, Michihito; and Uusitalo, Jussi Severi
08077156 Cl. 345-173.
Phan, Vinh Van; and Vainikka, Markku
08078170 Cl. 455-436.
Rinne, Mika P.; and Kermoal, Jean-Philippe
08077612 Cl. 370-230.
Wirola, Lauri; and Syrjärinne, Jari
08078192 Cl. 455-456.1.
Nokia Siemens Networks GmbH & Co. KG: See--
Nokia Siemens Networks Oy: See--
Rexhepi, Vlora; Sebire, Guillaume; Hamiti, Shkumbin; and Parantainen, Janne
08077680 Cl. 370-335.
Noland, Michael L.: See--
Imholt, Timothy J.; St. Claire, Alexander F.; and Noland, Michael L.
08074552 Cl. 89-36.01.
Noldus, Rogier August Caspar Joseph: See--
Hartog, Jos den; Noldus, Rogier August Caspar Joseph; and Taori, Rakesh
08077703 Cl. 370-352.
Nolte, Bert: See--
Kroth, Heiko; Feuerstein, Tim; Richter, Frank; Boer, Jürgen; Essers, Michael; Nolte, Bert; Schneider, Matthias; Hochgürtel, Matthias; Frickel, Fritz-Frieder; Taveras, Arthur G.; and Steeneck, Christoph
08076330 Cl. 514-236.2.
Noman, Syed Mohammad Shiblee: See--
Cox, Donald W.; and Noman, Syed Mohammad Shiblee
08075304 Cl. 431-90.
Nomoto, Masakazu; Mochizuki, Yasushi; and Nagao, Keisuke, to Canon Kabushiki Kaisha Printing control apparatus, information processing apparatus, control method therefor, computer program, and computer-readable storage medium
08077339 Cl. 358-1.16.
Nomura, Kazushi: See--
Teramoto, Yoji; Fujiwara, Ryoji; Nishimura, Michiyo; Nomura, Kazushi; and Murakami, Shunsuke
08075360 Cl. 445-51.
Nomura, Koji: See--
Minamio, Masanori; Tomita, Yoshihiro; and Nomura, Koji
08077900 Cl. 381-355.
Nomura, Satoyuki: See--
Tsuda, Yoshihiro; Morishita, Yoshii; Nomura, Satoyuki; Hoshi, Yousuke; Funyuu, Shigeaki; Motamedi, Farshad J.; and Wang, Li-Sheng
08075943 Cl. 427-66.
Nomura, Yujiro: See--
Inoue, Nozomu; and Nomura, Yujiro
08077190 Cl. 347-130.
Nomura, Yuki: See--
Shoda, Kazuo; Nomura, Yuki; and Nagato, Yoshifumi
08076890 Cl. 318-599.
Nonaka, Kazuhiro: See--
Yamamoto, Yoichi; Nonaka, Kazuhiro; and Nakai, Masaki
08076896 Cl. 318-801.
Nonaka, Masao: See--
Matsuzaki, Natsume; Yokota, Kaoru; Nonaka, Masao; Inoue, Mitsuhiro; Nakahara, Tohru; and Higashi, Akio
08077980 Cl. 382-209.
Nonaka, Yusuke; Yamamoto, Akira; Matsunami, Naoto; and Sonoda, Koji, to Hitachi, Ltd. Arrangements for managing metadata of an integrated logical unit including differing types of storage media
08078819 Cl. 711-165.
Noni, Lisa M: See--
Helfinstine, John David; McIntosh, Robert A; Noni, Lisa M; Shi, Zhiqiang; Widjaja, Sujanto; and Worthey, David John
08074518 Cl. 73-598.
Noonan, Joseph S.; Nadler, Barry R.; and Insler, Julius R., to Binj Laboratories, Inc. Systems and methods for detection of transmission facilities
08078190 Cl. 455-456.1.
Noordegraaf, Jan; to Synbra Technology B.V. Particulate expandable polystyrene (EPS), process for making particulate expandable polystyrene, as well as a particular application of polystyrene foam material
08076380 Cl. 521-56.
Nord, Lars; and Horppu, Petri, to Carmel Pharma AB Piercing member protection device
08075550 Cl. 604-533.
Nordberg, Timothy J.: See--
Bracken, Scott J.; Chian, Brent; Nordberg, Timothy J.; and Troost, Henry E.
08074892 Cl. 236-1H.
Nordex Energy GmbH: See--
Keller, Harald; Wiese-Müller, Lars-Ulrich; and Voβ, Eberhard
08075266 Cl. 416-37.
Nordson Corporation: See--
Burmester, Thomas; and Kufner, Hubert
08074902 Cl. 239-553.5.
Fiske, Erik; Quinones, Horatio; Maiorca, Phillip P.; Babiarz, Alec; and Ciardella, Robert
08074467 Cl. 62-389.
Nordstrom, Diane: See--
Goldenberg, David M.; Qu, Zhengxing; Chang, Chien-Hsing; Rossi, Edmund A.; Yang, Jeng-Dar; and Nordstrom, Diane
08076140 Cl. 435-455.
Norgren GT Development Corporation: See--
Stephens, Charles; and Morris, John Michael
08074684 Cl. 137-625.21.
Nori, Aditya Vithal: See--
Chilimbi, Trishul Amit Madhukar; Vaswani, Kapil; and Nori, Aditya Vithal
08079020 Cl. 717-132.
Normand, Joseph: See--
Mercat, Jean-Pierre; Veux, Jean-Luc; and Normand, Joseph
08075065 Cl. 301-124.2.
Normile, James Oliver: See--
Price, Douglas; Zhou, Xiaosong; Wu, Hsi-Jung; and Normile, James Oliver
08077256 Cl. 348-364.
Noro, Yoshihiko: See--
Jabri, Khaled; Arai, Atsushi; Nishimura, Hiromichi; Noro, Yoshihiko; and Takeda, Dai
08077389 Cl. 359-487.02.
Norris, Steven J.; to Board of Regents of the University of Texas System, The VMP-like sequences of pathogenic Borrelia species and strains
08076470 Cl. 536-23.7.
Norrman, Karl: See--
Åström, Bo; Ivars, Ignacio Más; Carlsson, Hans; Cheng, Yi; and Norrman, Karl
08078733 Cl. 709-227.
Norstar Office Products, Inc.: See--
Nortel Networks Limited: See--
El-Hennaway, Mohamed Samy; Goubran, Rafik A.; and Qian, Zhihong
08077636 Cl. 370-260.
Wang, Phil; Monga, Indermohan; Lavian, Tal; Durairaj, Ramesh; and Travostino, Franco
08078708 Cl. 709-223.
Wu, Shiquan; Tong, Wen; and Strawczynski, Leo
08077599 Cl. 370-208.
North, Angus John: See--
Silverbrook, Kia; North, Angus John; and McAvoy, Gregory John
08075111 Cl. 347-84.
North Cell Pharmacetical: See--
North Pole Limited: See--
Northrop Grumman Systems Corporation: See--
Talbot, Patrick James; Ellis, Dennis Regan; and Sanders, J. Ryan
08078559 Cl. 706-45.
Norton Healthcare Limited: See--
Norton, Richard L.: See--
Moore, Lester; and Norton, Richard L.
08076448 Cl. 528-492.
Norwood, Robert A.; and Skotheim, Terje Nanoamorphous carbon-based photonic crystal infrared emitters
08076617 Cl. 219-407.
Notarangelo, Giuseppe: See--
Pappalardo, Francesco; Notarangelo, Giuseppe; Salurso, Elena; and Guidetti, Elio
08078804 Cl. 711-130.
Noto, Nobuhiko: See--
Oka, Satoshi; and Noto, Nobuhiko
08076223 Cl. 438-503.
Nottingham, Brett Wells: See--
Othmer, Konstantin; and Nottingham, Brett Wells
08077832 Cl. 379-85.
Novak, Michael: See--
Sacson, Ilia; Novak, Michael; and McConnell, Christopher Clayton
08079065 Cl. 726-4.
Novar ED&S Limited: See--
Thirugnanasambandham, Kanthimathinathan
08076862 Cl. 315-209R.
Novartis AG: See--
Albientz, Patrick; Grenet, Jean-Michel; Hillenbrand, Rainer; Legay, Francois; Marbach, Peter; Marrony, Severine; and Schaefer, Judith
08076160 Cl. 436-501.
Fairhurst, Robin A
08076489 Cl. 548-165.
Herold, Peter; Mah, Robert; Tschinke, Vincenzo; Stojanovic, Aleksandar; Marti, Christiane; Stutz, Stefan; and Bennacer, Bibia
08076327 Cl. 514-224.2.
Portmann, Robert; Hofmeier, Urs Christoph; Burkhard, Andreas; Scherrer, Walter; and Szelagiewicz, Martin
08076362 Cl. 514-359.
Novello, Stefano: See--
Vasseur, Jean-Philippe Marcel; Novello, Stefano; and Previdi, Stefano Benedetto
08077713 Cl. 370-390.
Novo Nordisk A/S: See--
DeFrees, Shawn; Zopf, David A.; Bayer, Robert J.; Bowe, Caryn; Hakes, David James; and Chen, Xi
08076292 Cl. 514-14.1.
Larsen, Carsten Gerner; Stenholt, Lars; Molin, Anders; Rex, Jørn; and Larsen, Bjørn Gullak
08075522 Cl. 604-110.
Novotney, Donald J.; Filson, John B.; and Tupman, David, to Apple Inc. Electronic device having a dual key connector
08078776 Cl. 710-62.
Novozymes A/S: See--
Allain, Eric; Wenger, Kevin S.; and Bisgard-Frantzen, Henrik
08076109 Cl. 435-132.
Deinhammer, Randy; and Festersen, Rikke Monica
08076112 Cl. 435-161.
Wik, Monica Takamiya; and Sjoholm, Carsten
08076115 Cl. 435-196.
Nowak, Edward J.: See--
Anderson, Brent A.; and Nowak, Edward J.
08076204 Cl. 438-283.
Noyes, Mark: See--
Brickfield, Peter J.; Mahling, Dirk; Noyes, Mark; and Weaver, David
08078330 Cl. 700-291.
Nozawa, Eisuke: See--
Yamada, Hiroyoshi; Itahana, Hirotsune; Moritomo, Ayako; Matsuzawa, Takaho; Nozawa, Eisuke; Akuzawa, Shinobu; and Harada, Koichiro
08076348 Cl. 514-277.
Nozue, Yoshinobu; and Kawashima, Yasutoyo, to Sumitomo Chemical Company, Limited Ethylene based polymer composition and film
08076418 Cl. 525-191.
NTT DoCoMo, Inc.: See--
Eguchi, Hisatoshi; and Miura, Fumiaki
08079064 Cl. 726-4.
Goto, Yoshikazu; Hanaki, Akihito; Hayashi, Takahiro; Kawamoto, Junichiro; and Takagi, Yukiko
08078186 Cl. 455-452.1.
Ishii, Hiroyuki; Sato, Takuya; and Ando, Hidehiro
08077794 Cl. 375-267.
Kozat, Ulas C.; Demircin, Mehmet U.; Harmanci, Oztan; and Kanumuri, Sandeep
08078729 Cl. 709-226.
Nuctech Company Limited: See--
Hu, Haifeng; Li, Yuanjing; Zhang, Qingjun; and Chen, Zhiqiang
08076638 Cl. 250-288.
NuFlare Technology, Inc.: See--
Abe, Takayuki; and Tsuchiya, Hideo
08078012 Cl. 382-317.
Sakai, Michihiro; Kakehi, Ryoichi; and Hattori, Kiyoshi
08076649 Cl. 250-396R.
Shibata, Hayato
08076656 Cl. 250-492.22.
Nulkar, Chaitanya; Kemp, Jeffrey A.; Grier, James R.; and Mathew, Jose, to Network Appliance, Inc. Method and apparatus for testing a storage system head in a clustered failover configuration
08078718 Cl. 709-224.
Numano, Yasuhisa; and Satake, Kenji, to Fujitsu Toshiba Mobile Communications Limited Mobile phone with a plurality of speakers
08078239 Cl. 455-575.4.
Numatics, Incorporated: See--
De Carolis, Enrico; Eskew, John F.; Hundt, Michael W.; and Welker, Jeffrey
08074680 Cl. 137-560.
Numazawa, Sumito; Nakazawa, Yoshito; Kobayashi, Masayoshi; Kudo, Satoshi; Imai, Yasuo; Kubo, Sakae; Shigematsu, Takashi; Ohnishi, Akihiro; Uesawa, Kozo; and Oishi, Kentaro, to Renesas Electronics Corporation Method of fabricating semiconductor device
08076202 Cl. 438-270.
Nunally, Patrick O'Neal System and method for in-situ integrity and performance monitoring of operating metallic and non-metallic natural gas transmission and delivery pipelines using ultra wideband point-to point and point-to point and point-to-multipoint communication
08076928 Cl. 324-220.
Nuno, Katsuhiko; to Ricoh Company, Ltd. Lens barrel, lens driving apparatus, camera, and mobile information terminal
08077408 Cl. 359-813.
Nuno, Tatsumi: See--
Soma, Ryoji; Tamato, Toyomochi; Akiba, Masatsugu; and Nuno, Tatsumi
08076402 Cl. 524-291.
Nunokawa, Hirokazu: See--
Ishimoto, Bunji; and Nunokawa, Hirokazu
08075085 Cl. 347-19.
Nuss, John M.: See--
Anand, Neel K.; Blazey, Charles M.; Bowles, Owen Joseph; Bussenius, Joerg; Bannen, Lynne Canne; Chan, Diva Sze-Ming; Chen, Baili; Co, Erick Wang; Costanzo, Simona; Defina, Steven Charles; Dubenko, Larisa; Franzini, Maurizio; Huang, Ping; Jammalamadaka, Vasu; Khoury, Richard George; Kim, Moon Hwan; Klein, Rhett Ronald; Le, Donna Tra; Mac, Morrison B.; Nuss, John M.; Parks, Jason Jevious; Rice, Kenneth D.; Tsang, Tsze H.; Tsuhako, Amy Lew; Wang, Yong; and Xu, Wei
08076338 Cl. 514-252.02.
Nutaro, Joseph: See--
Lazarovich, David; Nutaro, Joseph; Gayowsky, Ted; Rusan, Ileana; Lee, Sang-Joon; Dangeti, Srinivasa Rao; Pesala, Narasimha Rao; Surisetty, Lakshminarayana; Gudimetla, Gopi; and Singh, Amit Kumar
08078342 Cl. 701-3.
Nutek Orthopaedics, Inc.: See--
Hajianpour, Mohammed A.
08075560 Cl. 606-59.
Nutley, Brian: See--
Nutley, Kim; and Nutley, Brian
08074723 Cl. 166-380.
Nutley, Kim; and Nutley, Brian, to Swelltec Limited Ring member for a swellable downhole packer
08074723 Cl. 166-380.
Nutting, John; and Daniel, Richard Substance identification and location method and system
08076924 Cl. 324-71.1.
NuVasive, Inc.: See--
Butcher, Peter; and Reah, Christopher
08074591 Cl. 112-475.18.
NVIDIA Corporation: See--
Lindholm, John Erik; Montrym, John S.; Kilgariff, Emmett M.; Moy, Simon S.; Treichler, Sean Jeffrey; Coon, Brett W.; Kirk, David; and Danskin, John
08077174 Cl. 345-419.
Rogers, Douglas H.; King, Gary C.; and Donovan, Walter E.
08078656 Cl. 708-200.
Tarjan, David; and Skadron, Kevin
08078844 Cl. 712-216.
NXP B.V.: See--
Kleihorst, Richard P.; Abbo, Antench A.; and Choudhary, Vishal S.
08078830 Cl. 712-10.
Krabbenborg, Bernardus Henricus; Berkhout, Marco; and Van Zwol, Johannes
08077440 Cl. 361-56.
Lindstrom, Mats; and Shafie, Abbolreza
08078129 Cl. 455-266.
Pontius, Timothy; and Roever, Jens
08078948 Cl. 714-798.
Witschnig, Harald; and Bruckbauer, Johannes
08078125 Cl. 455-205.
Nyce, David Scott Method and apparatus for simulating a potentiometer
08077067 Cl. 341-144.
Nycz, Jeffrey H.; to Warsaw Orthopedic, Inc Implantable tissue growth stimulator
08078282 Cl. 607-51.
Nykänen, Jari: See--
Hietaranta, Timo; and Nykänen, Jari
08075941 Cl. 427-8.