LIST OF PATENTEES
TO WHOM
PATENTS WERE ISSUED ON THE 13th DAY OF December, 2011
NOTE--Arranged in accordance with the first significant character or word of the name
(in accordance with city and telephone directory practice).

N.V. Nutricia: See--
Hageman, Robert J. J. 08076282 Cl. 514-2.
Speelmans, Gelske; and Govers, Maria Johanna Adriana Petronella 08076313 Cl. 514-54.
Na, Byoung-Sun: See--
Lee, Hyeok-Jin; Kim, Hee-Seop; Na, Byoung-Sun; Gang, LuJian; Woo, Hwa-Sung; and Kwon, Ji-Hyun 08077265 Cl. 349-39.
Nabar, Rohit U.: See--
Lee, Jungwon; Nabar, Rohit U.; Choi, Jihwan P.; and Lou, Hui-Ling 08077785 Cl. 375-260.
Naccache, David; and Troumelin, Michael, to Compagnie Industrielle et Financiere d'Ingenierie “Ingenico” Payment terminal, and associated method and program 08074872 Cl. 235-379.
Naccache, David; to Compagnie Industrielle et Financiere d'Ingenierie “Ingenico” Terminal, method of checking conformity of at least one removable battery of an electronic payment terminal, and the corresponding removable battery and computer program product 08074888 Cl. 235-472.02.
Nachreiner, Michael William: See--
Waters, Eric Scott; Nachreiner, Michael William; Jacobs, Gregory F.; and Zarynow, John 08074424 Cl. 52-834.
Nachum, Youval: See--
Arad, Carmi; and Nachum, Youval 08077608 Cl. 370-229.
Arad, Carmi; and Nachum, Youval 08077610 Cl. 370-230.
Nada, Naoji; to Sony Corporation Illumination apparatus, color conversion device, and display apparatus 08075148 Cl. 362-84.
Nadjar, Hechem: See--
Laurens, Claire; Nadjar, Hechem; Rebuffatti, Anne Claire; Rodrigues, Catherine; Wang, Kathy; and Soubigou, Chantal 08076399 Cl. 524-77.
Nadler, Barry R.: See--
Noonan, Joseph S.; Nadler, Barry R.; and Insler, Julius R. 08078190 Cl. 455-456.1.
Nadolski, Timothy J.: See--
Scheller, Gregg D.; Auld, Michael D.; and Nadolski, Timothy J. 08075553 Cl. 606-13.
Nadzadi, Mark Ellsworth: See--
Otto, Jason Karl; McKinnon, Brian W.; and Nadzadi, Mark Ellsworth 08078440 Cl. 703-6.
Nag, Soumya K.: See--
Mohamadi, Farrokh; and Nag, Soumya K. 08077072 Cl. 342-22.
Nagadomi, Yasushi; Takashima, Daisaburo; and Hatsuda, Kosuke, to Kabushiki Kaisha Toshiba Semiconductor memory device with error correction 08078923 Cl. 714-706.
Nagai, Haruo: See--
Yamamoto, Masahiro; Ono, Syunsuke; Ozasa, Minoru; Ichibakase, Tsuyoshi; Seki, Tomoyuki; Tsutatani, Takashi; and Nagai, Haruo 08076852 Cl. 313-594.
Nagai, Kouichi: See--
Saigoh, Kaoru; and Nagai, Kouichi 08076780 Cl. 257-760.
Takahashi, Makoto; and Nagai, Kouichi 08076212 Cl. 438-396.
Nagai, Naoshi: See--
Mita, Naruyoshi; Chida, Mitsuaki; Kawaguchi, Masaru; Otsuka, Kengo; Nagai, Naoshi; Yamazaki, Takaaki; and Ichihashi, Tetsuya 08076478 Cl. 544-198.
Nagai, Norihiro: See--
Seki, Yasuharu; Konno, Tatsuya; and Nagai, Norihiro 08079028 Cl. 717-171.
Nagamichi, Yasuhiro: See--
Morichika, Shunji; Morita, Katsuaki; Yamaguchi, Masahiro; Katahira, Kosuke; and Nagamichi, Yasuhiro 08074577 Cl. 104-139.
Nagao, Keisuke: See--
Nomoto, Masakazu; Mochizuki, Yasushi; and Nagao, Keisuke 08077339 Cl. 358-1.16.
Nagao, Manabu; to Kabushiki Kaisha Toshiba Apparatus, method and computer program product for translating speech, and terminal that outputs translated speech 08078449 Cl. 704-8.
Nagao, Naoyuki: See--
Seki, Fujio; and Nagao, Naoyuki 08078917 Cl. 714-38.1.
Nagao, Yoshiki: See--
Matsumoto, Toshihiro; Nagao, Yoshiki; Kusakabe, Hiroki; Kawabata, Norihiko; and Arai, Kenji 08076017 Cl. 429-66.
Nagaoka, Nobuharu: See--
Watanabe, Masahito; Tsuji, Takayuki; Hattori, Hiroshi; Nagaoka, Nobuharu; Takatsudo, Izumi; and Saka, Masakazu 08077909 Cl. 382-100.
Yokochi, Yuji; Nagaoka, Nobuharu; and Taniguchi, Fuminori 08077204 Cl. 348-148.
Nagasawa, Namiko Satoh: See--
Jackson, David Peter; Nagasawa, Namiko Satoh; Sakai, Hajime; and Nagasawa, Nobuhiro 08076141 Cl. 435-468.
Nagasawa, Nobuhiro: See--
Jackson, David Peter; Nagasawa, Namiko Satoh; Sakai, Hajime; and Nagasawa, Nobuhiro 08076141 Cl. 435-468.
Nagasawa, Toshio: See--
Uno, Tomoaki; Shiraishi, Masaki; Matsuura, Nobuyoshi; and Nagasawa, Toshio 08076767 Cl. 257-686.
Nagase, Hisato: See--
Shimohara, Norihide; Nagase, Hisato; and Takahashi, Hidenori 08076392 Cl. 523-160.
Nagase, Takahiro: See--
Inagaki, Naoyuki; Mori, Tatsuya; Ohara, Osamu; and Nagase, Takahiro 08076307 Cl. 514-44A.
Nagashima, Nobuyoshi: See--
Nakagawa, Hidetoshi; Tsubata, Toshihide; Nagashima, Nobuyoshi; and Hisada, Yuhko 08077284 Cl. 349-144.
Nagashima, Syunichi: See--
Yatagai, Hiroomi; and Nagashima, Syunichi 08074971 Cl. 261-106.
Nagata, Hiroshi; and Shingaki, Yoshinori, to Ulvac, Inc. Coating method and apparatus, a permanent magnet, and manufacturing method thereof 08075954 Cl. 427-250.
Nagata, Munetake: See--
Sasaoka, Yoshimasa; Shiraishi, Ryuichi; Kawachidani, Toshio; Nakamura, Tsuyoshi; and Nagata, Munetake 08078093 Cl. 399-405.
Nagata, Tatsuki; and Kawakami, Toshihiro, to OMRON Corporation Seat control device 08078366 Cl. 701-49.
Nagato, Yoshifumi: See--
Shoda, Kazuo; Nomura, Yuki; and Nagato, Yoshifumi 08076890 Cl. 318-599.
Nagatomi, Sheila: See--
Shalaby, Shalaby W; Vaughn, Michael Aaron; Peniston, Shawn J; and Nagatomi, Sheila 08076388 Cl. 523-115.
Nagatsuka, Tetsuro: See--
Iga, Soichiro; Nagatsuka, Tetsuro; and Shinnishi, Makoto 08078988 Cl. 715-800.
Nagayama, Katsuhiro: See--
Otsuka, Masayuki; Nagayama, Katsuhiro; and Kitagawa, Takashi 08078069 Cl. 399-49.
Nagayama, Masatoshi: See--
Ichinose, Hiroaki; and Nagayama, Masatoshi 08076023 Cl. 429-163.
Nagayama, Tomohiko: See--
Yamamoto, Hideo; Hanaki, Naofumi; Teruyama, Katsuyuki; Nagayama, Tomohiko; Sueyoshi, Masahiro; and Hirano, Yoshiaki 08079078 Cl. 726-17.
Nagel, Uwe: See--
Breunig, Achim; and Nagel, Uwe 08077138 Cl. 345-102.
Nagesh, Saresh: See--
Kumar, Pramod; and Nagesh, Saresh 08074955 Cl. 248-519.
Nagle, Greg A.: See--
McKernan, Pat S.; and Nagle, Greg A. 08078315 Cl. 700-228.
Naguib, Ayman Fawzy; and Ji, Tingfang, to QUALCOMM Incorporated Signaling transmission and reception in wireless communication systems 08077596 Cl. 370-208.
Nair, Vijay K.: See--
Suh, Seong-youp; Nair, Vijay K.; and Choudhury, Debabani 08077095 Cl. 343-702.
Naitoh, Kei: See--
Saito, Takuya; Tanaka, Chiaki; Ishii, Masayuki; Watanabe, Naohiro; and Naitoh, Kei 08076051 Cl. 430-137.1.
Naitou, Hidehiro: See--
Kurihara, Norihiko; Iizaka, Hitoshi; Yamada, Yoshiya; Mihara, Hidemi; Tsuchiya, Osamu; and Naitou, Hidehiro 08074881 Cl. 235-383.
Naitou, Takahiro: See--
Tamaki, Hiroto; Naitou, Takahiro; and Murazaki, Yoshinori 08076847 Cl. 313-512.
Naitou, Takashi: See--
Sawai, Yuichi; Shiono, Osamu; Namekawa, Takashi; Naitou, Takashi; Hayashibara, Mitsuo; Kijima, Yuichi; Hirasawa, Shigemi; Asakura, Shunichi; Yamamoto, Hiroki; and Hatori, Akira 08075961 Cl. 428-1.5.
Nakada, Takayuki: See--
Morita, Shinya; Sada, Koichi; Nakada, Takayuki; and Matsuda, Tomoyuki 08076615 Cl. 219-390.
Nakagaito, Tatsuya: See--
Kaneko, Shinjiro; Matsuda, Hiroshi; Kawasaki, Yoshiyasu; Nakagaito, Tatsuya; Suzuki, Yoshitsugu; Fushiwaki, Yusuke; Kawano, Takashi; and Matsuoka, Saiji 08076008 Cl. 428-659.
Nakagaki, Yoshio; to Denso Corporation Failure-diagnosis information collection system 08078355 Cl. 701-35.
Nakagami, Taro: See--
Shimura, Masaru; Nakagami, Taro; and Ohkuri, Kazunobu 08077882 Cl. 381-102.
Nakagawa, Hidetoshi; Tsubata, Toshihide; Nagashima, Nobuyoshi; and Hisada, Yuhko, to Sharp Kabushiki Kaisha Substrate for a display device, a method for repairing the same, a method for repairing a display device and a liquid-crystal display device 08077284 Cl. 349-144.
Nakagawa, Hiroki: See--
Nakamura, Atsushi; Nakagawa, Hiroki; Nakashima, Hiromitsu; Tsuji, Takayuki; Dougauchi, Hiroshi; Kouno, Daita; and Nishimura, Yukio 08076053 Cl. 430-270.1.
Nakagawa, Katsumi: See--
Oda, Kouji; Fuchigami, Hiroyuki; Yamagata, Yusuke; Nakagawa, Katsumi; and Ohyama, Junji 08076844 Cl. 313-506.
Nakagawa, Koichi; Sugihara, Reiko; Shimizu, Tetsuo; and Takagi, Shusaku, to JFE Steel Corporation Hot-rolled high strength steel sheet having excellent ductility, and tensile fatigue properties and method for producing the same 08075711 Cl. 148-328.
Nakagawa, Masamichi: See--
Okamoto, Shusaku; Ishii, Hirofumi; Nakagawa, Masamichi; Nobori, Kunio; and Morimura, Atsushi 08077202 Cl. 348-148.
Nakagawa, Shuichi: See--
Koyama, Masahiro; Ogawa, Hironori; Shibata, Nobuo; Matsushima, Masaru; Kobayashi, Toshinori; and Nakagawa, Shuichi 08076651 Cl. 250-442.11.
Nakahara, Hiroshi: See--
West, Robert C.; Amine, Khalil; Zhang, Zhengcheng; Wang, Qingzheng; Rossi, Nicholas A. A.; Yoon, Sang Young; and Nakahara, Hiroshi 08076032 Cl. 429-313.
Nakahara, Shuichi: See--
Narita, Nobuhiko; Nakahara, Shuichi; Onoyama, Hiroyuki; Tonomura, Hironori; Nakao, Yasushi; and Matsuno, Yoshizumi 08076413 Cl. 525-72.
Nakahara, Tohru: See--
Matsuzaki, Natsume; Yokota, Kaoru; Nonaka, Masao; Inoue, Mitsuhiro; Nakahara, Tohru; and Higashi, Akio 08077980 Cl. 382-209.
Nakai, Masaki: See--
Yamamoto, Yoichi; Nonaka, Kazuhiro; and Nakai, Masaki 08076896 Cl. 318-801.
Nakajima, Akihiro: See--
Kano, Toshihiro; and Nakajima, Akihiro 08078356 Cl. 701-36.
Nakajima, Eiji: See--
Nanjo, Yuzuru; Nakajima, Eiji; Kondo, Akihiro; Ishida, Naoyuki; Gon, Syoukou; and Kasama, Kenichi 08078072 Cl. 399-67.
Nakajima, Genei; to Hitachi Metals, Ltd. Ceramic sintered compact and piezoelectric element 08075996 Cl. 428-402.
Nakajima, Hiroaki; and Ohashi, Toshikazu, to Medikit Co., Ltd. Indwelling needle assembly 08075529 Cl. 604-164.11.
Nakajima, Noriko; Taguchi, Yuichi; and Mizuno, Jun, to Hitachi, Ltd. Power-saving-backup management method 08078815 Cl. 711-162.
Nakajima, Satoshi: See--
Miyata, Yoshinao; Goto, Kazutoshi; Nakajima, Satoshi; Kori, Toshiaki; and Takahashi, Tomoaki 08075106 Cl. 347-71.
Nakajima, Takamitsu: See--
Yamaji, Takahiro; Watanabe, Masahide; Nakajima, Takamitsu; Kamata, Hiroki; and Kimura, Akira 08075324 Cl. 439-188.
Nakajo, Satoshi: See--
Muraji, Akio; Oketani, Kazunobu; Nakajo, Satoshi; Okuno, Hiromitsu; and Nakamura, Hisashi 08077188 Cl. 345-690.
Nakamae, Masato: See--
Nii, Shinsuke; Nakamae, Masato; and Tokoh, Makio 08076433 Cl. 526-304.
Nakamura, Akihiro: See--
Ohmura, Ken; Nakamura, Akihiro; Furuichi, Makoto; and Konishi, Hayato 08078077 Cl. 399-82.
Nakamura, Atsushi: See--
Lim, Kian Kiat; Nakamura, Atsushi; Tan, Kai Pheng; Lim, Eng Soon; Fu, Poh Ling; and Kamimura, Takaaki 08076186 Cl. 438-162.
Nakamura, Atsushi; Nakagawa, Hiroki; Nakashima, Hiromitsu; Tsuji, Takayuki; Dougauchi, Hiroshi; Kouno, Daita; and Nishimura, Yukio, to JSR Corporation Upper layer-forming composition and photoresist patterning method 08076053 Cl. 430-270.1.
Nakamura, Dai; to Kabushiki Kaisha Toshiba Nonvolatile semiconductor memory device 08077525 Cl. 365-185.29.
Nakamura, Daisuke: See--
Fukuoka, Yoshihito; Nakamura, Daisuke; Yamauchi, Hirotoshi; and Hasegawa, Sachiyo 08075357 Cl. 440-88L.
Nakamura, Hajime; Minowa, Takehisa; and Hirota, Koichi, to Shin-Etsu Chemical Co., Ltd. Method for preparing rare earth permanent magnet material 08075707 Cl. 148-122.
Nakamura, Hiroaki: See--
Tomizawa, Yasushi; Harada, Kohsuke; Nakamura, Hiroaki; Ishihara, Yoshiyuki; and Takakura, Shinji 08077425 Cl. 360-75.
Nakamura, Hiroaki; and Ono, Kohichi, to International Business Machines Corporation System and method for verifying operation of a target system 08078915 Cl. 714-37.
Nakamura, Hiroshi: See--
Nakano, Takeshi; Nakamura, Hiroshi; and Hosono, Koji 08077523 Cl. 365-185.23.
Nakamura, Hisashi: See--
Muraji, Akio; Oketani, Kazunobu; Nakajo, Satoshi; Okuno, Hiromitsu; and Nakamura, Hisashi 08077188 Cl. 345-690.
Nakamura, Hitoshi: See--
Ito, Satoru; Nakamura, Hitoshi; Matsui, Taijiro; and Nitta, Michio 08076255 Cl. 501-124.
Nakamura, Kazuto: See--
Nishikawa, Kazuhiro; Kai, Yoshihiro; and Nakamura, Kazuto 08077264 Cl. 349-12.
Nakamura, Kazuyasu: See--
Ohta, So; Ando, Hiroshi; Suzuki, Masayo; Kawamoto, Shinobu; Nakano, Mariko; and Nakamura, Kazuyasu 08076458 Cl. 530-387.1.
Nakamura, Kenji; and Okada, Yoshihiro, to Sharp Kabushiki Kaisha Active matrix substrate having interleaved source and drain electrodes on circle semiconductor and display device including same 08077266 Cl. 349-43.
Nakamura, Kouichi: See--
Nishimura, Takao; Kumagaya, Yoshikazu; Takashima, Akira; Nakamura, Kouichi; and Aiba, Kazuyuki 08076785 Cl. 257-780.
Nakamura, Kunihiko: See--
Yoshizawa, Jun; Sato, Shin-ichi; Nakamura, Kunihiko; and Yamashita, Tomohiro 08075126 Cl. 347-100.
Nakamura, Masato: See--
Tanaka, Yasuhiro; Fukuda, Toshio; and Nakamura, Masato 08075124 Cl. 347-100.
Tanaka, Yasuhiro; Fukuda, Toshio; and Nakamura, Masato 08075125 Cl. 347-100.
Nakamura, Naohiro; and Kuwahara, Shiori, to Olympus Corporation Electric connector for endoscope, endoscope, and method for assembling electric connector 08075477 Cl. 600-132.
Nakamura, Naotoshi: See--
Kumatani, Kazuhiko; Takano, Yoshihisa; Nakamura, Naotoshi; Ogasa, Mototsugu; Nakamura, Takashi; and Iizuka, Minoru 08076576 Cl. 174-50.51.
Nakamura, Shiho: See--
Yanagi, Satoshi; Ohsawa, Yuichi; Nakamura, Shiho; Saida, Daisuke; and Morise, Hirofumi 08077509 Cl. 365-173.
Nakamura, Shoichi; to ACP Japan Co., Ltd. Holder for a surgical knife blade 08074364 Cl. 30-335.
Nakamura, Tadashi; Echigo, Fumio; and Hirai, Shogo, to Panasonic Corporation Multilayer wiring board and its manufacturing method 08076589 Cl. 174-262.
Nakamura, Takao: See--
Maruyama, Takaharu; Nakamura, Takao; Itadani, Hiraku; and Tanaka, Ken-ichi 08076455 Cl. 530-350.
Nakamura, Takashi: See--
Fujita, Tetsuo; Nakamura, Takashi; Suzuki, Shigeru; and Shinoda, Kozo 08075868 Cl. 423-602.
Kumatani, Kazuhiko; Takano, Yoshihisa; Nakamura, Naotoshi; Ogasa, Mototsugu; Nakamura, Takashi; and Iizuka, Minoru 08076576 Cl. 174-50.51.
Tada, Masahiro; Nakamura, Takashi; Hayashi, Hirotaka; Fuchi, Masayoshi; and Imai, Takayuki 08076631 Cl. 250-226.
Nakamura, Tomokazu; to Fujifilm Corporation Apparatus for detecting blinking state of eye 08077215 Cl. 348-222.1.
Nakamura, Toshikazu: See--
Amano, Jun; Ito, Ken-ichi; Yamaura, Kazuhiro; Matsumoto, Kunio; and Nakamura, Toshikazu 08076289 Cl. 514-9.5.
Nakamura, Toshiyuki; Machida, Satoshi; Yabe, Sachiko; and Taguchi, Takashi, to Oki Semiconductor Co., Ltd. Fabrication method for device structure having transparent dielectric substrate 08076220 Cl. 438-479.
Nakamura, Tsuyoshi: See--
Sasaoka, Yoshimasa; Shiraishi, Ryuichi; Kawachidani, Toshio; Nakamura, Tsuyoshi; and Nagata, Munetake 08078093 Cl. 399-405.
Nakamura, Yoshiaki; Sorimachi, Masami; Kimura, Hitoshi; and Matsuyama, Shigeki, to Hitachi Cable, Ltd. Radiation resistant composition, wire and cable 08076408 Cl. 524-515.
Nakamura, Yoshifumi: See--
Ominato, Hiroyuki; Fujino, Hitoshi; Nakamura, Yoshifumi; and Yukawa, Hiroki 08077370 Cl. 359-207.5.
Nakamura, Yoshihiro; Yamada, Etsuo; Takagi, Keiji; and Chiba, Masataka, to Aisin Seiki Kabushiki Kaisha Target position identifying apparatus 08077199 Cl. 348-135.
Nakamura, Yoshinori; Hayashi, Norimitsu; Higashijima, Takanori; Kubota, Hitoshi; and Oka, Kozo, to Mitsubishi Tanabe Pharma Corporation Trisubstituted amine compound 08076364 Cl. 514-374.
Nakanishi, Koji: See--
Takahashi, Hideaki; Kiyono, Takaaki; and Nakanishi, Koji 08075825 Cl. 264-255.
Nakanishi, Nozomu: See--
Minowa, Nobuto; Nakanishi, Nozomu; Mitomi, Masaaki; Nara, Hideki; and Yokozawa, Tohru 08076503 Cl. 560-155.
Nakano, Hiroshi: See--
Kato, Atsushi; and Nakano, Hiroshi 08078081 Cl. 399-101.
Nakano, Itsuki; and Ikeuchi, Akira, to Mitsumi Electric Co., Ltd. Circuit for detecting remaining battery capacity 08076904 Cl. 320-132.
Nakano, Itsuki; and Ikeuchi, Akira, to Mitsumi Electric Co., Ltd. Digital signal processing apparatus 08077768 Cl. 375-239.
Nakano, Mariko: See--
Ohta, So; Ando, Hiroshi; Suzuki, Masayo; Kawamoto, Shinobu; Nakano, Mariko; and Nakamura, Kazuyasu 08076458 Cl. 530-387.1.
Nakano, Takeshi; Nakamura, Hiroshi; and Hosono, Koji, to Kabushiki Kaisha Toshiba Semiconductor memory device with a stacked gate including a charge storage layer and a control gate and method of controlling the same 08077523 Cl. 365-185.23.
Nakano, Teppei: See--
Hosokawa, Junichi; Koguchi, Yuuki; Tashiro, Keizo; and Nakano, Teppei 08077253 Cl. 348-354.
Nakano, Yutaka: See--
Watanabe, Manabu; Nakano, Yutaka; Ueda, Kenji; Kurashige, Mitsuharu; Hasegawa, Yasushi; Morozumi, Hiroyuki; and Itoyama, Sueki 08079014 Cl. 717-100.
Nakanowatari, Takanori: See--
Kakehi, Rumiko; Suzuki, Toshikatsu; and Nakanowatari, Takanori 08079089 Cl. 726-26.
Nakao, Hidetaka; Hayashi, Eisaku; Oishi, Kunio; Hayakawa, Isao; Miyake, Yoshiaki; Tateyama, Yoshikuni; and Ashihara, Takeshi, to Ebara Corporation Polishing apparatus and polishing method 08078306 Cl. 700-121.
Nakao, Masaki: See--
Higashiyama, Tadashi; and Nakao, Masaki 08078232 Cl. 455-566.
Nakao, Yasushi: See--
Narita, Nobuhiko; Nakahara, Shuichi; Onoyama, Hiroyuki; Tonomura, Hironori; Nakao, Yasushi; and Matsuno, Yoshizumi 08076413 Cl. 525-72.
Nakaoka, Hideaki: See--
Masuda, Rikiya; and Nakaoka, Hideaki 08078038 Cl. 386-297.
Nakashima, Hiromitsu: See--
Nakamura, Atsushi; Nakagawa, Hiroki; Nakashima, Hiromitsu; Tsuji, Takayuki; Dougauchi, Hiroshi; Kouno, Daita; and Nishimura, Yukio 08076053 Cl. 430-270.1.
Nakashima, Hisao: See--
Li, Lei; Tao, Zhenning; and Nakashima, Hisao 08078066 Cl. 398-209.
Nakashima, Kensaku: See--
Kodama, Hiroaki; and Nakashima, Kensaku 08078017 Cl. 385-14.
Nakashima, Masataka; Kinoshita, Yoko; and Itoh, Kiyoshi, to Dai Nippon Printing Co., Ltd. Optical layered body and method for producing optical layered body 08076446 Cl. 528-176.
Nakashima, Yoshimitsu; to Sharp Kabushiki Kaisha Solid-state image capturing device, manufacturing method for the same and electronic information device 08076225 Cl. 438-510.
Nakata, Tsuneo: See--
Zhu, Qiang; Iwashita, Hiroaki; Takayama, Koichiro; and Nakata, Tsuneo 08079001 Cl. 716-106.
Nakatsuka, Toshiyuki; Kadobayashi, Yusei; and Takano, Satoshi, to Kabushiki Kaisha Shofu Chemicals mixing container with offset communicating holes 08074794 Cl. 206-222.
Nakaya, Masaki; and Kan, Hirofumi, to Kirin Beer Kabushiki Kaisha Method for producing hermetically sealed container for beverage or food 08075726 Cl. 156-272.8.
Nakayama, Hiroshi: See--
Kinouchi, Satoshi; Takagi, Osamu; Tsueda, Yoshinori; Kitamura, Tetsuo; Nakayama, Hiroshi; Doi, Yohei; Kikuchi, Kazuhiko; Takai, Masanori; Kusaka, Toyoyasu; and Sone, Toshihiro 08078073 Cl. 399-69.
Nakayama, Satoshi; to Canon Kabushiki Kaisha Image pickup apparatus 08077225 Cl. 348-240.1.
Nakayama, Shinobu: See--
Okada, Rie; Nakayama, Shinobu; and Murakami, Toshio 08075836 Cl. 266-44.
Nakayama, Yoshikazu; Haruta, Masato; and Sekine, Hiroyuki, to Advantest Corporation Device, method, program, and recording medium for error factor determination, and output correction device and reflection coefficient measurement device provided with the device 08076947 Cl. 324-601.
Nakazato, Atsuro: See--
Yasuhara, Akito; Sakagami, Kazunari; Ohta, Hiroshi; and Nakazato, Atsuro 08076502 Cl. 560-119.
Nakazato, Syunji: See--
Katayose, Yoshiaki; Hirai, Takaaki; and Nakazato, Syunji 08076054 Cl. 430-306.
Nakazawa, Akira: See--
Silverbrook, Kia; Berry, Norman Micheal; Nakazawa, Akira; Mackey, Paul Ian; and Jackson, Garry Raymond 08075116 Cl. 347-86.
Silverbrook, Kia; Nakazawa, Akira; Hibbard, Christopher; Mackey, Paul Ian; Berry, Norman Micheal; and Jackson, Garry Raymond 08075110 Cl. 347-84.
Nakazawa, Shigeaki; to Fujitsu Limited Switching converter 08076915 Cl. 323-271.
Nakazawa, Takeo; Fujimura, Osamu; Ito, Junichi; and Murakawa, Jun, to Voith Patent GmbH Deflection compensation roll 08075736 Cl. 162-336.
Nakazawa, Yoshito: See--
Numazawa, Sumito; Nakazawa, Yoshito; Kobayashi, Masayoshi; Kudo, Satoshi; Imai, Yasuo; Kubo, Sakae; Shigematsu, Takashi; Ohnishi, Akihiro; Uesawa, Kozo; and Oishi, Kentaro 08076202 Cl. 438-270.
Nalley, Mark Weight plate locking and lifting system 08075458 Cl. 482-98.
Nam, Bo-Young: See--
Lee, Geonho; Nam, Dong-lim; Han, Young-chang; Nam, Bo-Young; and Lee, Jung-Kyung 08075291 Cl. 418-55.5.
Nam, Dong-lim: See--
Lee, Geonho; Nam, Dong-lim; Han, Young-chang; Nam, Bo-Young; and Lee, Jung-Kyung 08075291 Cl. 418-55.5.
Nam, Hui: See--
Kim, Beom-Shik; Nam, Hui; Park, Chan-Young; and Ku, Ja-Seung 08077117 Cl. 345-7.
Nam, Hye-Yeong: See--
Kim, Dae-Joong; Baek, In-Su; Park, Jong-Sang; Nam, Hye-Yeong; and Bai, Chengzhe 08075940 Cl. 427-2.25.
Namekawa, Takashi: See--
Sawai, Yuichi; Shiono, Osamu; Namekawa, Takashi; Naitou, Takashi; Hayashibara, Mitsuo; Kijima, Yuichi; Hirasawa, Shigemi; Asakura, Shunichi; Yamamoto, Hiroki; and Hatori, Akira 08075961 Cl. 428-1.5.
Nanda, Arun K.; and Wilson, Hervey, to Microsoft Corporation HTTP-based authentication 08078870 Cl. 713-166.
Nanda, Arun K.; Bhargava, Ruchita; and Melton, Lucas R., to Microsoft Corporation Portable personal identity information 08078880 Cl. 713-182.
Nangia, Vijay: See--
Sartori, Philippe J.; Baum, Kevin L.; Classon, Brian K.; Love, Robert T.; Nangia, Vijay; and Cudak, Mark Conrad 08077690 Cl. 370-342.
Nanjo, Yuzuru; Nakajima, Eiji; Kondo, Akihiro; Ishida, Naoyuki; Gon, Syoukou; and Kasama, Kenichi, to Kyocera Mita Corporation Image forming apparatus with image fixing device including an induction heater and a shield located between two sections of a core of the induction heater 08078072 Cl. 399-67.
Nankyo Efnica Co., Ltd.: See--
Ohama, Chiaki 08076385 Cl. 521-120.
Nannoni, Fabio: See--
Ballerio, Dante; and Nannoni, Fabio 08074921 Cl. 244-17.19.
Nanologica AB: See--
Garcia-Bennett, Alfonso 08075867 Cl. 423-592.1.
Nanoport Technologies: See--
Muray, Andrew Julius; and Muray, Kathleen 08075942 Cl. 427-10.
Nanosi Advanced Technologies, Inc.: See--
Nayfeh, Munir H.; and Alrokayan, Salman A. H. 08076410 Cl. 524-789.
Nanotherapeutics, Inc.: See--
Talton, James D. 08074906 Cl. 241-5.
Nanotope, Inc.: See--
Hulvat, James F.; and Guler, Mustafa O. 08076295 Cl. 514-17.7.
Nanya Technology Corp.: See--
Renn, Shing Hwa 08077512 Cl. 365-185.03.
Naoi, Hiroo: See--
Yoshimoto, Yuhsuke; Deguchi, Masanobu; Wakabayashi, Takeshi; Takenouchi, Kohichi; Morimoto, Kiyofumi; and Naoi, Hiroo 08078087 Cl. 399-258.
Naoi, Taro; Lin, Hai; Otani, Eishiro; and Ito, Hiroshi, to Panasonic Corporation Plasma display having a crystalline MgO dielectric layer 08076851 Cl. 313-587.
Naono, Takayuki: See--
Hishinuma, Yoshikazu; Fujii, Takamichi; Naono, Takayuki; Okamoto, Yuuichi; and Ozawa, Ryosuke 08075105 Cl. 347-68.
Nappa, Mario Josph: See--
Rao, Velliyur Nott Mallikarjuna; Nappa, Mario Josph; Minor, Barbara Haviland; Leck, Thomas J.; and Mouli, Nandini C. 08075796 Cl. 252-67.
Nara, Hideki: See--
Minowa, Nobuto; Nakanishi, Nozomu; Mitomi, Masaaki; Nara, Hideki; and Yokozawa, Tohru 08076503 Cl. 560-155.
Narajowski, David; Hall, Jacob; Whittaker, Chad; Mellon, David; Gustafson, Derek; Saxton, Jeremy; Santurbane, Mark Vincent; and Laakso, Thomas, to Black Diamond Equipment, Ltd. Modular boot sole system 08074380 Cl. 36-117.3.
Narang, Mohit; and Catovic, Amer, to Qualcomm Incorporated Method and apparatus for improving mobile-terminated call set-up performance 08078174 Cl. 455-436.
Narasimhan, Dave: See--
Hardee, Fred; Radhakrishnan, Gopinath; Carrillo, Marco; Narasimhan, Dave; and Nelson, Cherilyn N. 08074436 Cl. 57-224.
Hurwitz, Marni Markell; Narasimhan, Dave; and Buff, Ernest D. 08074605 Cl. 119-171.
Narasimhan, Mukundan: See--
Demaray, Richard E.; Zhang, Hong Mei; Narasimhan, Mukundan; and Milonopoulou, Vassiliki 08076005 Cl. 428-469.
Narayanachar, Nagesh; to Kyocera Corporation Wireless handset configured to forward multiple messages 08078202 Cl. 455-466.
Nardi, Flavio; Ryu, Jihan; Moshchuk, Nikolai K.; and O'Dea, Kevin A., to GM Global Technology Operations LLC Estimation of surface lateral coefficient of friction 08078351 Cl. 701-29.
Narita, Morio: See--
Toshioka, Shunsuke; Asanuma, Takamitsu; and Narita, Morio 08074446 Cl. 60-286.
Narita, Nobuhiko; Nakahara, Shuichi; Onoyama, Hiroyuki; Tonomura, Hironori; Nakao, Yasushi; and Matsuno, Yoshizumi, to Kansai Paint Co., Ltd. Aqueous metallic coating composition and method for forming a multilayer coating film 08076413 Cl. 525-72.
Narukawa, Yukio; Mitani, Tomotsugu; Ichikawa, Masatsugu; Kitano, Akira; and Misaki, Takao, to Nichia Corporation Nitride semiconductor element having a silicon substrate and a current passing region 08076694 Cl. 257-103.
Nash, Kevin; Ventura, Leon; and Garibay, Rafael, to Dole Fresh Vegetables, Inc. Lettuce harvesting for cup-shaped portions of heads 08074365 Cl. 30-346.
Nash, Reuel William: See--
Kirmse, Andrew; Nash, Reuel William; and Zelinka, Steve 08077918 Cl. 382-103.
Nashiki, Tomotake; and Sugawara, Hideo, to Nitto Denko Corporation Transparent conductive film 08075948 Cl. 427-167.
Nass, Andreas: See--
Schwettmann, Hartmut; Nass, Andreas; and Schnieder, Stefan 08075322 Cl. 439-82.
Nassor, Eric: See--
Maze, Frédéric; and Nassor, Eric 08077601 Cl. 370-216.
Maze, Frederic; and Nassor, Eric 08078752 Cl. 709-232.
Nathan, Anoo: See--
Nathan, Vaidhi; Gope, Chanden; and Nathan, Anoo 08075499 Cl. 600-587.
Nathan, Vaidhi: See--
Nathan, Vaidhi; Gope, Chanden; and Nathan, Anoo 08075499 Cl. 600-587.
Nathan, Vaidhi; Gope, Chanden; and Nathan, Anoo, to Nathan, Vaidhi Abnormal motion detector and monitor 08075499 Cl. 600-587.
National Central University: See--
Chien, Ming-Chen; and Chang, Pao-Chi 08077777 Cl. 375-240.17.
National Cheng Kung University: See--
Chen, Kuan-Ren 08078027 Cl. 385-129.
National Coupling Company, Inc.: See--
Smith, III, Robert E. 08075025 Cl. 285-374.
National Health Research Institutes: See--
Lin, Kurt Ming-Chao 08076531 Cl. 800-13.
National Institute of Advanced Industrial Science and Technology: See--
Fukuda, Osamu; Ueno, Naohiro; Tsubai, Masayoshi; and Akiyama, Morito 08075489 Cl. 600-459.
Ouchi, Shinichi; Liu, Yongxun; Masahara, Meishoku; Matsukawa, Takashi; and Endo, Kazuhiko 08077510 Cl. 365-184.
Yamada, Takatoshi; and Shikata, Shinichi 08075359 Cl. 445-51.
National Instruments Corporation: See--
Fuller, III, David W; Kornerup, Jacob; and Breyer, John R. 08078980 Cl. 715-763.
National Semiconductor Corporation: See--
Chiu, Hon Kin 08076995 Cl. 333-81R.
Margalit, Ilan 08077625 Cl. 370-252.
National Taiwan University: See--
Huang, Polly; Lin, Tsung-Han; Hu, Shu-Yu; Chang, Ting-Hao; Huang, Shin-Lung; Wu, I-Hei; and Lau, Seng-Yong 08078098 Cl. 455-7.
Jiang, Joe-Air; Yang, En-Cheng; Tseng, Chwan-Lu; Chen, Chia-Pang; Lin, Tzu-Shiang; Wu, Yung-Cheng; Lin, Chen-Ying; Tseng, Chu-Ping; Lin, Shih-Hsiang; Liao, Chih-Sheng; Szu, Shih-Hao; Yen, Chung-Wei; Lin, Kuang-Chang; Wu, Zong-Siou; and Lu, Fu-Ming 08078711 Cl. 709-223.
Wang, An-Bang; Lee, Chia-Fong; Tsai, Wen-Chin; Lin, I-Chun; Lu, Fei-Yau; Chen, Chih-Chieh; Leu, Liang-Jenq; Chen, Chuin-Shan; and Shih, Wen-Pin 08074460 Cl. 62-171.
National Taiwan University of Science and Technology: See--
Guo, Jing-ming; and Liu, Yun-fu 08077355 Cl. 358-3.03.
Hwang, Bing-Joe; Do, Jing-Shan; Hu, Shao-Kang; Chen, Ching-Hsiang; Wang, Kuo-Jung; Kumar, Sakkarapalayam Murugesan Senthil; and Sarma, Loka Subramanyam 08075644 Cl. 44-905.
National University Corporation Chiba University: See--
Imamoto, Tsuneo; Yoshida, Kazuhiro; Nishimura, Miwako; and Koide, Aya 08076480 Cl. 544-353.
National University Corporation Nara Institute of Science and Technology: See--
Inagaki, Naoyuki; Mori, Tatsuya; Ohara, Osamu; and Nagase, Takahiro 08076307 Cl. 514-44A.
National University Corporation Tokyo University of Marine Science and Technology: See--
Izumi, Mitsuru; and Maki, Naoki 08076894 Cl. 318-716.
National Yang-Ming University: See--
Wu, Kou-Juey 08076084 Cl. 435-6.14.
Natsume, Norimitsu: See--
Arai, Nobuyuki; Natsume, Norimitsu; Yoshioka, Kenichi; Kawasaki, Junko; and Takezaki, Hiroshi 08075988 Cl. 428-297.4.
Natural Beauty Bio-Technology Limited: See--
Chen, Jidai; and Cong, Yanping 08076296 Cl. 514-18.6.
Naugler, Jr., Walter Edward; to Leadis Technology, Inc. Emission control in aged active matrix OLED display using voltage ratio or current ratio with temperature compensation 08077123 Cl. 345-76.
Naumann, Herbert; to Thyssenkrupp Presta TecCenter AG Guide systems for variable valve controller 08074615 Cl. 123-90.39.
Naveh-Benjamin, Yitzchak: See--
Leeb, Gunter; Naveh-Benjamin, Yitzchak; Roberts, Scott M.; Abbas, Samar; Franky Lam, Shung Lai; and Avital, Noaa 08078914 Cl. 714-26.
Navia, Sr., Jose A.: See--
Kassab, Ghassan S.; and Navia, Sr., Jose A. 08075532 Cl. 604-176.
Navilyst Medical, Inc.: See--
Gray, Jeff; and Buiser, Marcia 08075536 Cl. 604-288.01.
Navok, Eric: See--
Sliger, Michael; Issaev, Nikolai N.; Navok, Eric; and Yelm, Kenneth E. 08076029 Cl. 429-221.
Navratil, Jiri: See--
Marek, Ladislav; Zednicek, Stanislav; Tomasko, Jaroslav; and Navratil, Jiri 08075640 Cl. 29-25.03.
NAVTEQ North America, LLC: See--
Dorum, Ole Henry; Hanson, John; and Kaplan, Lawrence M. 08078572 Cl. 707-603.
Nawa, Toshihiko; Inoue, Takeshi; and Otsuka, Keitaro, to Fujitsu Semiconductor Limited Wireless reception device automatically establishing frequency synchronization or phase synchronization 08077806 Cl. 375-326.
Nayak, Chetan: See--
Bonderson, Parsa; Shtengel, Kirill; Clarke, David; and Nayak, Chetan 08076666 Cl. 257-9.
Nayfeh, Munir H.; and Alrokayan, Salman A. H., to Nanosi Advanced Technologies, Inc. Luminescent silicon nanoparticle-polymer composites, composite wavelength converter and white LED 08076410 Cl. 524-789.
NCR Corporation: See--
Blust, Donald; and Driscoll, Thomas 08078316 Cl. 700-236.
Neilan, Michael J.; and Chisholm, Gordon 08078912 Cl. 714-22.
Neal, Daniel John: See--
Baker, Matthew Donald; Geller, Steven Ira; Kesser, Douglas Owen; Neal, Daniel John; Politi, Carol Ann; and Weintraub, Ben Julian 08078140 Cl. 455-405.
Neal, Timothy L.: See--
Marriott, Craig D.; Neal, Timothy L.; Swain, Jeff L.; and Raimao, Miguel A. 08074614 Cl. 123-90.12.
Neapco Europe GmbH: See--
Kroener, Thilo 08075218 Cl. 403-341.
NEC (China) Co., Ltd.: See--
Liang, Bangyong; Qi, Hongwei; and Feng, Qiangze 08078647 Cl. 707-802.
Wang, Jinling; and Xia, Yong 08077666 Cl. 370-329.
Wu, Genqing; and Xu, Liqin 08078467 Cl. 704-270.
NEC Corporation: See--
Hamada, Yasuhiro; Kishimoto, Shuya; Maruhashi, Kenichi; Ito, Masaharu; Tanomura, Masahiro; and Orihashi, Naoyuki 08076993 Cl. 333-26.
Hideshima, Kosuke 08079026 Cl. 717-168.
Ito, Toshiharu 08078064 Cl. 398-202.
Kato, Masanori; and Sugiyama, Akihiko 08078460 Cl. 704-226.
Kiribayashi, Shinji 08077674 Cl. 370-331.
Lee, Jinsock; and Hamabe, Kojiro 08077671 Cl. 370-331.
Matsumoto, Kiyoto 08078748 Cl. 709-231.
Miyamoto, Shinichi 08077217 Cl. 348-222.1.
Sekiya, Kayato 08078115 Cl. 455-67.11.
Sumiyoshi, Yasuaki 08077985 Cl. 382-232.
Tetsuhashi, Hideaki; and Tanaka, Hiroshi 08078229 Cl. 455-566.
Ushida, Jun 08078021 Cl. 385-31.
NEC Electronics Corporation: See--
Mizunashi, Harumi 08077466 Cl. 361-704.
NEC Infrontia Corporation: See--
Hikabe, Akinori 08078782 Cl. 710-301.
Needle, Jacob; and Kokkinos, Dimitrios, to Verizon Services Corp. Multimedia distribution system using fiber optic lines 08078056 Cl. 398-72.
Neelogy: See--
Lenglet, Luc 08076931 Cl. 324-253.
Lenglet, Luc Lucien Marie 08076932 Cl. 324-253.
Neeman, Yossy: See--
Goren, Ori; Netanel, Yaron; Livay, Aviel; Moran, Gil; and Neeman, Yossy 08078781 Cl. 710-244.
Negishi, Hideo: See--
Hasegawa, Saburo; Asao, Kimihiko; Makino, Koji; Kato, Takashi; and Negishi, Hideo 08075233 Cl. 411-8.
Neifert, William E.: See--
Seneski, Mark; Sayde, Richard; Marantz, Joshua D.; Cloutier, Richard J.; Dobbyn, Dylan; and Neifert, William E. 08079022 Cl. 717-135.
Neiger, Gilbert: See--
Bennett, Steven M.; Anderson, Andrew V.; Jeyasingh, Stalinselvaraj; Kägi, Alain; Neiger, Gilbert; Uhlig, Richard; Zou, Xiang; Smith, Lawrence; and Rodgers, Scott 08079034 Cl. 718-104.
Neighley, Kevin Arthur; and Scott, Christina Renee Cleaning towel 08074317 Cl. 15-118.
Neilan, Michael J.; and Chisholm, Gordon, to NCR Corporation Self-service terminal 08078912 Cl. 714-22.
Nektar Therapeutics: See--
Kozlowski, Antoni 08076412 Cl. 525-50.
Nellcor Puritan Bennett Ireland: See--
Addison, Paul Stanley; Watson, James; and Clifton, David 08077297 Cl. 356-41.
Nellcor Puritan Bennett LLC: See--
Brumer, Rebecca; Chamoun, Nassib G.; Cordero, Rafael M.; Davidson, Marc; and Kiely, James P. 08077039 Cl. 340-572.1.
Mannheimer, Paul D.; Fein, deceased, Michael E.; and Porges, Charles E. 08078246 Cl. 600-323.
Nelson, Cherilyn N.: See--
Hardee, Fred; Radhakrishnan, Gopinath; Carrillo, Marco; Narasimhan, Dave; and Nelson, Cherilyn N. 08074436 Cl. 57-224.
Nelson, James E.: See--
Thompson, Loren M.; Nelson, James E.; and Voltenburg, Jr., Robert R. 08075676 Cl. 96-121.
Nelson, James M.: See--
Marx, Ryan E.; Nelson, James M.; and Cernohous, Jeffrey J. 08076405 Cl. 524-445.
Nelson, Lionel M: See--
Paraschac, Joseph; and Nelson, Lionel M 08074654 Cl. 128-848.
Nelson, Mark; to Panasonic Electric Works Co., Ltd. System and methods for controlling embedded devices using device style sheets 08078290 Cl. 700-17.
Nelson, Matthew: See--
Maier, John S.; Stewart, Shona; Cohen, Jeffrey; Nelson, Matthew; and Treado, Patrick J 08078268 Cl. 600-476.
Nelson, Randall W.: See--
Tubbs, Kemmons A.; Gruber, Karl F.; and Nelson, Randall W. 08075767 Cl. 210-198.2.
Nemec, Philip: See--
Prada Gomez, Luis Ricardo; Fairfield, Nathaniel; Szybalski, Andy; Nemec, Philip; and Urmson, Christopher 08078349 Cl. 701-23.
Nemoto, Michio; to Fuji Electric Co., Ltd. Semiconductor device and method of producing the same 08076173 Cl. 438-91.
Nemoto, Yusuke; Torisaki, Yuishi; Fujiwara, Makoto; Kuriki, Satoru; and Sano, Masahiro, to Panasonic Corporation Confidential information processing apparatus, confidential information processing device, and confidential information processing method 08077867 Cl. 380-42.
Nemuth, Jens: See--
Poike, Thomas; and Nemuth, Jens 08074975 Cl. 269-60.
Neos, Perry: See--
Ton-That, Luan; and Neos, Perry 08077422 Cl. 360-75.
Neotecha AG: See--
Zollinger, Peter 08074528 Cl. 73-863.86.
Neps, Robert: See--
Ye, Cheng Gang Yap; Ferrer, Jose Joaquin Arias; del Campo, Jose Antonio Alvarado; and Neps, Robert 08078509 Cl. 705-32.
Ness, Jon E.: See--
DelCardayre, Stephen; Tobin, Matthew B.; Stemmer, Willem P. C.; Ness, Jon E.; Minshull, Jeremy S.; Patten, Phillip A.; Subramanian, Venkiteswatan Mani; Castle, Linda A.; Krebber, Claus M.; Bass, Steven H.; Zhang, Ying-Xin; Cox, Anthony R.; Huisman, Gjalt W.; Yuan, Ling; and Affholter, Joseph A. 08076138 Cl. 435-440.
Nestec S.A.: See--
Dworzak, Christoph; Mock, Elmar; Klopfenstein, Andre; Rusch, Christoph; Bitmead, Naomi; Yoakim, Alfred; and Ozanne, Matthieu 08074562 Cl. 99-323.1.
Netanel, Yaron: See--
Goren, Ori; Netanel, Yaron; Livay, Aviel; Moran, Gil; and Neeman, Yossy 08078781 Cl. 710-244.
NetApp, Inc.: See--
Bisson, Timothy C.; Pasupathy, Shankar; and Patel, Yuvraj 08078653 Cl. 707-829.
Chan, Heng Po 08078822 Cl. 711-170.
Thoppai, Omprakaash C.; Rajasekaran, Umeshkumar V.; Driscoll, Alan Stuart; and Shah, Devang 08078816 Cl. 711-162.
NETGEAR, Inc.: See--
Capone, Jeffery M.; and Immaneni, Pramod 08077624 Cl. 370-241.
Netmotion Wireless, Inc.: See--
Hanson, Aaron D.; Sturniolo, Emil A.; Menn, Anatoly; Olsen, Erik D.; and Savarese, Joseph T. 08078727 Cl. 709-226.
Network Appliance, Inc.: See--
Nulkar, Chaitanya; Kemp, Jeffrey A.; Grier, James R.; and Mathew, Jose 08078718 Cl. 709-224.
Rabii, Faramarz; Vassef, Hooman; Corbett, Peter; and Arner, Keith 08078622 Cl. 707-737.
Neu, Steven; and Neu, Tammy Multiple size strap and tie down container 08074795 Cl. 206-279.
Neu, Tammy: See--
Neu, Steven; and Neu, Tammy 08074795 Cl. 206-279.
Neuberth, Simone: See--
Scherer, Stefan; Neuberth, Simone; and Covini, Christian 08074447 Cl. 60-295.
Neuerburg, Horst: See--
Hironimus, Jeannot; Neuerburg, Horst; Stutzmann, Olivier; and Bonnin, David 08074432 Cl. 56-6.
Neugebauer, Witold A.: See--
Gobeil, Jr., Fernand; Neugebauer, Witold A.; Regoli, Domenico; and Fortin, David 08076453 Cl. 530-328.
Neuhausen, Ulrich; Braun, Daniela; Klein, Johann; Kunze, Christiane; Gonzalez, Sara; Zander, Lars; and Bachon, Thomas, to Henkel AG & Co. KGaA Curable compositions consisting of silanes with three hydrolysable groups 08076444 Cl. 528-33.
Neumann, Markus: See--
Schräbler, Sighard; Schade, Kai; Kammann, Stefan; Neumann, Markus; and Käfer, Wolfgang 08074507 Cl. 73-146.5.
Neumann, Matthew Aaron: See--
Motsch, Andreas Peter; Neumann, Matthew Aaron; and Saggar, Ravi K. 08074803 Cl. 206-494.
Neumann, Uwe: See--
Carl, Udo; Neumann, Uwe; and Holert, Ben 08074937 Cl. 244-194.
Neumayer Tekfor Holding GmbH: See--
Lehmann, Martin 08075412 Cl. 464-167.
Neurim Pharmaceuticals (1991) Ltd.: See--
Zisapel, Nava; and Laudon, Moshe 08075914 Cl. 424-457.
Neurometrix, Inc.: See--
Krishnamachari, Srivathsan; Kong, Xuan; Tracey, Brian; and Williams, Michael 08078273 Cl. 600-546.
Neuser, Joseph H.; Olson, Larry M.; and Olson, Daniel W., to Idea Folder, LLC, The Elastomeric gloves and methods of making 08075965 Cl. 428-35.6.
Nevarez, Roberto; Smith, William E.; and Claesson, Jan, to Enodis Corporation Method and system for portioning and dispensing ice 08074837 Cl. 222-56.
Neveitt, William T.; and Gasser, Ralph U., to Google Inc. Model based ad targeting 08078617 Cl. 707-732.
Nevish, Keith A: See--
Duggan, Robert J; and Nevish, Keith A 08077031 Cl. 340-539.13.
New Japan Radio Co., Ltd.: See--
Miyakoshi, Kaoru 08076188 Cl. 438-172.
New Way Tools Co., Ltd.: See--
Huang, Ping Wen 08074540 Cl. 81-145.
New York Air Brake Corporation: See--
Newton, Gary 08078346 Cl. 701-19.
New York University: See--
Pagano, Michele; Skaar, Jeffrey R.; Peschiaroli, Angelo; and Dorrello, N. Valerio 08076309 Cl. 514-44.
Newhauser, Richard R.: See--
Ehrenreich, Kevin J.; Newhauser, Richard R.; von Oepen, Randolf; and Stankus, John 08076529 Cl. 604-367.
Newland, Paul J.: See--
Partridge, Colin Jon; and Newland, Paul J. 08074980 Cl. 271-169.
Newman, Gerald K.: See--
Refai, Hakki H.; Petrich, Erik; Sluss, Jr., James J.; Tull, Monte P.; Verma, Pramode; Newman, Gerald K.; and Dreyer, Martina 08075139 Cl. 353-10.
Newman, Harvey S: See--
Magno, Richard; Ancona, Mario; Boos, John Bradley; Champlain, James G; and Newman, Harvey S 08076700 Cl. 257-200.
Newman, Melvin A.: See--
Wilkerson, John B.; Hancock, John H.; Moody, Fred H.; and Newman, Melvin A. 08074585 Cl. 111-127.
Newman, Richard W.; to Welch Allyn, Inc. Apparatus and method of diagnosis of optically identifiable ophthalmic conditions 08075136 Cl. 351-205.
Newmax Technology Co., Ltd.: See--
Lai, Shu-Tzu 08077399 Cl. 359-715.
Newport Media, Inc.: See--
Yousef, Nabil 08077659 Cl. 370-328.
Yousef, Nabil 08077736 Cl. 370-455.
Newron Pharmaceuticals S.p.A.: See--
Barbanti, Elena; Caccia, Carla; Salvati, Patricia; Velardi, Francesco; Ruffilli, Tiziano; and Bogogna, Luigi 08076515 Cl. 564-165.
Newton, Gary; to New York Air Brake Corporation Convertible wireless display unit 08078346 Cl. 701-19.
Newton Photonics, Inc.: See--
Melman, Paul; and Cohen, Stephen 08078244 Cl. 600-316.
Nextreme, LLC: See--
Muirhead, Scott A. W. 08077040 Cl. 340-572.1.
Nextrom Oy: See--
Hietaranta, Timo; and Nykänen, Jari 08075941 Cl. 427-8.
Neysmith, Jordan M.: See--
Greenberg, Robert J.; McMahon, Matthew J.; Little, James Singleton; McClure, Kelly H.; Mech, Brian V.; Talbot, Neil Hamilton; and Neysmith, Jordan M. 08078284 Cl. 607-53.
Ng, Kwok-Lam; Scheckel, Benjamin L.; and Malgorn, Gerard, to Cummins Filtration IP, Inc. Impactor with de-icing 08075657 Cl. 55-465.
NGK Insulators, Ltd.: See--
Furukubo, Hiroshi 08074696 Cl. 156-757.
Takagi, Shuichi; and Horiba, Yasuhiro 08075829 Cl. 264-432.
Ngoh, Wendy Chet Ming: See--
Tay, Cheng Siew; Ngoh, Wendy Chet Ming; and Chan, Choi Keng 08079011 Cl. 716-137.
Ngosi, Masautso Sau; Monk, Trevor; and Miletic, Zoran, to Xantrex Technology Inc. Method and apparatus for exporting power in a renewable energy system employing a battery charger 08076907 Cl. 320-160.
Nguyen, Andrew: See--
Balakrishna, Ajit; Rauf, Shahid; Nguyen, Andrew; Willwerth, Michael D.; and Todorow, Valentin N. 08075728 Cl. 156-345.26.
Collins, Kenneth S.; Hanawa, Hiroji; Ramaswamy, Kartik; Buchberger, Jr., Douglas A.; Rauf, Shahid; Bera, Kallol; Wong, Lawrence; Merry, Walter R.; Miller, Matthew L.; Shannon, Steven C.; Nguyen, Andrew; Cruse, James P.; Carducci, James; Detrick, Troy S.; Deshmukh, Subhash; and Sun, Jennifer Y. 08076247 Cl. 438-714.
Nguyen, Annie: See--
Laster, Maurice Scott; Enzmann, Mark; Dammrose, John Mark; and Nguyen, Annie 08078167 Cl. 455-433.
Nguyen, Anthony T.: See--
Beckman, Andrew T.; Minnelli, Patrick J.; Nguyen, Anthony T.; Baxter, III, Chester O.; and D'Arcangelo, Michele 08075482 Cl. 600-208.
Nguyen, Antony: See--
Hanlon, Andrew; Huang, Fu-Ying; Huang, Lidu; Nguyen, Antony; and Salehizadeh, Hamid 08077432 Cl. 360-99.08.
Nguyen, Binh T.: See--
Min, Sung Woo; von Oepen, Randolf; Nguyen, Binh T.; Ehrenreich, Kevin J.; Webler, Jr., William E.; Lumauig, Rommel; Chan, Gregory W.; Coffey, Lorcan J.; Yribarren, Travis R.; and Magana, Jesus 08075519 Cl. 604-96.01.
Nguyen, Chuc Tu: See--
Fitzpatrick, Michael E.; Nguyen, Chuc Tu; Brtko, Wayne J.; and Salisbury, Brian A. 08076512 Cl. 562-608.
Nguyen, Khang V.: See--
Rosine, Steven David; Nguyen, Khang V.; and Mills, Michael Scott 08076627 Cl. 250-207.
Nguyen, Khoa: See--
Nodianos, Kristopher; Blachek, Laura; Nguyen, Khoa; Oyelowo, Adedayo; Tran, Tan; Sanford, Bernice; and Cochran, Kevin 08076921 Cl. 323-304.
Nguyen, Mai; Wang, Xin; Ta, Thanh; Lao, Guillermo; and Chen, Eddie J., to ContentGuard Holdings, Inc. System and method for managing transfer of rights using shared state variables 08078542 Cl. 705-59.
Nguyen, Nga Marie Phan: See--
Bergeron, Michael A.; Nishikawa, Yuko; Nguyen, Nga Marie Phan; and Diaz, Ronaldo 08078036 Cl. 386-278.
Nguyen, Philip D.: See--
Blauch, Matthew E.; Welton, Thomas D.; and Nguyen, Philip D. 08076271 Cl. 507-226.
Nice Systems, Ltd.: See--
Wasserblat, Moshe; Zigel, Yaniv; and Pereg, Oren 08078463 Cl. 704-246.
Nichia Corporation: See--
Narukawa, Yukio; Mitani, Tomotsugu; Ichikawa, Masatsugu; Kitano, Akira; and Misaki, Takao 08076694 Cl. 257-103.
Tamaki, Hiroto; Naitou, Takahiro; and Murazaki, Yoshinori 08076847 Cl. 313-512.
Nichiban Co., Ltd.: See--
Sekiya, Nobuyuki; Yamaguchi, Masatsugu; Tanaka, Masashi; and Kawakami, Takashi 08074695 Cl. 156-540.
Nicholls, Leon E.: See--
Ansari, Amir; Cowgill, George A.; Nicholls, Leon E.; Raissyan, Atousa; Ramayya, Jude P.; and Masina, Ramprakash 08078688 Cl. 709-217.
Nichols, Jeffrey William: See--
Barton, John Joseph; Hua, Zhigang; and Nichols, Jeffrey William 08078694 Cl. 709-219.
Nichols, Jr., James P.: See--
Wall, Daniel P.; Leasure, Jeremy D.; Carroll, Craig A.; Jones, Julie L.; Weston, Jeffrey D.; Mooty, Thomas A.; Nichols, Jr., James P.; and Schnell, John W. 08075374 Cl. 451-355.
Nichols, Michelle; Atwood, Todd; Heddleson, James; and Cargle, Steve, to Bank of America Corporation Cash supply chain surveillance 08078534 Cl. 705-39.
Nichols, Tony; to Webroot Software, Inc. Method and system for rendering harmless a locked pestware executable object 08079032 Cl. 718-100.
Nickelson, David A. Safety ladder 08074771 Cl. 182-195.
Nidec Corporation: See--
Hanaoka, Satoru; Sugiyama, Tomotsugu; Tabata, Shinya; and Tsukada, Takashi 08074344 Cl. 29-598.
Nidumolu, Kalyan Chakravarthy: See--
Parthasarathy, Anand; Holankar, Manali Chandrakant; Nidumolu, Kalyan Chakravarthy; and Kondamuri, Chandra Sekhar 08078903 Cl. 714-4.11.
Nie, Xiaoning: See--
Lin, Jinan; Nie, Xiaoning; Itjeshorst, Ralf; Giese, Tilman; Deng, Xianming; Brem, Denny; Mott, Klaus; and Kella, Tideya 08077644 Cl. 370-310.
Niebling, Peter: See--
Heim, Jens; Dlugai, Darius; Niebling, Peter; and Mock, Christian 08075194 Cl. 384-448.
Mock, Christian; Niebling, Peter; and Heiss, Ralf 08075195 Cl. 384-512.
Nieco Corporation: See--
Baker, Edward D.; Baker, Matthew J.; Baker, Patrick D.; Sarfehjoo, Mohsen; and Magner, Erik 08076614 Cl. 219-388.
Nied, Roland: See--
Nied, Roland; and Sickel, Hermann 08074907 Cl. 241-5.
Nied, Roland; and Sickel, Hermann, to Nied, Roland Method for generating finest particles and jet mill therefor as well as classifier and operating method thereof 08074907 Cl. 241-5.
Nielsen Company (US), LLC, The: See--
Srinivasan, Venugopal 08078301 Cl. 700-94.
Nielsen, Michael Gunther: See--
Nielsen, Per Gorm Gunther; and Nielsen, Michael Gunther 08075480 Cl. 600-185.
Nielsen, Ole: See--
Lopez de Diego, Heidi; Nielsen, Ole; Munch Ringgard, Lone; Svane, Henrik; Dahl, Allan Carsten; Howells, Mark; Bang-Andersen, Benny; and Lyngso, Lars Ole 08076342 Cl. 514-255.03.
Rock, Michael Harold; De Diego, Heidi Lopez; Christensen, Kim Lasse; Nielsen, Ole; Buur, Anders; and Howells, Mark 08076320 Cl. 514-211.08.
Nielsen, Per Gorm Gunther; and Nielsen, Michael Gunther, to Techmin Pty Limited Apparatus for reducing cross-contamination 08075480 Cl. 600-185.
Nielsen, Stevan: See--
Solem, Jan Otto; Kimblad, Per Ola; von Oepen, Randolf; Quint, Bodo; Seibold, Gerd; Michlitsch, Kenneth J.; Ha, Suk-Woo; Eckert, Karl-Ludwig; Joergensen, Ib; and Nielsen, Stevan 08075616 Cl. 623-2.37.
Nielsen, Theodor; Kristensen, Anders; and Hansen, Ole, to Nil Technology APS Flexible nano-imprint stamp 08075298 Cl. 425-385.
Nielson, Daniel B.: See--
Ashcroft, Benjamin N.; Nielson, Daniel B.; and Doll, Daniel W. 08075715 Cl. 149-2.
Niemann, Holger; and Juenemann, Thorsten, to Robert Bosch GmbH Monitoring system for a hybrid drive 08074527 Cl. 73-862.193.
Nieminen, Gregory: See--
Gordon, Lucas S.; Mathis, Mark L.; and Nieminen, Gregory 08075608 Cl. 623-1.11.
Nien, Ya-Fang: See--
Wu, Ming-Tsang; Yin, Hao-Hui; Yu, Chih-Ching; Yang, Tzu-Ching; Nien, Ya-Fang; Huang, Ying-Feng; and Liu, Pi-Hai 08077564 Cl. 369-44.27.
Nies, Jacob Johannes; and Hemmelmann, Jan Erich, to General Electric Company Wind energy system with fluid-working machine with non-symmetric actuation 08074450 Cl. 60-398.
Niessen, William Frederick: See--
Bovaird, Lorie Jean; Niessen, William Frederick; Haydu, Jr., William Andrew; Enix, Daniel Dale; and Daniel, Jr., McAllister 08075032 Cl. 294-74.
Nieto, John W.: See--
Furman, William N.; and Nieto, John W. 08077813 Cl. 375-341.
Niewiadomski, Walter: See--
Lam, David Y.; Niewiadomski, Walter; Mowry, Steve; and Klingler, Eric 08077080 Cl. 342-174.
Niggemann, Matthias: See--
Heggemann, Christian; Oesterhaus, Jens; Boensch, Matthias; Niggemann, Matthias; Lenschen, Michael; Fehling, Stephan; and Diekmann, Torsten 08075350 Cl. 439-680.
Nihon Dempa Kogyo Co., Ltd.: See--
Ito, Manabu 08076983 Cl. 331-158.
Kawanishi, Shingo 08076830 Cl. 310-370.
Kikegawa, Shinya; Nishi, Toshimasa; and Takada, Motoo 08075947 Cl. 427-162.
Nii, Shinsuke; Nakamae, Masato; and Tokoh, Makio, to Kuraray Co., Ltd. Vinyl alcohol-based polymer and film containing the same 08076433 Cl. 526-304.
Niida, Mitsuo; to Canon Kabushiki Kaisha Image processing apparatus to transmit moving image data 08077222 Cl. 348-231.3.
Niijima, Takayuki: See--
Kashiwagi, Tsuyoshi; and Niijima, Takayuki 08077395 Cl. 359-625.
Niitsuma, Kenichi: See--
Omori, Misao; and Niitsuma, Kenichi 08075052 Cl. 297-216.12.
Niizuma, Kazuo; to Shibuya Kogyo Co., Ltd. Conductive ball mounting apparatus 08074867 Cl. 228-175.
Nijhawan, Vijay; and Rangarajan, Madhusudhan, to Dell Products L.L.P. System and method for providing memory performance states in a computing system 08078890 Cl. 713-320.
Nijmeijer, Gerrit Johannes: See--
Hoogendam, Christiaan Alexander; Nijmeijer, Gerrit Johannes; Cuperus, Minne; and Van Eijck, Petrus Anton Willern Cornelia Maria 08077291 Cl. 355-77.
Nijssen, Raymond: See--
Manohar, Rajit; Kelly, Clinton W.; Ekanayake, Virantha; LaFrieda, Christopher; Tam, Hong; Ganusov, Ilya; Nijssen, Raymond; and Van der Goot, Marcel 08078899 Cl. 713-375.
Nike, Inc.: See--
Fleming, John C.; and Mixon, Thomas D. 08078478 Cl. 705-1.1.
Reichow, Alan W.; and Yoo, Herb 08075135 Cl. 351-203.
Smith, Todd; Reichow, Alan W.; and Citek, Karl 08075431 Cl. 473-604.
Stites, John T.; and Franklin, David N. 08075416 Cl. 473-238.
Thomas, James S.; and Lukasiewicz, Jr., Robert 08075417 Cl. 473-246.
Nikitin, Pavel; Rao, KVS (Venkata Kodukula); and Lam, Sander, to Intermec IP Corp. RFID tags with enhanced range and bandwidth obtained by spatial antenna diversity 08077044 Cl. 340-572.7.
Nikolic, Nebojsa; Frey, Michaela; Grabmayer, Wolfgang; Jancik, Thomas; Fried, Matthias; Tschetschkowitsch, Klaus; Schnecker, Kurt; Riegler, Barbara; and Kasapovic, Alma, to Baxter International Inc. Counter-pressure filtration of proteins 08075781 Cl. 210-651.
Nikolic, Nebojsa; Frey, Michaela; Grabmayer, Wolfgang; Jancik, Thomas; Fried, Matthias; Tschetschkowitsch, Klaus; Schnecker, Kurt; Riegler, Barbara; and Kasapovic, Alma, to Baxter International Inc. Counter-pressure filtration of proteins 08075782 Cl. 210-651.
Nikon Corporation: See--
Hagiwara, Kosuke; and Mikamoto, Eiji 08078042 Cl. 396-55.
Niksch, Barbara A.: See--
Tu, Hosheng; Smedley, Gregory T.; Haffner, David; and Niksch, Barbara A. 08075511 Cl. 604-8.
Nil Technology APS: See--
Nielsen, Theodor; Kristensen, Anders; and Hansen, Ole 08075298 Cl. 425-385.
Niles Co., Ltd: See--
Ohata, Tomoyuki; and Watanabe, Shigeo 08076887 Cl. 318-444.
Nilsson, C. Michael: See--
Stahurski, Terrance; and Nilsson, C. Michael 08075597 Cl. 606-260.
Nilsson, Malin: See--
Källèn, Elisabeth; and Nilsson, Malin 08074600 Cl. 119-14.04.
Niman, Murray Jerel: See--
Agnew, Martin Joseph; Panaghiston, Gary David; Niman, Murray Jerel; and Chandler, Nicholas 08076591 Cl. 174-350.
Ning, Ke: See--
Wang, Xiaolin; Wu, Qian; Marshall, Benjamin; Wang, Fugui; Ning, Ke; and Pitarys, Gregory 08078833 Cl. 712-15.
Ning, Tian: See--
Ning, Tian 08074663 Cl. 131-365.
Ning, Tian; to Ning, Tian Flame-retardant and fireproof cigarette 08074663 Cl. 131-365.
Ninic, Mario: See--
Harney, Michael; Ninic, Mario; Howard, Rory; and Mansfield, Kim 08075342 Cl. 439-620.01.
Nintendo, Co., Ltd.: See--
Miyamoto, Shigeru; and Eguchi, Katsuya 08075401 Cl. 463-37.
Sasaki, Tetsuya; and Araki, Tsutomu 08075405 Cl. 463-42.
Niogi, Sumit Narayan; and McCandliss, Bruce D., to Cornell University Reproducible objective quantification method to segment white matter structures 08077937 Cl. 382-128.
Nippon Paint Co., Ltd.: See--
Matsukawa, Masahiko; Makino, Kazuhiro; Shimakura, Toshiaki; Futsuhara, Masanobu; and Yang, Jiping 08075708 Cl. 148-247.
Nippon Sheet Glass Company, Limited: See--
Shimmo, Katsuhide; Sato, Shiro; and Mamada, Haruhiko 08077407 Cl. 359-811.
Nippon Shokubai Co., Ltd: See--
Yoneda, Atsuro; and Michitaka, Daisuke 08076434 Cl. 526-312.
Nippon Shokubai Co., Ltd.: See--
Kasuga, Hiroto; Matsunami, Etsushige; and Sugio, Masafumi 08076509 Cl. 562-532.
Nippon Soken, Inc.: See--
Kawakita, Shinichiro; Ohshima, Keiji; and Nishijima, Yoshiaki 08074444 Cl. 60-286.
Nippon Steel Corporation: See--
Ito, Satoru; Nakamura, Hitoshi; Matsui, Taijiro; and Nitta, Michio 08076255 Cl. 501-124.
Nippon Telegraph and Telephone Corporation: See--
Takatori, Yasushi; Cho, Keizo; Hori, Toshikazu; and Nishimori, Kentaro 08078113 Cl. 455-63.4.
Nippon Valqua Industries, Ltd.: See--
Tsuji, Kazuaki 08074967 Cl. 251-328.
Nippon Zenyaku Kogyo Co., Ltd.: See--
Tsukui, Toshihiro; Tsujimoto, Hajime; and Iwabuchi, Shigehiro 08075898 Cl. 424-185.1.
Nishi, Tomohiro: See--
Kuroki, Yoshihiko; and Nishi, Tomohiro 08077172 Cl. 345-213.
Nishi, Toshimasa: See--
Kikegawa, Shinya; Nishi, Toshimasa; and Takada, Motoo 08075947 Cl. 427-162.
Nishida, Hirokazu: See--
Kawasaki, Takafumi; Mimura, Seiichi; Nishida, Hirokazu; and Yoshida, Yasuhiro 08075647 Cl. 51-307.
Nishida, Katsutoshi: See--
Valko, Andras; Turanyi, Zoltan; Keszei, Csaba; Iwasaki, Atsushi; and Nishida, Katsutoshi 08077648 Cl. 370-311.
Nishida, Yoshiyasu: See--
Miyashita, Takeshi; Kobayashi, Hirokazu; Iwata, Mitsuru; and Nishida, Yoshiyasu 08077231 Cl. 348-272.
Nishihara, Seiichi: See--
Iwanaga, Toshiyuki; Motoki, Akihiro; Ogawa, Makoto; Kawasaki, Kenichi; Takeuchi, Shunsuke; Nishihara, Seiichi; and Matsumoto, Shuji 08077445 Cl. 361-309.
Nishihara, Takashi; Sakaue, Yoshitaka; and Kojima, Rie, to Panasonic Corporation Information recording medium and method for manufacturing the same 08075973 Cl. 428-64.1.
Nishihara, Yuka: See--
Kojima, Katsumi; Nishihara, Yuka; Kubo, Hiroshi; Yasue, Yoshihiko; Oshima, Yasuhide; and Iwasa, Hiroki 08074483 Cl. 72-379.4.
Nishiie, Takehiro: See--
Honda, Kazuki; Murakami, Kazushi; Ichikawa, Hiroaki; Nishiie, Takehiro; Kura, Yasuhito; Onuki, Yoshio; and Komiya, Takaaki 08075474 Cl. 600-106.
Honda, Kazuki; Murakami, Kazushi; Ichikawa, Hiroaki; Nishiie, Takehiro; Kura, Yasuhito; Onuki, Yoshio; and Komiya, Takaaki 08075475 Cl. 600-106.
Nishijima, Yoshiaki: See--
Kawakita, Shinichiro; Ohshima, Keiji; and Nishijima, Yoshiaki 08074444 Cl. 60-286.
Nishikawa, Kazuhiro; Kai, Yoshihiro; and Nakamura, Kazuto, to Nissha Printing Co., Ltd. Touch input function-equipped protection panel for electronic device display window 08077264 Cl. 349-12.
Nishikawa, Seiichiro: See--
Suzuki, Yusaku; and Nishikawa, Seiichiro 08074504 Cl. 73-114.38.
Nishikawa, Shizuo: See--
Fujishima, Makoto; Kashihara, Keizo; and Nishikawa, Shizuo 08077327 Cl. 356-614.
Nishikawa, Tomoki; to Panasonic Corporation OFDM demodulation device 08077784 Cl. 375-260.
Nishikawa, Yoshiteru: See--
Ochi, Makoto; Nishikawa, Yoshiteru; and Tao, Kozo 08074976 Cl. 270-58.09.
Nishikawa, Yuko: See--
Bergeron, Michael A.; Nishikawa, Yuko; Nguyen, Nga Marie Phan; and Diaz, Ronaldo 08078036 Cl. 386-278.
Nishimori, Kentaro: See--
Takatori, Yasushi; Cho, Keizo; Hori, Toshikazu; and Nishimori, Kentaro 08078113 Cl. 455-63.4.
Nishimori, Yasuhiro: See--
Watanabe, Seiichi; Yasui, Naoki; Tauchi, Susumu; and Nishimori, Yasuhiro 08075733 Cl. 156-345.41.
Nishimoto, deceased, Ikuo: See--
Chiba, Tomohiro; Kita, Yoshiko; Matsuoka, Masaaki; Terashita, Kenzo; Aiso, Sadakazu; and Nishimoto, deceased, Ikuo 08076449 Cl. 530-300.
Nishimoto, legal representative, Tomo: See--
Chiba, Tomohiro; Kita, Yoshiko; Matsuoka, Masaaki; Terashita, Kenzo; Aiso, Sadakazu; and Nishimoto, deceased, Ikuo 08076449 Cl. 530-300.
Nishimoto, Tomotaka; Okada, Yasuhiro; Igarashi, Chihiro; Yoshitake, Takanori; and Watanabe, Nobuhisa, to Panasonic Corporation Component crimping apparatus control method, component crimping apparatus, and measuring tool 08078310 Cl. 700-206.
Nishimura, Hiromichi: See--
Jabri, Khaled; Arai, Atsushi; Nishimura, Hiromichi; Noro, Yoshihiko; and Takeda, Dai 08077389 Cl. 359-487.02.
Nishimura, Kenichi; to Panasonic Corporation Semiconductor device 08076695 Cl. 257-170.
Nishimura, Michiyo: See--
Teramoto, Yoji; Fujiwara, Ryoji; Nishimura, Michiyo; Nomura, Kazushi; and Murakami, Shunsuke 08075360 Cl. 445-51.
Nishimura, Miwako: See--
Imamoto, Tsuneo; Yoshida, Kazuhiro; Nishimura, Miwako; and Koide, Aya 08076480 Cl. 544-353.
Nishimura, Takao; and Kumagaya, Yoshikazu, to Fujitsu Semiconductor Limited Semiconductor device and manufacturing method of semiconductor device 08076769 Cl. 257-688.
Nishimura, Takao; Kumagaya, Yoshikazu; Takashima, Akira; Nakamura, Kouichi; and Aiba, Kazuyuki, to Fujitsu Semiconductor Limited Semiconductor device 08076785 Cl. 257-780.
Nishimura, Yukio: See--
Nakamura, Atsushi; Nakagawa, Hiroki; Nakashima, Hiromitsu; Tsuji, Takayuki; Dougauchi, Hiroshi; Kouno, Daita; and Nishimura, Yukio 08076053 Cl. 430-270.1.
Nishino, Hidehiko; and Hirano, Yoshihiro, to Shin-Etsu Handotai Co., Ltd. Cylindrical grinding apparatus and method for grinding 08074544 Cl. 82-122.
Nishino, Hironori: See--
Uchiyama, Yasuhito; and Nishino, Hironori 08076740 Cl. 257-431.
Nishino, Hisashi: See--
Mabuchi, Tomoki; and Nishino, Hisashi 08074762 Cl. 180-309.
Nishio, Akihiko: See--
Kuri, Kenichi; Nishio, Akihiko; Fukuoka, Masaru; and Miyoshi, Kenichi 08077667 Cl. 370-329.
Matsumoto, Atsushi; Miyoshi, Kenichi; and Nishio, Akihiko 08077598 Cl. 370-208.
Nishio, Kazunori; and Mizouchi, Hayato, to Rinnai Corporation Warm air furnace 08074636 Cl. 126-116A.
Nishio, Tetsushi: See--
Minamio, Masanori; Nishio, Tetsushi; and Tsuji, Kenji 08077248 Cl. 348-340.
Nishiwaki, Fumitoshi: See--
Hasegawa, Hiroshi; Matsui, Masaru; Ogata, Takeshi; Nishiwaki, Fumitoshi; Taguchi, Hidetoshi; Sakima, Fuminori; and Wada, Masanobu 08074471 Cl. 62-498.
Nishiwaki, Seiji; to Panasonic Corporation Imaging photodetection device 08076745 Cl. 257-434.
Nishiwaki, Tsuyoshi; Ootsuka, Yosuke; and Kiso, Satoshi, to Asics Corporation Shoe sole with reinforcement structure 08074377 Cl. 36-25R.
Nishiyama, Kazuhiro; and Sasaki, Tsutomu, to Seiko Epson Corporation Liquid developer transport device and image forming apparatus 08078086 Cl. 399-238.
Nishizawa, Takashi: See--
Soma, Gen-Ichiro; Kohchi, Chie; Inagawa, Hiroyuki; Nishizawa, Takashi; and Takahashi, Yukinori 08075928 Cl. 424-750.
Nishtala, Vasu; Davis, Michele Gandy; Bracken, Ronald L.; and Hine, Robert M., to C. R. Bard, Inc. Waste management system 08075539 Cl. 604-328.
Nissan Diesel Motor Co., Ltd.: See--
Matsunaga, Hideki 08078414 Cl. 702-55.
Nissan Motor Co., Ltd.: See--
Shimamura, Osamu; Hosaka, Kenji; Watanabe, Kyoichi; Abe, Takaaki; Kinoshita, Takuya; Horie, Hideaki; Sato, Hajime; and Senbokuya, Ryouichi 08076021 Cl. 429-149.
Sugano, Takashi; and Etori, Nariaki 08078382 Cl. 701-96.
Yamamoto, Takeshi 08075444 Cl. 476-61.
Nissha Printing Co., Ltd.: See--
Nishikawa, Kazuhiro; Kai, Yoshihiro; and Nakamura, Kazuto 08077264 Cl. 349-12.
Nitschke, David B.; Nitschke, Dean M.; Reinhart, Cristin J.; and Shetterly, Donivan M., to Glasstech, Inc. Method for quenching formed glass sheets 08074473 Cl. 65-114.
Nitschke, Dean M.: See--
Nitschke, David B.; Nitschke, Dean M.; Reinhart, Cristin J.; and Shetterly, Donivan M. 08074473 Cl. 65-114.
Nitta, Michio: See--
Ito, Satoru; Nakamura, Hitoshi; Matsui, Taijiro; and Nitta, Michio 08076255 Cl. 501-124.
Nitto Denko Corporation: See--
Ikeda, Koichi; Ueda, Tsubasa; and Tamai, Hironori 08075970 Cl. 428-40.1.
Konishi, Tatsuya; and Mori, Kenjiro 08076383 Cl. 521-61.
Nashiki, Tomotake; and Sugawara, Hideo 08075948 Cl. 427-167.
Ohashi, Hiromichi 08078307 Cl. 700-122.
Niu, Li; Huang, Zhen; Shi, Hua; and Lis, John T., to Research Foundation of State University of New York, The Nucleic acid inhibitors of glutamate receptors 08076467 Cl. 536-23.1.
Niwa, Atsumi; Matsumoto, Tomohiro; and Moue, Takashi, to Sony Corporation ΔΣ modulator 08077066 Cl. 341-143.
Nobori, Kunio: See--
Okamoto, Shusaku; Ishii, Hirofumi; Nakagawa, Masamichi; Nobori, Kunio; and Morimura, Atsushi 08077202 Cl. 348-148.
Noda, Akihiko: See--
Mori, Akihito; and Noda, Akihiko 08077333 Cl. 358-1.15.
Noda, Chosaku: See--
Watabe, Kazuo; Usui, Takashi; Yusu, Keiichiro; Noda, Chosaku; Kuroda, Kazuto; Kaji, Nobuaki; and Saito, Masahiro 08077586 Cl. 369-116.
Noda, Hideyuki: See--
Dosaka, Katsumi; Arimoto, Kazutami; Saito, Kazunori; and Noda, Hideyuki 08077492 Cl. 365-49.1.
Noda, Kazuya; and Miyoshi, Takaaki, to Asahi Kasei Chemicals Corporation Method for producing conductive masterbatch 08075805 Cl. 252-502.
Noda, Makoto: See--
Yamagishi, Hiroyuki; and Noda, Makoto 08078936 Cl. 714-755.
Noda, Ryusuke: See--
Fujishima, Yoshikazu; and Noda, Ryusuke 08078033 Cl. 386-250.
Node, Yasunobu: See--
Machimura, Masanori; Kondo, Tetsujiro; Ando, Kazutaka; Node, Yasunobu; Obana, Michimasa; Hiraizumi, Kei; and Akao, Masato 08077978 Cl. 382-190.
Nodianos, Kristopher; Blachek, Laura; Nguyen, Khoa; Oyelowo, Adedayo; Tran, Tan; Sanford, Bernice; and Cochran, Kevin, to United States of America as represented by the Secretary of the Navy, The Self-regulating power supply for micro electronic mechanical systems thermal actuators 08076921 Cl. 323-304.
Noegel, John J.: See--
Ramme, Bruce W.; Noegel, John J.; and Rohatgi, Pradeep K. 08074804 Cl. 209-133.
Nogami, Syusaku; and Baba, Tomohiko, to Kayaba Industry Co., Ltd. Vehicle height adjusting device 08074974 Cl. 267-64.17.
Nogami, Toshizo: See--
Onodera, Takashi; Nogami, Toshizo; and Tsuboi, Hidekazu 08077782 Cl. 375-260.
Noguchi, Hiromichi: See--
Shimomura, Masako; and Noguchi, Hiromichi 08075094 Cl. 347-45.
Noguchi, Ryota; to Hitachi, Ltd. Computer system provided with hypervisor 08078765 Cl. 710-5.
Noh, Sok-Won; Kang, Tae-Min; Seong, Jin-Wook; Lee, Sang-Bong; Lee, Seung-Mook; Park, Jin-Woo; Kim, Sun-Hoe; and Jung, Myung-Jong, to Samsung Mobile Display Co., Ltd. Crucible heating apparatus and deposition apparatus including the same 08075693 Cl. 118-726.
Nohmi Bosai Ltd.: See--
Yokota, Hiroyuki 08077018 Cl. 340-328.
Noji, Nobuharu: See--
Hatakeyama, Masahiro; Watanabe, Kenji; Murakami, Takeshi; Satake, Tohru; and Noji, Nobuharu 08076654 Cl. 250-492.1.
Nojima, Shigeki: See--
Izuha, Kyoko; Nojima, Shigeki; Kotani, Toshiya; and Tanaka, Satoshi 08078996 Cl. 716-53.
Nokia Coporation: See--
Syrjarinne, Jari; and Valio, Harri 08077084 Cl. 342-357.43.
Nokia Corporation: See--
Ahmavaara, Kalle; and Vesterinen, Seppo 08077681 Cl. 370-338.
Ahonen, Petri 08077208 Cl. 348-207.99.
Dixit, Amitabh 08077904 Cl. 382-100.
Eteläperä, Esa 08078719 Cl. 709-224.
Hannuksela, Miska 08078644 Cl. 707-802.
Koskinen, Juha-Pekka; and Vallinen, Juha R. 08078142 Cl. 455-406.
Kuure, Pekka; Jouppi, Jarkko; and Ala-Tauriala, Erkka 08077653 Cl. 370-328.
Lainema, Jani 08077991 Cl. 382-236.
Maunuksela, Jaako; Vepsäläinen, Jussi; and Kahola, Mika 08077799 Cl. 375-296.
Mizutani, Michihito; and Uusitalo, Jussi Severi 08077156 Cl. 345-173.
Phan, Vinh Van; and Vainikka, Markku 08078170 Cl. 455-436.
Rinne, Mika P.; and Kermoal, Jean-Philippe 08077612 Cl. 370-230.
Wirola, Lauri; and Syrjärinne, Jari 08078192 Cl. 455-456.1.
Nokia Siemens Networks GmbH & Co. KG: See--
Wang, Allen 08078057 Cl. 398-99.
Nokia Siemens Networks Oy: See--
Rexhepi, Vlora; Sebire, Guillaume; Hamiti, Shkumbin; and Parantainen, Janne 08077680 Cl. 370-335.
Noland, Michael L.: See--
Imholt, Timothy J.; St. Claire, Alexander F.; and Noland, Michael L. 08074552 Cl. 89-36.01.
Noldus, Rogier August Caspar Joseph: See--
Hartog, Jos den; Noldus, Rogier August Caspar Joseph; and Taori, Rakesh 08077703 Cl. 370-352.
Nolte, Bert: See--
Kroth, Heiko; Feuerstein, Tim; Richter, Frank; Boer, Jürgen; Essers, Michael; Nolte, Bert; Schneider, Matthias; Hochgürtel, Matthias; Frickel, Fritz-Frieder; Taveras, Arthur G.; and Steeneck, Christoph 08076330 Cl. 514-236.2.
Noman, Syed Mohammad Shiblee: See--
Cox, Donald W.; and Noman, Syed Mohammad Shiblee 08075304 Cl. 431-90.
Nomoto, Masakazu; Mochizuki, Yasushi; and Nagao, Keisuke, to Canon Kabushiki Kaisha Printing control apparatus, information processing apparatus, control method therefor, computer program, and computer-readable storage medium 08077339 Cl. 358-1.16.
Nomura, Kazushi: See--
Teramoto, Yoji; Fujiwara, Ryoji; Nishimura, Michiyo; Nomura, Kazushi; and Murakami, Shunsuke 08075360 Cl. 445-51.
Nomura, Koji: See--
Minamio, Masanori; Tomita, Yoshihiro; and Nomura, Koji 08077900 Cl. 381-355.
Nomura, Satoyuki: See--
Tsuda, Yoshihiro; Morishita, Yoshii; Nomura, Satoyuki; Hoshi, Yousuke; Funyuu, Shigeaki; Motamedi, Farshad J.; and Wang, Li-Sheng 08075943 Cl. 427-66.
Nomura, Yujiro: See--
Inoue, Nozomu; and Nomura, Yujiro 08077190 Cl. 347-130.
Nomura, Yuki: See--
Shoda, Kazuo; Nomura, Yuki; and Nagato, Yoshifumi 08076890 Cl. 318-599.
Nonaka, Kazuhiro: See--
Yamamoto, Yoichi; Nonaka, Kazuhiro; and Nakai, Masaki 08076896 Cl. 318-801.
Nonaka, Masao: See--
Matsuzaki, Natsume; Yokota, Kaoru; Nonaka, Masao; Inoue, Mitsuhiro; Nakahara, Tohru; and Higashi, Akio 08077980 Cl. 382-209.
Nonaka, Yusuke; Yamamoto, Akira; Matsunami, Naoto; and Sonoda, Koji, to Hitachi, Ltd. Arrangements for managing metadata of an integrated logical unit including differing types of storage media 08078819 Cl. 711-165.
Noni, Lisa M: See--
Helfinstine, John David; McIntosh, Robert A; Noni, Lisa M; Shi, Zhiqiang; Widjaja, Sujanto; and Worthey, David John 08074518 Cl. 73-598.
Noonan, Joseph S.; Nadler, Barry R.; and Insler, Julius R., to Binj Laboratories, Inc. Systems and methods for detection of transmission facilities 08078190 Cl. 455-456.1.
Noordegraaf, Jan; to Synbra Technology B.V. Particulate expandable polystyrene (EPS), process for making particulate expandable polystyrene, as well as a particular application of polystyrene foam material 08076380 Cl. 521-56.
Nord, Lars; and Horppu, Petri, to Carmel Pharma AB Piercing member protection device 08075550 Cl. 604-533.
Nordberg, Timothy J.: See--
Bracken, Scott J.; Chian, Brent; Nordberg, Timothy J.; and Troost, Henry E. 08074892 Cl. 236-1H.
Nordex Energy GmbH: See--
Keller, Harald; Wiese-Müller, Lars-Ulrich; and Voβ, Eberhard 08075266 Cl. 416-37.
Nordson Corporation: See--
Burmester, Thomas; and Kufner, Hubert 08074902 Cl. 239-553.5.
Fiske, Erik; Quinones, Horatio; Maiorca, Phillip P.; Babiarz, Alec; and Ciardella, Robert 08074467 Cl. 62-389.
Nordstrom, Diane: See--
Goldenberg, David M.; Qu, Zhengxing; Chang, Chien-Hsing; Rossi, Edmund A.; Yang, Jeng-Dar; and Nordstrom, Diane 08076140 Cl. 435-455.
Norgren GT Development Corporation: See--
Stephens, Charles; and Morris, John Michael 08074684 Cl. 137-625.21.
Nori, Aditya Vithal: See--
Chilimbi, Trishul Amit Madhukar; Vaswani, Kapil; and Nori, Aditya Vithal 08079020 Cl. 717-132.
Normand, Joseph: See--
Mercat, Jean-Pierre; Veux, Jean-Luc; and Normand, Joseph 08075065 Cl. 301-124.2.
Normile, James Oliver: See--
Price, Douglas; Zhou, Xiaosong; Wu, Hsi-Jung; and Normile, James Oliver 08077256 Cl. 348-364.
Noro, Yoshihiko: See--
Jabri, Khaled; Arai, Atsushi; Nishimura, Hiromichi; Noro, Yoshihiko; and Takeda, Dai 08077389 Cl. 359-487.02.
Norris, Steven J.; to Board of Regents of the University of Texas System, The VMP-like sequences of pathogenic Borrelia species and strains 08076470 Cl. 536-23.7.
Norrman, Karl: See--
Åström, Bo; Ivars, Ignacio Más; Carlsson, Hans; Cheng, Yi; and Norrman, Karl 08078733 Cl. 709-227.
Norstar Office Products, Inc.: See--
Horian, Richard C. 08075971 Cl. 428-61.
Nortel Networks Limited: See--
El-Hennaway, Mohamed Samy; Goubran, Rafik A.; and Qian, Zhihong 08077636 Cl. 370-260.
Wang, Phil; Monga, Indermohan; Lavian, Tal; Durairaj, Ramesh; and Travostino, Franco 08078708 Cl. 709-223.
Wu, Shiquan; Tong, Wen; and Strawczynski, Leo 08077599 Cl. 370-208.
North, Angus John: See--
Silverbrook, Kia; North, Angus John; and McAvoy, Gregory John 08075111 Cl. 347-84.
North Cell Pharmacetical: See--
Martin, Alain 08076373 Cl. 514-554.
North Pole Limited: See--
Kim, Changsoo 08075059 Cl. 297-378.12.
Northrop Grumman Systems Corporation: See--
Rice, Robert Rex 08076629 Cl. 250-216.
Rose, Conrad M. 08077088 Cl. 342-424.
Talbot, Patrick James; Ellis, Dennis Regan; and Sanders, J. Ryan 08078559 Cl. 706-45.
Norton Healthcare Limited: See--
Zeng, Xian-Ming 08075873 Cl. 424-46.
Norton, Richard L.: See--
Moore, Lester; and Norton, Richard L. 08076448 Cl. 528-492.
Norwood, Robert A.; and Skotheim, Terje Nanoamorphous carbon-based photonic crystal infrared emitters 08076617 Cl. 219-407.
Notarangelo, Giuseppe: See--
Pappalardo, Francesco; Notarangelo, Giuseppe; Salurso, Elena; and Guidetti, Elio 08078804 Cl. 711-130.
Noto, Nobuhiko: See--
Oka, Satoshi; and Noto, Nobuhiko 08076223 Cl. 438-503.
Nottingham, Brett Wells: See--
Othmer, Konstantin; and Nottingham, Brett Wells 08077832 Cl. 379-85.
Novak, Michael: See--
Sacson, Ilia; Novak, Michael; and McConnell, Christopher Clayton 08079065 Cl. 726-4.
Novar ED&S Limited: See--
Thirugnanasambandham, Kanthimathinathan 08076862 Cl. 315-209R.
Novartis AG: See--
Albientz, Patrick; Grenet, Jean-Michel; Hillenbrand, Rainer; Legay, Francois; Marbach, Peter; Marrony, Severine; and Schaefer, Judith 08076160 Cl. 436-501.
Fairhurst, Robin A 08076489 Cl. 548-165.
Herold, Peter; Mah, Robert; Tschinke, Vincenzo; Stojanovic, Aleksandar; Marti, Christiane; Stutz, Stefan; and Bennacer, Bibia 08076327 Cl. 514-224.2.
Portmann, Robert; Hofmeier, Urs Christoph; Burkhard, Andreas; Scherrer, Walter; and Szelagiewicz, Martin 08076362 Cl. 514-359.
Novello, Stefano: See--
Vasseur, Jean-Philippe Marcel; Novello, Stefano; and Previdi, Stefano Benedetto 08077713 Cl. 370-390.
Novo Nordisk A/S: See--
DeFrees, Shawn; Zopf, David A.; Bayer, Robert J.; Bowe, Caryn; Hakes, David James; and Chen, Xi 08076292 Cl. 514-14.1.
Larsen, Carsten Gerner; Stenholt, Lars; Molin, Anders; Rex, Jørn; and Larsen, Bjørn Gullak 08075522 Cl. 604-110.
Novotney, Donald J.; Filson, John B.; and Tupman, David, to Apple Inc. Electronic device having a dual key connector 08078776 Cl. 710-62.
Novozymes A/S: See--
Allain, Eric; Wenger, Kevin S.; and Bisgard-Frantzen, Henrik 08076109 Cl. 435-132.
Deinhammer, Randy; and Festersen, Rikke Monica 08076112 Cl. 435-161.
Wik, Monica Takamiya; and Sjoholm, Carsten 08076115 Cl. 435-196.
Nowak, Edward J.: See--
Anderson, Brent A.; and Nowak, Edward J. 08076204 Cl. 438-283.
Noyes, Mark: See--
Brickfield, Peter J.; Mahling, Dirk; Noyes, Mark; and Weaver, David 08078330 Cl. 700-291.
Nozawa, Eisuke: See--
Yamada, Hiroyoshi; Itahana, Hirotsune; Moritomo, Ayako; Matsuzawa, Takaho; Nozawa, Eisuke; Akuzawa, Shinobu; and Harada, Koichiro 08076348 Cl. 514-277.
Nozue, Yoshinobu; and Kawashima, Yasutoyo, to Sumitomo Chemical Company, Limited Ethylene based polymer composition and film 08076418 Cl. 525-191.
NTT DoCoMo, Inc.: See--
Eguchi, Hisatoshi; and Miura, Fumiaki 08079064 Cl. 726-4.
Goto, Yoshikazu; Hanaki, Akihito; Hayashi, Takahiro; Kawamoto, Junichiro; and Takagi, Yukiko 08078186 Cl. 455-452.1.
Ishii, Hiroyuki; Sato, Takuya; and Ando, Hidehiro 08077794 Cl. 375-267.
Kozat, Ulas C.; Demircin, Mehmet U.; Harmanci, Oztan; and Kanumuri, Sandeep 08078729 Cl. 709-226.
Nuctech Company Limited: See--
Hu, Haifeng; Li, Yuanjing; Zhang, Qingjun; and Chen, Zhiqiang 08076638 Cl. 250-288.
NuFlare Technology, Inc.: See--
Abe, Takayuki; and Tsuchiya, Hideo 08078012 Cl. 382-317.
Sakai, Michihiro; Kakehi, Ryoichi; and Hattori, Kiyoshi 08076649 Cl. 250-396R.
Shibata, Hayato 08076656 Cl. 250-492.22.
Nulkar, Chaitanya; Kemp, Jeffrey A.; Grier, James R.; and Mathew, Jose, to Network Appliance, Inc. Method and apparatus for testing a storage system head in a clustered failover configuration 08078718 Cl. 709-224.
Numano, Yasuhisa; and Satake, Kenji, to Fujitsu Toshiba Mobile Communications Limited Mobile phone with a plurality of speakers 08078239 Cl. 455-575.4.
Numatics, Incorporated: See--
De Carolis, Enrico; Eskew, John F.; Hundt, Michael W.; and Welker, Jeffrey 08074680 Cl. 137-560.
Numazawa, Sumito; Nakazawa, Yoshito; Kobayashi, Masayoshi; Kudo, Satoshi; Imai, Yasuo; Kubo, Sakae; Shigematsu, Takashi; Ohnishi, Akihiro; Uesawa, Kozo; and Oishi, Kentaro, to Renesas Electronics Corporation Method of fabricating semiconductor device 08076202 Cl. 438-270.
Nunally, Patrick O'Neal System and method for in-situ integrity and performance monitoring of operating metallic and non-metallic natural gas transmission and delivery pipelines using ultra wideband point-to point and point-to point and point-to-multipoint communication 08076928 Cl. 324-220.
Nuno, Katsuhiko; to Ricoh Company, Ltd. Lens barrel, lens driving apparatus, camera, and mobile information terminal 08077408 Cl. 359-813.
Nuno, Tatsumi: See--
Soma, Ryoji; Tamato, Toyomochi; Akiba, Masatsugu; and Nuno, Tatsumi 08076402 Cl. 524-291.
Nunokawa, Hirokazu: See--
Ishimoto, Bunji; and Nunokawa, Hirokazu 08075085 Cl. 347-19.
Nuss, John M.: See--
Anand, Neel K.; Blazey, Charles M.; Bowles, Owen Joseph; Bussenius, Joerg; Bannen, Lynne Canne; Chan, Diva Sze-Ming; Chen, Baili; Co, Erick Wang; Costanzo, Simona; Defina, Steven Charles; Dubenko, Larisa; Franzini, Maurizio; Huang, Ping; Jammalamadaka, Vasu; Khoury, Richard George; Kim, Moon Hwan; Klein, Rhett Ronald; Le, Donna Tra; Mac, Morrison B.; Nuss, John M.; Parks, Jason Jevious; Rice, Kenneth D.; Tsang, Tsze H.; Tsuhako, Amy Lew; Wang, Yong; and Xu, Wei 08076338 Cl. 514-252.02.
Nutaro, Joseph: See--
Lazarovich, David; Nutaro, Joseph; Gayowsky, Ted; Rusan, Ileana; Lee, Sang-Joon; Dangeti, Srinivasa Rao; Pesala, Narasimha Rao; Surisetty, Lakshminarayana; Gudimetla, Gopi; and Singh, Amit Kumar 08078342 Cl. 701-3.
Nutek Orthopaedics, Inc.: See--
Hajianpour, Mohammed A. 08075560 Cl. 606-59.
Nutley, Brian: See--
Nutley, Kim; and Nutley, Brian 08074723 Cl. 166-380.
Nutley, Kim; and Nutley, Brian, to Swelltec Limited Ring member for a swellable downhole packer 08074723 Cl. 166-380.
Nutting, John; and Daniel, Richard Substance identification and location method and system 08076924 Cl. 324-71.1.
NuVasive, Inc.: See--
Butcher, Peter; and Reah, Christopher 08074591 Cl. 112-475.18.
NVIDIA Corporation: See--
Diard, Franck R. 08077181 Cl. 345-505.
Lindholm, John Erik; Montrym, John S.; Kilgariff, Emmett M.; Moy, Simon S.; Treichler, Sean Jeffrey; Coon, Brett W.; Kirk, David; and Danskin, John 08077174 Cl. 345-419.
Rogers, Douglas H.; King, Gary C.; and Donovan, Walter E. 08078656 Cl. 708-200.
Tarjan, David; and Skadron, Kevin 08078844 Cl. 712-216.
NXP B.V.: See--
Kleihorst, Richard P.; Abbo, Antench A.; and Choudhary, Vishal S. 08078830 Cl. 712-10.
Krabbenborg, Bernardus Henricus; Berkhout, Marco; and Van Zwol, Johannes 08077440 Cl. 361-56.
Lindstrom, Mats; and Shafie, Abbolreza 08078129 Cl. 455-266.
Pontius, Timothy; and Roever, Jens 08078948 Cl. 714-798.
Thoonen, Henk 08076763 Cl. 257-686.
Witschnig, Harald; and Bruckbauer, Johannes 08078125 Cl. 455-205.
Nyce, David Scott Method and apparatus for simulating a potentiometer 08077067 Cl. 341-144.
Nycz, Jeffrey H.; to Warsaw Orthopedic, Inc Implantable tissue growth stimulator 08078282 Cl. 607-51.
Nykänen, Jari: See--
Hietaranta, Timo; and Nykänen, Jari 08075941 Cl. 427-8.