| US 7,464,311 B2 | ||
| Apparatus and method for device selective scans in data streaming test environment for a processing unit having multiple cores | ||
| Lee A. Larson, Katy, Tex. (US); Gary L. Swoboda, Sugar Land, Tex. (US); and Mark B. Rix, Houston, Tex. (US) | ||
| Assigned to Mitsubishi Denki Kabushiki Kaisha, Tokyo (Japan) | ||
| Filed on Aug. 05, 2002, as Appl. No. 10/212,622. | ||
| Prior Publication US 2004/0054950 A1, Mar. 18, 2004 | ||
| Int. Cl. G01R 31/28 (2006.01) | ||
| U.S. Cl. 714—727 [714/729] | 14 Claims |
| 1. In a multi-processor test system having boundary scan functionality, each processor capable of a streaming data mode of
operation, each processor comprising:
a test control unit;
a register unit including;
a 1-bit bypass register for use in a bypass node, and;
an n-bit register for use in data exchange mode;
wherein the test control unit is responsive to a first instruction for placing the processor in a bypass mode;
wherein, in the bypass mode, the test control unit is responsive to logic “1” in the bypass register, the logic “1” in the
bypass register maintaining the processor in the bypass mode; and
wherein, in the bypass mode, the test control apparatus is responsive to a logic “0” in the bypass register, the logic “0”
in the bypass register causing the processor to enter the streaming data mode of operation.
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