| US 7,461,309 B2 | ||
| Systems and methods for providing output data in an LBIST system having a limited number of output ports | ||
| Naoki Kiryu, Tokyo (Japan) | ||
| Assigned to Kabushiki Kaisha Toshiba, Tokyo (Japan) | ||
| Filed on Dec. 20, 2005, as Appl. No. 11/313,097. | ||
| Prior Publication US 2007/0143651 A1, Jun. 21, 2007 | ||
| Int. Cl. G01R 31/28 (2006.01) | ||
| U.S. Cl. 714—729 [714/724; 714/726; 714/732] | 19 Claims |
| 1. A system comprising,
test circuitry coupled to target logic under test,
wherein the test circuitry is configured to perform logic tests on the target logic using input data and thereby generate
signature data;
a first number of shared I/O ports coupled to the test circuitry and configured to alternately convey the input data to the
test circuitry and output the signature data generated by the test circuitry;
wherein the signature data comprises a second number of bits greater than the first number of I/O ports; and
wherein the test circuitry is configured to successively output multiple segments of the signature data through the I/O ports,
wherein each segment has a third number of bits no greater than the first number of I/O ports.
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