| US 7,460,343 B2 | ||
| Magnetic read sensor employing oblique etched underlayers for inducing uniaxial magnetic anisotropy in a hard magnetic in-stack bias layer | ||
| Matthew Joseph Carey, San Jose, Calif. (US); Jeffrey Robinson Childress, San Jose, Calif. (US); Eric Edward Fullerton, Morgan Hill, Calif. (US); and Stefan Maat, San Jose, Calif. (US) | ||
| Assigned to Hitachi Global Storage Technologies Netherlands B.V., Amsterdam (Netherlands) | ||
| Filed on Mar. 31, 2005, as Appl. No. 11/97,638. | ||
| Prior Publication US 2006/0221513 A1, Oct. 05, 2006 | ||
| This patent is subject to a terminal disclaimer. | ||
| Int. Cl. G11B 5/39 (2006.01) | ||
| U.S. Cl. 360—324.12 [360/324.2] | 31 Claims |
| 1. A magnetoresistive sensor comprising:
an underlayer;
a hard magnetic layer formed over the underlayer;
a non-magnetic coupling layer formed over the hard magnetic layer; and
a magnetic free layer formed over the coupling layer;
wherein the underlayer has an anisotropic roughness at an surface between the hard magnetic layer and the underlayer.
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