| US 7,458,818 B2 | ||
| Electric connector and electrical connecting apparatus using the same | ||
| Hidehiro Kiyofuji, Aomori (Japan); and Naoki Suto, Aomori (Japan) | ||
| Assigned to Kabushiki Kaisha Nihon Micronics, Musashino-shi, Tokyo (Japan) | ||
| Filed on Nov. 14, 2007, as Appl. No. 11/940,282. | ||
| Claims priority of application No. 2006-332031 (JP), filed on Dec. 08, 2006. | ||
| Prior Publication US 2008/0139017 A1, Jun. 12, 2008 | ||
| Int. Cl. H01R 12/00 (2006.01) | ||
| U.S. Cl. 439—66 [324/761; 439/92] | 12 Claims |
| 1. An electrical connecting apparatus for connecting a tester and electrical connection terminals of a device under test to
undergo an electrical test by said tester, comprising:
a wiring board having an upside, an underside, a plurality of wiring circuits to be connected to said tester, and connection
terminals formed on the underside of said wiring board, each connection terminal being connected to said wiring circuits;
a flat plate-like probe board having an upside and an underside, the upside of said probe board being opposed to the underside
of said wiring board, and said probe board having a plurality of electrical connection terminals on the upside of said probe
board and having a plurality of probe lands on the underside of said probe board, each probe land being connected to said
electrical connection terminals of the probe board;
a plurality of contacts provided on the underside of said probe board, each contact being connected to said probe lands, and
having a tip end portion, and each tip end portion being able to abut on the electrical connection terminals of the device
under test;
a support member disposed on the upside of said wiring board;
a thermal deformation restraining member disposed on said support member to restrain thermal deformation of said support member
and having a coefficient of thermal expansion greater than that of said support member; and
an electrical connecting device disposed between said wiring board and said probe board and for connecting the connection
terminals of said wiring board to the electrical connection terminals of said probe board, said electrical connecting device
comprising:
an electrical insulating plate having at least a first and a second groups each including a plurality of through holes penetrating
said electrical insulating plate in its thickness direction; and
a plurality of conductive connecting pins, each pin being disposed in the through hole, and each pin having the upper end
portion connected to the connection terminals of said wiring board and the lower end portion connected to the connection terminals
of said probe board; wherein
said electrical insulating plate further has at least one of conductive earth patterns on at least one of the upside, underside
and inside of said electrical insulating plate;
the connecting pin disposed in each through hole of said first group is connected to said earth pattern; and
the connecting pin disposed in each through hole of said second group is electrically separated from said earth pattern.
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