| US 7,456,763 B2 | ||
| Semiconductor device having an A/D conversion circuit | ||
| Masaya Hirose, Kyoto (Japan); Kinya Daio, Kyoto (Japan); and Tetsuya Oosaka, Osaka (Japan) | ||
| Assigned to Panasonic Corporation, Osaka (Japan) | ||
| Filed on Jan. 03, 2007, as Appl. No. 11/648,626. | ||
| Claims priority of application No. 2006-010681 (JP), filed on Jan. 19, 2006. | ||
| Prior Publication US 2007/0164890 A1, Jul. 19, 2007 | ||
| Int. Cl. H03M 1/10 (2006.01) | ||
| U.S. Cl. 341—120 [341/155] | 17 Claims |
| 1. A semiconductor device comprising:
an A/D conversion circuit;
a digital processing circuit for performing processing based on conversion results of the A/D conversion circuit; and
an output terminal for testing for outputting the conversion results of the A/D conversion circuit externally,
wherein the output of the conversion results from the output terminal for testing is made at timing that is different from
timing of other conversion operation of which conversion results are to be outputted later and is longer in cycle than timing
of conversion operation.
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