| US 7,455,955 B2 | ||
| Planarization method for multi-layer lithography processing | ||
| Wu-Sheng Shih, Rolla, Mo. (US); James E. Lamb, III, Rolla, Mo. (US); Juliet Ann Minzey Snook, Cook Station, Mo. (US); and Mark G. Daffron, Rolla, Mo. (US) | ||
| Assigned to Brewer Science Inc., Rolla, Mo. (US) | ||
| Filed on Feb. 24, 2003, as Appl. No. 10/373,897. | ||
| Claims priority of provisional application 60/360374, filed on Feb. 27, 2002. | ||
| Prior Publication US 2004/0029041 A1, Feb. 12, 2004 | ||
| This patent is subject to a terminal disclaimer. | ||
| Int. Cl. G03F 7/26 (2006.01) | ||
| U.S. Cl. 430—311 [438/760] | 30 Claims |
| 1. A method of forming a microelectronic precursor, said method comprising the steps of:
(a) providing a substrate having a surface and including a plurality of topography features on said surface;
(b) forming a planarizing layer on said surface, said planarizing layer comprising a compound selected from the group consisting
of polymers, monomers, oligomers, or mixtures thereof of the following: epoxies, acrylates, vinyl ethers, polyesters, polyimides,
and vinyl-containing compounds and mixtures of the foregoing;
(c) contacting the planarizing layer with a flat surface of an object for sufficient time, pressure, and temperature to transfer
the flatness of the flat surface to the planarizing layer, curing or hardening said planarizing layer during or after said
contacting, said flattened cured or hardened planarizing layer presenting a globally planar surface ready for the application
of subsequent layers;
(d) optionally forming one or more intermediate layers on said globally planar surface of said planarizing layer;
(e) forming an imaging layer to yield the microelectronic precursor, said imaging layer being formed on said intermediate
layers if present or on said planarizing layer if no intermediate layers are present, said layer-forming steps (d) and (e)
being carried out without alteration of said globally planar surface of said planarizing layer;
(f) creating a pattern on said imaging layer; and
(g) transferring said pattern to said intermediate layers, if present, and to said planarizing layer, wherein after said transferring
step said substrate surface retains at least a portion of its original topography.
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