LIST OF PATENTEES
TO WHOM
PATENTS WERE ISSUED ON THE 22th DAY OF November, 2011
NOTE--Arranged in accordance with the first significant character or word of the name
(in accordance with city and telephone directory practice).

N. V. Organon: See--
Rewinkel, Johannes Bernardus Maria; Folmer, Brigitte Johanna Bernita; Ollero, Maria Lourdes; and Ibrahim, Hemen 08063037 Cl. 514-211.09.
N.V. Organon: See--
Stock, Herman Thijs; Teerhuis, Neeltje Miranda; and Veeneman, Gerrit Herman 08063102 Cl. 514-520.
Na, Jae Hyun: See--
Gi, Chang Ju; Sung, Young Bok; Kim, Hyeong Jun; Na, Jae Hyun; Lee, Tae Hoon; and Choi, Jong Eup 08061776 Cl. 297-341.
Naarup, Gary; to Premier One Products Adjustable UV air purifier 08062589 Cl. 422-29.
Nabetani, Toshihisa: See--
Toshimitsu, Kiyoshi; Takagi, Masahiro; Matsuo, Ryoko; Nabetani, Toshihisa; Hirano, Tatsuma; and Adachi, Tomoko 08064371 Cl. 370-278.
Nabutovsky, Yelena; and Falkenberg, Eric, to Pacesetter, Inc. Use of implantable body position and body movement sensors 08065001 Cl. 607-17.
Nadabar, Sateesh: See--
Gerst, III, Carl W.; Equitz, William H.; Testa, Justin; and Nadabar, Sateesh 08061614 Cl. 235-455.
Nadabar, Sateesha: See--
Gerst, III, Carl W.; Equitz, William H.; Testa, Justin; and Nadabar, Sateesha 08061613 Cl. 235-455.
Nadampalli, Narasimhamurthy Raju: See--
Kumar, Raj; Hiremath, Vijaykumar Muppayya; Sakkaraju, Dhanasekarakannan; Rao, Kavala Venkateswara; and Nadampalli, Narasimhamurthy Raju 08062431 Cl. 134-10.
Nadella, Venupriya: See--
Kumar, Janaki; Nadella, Venupriya; Pricken, Thorsten; Kruger, Jodette; and Hamner, Brett 08065618 Cl. 715-736.
Nadiro A/S: See--
Nielsen, Bent D0649028 Cl. D8-382.
Naessens, Kris; Bockstaele, Ronny; Luyssaert, Bert; and Baets, Roeland, to Trinean NV Optical characterisation methods and systems 08064063 Cl. 356-441.
Nagae, Tsuyoshi: See--
Hioki, Hitomi; Ohta, Kiyoichi; Nagae, Tsuyoshi; Yamaguchi, Koshiro; and Ohashi, Tsuyoshi 08063741 Cl. 340-10.1.
Nagahiro, Isamu: See--
Kawata, Hisao; Nagahiro, Isamu; and Shimizu, Motohiro 08063600 Cl. 318-471.
Nagai, Hiroshi: See--
Sakamoto, Michiaki; Mori, Kenichi; Naka, Kenichirou; and Nagai, Hiroshi 08064030 Cl. 349-153.
Nagai, Takayuki: See--
Takagi, Kiyoji; Tsunoda, Morio; Suzuki, Masami; Nagai, Takayuki; and Isobe, Yasumitsu 08062557 Cl. 252-511.
Nagamine, Hisayuki: See--
Ishihara, Takashi; Yamagami, Minoru; and Nagamine, Hisayuki 08063661 Cl. 326-41.
Nagano, Isamu; and Ikehata, Yoshio, to Kanazawa University Coil device and magnetic field generating device 08062204 Cl. 600-13.
Nagano, Masao: See--
Higashidani, Yoshihiko; Kato, Takeshi; Nagano, Masao; and Yoshino, Tsutomu 08064198 Cl. 361-679.53.
Nagao, Daisuke; and Tamura, Kenji, to Honda Motor Company, Ltd. Handlebar assemblies and vehicles including same 08061235 Cl. 74-551.3.
Nagao, Nobuaki; Hamada, Takahiro; and Itoh, Akihiro, to Panasonic Corporation Light-emitting diode element and method for fabricating the same 08063549 Cl. 313-498.
Nagao, Yoshito; and Shimoyama, Takeshi, to Sony Corporation Arbitration apparatus, method, and computer readable medium with dynamically adjustable priority scheme 08065458 Cl. 710-244.
Nagaoka, Hiroshi; Horitani, Masao; and Inoue, Satoru, to Paramount Bed Co., Ltd. Coordinative control system for adjusting the back and knee bottom sections of an adjustable bed 08065024 Cl. 700-83.
Nagaraj, Bangalore Aswatha: See--
Fu, Ming; Darolia, Ramgopal; Gorman, Mark; and Nagaraj, Bangalore Aswatha 08062759 Cl. 428-469.
Nagaraj, Prithvi: See--
Khan, Ata; Goodhue, Greg; Shrivastava, Pankaj; Van Der Veer, Bas; Varney, Rick; and Nagaraj, Prithvi 08065512 Cl. 713-2.
Nagarajan, Vijay; Scharf, Louis L.; and Narayan, Armand P., to Rambus Inc. Interference cancellation in variable codelength systems for multi-acess communication 08064498 Cl. 375-148.
Nagasaka, Hiroyuki; Ishii, Yuuki; and Makinouchi, Susumu, to Nikon Corporation Immersion exposure apparatus and device manufacturing method with no liquid recovery during exposure 08064037 Cl. 355-30.
Nagasaka, Hiroyuki; to Nikon Corporation Exposure apparatus, exposure method, and device producing method 08064044 Cl. 355-72.
Nagasawa, Toshio: See--
Hosokawa, Kyoichi; Kudo, Ryotaro; Nagasawa, Toshio; and Tateno, Koji 08063620 Cl. 323-282.
Nagase, Kenji: See--
Nishino, Shuko; and Nagase, Kenji 08065101 Cl. 702-66.
Nagase, Ryuichi; and Kajiya, Yoshio, to JX Nippon Mining & Metals Corporation Lithium-containing transition metal oxide target, process for producing the same and lithium ion thin film secondary battery 08062486 Cl. 204-298.13.
Nagase, Yu; Shimoyamada, Naoya; Iwasaki, Yasuhiko; and Ishihara, Kazuhiko, to Tokai University Educational System Diamine compound having phosphorylcholine group, polymer thereof, and process for producing the polymer 08063238 Cl. 558-169.
Nagashima, Hiroyuki; and Tokiwa, Naoya, to Kabushiki Kaisha Toshiba Semiconductor memory device 08064272 Cl. 365-189.06.
Nagashio, Yoshiaki: See--
Shimizu, Shigenori; and Nagashio, Yoshiaki 08061038 Cl. 29-898.09.
Nagata, Kenji: See--
Ichikawa, Toru; Nagata, Kenji; and Chew, Kong Mun 08061897 Cl. 383-35.
Nagata, Shingo: See--
Ikegame, Ken; Nagata, Shingo; and Fukui, Shigeki 08061809 Cl. 347-47.
Nagata, Shingo; to Canon Kabushiki Kaisha Recording head 08061808 Cl. 347-47.
Nagata, Takayuki: See--
Kawakami, Yuta; and Nagata, Takayuki D0649118 Cl. D13-147.
Nagatani, Kazuo: See--
Hamada, Hajime; Nagatani, Kazuo; Ishikawa, Hiroyoshi; and Fudaba, Nobukazu 08064529 Cl. 375-260.
Nagatomi, Akira; Sakane, Kenji; and Yamada, Tomoya, to Mitsubishi Chemical Corporation Phosphor and manufacturing method therefore, and light emission device using the phosphor 08062549 Cl. 252-301.4F.
Nagatomi, Kenji; to Sanyo Electric Co., Ltd. Optical pickup apparatus and focal-point adjusting method 08064317 Cl. 369-112.19.
Nagaya, Shigeki; Hirai, Seiichi; and Ueda, Hirotada, to Hitachi Kokusai Electric Co., Ltd. Recording and reproducing system for image data with recording position information and a recording and reproducing method therefor 08064735 Cl. 382-305.
Nagayama, Kazuo: See--
Kamimura, Yasuhiro; Sasaki, Yasushi; Aoki, Sadayuki; and Nagayama, Kazuo RE042940 Cl. 123-399.
Naghshiineh, Steve F.; and Roberts, Ralph L., to R&L Carriers, Inc. Bill of lading transmission and processing system for less than a load carriers 08065205 Cl. 705-29.
Naghski, John Emiljan: See--
DiRienzo, Jr., Jules Joseph; Hafer, Kevin G.; Naghski, John Emiljan; and Hopkins, Travis Darrell 08061199 Cl. 73-431.
Nagoya, Mitsugu; to Duaxes Corporation Binary search circuit and method 08065322 Cl. 707-769.
Nagra, Sundeep S.: See--
Santos, David L.; and Nagra, Sundeep S. 08064454 Cl. 370-392.
Nagumo, Takayuki: See--
Hayashi, Tatsuya; and Nagumo, Takayuki 08062077 Cl. 439-725.
Nagumo, Toshihiko; to Seiko Epson Corporation Optical device and projector 08061844 Cl. 353-20.
Nagurny, Nicholas John: See--
Rapp, John; Nagurny, Nicholas John; Farrior, Curry; and Howard, Robert J. 08064291 Cl. 367-145.
Nagy, Lajos T.: See--
Aranyi, Peter; Balazs, Laszlo; Bata, Imre; Batori, Sandor; Boronkay, Eva; Bovy, Philippe; Kanai, Karoly; Kapui, Zoltan; Susan, Edit; Szabo, Tibor; Nagy, Lajos T.; Urban-Szabo, Katalin; and Varga, Marton 08063045 Cl. 514-241.
Nahuelquin Rios, Yanina Iveth: See--
Schobitz Twele, Renate Paula; Ciampi Panno, Luigi; Costa Lobo, Marcia Enriqueta; Brito Contreras, Carmen Susana; Fuentes Perez, Juan Ricardo; Horzella Rademacher, Mariela; Nahuelquin Rios, Yanina Iveth; and Vergara Hinostroza, Cristina del Carmen 08062633 Cl. 424-93.1.
Naimi, Yaakov; to Holy Land Treasures, Inc. Book that includes soil from predetermined places D0649186 Cl. D19-26.
Nair, Rajesh: See--
Cheng, Wen-Chun; Wang, Po-Cheng; Srirajavatchavai, Venkatapathi Raju; and Nair, Rajesh 08065712 Cl. 726-1.
Naito, Hidehiro: See--
Yamada, Yoshiya; Iizaka, Hitoshi; Mihara, Hidemi; Tsuchiya, Osamu; and Naito, Hidehiro 08061612 Cl. 235-454.
Naito, Hirohisa; Kii, Takahiro; and Ozaki, Toru, to Fujitsu Limited Multi-lingual information display system comprising public area and individual areas 08065134 Cl. 704-8.
Naito, Masashi: See--
Katayama, Kunihiro; Tamura, Takayuki; Watatani, Satoshi; Inoue, Kiyoshi; Shiota, Shigemasa; and Naito, Masashi 08064257 Cl. 365-185.08.
Najarian, Kayvan; to University of North Carolina at Charlotte Methods and systems for analysis of dynamic biological pathways 08065089 Cl. 702-19.
Najt, Paul M.: See--
Cleary, David J.; Najt, Paul M.; Marriott, Craig D.; and Chang, Junseok 08061318 Cl. 123-90.17.
Naka, Kenichirou: See--
Sakamoto, Michiaki; Mori, Kenichi; Naka, Kenichirou; and Nagai, Hiroshi 08064030 Cl. 349-153.
Nakabayashi, Kenichi: See--
Morita, Keizo; and Nakabayashi, Kenichi 08064241 Cl. 365-145.
Nakada, Toshiyuki; Kawane, Hideaki; Fujinaka, Hiroyasu; and Enguchi, Itaru, to Panasonic Corporation Lens barrel and imaging device 08064150 Cl. 359-819.
Nakagaki, Yoshihisa; and Tokiwa, Yuji, to NHK Spring Co., Ltd. Frame structure of seat back for vehicle and seat back for vehicle with frame structure 08061779 Cl. 297-452.2.
Nakagawa, Hisao: See--
Itai, Daisuke; Ozawa, Kunitaka; Fujiwara, Hiroaki; Kawauchi, Yoshihiro; Nakagawa, Hisao; Nakamura, Hajime; and Masuda, Mitsuhiro 08065270 Cl. 707-638.
Nakagawa, Katsumi; to Canon Kabushiki Kaisha Organic electroluminescence display and method of producing same 08062774 Cl. 428-690.
Nakagawa, Kazuyuki; to Canon Kabushiki Kaisha Photosensor and focus detecting device 08063977 Cl. 348-345.
Nakagawa, Tadashi: See--
Jinno, Kunihiko; Nakagawa, Tadashi; Maeda, Masahiko; and Yaguchi, Hideaki 08065069 Cl. 701-102.
Nakagawa, Takao: See--
Obuchi, Kazuhisa; Yano, Tetsuya; Miyazaki, Shunji; and Nakagawa, Takao 08064937 Cl. 455-502.
Nakagawa, Takashi: See--
Fujii, Shuhji; Okamoto, Yuji; Nakagawa, Yuji; Nakagawa, Takashi; Kato, Shinji; Ishikura, Kaoru; Ueda, Nobuyuki; and Ogo, Atsushi 08064785 Cl. 399-33.
Nakagawa, Yuji: See--
Fujii, Shuhji; Okamoto, Yuji; Nakagawa, Yuji; Nakagawa, Takashi; Kato, Shinji; Ishikura, Kaoru; Ueda, Nobuyuki; and Ogo, Atsushi 08064785 Cl. 399-33.
Nakahara, Tae; Tanaka, Shinichiro; Kaneko, Hideki; Taniguchi, Hironori; and Ariga, Masashi, to Sony Corporation Liquid crystal display panel having an ornamental reflector deployed around the periphery of a display region 08064013 Cl. 349-113.
Nakahara, Youichiro; and Ikegawa, Naoto, to Panasonic Electric Works, Ltd. Silver layer formed by electrosilvering substrate material 08062765 Cl. 428-673.
Nakai, Miho: See--
Kawahara, Mitsuhiro; Nakai, Miho; and Ueda, Kazue 08062721 Cl. 428-34.1.
Nakajima, Daiki: See--
Kanaya, Yasuhiro; Nakajima, Daiki; Shimada, Yusuke; and Tanaka, Hironao 08064023 Cl. 349-138.
Nakajima, Kenichi: See--
Kubota, Tomoyuki; and Nakajima, Kenichi 08061915 Cl. 400-621.
Nakajima, Yoshinori; Tanaka, Toshiyuki; and Matoba, Hirotugu, to Sharp Kabushiki Kaisha Droplet jet unit and droplet jet device 08061817 Cl. 347-65.
Nakakado, Masaki; and Miyoshi, Akihiro, to Zuiko Corporation Velocity-changing apparatus for web 08062459 Cl. 156-256.
Nakakita, Satoru; and Sakakibara, Akihiro, to Brother Kogyo Kabushiki Kaisha Sheet conveyor and image reading apparatus 08061711 Cl. 271-245.
Nakamoto, Keiichi: See--
Sasaki, Yuichiro; Okashita, Katsumi; Nakamoto, Keiichi; Kanada, Hisataka; and Mizuno, Bunji 08063437 Cl. 257-327.
Nakamura, Ayako: See--
Cociorva, Oana; Li, Bei; Szardenings, Anna Katrin; Fukuda, Yasumichi; Nomura, Masahiro; Seto, Shigeki; Yumoto, Kazuhiro; Okada, Kyoko; and Nakamura, Ayako 08063221 Cl. 546-156.
Nakamura, Hajime: See--
Itai, Daisuke; Ozawa, Kunitaka; Fujiwara, Hiroaki; Kawauchi, Yoshihiro; Nakagawa, Hisao; Nakamura, Hajime; and Masuda, Mitsuhiro 08065270 Cl. 707-638.
Nakamura, Hiroki: See--
Hayashi, Hirotaka; Nakamura, Takashi; Fuchi, Masayoshi; Tada, Masahiro; and Nakamura, Hiroki 08063866 Cl. 345-98.
Nakamura, Hiroshi: See--
Umemoto, Kazuhiko; Takeuchi, Hisato; Nakamura, Hiroshi; Usuki, Arimitsu; and Fujita, Makoto 08063207 Cl. 544-181.
Nakamura, Junichi: See--
Kainoh, Naoshi; Shirai, Akihito; Nishimoto, Yoichi; and Nakamura, Junichi 08064166 Cl. 360-224.
Nakamura, Katsuyuki: See--
Kuranuki, Kenji; Nakamura, Katsuyuki; and Kobashi, Mikio 08064192 Cl. 361-525.
Nakamura, Kazuhiko: See--
Itani, Takaharu; Matsuo, Koji; and Nakamura, Kazuhiko 08062973 Cl. 438-664.
Nakamura, Keisuke; to Japan Aviation Electronics Industry, Limited Connector 08062041 Cl. 439-108.
Nakamura, Kensuke; to Mitsui Mining & Smelting Co., Ltd. Method for manufacturing multilayer printed wiring board and multilayer printed wiring board obtained by the same 08062539 Cl. 216-83.
Nakamura, Makoto: See--
Tonegawa, Hiromi; Ichishi, Masato; Oyobe, Hichirosai; Nakamura, Makoto; Ishikawa, Tetsuhiro; and Fujitake, Yoshinori 08063605 Cl. 320-107.
Nakamura, Makoto; to Hitachi, Ltd. Variable valve actuating apparatus for internal combustion engine 08061311 Cl. 123-90.16.
Nakamura, Makoto; Hara, Seinosuke; Tsuruta, Seiji; and Kajiura, Mikihiro, to Hitachi, Ltd. Variable valve actuating apparatus for internal combustion engine and control shaft for variable valve actuating apparatus 08061315 Cl. 123-90.16.
Nakamura, Minako: See--
Takano, Ruriko; Nishijima, Etsu; Tanaka, Hiroshi; Okano, Tamae; Futagi, Momoe; and Nakamura, Minako 08064648 Cl. 382-117.
Nakamura, Naohiro: See--
Nohara, Takeshi; Tajima, Kenji; and Nakamura, Naohiro D0649244 Cl. D24-138.
Nakamura, Nobuyuki; and Seto, Kazuhiro, to JFE Steel Corporation Hot-rolled thin steel sheet with excellent formability and excellent strength and toughness after heat treatment, and method for manufacturing the same 08062438 Cl. 148-602.
Nakamura, Seigo: See--
Hasebe, Akio; Motoyama, Yasuhiro; Narizuka, Yasunori; Nakamura, Seigo; and Kawakami, Kenji 08062911 Cl. 438-17.
Nakamura, Shigeo: See--
Shimizu, Toshihiko; Watanabe, Keiko; Nakamura, Shigeo; and Otake, Noritaka 08064171 Cl. 360-264.9.
Nakamura, Takashi: See--
Hayashi, Hirotaka; Nakamura, Takashi; Fuchi, Masayoshi; Tada, Masahiro; and Nakamura, Hiroki 08063866 Cl. 345-98.
Nakamura, Takashi; and Anbo, Kiyoshi, to Husqvarna Zenoah Co., Ltd. Fuel tank cap D0649099 Cl. D12-197.
Nakamura, Takeshi; to Canon Kabushiki Kaisha Image processing apparatus and control method for printing image sized according to determined face area 08064652 Cl. 382-118.
Nakamura, Yayoi: See--
Ishii, Hiromitsu; and Nakamura, Yayoi 08063865 Cl. 345-98.
Nakamura, Yoshihiko: See--
Motobe, Hidetsugu; Nakamura, Yoshihiko; Koizumi, Takeshi; and Takahashi, Ryuji 08062750 Cl. 428-413.
Nakamura, Yuji: See--
Hakomori, Ikuo; Nakamura, Yuji; Nakanishi, Keiichi; and Ida, Koichi 08063457 Cl. 257-417.
Nakanishi, Kazuo; Kikuchi, Yoshimi; Kojima, Junichiro; Suzuki, Tomoko; Nishimura, Yasushi; and Kojima, Hiroyuki, to Ajinomoto Co., Inc. Method for producing L-lysine 08062869 Cl. 435-115.
Nakanishi, Keiichi: See--
Hakomori, Ikuo; Nakamura, Yuji; Nakanishi, Keiichi; and Ida, Koichi 08063457 Cl. 257-417.
Nakanishi, Takashi: See--
Yoshioka, Masahiro; Kikuchi, Masato; Mochizuki, Shunsuke; Araki, Ryosuke; Handa, Masaki; Nakanishi, Takashi; Kimura, Hiroto; Wada, Seiji; Ichiki, Hiroshi; and Kondo, Tetsujiro 08063830 Cl. 343-700MS.
Nakano, Daiju: See--
Taira, Yoichi; and Nakano, Daiju 08064138 Cl. 359-571.
Nakano, Takahiro: See--
Moriwake, Shinichi; Saika, Nobuyuki; Kamei, Hitoshi; and Nakano, Takahiro 08065305 Cl. 707-737.
Nakano, Takao: See--
Hoga, Toru; Nakano, Takao; Kira, Satoshi; and Tahara, Kouzou 08062131 Cl. 463-37.
Nakano, Takuji: See--
Uebayashi, Shigeki; Kobayashi, Masakazu; and Nakano, Takuji 08061523 Cl. 209-21.
Nakano, Toshihisa: See--
Ito, Yoshikatsu; Harada, Shunji; Tsusaka, Yuko; Fujioka, Soichiro; Ohmori, Motoji; and Nakano, Toshihisa 08065498 Cl. 711-162.
Nakano, Yoshikazu; Sakura, Shunji; and Kunimatsu, Kohei, to Tsubakimoto Chain Co. Timing chain drive unit 08062158 Cl. 474-141.
Nakao, Seigo: See--
Fukuoka, Masaru; Nishio, Akihiko; Nakao, Seigo; and Golitschek Edler Von Elbwart, Alexander 08064919 Cl. 455-450.
Tanaka, Yasuhiro; and Nakao, Seigo 08064388 Cl. 370-329.
Nakao, Takayuki: See--
Ochiai, Takahiro; Nakao, Takayuki; Miyazawa, Toshio; Maki, Masahiro; and Sasaki, Tohru 08064026 Cl. 349-141.
Nakashima, Akira; Egami, Miki; Komatsu, Michio; Nakata, Yoshihiro; Yano, Ei; and Suzuki, Katsumi, to JGC Catalysts and Chemicals Ltd. Coating liquid for forming amorphous silica-based coating film with low dielectric constant 08062414 Cl. 106-287.11.
Nakashima, Atsuhisa; to Brother Kogyo Kabushiki Kaisha Inkjet recording apparatus 08061835 Cl. 347-104.
Nakashima, Daiichiro: See--
Yamada, Shohei; Nakashima, Daiichiro; and Hibi, Keiichi 08064916 Cl. 455-450.
Nakashima, Shingo; to Renesas Electronics Corporation Semiconductor integrated circuit for minimizing a deviation of an internal power supply from a desired value 08065535 Cl. 713-300.
Nakata, Masahiro: See--
Nakatani, Morio; Horiuchi, Keiji; and Nakata, Masahiro 08064306 Cl. 369-53.2.
Nakata, Ryuji: See--
Kitahata, Kouji; Tabata, Masahiro; and Nakata, Ryuji 08063002 Cl. 508-110.
Nakata, Satoshi: See--
Endo, Hironori; Nunokawa, Hirokazu; Igarashi, Hitoshi; and Nakata, Satoshi 08061798 Cl. 347-16.
Nakata, Tetsuo: See--
Takahashi, Takayuki; Susa, Toshihiro; Furusho, Kazuhiro; Suhara, Atsushi; Hirouchi, Takashi; and Nakata, Tetsuo 08061028 Cl. 29-888.022.
Nakata, Toshihiko; Watanabe, Masahiro; Baba, Shuichi; Yoshitake, Yasuhiro; and Nomoto, Mineo, to Hitachi, Ltd. Method and apparatus for measuring displacement of a sample to be inspected using an interference light 08064066 Cl. 356-493.
Nakata, Yoshihiro: See--
Nakashima, Akira; Egami, Miki; Komatsu, Michio; Nakata, Yoshihiro; Yano, Ei; and Suzuki, Katsumi 08062414 Cl. 106-287.11.
Nakatake, Kouji: See--
Oohashi, Masaaki; Horiuchi, Youichi; Yoda, Yasushi; and Nakatake, Kouji 08063523 Cl. 310-71.
Nakatani, Hiroshi; Seto, Naoto; Toko, Makoto; and Fukai, Eigo, to Kabushiki Kaisha Toshiba Redundant control apparatus 08065564 Cl. 714-37.
Nakatani, Morio; Horiuchi, Keiji; and Nakata, Masahiro, to Sanyo Electric Co., Ltd. Optical disc device and hybrid optical disc 08064306 Cl. 369-53.2.
Nakatani, Seiichi: See--
Asahi, Toshiyuki; Karashima, Seiji; Ichiryu, Takashi; Nakatani, Seiichi; and Nishiyama, Tousaku 08064213 Cl. 361-761.
Hirano, Koichi; Shiraishi, Tsukasa; Nakatani, Seiichi; and Ogawa, Tatsuo 08063486 Cl. 257-737.
Nakatsu, Fumihiko: See--
Miyamoto, Takashi; Doi, Ryuji; Syukunami, Tomoyuki; and Nakatsu, Fumihiko 08064126 Cl. 359-296.
Nakatsu, Kinya: See--
Tokuyama, Takeshi; Nakatsu, Kinya; and Saito, Ryuichi 08064234 Cl. 363-141.
Nakatsuka, Yoshiaki; to Seiwa Industry Co., Ltd. Booster cable D0649116 Cl. D13-120.
Nakaue, Takuya: See--
Iwata, Futoshi; Yasutake, Masatoshi; Nakaue, Takuya; Kikuchi, Syuichi; and Takaoka, Osamu 08062494 Cl. 204-650.
Nakayama, Eric S.: See--
Fitzpatrick, Richard M.; Mayberry, Michael T.; Morgan, Michael; Burt, Eric C.; and Nakayama, Eric S. 08061071 Cl. 42-50.
Nakayama, Yoshinori: See--
Okai, Nobuhiro; Okazaki, Shinji; Sohda, Yasunari; and Nakayama, Yoshinori 08064681 Cl. 382-141.
Nakazato, Yasushi; Ue, Kohji; Yamane, Jun; Satoh, Osamu; and Yamashita, Masahide, to Ricoh Company, Ltd. Management device of an image forming apparatus 08064782 Cl. 399-9.
Nakhawa, Ganesh: See--
Zhang, Debin; Lapuh, Roger; and Nakhawa, Ganesh 08064458 Cl. 370-392.
Nakstad, Hilde: See--
Rønnekleiv, Erlend; Waagaard, Ole Henrik; Nakstad, Hilde; and Berg, Arne 08064286 Cl. 367-20.
Nalagatla, Anil K.: See--
Nobis, Rudolph H.; Nalagatla, Anil K.; and Conlon, Sean P. 08062306 Cl. 606-113.
Nam, Chul-Hun: See--
Jung, Min-Kyu; Park, Dong-Woo; Lee, Hun-Sik; Nam, Chul-Hun; and Sung, Ki-Seok 08062004 Cl. 417-312.
Nam, Taek kyun; to GCS. Inc., Ltd Cylinder housing for air compressor D0649165 Cl. D15-9.
Namatame, Ichiji: See--
Suzuki, Yoshio; Yokoyama, Kenji; and Namatame, Ichiji 08062492 Cl. 204-600.
Namuduri, Chandra S.; Li, Yunjun; Talty, Timothy J.; Elliott, Robert B.; and McMahon, Nancy, to GM Global Technology Operations LLC Harvesting energy from vehicular vibrations 08063498 Cl. 290-1R.
Namuduri, Chandra S.; and Shoemaker, Kenneth J., to GM Global Technology Operations LLC Rectifying circuit for a multiphase electric machine 08064227 Cl. 363-17.
Nanjo, Ryota: See--
Fujita, Kazushi; and Nanjo, Ryota 08063468 Cl. 257-620.
Nanoco Technologies Ltd.: See--
O'Brien, Paul; and Pickett, Nigel 08062703 Cl. 427-213.31.
NanoCyte Inc.: See--
Lotan, Tamar; and Eckhouse, Shimon 08062660 Cl. 424-443.
Nanometrics Incorporated: See--
Feng, Ye; and Liu, Zhuan 08062910 Cl. 438-14.
Nanophotonics Co., Ltd.: See--
Kweon, Gyeongil; and Laikin, Milton 08064149 Cl. 359-754.
Nanopoulos, Andrew: See--
Bryan, Daniel; Ivanov, Nikita; Judson, Daniel; Kwan, Yusang; Levine, David; Nanopoulos, Andrew; Nazeeri, Furqan; Schory, Brandon; and Shwayhat, Nader 08065373 Cl. 709-206.
NanoSteel Company, Inc., The: See--
Branagan, Daniel James; and Sergueeva, Alla V. 08062436 Cl. 148-403.
Nanosys, Inc.: See--
Scher, Erik C.; Buretea, Mihai A.; Freeman, William P.; Gamoras, Joel; Qian, Baixin; and Whiteford, Jeffery A. 08062967 Cl. 438-604.
Nantel, Normand; Smith, Adrian; Cheu, Scot; Parks, Derrick J; Ghandhi, Jamshed; and Walsh, Kevin Russert, to Novartis AG Systems and methods for non-destructive mass sensing 08061222 Cl. 73-865.
Nanya Technology Corp.: See--
Renn, Shing-Hwa 08063404 Cl. 257-68.
Naoi, Masaaki: See--
Okumura, Ichiro; Shihoh, Makoto; Murayama, Yasushi; Fujimoto, Kosuke; Hayashi, Isao; Shigemura, Yoshihiro; Nishikawa, Katsumasa; Naoi, Masaaki; Yamamoto, Shinji; and Ito, Hiroshi 08064810 Cl. 399-301.
Naor, Gil: See--
Shimon, Dov V.; Naor, Gil; and Shezifi, Yuval 08062324 Cl. 606-200.
Naqvi, Ali K: See--
Sah, Jy-Jen F.; and Naqvi, Ali K 08062174 Cl. 477-15.
Narayan, Armand P.: See--
Nagarajan, Vijay; Scharf, Louis L.; and Narayan, Armand P. 08064498 Cl. 375-148.
Narayanan, Manoj; Bakker, Bart Jacob; Gagnon, Daniel; Fischer, Alexander; and Spies, Lothar, to Koninklijke Philips Electronics N.V. Patient scan time optimization for PET/SPECT imaging 08064672 Cl. 382-131.
Narayanan, Ravikumar: See--
Lewis, Peter; Narayanan, Ravikumar; Cairns, Richard W.; and Phipps, Riley M. D0649240 Cl. D24-129.
Narayanan, Venkat; and Tang, Qiang, to Micron Technology, Inc. Band-gap reference voltage detection circuit 08063676 Cl. 327-143.
Narayanan, Vijay K.: See--
Agarwal, Deepak; Chen, Bee-Chung; Elango, Pradheep; Motgi, Nitin; Narayanan, Vijay K.; Ramakrishnan, Raghu; Roy, Howard Scott; Seth, Amitabh; Singh, Vik; Zachariah, Joe; Israni, Sharat; Thrall, John; Venkataraman, Chandar; Phadke, Amit; and Salisbury, Michael 08065619 Cl. 715-742.
Narayanaswami, Chandrasekhar; and Raghunath, Mandayam Thondanur, to International Business Machines Corporation Portable intelligent shopping device 08065235 Cl. 705-64.
Narizuka, Yasunori: See--
Hasebe, Akio; Motoyama, Yasuhiro; Narizuka, Yasunori; Nakamura, Seigo; and Kawakami, Kenji 08062911 Cl. 438-17.
Narquizian, Robert: See--
Kolczewski, Sabine; Narquizian, Robert; and Pinard, Emmanuel 08063098 Cl. 514-428.
Narula, Kapil; Agarwal, Amol; Aggarwal, Sumeet; Bansal, Sunit K.; Sandhu, Sabaa; and Singh, Harkaran, to Freescale Semiconductor, Inc. Pulsed flip-flop circuit 08063685 Cl. 327-201.
Narus, Inc.: See--
Nucci, Antonio; and Ranjan, Supranamaya 08065731 Cl. 726-22.
Natesaiyer, Kumar: See--
Tonyan, Timothy D.; Frank, William A.; Dubey, Ashish; Natesaiyer, Kumar; Durst, Bartley P.; Kinnebrew, Pamela G.; Cummins, Toney K.; Boone, Nicholas; Heard, William F.; Roth, Michael J.; Slawson, Thomas; Davis, James L.; Stinson, Ryan; and Johnson, Carol F. 08061257 Cl. 89-36.02.
National Health Research Instittues: See--
Wang, Yu-Jing; Wang, Yu-Chao; Wu, Yi-Ting; Tai, Lin-Ai; Lo, Leu-Wei; and Yang, Chung-Shi 08062663 Cl. 424-450.
National Institute For Materials Science: See--
Li, Jiguang; and Ishigaki, Takamasa 08062621 Cl. 423-610.
National Institute of Advanced Industrial Science and Technology: See--
Suzuki, Yoshio; Yokoyama, Kenji; and Namatame, Ichiji 08062492 Cl. 204-600.
National Oilwell Varco L.P.: See--
Yater, Ronald William; Seyffert, Kenneth Wayne; and Tate, Jr., Maurice 08061445 Cl. 175-57.
National Research Council of Canada: See--
Ni, Feng; Tolkatchev, Dmitri; and Su, Zhengding 08063018 Cl. 514-12.
Xiao, Zhizhuang; Bergeron, Hélène; Grosse, Stephan; and Lau, Peter C. K. 08062877 Cl. 435-232.
National Taiwan University: See--
Jiang, Joe-Air; Yang, En-Cheng; Tseng, Chwan-Lu; Chen, Chia-Pang; Lin, Tzu-Shiang; Wu, Yung-Cheng; Lin, Chen-Ying; Tseng, Chu-Ping; Lin, Shih-Hsiang; Liao, Chih-Sheng; Szu, Shih-Hao; Yen, Chung-Wei; Lin, Kuang-Chang; Wu, Zong-Siou; and Lu, Fu-Ming 08064387 Cl. 370-328.
Kuo, Che-Chung; and Wang, Huei 08064870 Cl. 455-326.
Kuo, Che-Chung; and Wang, Huei 08064871 Cl. 455-326.
National University Corporation, Hokkaido University: See--
Hara, Shoji; Fukuhara, Tsuyoshi; and Hidaka, Toshio 08063205 Cl. 544-53.
Sakaguchi, Kazuyasu; Chuman, Yoshiro; Akebiyama, Yasuo; Matsukizono, Miho; Watanabe, Maki; and Tsutsumi, Junichi 08062887 Cl. 435-330.
National University Corporation Shizuoka University: See--
Iwata, Futoshi; Yasutake, Masatoshi; Nakaue, Takuya; Kikuchi, Syuichi; and Takaoka, Osamu 08062494 Cl. 204-650.
National University of Singapore: See--
Leow, Wee Kheng; Yap, Dennis; Howe, Tet Sen; and Png, Meng Ai 08064660 Cl. 382-128.
National Yang-Ming University: See--
Lee, Oscar Kuang-Sheng; and Kuo, Tom Kwang-Chun 08062632 Cl. 424-93.1.
National Yunlin University of Science and Technology: See--
Chou, Jung-Chuan; and Liu, Shih-I 08062488 Cl. 204-403.01.
Nationz Technologies Inc.: See--
Yu, Yunbo; and Zhu, Shan 08061625 Cl. 235-492.
Native Shoes, Ltd.: See--
Van Zyll De Jong, Damian; and Penner, Matthew Philip Dorrington D0648929 Cl. D2-911.
Natsume, Shigeru Gary: See--
Chan, Eric; Natsume, Shigeru Gary; Miller, Jeffrey; Waldinger, Justin; and Hanagata, Takayoshi D0649075 Cl. D10-81.
Naturel, Corinne: See--
Baudry, Séverine; Naturel, Corinne; and Nguyen, Philippe 08064635 Cl. 382-100.
Naukowa I Akademicka Siec Komputerowa Nask: See--
Czajka, Adam; Pacut, Andrzej; and Chochowski, Marcin 08061842 Cl. 351-246.
Naumann, Frank; and Reese, Tobias, to Siemens Medical Instruments Pte. Ltd. Hearing instrument D0649251 Cl. D24-174.
Nautilus, Inc.: See--
Lull, Andrew P.; Weier, Keith M.; Krapfl, Zachary D.; Kowalewski, Chester F.; and Watt, Jonathan B. 08062187 Cl. 482-52.
Naviasky, Eric; and Wilson, Thomas E., to Cadence Design Systems, Inc. Phase interpolator circuit with two phase capacitor charging 08063686 Cl. 327-231.
Navistar Canada, Inc.: See--
Oriet, Leo; and Cazabon, Jules 08062784 Cl. 429-158.
Nawaz, Sabina: See--
D'Souza, David J.; Nawaz, Sabina; Snapper, Erik Jon; Mitchell, Darren; Endres, Raymond Edward; Martineau, Teresa; Shyam, Bharat; Ellison-Taylor, Ian Michael; and Ahmed, Mohsin 08065673 Cl. 717-173.
Naydo, Kyle A.: See--
Stout, Gordon; Pham, Xuyen; Rocchio, Michael J.; Naydo, Kyle A.; Parks, Derrick J.; and Reich, Patrick RE042942 Cl. 141-67.
Nazarian, Hagop A.; to Micron Technology, Inc. Memory device and method having charge level assignments selected to minimize signal coupling 08064251 Cl. 365-185.02.
Nazeeri, Furqan: See--
Bryan, Daniel; Ivanov, Nikita; Judson, Daniel; Kwan, Yusang; Levine, David; Nanopoulos, Andrew; Nazeeri, Furqan; Schory, Brandon; and Shwayhat, Nader 08065373 Cl. 709-206.
NCR Corporation: See--
Day, Philip N.; and Coventry, Lynne M. 08061590 Cl. 235-379.
Harkins, Cheryl Kay; and Claessen, Albert M. G. 08061601 Cl. 235-383.
NDSU Research Foundation: See--
Webster, Dean C.; and Majumdar, Partha S. 08062729 Cl. 428-141.
Neal, Franklin Eugene: See--
Shamoon, Charles G.; Shamoon, Deborah H.; Neal, Franklin Eugene; and Fehnel, Michael D. 08064935 Cl. 455-466.
Neal, Robert: See--
Barry, David; Greene, Jr., Elwood H.; Jacobs, Matthew; and Neal, Robert D0649243 Cl. D24-133.
Neal, Robert W.; and Garin, Michael A., to MarcTech Innovative Design, Inc. Mold for a battery cast on strap 08061404 Cl. 164-98.
Neamtu, Nicolae: See--
Hobbs, Stephen F.; Li, Cheng-Jih; and Neamtu, Nicolae 08061237 Cl. 76-101.1.
Neary, John Articles of jewelry D0649080 Cl. D11-3.
NEC Corporation: See--
Hiraoka, Masaharu; and Kokubo, Tsuyoshi 08064657 Cl. 382-124.
Ikegami, Teruya 08065625 Cl. 715-780.
Inui, Shigeto; and Hagihara, Yasuhiko 08065645 Cl. 716-113.
Kikuchi, Baku 08064765 Cl. 398-33.
Kobayashi, Masayoshi 08064340 Cl. 370-229.
Kuroda, Naotaka; Wakejima, Akio; Tanomura, Masahiro; and Miyamoto, Hironobu 08063484 Cl. 257-712.
Oomuro, Norihiko 08063821 Cl. 342-360.
Roberts, Michael; and Savaglio, Frank 08064429 Cl. 370-350.
Sugitani, Choei; and Mikami, Kazuaki 08063868 Cl. 345-102.
Watanabe, Yoshinori; and Matsunaga, Yasuhiko 08065568 Cl. 714-47.1.
Yageta, Hiroshi; Otohata, Makihiro; Mizuta, Masatomo; and Kanai, Takeshi 08062780 Cl. 429-82.
NEC Laboratories America, Inc.: See--
Ding, Luping; Chen, Songting; Rundensteiner, Elke A; Tatemura, Junichi; and Hsiung, Wang-Pin 08065319 Cl. 707-769.
Ji, Philip Nan; Xu, Lei; Wang, Ting; Murakami, Shuji; Tajima, Tsutomu; and Yano, Yutaka 08064768 Cl. 398-80.
Vapnik, Vladimir N.; and Miller, deceased, Michael R. 08065241 Cl. 706-12.
Wei, Wei; and Wang, Ting 08064766 Cl. 398-59.
Yu, Jianjun; Qian, Dayou; Xu, Lei; and Wang, Ting 08064774 Cl. 398-168.
Yu, Jianjun; Xu, Lei; Ji, Philip; Wang, Ting; Qian, Dayou; and Yano, Yutaka 08064775 Cl. 398-187.
Yue, Guosen; and Wang, Xiaodong 08064333 Cl. 370-216.
Necchi, Pietro Interchangeable closing device for anti-theft case and anti-theft case equipped with such device 08061514 Cl. 206-308.2.
Ned, Alexander A.: See--
Kurtz, Anthony D.; Ned, Alexander A.; and Van DeWeert, Joseph 08061213 Cl. 73-721.
NED LCD Technologies, Ltd.: See--
Sakamoto, Michiaki; Mori, Kenichi; Naka, Kenichirou; and Nagai, Hiroshi 08064030 Cl. 349-153.
Nedashkivskyi, Oleksii: See--
Kyyko, Volodymyr; Matsello, Vyacheslav; Tsariov, Andriy; Musatenko, Yuriy; Schlezinger, Mykhailo; Kyiko, Kostiantyn; and Nedashkivskyi, Oleksii 08064653 Cl. 382-118.
Nederlandse Organisatie Voor Toegepast-Natuurwetenschappelijk Onderzoek TNO: See--
Jetten, Jan Matthijs; and Slaghek, Theodoor Maximiliaan 08062430 Cl. 134-2.
Nee, Chi-Ping; Krieger, Abraham; Kons, Shachar; and Kuo, Chun-Hsuan, to Trident Microsystems (Far East) Ltd. Erasures assisted block code decoder and related method 08065593 Cl. 714-784.
Neftel, Frederic; to SMC—Swiss Medical Care S.A. Medical device for injecting liquid 08062281 Cl. 604-500.
Negandhi, Nishant Satish: See--
Zhu, Jin; and Negandhi, Nishant Satish 08062725 Cl. 428-35.7.
Negoi, Andy; and Zecri, Michel, to Synopsys, Inc. Analog compensation circuit 08063623 Cl. 323-312.
Nehler, Jürgen; and Werner, Christoph, to Euromicron Werkzeuge GmbH Fibre optic duplex connector 08061906 Cl. 385-78.
Neil, John Malcolm: See--
Dunaisky, Jonathan J.; Neil, John Malcolm; and Kumar, Subodh 08063908 Cl. 345-519.
Nelias, Francois; to Visteon Global Technologies, Inc. Process for molded decorative stitched skins 08062727 Cl. 428-102.
Nellcor Puritan Bennett LLC: See--
Debreczeny, Martin P.; Colburn, Joel; and O'Neil, Michael P. 08062221 Cl. 600-309.
Pav, Steven E. 08064975 Cl. 600-323.
Skidmore, John P.; and Ross, Christopher D0649157 Cl. D14-492.
Nellor, Howard J.: See--
Cocotis, Thomas A.; Curtis, Alan D.; Emmett, David M.; Fan, Shengkuo; Henderson, Kristofer P.; Luepke, Jack W.; Nellor, Howard J.; Treptow, Jay A.; and Wong, Gregory H. 08065357 Cl. 709-200.
Nelsen, Donald E.: See--
Rudd, Michael J.; and Nelsen, Donald E. 08063985 Cl. 348-451.
Nelson, Benny Kevin; Reichter, Gregory L.; Boehrs, Bruce Allen; and Wendt, Paul Anthony, to Donaldson Company, Inc. Air filter arrangement; assembly; and, methods 08062399 Cl. 55-357.
Nelson, Cory J.: See--
Carpenter, M. Scott; Furner, Paul E.; Gasper, Thomas P.; Kubicek, Chris A.; Lemon, Leon M.; Madsen, Brent D.; Michaels, Kenneth W.; Nelson, Cory J.; Short, Michael E.; Sipinski, Gene; and Westphal, Nathan R. 08061562 Cl. 222-52.
Nelson, Craig Isolator plate assembly for rock breaking device 08061439 Cl. 173-210.
Nelson, Derek: See--
Pyles, Nathan; Nelson, Derek; and Fa, Wang Yong 08062190 Cl. 482-57.
Nelson, Derek L.; Myers, Clinton S.; and Budworth, Daniel D., to Johnson Health Tech Co., Ltd. Elliptical exercise machine 08062186 Cl. 482-52.
Nelson, Kenneth I.: See--
McMahon, Ryan C.; and Nelson, Kenneth I. 08061209 Cl. 73-663.
Nelson, Kevin D.; and Crow, Brent B., to Board of Regents of the University of Texas System, The Drug releasing biodegradable fiber for delivery of therapeutics 08062654 Cl. 424-426.
Nentwick, Brian: See--
Prommersberger, Megan; Nentwick, Brian; Gravagna, Philippe; Bayon, Yves; Dassonville, Dagmar; Meneghin, Alfredo; and Lecuivre, Julie 08062330 Cl. 606-215.
Neptune Technology Group, Inc.: See--
Sala, John; Greisz, Jonathan; Sulfridge, Darren; Feeney, Steven; Young, Wayne; and Nisewonder, Eric Jason 08063792 Cl. 340-870.02.
Neri, Bruce P.: See--
Allawi, Hatim; Argue, Brad T.; Bartholomay, Christian Tor; Chehak, LuAnne; Curtis, Michelle L.; Eis, Peggy S.; Hall, Jeff G.; Ip, Hon S.; Ji, Lin; Kaiser, Michael; Kwiatkowski, Jr., Robert W.; Lukowiak, Andrew A.; Lyamichev, Victor; Lyamicheva, Natalie E.; Ma, WuPo; Neri, Bruce P.; Olson, Sarah M.; Olson-Munoz, Marilyn C.; Schaefer, James J.; Skrzypczynski, Zbigniev; Takova, Tsetska Y.; Thompson, Lisa C.; and Vedvik, Kevin L. 08063184 Cl. 530-350.
Nering, Thomas: See--
Cichocki, Frank R.; Nering, Thomas; and Demarest, David 08062437 Cl. 148-567.
Nero, Regis J.: See--
Gibala, Jeffrey A.; Nero, Regis J.; Day, Steven P.; Cimbala, Matthew G.; and Smith, Roger A. 08065099 Cl. 702-62.
Ness, Mark A.: See--
Bullinger, Charles W.; Ness, Mark A.; Sarunac, Nenad; Levy, Edward K.; Weinstein, Richard S.; James, Dennis R.; Coughlin, Matthew P.; and Wheeldon, John M. 08062410 Cl. 95-288.
Nestec S.A.: See--
Fritsche, Rodolphe; Schaller, Raphael; and Cartou, Isabelle 08062862 Cl. 435-68.1.
Mandralis, Zenon Ioannis; Denisart, Jean-Paul; Ward, Tony; and Gaillard, Julien 08062682 Cl. 426-119.
Nesterova, Ekaterina: See--
Alshina, Elena; Alshin, Alexander; Nesterova, Ekaterina; Koroteev, Maxim; and Seregin, Vadim 08064711 Cl. 382-250.
Net Return LLC, The: See--
Crawley, Paul A.; and Crawley, Matthew J. D0649208 Cl. D21-705.
NetApp, Inc.: See--
Hing, Jeffrey; Perry, Jay; and Klinkner, Steven R. 08065346 Cl. 707-805.
Jibbe, Mahmoud K.; and Heroor, Srirang 08065422 Cl. 709-228.
Netgear, Inc.: See--
Ramones, John K.; Bucholtz, Laura E.; Harber, Chadwick J.; Amit, Gadi; and Rouillac, Julien D0649151 Cl. D14-358.
NetLogic Microsystems, Inc.: See--
Babanezhad, Joseph N. 08064510 Cl. 375-229.
Hojabri, Pirooz; and Lam, Jack 08063811 Cl. 341-158.
Zhu, Julianne Jiang; and Hass, David T. 08065456 Cl. 710-105.
Nett, Juergen H.; to Glycofi, Inc. URA5 gene and methods for stable genetic integration in yeast 08062879 Cl. 435-254.11.
Nettekoven, Matthias: See--
Jablonski, Philippe; Kawasaki, Kenichi; Knust, Henner; Limberg, Anja; Nettekoven, Matthias; Ratni, Hasane; and Riemer, Claus 08063075 Cl. 514-340.
Network Appliance, Inc.: See--
Bali, Naveen; and Sawant, Amit Prakash 08065658 Cl. 717-113.
Vaid, Aseem; Rajashekar, Rajesh; Su, Ronghuei A.; and Patel, Rimple 08065398 Cl. 709-220.
Netzloff, Julie: See--
Dumon, Oliver G.; McDonald, Ryan; Rehman, Muhammad Faisal; Netzloff, Julie; and Sun, Ken 08065199 Cl. 705-26.7.
Neu, Jochen: See--
Cook, Brian Nicholas; Di Salvo, Darren; Harcken, Christian; Kuzmich, Daniel; Lee, Thomas Wai-Ho; Liu, Pingrong; Lord, John; Mao, Can; Neu, Jochen; Raudenbush, Brian Christopher; Razavi, Hossein; and Swinamer, Alan David 08063065 Cl. 514-303.
Neugebauer, Bernhard; Plogsties, Jan; and Popp, Harald, to Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V. Method and apparatus for generating a stereo signal with enhanced perceptual quality 08064624 Cl. 381-310.
Neuman, Darren: See--
Herrick, Jason; and Neuman, Darren 08063916 Cl. 345-629.
Neumeyer, John L.; and Baldessarini, Ross J., to McLean Hospital Corporation, The R(−)-11-hydroxyaporphine derivatives and uses thereof 08063060 Cl. 514-284.
Neuner, Clemens; to Swarovski Aktiengesellschaft Stone D0649082 Cl. D11-89.
Neureder, Uwe; to Ford Global Technologies, LLC Elastic bushing 08061693 Cl. 267-140.12.
Nevelle, James W.: See--
Phillips, Bruce A.; Kung, Darwei; Pett, Todd A.; Arens, David J.; Poberzyn, Paula C.; Fink, Richard H.; Brodigan, Donald L.; Nevelle, James W.; and Campbell, Kurt A. 08064369 Cl. 370-274.
New York University: See--
Coruzzi, Gloria; Oliveira, Igor; Lam, Hon-Ming; and Hsieh, Ming-Hsiun 08062996 Cl. 504-287.
Newberry, William: See--
Liu, Yong; Newberry, William; Rios, Margie T.; and Qian, Qiuxiao 08063472 Cl. 257-676.
Newcomer, Daniel A.; Seely, Jon Scott; Branham, Dennis Lee; and Kosan, Paul, to Data Trace Information Services, LLC Property record document data validation systems and methods 08064703 Cl. 382-190.
Newell, Christopher R.: See--
Shener, Cemal; Newell, Christopher R.; Hedstrom, Petter; and Krause, Kenneth W. 08062214 Cl. 600-159.
Newell Operating Company: See--
Roe, Megan; Bishop, Ryan; and Begin, Jason D0649005 Cl. D8-316.
Newkirk, Dennis R.: See--
Bitter, Richard J.; Davis, Jamillah G.; Eastwood, James E.; Gustafson, Leslie G.; and Newkirk, Dennis R. 08064480 Cl. 370-466.
NewLife Sciences, LLC: See--
Weinstock, Ronald J. 08064988 Cl. 600-431.
Newman, Benjamin Keith: See--
Carter, Daniel Lee; Foster, Larry Steven; Newman, Benjamin Keith; Portig, Harald; Siders, Lowell Thomas; and Spencer, Brian Reed 08064800 Cl. 399-167.
Newman, Frederic M.; to Bank of America REMOTELY ACCESSIBLE MOBILE REPAIR UNIT FOR WELLS 06079490 Cl. 166-77.51.
Newman, Lawrence: See--
Stupp, Steven Elliot; Newman, Lawrence; and Lanckriet, Gert 08062219 Cl. 600-300.
Newman, Michael J.: See--
Gillick, Laurence S.; Lynch, Thomas E.; Newman, Michael J.; Roth, Daniel L.; Wegmann, Steven A.; and Yamron, Jonathan P. 08065144 Cl. 704-243.
Stevens, Daniell; Roth, Robert; Gould, Joel M.; Newman, Michael J.; Sturtevant, Dean; Ingold, Charles E.; Abrahams, David; and Gold, Allan 07315818 Cl. 704-235.
Newport Media, Inc.: See--
Gu, Yongru 08065596 Cl. 714-795.
Gu, Yongru; and Ma, Jun 08064553 Cl. 375-344.
Newron Pharmaceuticals S.p.A.: See--
Thaler, Florian; Sabido David, Cibele Maria; Maestroni, Sara; Raveglia, Luca Francesco; and Salvati, Patricia 08063039 Cl. 514-212.03.
Newton, Mark: See--
Prince, Stephen R.; Tipton, Thomas R.; Friedman, Michael E.; Newton, Mark; and Lombardo, Dale R. 08061995 Cl. 416-204R.
Nexeon Medsystems, Inc.: See--
Bates, Mark C. 08062283 Cl. 604-522.
Nextreme Thermal Solutions, Inc.: See--
Koester, David A.; and Alley, Randall G. 08063298 Cl. 136-203.
Ng, Chan-Wah; Tan, Pek-Yew; and Ue, Toyoki, to Panasonic Corporation Network element apparatus and intermediate router apparatus 08064430 Cl. 370-351.
Ng, Kar Choon: See--
Soetejo, Juarsa; Ng, Kar Choon; and Toh, Boon Keat Eddy D0649146 Cl. D14-253.
Ng, Samson: See--
Spence, Jonathan; Kwong, Teddy; Hammad, Kamal; Ng, Samson; Siy, Robert; and Schaan, Jason 08062511 Cl. 208-390.
NGK Insulators, Ltd.: See--
Yoshino, Takashi 08062449 Cl. 156-154.
Ngo, Hung Viet; to FCI Americas Technology LLC Electrical communication system having latching and strain relief features 08062051 Cl. 439-352.
Ngo, Tiffany Tran: See--
Sepetka, Ivan; Vu, Emily; Nguyen, Dan; Miller, John; Pierce, Ryan; Ngo, Tiffany Tran; and Fung, Norman 08062307 Cl. 606-127.
Nguy, Chanwa: See--
Lin, Pei-Ying; and Nguy, Chanwa 08061536 Cl. 211-70.6.
Nguyen, Bang-Thu: See--
Rahman, Arifur; Pan, Hong-Tsz; and Nguyen, Bang-Thu 08063654 Cl. 324-762.03.
Nguyen, Dan: See--
Sepetka, Ivan; Vu, Emily; Nguyen, Dan; Miller, John; Pierce, Ryan; Ngo, Tiffany Tran; and Fung, Norman 08062307 Cl. 606-127.
Nguyen, David: See--
Ma, Abraham; Yu, I-Kang; Nguyen, David; Lee, Charles C.; and Shen, Ming-Shiang 08061905 Cl. 385-75.
Nguyen, Derek: See--
Marquez, Salvador; Nguyen, Derek; and Nguyen-Thien-Nhon, Diana 08062359 Cl. 623-2.41.
Nguyen, Dzung H.: See--
Sarin, Vishal; and Nguyen, Dzung H. 08064267 Cl. 365-185.29.
Nguyen, Hai-Van: See--
Begemann, Ulrich; Kleiser, Georg; Nguyen, Hai-Van; and Reuter, Joerg 08062479 Cl. 162-289.
Nguyen, Han: See--
Pendse, Sudhir; and Nguyen, Han 08065691 Cl. 719-331.
Nguyen, Hanh D.: See--
Liu, Wei; Swenberg, Johanes F.; Nguyen, Hanh D.; Nguyen, Son T.; Curtis, Roger; and Bottini, Philip A. 08062472 Cl. 156-345.48.
Nguyen, Hong-Nhung Y.: See--
Bowman, Edward P.; Chen, Shi-Juan; Cua, Daniel J.; Moore, Kevin W.; Churakova, Tatyana; Nguyen, Hong-Nhung Y.; and Chan, Jason R. 08062634 Cl. 424-130.1.
Nguyen, Hong Thi: See--
Silver, Edward Michael; Roberts, Linda Ann; and Nguyen, Hong Thi 08064578 Cl. 379-88.21.
Nguyen, Huu-Dat: See--
Heilmann, Gernod; and Nguyen, Huu-Dat 08061733 Cl. 280-735.
Nguyen, Huy-Van: See--
Hocquet, Philippe; Nguyen, Huy-Van; and Parry, Andrew 08061448 Cl. 175-107.
Nguyen, Justin T.; Chang, John; Chen, Joseph; Thackeray, Raymond; Stanovic, Hoselito; Leong, Bruce; and Goodrich, Adam, to StarCite, Inc. Event planning system 08065171 Cl. 705-5.
Nguyen, Lam: See--
Durocher, Eric; Pietrobon, John; and Nguyen, Lam 08061969 Cl. 415-69.
Nguyen, Lang: See--
McDuff, Pierre; Pollak, Alexandre; and Nguyen, Lang D0649022 Cl. D8-367.
McDuff, Pierre; Pollak, Alexandre; and Nguyen, Lang D0649023 Cl. D8-367.
Nguyen, PhiDien: See--
Sriram, Vijay Nichinbatl; Nguyen, PhiDien; and Ganguly, Shamik 08065672 Cl. 717-169.
Nguyen, Philippe: See--
Baudry, Séverine; Naturel, Corinne; and Nguyen, Philippe 08064635 Cl. 382-100.
Nguyen, Phong X.: See--
Chow, Ken; Heidelbaugh, Todd; Gill, Daniel; Garst, Michael; Wheeler, Larry A.; Nguyen, Phong X.; and Gomez, Dario G. 08063087 Cl. 514-392.
Fang, Wenkui K.; Nguyen, Phong X.; Chow, Ken; Heidelbaugh, Todd M.; Gomez, Dario G.; Garst, Michael E.; and Sinha, Santosh C. 08063231 Cl. 548-331.5.
Nguyen, Phuong H.; Sikora, Joseph A.; and Campbell, Thomas A., to Boeing Company, The Automatic control systems for aircraft auxiliary power units, and associated methods 08061650 Cl. 244-58.
Nguyen, Simon: See--
Nita, Henry; Sarge, Jeff; Nguyen, Simon; and Spano, Richard 08062566 Cl. 264-162.
Nguyen, Son T.: See--
Liu, Wei; Swenberg, Johanes F.; Nguyen, Hanh D.; Nguyen, Son T.; Curtis, Roger; and Bottini, Philip A. 08062472 Cl. 156-345.48.
Nguyen, Steven Huu: See--
Simpson, Roddi James; and Nguyen, Steven Huu 08061007 Cl. 29-453.
Nguyen-Thien-Nhon, Diana: See--
Marquez, Salvador; Nguyen, Derek; and Nguyen-Thien-Nhon, Diana 08062359 Cl. 623-2.41.
Nguyen, Tran-Dzien: See--
Heyraud, Jean-Noël; Johnston, Wilfrid; and Nguyen, Tran-Dzien 08065287 Cl. 707-706.
Nguyen, Tuan Anh; Zadno-Azizi, Gholam-Reza; Evans, Scott; and Portney, Valdemar, to Visiogen, Inc. Accommodating intraocular lens system with aberration-enhanced performance 08062361 Cl. 623-6.34.
Nguyen, Tung: See--
Kulkarni, Pradip; Kumar, Mukul; Potdar, Adhir; Au, Richard; and Nguyen, Tung 08065737 Cl. 726-24.
Nguyen, Tuyet Hoc: See--
Brady, Daniel G.; Nguyen, Tuyet Hoc; Weeber, Hendrik A.; and Cali, Douglas S. 08062362 Cl. 623-6.46.
Nguyen, Uoc H.: See--
Plewnia, Boguslaw Ludwik; Sojian, Lena; Lum, Joey P.; and Nguyen, Uoc H. 08065384 Cl. 709-217.
NHK Laboratories, Inc.: See--
Oguri, Elisha R. 08062899 Cl. 436-161.
NHK Spring Co., Ltd.: See--
Higashi, Tsukasa; and Ogawa, Hidenori 08064169 Cl. 360-245.9.
Nakagaki, Yoshihisa; and Tokiwa, Yuji 08061779 Cl. 297-452.2.
NHN Business Platform Corporation: See--
Kim, Jung Su 08065258 Cl. 706-47.
NHS Blood and Transplant: See--
Renfrew, Bruce James; Poberezny, Kenneth; Williamson, William James; and Phillips, Shaun Melvyn D0648944 Cl. D6-336.
Renfrew, Bruce James; Poberezny, Kenneth; Williamson, William James; and Phillips, Shaun Melvyn D0649318 Cl. D34-12.
Renfrew, Bruce James; Poberezny, Kenneth; Williamson, William James; and Phillips, Shaun Melvyn D0649319 Cl. D34-12.
Renfrew, Bruce James; Poberezny, Kenneth; Williamson, William James; and Phillips, Shaun Melvyn D0649320 Cl. D34-12.
Ni, Feng; Tolkatchev, Dmitri; and Su, Zhengding, to National Research Council of Canada Bivalent thrombin binding molecules comprising linkers 08063018 Cl. 514-12.
Nica, Anisoara; and Eflov, Evguenia, to iAnywhere Solutions, Inc. Immediate maintenance of materialized views 08065269 Cl. 707-625.
Nicely, Jeremy S.: See--
Wall, Kevin W.; and Nicely, Jeremy S. 08062140 Cl. 464-152.
Nichia Corporation: See--
Sakamoto, Keiji; and Sakata, Hiroki 08062959 Cl. 438-460.
Nichias Corporation: See--
Mori, Tadashi; Kondoh, Motonori; Arimizu, Kaname; Niwa, Takahiro; and Yoshihara, Masaki 08061475 Cl. 181-205.
Nichiha Corporation: See--
Honda, Takashi D0649015 Cl. D8-349.
Nichols, Eric: See--
Hocherman, Adam B.; Hu, Antonio; and Nichols, Eric D0649135 Cl. D14-159.
Nichols, John: See--
Wilkins, David; Nichols, John; Fredricks, Jim; and Ketcher, Keith 08065159 Cl. 705-1.1.
Nicholson, Dennis G.; to Adobe Systems Incorporated Method and apparatus for removing noise from a digital image 08064721 Cl. 382-275.
Nicholson, James E.: See--
McDevitt, Dennis; and Nicholson, James E. 08062295 Cl. 606-60.
Nickerson-Zwaan B.V.: See--
Van Andel, Andre 08063271 Cl. 800-306.
Nickolov, Radoslav P.: See--
Gerhard, Lutz; Jones, Paul D.; Gedye, David M.; Dunn, Abraham; and Nickolov, Radoslav P. 08064733 Cl. 382-299.
Nicol, William Bruce: See--
Smith, Andrew Bryan; Bokor, Brian Ronald; Haggar, Peter Frederick; House, Daniel Edward; and Nicol, William Bruce 08062130 Cl. 463-31.
Nicolaidis, Chris: See--
Collas, James; Nicolaidis, Chris; Shultz, Jonathan; and Hall, Jeffery 08065190 Cl. 705-26.1.
Nicoli, Andrea: See--
Andreella, Paolo; Brescello, Roberto; Michieletto, Ivan; Maffini, Mauro; Catozzi, Nicola; Nicoli, Andrea; Fornasari, Paolo; Verzini, Massimo; Cotarca, Livius; and Brazzarola, Franco 08063041 Cl. 514-217.08.
Nicoll, Roy: See--
Jessemey, Paul Michael; Nicoll, Roy; Hart, Robert Anthony; and Walker, Vincent P. 08061041 Cl. 30-45.
Nicoson, Zachary R.: See--
Mark, Joseph L.; Zimmer, Brian; and Nicoson, Zachary R. 08062230 Cl. 600-567.
Nidam, Tamar: See--
Niddam-Hildesheim, Valerie; Lancry, Eli; Shachan-tov, Sharona; Levi, Sigalit; and Nidam, Tamar 08063250 Cl. 564-360.
Niddam-Hildesheim, Valerie; Balanov, Anna; and Shenkar, Natalia, to Teva Pharmaceutical Industries, Ltd. Rosuvastatin and salts thereof free of rosuvastatin alkylether and a process for the preparation thereof 08063211 Cl. 544-330.
Niddam-Hildesheim, Valerie; Lancry, Eli; Shachan-tov, Sharona; Levi, Sigalit; and Nidam, Tamar, to Teva Pharmaceutical Industries, Ltd. Crystal forms of O-desmethylvenlafaxine fumarate 08063250 Cl. 564-360.
Nie, Yao; Shi, Chao; Majdi-Nasab, Nariman; and Hasegawa, Akira, to FUJIFILM Corporation Systems and methods for measurement of objects of interest in medical images 08064677 Cl. 382-132.
Niederhauser, Urs: See--
Lehnert, Frank; and Niederhauser, Urs 08061684 Cl. 251-129.11.
Nielsen, Bent; to Nadiro A/S Combination of a coupling and a coupling receiver D0649028 Cl. D8-382.
Nielsen Company (US), LLC, The: See--
Lee, Morris 08065700 Cl. 725-19.
Wright, David Howell; Milavsky, Joseph; Lee, Morris; Feininger, William A.; Conklin, Charles; Koutsopanagos, Vasiliki; and Ramaswamy, Arun 08065697 Cl. 725-9.
Nielsen, Finn; and Domsten, Rune, to Cardlab Aps Electronic payment, information, or ID card with a deformation sensing means 08061622 Cl. 235-492.
Nielsen, Jakob Peter: See--
Robertson, George G.; Carlson, Jason D.; Ruble, Brian Scott; Boon, Sean Michael; Nielsen, Jakob Peter; Heckerman, David E.; Lee, Joshua W.; Schormann, Christian Bernd; and Givens, Barry James 08065345 Cl. 707-805.
Nielsen, Karl Allen: See--
Donie, Benjamin Jay; and Nielsen, Karl Allen 08065556 Cl. 714-6.
Nielsen, Ole Christian; Radmer, Jim; and Preuthun, Jan Harald, to Novo Nordisk A/S Medical skin mountable device 08062253 Cl. 604-131.
Nightingale, Tycho G.; and Mesard, Wayne, to Oracle America, Inc. Method and apparatus for enabling optimistic program execution 08065670 Cl. 717-151.
Nihashi, Satoshi: See--
Sato, Hideki; Yamaki, Kiyoshi; Omura, Masayoshi; Osuga, Chihiro; Nihashi, Satoshi; and Mabuchi, Tetsuya 08065083 Cl. 701-224.
Nihon Dempa Kogyo Co., Ltd.: See--
Kuroda, Tomotaka 08064221 Cl. 361-803.
Ono, Kozo D0649127 Cl. D13-182.
Ono, Kozo; and Inoue, Takahiro 08063542 Cl. 310-348.
Nihon University: See--
Arai, Yoshinori; Yoshimura, Takahiro; and Yoshikawa, Hideki 08064569 Cl. 378-16.
Niitsuma, Kenichi: See--
Omori, Misao; and Niitsuma, Kenichi 08061774 Cl. 297-284.4.
Niitti, Timo; to Outotec Oyj Gasket distributor 08062519 Cl. 210-207.
Nijssen, Wilhelmus J. J.; to K. Sahin Zaden B.V. Achillea plant named ‘Peachy Seduction’ PP022262 Cl. PLT-263.1.
Nik Software, Inc.: See--
Kokemohr, Nils 08064725 Cl. 382-276.
NIKE, Inc.: See--
Boyd, Robert; Tavares, Gary G.; Stites, John Thomas; and Cheng, Chia-Chyi 08062151 Cl. 473-334.
Bruce, Robert M.; Cooper, Aaron A. C.; Lupo, Bo; and Stockbridge, Kurt J. 08061059 Cl. 36-25R.
Burton, Maximillian P. 08064292 Cl. 368-88.
Chapa, Jr., Rodolfo; Wojciechowski, Bruce; Wojciechowski, Justin; and Collier, Michael 08062037 Cl. 434-251.
Franklin, David N.; and Stites, John T. 08062146 Cl. 473-251.
Kokstis, Gary Allen; Heard, Joshua P.; and Beers, Tiffany Anne 08060964 Cl. 12-142B.
Swigart, John F.; and Schindler, Eric S. 08061060 Cl. 36-28.
Thomas, James S.; Trees, Gregory A.; Contini, Vincent; Sander, Raymond J.; Scott, James Alan; Harris, Scott Allen; and Rubal, Matthew Paul 08061008 Cl. 29-525.01.
Nikitidis, Antonios: See--
Hansen, Peter; Lönn, Hans; and Nikitidis, Antonios 08063073 Cl. 514-333.
Niko Semiconductor Co., Ltd.: See--
Ting, Ming-Chiang 08063684 Cl. 327-175.
Nikolai, Dave M.; Preisig, Cheryl A.; Schneider, Bernd A.; Poverski, David M.; and Sweet, Michael D., to Graphic Packaging International, Inc. Reclosable cartons 08061585 Cl. 229-126.
Nikolaychik, Leonid: See--
Golinveaux, James E.; Nikolayev, Alexander; Flax, Michael; Kabashnikov, Vitaly; Mahomet, Michael; Mourachko, Valeri; Nikolaychik, Leonid; Prymak, Thomas; Popov, Valery; Bril, Andrey; Babenko, Valery; and Sosinovich, deceased, Valery 08065110 Cl. 702-181.
Nikolayev, Alexander: See--
Golinveaux, James E.; Nikolayev, Alexander; Flax, Michael; Kabashnikov, Vitaly; Mahomet, Michael; Mourachko, Valeri; Nikolaychik, Leonid; Prymak, Thomas; Popov, Valery; Bril, Andrey; Babenko, Valery; and Sosinovich, deceased, Valery 08065110 Cl. 702-181.
Nikon Corporation: See--
Fujinawa, Nobuhiro; and Nozaki, Hirotake 08061850 Cl. 353-52.
Kusaka, Yosuke 08063978 Cl. 348-345.
Nagasaka, Hiroyuki 08064044 Cl. 355-72.
Nagasaka, Hiroyuki; Ishii, Yuuki; and Makinouchi, Susumu 08064037 Cl. 355-30.
Sakamoto, Hideaki 08064067 Cl. 356-500.
Shiraishi, Kenichi; Hoshika, Ryuichi; and Fujiwara, Tomoharu 08064039 Cl. 355-53.
Nikonov, Dmitri E.; Bourianoff, George I.; and Ghani, Tahir, to Intel Corporation Spin torque magnetic integrated circuits and devices therefor 08063460 Cl. 257-421.
Niksch, Barbara A: See--
Tu, Hosheng; Smedley, Gregory T; Haffner, David; and Niksch, Barbara A 08062244 Cl. 604-8.
Nilsen, Svein Moller: See--
Skog, Terje; and Nilsen, Svein Moller 08064186 Cl. 361-277.
Nilsson, Alan C.: See--
Mitchell, Matthew L.; Taylor, Robert B.; Dominic, Vincent G.; and Nilsson, Alan C. 08064771 Cl. 398-94.
Nilsson, Jan; and Sobel, Jarl R., to ABB AB Method and device for demodulation of signals 08063648 Cl. 324-608.
Nilsson, Jerry: See--
Sjöberg, Johan; and Nilsson, Jerry 08063835 Cl. 343-702.
Nilsson, Peter; Henriksson, Rolf; Wenström, Joachim; and Magnusson, Reine, to Elfa International Tool holder 08061537 Cl. 211-70.6.
Ning, Tak H.: See--
Gebara, Fadi H.; Ning, Tak H.; Ouyang, Qiqing C.; and Schaub, Jeremy D. 08063424 Cl. 257-292.
Ningam, Srinivas Reddy: See--
Sajja, Eswaraiah; Vetukuri, Venkata Naga Kali Vara Prasada Raju; Ningam, Srinivas Reddy; Vedantham, Ravindra; and Bodepudi, Rajyalakshmi 08063214 Cl. 544-343.
Ninomiya, Akihide: See--
Yamamoto, Hiroki; and Ninomiya, Akihide 08062454 Cl. 156-229.
Ninomiya, Tooru: See--
Morita, Kazuki; Inoue, Tatehiko; Kawasaki, Shusaku; Kitagawa, Toshiyuki; and Ninomiya, Tooru 08064191 Cl. 361-328.
Nintendo Co., Ltd.: See--
Hoga, Toru; Nakano, Takao; Kira, Satoshi; and Tahara, Kouzou 08062131 Cl. 463-37.
Shimizu, Kazunobu 08062110 Cl. 463-2.
Tawara, Masaki; and Meguro, Norichika 08062113 Cl. 463-9.
Nippon Kasei Chemical Company Limited: See--
Yamauchi, Satoshi; Kaneko, Yoshiko; Kujira, Katsufumi; and Sakamoto, Shouji 08062469 Cl. 156-330.
Nippon Sheet Glass Company, Limited: See--
Fukuzawa, Takashi; and Yamaguchi, Jun 08063384 Cl. 250-458.1.
Nippon Soken, Inc.: See--
Takeuchi, Takayuki; and Shibata, Masamichi 08061321 Cl. 123-143R.
Nippon Steel & Sumikin Stainless Steel Corporation: See--
Hamada, Junichi; Kajimura, Haruhiko; Tanoue, Toshio; Fudanoki, Fumio; and Inoue, Yoshiharu 08062584 Cl. 420-34.
Nippon Steel Chemical Co., Ltd.: See--
Kai, Takahiro; Komori, Masaki; and Yamamoto, Toshihiro 08062769 Cl. 428-690.
Nippon Thermostat Co., Ltd.: See--
Suda, Hiroshi; and Hirosawa, Atsushi 08061294 Cl. 116-216.
Nippon Thompson Co., Ltd.: See--
Sakai, Tetsuya 08061227 Cl. 74-89.34.
Nipro Diagnostics, Inc.: See--
Bell, Douglas E.; and Albino, Michele 08062490 Cl. 204-403.04.
Nisbett, Andrew: See--
Kordosky, Gary A.; and Nisbett, Andrew 08062614 Cl. 423-24.
Nisca Corporation: See--
Mimura, Hideki; Horii, Toshihiro; and Kobayashi, Misao 08062201 Cl. 493-434.
Nisewonder, Eric Jason: See--
Sala, John; Greisz, Jonathan; Sulfridge, Darren; Feeney, Steven; Young, Wayne; and Nisewonder, Eric Jason 08063792 Cl. 340-870.02.
Nishi, Kensuke: See--
Ooyabu, Yasunari; Ishii, Jun; and Nishi, Kensuke 08063312 Cl. 174-255.
Nishi, Tadashi; Miyaguchi, Yoshinori; Oda, Naonobu; and Nose, Katsuhiko, to Toyo Boseki Kabushiki Kaisha Polyamide based mixed resin film roll and process for producing the same 08062740 Cl. 428-220.
Nishi, Takeshi: See--
Yamazaki, Shunpei; and Nishi, Takeshi 08064025 Cl. 349-141.
Nishi, Tetsuya; to Fujitsu Limited Method for specifying input edge router 08064466 Cl. 370-400.
Nishi, Tsunehiro: See--
Shinachi, Satoshi; Nishi, Tsunehiro; Hasegawa, Koji; Kinsho, Takeshi; Tachibana, Seiichiro; and Watanabe, Takeru 08062831 Cl. 430-270.1.
Nishi, Yasuhisa; and Fukuda, Takashi, to Denki Kagaku Kogyo Kabushiki Kaisha Ceramic powder and use thereof 08063120 Cl. 523-220.
Nishibori, Shin: See--
Akana, Jody; Andre, Bartley K.; Bataillou, Jeremy; Coster, Daniel J.; De Iuliis, Daniel; Hankey, Evans; Howarth, Richard P.; Ive, Jonathan P.; Kerr, Duncan Robert; Nishibori, Shin; Rohrbach, Matthew Dean; Russell-Clarke, Peter; Stringer, Christopher J.; Whang, Eugene Antony; and Zorkendorfer, Rico D0649138 Cl. D14-218.
Nishida, Masayuki; to Fuji Jukogyo Kabushiki Kaisha Control device for continuously variable transmission 08062156 Cl. 474-28.
Nishida, Yoshifumi; and Shionozaki, Atsushi, to Sony Corporation Method and apparatus for TCIP/IP data transfer over a wireless network 08064461 Cl. 370-394.
Nishigata, Yoshitaka; to Renesas Electronics Corporation Power supply selection/detection circuit 08063514 Cl. 307-85.
Nishigori, Nobuyuki: See--
Suzuki, Nobukazu; Uryu, Masaru; Ohashi, Yoshio; Tanaka, Yukio; and Nishigori, Nobuyuki 08064626 Cl. 381-336.
Nishihara, Masato; Sugaya, Yasushi; and Hayashi, Etsuko, to Fujitsu Limited Optical amplifier 08064130 Cl. 359-337.2.
Nishihira, Henry S.: See--
Suzuki, Shoji; and Nishihira, Henry S. 08064156 Cl. 360-75.
Nishijima, Etsu: See--
Takano, Ruriko; Nishijima, Etsu; Tanaka, Hiroshi; Okano, Tamae; Futagi, Momoe; and Nakamura, Minako 08064648 Cl. 382-117.
Nishikawa, Katsumasa: See--
Okumura, Ichiro; Shihoh, Makoto; Murayama, Yasushi; Fujimoto, Kosuke; Hayashi, Isao; Shigemura, Yoshihiro; Nishikawa, Katsumasa; Naoi, Masaaki; Yamamoto, Shinji; and Ito, Hiroshi 08064810 Cl. 399-301.
Nishikawa, Satoshi: See--
Uetani, Yoshihiro; Kii, Keisuke; Fujita, Shigeru; Nishikawa, Satoshi; and Okuno, Tatsuya 08062387 Cl. 29-623.5.
Nishiki, Hirohiko: See--
Saida, Shinsuke; and Nishiki, Hirohiko 08064033 Cl. 349-158.
Nishimoto, Yoichi: See--
Kainoh, Naoshi; Shirai, Akihito; Nishimoto, Yoichi; and Nakamura, Junichi 08064166 Cl. 360-224.
Nishimura, Hiromichi: See--
Jabri, Khaled; Takeshima, Nobuhito; Arai, Atsushi; Nishimura, Hiromichi; Yamashita, Toshiharu; and Noro, Yoshihiko 08063999 Cl. 349-8.
Nishimura, Kouichi; to Renesas Electronics Corporation Temperature detection circuit and semiconductor device 08061894 Cl. 374-170.
Nishimura, Kouichi; to Renesas Electronics Corporation Liquid crystal display device, source driver, and method of driving a liquid crystal display panel 08063896 Cl. 345-209.
Nishimura, Masafumi: See--
Kurata, Gakuto; Mori, Shinsuke; and Nishimura, Masafumi 08065149 Cl. 704-260.
Nishimura, Yasushi: See--
Nakanishi, Kazuo; Kikuchi, Yoshimi; Kojima, Junichiro; Suzuki, Tomoko; Nishimura, Yasushi; and Kojima, Hiroyuki 08062869 Cl. 435-115.
Nishinaga, Hikaru: See--
Ushio, Seiji; Kimura, Yoshihisa; and Nishinaga, Hikaru 08062457 Cl. 156-250.
Nishino, Hirokazu: See--
Shirai, Akira; Nishino, Hirokazu; Horikawa, Yoshiaki; and Ishii, Fusao 08061854 Cl. 353-85.
Nishino, Shuko; and Nagase, Kenji, to Fujitsu Limited Electromagnetic field intensity calculating method and apparatus 08065101 Cl. 702-66.
Nishio, Akihiko: See--
Fukuoka, Masaru; Nishio, Akihiko; Miyoshi, Kenichi; Imamura, Daichi; and Kuri, Kenichi 08064393 Cl. 370-329.
Fukuoka, Masaru; Nishio, Akihiko; Nakao, Seigo; and Golitschek Edler Von Elbwart, Alexander 08064919 Cl. 455-450.
Matsumoto, Atsushi; Futagi, Sadaki; Nishio, Akihiko; and Imamura, Daichi 08064897 Cl. 455-423.
Nishio, Ryoji; Yoshioka, Ken; Kanai, Saburou; Kanekiyo, Tadamitsu; Kihara, Hideki; and Okuda, Koji, to Hitachi High-Technologies Corporation Plasma processing apparatus and method 08062473 Cl. 156-345.48.
Nishio, Yoji; and Funaba, Seiji, to Elpida Memory, Inc. Semiconductor integrated circuit device 08064222 Cl. 361-803.
Nishio, Yoji; and Hiraishi, Atsushi, to Elpida Memory, Inc. Memory module, method for using same and memory system 08064236 Cl. 365-51.
Nishioka, Hiromasa: See--
Yoshida, Kohei; Nishioka, Hiromasa; and Asanuma, Takamitsu 08061125 Cl. 60-286.
Nishioka, Koichi: See--
Sakamoto, Koji; Nishioka, Koichi; Mitsuoka, Katsuya; Hoshino, Katsumi; and Sato, Yo 08064159 Cl. 360-110.
Nishiwaki, Kenjiro; and Maeda, Masataka, to Brother Kogyo Kabushiki Kaisha Image forming device having a developing material case with a moving vibrating region 08064806 Cl. 399-261.
Nishiyama, Nobuyasu; and Yahashi, Katsunori, to Kabushiki Kaisha Toshiba Semiconductor device and method of fabricating the same 08062938 Cl. 438-157.
Nishiyama, Taku; Okada, Kiyokazu; Ando, Yoriyasu; Yamamoto, Tetsuya; and Okumura, Naohisa, to Kabushiki Kaisha Toshiba Semiconductor memory device and semiconductor memory card using the same 08064206 Cl. 361-737.
Nishiyama, Tousaku: See--
Asahi, Toshiyuki; Karashima, Seiji; Ichiryu, Takashi; Nakatani, Seiichi; and Nishiyama, Tousaku 08064213 Cl. 361-761.
Nissan Motor Co., Ltd.: See--
Hasegawa, Masami; Tsuchikawa, Haruhisa; and Yoshida, Susumu 08065047 Cl. 701-22.
Satou, Katsunori; Kubota, Masaya; Takenaka, Hiroyuki; Yagi, Kan; and Totsuka, Seiji 08065065 Cl. 701-68.
Nissen, Rasmus Thranberg: See--
Helm, Alexander; and Nissen, Rasmus Thranberg 08061641 Cl. 241-117.
Nistala, Ramesh Rao: See--
Zhao, Siping; Hua, Younan; Nistala, Ramesh Rao; and Li, Kun 08061224 Cl. 73-865.8.
Nistler, Jürgen: See--
Eberler, Ludwig; Lazar, Razvan; Nistler, Jürgen; Renz, Wolfgang; and Rietsch, Norbert 08064981 Cl. 600-407.
Nita, Henry; Sarge, Jeff; Nguyen, Simon; and Spano, Richard, to Flowcardia, Inc. Method of manufacturing an ultrasound transmission member for use in an ultrasound catheter device 08062566 Cl. 264-162.
Nitta Haas Incorporated: See--
Ohta, Yoshiharu; Tanaka, Rika; Nitta, Hiroshi; and Morioka, Yoshitaka 08062548 Cl. 252-79.1.
Nitta, Hiroshi: See--
Ohta, Yoshiharu; Tanaka, Rika; Nitta, Hiroshi; and Morioka, Yoshitaka 08062548 Cl. 252-79.1.
Nitto Denko Corporation: See--
Ooyabu, Yasunari; Ishii, Jun; and Nishi, Kensuke 08063312 Cl. 174-255.
Sisk, David T.; Li, Sheng; and Mochizuki, Amane 08062770 Cl. 428-690.
Sisk, David T.; Li, Sheng; and Mochizuki, Amane 08062771 Cl. 428-690.
Sisk, David T.; Li, Sheng; and Mochizuki, Amane 08062772 Cl. 428-690.
Sisk, David T.; Li, Sheng; and Mochizuki, Amane 08062773 Cl. 428-690.
Takada, Katsunori; and Shigematsu, Takayuki 08062731 Cl. 428-145.
Uetani, Yoshihiro; Kii, Keisuke; Fujita, Shigeru; Nishikawa, Satoshi; and Okuno, Tatsuya 08062387 Cl. 29-623.5.
Yamamoto, Masayuki; and Miyamoto, Saburo 08062474 Cl. 156-702.
Niwa, Takahiro: See--
Mori, Tadashi; Kondoh, Motonori; Arimizu, Kaname; Niwa, Takahiro; and Yoshihara, Masaki 08061475 Cl. 181-205.
Niwamae, Yuuki; to Canon Kabushiki Kaisha Imaging apparatus having unit for removing foreign substance 08063973 Cl. 348-335.
Niwano, Kazuhito; to Mitsubishi Denki Kabushiki Kaisha Mobile station, base station, communication system, and communication method 08064326 Cl. 370-206.
Nix, Anthony Ronald; to Seasafe Pty Ltd Marine personal locator apparatus 08063771 Cl. 340-539.13.
Nixon, Donald A.: See--
Barber, Daniel E.; and Nixon, Donald A. 08062541 Cl. 252-62.52.
Niyogi, Shanku Shivabrata: See--
Chory, Susan; Gibbs, Matthew E.; Guthrie, Scott D.; Harder, Michael; Howard, Robert M.; Imig, Scott Kirk; Kothari, Nikhil; Niyogi, Shanku Shivabrata; Yang, Ting-Hao; and Sanabria, Andres M. 08065600 Cl. 715-205.
NKT Photonics A/S: See--
Mattsson, Kent; and Frosz, Michael Henoch 08064128 Cl. 359-326.
Nobis, Rudolph H.; Nalagatla, Anil K.; and Conlon, Sean P., to Ethicon Endo-Surgery, Inc. Manually articulating devices 08062306 Cl. 606-113.
Noble, Larry Allen: See--
Dooley, Kenneth Alan; Farrer, Don Kent; Holyfield, Sandra Dorothy; Maddox, II, Tommy Ray; Moore, Glenn Edward; and Noble, Larry Allen 08063158 Cl. 526-64.
Nobori, Masahiro: See--
Amano, Hiroshi; Nobori, Masahiro; and Shirakawa, Shoji 08064747 Cl. 386-239.
Nochta, Zoltan: See--
Spiess, Patrik; Sa de Souza, Luciana Moreira; Haller, Stephan; and Nochta, Zoltan 08065411 Cl. 709-224.
Noda, Masatsugu Information processing device, file data merging method, file naming method, and file data output method 08065267 Cl. 707-609.
Noda, Takuro; Wang, QiHong; Terayama, Akiko; Gotoh, Tomohiko; Kojima, Tamaki; Ikeda, Takuo; and Karasawa, Hidenori, to Sony Corporation Information processing apparatus, image display apparatus, control methods therefor, and programs for causing computer to perform the methods 08064633 Cl. 382-100.
Noda, Tomoyuki: See--
Itano, Tetsuya; and Noda, Tomoyuki 08063967 Cl. 348-308.
Noda, Toshiyuki; and Kameoka, Ayumu, to Canon Kabushiki Kaisha Image projection apparatus 08061852 Cl. 353-61.
Noda, Wayne A.; and Bell, Stephen Graham, to Minos Medical Devices and methods for securing tissue 08062308 Cl. 606-140.
Noda, Yoshiyuki; Terashima, Kazuhiko; Miyoshi, Takanori; Ota, Kazuhiro; and Suzuki, Makio, to Sintokogio, Ltd. Tilting-type automatic pouring method and a medium that stores programs to control the tilting of a ladle 08062578 Cl. 266-45.
Noguchi, Yoshitaka: See--
Sakai, Naohiro; and Noguchi, Yoshitaka 08063324 Cl. 200-313.
Noh, Cheol-yong: See--
Cho, Joo-Woan; Choi, Seong-sik; Chung, Du-hwan; and Noh, Cheol-yong 08061862 Cl. 362-97.1.
Nohara, Takeshi; Tajima, Kenji; and Nakamura, Naohiro, to Olympus Medical Systems Corp. Portion of an endoscope D0649244 Cl. D24-138.
Nokia Corporation: See--
Hottinen, Ari; and Fertl, Peter 08064823 Cl. 455-11.1.
Kakani, Naveen; and Majkowski, Jakub 08064374 Cl. 370-311.
Karhiniemi, Marko; and Nousiainen, Jari 08063330 Cl. 200-600.
Koli, Kimmo 08063806 Cl. 341-143.
Lindfors, Saska; Stadius, Kari; Xu, Liangge; Rapinoja, Tapio; Ryynanen, Jussi; Kaunisto, Risto H. S.; and Parssinen, Aarno 08063669 Cl. 327-105.
Maaniitty, Jussi; Asikainen, Pauli; and Wasilewski, Krzysztof 08065616 Cl. 715-732.
Mustonen, Mika P.; and Rytivaara, Markku 08065344 Cl. 707-805.
Oommen, Paul 08065359 Cl. 709-203.
Pyhalammi, Seppo; Hameen-Anttila, Tapio; Saarimaa, Tero-Markus; Sihvola, Tuomo; Makila, Niko; and Artman, Tuomas Santeri 08065429 Cl. 709-232.
Rajala, Jussi; Forssell, Mika; and Parantainen, Janne 08064912 Cl. 455-438.
Ruha, Antti 08063776 Cl. 340-539.26.
Strandel, Toni; Wong, Davin; and Tammi, Tuomas 08065328 Cl. 707-781.
Vaha-Sipila, Antti; and Oikarinen, Jarkko 08064598 Cl. 380-247.
Vesamäki, Seppo; and Herranen, Timo 08064973 Cl. 455-575.4.
Nokia, Inc.: See--
Shaik, Ibrahim S.; Sai, Gollapudi; Pallaprolu, Raviteja; Bangar, Reema; Rao, Muntha K.; and Satyanarayana, Vummidi 08065408 Cl. 709-224.
Nokomis, Inc.: See--
Keller, Walter J. 08063813 Cl. 342-22.
Nolin, Daniel; and Leaman, Deborah F. Recycling and refuse curbside cart D0649317 Cl. D34-12.
Nolte, Roger Allen: See--
Tullis, Barclay J.; Nolte, Roger Allen; and Merrill, Charles 08061930 Cl. 404-73.
Nomoto, Mineo: See--
Nakata, Toshihiko; Watanabe, Masahiro; Baba, Shuichi; Yoshitake, Yasuhiro; and Nomoto, Mineo 08064066 Cl. 356-493.
Nomura, Masahiro: See--
Cociorva, Oana; Li, Bei; Szardenings, Anna Katrin; Fukuda, Yasumichi; Nomura, Masahiro; Seto, Shigeki; Yumoto, Kazuhiro; Okada, Kyoko; and Nakamura, Ayako 08063221 Cl. 546-156.
Nonaka, Tuyoshi: See--
Makino, Shogo; and Nonaka, Tuyoshi 08063547 Cl. 310-400.
Nondhasitthichai, Somchai: See--
Sirinorakul, Saravuth; and Nondhasitthichai, Somchai 08063470 Cl. 257-666.
Noni, Jr., Douglas Miles: See--
Hawtof, Daniel Warren; and Noni, Jr., Douglas Miles 08062733 Cl. 428-167.
Nordeen, Craig A.: See--
Merry, Brian; Suciu, Gabriel L.; Norris, James W.; and Nordeen, Craig A. 08061968 Cl. 415-68.
Nordson Corporation: See--
Frates, Paul S. 08061564 Cl. 222-146.5.
Norgen Biotek Corp.: See--
Haj-Ahmad, Yousef 08063199 Cl. 536-25.41.
Nori, Aditya V.: See--
Chilimbi, Trishul; Mehra, Krishna Kumar; Liblit, Benjamin Robert; Nori, Aditya V.; and Vaswani, Kapil 08065565 Cl. 714-38.1.
Norma Sweden AB: See--
Ryhman, Morgan; and Andersson, Lennart 08060991 Cl. 24-274R.
Norman, Casey W.; and Gamlin, David, to Genie Toys plc Flexible track system 08061627 Cl. 238-10A.
Norman, Robert; to Unity Semiconductor Corporation System using non-volatile resistivity-sensitive memory for emulation of embedded flash memory 08064238 Cl. 365-63.
Norman, Robert; to Unity Semiconductor Corporation Non-volatile FIFO with third dimension memory 08064256 Cl. 365-185.08.
Norman, Robert; to Unity Semiconductor Corporation Circuitry and method for indicating a memory 08064276 Cl. 365-189.2.
Norman, Robert; to Unity Semiconductor Corporation Method for accessing vertically stacked embedded non-flash re-writable non-volatile memory 08064284 Cl. 365-230.03.
Norman, Robert; to Unity Semiconductor Corporation Memory device with vertically embedded non-flash non-volatile memory for emulation of NAND flash memory 08065474 Cl. 711-103.
Norman, Robert; to Unity Semiconductor Corporation Performing data operations using non-volatile third dimension memory 08065478 Cl. 711-112.
Noro, Hiroshi: See--
Onoda, Keiichi; Furukawa, Masakazu; Ozaki, Kazuyoshi; Noro, Hiroshi; and Sakuma, Yasumitsu 08063009 Cl. 510-310.
Noro, Yoshihiko: See--
Jabri, Khaled; Takeshima, Nobuhito; Arai, Atsushi; Nishimura, Hiromichi; Yamashita, Toshiharu; and Noro, Yoshihiko 08063999 Cl. 349-8.
Norris, Derek J.: See--
Wei, Chenkou; and Norris, Derek J. 08063208 Cl. 544-183.
Norris, James W.: See--
Merry, Brian; Suciu, Gabriel L.; Norris, James W.; and Nordeen, Craig A. 08061968 Cl. 415-68.
Norsten, Tyler B.: See--
Iftime, Gabriel; Kazmaier, Peter M.; Smith, Paul F.; Mahabadi, Hadi K.; Wagner, Christopher A.; Odell, Peter G.; and Norsten, Tyler B. 08061791 Cl. 347-1.
Nortel Networks Limited: See--
Beshai, Maged E. 08064341 Cl. 370-230.
Zhang, Debin; Lapuh, Roger; and Nakhawa, Ganesh 08064458 Cl. 370-392.
North Carolina State University: See--
Bailis, Robert; Butler, Tom; Flynn, Brian; Kinlaw, Alan; Jester, Ian; and Taylor, Carl 08064628 Cl. 381-386.
North-West University: See--
Visser, Barend; and De Jager, Ocker Cornelis 08063426 Cl. 257-312.
Northern Innovations and Formulations Corp.: See--
Clement, Ken; Chaudhuri, Shan; Molino, Michele; and Apong, Phil 08062679 Cl. 424-725.
Northrop Grumman Guidance and Electronics Company, Inc.: See--
Karam, Mostafa A.; Volk, Charles H.; and Meyer, A. Douglas 08065108 Cl. 702-136.
Northrop Grumman Systems Corporation: See--
Higgs, Brent E.; Birbeck, John S.; Frieler, Cliff E.; and Cothren, Robert M. 08064670 Cl. 382-131.
Lytle, II, David R.; Stack, David J.; and Wieczorek, Joseph 08063346 Cl. 244-3.1.
Northwest Missouri State University: See--
Islam, M. Rafiq 08062407 Cl. 75-345.
Northwestern University: See--
Peoppelmeier, Kenneth R.; Sauvage, Frederic; Bodenez, Vincent; and Tarascon, Jean-Marie 08062791 Cl. 429-219.
Stupp, Samuel I.; Hartgerink, Jeffrey D.; and Beniash, Elia 08063014 Cl. 514-2.
Norwood, Richard L.: See--
Skalitzky, Michael J.; Leonard, Stephen B.; Harwig, Jeffrey L.; Shirley, Steven C.; Norwood, Richard L.; Cheng, Fuk Yuen; Wen, Zhi Bin; Shi, Jian; and Kopanic, Robert J. 08061918 Cl. 401-188R.
Nose, Katsuhiko: See--
Nishi, Tadashi; Miyaguchi, Yoshinori; Oda, Naonobu; and Nose, Katsuhiko 08062740 Cl. 428-220.
Noshita, Masanobu: See--
Ito, Yutaka; Motojima, Katsuhide; Uematsu, Kazuya; Noshita, Masanobu; Takata, Kazutaka; Shimada, Mitsushige; Manabe, Megumi; Miyaoka, Noboru; and Takesaka, Kenji 08062527 Cl. 210-650.
Nothaft, Hans-Peter; and Hauke, Rudolf, to TBS Holding AG Touch-free finger line recogition 08064659 Cl. 382-126.
Notohamiprodjo, Hubertus: See--
Chen, Xiaopeng; Lin, Jianqing; and Notohamiprodjo, Hubertus RE042946 Cl. 323-222.
Chen, Xiaopeng; Lin, Jianqing; and Notohamiprodjo, Hubertus RE042947 Cl. 323-222.
Nousiainen, Jari: See--
Karhiniemi, Marko; and Nousiainen, Jari 08063330 Cl. 200-600.
Novack, Brian M.: See--
Rakers, Matthew A.; Dunmire, David L.; and Novack, Brian M. 08065364 Cl. 709-203.
Novak, Allison E.: See--
Hales, John H.; Novak, Allison E.; and Burleson, John D. 08061425 Cl. 166-297.
Novak, Peter: See--
Klaiber, Franz; and Novak, Peter 08061502 Cl. 198-396.
Novak, Vincent P.: See--
Ammann, Kelly G.; Novak, Vincent P.; Schneider, Robert E.; and Taber, Justin R. 08062301 Cl. 606-87.
Novartis AG: See--
Ahlgren, Nils William; Dahl, Ronald Lee; Friesen, Monte Lee; and Schobel, Alexander Mark 08062659 Cl. 424-439.
Bajwa, Joginder; de la Cruz, Marilyn; Dodd, Stephanie Kay; Waykole, Liladhar Murlidhar; and Wu, Raeann 08063043 Cl. 514-235.5.
Clark, Abbot F.; and Wordinger, Robert J. 08063013 Cl. 514-1.1.
Dales, Natalie; Fonarev, Julia; Fu, Jianmin; Kamboj, Rajender; Kodumuru, Vishnumurthy; Liu, Shifeng; Pokrovskaia, Natalia; Raina, Vandna; Sun, Shaoyi; and Zhang, Zaihui 08063084 Cl. 514-385.
Lane, Jennifer Dawn; Perreault, Stephen Raymond; and Beaullieu, Elizabeth Hickson 08062607 Cl. 422-261.
Nantel, Normand; Smith, Adrian; Cheu, Scot; Parks, Derrick J; Ghandhi, Jamshed; and Walsh, Kevin Russert 08061222 Cl. 73-865.
Oscarson, Stefan; Teodorovic, Peter; and Costantino, Paolo 08062641 Cl. 424-184.1.
Stout, Gordon; Pham, Xuyen; Rocchio, Michael J.; Naydo, Kyle A.; Parks, Derrick J.; and Reich, Patrick RE042942 Cl. 141-67.
Sutton, James; and Valiante, Nicholas 08063063 Cl. 514-303.
Novartis International Pharmaceutical Ltd.: See--
Koide, Shohei 08062858 Cl. 435-7.23.
Novartis Vaccines & Diagnostics SRL.: See--
Pizza, Mariagrazia; Serino, Laura; Scorza, Francesco Berlanda; Moriel, Danilo Gomes; and Fontana, Maria Rita 08062644 Cl. 424-241.1.
Novatel Wireless Inc.: See--
Wu, John Jun; and Ho, Kevin 08064884 Cl. 455-412.2.
Novel Ideas, Inc.: See--
Wink, John S. D0649268 Cl. D25-164.
Novell, Inc.: See--
Burch, Lloyd Leon; McClain, Carolyn Bennion; and Carter, Stephen R. 08065395 Cl. 709-219.
Ebrahimi, Hashem M.; Carter, Stephen R; and Oyler, Mel J 08065720 Cl. 726-12.
Novellus Systems, Inc.: See--
Ashtiani, Kaihan; Humayun, Raashina; Dixit, Girish; Battaglia, Anna; and Rassiga, Stefano 08062977 Cl. 438-681.
Draeger, Nerissa S.; and Ray, Gary William 08062983 Cl. 438-783.
Novexel: See--
Lampilas, Maxime; Rowlands, David Alun; Kebsi, Adel; Ledoussal, Benoit; and Pierres, Camille 08063219 Cl. 546-121.
Novikov, Roman Vasilyevich: See--
Zhuravlev, German Alexandrovich 08061229 Cl. 74-457.
Novo Nordisk A/S: See--
DeFrees, Shawn; Zopf, David A.; Bayer, Robert J.; Hakes, David James; Bowe, Caryn L.; and Chen, Xi 08063015 Cl. 514-3.1.
Nielsen, Ole Christian; Radmer, Jim; and Preuthun, Jan Harald 08062253 Cl. 604-131.
Polisetti, Dharma Rao; Kodra, Janos Tibor; Lau, Jesper; Bloch, Paw; Lopez, Maria Carmen Valcarce; Blume, Niels; Guzel, Mustafa; Santhosh, Kalpathy Chidambareswaran; Mjalli, Adnan M. M.; Andrews, Robert Carl; Subramanian, Govindan; Ankersen, Michael; Vedso, Per; Murray, Anthony; and Jeppesen, Lone 08063081 Cl. 514-371.
Novoselova, Larisa: See--
Kitson, Anthony P.; and Novoselova, Larisa 08062827 Cl. 430-270.1.
Novozymes, Inc.: See--
Harris, Paul; Vlasenko, Elena; Kauppinnen, Marcus Sakari; Zaretsky, Elizabeth; Teter, Sarah; and Brown, Kimberly 08063267 Cl. 800-288.
Nowak, Marcin: See--
Celik, Feyzi; Nowak, Marcin; DeGrace, Chris; and Finn, Jeffrey S. 08064956 Cl. 455-558.
Noyes, Ying Xie; and Hung, Szepo Robert, to QUALCOMM Incorporated Adaptive auto white balance 08064110 Cl. 358-504.
Nozaki, Chiyoshi: See--
Yamamoto, Atsushi; Nozaki, Chiyoshi; and Nozaki, Tsuyoshi 08062821 Cl. 430-109.4.
Nozaki, Hirotake: See--
Fujinawa, Nobuhiro; and Nozaki, Hirotake 08061850 Cl. 353-52.
Nozaki, Tsuyoshi: See--
Yamamoto, Atsushi; Nozaki, Chiyoshi; and Nozaki, Tsuyoshi 08062821 Cl. 430-109.4.
NTN Corporation: See--
Ooba, Hirokazu; and Sone, Keisuke 08062139 Cl. 464-145.
NTT DoCoMo, Inc.: See--
Fujibayashi, Akira; Boon, Choong Seng; Kato, Sadaatsu; and Horikoshi, Tsutomu 08064638 Cl. 382-103.
Inoue, Takahiro; and Ito, Shogo 08064971 Cl. 455-575.1.
Ohtani, Tomoyuki; Tamura, Motoshi; and Sato, Takaaki 08064908 Cl. 455-436.
Ramzan, Zulfikar Amin; and Gentry, Craig B. 08065332 Cl. 707-791.
Sundberg, Carl-Erik W.; and Papadopoulos, Haralabos 08064548 Cl. 375-341.
Tobita, Noriaki; Endo, Kentaro; and Takatsu, Toshiki 08064818 Cl. 455-3.01.
Nuance Communications, Inc.: See--
Breuer, Richard 08065147 Cl. 704-257.
Buck, Markus; and Haulick, Tim 08064617 Cl. 381-92.
Clelland, George Murdoch; and Pickering, John Brian 08064573 Cl. 379-88.04.
Eide, Ellen M. 08065150 Cl. 704-260.
Huerta, Juan Manuel; and Pieraccini, Roberto 08065148 Cl. 704-257.
Imoto, Noriko; Uda, Tetsuya; and Watanabe, Takatoshi 08065142 Cl. 704-231.
Kurata, Gakuto; Mori, Shinsuke; and Nishimura, Masafumi 08065149 Cl. 704-260.
Stevens, Daniell; Roth, Robert; Gould, Joel M.; Newman, Michael J.; Sturtevant, Dean; Ingold, Charles E.; Abrahams, David; and Gold, Allan 07315818 Cl. 704-235.
Nucci, Antonio; and Ranjan, Supranamaya, to Narus, Inc. System and method for malware containment in communication networks 08065731 Cl. 726-22.
Nuctech Company Limited: See--
Yang, Zhongrong; Meng, Hui; Jiang, Nan; and Sun, Shangmin 08060965 Cl. 14-69.5.
NuFlare Technology, Inc.: See--
Yashima, Jun; Suzuki, Junichi; and Abe, Takayuki 08065635 Cl. 716-50.
Null, Jr., William A.: See--
Goertzen, Gerold; and Null, Jr., William A. 08062003 Cl. 417-269.
Nullodor USA LLC: See--
Mestrallet, Francois 08062902 Cl. 436-169.
Numata, Kenichi; to Fuji Xerox Co., Ltd. Content use management system, content-providing system, content-using device and computer readable medium 08065743 Cl. 726-30.
Nun, Edwin; Bergandt, Heike; Gutsch, Andreas; and Geipel, Gerhard, to Evonik Degussa GmbH Ceramic wall cladding composites that reflect IR radiation 08062700 Cl. 427-160.
Nunley, Ranny Joe: See--
Jensen, David R.; Ghiran, Mike M.; Nunley, Ranny Joe; Friddell, David R.; Crantas, William M.; Marks, Kevin R.; and Larsen, Paul D. 08061179 Cl. 72-453.02.
Nunnink, Laurens; to Cognex Technology and Investment Corporation System and method for employing color illumination and color filtration in a symbology reader 08061610 Cl. 235-454.
Nunokawa, Hirokazu: See--
Endo, Hironori; Nunokawa, Hirokazu; Igarashi, Hitoshi; and Nakata, Satoshi 08061798 Cl. 347-16.
Nuon, Inc.: See--
Hui, Joseph Y.; and Daniel, David A. 08064433 Cl. 370-351.
Nuss, Bart: See--
Johns, Clifford L.; Camoriano, Guillermo; and Nuss, Bart 08063778 Cl. 340-540.
Nutrition 21, Inc.: See--
Komorowski, James R. 08062677 Cl. 424-655.
Nuttall, Kirsty: See--
Chau, Victor; Hoople, Doug; Leung, Timothy; Nuttall, Kirsty; Ravuri, Muralidhar; Roper, Joshua M.; Sovocool, Peter; Srinivasan, Balaji; and Yee, Colette 08065229 Cl. 705-40.
Nuvera Fuel Cells Europe S.R.L.: See--
Trifoni, Eduardo; and Liotta, Marcello 08062805 Cl. 429-457.
Nuytinck, Lieve: See--
Vanmechelen, Eugeen; and Nuytinck, Lieve 08062842 Cl. 435-6.
NVIDIA Corporation: See--
d'Eon, Eugene J.; and Luebke, David Patrick 08064726 Cl. 382-279.
Donovan, Walter E.; and McAllister, David K. 08065354 Cl. 708-203.
Dunaisky, Jonathan J.; Neil, John Malcolm; and Kumar, Subodh 08063908 Cl. 345-519.
Garland, Michael J.; Laine, Samuli M.; and Aila, Timo O. 08065288 Cl. 707-706.
Johnson, Michael Ward; Currid, Andrew; Kanuri, Mrudula; and Minami, John Shigeto 08065439 Cl. 709-250.
Mrazek, Dane; Liu, Yongxiang; Tang, Yin Fung; and Glasco, David 08065465 Cl. 710-317.
Stolowitz, Michael C. 08065590 Cl. 714-763.
Vignon, Blaise A.; and Crow, Franklin C. 08063903 Cl. 345-428.
NXP B.V.: See--
Bekooij, Marco J. G. 08065459 Cl. 710-244.
Boyle, Kevin R. 08063834 Cl. 343-702.
Burchard, Artur Tadeusz; Hekstra-Nowacka, Ewa; Van Den Hamer, Peter; and Chauhan, Atul Pratap 08065493 Cl. 711-154.
Butzmann, Stefan 08063635 Cl. 324-252.
Goarin, Pierre 08063427 Cl. 257-314.
Habenicht, Soenke; Thorns, Ansgar; and Zeile, Heinrich 08062974 Cl. 438-666.
Hendriks, Antonius Maria Petrus Johannes; Guelen, Josephus Franciscus Antonius Maria; and Dormans, Guido Jozef Maria 08063429 Cl. 257-315.
Khan, Ata; Goodhue, Greg; Shrivastava, Pankaj; Van Der Veer, Bas; Varney, Rick; and Nagaraj, Prithvi 08065512 Cl. 713-2.
Le Mellat, Bertrand Jean-Louis 08064866 Cl. 455-312.
Lindstrom, Mats; Eswein, Glenn W.; Shafie, Abdolreza; Ploof, Mike A.; Maeda, Ryuji; Gill, Manjit S.; Carlson, Eileen; Simon, Anthony R.; and Lau, Henry S. 08063997 Cl. 348-731.
Sidiki, Tamim Peter; Roehm, Horst; Ritter, Hans-Martin; Izat, Robert Muir Gemmel; and Weber, Rob P. 08062068 Cl. 439-620.08.
Tabaaloute, Zahra 08065389 Cl. 709-217.
Tobergte, Wolfgang 08065531 Cl. 713-187.
Zingg, Rene P.; Gopalan Zingg, Sudha; Doornveld, Herman E.; and Martens, Theodorus H. G. 08063401 Cl. 257-48.
Nybakken, George H.: See--
Palinkas, Richard L.; Laskowitz, Ian; and Nybakken, George H. 08061398 Cl. 152-324.
Nycz, Jeffrey H.; and Lyons, Christopher Michael, to Warsaw Orthopedic, Inc. Cannulated sensing device 08062259 Cl. 604-164.01.
Nye, S. Curtis; and Steed, Brent, to Lifetime Products, Inc. Height adjustment mechanism for a basketball system 08062152 Cl. 473-484.
Nyeboer, Calvin D.; and Stejskal, Michael F., to Bradford Company Dunnage structure made with multiple ply partitions 08061549 Cl. 220-552.