| US 7,454,062 B2 | ||
| Apparatus and method of pattern recognition | ||
| Masashi Nishiyama, Kanagawa (Japan); Osamu Yamaguchi, Kanagawa (Japan); and Kazuhiro Fukui, Kanagawa (Japan) | ||
| Assigned to Kabushiki Kaisha Toshiba, Tokyo (Japan) | ||
| Filed on Nov. 04, 2004, as Appl. No. 10/980,310. | ||
| Claims priority of application No. 2003-376267 (JP), filed on Nov. 05, 2003. | ||
| Prior Publication US 2005/0141767 A1, Jun. 30, 2005 | ||
| Int. Cl. G06K 9/00 (2006.01) | ||
| U.S. Cl. 382—181 [382/118] | 18 Claims |

| 1. A pattern recognition apparatus comprising:
an input unit configured to input at least one input pattern;
an input subspace generating unit configured to generate an input subspace by generating an input vector from said input pattern
and analyzing a main component for said input vector;
a reference subspace calculating unit configured to calculate a reference subspace, respectively, by analyzing a main component
for a reference pattern relevant to a plurality of comparison targets to compare them with said recognition target;
a constraint subspace storing unit configured to obtain a subspace for learning obtained by a main component analysis from
a pattern including a variation resulting in declining pattern recognition performance and storing a plurality of constraint
subspaces obtained from said subspace for learning;
a projecting unit configured to project said input subspace and said plurality of reference subspaces onto each one of said
plurality of constraint subspaces;
a similarity calculating unit configured to calculate similarities between said input subspace in the projected constraint
subspaces and all of said plurality of reference subspaces, individually;
a similarity combining unit configured to combine the similarities of said plurality of constraint spaces for each reference
subspace and calculating a combined similarity for each reference subspace; and
a determining unit configured to determine a comparison target of the reference subspace corresponding to a combined similarity
having a high value among said combined similarities as said recognition target.
|