LIST OF PATENTEES
TO WHOM
PATENTS WERE ISSUED ON THE 12th DAY OF November, 2013
AND TO WHOM
REEXAMINATION CERTIFICATES WERE ISSUED
DURING THE WEEK BEGINNING THE 4th DAY OF November, 2013.
NOTE--Arranged in accordance with the first significant character or word of the name
(in accordance with city and telephone directory practice).

N. V. Nutricia: See--
Boehm, Günther; Beermann, Christopher; Stahl, Bernd; M'Rabet, Laura; and Garssen, Johan 08580316 Cl. 424-643.
N.V. Nutricia: See--
Sawatzki, Gunther; and Stahl, Bernd 08580295 Cl. 424-439.
N.V. Perricone LLC: See--
Perricone, Nicholas V. 08580742 Cl. 514-18.6.
Na, Hoon-Joo: See--
Park, Hong-Bae; Hyun, Sang-Jin; Lee, Hu-Yong; Na, Hoon-Joo; Han, Jeong-Hee; Lee, Hye-Lan; and Hong, Hyung-Seok 08580629 Cl. 438-199.
Na, Ilju: See--
Singh, Harkirat; Hsu, Ju-Lan; Yong, Su Khiong; Na, Ilju; and Ngo, Chiu 08582456 Cl. 370-252.
Na, Se-wook; and Ryu, In Sik, to Seagate Technology International Data storage device, storing medium access method and storing medium thereof 08583879 Cl. 711-154.
Naamad, Amnon: See--
Marshak, Marik; Martin, Owen; Veprinsky, Alex; Naamad, Amnon; Dolan, Sean C.; and Sahin, Adnan 08583838 Cl. 710-18.
Naccache, David: See--
Bidan, Christophe; Naccache, David; Girard, Pierre; Guterman, Pascal; and Rousseau, Ludovic 08583934 Cl. 713-182.
Naciri, Mamoun: See--
Pollack, Jack; Poldervaart, Leendert; and Naciri, Mamoun 08579547 Cl. 405-224.
Nadachi, Mitsuhiro: See--
Hatano, Osamu; Sugimoto, Kazuya; and Nadachi, Mitsuhiro 08579777 Cl. 493-56.
Nadar, Mariappan S.: See--
Bilgin, Ali; Kim, Yookyung; and Nadar, Mariappan S. 08582907 Cl. 382-240.
Nadaud, Nicolas: See--
Durandeau, Anne; Kharchenko, Andriy; and Nadaud, Nicolas 08580355 Cl. 427-554.
Nadkarni, Rajeev: See--
Singhal, Anil K.; Kelley, Bruce A.; Nadkarni, Rajeev; Byrapuram, Narendra; Saraswati, Abhishek; and Singhal, Ashwani 08582454 Cl. 370-252.
Nadvit, Gregory M.; Williams, Andrew D.; Tessarini, Leone J.; and Arnal, Michel P., to Wood Group Heavy Industrial Turbines AG Turbomachinery blade having a platform relief hole, platform cooling holes, and trailing edge cutback 08579590 Cl. 416-97R.
Nagadomi, Yasushi; and Tokiwa, Naoya, to Kabushiki Kaisha Toshiba Nonvolatile semiconductor memory device 08582369 Cl. 365-185.22.
Nagae, Yoshiharu: See--
Tomizuka, Yoshiteru; Oku, Kentaro; Tanaka, Yoshinori; and Nagae, Yoshiharu 08582041 Cl. 349-15.
Nagahama, Tsutomu: See--
Haga, Yumi; Nagahama, Tsutomu; and Matsumura, Shinichi 08582204 Cl. 359-488.01.
Nagahisa, Hiroshi: See--
Asakura, Yoshihiro; Nagahisa, Hiroshi; Hohki, Hidemitsu; Takahashi, Atsushi; Yoshida, Yukitaka; Ichioka, Yuji; and Kato, Mamoru 08581626 Cl. 326-39.
Nagai, Akira; Arazoe, Mei; and Kato, Go, to Mitsui High-Tec, Inc. Method of manufacturing laminated rotor core 08578592 Cl. 29-598.
Nagai, Kenichi: See--
Terada, Munehiro; and Nagai, Kenichi 08581906 Cl. 345-428.
Nagai, Kiyofumi: See--
Namba, Michihiko; Matsuyama, Akihiko; Morohoshi, Naoya; Ohshima, Tohru; Koyano, Masayuki; Gotoh, Akihiko; and Nagai, Kiyofumi 08580159 Cl. 252-521.6.
Nagai, Kouichi: See--
Yaegashi, Tetsuo; and Nagai, Kouichi 08581249 Cl. 257-48.
Nagai, Kouichi; to Fujitsu Semiconductor Limited Semiconductor storage device, semiconductor storage device manufacturing method and package resin forming method 08582343 Cl. 365-145.
Nagai, Takayuki; Nagura, Masataka; and Kuroda, Takaki, to Hitachi, Ltd. Computer system management method and management apparatus 08583789 Cl. 709-224.
Nagai, Yutaka: See--
Ikeda, Masakazu; Nishimura, Koichiro; and Nagai, Yutaka 08582404 Cl. 369-47.1.
Nagaike, Hiroshi; and Moriya, Tsuyoshi, to Tokyo Electron Limited Substrate processing system, substrate surface processing apparatus, substrate surface inspecting apparatus, substrate surface inspecting method, and storage medium storing program for implementing the method 08578952 Cl. 134-113.
Nagamatsu, Ikuro: See--
Yamaoka, Nobuyoshi; Ishimine, Junichi; Nagamatsu, Ikuro; Suzuki, Masahiro; Katsui, Tadashi; Ohba, Yuji; Saito, Seiichi; Ueda, Akira; and Uraki, Yasushi 08584134 Cl. 718-104.
Nagamine, Yoshihiko: See--
Fujimoto, Rintaro; Nagamine, Yoshihiko; Umezawa, Masumi; Umekawa, Toru; Fujii, Yusuke; and Akiyama, Hiroshi 08581218 Cl. 250-492.3.
Nagamori, Masashi: See--
Hagiwara, Yuji; Nagamori, Masashi; Fujiwara, Masaki; Jodry, Jonathan Joachim; and Narizuka, Satoru 08581009 Cl. 568-842.
Nagamori, Masashi; Narizuka, Satoru; Inoue, Susumu; and Kume, Takashi, to Central Glass Company, Limited Salt having fluorine-containing carbanion structure, derivative thereof, photoacid generator, resist material using the photoacid generator, and pattern forming method 08580486 Cl. 430-921.
Naganuma, Yoshiaki; to Toyota Jidosha Kabushiki Kaisha Fuel cell system and power supply control method 08580449 Cl. 429-432.
Nagao, Kanehiro: See--
Kaga, Hiroyasu; Nagao, Kanehiro; and Ukiana, Motohide 08581484 Cl. 313-361.1.
Nagaraj, Guruprasad; Murthy, Krishna Koteshwara Sridhar; Patil, Vijayalaxmi; Muniyappa, Nataraja Kambadahalli; and Nyamagouda, Sunil Ramappa, to LG Electronics Inc. System and method for displaying a rotated image in a display device 08581933 Cl. 345-649.
Nagarajan, Radhakrishnan L.; Liou, Christopher C.; and Kato, Masaki, to Infinera Corporation Wavelength division multiplexed passive optical network 08582975 Cl. 398-137.
Nagarajan, Raj: See--
Lu, Zihong; Meier, Richard A.; Shah, Sunil P.; and Nagarajan, Raj 08583833 Cl. 709-251.
Nagaralu, Sree Hari: See--
Krishnan, Vijay; Agrawal, Puneet; Khator, Ankur; and Nagaralu, Sree Hari 08583622 Cl. 707-711.
Nagarathnam, Dhanapalan: See--
Sofia, Michael Joseph; Du, Jinfa; Wang, Peiyuan; and Nagarathnam, Dhanapalan 08580765 Cl. 514-51.
Nagasaka, Akio: See--
Miura, Naoto; Nagasaka, Akio; and Miyatake, Takafumi 08582831 Cl. 382-115.
Nagasaki, Kenji; to Lapis Semiconductor Co., Ltd. Semiconductor device 08581408 Cl. 257-773.
Nagasaki, Yasuhiko; Matsuoka, Toshifumi; Saito, Akira; and Okuzumi, Koichi, to Japan Oil, Gas and Metals National Corporation Underground electromagnetic exploration method 08581593 Cl. 324-345.
Nagasawa, Atsushi: See--
Watanabe, Tatsufumi; Tanaka, Junichi; Nagasawa, Atsushi; Hiramatsu, Shinji; and Fujisawa, Katsuya 08580069 Cl. 156-272.8.
Nagasawa, Minoru: See--
Chino, Takashi; Gomi, Satoshi; Miyashita, Koichi; Nagasawa, Minoru; and Eda, Yoshie 08581153 Cl. 219-446.1.
Nagase, Kenji; and Fujitani, Kensaku, to Aisin AW Co, Ltd. Apparatus, method, and program for generating road information 08583362 Cl. 701-414.
Nagase, Kenji; Sawada, Yoshihiro; Hiratsuka, Yoshiaki; Nakao, Tomoyuki; and Nakamura, Keisuke, to Fujitsu Limited Printed circuit board design assisting device, method, and program 08584076 Cl. 716-137.
Nagase, Yasuo; to Kabushiki Kaisha Toshiba Grooving work method and grooving work apparatus 08579559 Cl. 409-132.
Nagata, Takaaki: See--
Hatano, Kaoru; Seo, Satoshi; Nagata, Takaaki; and Okano, Tatsuya 08581265 Cl. 257-79.
Nagata, Yukiaki: See--
Muratsubaki, Ryoji; Nagata, Yukiaki; and Sugimori, Tadashi 08581141 Cl. 219-121.67.
Nagato, Rie; and Ishikawa, Yoshihiro, to NTT DoCoMo, Inc. Base station and mobile communication method to change a transmission power of communication channel 08583124 Cl. 455-444.
Nagatsuka, Masato: See--
Matsuda, Mamoru; Nagatsuka, Masato; Mori, Toshiyuki; Kobayashi, Sachiko; Kato, Masatomo; and Takai, Miwa 08580784 Cl. 514-235.2.
Nagatsuka, Shuhei: See--
Inoue, Hiroki; Kato, Kiyoshi; Matsuzaki, Takanori; and Nagatsuka, Shuhei 08582348 Cl. 365-149.
Nagel, Michael; to Rwth Aachen University THz antenna array, system and method for producing a THz antenna array 08581784 Cl. 343-700MS.
Nagel, Thomas: See--
Eberheim, Andreas; Nagel, Thomas; Thieme, Andre; and Zeun, Hendrik 08581575 Cl. 324-204.
Nagler, Sharon: See--
Kadis, Giries; Salalha, Wael; Petachia, Shunit; Nagler, Sharon; Richter, Marko; Bendek, Assaf; and Har-Tsvi, Roy 08583021 Cl. 399-343.
Nagori, Soyeb: See--
Mathew, Manu; Nagori, Soyeb; and Osamoto, Akira 08582645 Cl. 375-240.03.
Nagoshi, Masahiko: See--
Noguchi, Wataru; Yamada, Toyoshi; Yurugi, Hiroyuki; Tanaka, Osamu; Arashin, Nobuhiko; and Nagoshi, Masahiko 08583052 Cl. 455-67.11.
Nagpal, Abhinay R.; Patil, Sandeep R.; Ramanathan, Sri; Sivakumar, Gandhi; and Trevathan, Matthew B., to International Business Machines Corporation Delivery in session initiated protocol (SIP) conferencing 08583735 Cl. 709-204.
Naguib, Ayman Fawzy: See--
Palanki, Ravi; and Naguib, Ayman Fawzy 08583146 Cl. 455-456.6.
Nagumo, Akira; to Oki Data Corporation Driving device, optical print head and image forming device 08581946 Cl. 347-132.
Nagura, Masataka: See--
Nagai, Takayuki; Nagura, Masataka; and Kuroda, Takaki 08583789 Cl. 709-224.
Nagurny, Nicholas J.; Jansen, Eugene C.; and Panchal, Chandrakant B., to Lockheed Martin Corporation Working-fluid power system for low-temperature rankine cycles 08578714 Cl. 60-645.
Nagy, Charles: See--
Khoury, James M.; Nagy, Charles; Nemethy, Stephen G.; and Ignatius, Mark J. 08578878 Cl. 118-668.
Nagy, Thomas C.; Pattenden, Christopher; and Simmons, Sean B., to BlackBerry Limited Multiple-processor wireless mobile communication device 08582583 Cl. 370-395.52.
Nahill, James A.: See--
Samek, Justin; and Nahill, James A. 08579200 Cl. 235-470.
Naibo, Alexis L.: See--
Lemaire, Mathieu; Kopp, Steve N.; and Naibo, Alexis L. 08583618 Cl. 707-706.
Naik, Devang: See--
Silverman, Kim; Naik, Devang; Lenzo, Kevin; and Henton, Caroline 08583418 Cl. 704-9.
Naik, Nagaraju: See--
Mudrick, Adam A.; Jayaraman, Siddharth; Nguyen, Albert; Gholmieh, Ralph A.; Gupta, Binita; Naik, Nagaraju; Gautam, Susheel K.; and Zeilingold, Daphna 08582455 Cl. 370-252.
Naik, Praful Ramachandra; Mandale, Avinash Shantaram; and Bhandari, Mohan Harakchand, to Bilcare Limited Packaged-product system with multi-operational access control 08579106 Cl. 206-1.5.
Nair, Jiji: See--
Welingkar, Bharat; and Nair, Jiji 08583602 Cl. 707-654.
Nair, Sean: See--
Wilson, Michael; Parkin, Ivan P.; and Nair, Sean 08580309 Cl. 424-489.
Nair, Sreejakumar Sreekantan: See--
Saligram, Narayana Prakash; Nair, Sreejakumar Sreekantan; Krishnan, Ramakrishnan Madenoor; and Dighrasker, Milind 08581554 Cl. 320-134.
Naitoh, Yutaka; Takahashi, Yoshiharu; and Yamamoto, Shin, to Ricoh Company, Ltd. Fixing device and image forming apparatus incorporating same 08582991 Cl. 399-45.
Najaraian, Thomas; Tam, Peter Y.; and Wilson, Leland F., to Vivus, Inc. Low dose topiramate/phentermine composition and methods of use thereof 08580298 Cl. 424-451.
Najarian, Thomas; Tam, Peter Y.; and Wilson, Leland F., to Vivus, Inc. Escalating dosing regimen for effecting weight loss and treating obesity 08580299 Cl. 424-451.
Naka, Toshiyuki: See--
Saito, Wataru; Saito, Yasunobu; Fujimoto, Hidetoshi; Yoshioka, Akira; Ohno, Tetsuya; and Naka, Toshiyuki 08581301 Cl. 257-195.
Nakada, Katsuyoshi; Nakano, Tomoyuki; Hasegawa, Junichi; and Watanabe, Koji, to Panasonic Corporation Discharge lamp lighting apparatus 08581510 Cl. 315-291.
Nakada, Naohisa; Tani, Akira; Uemura, Yuiko; Takahashi, Masashi; and Nonaka, Osamu, to Olympus Imaging Corp. Imaging device, image composition and display device, and image composition method 08582918 Cl. 382-282.
Nakada, Tsuyoshi: See--
Teramoto, Kohei; Kimura, Masaru; Nakada, Tsuyoshi; and Saito, Fuminori 08583717 Cl. 708-320.
Nakadate, Kazuhiko: See--
Kawasaki, Atsuko; Hagiwara, Kenichiro; Inoue, Ikuko; Akiyama, Kazutaka; Sakai, Itsuko; Matsuo, Mie; Sekiguchi, Masahiro; Koseki, Yoshiteru; Neko, Hiroki; Tozuka, Koushi; Nakadate, Kazuhiko; and Inoue, Takuto 08580652 Cl. 438-435.
Nakade, Yusuke; and Itazu, Naoki, to Toyota Jidosha Kabushiki Kaisha Shift-by-wire gearshift control apparatus 08579763 Cl. 477-126.
Nakae, Kazuaki; to KYOCERA Corporation Mobile terminal device 08583095 Cl. 455-415.
Nakagaki, Ryo: See--
Kurihara, Masaki; Honda, Toshifumi; and Nakagaki, Ryo 08581976 Cl. 348-126.
Nakagata, Shohei; Kuraki, Kensuke; Takahashi, Jun; and Anan, Taizo, to Fujitsu Limited Digital watermark embedding device, computer-readable recording medium, and digital watermark detecting device and computer-readable recording medium 08582900 Cl. 382-232.
Nakagawa, Hiroki: See--
Chiba, Takashi; Kimura, Toru; Utaka, Tomohiro; Nakagawa, Hiroki; Sakakibara, Hirokazu; and Dougauchi, Hiroshi 08580482 Cl. 430-270.1.
Nakagawa, Kazuyuki; Baba, Shinji; Yamada, Satoshi; and Karashima, Takashi, to Renesas Electronics Corporation Method of manufacturing semiconductor device 08580620 Cl. 438-121.
Nakagawa, Kenji: See--
Sakaguchi, Kiyofumi; Yonehara, Takao; Kawase, Nobuo; and Nakagawa, Kenji 08580610 Cl. 438-108.
Nakagawa, Masami: See--
Koike, Kunihiko; Nakagawa, Masami; and Furuzono, Tsutomu 08580347 Cl. 427-323.
Nakagawa, Mitsuru: See--
Sugimoto, Keiichi; and Nakagawa, Mitsuru 08582308 Cl. 361-737.
Nakagawa, Ryusuke: See--
Shiozaki, Masao; Tashiro, Takuya; Mori, Kenji; Nakagawa, Ryusuke; Watarai, Hiroshi; and Taniguchi, Masaru 08580751 Cl. 514-25.
Nakagawa, Tomonori: See--
Bando, Takuji; Aoki, Satoshi; Kawasaki, Junichi; Ishigami, Makoto; Taniguchi, Youichi; Yabuuchi, Tsuyoshi; Fujimoto, Kiyoshi; Nishioka, Yoshihiro; Kobayashi, Noriyuki; Fujimura, Tsutomu; Takahashi, Masanori; Abe, Kaoru; Nakagawa, Tomonori; Shinhama, Koichi; Utsumi, Naoto; Tominaga, Michiaki; Ooi, Yoshihiro; Yamada, Shohei; and Tomikawa, Kenji 08580796 Cl. 514-253.07.
Nakagawa, Yasuko: See--
Ono, Yuichi; Nakagawa, Yasuko; and Nakatani, Tomoya 08580523 Cl. 435-7.1.
Nakagawa, Yoshiyuki: See--
Takasaka, Daisuke; Tamura, Tetsuya; Nakatani, Masaki; Ichinohe, Katsuo; Ueshima, Rikiya; Kobayashi, Tomohiro; Nakagawa, Yoshiyuki; and Mizuta, Yasuhide 08584153 Cl. 720-706.
Nakahara, Kiyoshi; Hashimoto, Nobuyuki; and Seki, Toshimasa, to Titan Kogyo Kabushiki Kaisha Titanium oxide-based compound for electrode and lithium secondary battery using the same 08580433 Cl. 429-218.1.
Nakahara, Shinji: See--
Hirayama, Seiko; Kobayashi, Keita; Ishii, Junya; Wada, Mizuho; and Nakahara, Shinji 08580148 Cl. 252-301.4R.
Nakahira, Toshiaki; and Himuro, Keiji, to Ricoh Company, Ltd. Lens unit, camera body, and camera device which determines whether the accumulated exposure time is above a value 08582021 Cl. 348-362.
Nakai, Tatsuo: See--
Morino, Harumi; Nakai, Tatsuo; and Sato, Junkei 08583999 Cl. 714-807.
Nakai, Toru; Amano, Tetsuo; and Takasaki, Yoshinori, to Ibiden Co., Ltd. Wiring board and method for manufacturing the same 08581104 Cl. 174-255.
Nakai, Tsukasa: See--
Hirai, Takahiro; Nakai, Tsukasa; Kubo, Kohichi; Kamata, Chikayoshi; Tsukamoto, Takayuki; and Aoki, Shinya 08581424 Cl. 257-797.
Nakaishi, Hidenori; and Itsuki, Yoshimasa, to Fujitsu Semiconductor Limited Encoding device and encoding method and decoding device and decoding method 08582649 Cl. 375-240.12.
Nakaishi, Yoshiaki; to Oki Data Corporation Image forming apparatus 08583026 Cl. 399-401.
Nakajima, Kenji: See--
Tanaka, Hiroshi; Nakajima, Kenji; Minagawa, Akihiro; Takebe, Hiroaki; and Fujimoto, Katsuhito 08582888 Cl. 382-182.
Nakajima, Ryusuke; to Canon Kabushiki Kaisha Shape measuring apparatus and shape measuring method 08578619 Cl. 33-503.
Nakajima, Yasushi: See--
Yaguchi, Tatsuya; Kushibiki, Keiko; Nakajima, Yasushi; Ibuka, Shigeo; and Ohara, Kenji 08580452 Cl. 429-456.
Nakajima, Yoshio: See--
Iritani, Hinako; Konno, Yuji; Hamasaki, Yuji; Yazawa, Takeshi; Seki, Satoshi; and Nakajima, Yoshio 08579401 Cl. 347-15.
Nakakita, Satoru: See--
Asada, Tetsuo; and Nakakita, Satoru 08579431 Cl. 347-104.
Nakakubo, Hirofumi; Nakamura, Takio; Kabasawa, Katsunori; and Yanagisawa, Tetsuya, to O-M Ltd. Wheel lathe 08578824 Cl. 82-104.
Nakakubo, Toru; Eguchi, Ken; and Watanabe, Mitsuhiro, to Canon Kabushiki Kaisha Fuel cell system with a cell unit and fuel tank unit in a housing and electronic device 08580458 Cl. 429-512.
Nakamae, Kazuo: See--
Kaneuchi, Yasuomi; Kakui, Motoki; Nakamae, Kazuo; and Tamaoki, Shinobu 08581949 Cl. 347-224.
Nakamura, Akira: See--
Suzuki, Hirotaka; Nakamura, Akira; Yoshigahara, Takayuki; Sabe, Kohtaro; and Fujita, Masahiro 08582887 Cl. 382-181.
Nakamura, Hajime; Hiehata, Yasuhiko; and Koto, Hideyuki, to KDDI Corporation Wireless node 08582435 Cl. 370-235.
Nakamura, Hideyoshi; Iwamoto, Atsushi; Kosaka, Koji; and Mizuhara, Susumu, to OMRON Corporation Photoelectric sensor and method for aiding checking of threshold 08583404 Cl. 702-176.
Nakamura, Hisanori: See--
Washizu, Shinichi; Nakamura, Hisanori; Kato, Shinji; and Otake, Tomoyuki 08581467 Cl. 310-208.
Nakamura, Keisuke: See--
Nagase, Kenji; Sawada, Yoshihiro; Hiratsuka, Yoshiaki; Nakao, Tomoyuki; and Nakamura, Keisuke 08584076 Cl. 716-137.
Nakamura, Kenichi: See--
Saito, Akinori; Nakamura, Kenichi; Sakai, Masaki; and Imai, Akira 08584040 Cl. 715-810.
Nakamura, Kenji: See--
Tada, Kaoru; Hanashima, Toru; Kondo, Kazuyoshi; Tanaka, Kimihiro; Nakamura, Kenji; Shiga, Yuuki; Furuichi, Yuusuke; and Ohi, Ryouhei 08582999 Cl. 399-90.
Nakamura, Koji; Oka, Toshio; Kobayashi, Hirokazu; and Senga, Satoshi, to Panasonic Corporation Wireless communication device and access point connection method 08582543 Cl. 370-338.
Nakamura, Kunihiko: See--
Yamada, Eiji; Ishibashi, Kengo; Takahashi, Takayuki; Ohkubo, Hiroshi; Ogawa, Masayuki; and Nakamura, Kunihiko 08579167 Cl. 224-42.23.
Nakamura, Masahiko; to Shinko Electric Industries Co., Ltd. Method for manufacturing wiring substrate 08580611 Cl. 438-108.
Nakamura, Mitsuhiro: See--
Okumura, Yasushi; Yoneda, Naofumi; Morisawa, Rui; and Nakamura, Mitsuhiro 08581859 Cl. 345-173.
Nakamura, Ryousuke; and Inagaki, Shigeyoshi, to Yamaha Hatsudoki Kabushiki Kaisha Rotation angle detection device 08581576 Cl. 324-207.25.
Nakamura, Shigenobu; to Kyocera Corporation Multi-layer piezoelectric element, and injection device and fuel injection system using the same 08578911 Cl. 123-490.
Nakamura, Takashi; to SRI Sports Limited Golf club head and method for manufacturing the same 08579723 Cl. 473-331.
Nakamura, Takatoshi: See--
Iriya, Shinichi; Kohno, Tetsuya; Nakamura, Takatoshi; and Sakata, Junichiro 08584014 Cl. 715-716.
Nakamura, Takeaki: See--
Miyamoto, Shinichi; Kameya, Takayuki; Watanabe, Katsushi; Matsumoto, Kazutaka; and Nakamura, Takeaki 08581971 Cl. 348-65.
Nakamura, Takehiro: See--
Iwamura, Mikio; and Nakamura, Takehiro 08583113 Cl. 455-434.
Usuda, Masafumi; Umesh, Anil; and Nakamura, Takehiro 08582477 Cl. 370-278.
Nakamura, Takio: See--
Nakakubo, Hirofumi; Nakamura, Takio; Kabasawa, Katsunori; and Yanagisawa, Tetsuya 08578824 Cl. 82-104.
Nakamura, Tetsuya: See--
Katsuno, Motonari; Takase, Masayuki; and Nakamura, Tetsuya 08581313 Cl. 257-292.
Nakamura, Tsuyoshi: See--
Kanehama, Mitsuhiko; Sato, Kensuke; Okano, Yasuo; Azuma, Hiroyuki; and Nakamura, Tsuyoshi 08583332 Cl. 701-50.
Nakamuta, Hironori: See--
Tadokoro, Chiharu; Ito, Yasutaka; Hattori, Hitoshi; Takahashi, Ryoichi; Yonezawa, Tetsuya; and Nakamuta, Hironori 08582722 Cl. 378-130.
Nakanishi, Eiichi; to Nakanishi Inc. Dental handpiece 08579629 Cl. 433-115.
Nakanishi, Hideyuki: See--
Onishi, Toshiki; Nakanishi, Hideyuki; Kobayashi, Takahiro; Umeda, Yoshio; Yamamura, Akihiro; and Hamada, Seiji 08581941 Cl. 345-690.
Nakanishi Inc.: See--
Nakanishi, Eiichi 08579629 Cl. 433-115.
Nakanishi, Kuniyuki: See--
Isobe, Tsutomu; Eshita, Yoshiyuki; Kato, Kazuhiko; Wakasa, Masanobu; Manago, Kenji; Nakanishi, Kuniyuki; and Tanji, Noriyuki 08580234 Cl. 424-57.
Nakanishi, Makoto; to Fujitsu Limited Method and apparatus for arithmetic operation by simultaneous linear equations of sparse symmetric positive definite matrix 08583719 Cl. 708-446.
Nakanishi, Ryota; Sumi, Chiaki; and Ito, Koji, to Aisin Seiki Kabushiki Kaisha Storage unit for occupant detection system 08582370 Cl. 365-185.24.
Nakano, Jun: See--
Nakatsuji, Hiroomi; and Nakano, Jun 08582997 Cl. 399-72.
Nakano, Keisuke: See--
Ohta, Tameharu; Shinoda, Takeshi; Ishii, Itaru; and Nakano, Keisuke 08578774 Cl. 73-493.
Nakano, Masayuki: See--
Oshika, Yoshikazu; and Nakano, Masayuki 08581106 Cl. 174-257.
Nakano, Takahiro; Nemoto, Jun; and Iwasaki, Masaaki, to Hitachi, Ltd. Storage subsystem and its control method 08583882 Cl. 711-161.
Nakano, Tomio: See--
Suga, Tomoharu; and Nakano, Tomio 08580305 Cl. 424-476.
Nakano, Tomonori; Kawasaki, Takeshi; Hirose, Kotoko; and Ito, Hiroyuki, to Hitachi High-Technologies Corporation Charged particle beam apparatus and geometrical aberration measurement method therefor 08581190 Cl. 250-310.
Nakano, Tomoyuki: See--
Nakada, Katsuyoshi; Nakano, Tomoyuki; Hasegawa, Junichi; and Watanabe, Koji 08581510 Cl. 315-291.
Nakano, Toshio: See--
Sanada, Akemi; Nakano, Toshio; Iwasaki, Hidehiko; Sato, Masahiko; Muraoka, Kenji; Takamoto, Kenichi; and Kobayashi, Masaaki 08583877 Cl. 711-152.
Nakano, Yoshihiko: See--
Suenaga, Seiichi; Yonetsu, Maki; Tomimatsu, Norihiro; Oozu, Hideyuki; Goto, Yasuhiro; Nakano, Yoshihiko; and Onodera, Shinichi 08580462 Cl. 429-532.
Nakao, Masayuki: See--
Llinas, Rodolfo R.; Watanabe, Hirobumi; Sugimori, Mutsuyuki; and Nakao, Masayuki 08583261 Cl. 607-137.
Nakao, Tomoyuki: See--
Nagase, Kenji; Sawada, Yoshihiro; Hiratsuka, Yoshiaki; Nakao, Tomoyuki; and Nakamura, Keisuke 08584076 Cl. 716-137.
Nakasaka, Akira; and Oohama, Kenichi, to Denso Corporation Power conversion apparatus 08582291 Cl. 361-679.47.
Nakasato, Yuki; to Kyocera Corporation Communication method and terminal apparatus using the same 08582537 Cl. 370-333.
Nakashima, Kazuhiro: See--
Kojima, Masahito; Nakashima, Kazuhiro; and Kumazaki, Takeshi 08581699 Cl. 340-8.1.
Nakashima, Kousuke; to Canon Kabushiki Kaisha Information processing apparatus, method of controlling thereof, and computer-readable storage medium storing program therefor 08583559 Cl. 705-59.
Nakashima, Tetsuya: See--
Endo, Jun; Nakashima, Tetsuya; and Takenaka, Atsuyoshi 08580411 Cl. 428-846.9.
Nakashima, Yuki: See--
Minoura, Minoru; Nakashima, Yuki; Yamada, Kenichi; Oota, Nobuharu; and Kojima, Shimpei 08579668 Cl. 440-41.
Nakata, Munehiro: See--
Kitagawa, Hiroshi; Nakata, Munehiro; Takayama, Daisuke; and Azuma, Tatsuya 08580385 Cl. 428-411.1.
Nakata, Takeshi; to NEC Corporation Signal light monitoring apparatus and signal light monitoring method 08582093 Cl. 356-225.
Nakata, Yoshihiro: See--
Kobayashi, Yasushi; Nakata, Yoshihiro; and Ozaki, Shirou 08580907 Cl. 528-34.
Nakatani, Masaki: See--
Takasaka, Daisuke; Tamura, Tetsuya; Nakatani, Masaki; Ichinohe, Katsuo; Ueshima, Rikiya; Kobayashi, Tomohiro; Nakagawa, Yoshiyuki; and Mizuta, Yasuhide 08584153 Cl. 720-706.
Nakatani, Seiichi: See--
Suzuki, Takeshi; Hotehama, Kenichi; Nakatani, Seiichi; Hirano, Koichi; and Ogawa, Tatsuo 08581247 Cl. 257-43.
Nakatani, Tomoya: See--
Ono, Yuichi; Nakagawa, Yasuko; and Nakatani, Tomoya 08580523 Cl. 435-7.1.
Nakatsuji, Hiroomi; and Nakano, Jun, to Kyocera Document Solutions Inc. Image forming apparatus 08582997 Cl. 399-72.
Nakayama, Eiji: See--
Ninagawa, Takayasu; and Nakayama, Eiji 08582495 Cl. 370-315.
Nakayama, Naoko; to Hitachi Medical Corporation Medical image processing device and method 08582844 Cl. 382-128.
Nakayama, Satoshi: See--
Shibayama, Masaki; Ishihara, Hideki; Gohda, Keigo; Nakayama, Satoshi; and Kiniwa, Tadashi 08583588 Cl. 706-54.
Nakayama, Tomonari: See--
Makino, Kenji; Nakayama, Tomonari; Abe, Keiko; and Kakegawa, Norishige 08580026 Cl. 106-287.17.
Nakayama, Tooru: See--
Yamaguchi, Masaho; Nishida, Yasutaka; Yamada, Mitsunobu; Nakayama, Tooru; and Togashi, Ryouichi 08583322 Cl. 701-36.
Nakazawa, Chiharu: See--
Koizumi, Toshihiro; Nakazawa, Chiharu; and Maruo, Ryohei 08579616 Cl. 418-126.
Nakazono, Keisuke; and Ueno, Akira, to Olympus Corporation Data processing apparatus and image processing apparatus 08581913 Cl. 345-502.
Nakhjiri, Madjid F.: See--
Upp, Steven D.; Medvinsky, Alexander; and Nakhjiri, Madjid F. 08584214 Cl. 726-6.
Nalla, Amar; Avadhanam, Srikanth; and Plancarte, Gustavo, to Microsoft Corporation Server session management application program interface and schema 08583790 Cl. 709-224.
Nalla, Ravi K.; Manusharow, Mathew J.; and Malatkar, Pramod, to Intel Corporation Methods of forming fully embedded bumpless build-up layer packages and structures formed thereby 08580616 Cl. 438-113.
Nallakrishnan, Ravi Safety knife with curved guard 08578613 Cl. 30-151.
Nam, Eun Joo: See--
Kang, Dong Wook; Lee, Jee Woo; Kim, Young Ho; Kim, Hee; Ha, Hee Jin; Nam, Eun Joo; and Joung, Chan Mi 08580848 Cl. 514-469.
Nam, Hui: See--
Kim, Beom-Shik; Nam, Hui; and Park, Chan-Young 08582062 Cl. 349-122.
Nam, Hyoung Sik; to Samsung Display Co., Ltd. Data driver, display apparatus and driving method thereof 08581895 Cl. 345-211.
Nam, Jung-Gyu; Mun, Jin-Soo; and Park, Sang-Cheol, to Samsung SDI Co., Ltd. Tandem solar cell and method of manufacturing same 08581092 Cl. 136-255.
Nam, KyungTae; and Baek, Ingyu, to Samsung Electronics Co., Ltd. Resistance memory devices and methods of forming the same 08581364 Cl. 257-536.
Namba, Michihiko; Matsuyama, Akihiko; Morohoshi, Naoya; Ohshima, Tohru; Koyano, Masayuki; Gotoh, Akihiko; and Nagai, Kiyofumi, to Ricoh Company, Ltd. Ink for inkjet recording, ink set for inkjet recording, ink media set for inkjet recording, ink cartridge, inkjet recording method, and inkjet recording apparatus 08580159 Cl. 252-521.6.
Namba, Toshiyuki: See--
Fujii, Daigo; Namba, Toshiyuki; Sekiyama, Hiroaki; and Okamoto, Keisuke 08583661 Cl. 707-749.
Namdev, Nivedita: See--
Liu, Yanbin; Namdev, Nivedita; Palma, Rocio; Tandon, Manish; Wang, Jianqiang; and Wu, Hui 08580803 Cl. 514-265.1.
Nammoonnoy, Jintana: See--
Remcho, Vincent Thomas; Nammoonnoy, Jintana; and Koesdjojo, Myra 08580161 Cl. 252-586.
Nan Ya Plastics Corporation: See--
Fung, Dein-Run; Liao, Te-Chao; and Chen, Hao-Sheng 08580879 Cl. 524-404.
Nanavati, Sharvil: See--
Ho, Casey Kwok Ching; and Nanavati, Sharvil 08581844 Cl. 345-158.
Nanda, Mangala Gowri: See--
Dhoolia, Pankaj; Nanda, Mangala Gowri; Saha, Diptikalyan; and Venkata, Krishna Nandivada 08583965 Cl. 714-38.1.
Nanda, Sanjiv: See--
Ketchum, John W.; Walton, Jay Rodney; and Nanda, Sanjiv 08582430 Cl. 370-230.
Nangia, Vijay: See--
Love, Robert T; Kuchibhotla, Ravi; Nangia, Vijay; Nimbalker, Ajit; and Stewart, Kenneth A 08582538 Cl. 370-335.
Nango, Takahiro: See--
Sugita, Takami; Moro, Hiroyuki; and Nango, Takahiro 08583968 Cl. 714-54.
Nanno, Tomoyuki; Riley, Michael; and Ueda, Gaku, to Google Inc. Keywords associated with document categories 08583635 Cl. 707-723.
NanoCarbons LLC: See--
Istvan, Rudyard 08580418 Cl. 429-129.
Nanotek Instruments, Inc.: See--
Zhamu, Aruna; Jang, Bor Z.; and Shi, Jinjun 08580432 Cl. 429-212.
Nant Holdings IP, LLC: See--
Boncyk, Wayne C.; and Cohen, Ronald H. 08582817 Cl. 382-103.
Desai, Neil P.; Soon-Shiong, Patrick; Tao, Chunlin; and Wang, Qinwei 08580786 Cl. 514-245.
Nantero Inc.: See--
Bertin, Claude L.; Guo, Frank; Rueckes, Thomas; Konsek, Steven L.; Meinhold, Mitchell; Strasburg, Max; Sivarajan, Ramesh; and Huang, X. M. Henry 08580586 Cl. 438-10.
Nanya Technology Corp.: See--
Busch, Brett; Damarla, Gowri; Jindal, Anurag; Ho, Chia-Yen; and Tran, Thy 08580690 Cl. 438-692.
Nanyang Technological University: See--
Li, Chang Ming; Li, Jun; Ong, Beng; and Fang, Qin 08581238 Cl. 257-40.
Napo Enterprises, LLC: See--
Svendsen, Hugh 08583791 Cl. 709-224.
Napoles, Adrian: See--
Meitzler, William H.; and Napoles, Adrian 08583193 Cl. 455-575.1.
Napp, Matthias: See--
Hook, David; Riss, Bernhard; Kaufmann, Daniel; Napp, Matthias; Bappert, Erhard; Polleux, Philippe; Medlock, Jonathan; and Zanotti-Gerosa, Antonio 08580974 Cl. 548-550.
Napra Co., Ltd.: See--
Sekine, Shigenobu; Sekine, Yurina; and Kuwana, Yoshiharu 08580581 Cl. 438-3.
Narahashi, Shoichi: See--
Kawai, Kunihiro; Okazaki, Hiroshi; and Narahashi, Shoichi 08581677 Cl. 333-205.
Narasimha, Maithili; Nellikar, Suraj; and Sardar, Srinivas, to Cisco Technology, Inc. System and method for securing distributed exporting models in a network environment 08584215 Cl. 726-6.
Narasimhan, Srinivasan; to McAfee, Inc. Probe election in failover configuration 08583792 Cl. 709-224.
Narayan, Pramodh; Terry, Matthew A.; Tilt, IV, Leroy W.; and Trevathan, Matthew B., to International Business Machines Corporation System and method of processing content 08583697 Cl. 707-802.
Narayanan, Ram Gopal Lakshmi: See--
Kotamarthi, Padmajabala; and Narayanan, Ram Gopal Lakshmi 08584118 Cl. 717-174.
Narayanan, Raman; Vishnumurty, Rajendra; Songco, Russell; and Liu, Ming, to Microsoft Corporation Displaying feed data 08584021 Cl. 715-751.
Narayanan, Shridhar: See--
Balasubramanian, Gopalan; Narayanan, Sukunath; Sharma, Ganapavarapu Veera Raghava; Andiappan, Lavanya; Narayanan, Shridhar; Saxena, Sanjeev; Rajagopal, Sridharan; Vishwakarma, Santosh Lolaknath; and Thirunavukkarasu, Saravanan 08580795 Cl. 514-252.19.
Narayanan, Sukunath: See--
Balasubramanian, Gopalan; Narayanan, Sukunath; Sharma, Ganapavarapu Veera Raghava; Andiappan, Lavanya; Narayanan, Shridhar; Saxena, Sanjeev; Rajagopal, Sridharan; Vishwakarma, Santosh Lolaknath; and Thirunavukkarasu, Saravanan 08580795 Cl. 514-252.19.
Nardella, Alessandro: See--
Massetti, Felicia; D'Abbieri, Michelangelo; and Nardella, Alessandro 08580106 Cl. 208-179.
Narendar, Yeshwanth: See--
Mahoney, F. Michael; Narendar, Yeshwanth; and Huang, Hansong 08580461 Cl. 429-528.
Naresh, Rakshith; Viradiya, Jayesh; and Kumar, Sanjeev, to Adobe Systems Incorporated Methods and system for proxy component to perform plurality of operations for applying to an object 08584142 Cl. 719-316.
Nariai, Junryo: See--
Tsukimori, Kazuyuki; Nariai, Junryo; Inuyama, Tsutomu; and Mizuno, Shinji 08580892 Cl. 525-191.
Narisawa, Fumio: See--
Yoshimura, Kentaro; Narisawa, Fumio; Atarashi, Yoshitaka; and Sasaki, Hiroto 08584086 Cl. 717-120.
Narita, Tomoya: See--
Yamamoto, Kazuyuki; Narita, Tomoya; Miyazaki, Reiko; and Koga, Yasuyuki 08581869 Cl. 345-173.
Narizuka, Satoru: See--
Hagiwara, Yuji; Nagamori, Masashi; Fujiwara, Masaki; Jodry, Jonathan Joachim; and Narizuka, Satoru 08581009 Cl. 568-842.
Nagamori, Masashi; Narizuka, Satoru; Inoue, Susumu; and Kume, Takashi 08580486 Cl. 430-921.
Narmo, Jon A.; to Norsk Glassgjenvinning AS Vehicle arresting bed 08579542 Cl. 404-71.
Naruse, Takumi: See--
Kawano, Hiroshi; Yamaguchi, Shuichiro; Naruse, Takumi; and Yamauchi, Toshihiro 08582312 Cl. 361-760.
Narushima, Yasuhito; Ogawa, Fukuo; Kawazoe, Shinichi; and Kubota, Toshimichi, to Sumco Techxiv Corporation Method for manufacturing single crystal 08580032 Cl. 117-74.
Nasevicius, Aidas: See--
Blake, Alan; Crockett, Richard; Essner, Jeffrey; Hackett, Perry; and Nasevicius, Aidas 08581025 Cl. 800-20.
Blake, Alan; Crockett, Richard; and Nasevicius, Aidas 08581023 Cl. 800-20.
Blake, Alan; Crockett, Richard; and Nasevicius, Aidas 08581024 Cl. 800-20.
Nashiki, Tomotake: See--
Haishi, Motoki; Nashiki, Tomotake; Noguchi, Tomonori; and Asahara, Yoshifumi 08580088 Cl. 204-192.29.
Naskali, Matti Juhani; and Paananen, Heikki Sakari, to Nokia Corporation Method and apparatus for an electrical interface 08580415 Cl. 429-65.
Nassor, Eric; and Renout, Karine, to Canon Research Centre France Method and device for creating a video sequence representative of a digital video sequence and associated methods and devices for transmitting and receiving video data 08582664 Cl. 375-240.26.
Natali, Gianfranco; to Faist Ltd(Holdings) Method for calibrating pneumatic actuators and calibrated actuator obtainable with this method 08578712 Cl. 60-602.
Natan, Yehudit: See--
Arav, Amir; Natan, Yehudit; Yavin, Saar; Meir, Uri; and Damari, Udi 08580487 Cl. 435-1.2.
Natanzon, Assaf; to EMC Corporation Energy efficient sync and async replication 08583885 Cl. 711-162.
Natarajan, Arunkumar; McCloskey, Patrick Joseph; Boden, Eugene Pauling; Chan, Kwok Pong; and Kim, Evgenia Mikhailovna, to General Electric Company Reactants for optical data storage media and methods for use 08580463 Cl. 430-1.
Natarajan, Arunkumar; McCloskey, Patrick Joseph; Chan, Kwok Pong; Kim, Evgenia Mikhailovna; Colborn, Robert Edgar; and Boden, Eugene Pauling, to General Electric Company Reverse saturable absorbtion sensitizers for optical data storage media and methods for use 08580464 Cl. 430-1.
Natarajan, Rama: See--
Rahbar, Samuel; and Natarajan, Rama 08580854 Cl. 514-563.
Natchetoi, Yuri; Wu, Huaigu; Babin, Gilbert; and Dagtas, Serhan, to SAP AG Semantic-based lossy compression 08583829 Cl. 709-247.
Nathan, Arokia; and Chaji, Gholamreza, to Ignis Innovation Inc. OLED luminance degradation compensation 08581809 Cl. 345-78.
Nathan, Guy; and Dion, Dominique, to TouchTunes Music Corporation Digital downloading jukebox system with user-tailored music management, communications, and other tools 08584175 Cl. 725-61.
National Applied Research Laboratories: See--
Peng, Tz-Shiuan; Liu, Ren-Young; and Wang, Lon 08578739 Cl. 65-425.
National Central University: See--
Tsai, Jang-Zern; Kuo, Cheng-Deng; Chuang, Ssu-Hsien; and Tsai, Ping-Hsiang 08583207 Cl. 600-407.
Wu, Jiunn-Chi; Tung, Pi-Cheng; and You, Yan-Bin 08581164 Cl. 250-203.4.
National Chiao Tung University: See--
Chen, Tsung-Lin; Chang, Edward Yi; Chieng, Wei-Hua; Cheng, Stone; Jeng, Shyr-Long; and Chang, Che-Wei 08581638 Cl. 327-108.
Chuang, Ching-Te; Jou, Shyh-Jye; Lin, Geng-Cing; Wang, Shao-Cheng; Lin, Yi-Wei; Tsai, Ming-Chien; Shih, Wei-Chiang; Lien, Nan-Chun; Lee, Kuen-Di; and Chu, Jyun-Kai 08582378 Cl. 365-201.
Huang, Chung-Jung; Sung, Chih-Sheng; and Lee, Ta-Sung 08582695 Cl. 375-341.
National Formosa University: See--
Lin, Bor-Jeng; Tsai, Mi-Ching; and Huang, Cheng-Chi 08581461 Cl. 310-83.
National Institute of Advanced Industrial Science and Technology: See--
Iwaki, Sunao; Harada, Nobuyoshi; and Sutani, Kouichi 08579441 Cl. 351-239.
National Institute of Radiological Sciences: See--
Yamaya, Taiga; Murayama, Hideo; Minohara, Shinichi; Inaniwa, Taku; Furukawa, Takuji; and Mori, Shinichirou 08581196 Cl. 250-363.03.
National Institutes of Natural Sciences: See--
Kiuchi, Hitoshi 08582977 Cl. 398-162.
National Instruments Corporation: See--
Chandhoke, Sundeep; Mohrmann, Lee E.; Ullrich, Adam C.; and Greenstreet, Rodney D. 08583957 Cl. 713-401.
Conway, Craig M. 08582706 Cl. 375-354.
National Semiconductor Corporation: See--
Zuckerman, Lawrence H.; Maida, Michael X.; Monticelli, Dennis M.; Wieser, James B.; and Ramdani, Jamal 08581579 Cl. 324-239.
National Taipei University of Technology: See--
Huang, Shih-Chia; and Do, Ben-Hsiang 08582812 Cl. 382-103.
National Taiwan University: See--
Chou, Pi-Tai; Liu, Chien-Liang; and Chien, Yun-Chen 08580731 Cl. 514-5.9.
Lee, Chia-Yen; Lee, Si-Chen; Lee, Wan-Jou; Chang, Che-Wei; Chien, Yu-Chun; and Chen, Chung-Ming 08582852 Cl. 382-128.
Tzean, Shean-Shong; Shu, Po-Yao; and Tzean, Yuh 08580514 Cl. 435-6.15.
Wang, Yu-Ta; Hsu, Po-Kai; and Huang, Sheng-Lung 08582110 Cl. 356-497.
National Tsing Hua University: See--
Chi, Yun; Hsu, Chien-Wei; and Ho, Shu-Te 08580961 Cl. 546-2.
Jou, Jwo-Huei; Chen, Sun-Zen; Peng, Shiang-Hau; and Wu, Bo-Shian 08580604 Cl. 438-99.
Yang, Cheng-Wei; and Jou, Jwo-Huei 08581282 Cl. 257-98.
National University Corporation Chiba University: See--
Watanabe, Norihiko; and Oya, Yoshihiro 08581022 Cl. 800-18.
National University Corporation Kobe University: See--
Ogino, Chiaki; Tanaka, Tsutomu; Sasaki, Ryohei; and Kondo, Akihiko 08580312 Cl. 424-490.
National University Corporation Kyoto Institute of Technology: See--
Kobayashi, Kazutoshi; Furuta, Jun; and Onodera, Hidetoshi 08581652 Cl. 327-202.
National University Corporation Shizuoka University: See--
Kawahito, Shoji; Park, Jong-ho; Aoyama, Satoshi; and Isobe, Keigo 08581171 Cl. 250-214A.
National Yang Ming University: See--
Kuo, Bo-Jau; and Yang, Ching-Hsiu 08583399 Cl. 702-141.
Naturamed Ltd.: See--
Wiener, Harold; Gal, Avi; Oleinik, Irena; Paluy, Irena; Kvitnitsky, Emma; and Shapira, Tzvia 08580318 Cl. 424-725.
Nau, Dieter: See--
Bender, Klaus-Werner; and Nau, Dieter 08581858 Cl. 345-173.
Naumovitz, John: See--
Patel, Rajen M.; Wu, Shaofu; Bernius, Mark T.; Esseghir, Mohamed; McGee, Robert L.; Mazor, Michael H.; and Naumovitz, John 08581094 Cl. 136-259.
Navubothu, Swarna L.: See--
Zhong, Cheng; Navubothu, Swarna L.; Dang, Nam V.; and Kong, Xiaohua 08581647 Cl. 327-157.
Navubothu, Swarna L.; Zhong, Cheng; Dang, Nam V.; and Kong, Xiaohua, to QUALCOMM Incorporated Tuning voltage range extension circuit and method 08581667 Cl. 331-57.
Nayak, Chetan: See--
Freedman, Michael; Bonderson, Parsa; Nayak, Chetan; and Sarma, Sankar Das 08583903 Cl. 712-221.
Freedman, Michael; Nayak, Chetan; and Shtengel, Kirill 08581227 Cl. 257-9.
Nayar, Venu G.: See--
Belluomini, Wendy A.; Gill, Binny S.; Hafner, James L.; Hetzler, Steven R.; Nayar, Venu G.; Smith, Daniel F.; and Surugucchi, Krishnakumar Rao 08583868 Cl. 711-114.
Nayler, Oliver: See--
Bolli, Martin; Lehmann, David; Mathys, Boris; Mueller, Claus; Nayler, Oliver; Steiner, Beat; and Velker, Jörg 08580824 Cl. 514-340.
Nazarov, Erkinjon G.: See--
Miller, Raanan A.; Nazarov, Erkinjon G.; Vouros, Paul; and Levin, Daren 08581178 Cl. 250-282.
NCKU Research and Development Foundation: See--
Horng, Ray-Hua; and Lu, Yi-An 08581289 Cl. 257-98.
NcNeil-PPC, Inc.: See--
Swann, Jim; and Cummins, Peter 08580856 Cl. 514-570.
Neal, Greg; Casteel, Glynne; Hill, Ron; and Droste, Bruce, to Trueffect, Inc. First party advertisement serving 08583749 Cl. 709-206.
Neben, Kathleen; Skeen, Julie; and Johnson, Scott, to TriZetto Corporation System and method for implementing program compliance for health-based rewards 08583459 Cl. 705-4.
NEC Corporation: See--
Ahluwalia, Jagdeep Singh 08583131 Cl. 455-450.
Furukawa, Jun 08583932 Cl. 713-176.
Furukawa, Jun; and Sako, Kazue 08583925 Cl. 713-168.
Ishikawa, Kai; Akamine, Susumu; and Ando, Shinichi 08583435 Cl. 704-257.
Ishikawa, Yuichi; and Koide, Toshio 08583912 Cl. 713-151.
Kajitani, Hiroshi; and Miyamoto, Junichi 08583381 Cl. 702-39.
Kuroda, Nahoko; Hamabe, Kojirou; and Lee, Jinsock 08583163 Cl. 455-522.
Lee, Jinsock 08583118 Cl. 455-436.
Monden, Akira 08584000 Cl. 714-819.
Nakata, Takeshi 08582093 Cl. 356-225.
Ouchi, Akira 08581403 Cl. 257-738.
Sasaki, Shigero 08583698 Cl. 707-802.
Shimazaki, Mamoru 08582747 Cl. 379-211.01.
Takeuchi, Toshiki; and Igura, Hiroyuki 08583845 Cl. 710-240.
Yaguchi, Takahiro 08583388 Cl. 702-60.
Yamamoto, Hitoshi; and Miki, Kiyokazu 08583436 Cl. 704-257.
NEC Embedded Products, Ltd.: See--
Kawasaki, Toshimitsu; Tsuchiya, Manabu; and Kosugi, Tadashi 08582401 Cl. 369-30.48.
NEC Infrontia Corporation: See--
Shima, Masato 08584116 Cl. 717-174.
NEC Laboratories America, Inc.: See--
Cadambi, Srihari; Majumdar, Abhinandan; Becchi, Michela; Chakradhar, Srimat; and Graf, Hans Peter 08583896 Cl. 712-27.
Malon, Christopher; Miller, Matthew L.; and Cosatto, Eric 08582860 Cl. 382-133.
Yang, Ming; Zhu, Shenghuo; Lv, Fengjun; and Yu, Kai 08582807 Cl. 382-103.
Zhao, Yi; Roetteler, Martin; Xu, Lei; and Wang, Ting 08582769 Cl. 380-256.
Neckaraje, Sunil Kumar: See--
Fisher, Gerald; Nesse, Theodore A.; Murthy, P V S Sathyanarayana; Neckaraje, Sunil Kumar; and Thomanschefsky, Uwe 08581720 Cl. 340-517.
Ned, Alexander A.: See--
Kurtz, Anthony D.; Ned, Alexander A.; and VanDeWeert, Joseph R. 08578782 Cl. 73-721.
Nederlandse Organisatie voor toegepast-natuurwetenschappelijk Onderzoek TNO: See--
Volker, Arno Willem Frederik; and Basten, Thomas Geertruida Henricus 08583407 Cl. 703-6.
Need, Dwayne Richard; Mahadevan, Varsha; Furtwangler, Brandon C.; Valtchev, Tsvetomir V.; Carter, Benjamin Franklin; Dussud, Cedric Patrick; and Corby, Karen Elizabeth, to Microsoft Corporation Creating and using deltas to modify existing computer code 08584102 Cl. 717-136.
Neelakantan, Vijay A.; Olson, Bret M.; and Wittkopp, Scott H., to GM Global Technology Operations LLC Synchronizer actuation assembly 08578803 Cl. 74-337.5.
Neels, Alice Emily: See--
Ganapathi, Archana Sulochana; Neels, Alice Emily; Robichaud, Marc Vincent; Sorkin, Stephen Phillip; and Zhang, Steve Yu 08583631 Cl. 707-722.
Neemuchwala, Huzefa: See--
Gu, Kunlong; Hasegawa, Akira; and Neemuchwala, Huzefa 08582840 Cl. 382-128.
Negishi, Satoshi: See--
Suganuma, Tomomi; Hirose, Tadashiro; Suzuki, Junko; Arimoto, Shin; Maki, Hideaki; and Negishi, Satoshi 08580550 Cl. 435-198.
Negri, Daria: See--
Manassen, Amnon; Kandel, Daniel; Baruch, Moshe; Levinski, Vladimir; Sapiens, Noam; Seligson, Joel; Hill, Andy; Bachar, Ohad; Negri, Daria; and Zaharan, Ofer 08582114 Cl. 356-509.
Neill, Richard; and Khisti, Pradip, to CSC Holdings, LLC Virtual service delivery platform 08583767 Cl. 709-220.
Neilson, Douglas Gregg: See--
Boratav, Olus Naili; Gaylo, Keith Raymond; Kang, Kiat Chyai; Kocatulum, Bulent; Milillo, Steven Michael; and Neilson, Douglas Gregg 08578737 Cl. 65-128.
Nejman, Jan: See--
Vojtech, Josef; Hula, Miloslav; Radil, Jan; Karásek, Miroslav; Síma, Stanislav; Nejman, Jan; and Holub, Petr 08582967 Cl. 398-45.
Neko, Hiroki: See--
Kawasaki, Atsuko; Hagiwara, Kenichiro; Inoue, Ikuko; Akiyama, Kazutaka; Sakai, Itsuko; Matsuo, Mie; Sekiguchi, Masahiro; Koseki, Yoshiteru; Neko, Hiroki; Tozuka, Koushi; Nakadate, Kazuhiko; and Inoue, Takuto 08580652 Cl. 438-435.
Neksa, Petter: See--
Jakobsen, Arne; Neksa, Petter; Girotto, Sergio; Rekstad, Havard; and Skaugen, Geir 08578722 Cl. 62-77.
Nektar Therapeutics: See--
Bossard, Mary J.; Fang, Zhihao; Viegas, Tacey X.; Thompson, Stewart A.; and Kuo, Mei-chang 08580919 Cl. 530-308.
Nelinger, Eran: See--
Vainer, Vitaly; Sherman, Yahali; Lehmann, Doron; and Nelinger, Eran 08583678 Cl. 707-769.
Yassin, Ohad; Koren, Nir; Nelinger, Eran; and Saar, Asaf 08584079 Cl. 717-101.
Nellen, Marcel Johan Christiaan; to Inalfa Roof Systems Group B.V. Sunshade assembly and open roof construction provided therewith 08579366 Cl. 296-214.
Nellikar, Suraj: See--
Narasimha, Maithili; Nellikar, Suraj; and Sardar, Srinivas 08584215 Cl. 726-6.
Nelsestuen, Paul S.: See--
Barsness, Eric L.; Nelsestuen, Paul S.; and Santosuosso, John M. 08583608 Cl. 707-693.
Nelson, Daniel: See--
Fischetti, Vincent A.; Schuch, Raymond; and Nelson, Daniel 08580553 Cl. 435-212.
Nelson, Dwight E.: See--
Jensen, Steven L.; and Nelson, Dwight E. 08583254 Cl. 607-62.
Nelson, Eric: See--
Francello, Gene A.; Nelson, Eric; and Park, Helen K. 08578631 Cl. 36-61.
Nelson, Franklyn S.: See--
Huotari, Allen Joseph; Harrington, Kendra; Dattagupta, Siddhartha; Nelson, Franklyn S.; and Li, Chong Liang 08583771 Cl. 709-223.
Nelson, Jeffrey: See--
Sullivan, Timothy R.; and Nelson, Jeffrey 08579856 Cl. 604-118.
Nelson, Jr., George Rodney: See--
Proctor, Jr., James A.; and Nelson, Jr., George Rodney 08582552 Cl. 370-348.
Nelson, Karl E.; Georgeson, Gary E.; Rutherford, Paul S.; and McKenna, Mark, to Boeing Company, The Ultrasonic method to verify the interference fit of fasteners 08578778 Cl. 73-602.
Nelson, Kristoff: See--
Casey, II, Thomas V.; Nelson, Kristoff; and Quigley, Fergus 08579961 Cl. 623-1.28.
Nelson, Matthew; Treado, Patrick; and Gardner, Jr., Charles W, to ChemImage Corporation System and method for combined raman, SWIR and LIBS detection 08582089 Cl. 356-73.
Nelson-Melby, Eric: See--
Lundquist, Paul B.; Martin, Hector; Nelson-Melby, Eric; and Zhang, Jiamin (Jim) 08582612 Cl. 372-25.
Nelson, Paul E.; to Boeing Company, The Parallel configuration composite material fabricator and related methods 08578995 Cl. 156-433.
Nelson, Richard M.; Johnson, Gregory D.; Tassistro, Kevin; Jorgensen, Douglas C.; Vokey, Robert W.; and Perez, Eddie G., to Acushnet Company Wedge type golf club head 08579729 Cl. 473-350.
Nelwan, Stefan P.; and Scholz, Wolfgang, to Draeger Medical Systems, Inc. ECG data display method for rapid detection of myocardial ischemia 08583222 Cl. 600-523.
Nemade, Kishor Lalchand: See--
Schnallinger, Helmuth; Schnallinger, Christian; Kulkarni, Jayprakash Jagannath; and Nemade, Kishor Lalchand 08579334 Cl. 285-364.
Nemet, Yaron; Eshedkaner, Rotem; and Brand, Ephraim, to Varcode Ltd. Barcoded indicators for quality management 08579193 Cl. 235-383.
Nemeth, Edward A.: See--
Crawford, David W.; Nemeth, Edward A.; Crosby, Brian E.; and Beatty, Christopher L. 08578857 Cl. 104-83.
Nemethy, Stephen G.: See--
Khoury, James M.; Nagy, Charles; Nemethy, Stephen G.; and Ignatius, Mark J. 08578878 Cl. 118-668.
Nemoto, Jun: See--
Nakano, Takahiro; Nemoto, Jun; and Iwasaki, Masaaki 08583882 Cl. 711-161.
Nemoto, Masakazu; to Ricoh Company, Limited Image-formation control device, image-formation control method, and computer program product 08582128 Cl. 358-1.13.
Nemoto, Peter Allen: See--
Bartolozzi, Alessandra; Bosanac, Todd; Chen, Zhidong; De Lombaert, Stephane; Dines, Jonathon Alan; Huber, John D.; Liu, Weimin; Lo, Ho Yin; Loke, Pui Leng; Morwick, Tina Marie; Nemoto, Peter Allen; Olague, Alan; Riether, Doris; Tye, Heather; Wu, Lifen; and Zindell, Renee M. 08580829 Cl. 514-364.
Nemoto, Yuichi: See--
Goto, Terutaka; Kaneta, Hiroshi; Nemoto, Yuichi; and Akatsu, Mitsuhiro 08578777 Cl. 73-597.
Neovasc Inc.: See--
Lane, Randy Matthew; and Nyuli, Colin A. 08579964 Cl. 623-2.11.
Nepomniachtchi, Grigori; and DeBello, James, to Mitek Systems Mobile image quality assurance in mobile document image processing applications 08582862 Cl. 382-137.
Neri, Dario: See--
Pedretti, Marta; and Neri, Dario 08580267 Cl. 424-178.1.
Nering, Robert; Cohn, Simon; Cardinale, Michael; Fuchs, Richard P.; Daniel, Matthew David; Jarrett, Jeremy David; Thornton, Race Eric; and Griffin, Carl Edward, to Ethicon, Inc. Surgical fasteners, applicator instruments, and methods for deploying surgical fasteners 08579920 Cl. 606-143.
Nerok LLC: See--
Koren, George F 08578524 Cl. 4-494.
Nerviano Medical Sciences S.r.l.: See--
Casale, Elena; Casuscelli, Francesco; Dalvit, Claudio; Polucci, Paolo; and Zuccotto, Fabio 08580783 Cl. 514-233.2.
Nerviano Medical Services S.r.l.: See--
Scaburri, Angela; Pacciarini, Maria Adele; Ciomei, Marina; Laffranchi, Bernard; and Comis, Silvia 08580793 Cl. 514-252.16.
Ness, Mark A.: See--
Bullinger, Charles W.; Ness, Mark A.; Sarunac, Nenad; Levy, Edward K.; Weinstein, Richard S.; and James, Dennis R. 08579999 Cl. 44-626.
Nesse, Theodore A.: See--
Fisher, Gerald; Nesse, Theodore A.; Murthy, P V S Sathyanarayana; Neckaraje, Sunil Kumar; and Thomanschefsky, Uwe 08581720 Cl. 340-517.
Nestec S.A.: See--
Bernhardsgruetter, Raphael; Beausire, Cedric; and Scorrano, Lucio 08579166 Cl. 222-452.
Net Optics, Inc.: See--
Matityahu, Eldad; Shaw, Robert; Carpio, Dennis Angelo Ramirez; Lee, Dong Su; and Le, Ky Hong 08582472 Cl. 370-254.
NetApp, Inc.: See--
Edwards, John K.; Lewis, Blake H.; English, Robert M.; Hamilton, Eric; and Corbett, Peter F. 08583892 Cl. 711-203.
Patel, Manish D.; and Teterin, Boris 08583887 Cl. 711-163.
Radhakrishnan, Prashanth; and Singh, Vaibhav 08583867 Cl. 711-114.
Neth, Robert: See--
Tiffany, Todd S.; and Neth, Robert 08580043 Cl. 134-18.
NetLogic Microsystems, Inc.: See--
Argyres, Dimitri 08582338 Cl. 365-49.17.
NetScout Systems, Inc.: See--
Singhal, Anil K.; Kelley, Bruce A.; Nadkarni, Rajeev; Byrapuram, Narendra; Saraswati, Abhishek; and Singhal, Ashwani 08582454 Cl. 370-252.
Network Enhanced Telecom, LLP: See--
Gonzales, Amanda; Broquie, Stephan; Kendrick, Ryan; Converse, Bill; Wood, Steven; Thornton, Philip; and Ford, Andrew 08582739 Cl. 379-114.2.
Netzer, Oren; and Liverant, Alex, to Double Verify Inc. Automated monitoring and verification of internet based advertising 08583482 Cl. 705-14.4.
Neudorf, Blake; and Berglund, Zachary, to Highline Manufacturing Ltd Rotary mower with optional lower skin 08578692 Cl. 56-320.1.
Neuman, Darren: See--
Law, Patrick; Neuman, Darren; and Baer, David 08581915 Cl. 345-506.
Schoner, Brian; and Neuman, Darren 08581918 Cl. 345-534.
Neumann-Henneberg, Wolf Electrical plug connector having a contact element with inwardly and outwardly protruding knobs 08579653 Cl. 439-469.
Neumeyer, Frederick Charles; Landry, David Matthew; and Yancey, Gregory Charles, to Audiotoniq, Inc. Hearing aid and circuit for detecting a connector 08582791 Cl. 381-314.
Neuropace, Inc.: See--
Pless, Benjamin D; and John, Michael Sasha 08583239 Cl. 607-46.
Neurosciences Research Foundation, Inc.: See--
Fleischer, Jason G.; Szatmáry, Botond; Hutson, Donald B.; Moore, Douglas A.; Snook, James A.; Edelman, Gerald M.; and Krichmar, Jeffrey L. 08583286 Cl. 700-259.
Neveaux, David Electronic board game using reaction time 08579687 Cl. 463-10.
Nevill-Manning, Craig; Tan, Chade-Meng; Dyanik, Aynur; and Norvig, Peter, to Google Inc. Automatic generation of rewrite rules for URLs 08583808 Cl. 709-228.
New, Darell W.: See--
Adler, Richard J; Gilbrech, Joshua A.; New, Darell W.; and Geyer, Daniel T. 08578831 Cl. 89-1.13.
New Point Holdings Corp.: See--
Wang, Zhenyu; and Zhu, Ning 08583479 Cl. 705-14.17.
New Vent Designs, Inc.: See--
Brown, Craig E.; and Brown, Robert J. 08579130 Cl. 215-11.4.
New York University: See--
Llinas, Rodolfo R.; Watanabe, Hirobumi; Sugimori, Mutsuyuki; and Nakao, Masayuki 08583261 Cl. 607-137.
New Zealand Forest Research Institute Limited: See--
Franich, Robert Arthur; Gallagher, Sheryl Suzanne; and Kroese, Hendricus Wilhelmus 08578625 Cl. 34-367.
Newbeam Sweden AB: See--
Nyberg, Alexander; and Nylund, Per 08579002 Cl. 156-581.
Newby, Daniel Gary: See--
Dittmar, Gregory Paul; Amante, Joseph Michael; Cronk, Tony Ryan; and Newby, Daniel Gary 08580302 Cl. 424-472.
Newell, Michael E.: See--
Dinsmoor, David A.; Anderson, Joel A.; Michaels, Matthew J.; Denison, Timothy J.; and Newell, Michael E. 08583954 Cl. 713-340.
Newfrey LLC: See--
Makino, Takanori 08579566 Cl. 411-34.
Schmidt, Thomas; and Reindl, Johann 08578571 Cl. 24-536.
Wimmer, Karin; Albach, Jens; Seng, Hans-Peter; Gerlach, Wolfgang; Stau, Bastian; and Schmidt, Michael 08578568 Cl. 24-297.
Newgard, Christopher B.; Stephens, Samuel B.; and Schisler, Jonathan C., to Duke University Peptide therapy for hyperglycemia 08580732 Cl. 514-6.9.
Newman, Arthur M.; and Crow, Brandon, to Raytheon Company Approximation of an imaged object from edges detected from the underlying image 08582884 Cl. 382-173.
Newman, James Hansen: See--
Crane, William Mike; Oppenheimer, Paul Michael; Romano, Marcello; and Newman, James Hansen 08579535 Cl. 403-28.
Newman, Keith E.: See--
Fly, Gerald W.; Lai, Yeh-Hung; Rock, Jeffrey A.; Newman, Keith E.; Liu, Ping; Jacobsen, Alan J.; Carter, William B.; and Brewer, Peter D. 08580454 Cl. 429-483.
Newman, Robert A.: See--
Pyzik, Aleksander J.; Newman, Robert A.; Chartier, Mark A.; Wetzel, Amy M.; and Haney, Christopher N. 08580185 Cl. 264-643.
Nexans: See--
Koelblin, Christian; Stuhldreier, Thomas; Daenekas, Franz; and Hartley, Mark 08581102 Cl. 174-110PM.
Schmidt, Frank; Lallouet, Nicolas; Delplace, Sébastien; and Marzahn, Erik 08583202 Cl. 505-230.
Steinmeyer, Florian; and Krämer, Simon 08582256 Cl. 361-19.
Nexter Power Systems, Inc.: See--
Parigoris, Ronald J.; Gutschow, Wayne A.; and Hartman, Benjamin 08578659 Cl. 52-39.
Nexter Systems: See--
Duc, Christian; and Monchalin, André 08579268 Cl. 267-140.12.
Ng, Eric: See--
Mousseau, Gary Phillip; and Ng, Eric 08583729 Cl. 709-203.
Ng, Hendra: See--
Knapp, Brian; Elce, Edmund; Bell, Andrew; Burns, Cheryl; Kaiti, Sridevi; Kocher, Brian; Ng, Hendra; Patel, Yogesh; Sakamoto, Masanobu; Wu, Xiaoming; and Zhang, Linda 08580477 Cl. 430-270.1.
Ng, Jack Hon Wai; Goss, Jeffrey J.; Pereyra, Hebert W.; Truuvert, Kaarel; and Xue, Xun, to International Business Machines Corporation Dynamic configuration and self-tuning of inter-nodal communication resources in a database management system 08583756 Cl. 709-213.
Ng, Kin Man: See--
Zeng, Lingqi; Kou, Yu; and Ng, Kin Man 08583979 Cl. 714-752.
Ng, Sei Y.: See--
Delker, Jason R.; Hacking, Lars J.; Ng, Sei Y.; Stone, Jeffrey M.; and Syromiatnikov, Peter S. 08583091 Cl. 455-414.3.
Ngai, Amelia: See--
Bem, Branko; Babikian, Dikran; Riccomini, Robert A.; and Ngai, Amelia 08579157 Cl. 222-63.
Ngan, Mei: See--
Weerakoon, Ishan P.; Ngan, Mei; Iyer, Suresh K.; Kuthethoor, Giri; and Sesha, Prakash M. 08582491 Cl. 370-315.
NGK Insulators, Ltd.: See--
Hiramatsu, Takuya; and Sato, Fumiharu 08580009 Cl. 55-523.
NGK Spark Plug Co., Ltd: See--
Maeda, Shinnosuke; Suzuki, Tetsuo; Sugimoto, Atsuhiko; Ito, Tatsuya; Hando, Takuya; and Hirano, Satoshi 08581388 Cl. 257-700.
Yamada, Erina; and Sato, Hironori 08580066 Cl. 156-247.
Ngo, Chiu: See--
Singh, Harkirat; Hsu, Ju-Lan; Yong, Su Khiong; Na, Ilju; and Ngo, Chiu 08582456 Cl. 370-252.
Ngo, David: See--
Prahlad, Anand; Ngo, David; Zhou, Lixin; and May, Andreas 08583594 Cl. 707-609.
Nguyen, Albert: See--
Mudrick, Adam A.; Jayaraman, Siddharth; Nguyen, Albert; Gholmieh, Ralph A.; Gupta, Binita; Naik, Nagaraju; Gautam, Susheel K.; and Zeilingold, Daphna 08582455 Cl. 370-252.
Nguyen, Andrew: See--
Ramaswamy, Kartik; Hanawa, Hiroji; Collins, Kenneth S.; Wong, Lawrence; Banna, Samer; and Nguyen, Andrew 08578879 Cl. 118-723I.
Nguyen, Bao Quoc: See--
Wood, Robert Henderson; and Nguyen, Bao Quoc 08583907 Cl. 713-1.
Nguyen, Binh; Paulsen, Craig; Kinsley, Mike; and Goodman, John, to IGT Module for providing additional capabilities to a gaming machine 08579711 Cl. 463-43.
Nguyen, Chinh: See--
Rashed, Mahbub; Soss, Steven; Kye, Jongwook; Lin, Irene Y.; Gullette, James Benjamin; Nguyen, Chinh; Kim, Jeff; Tarabbia, Marc; Ma, Yuansheng; Deng, Yunfei; Augur, Rod; Rhee, Seung-Hyun; Johnson, Scott; Kengeri, Subramani; and Venkatesan, Suresh 08581348 Cl. 257-401.
Nguyen, Chung T.; to International Business Machines Corporation Information management using a custom identifier stored on an identification tag 08581702 Cl. 340-10.1.
Nguyen, Hanh Nho: See--
Cee, Victor J.; Deak, Holly L.; Du, Bingfan; Geuns-Meyer, Stephanie D.; Hodous, Brian L.; Nguyen, Hanh Nho; Olivieri, Philip R.; Patel, Vinod F.; Romero, Karina; and Schenkel, Laurie 08580966 Cl. 546-268.1.
Nguyen, Hao: See--
Oowada, Ken; Dong, Yingda; Hemink, Gerrit Jan; Mui, Man Lung; Nguyen, Hao; Lee, Seungpil; Park, Jong; and Zhang, Fanglin 08582381 Cl. 365-211.
Nguyen, Henry: See--
Kumar, Anil; Yoest, Rachael L.; Li, Chenguang; Jackson, Delwin S.; and Nguyen, Henry 08582192 Cl. 359-241.
Nguyen, Lynh; to International Business Machines Corporation Data source interface enhanced error recovery 08583796 Cl. 709-226.
Nguyen, Minh H.; Smith, Kelly K.; Ganta Papa Rao Bala, Kapil Rao; and Doerr, Alan B., to Hewlett-Packard Development Company, L.P. Drive carrier with pivoting handle 08582287 Cl. 361-679.37.
Nguyen, Philip D.; and Weaver, Jimmie D., to Halliburton Energy Services, Inc. Tackifying agent pre-coated particulates 08579028 Cl. 166-278.
Nguyen, Phu; and Freriks, Timothy A. Adjustable orthopedic device 08578634 Cl. 36-155.
Nguyen, Reno T.; Anderson, Scott; and Chappell, Ian, to Alltech Associates, Inc. Ultra-fast chromatography 08580935 Cl. 530-417.
Nguyen, Thanh X.: See--
Wang, Rongjun; Lou, Sally; Rasheed, Muhammad; Lei, Jianxin; Tang, Xianmin; Gandikota, Srinivas; Hanson, Ryan; Gung, Tza-Jing; Miller, Keith A.; and Nguyen, Thanh X. 08580094 Cl. 204-298.19.
NHK Spring Co., Ltd.: See--
Arai, Hajime 08582244 Cl. 360-245.9.
Hanya, Masao; and Kuchiwaki, Isamu 08582245 Cl. 360-245.9.
Kashima, Hideki 08580334 Cl. 427-100.
NHN Business Platform Corporation: See--
Kim, Young Wook; Woo, Chang Hee; Kim, Jong Soo; Park, Jung Jun; Yang, Seung Kwan; Oh, Jae Won; and Lee, Sang Hyun 08583819 Cl. 709-231.
NHN Corporation: See--
Park, Chong Mok; Seong, Seok Hyon; and Lee, Kangin 08583761 Cl. 709-218.
Ni, Chih-Hsien: See--
Hsieh, Chin-Tang; Kuo, Chih-Ming; Tu, Chia-Jung; Chang, Shih-Chieh; Ho, Lung-Hua; and Ni, Chih-Hsien 08581384 Cl. 257-692.
Ni, Ping: See--
Pearce, Chris; Bao, Ho; and Ni, Ping 08582741 Cl. 379-201.12.
Ni, Rongkwang: See--
Lueng, Chiuming; Sato, Kazuki; Koyanagi, Yohei; Leung, Cheukwing; Ding, Juren; Ni, Rongkwang; Kwan, Wanyin; and Mok, Siuman 08582248 Cl. 360-319.
Niblett, Charles L.; to Venganza, Inc. Methods and materials for conferring resistance to pests and pathogens of plants 08581039 Cl. 800-279.
Nichol, Scott: See--
Turenne, Alain; Nichol, Scott; and Smith, Dan 08580218 Cl. 423-348.
Nicholas, Christopher P.: See--
Bhattacharyya, Alakananda; Serban, Manuela; Mezza, Beckay J.; Vanden Bussche, Kurt M.; Nicholas, Christopher P.; Kocal, Joseph A.; and Bennion, Warren K. 08580107 Cl. 208-208R.
Nicholas, Michael: See--
Calvo, David C.; Bingham, Jill P.; and Nicholas, Michael 08578759 Cl. 73-40.5A.
Nichols, David; and Finley, Eric, to Howmedica Osteonics Corp. Apparatus for securing a spinal rod system 08579943 Cl. 606-279.
Nicholson, Clark D.: See--
Belali, Mohamed; Stinnett, Cort Whitney; and Nicholson, Clark D. 08583949 Cl. 713-310.
Nicol, II, William Bruce; Bokor, Brian Ronald; Haggar, Peter Frederick; House, Daniel Edward; and Smith, Andrew Bryan, to International Business Machines Corporation Avatar cloning in a virtual world 08584024 Cl. 715-757.
Niculae, Marian: See--
Bucur, Constantin; and Niculae, Marian 08581552 Cl. 320-132.
Niday, Peter: See--
Kumar, Arbind; Lefebvre, II, John Robert; Banka, Krishna Kumar; and Niday, Peter 08584077 Cl. 716-139.
Nidec Corporation: See--
Fukushima, Kazuhiko 08582233 Cl. 360-99.08.
Nidec Sankyo Corporation: See--
Momose, Shogo 08581578 Cl. 324-228.
Nidek Co., Ltd.: See--
Matsuyama, Yoshinori 08578617 Cl. 33-200.
Nie, Ke: See--
Su, Min-Ying; and Nie, Ke 08582858 Cl. 382-132.
Niedermeier, Anton; and Kwirandt, Rainer, to Krones AG Apparatus and method for inspecting labeled containers 08581977 Cl. 348-127.
Niehrs, Christof; Kazanskaya, Olga; and Okawara, Bisei, to Deutsches Krebsforschungszentrum Stiftung des Offentlichen Rechts Rspondin polypeptides as promoting factors of angiogenesis and vasculogenesis 08580736 Cl. 514-13.3.
Nielsen, Anders Lade: See--
Mikkelsen, Jacob Giehm; Moldt, Brian; Nielsen, Anders Lade; Bolund, Lars Axel; Kragh, Peter Michael; Jakobsen, Jannik Ejnar; and Jørgensen, Arne Lund 08581021 Cl. 800-17.
Nielsen, Arne Mølgaard; to Cook Medical Technologies LLC Drive assembly for facilitating deployment of an implantable medical device 08579913 Cl. 606-108.
Nielsen Company (US), LLC, The: See--
Dodge, James; Donmyer, John; and Slavik, Frank J. 08583477 Cl. 705-14.1.
Nielsen, Hans Jørgen: See--
Johansen, Julia Sidenius; Schultz, Nicolai Aagaard; Jensen, Benny Vittrup; Bojesen, Stig; Nordestgaard, Børge Grønne; Nielsen, Hans Jørgen; and Christensen, Ib Jarle 08580520 Cl. 435-7.1.
Nielsen, Henrik; and Petitdemange, David, to Handpresso Apparatus for preparing an infusion 08578839 Cl. 99-302R.
Nielsen, Jan Frank: See--
Klint, Henrik Sonderskov; Radmer, Jim; Smedegaard, Jorgen K; Nielsen, Jan Frank; Jensen, Peter Moller; and Jensen, Jens Moller 08579869 Cl. 604-240.
Nielsen, Mark T.: See--
Xui, Dongmei; and Nielsen, Mark T. 08581043 Cl. 800-286.
Nielsen, Niels Fisker: See--
Hansen, Jens Bo Rode; Orum, Henrik; Hansen, Henrik Frydenlund; Straarup, Ellen Marie; Nielsen, Niels Fisker; and Hedtjärn, Maj 08580756 Cl. 514-44A.
Nielsen, Steven; Chambers, Curtis; and Farr, Jeffrey, to CertusView Technologies, LLC Methods, apparatus, and systems for facilitating compliance with marking specifications for dispensing marking material 08583372 Cl. 701-521.
Nielsen, Steven E.; Chambers, Curtis; and Farr, Jeffrey, to CertusView Technologies, LLC Marking device docking stations and methods of using same 08583264 Cl. 700-58.
Nielsen, Steven E.; Chambers, Curtis; and Farr, Jeffrey, to CertusView Technologies, LLC Methods and apparatus for analyzing locate and marking operations with respect to environmental landmarks 08583461 Cl. 705-7.11.
Niemi, Markus: See--
Brace, Wiliam; Hautala, Pekka; Kiijarvi, Jukka; and Niemi, Markus 08579253 Cl. 251-129.06.
Nierlich, Florent; to Messier-Bugatti-Dowty Device for braking/driving an aircraft wheel 08579229 Cl. 244-50.
Niesen, Urs; and Marzetta, Thomas L., to Alcatel Lucent Interference alignment for channel-adaptive waveform modulation 08582684 Cl. 375-295.
Nieto, John W.: See--
Furman, William N.; Nieto, John W.; and De Risio, Marcelo 08583431 Cl. 704-235.
Niewczas, Jaroslaw: See--
Jonsson, Elias; Murata, Yoshitaka; Niewczas, Jaroslaw; Singh, Amit; and Uesaka, Kazuyoshi 08582624 Cl. 375-148.
Niewels, Frank; and Lemejda, Markus, to Robert Bosch GmbH Method and device for determining the angle of inclination of a two-wheeled vehicle 08583324 Cl. 701-38.
Niewoehner, Jens; Kiessling, Alexander; and Speck, Werner, to Dr. Ing. h.c. F. Porsche Aktiengesellschaft Fuel tank 08579062 Cl. 180-69.4.
Nifantiev, Nikolay; and Albrecht, Volker, to Biolitec Pharma Marketing Ltd Photosensitizer formulations and their use 08580839 Cl. 514-410.
Nifco Inc.: See--
Kimura, Motohiko 08579092 Cl. 188-321.11.
Niggel, Brett: See--
Sanguinet, Andrew; Niggel, Brett; and Jost, Scott 08579164 Cl. 222-207.
Niggemann, Matthias: See--
Van Giesen, Bernd; Hanke, Dirk; Stuckmann, Peter; Lange, Stephan; Niggemann, Matthias; Wagner, Georg; Brokmann, Jens; Wibbeke, Katrin; Scharlibbe, Heinz; and Wedler, Andreas 08582311 Cl. 361-752.
Nihon Dempa Kogyo Co., Ltd.: See--
Akaike, Kazuo; and Kobayashi, Kaoru 08581670 Cl. 331-158.
Akaike, Kazuo; and Sato, Shinichi 08581671 Cl. 331-158.
Amano, Yoshiaki; Takahashi, Takehiro; and Mizusawa, Shuichi 08581476 Cl. 310-348.
Hasegawa, Yasunobu 08581472 Cl. 310-334.
Sasaki, Hiroyuki; Shimao, Kenji; and Ishikawa, Manabu 08580126 Cl. 216-2.
Niigata Univerasity: See--
Goto, Terutaka; Kaneta, Hiroshi; Nemoto, Yuichi; and Akatsu, Mitsuhiro 08578777 Cl. 73-597.
Nijhuis, Theo; to Siemens Aktiengesellschaft Fluid energy machine 08579608 Cl. 417-423.12.
Nikander, Pekka: See--
Sarela, Mikko; and Nikander, Pekka 08583919 Cl. 713-163.
Nike, Inc.: See--
Baker, Brian D.; Baudouin, Alexandre; and Dieter, William M. 08579241 Cl. 248-152.
Bell, Thomas G.; Farris, Bryan N.; and Henrichot, Olivier 08578632 Cl. 36-88.
Cohen, Tal; Raynak, Geoffrey C.; White, Vincent F.; and Chavez, Eleazar C. 08579743 Cl. 473-605.
Diepenbrock, James 08578630 Cl. 36-59R.
Dojan, Frederick J.; Johnson, Daniel Akey; Tseng, Yung-Tsung; and Kohatsu, Shane S. 08578535 Cl. 12-142R.
Langvin, Elizabeth; and Rapaport, Zvi 08578534 Cl. 12-128R.
Moore, Bruce Yin; and Hurley, Ryan Michael 08578512 Cl. 2-2.16.
Prstojevich, Michael 08579768 Cl. 482-15.
Roether, Julia; Smith, Steven F.; and McDowell, Sean M. 08578633 Cl. 36-100.
Snyder, Jeremy N.; Franklin, David N.; Stites, John T.; and Rahrig, Donald S. 08579717 Cl. 473-251.
Nikfarjam, Jonathan S.; and West, Patrick M., to International Business Machines Corporation Hand activated input device with horizontal control surface 08581845 Cl. 345-163.
Nikolaev, Igor: See--
Morris, Sean; Keane, Peter; Nikolaev, Igor; and Mulligan, Tom 08583467 Cl. 705-7.26.
Nikon Corporation: See--
Binnard, Michael; Ma, Wen-Hou; Ueta, Toshio; Yang, Pai-Hsueh; Teng, Ting-Chien; and Yuan, Bausan 08582080 Cl. 355-53.
Hagiwara, Kosuke 08581989 Cl. 348-207.1.
Hoshikawa, Hideaki 08582020 Cl. 348-360.
Novak, W. Thomas; Smith, Daniel G.; and Holland, Lloyd 08582119 Cl. 356-614.
Shibazaki, Yuichi; and Kanaya, Yuho 08582084 Cl. 355-77.
Takahashi, Isao; and Yamamoto, Tetsuya 08582973 Cl. 398-118.
Tezaur, Radka 08582914 Cl. 382-263.
Niksa, Andrew J.: See--
Niksa, Marilyn J.; and Niksa, Andrew J. 08580091 Cl. 204-290.09.
Niksa, Marilyn J.; and Niksa, Andrew J., to Water Star, Inc. Multi-layer mixed metal oxide electrode and method for making same 08580091 Cl. 204-290.09.
Niksch, Barbara A.: See--
Tu, Hosheng; Smedley, Gregory T.; Haffner, David; and Niksch, Barbara A. 08579846 Cl. 604-8.
Nikzad, Shouleh: See--
Monacos, Steve P.; Hoenk, Michael E.; and Nikzad, Shouleh 08582805 Cl. 382-103.
Nilsson, Anders: See--
Jönsson, Lennart; Jansson, Olof; Holmer, Mattias; Sternby, Jan; Nilsson, Anders; and Hansson, Per 08580110 Cl. 210-134.
Nimbalker, Ajit: See--
Love, Robert T; Kuchibhotla, Ravi; Nangia, Vijay; Nimbalker, Ajit; and Stewart, Kenneth A 08582538 Cl. 370-335.
Ninagawa, Takayasu; and Nakayama, Eiji, to Kyocera Corporation Relay station and radio communication relay method 08582495 Cl. 370-315.
Ning, Paul C.: See--
Kramer, James F.; and Ning, Paul C. 08583447 Cl. 705-1.1.
Ninomiya, Akihide: See--
Yamamoto, Hiroki; Ninomiya, Akihide; and Matsumoto, Yoshihiko 08580057 Cl. 156-73.1.
Ninomiya, Sachiko: See--
Shimizu, Yoshiyuki; Matsuo, Akane; Ninomiya, Sachiko; and Miura, Tsunetoshi 08579875 Cl. 604-385.02.
Ninomiya, Yosuke; Saito, Kazuhiro; and Hori, Satoru, to Fuji Xerox Co., Ltd. Powder holding container with an opening and closing member having a resilient tab surrounded by a cutout 08583014 Cl. 399-260.
Nintendo Co., Ltd.: See--
Kando, Yuuji 08579706 Cl. 463-31.
Umezu, Ryuji 08584260 Cl. 726-31.
Nippon Chemical Industrial Co., Ltd.: See--
Kuwano, Hiroyuki; Banda, Tomohiro; and Tanaka, Yasuyuki 08580221 Cl. 423-419.1.
Nippon Seiki Co., Ltd.: See--
Obata, Masato 08579449 Cl. 362-23.21.
Nippon Soda Co., Ltd.: See--
Tanaka, Ayumi; Tanaka, Ryouichi; Kato, Kazushige; and Fukagawa, Takako 08580940 Cl. 536-23.7.
Nippon Soken, Inc.: See--
Kawasaki, Koji; Matsue, Takenori; Tokudome, Yuji; Inagaki, Mitsuo; and Ogawa, Oyuki 08579748 Cl. 475-5.
Nippon Steel & Sumitomo Metal Corporation: See--
Ito, Nobuaki 08578788 Cl. 73-861.42.
Nippon Steel Engineering Co., Ltd.: See--
Kurayoshi, Kazumi; Kato, Ryo; Mori, Katsumi; and Doi, Yoshihito 08578582 Cl. 29-426.1.
Nippon Telegraph and Telephone Corporation: See--
Shimokawa, Fusao; Uchiyama, Shingo; Yamaguchi, Johji; Sato, Makoto; Sasakura, Kunihiko; Morita, Hirofumi; Inagaki, Shuichiro; Machida, Katsuyuki; Ishii, Hiromu; and Murakami, Makoto 08582189 Cl. 359-198.1.
Nippon Thompson Co., Ltd.: See--
Kikuchi, Shunsuke 08579511 Cl. 384-447.
Nirvanix, Inc.: See--
Chatley, Scott P.; Gallagher, Gabriel; Phan, Thanh T.; and Gatchell, Troy C. 08583616 Cl. 707-705.
Nish, Randall William; and Vogel, Jason Jon, to Exelis Inc. Composite downhole tool with ratchet locking mechanism 08579023 Cl. 166-134.
Nishi, Keishiro; and Ono, Akiyoshi, to Kubota Corporation Work vehicle 08579070 Cl. 180-336.
Nishi, Kentaro: See--
Soma, Fumihito; Majima, Minoru; Sasaki, Yosuke; Oshiba, Takuya; Miyazawa, Hiroaki; Hamanaga, Takamitsu; and Nishi, Kentaro 08578590 Cl. 29-566.4.
Nishi, Nozomu; Hirashima, Mitsuomi; Yamauchi, Akira; and Ito, Aiko, to Galpharma Co., Ltd. Modified galectin 9 proteins and methods of treatment using them 08580743 Cl. 514-18.7.
Nishi, Takashi: See--
Tsukamoto, Hiroyuki; and Nishi, Takashi 08578709 Cl. 60-445.
Nishida, Junichi; to Toyota Jidosha Kabushiki Kaisha In-vehicle device, vehicle authentication system and data communication method 08583317 Cl. 701-31.4.
Nishida, Mitsuhiro; Ohno, Shingo; and Yamazaki, Hirotaka, to Bridgestone Corporation Information display panel 08582198 Cl. 359-296.
Nishida, Tatsuya: See--
Ishii, Yoshito; Nishida, Tatsuya; Fujita, Atsushi; and Yamada, Kazuo 08580437 Cl. 429-231.8.
Nishida, Toshio; to Hitachi-LG Data Storage, Inc. Data library apparatus 08582400 Cl. 369-30.39.
Nishida, Yasutaka: See--
Yamaguchi, Masaho; Nishida, Yasutaka; Yamada, Mitsunobu; Nakayama, Tooru; and Togashi, Ryouichi 08583322 Cl. 701-36.
Nishide, Yosuke: See--
Kosuge, Tetsuya; Kamatani, Jun; Nishide, Yosuke; and Kishino, Kengo 08580400 Cl. 428-690.
Nishihara, Masato: See--
Akiyama, Yuichi; Miyata, Hideyuki; Tanaka, Toshiki; and Nishihara, Masato 08582981 Cl. 398-188.
Nishihara, Masato; Takahara, Tomoo; Akiyama, Yuichi; and Yuki, Masahiro, to Fujitsu Limited Optical device and optical modulation method 08582980 Cl. 398-188.
Nishihara, Masato; and Takahara, Tomoo, to Fujitsu Limited Optical modulation device and optical modulation method 08582982 Cl. 398-188.
Nishihara, Takashi: See--
Tsuchino, Akio; Nishihara, Takashi; Kusada, Hideo; Kojima, Rie; and Yamada, Noboru 08580368 Cl. 428-64.1.
Nishijima, Tatsuji: See--
Yoneda, Seiichi; and Nishijima, Tatsuji 08581625 Cl. 326-38.
Nishikawa, Katsunari; to Fujitsu Semiconductor Limited Manufacturing method of semiconductor device, method for controlling ion beam, and ion implantation apparatus 08581216 Cl. 250-492.21.
Nishikawa, Kentarou: See--
Ikki, Kentaro; Norimatsu, Takayuki; and Nishikawa, Kentarou 08578791 Cl. 73-862.045.
Nishikawa, Satoru; to Fuji Xerox Co., Ltd. Multi-path exhaust apparatus and image forming apparatus 08583000 Cl. 399-92.
Nishikawa, Yuriko: See--
Bhandari, Sakura; Nishikawa, Yuriko; Shinkawa, Kaoru; and Tahara, Yoshinori 08584095 Cl. 717-127.
Nishikido, Shuuichi: See--
Takiguchi, Yasushi; Yamamoto, Taro; Fujimoto, Akihiro; Nishikido, Shuuichi; Kumagai, Dai; Yoshitaka, Naoto; Kitano, Takahiro; and Tokunaga, Yoichi 08578953 Cl. 134-149.
Nishimae, Yuichi: See--
Yamato, Hitoshi; Asakura, Toshikage; Matsumoto, Akira; Tanaka, Keita; and Nishimae, Yuichi 08580478 Cl. 430-270.1.
Nishimi, Taisei; and Kawamura, Koichi, to FUJIFILM Corporation Method for producing a biosensor 08580571 Cl. 436-164.
Nishimura, deceased, Shingo: See--
Yamamoto, Naoyuki; Mizuno, Seiichi; Nishimura, deceased, Shingo; Gotou, Takanobu; Matsuura, Keiichi; and Shinoda, Tadashi 08580557 Cl. 435-256.1.
Nishimura, Hiroshi: See--
Tsuboi, Michitaka; Ikeda, Makoto; Murata, Yoshiaki; Yamamoto, Kazuhisa; Hirabayashi, Kazuo; Yashiki, Tetsuya; Okada, Kazunari; Tomimatsu, Shuji; and Nishimura, Hiroshi 08582586 Cl. 370-401.
Nishimura, Jun: See--
Murai, Atsuhito; Tanaka, Shinya; Kitagawa, Hideki; Imai, Hajime; Imade, Mitsunori; Kikuchi, Tetsuo; Morimoto, Kazunori; Shimada, Junya; and Nishimura, Jun 08581257 Cl. 257-59.
Nishimura, Kazuo: See--
Majima, Toshiyuki; and Nishimura, Kazuo 08578829 Cl. 83-618.
Nishimura, Kazuto: See--
Hirota, Masaki; Nishimura, Kazuto; Sasakawa, Yasushi; and Takatori, Kou 08582467 Cl. 370-254.
Nishimura, Koichiro: See--
Ikeda, Masakazu; Nishimura, Koichiro; and Nagai, Yutaka 08582404 Cl. 369-47.1.
Nishimura, legal representative, Hideo: See--
Yamamoto, Naoyuki; Mizuno, Seiichi; Nishimura, deceased, Shingo; Gotou, Takanobu; Matsuura, Keiichi; and Shinoda, Tadashi 08580557 Cl. 435-256.1.
Nishimura, Tadafumi; to Daikin Industries, Ltd. Air conditioning apparatus and refrigerant quantity determination method 08578725 Cl. 62-149.
Nishimura, Yutaka: See--
Fujii, Shinichi; Ui, Hiroki; and Nishimura, Yutaka 08582019 Cl. 348-350.
Nishino, Toshiharu: See--
Sasaki, Kazuhiro; Iwasaki, Makoto; and Nishino, Toshiharu 08581863 Cl. 345-173.
Nishio, Yoji; to Elpida Memory, Inc. Semiconductor device and information processing system 08581649 Cl. 327-170.
Nishioka, Yoshihiro: See--
Bando, Takuji; Aoki, Satoshi; Kawasaki, Junichi; Ishigami, Makoto; Taniguchi, Youichi; Yabuuchi, Tsuyoshi; Fujimoto, Kiyoshi; Nishioka, Yoshihiro; Kobayashi, Noriyuki; Fujimura, Tsutomu; Takahashi, Masanori; Abe, Kaoru; Nakagawa, Tomonori; Shinhama, Koichi; Utsumi, Naoto; Tominaga, Michiaki; Ooi, Yoshihiro; Yamada, Shohei; and Tomikawa, Kenji 08580796 Cl. 514-253.07.
Nishioka, Yoshinao: See--
Fujii, Yasuo; and Nishioka, Yoshinao 08581111 Cl. 174-260.
Nishiyama, Takeshi; to Fujitsu Limited Electronic apparatus and method related thereto 08582315 Cl. 361-807.
Nishiyama, Taku: See--
Asada, Junichi; Nishiyama, Taku; and Seki, Atsuko 08581372 Cl. 257-668.
Nishizawa, Koichiro; to Mitsubishi Electric Corporation Semiconductor device 08581411 Cl. 257-774.
Nishizawa, Masato; to Seiko Epson Corporation Electro-optical device 08581834 Cl. 345-107.
Niskanen, Matti; Turtinen, Markus; and Hannuksela, Jari, to Visidon Oy Face recognition in digital images by applying a selected set of coefficients from a decorrelated local binary pattern matrix 08582836 Cl. 382-118.
Nissan Diesel Motor Co., Ltd.: See--
Hirata, Kiminobu; Masaki, Nobuhiko; Akagawa, Hisashi; and Yajima, Yuji 08578703 Cl. 60-286.
Nissan Motor Co., Ltd: See--
Ogawa, Yoshitaka 08579355 Cl. 296-146.9.
Nissan Motor Co., Ltd.: See--
Abe, Keita 08579339 Cl. 292-336.3.
Komatsu, Gakushi 08583273 Cl. 700-166.
Sakagami, Eigo; and Takaishi, Tetsu 08579757 Cl. 476-67.
Takekawa, Toshihiro 08580442 Cl. 429-409.
Yaguchi, Tatsuya; Kushibiki, Keiko; Nakajima, Yasushi; Ibuka, Shigeo; and Ohara, Kenji 08580452 Cl. 429-456.
Nissha Printing Co., Ltd.: See--
Sakata, Yoshihiro; Hashimoto, Takao; Kai, Yoshihiro; and Morikawa, Yuji 08581871 Cl. 345-173.
Nisshin OilliO Group, Ltd., The: See--
Suganuma, Tomomi; Hirose, Tadashiro; Suzuki, Junko; Arimoto, Shin; Maki, Hideaki; and Negishi, Satoshi 08580550 Cl. 435-198.
Nitin, Nitin: See--
Oxley, James D; Finkbiner, Jenny J.; and Nitin, Nitin 08581209 Cl. 250-459.1.
Nitta, Ryuichi; to Kyocera Document Solutions, Inc. Image forming apparatus and display method thereof 08582177 Cl. 358-1.9.
Nitta, Satoru: See--
Sano, Takayoshi; and Nitta, Satoru 08579621 Cl. 425-66.
Nitta, Tetsuya: See--
Tsujiuchi, Mikio; and Nitta, Tetsuya 08581299 Cl. 257-140.
Nitta, Tsuyoshi; to KYOCERA Document Solutions inc. Image forming apparatus and method 08582153 Cl. 358-1.15.
Nittani, Susumu: See--
Kubo, Yukio; Nittani, Susumu; and Kashiide, Yosuke 08583001 Cl. 399-103.
Nitto Denko Corporation: See--
Haishi, Motoki; Nashiki, Tomotake; Noguchi, Tomonori; and Asahara, Yoshifumi 08580088 Cl. 204-192.29.
Ishimaru, Yasuto; and Ebe, Hirofumi 08581110 Cl. 174-260.
Oda, Takashi; Morita, Kosuke; and Toyoda, Eiji 08580619 Cl. 438-118.
Satake, Masayuki; Kawaguchi, Masaaki; Itano, Noboru; Ogasawara, Akiko; and Hayashi, Osamu 08580367 Cl. 428-40.1.
Sugo, Yuki; Misumi, Sadahito; and Matsumura, Takeshi 08580617 Cl. 438-118.
Nittoh Kogaku K.K.: See--
Koizumi, Fumiaki 08579472 Cl. 362-308.
Niu, Chunming; Moy, David; Chishti, Asif; and Hoch, Robert, to Hyperion Catalysis International, Inc. Methods of oxidizing multiwalled carbon nanotubes 08580436 Cl. 429-231.8.
Niu, Qi-Wen: See--
Zuo, Jianru; Niu, Qi-Wen; Frugis, Giovanna; and Chua, Nam-Hai 08581037 Cl. 800-278.
Niu, Xiaoye: See--
Xin, Ying; Gong, Weizhi; Niu, Xiaoye; and Cao, Zhengjian 08582255 Cl. 361-19.
Niwa, Atsumi; and Ueno, Yosuke, to Sony Corporation Delta-sigma modulator and signal processing system 08581763 Cl. 341-143.
Niwano, Kazuhito; to Mitsubishi Electric Corporation Mobile station, base station, communication system, amount-of-data information transmission method, transmission-control-information notification method, and wireless communication method 08583156 Cl. 455-509.
Nobis, Guenter; Abraham, Steffen; and Uffenkamp, Volker, to Robert Bosch GmbH Method for wheel suspension measurement and a device for measuring the wheel suspension geometry of a vehicle 08578765 Cl. 73-115.07.
Noble, Andy: See--
Sindano, Hector; Rogers, Ben; Noble, Andy; Keenan, Matthew; and Mortimer, Phil 08578705 Cl. 60-295.
Noble, Jr., Stephen William: See--
Grote, Edwin Michael; Noble, Jr., Stephen William; and Henke, Gary Edward 08581067 Cl. 800-320.1.
Noble, Shawn D.; Kerendian, Hormoz; Dudding, Ashley T.; Mattia, Louis F.; and Parrish, Charles A., to Hendrickson USA, L.L.C. Rotatable bar pin bushing assembly 08579510 Cl. 384-428.
Nobori, Kunio: See--
Iwasaki, Masahiro; Nobori, Kunio; and Komoto, Ayako 08582822 Cl. 382-107.
Nochimowski, Alain; Rave, Micha; Stern, Ori; Garcia, Jose Carlos Santos; and Martin, Antonio Manuel Lopez, to SanDisk IL Ltd. Storage device having direct user access 08583878 Cl. 711-154.
Noda, Masataka; and Tomimatsu, Rie, to Kabushiki Kaisha SEGA Game machine and game method 08579295 Cl. 273-372.
Noda, Mitsunaga: See--
Shibaya, Miaki; Gotou, Masaoki; Noda, Mitsunaga; and Kawakami, Masami 08580863 Cl. 521-86.
Noda, Takafumi; and Takizawa, Jun, to Seiko Epson Corporation Pyroelectric detector and method for manufacturing same, pyroelectric detection device, and electronic instrument 08581192 Cl. 250-338.3.
Noebauer, Gerhard: See--
Hosseini, Khalil; Krumrey, Joachim; Mahler, Joachim; and Noebauer, Gerhard 08581371 Cl. 257-663.
Noel, Ross: See--
Behl, Daniel; Gordon, Glen; Lower, Loren; and Noel, Ross 08580073 Cl. 156-325.
Noeldner, David R.; and Bratvold, Michael, to LSI Corporation Context processing for multiple active write commands in a media controller architecture 08583839 Cl. 710-22.
NOF Corporation: See--
Matsuoka, Yosuke; Yoshioka, Nobuyuki; Sorimachi, Mao; and Sakamoto, Nobuyuki 08580904 Cl. 526-279.
Noguchi, Masumi; to Kojima Press Industry Co., Ltd. Organic glass for automobile and process for producing the same 08580378 Cl. 428-336.
Noguchi, Tomonori: See--
Haishi, Motoki; Nashiki, Tomotake; Noguchi, Tomonori; and Asahara, Yoshifumi 08580088 Cl. 204-192.29.
Noguchi, Wataru; Yamada, Toyoshi; Yurugi, Hiroyuki; Tanaka, Osamu; Arashin, Nobuhiko; and Nagoshi, Masahiko, to Panasonic Corporation Wireless communication apparatus changing radiation patterns of antenna apparatuses 08583052 Cl. 455-67.11.
Noh, Cheolyong: See--
Kang, Eui Jeong; Ha, Juhwa; Park, Hyeeun; Noh, Cheolyong; Baek, Seung Hwan; and Kwon, Yong-Hoon 08579491 Cl. 362-621.
Noh, Hyong Soo; Yasuhiko, Kochiyama; and Yun, So Young, to Samsung Electronics Co., Ltd. Electrostatic precipitator 08580017 Cl. 96-69.
Noh, Yong Gyu: See--
Lee, Hyun Joon; Noh, Yong Gyu; and Kwon, Bu Kil 08580444 Cl. 429-415.
Noh, Yu Jin; Kim, Ki Jun; Lee, Dae Won; Kim, Bong Hoe; and Ahn, Joon Kui, to LG Electronics Inc. Reference signal transmission method for downlink multiple input multiple output system 08582486 Cl. 370-312.
Nohechi, Hideki; to Sony Corporation Terminal device 08581124 Cl. 200-5A.
Noiré, Aline; and Therond, Benjamin, to STMicroelectronics S.A. Multiple-level inductance 08581684 Cl. 336-200.
NOK Corporation: See--
Jinbo, Kazunori 08579298 Cl. 277-559.
Nokia Corporation: See--
Chen, Tao; Hakola, Sami-Jukka; and Koskela, Timo K. 08582593 Cl. 370-432.
Holtmanns, Silke; Laitinen, Pekka; Ginzboorg, Philip; Miettinen, Kari; and Rajaniemi, Jaakko 08582762 Cl. 380-44.
Jung, Younghee; Persson, Per; Piippo, Petri; and Mäenpää, Petri H. 08583139 Cl. 455-456.1.
Kotamarthi, Padmajabala; and Narayanan, Ram Gopal Lakshmi 08584118 Cl. 717-174.
Ledlie, Jonathan; Hicks, Jamey; Teller, Seth J.; Curtis, Dorothy W.; Battat, Jonathan; and Charrow, Benjamin 08581698 Cl. 340-8.1.
Mustonen, Mika P.; and Rytivaara, Markku 08583706 Cl. 707-805.
Naskali, Matti Juhani; and Paananen, Heikki Sakari 08580415 Cl. 429-65.
Ollila, Elina; Rautava, Mika; and Kärkkäinen, Leo 08583148 Cl. 455-466.
Pasanen, Pirjo; Ermolov, Vladimir; Oksanen, Markku Anttoni; Voutilainen, Martti; and Seppala, Eira 08581672 Cl. 332-115.
Pienimaa, Seppo; and Wang, Kong Qiao 08581851 Cl. 345-171.
Sathish, Sailesh Kumar 08584208 Cl. 726-4.
Vartiainen, Elina; Popescu, Andrei; Roto, Virpi; Grassel, Guido; and Rautava, Mika 08583090 Cl. 455-414.3.
Nokia Siemens Networks GmbH & Co. KG: See--
Frederiksen, Frank; and Raaf, Bernhard 08583997 Cl. 714-786.
Nokia Siemens Networks Oy: See--
Bunge, Christian Alexander; Schuster, Matthias; and Spinnler, Bernhard 08582979 Cl. 398-183.
Piirainen, Olli Juhani; Vainikka, Markku Juha; and Van Phan, Vinh 08583182 Cl. 455-562.1.
Zheng, Haihong; Wang, Xiaoyi; Suumäki, Jan; Maheshwari, Shashikant; and Saifullah, Yousuf 08582436 Cl. 370-235.
Nolan, Joseph J.: See--
Skelton, Dennis M.; Davis, Jon P.; Sahasrabudhe, Rajeev; Gokaldas, Shyam; and Nolan, Joseph J. 08583252 Cl. 607-62.
Nolan, Patrick; and Dotsey, Michael A., to AZEK Building Products, Inc. Universal skirt board 08578660 Cl. 52-62.
Nomaguchi, Tsunenori; and Agemura, Toshihide, to Hitachi High-Technologies Corporation Composite charged-particle-beam apparatus 08581219 Cl. 250-492.3.
Nomaru, Keiji: See--
Furuta, Kenji; and Nomaru, Keiji 08581144 Cl. 219-121.75.
Nomoto, Akira: See--
Suenaga, Kazufumi; Shibata, Kenji; Watanabe, Kazutoshi; and Nomoto, Akira 08581477 Cl. 310-358.
Nomura, Yoshihide; to Fujitsu Limited Business flow distributed processing system and method 08583754 Cl. 709-208.
Nonaka, Osamu: See--
Nakada, Naohisa; Tani, Akira; Uemura, Yuiko; Takahashi, Masashi; and Nonaka, Osamu 08582918 Cl. 382-282.
Ugawa, Akira; and Nonaka, Osamu 08581994 Cl. 348-211.1.
Nonami, Tetsuo: See--
Inoue, Ryoko; and Nonami, Tetsuo 08581973 Cl. 348-77.
Nones, Carlos; and Paredes, Pedro, to Parex USA, Inc. Dry powder polymer finish 08580866 Cl. 523-122.
Noor, Norazian Mohammed: See--
Abdullah, Mohd Mustafa Albakri; Binhussain, Mohammed A; Hussin, Kamarudin; Ghazali, Mohd Ruzaidi; Noor, Norazian Mohammed; and Selimin, Mohammad Tamizi 08580029 Cl. 106-600.
Noordzij, Duco W.: See--
Rogers, David C.; Noordzij, Duco W.; Stokes, Peter L.; and Koenig, Leonard M. 08578521 Cl. 2-417.
Nordemann, Rudolf: See--
Becker, Torben; Nordemann, Rudolf; and Render, Joachim 08578843 Cl. 99-474.
Nordestgaard, Børge Grønne: See--
Johansen, Julia Sidenius; Schultz, Nicolai Aagaard; Jensen, Benny Vittrup; Bojesen, Stig; Nordestgaard, Børge Grønne; Nielsen, Hans Jørgen; and Christensen, Ib Jarle 08580520 Cl. 435-7.1.
Nordischermaschinenbau rud. Baader GmbH + Co. KG: See--
Grabau, Thomas 08579683 Cl. 452-125.
Nordson Corporation: See--
Fiske, Erik; Quinones, Horatio; Maiorca, Phillip P.; Babiarz, Alec; and Ciardella, Robert 08578729 Cl. 62-324.6.
Khoury, James M.; Nagy, Charles; Nemethy, Stephen G.; and Ignatius, Mark J. 08578878 Cl. 118-668.
Norimatsu, Takayuki: See--
Ikki, Kentaro; Norimatsu, Takayuki; and Nishikawa, Kentarou 08578791 Cl. 73-862.045.
Noritomi, Hidetaka: See--
Noritomi, Yasuko; Noritomi, Hidetaka; Kubota, Yuuji; and Suzuki, Takahiro 08580165 Cl. 264-4.1.
Noritomi, Yasuko; Noritomi, Hidetaka; Kubota, Yuuji; and Suzuki, Takahiro, to Kabushiki Kaisha Toshiba Method for manufacturing multiple-phase particle and apparatus for manufacturing multiple-phase particle 08580165 Cl. 264-4.1.
Norkitis, Michael: See--
Frazier, Isaac S.; Knierim, David L.; Bonicatto, James M.; and Norkitis, Michael 08579396 Cl. 347-7.
Norling, Tomas: See--
Zee, Oscar; and Norling, Tomas 08582444 Cl. 370-242.
Norman, John Phillip: See--
McDaniel, Terrence Lee; McDaniel, Bradley John; Norman, John Phillip; Robbins, Michael LaMar; and Sacerdoti, Earl D. 08583562 Cl. 705-313.
Normile, Tom; to eBay Inc. System and method to identify machine-readable codes 08579187 Cl. 235-375.
Norsk Glassgjenvinning AS: See--
Narmo, Jon A. 08579542 Cl. 404-71.
Nørskov, Jens Kehlet: See--
Johannessen, Tue; Sørensen, Rasmus Zink; Christensen, Claus Hviid; Quaade, Ulrich; Nørskov, Jens Kehlet; and Schmidt, Henning 08578702 Cl. 60-286.
Norsworthy, Joe B.: See--
Canterbury, Tracey A.; and Norsworthy, Joe B. 08578766 Cl. 73-121.
North Carolina State University: See--
Buckner, Gregory D.; and Bolotin, Gil 08579806 Cl. 600-202.
Northeastern University: See--
Karger, Barry L.; and Zhang, Jian 08580570 Cl. 436-161.
Northern Light Group, LLC: See--
Seuss, C. David 08583580 Cl. 706-47.
Northrop Grumman Corporation: See--
Abbink, Henry C.; Kuhn, Gabriel M.; Ge, Howard; and Sakaida, Daryl 08579502 Cl. 374-5.
Northrup, M. Allen: See--
Petersen, Kurt E.; Taylor, Michael T.; Pourahmadi, Farzad; McMillan, William A.; Chang, Ronald; Sakai, Stanley H.; Ching, Jesus; Dority, Douglas B.; Belgrader, Phillip; and Northrup, M. Allen 08580559 Cl. 435-287.2.
Northwestern University: See--
Ameer, Guillermo; Kibbe, Melina; and Zhao, Haichao 08580912 Cl. 528-291.
Stupp, Samuel I.; Donners, Jack J. J. M.; Silva, Gabriel A.; Behanna, Heather A.; and Anthony, Shawn G. 08580923 Cl. 530-326.
Sukerkar, Preeti A.; Lee, Jiyoun; Woodruff, Teresa K.; and Meade, Thomas J. 08580231 Cl. 424-9.363.
Yi, Fei; and Ho, Seng-Tiong 08582929 Cl. 385-10.
Norton, David Paul: See--
Ren, Fan; Lin, Jenshan; Norton, David Paul; and Pearton, Stephen John 08578757 Cl. 73-31.05.
Norton, Jeffrey M.; and Albert, Barry R., to Ames True Temper, Inc. Consumer post hole digger 08579342 Cl. 294-50.8.
Norviel, Vern: See--
Stephan, Dietrich; Norviel, Vern; Warrington, Janet; and Dolginow, Doug 08583380 Cl. 702-20.
Norvig, Peter: See--
Nevill-Manning, Craig; Tan, Chade-Meng; Dyanik, Aynur; and Norvig, Peter 08583808 Cl. 709-228.
Norville, William C.; to PCW Holdings, LLC Compositions and methods for restoring aircraft windows and other plastic surfaces 08580346 Cl. 427-307.
Notiyath, Pramod: See--
Kapur, Rohit; Saikia, Jyotirmoy; Uppuluri, Rajesh; Notiyath, Pramod; Fernandes, Tammy; Kulkarni, Santosh; and Anbalan, Ashok 08584073 Cl. 716-136.
Novack, Candice DeLeo; and Bansal, Amitabh, to Avon Products, Inc. Cosmetic compositions of reactively blended copolymers 08580238 Cl. 424-78.03.
Novak, Joseph Thomas; and Green, Matthew Christopher, to Irwin Industrial Tool Company Hole cutter with axially-elongated aperture defining multiple fulcrums 08579554 Cl. 408-204.
Novak, Joseph Thomas; and Green, Matthew Christopher, to Irwin Industrial Tool Company Hole cutter with axially-elongated aperture defining multiple fulcrums 08579555 Cl. 408-204.
Novak, Voytek; Cubr, Anthony E.; and Shripathy, Vivekananda, to GM Global Technology Operations LLC System and method for detecting vehicle wake-up failure 08583305 Cl. 701-22.
Novak, W. Thomas; Smith, Daniel G.; and Holland, Lloyd, to Nikon Corporation Large scale metrology apparatus and method 08582119 Cl. 356-614.
Novak, William J.; Cole, Kathryn Y.; Hanks, Patrick L.; and Hilbert, Timothy L., to ExxonMobil Research and Engineering Company Hydroprocessing of high nitrogen feed using bulk catalyst 08580108 Cl. 208-254R.
Novartis AG: See--
Biel, Roger; Cocora, Gabriela; Hagmann, Peter; Haken, Uwe; Hall, Jordan; Heinrich, Axel; Lässig, Günter; Lu, Honghui; Mulcahy, Deborah J.; Pope, Carlton; Reece, Daryl; and Seiferling, Bernhard 08580163 Cl. 264-1.32.
Campbell, Emma Michelle; Parveen, Sofia; Buechler, Joe; and Valkirs, Gunars 08580260 Cl. 424-133.1.
Hook, David; Riss, Bernhard; Kaufmann, Daniel; Napp, Matthias; Bappert, Erhard; Polleux, Philippe; Medlock, Jonathan; and Zanotti-Gerosa, Antonio 08580974 Cl. 548-550.
Ivri, Yehuda; De Young, Linda R.; Wu, Cheng H.; Cater, Miro S.; Kumar, Vijay; and Flierl, Markus 08578931 Cl. 128-200.16.
Lang, Hengyuan; Fryszman, Olga M.; Chang, Edcon; Lan, Jiong; and Fang, Yunfeng 08580838 Cl. 514-407.
Manley, Paul W; Shieh, Wen-Chung; Sutton, Paul Allen; Karpinski, Piotr H; Wu, Raeann; Monnier, Stéphanie; and Brozio, Jörg 08580806 Cl. 514-275.
Novatek Microelectronics Corp.: See--
Wu, Chung-Wen; Tu, Chien-Cheng; and Lin, Wen-Hsuan 08582328 Cl. 363-21.15.
Novelis Inc.: See--
Godin, Daniel; and LeBlanc, Rejean 08579012 Cl. 164-463.
Hymas, Jason D.; Reeves, Eric W.; and Tingey, John Steven 08580186 Cl. 266-196.
Novell, Inc.: See--
Burch, Lloyd Leon; Brown, Jeremy Ray; Sabin, Jason Allen; Kranendonk, Nathaniel Brent; Larsen, Kal A.; Fairbanks, Michael; Jorgensen, Michael John; and Biggs, Thomas Larry 08583788 Cl. 709-224.
Novellus Systems, Inc.: See--
Lang, Chi-I; Huang, Judy H.; Barnes, Michael; and Shanker, Sunil 08580697 Cl. 438-761.
Noviello, Joseph C: See--
Claus, Matthew W; and Noviello, Joseph C 08583540 Cl. 705-37.
Novo Nordisk A/S: See--
Christiansen, Asger Voss 08579868 Cl. 604-211.
Klint, Henrik Sonderskov; Radmer, Jim; Smedegaard, Jorgen K; Nielsen, Jan Frank; Jensen, Peter Moller; and Jensen, Jens Moller 08579869 Cl. 604-240.
Radmer, Bo; Klint, Henrik Sønderskov; Kristensen, Johnny; Glejbøl, Kristian; Andersen, Mikael; Kamstrup-Holm, Lisbeth; Von Bülow, Martin; Møller-Jensen, Peter; Sparholt, Philip Albert; Hofstätter, Thibaud; and Toft, Tue Kjærgaard 08579861 Cl. 604-173.
Novomer, Inc.: See--
Allen, Scott D.; Simoneau, Chris A.; Salladay, John M.; Hatfield, David M.; and Stevens, John W. 08580911 Cl. 528-196.
Novotney, Donald J.: See--
Tupman, David John; Farrar, Doug M.; Fisher, Jr., Joseph R.; Dorogusker, Jesse L.; and Novotney, Donald J. 08581449 Cl. 307-126.
Novozymes A/S: See--
Morant, Marc D.; Patkar, Shamkant; and Ding, Hanshu 08581042 Cl. 800-284.
Novozymes, Inc.: See--
McBrayer, Brett; Shaghasi, Tarana; and Vlasenko, Elena 08580536 Cl. 435-41.
Nowak, Edward J.: See--
Anderson, Brent A.; Bryant, Andres; Clark, Jr., William F.; Ellis-Monaghan, John Joseph; and Nowak, Edward J. 08580601 Cl. 438-69.
Nowatari, Hiromi; Seo, Satoshi; Ohsawa, Nobuharu; Ushikubo, Takahiro; and Tsutsui, Tetsuo, to Semiconductor Energy Laboratory Co., Ltd. Light-emitting element, light-emitting device, lighting device, and electronic device 08581266 Cl. 257-87.
Nowicki, Tyler B.: See--
Bernal, Ariel J.; Thirumurthi, Ashok; McCool, Michael; Nowicki, Tyler B.; and Pabst, Hans 08582909 Cl. 382-254.
Noxilizer, Inc.: See--
Matsuuchi, Hidetaka; Hirose, Tomoyuki; Iwasaki, Ryuichi; Mike, Masaaki; Masuda, Shigeru; Hayashi, Hirofumi; Tanibata, Toru; Kim, Joongsoo; Lee, Sang Hun; Koo, Jae-Mo; Weihe, Orion; and Way, Andrew 08580086 Cl. 204-157.46.
Nozaki, Satoshi; and Shirai, Tsutomu, to Unicharm Corporation Process for producing bulky paper with concavo-convex pattern 08580080 Cl. 162-115.
Nozawa, Osamu: See--
Shiota, Yuki; and Nozawa, Osamu 08580466 Cl. 430-5.
Nozawa, Shinnosuke; to Sharp Kabushiki Kaisha Backlight unit 08579456 Cl. 362-97.3.
Nozawa, Syuji: See--
Ogasawara, Kosuke; Saito, Susumu; and Nozawa, Syuji 08580077 Cl. 156-345.25.
NSK, Ltd.: See--
Minamigata, Takahiro 08578812 Cl. 74-492.
NTN Corporation: See--
Hori, Masaharu; and Yamamoto, Tetsuya 08578610 Cl. 29-898.02.
Ikki, Kentaro; Norimatsu, Takayuki; and Nishikawa, Kentarou 08578791 Cl. 73-862.045.
Kaimi, Masayuki; Shimizu, Kazuto; Bitou, Kimihiko; Ishiyama, Nao; and Yamashita, Nobuyoshi 08578611 Cl. 29-898.02.
Takahashi, Toru; and Shibata, Kiyotake 08581457 Cl. 310-67R.
Yamasaki, Tatsuya 08579090 Cl. 188-72.8.
NTT DoCoMo, Inc.: See--
Hou, Xiaolin; Zhang, Zhan; and Kayama, Hidetoshi 08583134 Cl. 455-452.2.
Ishii, Hiroyuki; and Kishiyama, Yoshihisa 08583152 Cl. 455-501.
Iwamura, Mikio; Harada, Atsushi; and Ishii, Minami 08583191 Cl. 455-574.
Iwamura, Mikio; and Nakamura, Takehiro 08583113 Cl. 455-434.
Kawai, Kunihiro; Okazaki, Hiroshi; and Narahashi, Shoichi 08581677 Cl. 333-205.
Mori, Shinichi 08583080 Cl. 455-411.
Nagato, Rie; and Ishikawa, Yoshihiro 08583124 Cl. 455-444.
Onda, Yasushi; Kano, Izua; Kamiya, Dai; Kushida, Yusuke; Murakami, Keiichi; Yamada, Eiju; and Yamada, Kazuhiro 08584148 Cl. 719-329.
Shen, Jiyun; and Oda, Yasuhiro 08583050 Cl. 455-67.11.
Suzuki, Mototsugu; Imai, Tetsurou; Kitao, Koushirou; and Ishikawa, Yoshihiro 08582691 Cl. 375-316.
Usuda, Masafumi; Umesh, Anil; and Nakamura, Takehiro 08582477 Cl. 370-278.
Nuance Communications, Inc.: See--
Berton, André; Block, Hans-Ulrich; Gehrke, Manfred; Regel-Brietzmann, Peter; Schachtl, Stefanie; and Schön, Friedrich 08583441 Cl. 704-270.
Longe, Michael R.; Bradford, Ethan R.; Kay, David J.; and van Meurs, Pim 08583087 Cl. 455-414.1.
Nuccetelli, Gary L.; Wang, Lei; and Swiler, Daniel R., to Ferro Corporation Pigment additive for improving solar reflectance 08580028 Cl. 106-456.
Nuch, Voha; Wang, David; Ma, Yue; Chen, Fufa; Wang, Jian; Huang, Yunwen; Xie, Liangzhi; and He, Chuan, to ACM Research (Shanghai) Inc. Methods and apparatus for cleaning semiconductor wafers 08580042 Cl. 134-10.
Nuclea Biomarkers, LLC: See--
Muraca, Patrick J. 08580926 Cl. 530-387.1.
Nukiyama, Kazuhiro: See--
Kamada, Tsuyoshi; Suzuki, Toshiaki; and Nukiyama, Kazuhiro 08581821 Cl. 345-94.
Numakura, Masaki: See--
Kikuoka, Shinichiro; and Numakura, Masaki 08578900 Cl. 123-90.17.
Numano, Masaru: See--
Shimomura, Hiroshi; and Numano, Masaru 08582260 Cl. 361-56.
Numata, Aihiko; Hoshi, Hikaru; and Tamamori, Kenji, to Canon Kabushiki Kaisha Method of producing three-dimensional photonic crystal and optical functional device 08580031 Cl. 117-3.
Numata, Masahito; to Canon Kabushiki Kaisha Information processing apparatus, output method, and storage medium 08582162 Cl. 358-1.15.
Nunami, Koji: See--
Ono, Hisashi; and Nunami, Koji 08579617 Cl. 418-150.
Nunley, Pele Jason: See--
Crawford, Michael Burl; and Nunley, Pele Jason 08579046 Cl. 175-227.
Nunokawa, Kenichi: See--
Shinojima, Ryota; Fujii, Hiroyuki; and Nunokawa, Kenichi 08583115 Cl. 455-435.1.
Nuovo Pignone S.p.A.: See--
Tonno, Giovanni; Paci, Mariateresa; D'Ercole, Michele; Russo, Alessandro; Stewart, Jesse F.; Chiu, Ya-Tien; Ulivi, Marco; and Baldassarre, Antonio 08578717 Cl. 60-779.
Nusbaum, Howard G. Retractable air deflection apparatus for reduction of vehicular air drag 08579357 Cl. 296-180.1.
Nussbaumer, Thomas; to Levitronix GmbH Bearingless electric rotary drive 08581462 Cl. 310-90.5.
Nussenblatt, Eric Lucien: See--
Schmaling, David N.; Smith, Clifford B.; and Nussenblatt, Eric Lucien 08578753 Cl. 73-12.01.
Nussenzveig, Roberto H.: See--
Prchal, Josef T.; Nussenzveig, Roberto H.; and Swierczek, Sabina I. 08580945 Cl. 536-24.33.
Nutter, Mark R.: See--
Eichenberger, Alexandre E.; Flachs, Brian K.; Johns, Charles R.; and Nutter, Mark R. 08583905 Cl. 712-241.
Nuventix, Inc.: See--
Mahalingam, Raghavendran; Heffington, Samuel N.; Darbin, Stephen P.; and Grimm, Daniel N. 08579476 Cl. 362-373.
NVIDIA Corporation: See--
Driemeyer, Thomas; and Herken, Rolf 08583724 Cl. 709-203.
Mount, George 08581969 Cl. 348-57.
Slavenburg, Gerrit A.; Fox, Thomas F.; and Cook, David Robert 08581833 Cl. 345-107.
Nvidia Technology UK Limited: See--
Tabet, Tarik; and Luschi, Carlo 08582632 Cl. 375-224.
Nwoke, Ugo S.: See--
Nwoke, Ugochukwu Shedrach 08579749 Cl. 475-5.
Nwoke, Ugochukwu Shedrach; to Nwoke, Ugo S. Transmission device 08579749 Cl. 475-5.
NXP B.V.: See--
Chabot, Xavier 08583998 Cl. 714-795.
Magnee, Petrus H. C.; Koning, Jan Jacob; and Van Beek, Jozef T. M. 08580596 Cl. 438-50.
Slikkerveer, Peter; and Burfeind, Susanne 08581692 Cl. 340-5.6.
Tiggelman, Markus Petrus Josephus; and Reimann, Klaus 08579195 Cl. 235-439.
Van Dalen, Rob; and Oncala, Sergio Masferrer 08581891 Cl. 345-207.
Wagner, Mathias; and Malzahn, Ralf 08583880 Cl. 711-155.
Nyamagouda, Sunil Ramappa: See--
Nagaraj, Guruprasad; Murthy, Krishna Koteshwara Sridhar; Patil, Vijayalaxmi; Muniyappa, Nataraja Kambadahalli; and Nyamagouda, Sunil Ramappa 08581933 Cl. 345-649.
Nyberg, Alexander; and Nylund, Per, to Newbeam Sweden AB Device for manufacture of an oriented strand board beam 08579002 Cl. 156-581.
Nyenhuis, Jack; Ruster, Matthew; Babick, Tod; Petertyl, Gary; and DeBruyne, Bradley, to DSA International, Inc. Removable attachment bar for a flip-top table 08578864 Cl. 108-115.
Nyeste, Patrick Gabor: See--
Champion, David Frederick; Nyeste, Patrick Gabor; Smith, Jeffrey John; and Windell, David Thomas 08584091 Cl. 717-125.
Nygard, Tony: See--
Money, David; Nygard, Tony; Seligman, Peter; Ibrahim, Ibrahim; and Zhang, Andy L. 08583246 Cl. 607-57.
Nylander, Tomas: See--
Hiltunen, Kimmo; Nylander, Tomas; and Vikberg, Jari 08583135 Cl. 455-452.2.
Nylund, Per: See--
Nyberg, Alexander; and Nylund, Per 08579002 Cl. 156-581.
Nytell Software LLC: See--
Jacobs, Eino; and Ang, Michael 08583895 Cl. 712-24.
Nyuli, Colin A.: See--
Lane, Randy Matthew; and Nyuli, Colin A. 08579964 Cl. 623-2.11.