LIST OF PATENTEES
TO WHOM
PATENTS WERE ISSUED ON THE 12th DAY OF November, 2013
AND TO WHOM
REEXAMINATION CERTIFICATES WERE ISSUED
DURING THE WEEK BEGINNING THE 4th DAY OF November, 2013.
NOTE--Arranged in accordance with the first significant character or word of the name
(in accordance with city and telephone directory practice).

E I du Pont de Nemours and Company: See--
Dhawan, Rajiv; Hargis, Annalisa; and Ritter, Joachim C 08580910 Cl. 528-186.
Hung, Ming-Hong; Ameduri, Bruno; and Kostov, Georgi 08580897 Cl. 525-326.3.
Peng, Sheng; Yake, Allison Mary; and Iaconelli, Cheryl Lynn 08580715 Cl. 507-205.
Zahr, George Elias 08580386 Cl. 428-413.
Zhao, Ruofei; Yin, Guangjun; and Ye, Changming 08580377 Cl. 428-336.
E Ink Corporation: See--
Walls, Michael D.; Feick, Jason D.; and Whitesides, Thomas H. 08582196 Cl. 359-296.
e-Vision Smart Optics, Inc.: See--
Blum, Ronald D.; and Kokonaski, William 08579435 Cl. 351-159.39.
E. I. du Pont de Nemours and Company: See--
McBride, Kevin E; Lassner, Michael W; Looger, Loren L; and McGonigle, Brian 08580556 Cl. 435-252.3.
Russell, William Richard; and Schultz, John Anthony 08580915 Cl. 528-395.
E. I. DuPont de Nemours and Company: See--
Kourtakis, Kostantinos 08580389 Cl. 428-532.
E.G.O. Elektro-Geraetebau GmbH: See--
Egenter, Christian 08581137 Cl. 219-100.
E2 LLC: See--
Grau, Buket; Gale, David Robert; Musgrave, Sam Anne; Perkins, George McGee; Edhouse, Mark Jeffrey; Graham, Marc; and Kadamus, Christopher 08579849 Cl. 604-9.
Eadon, George: See--
Kolovski, Vladimir; Wu, Zhe; and Eadon, George 08583589 Cl. 706-55.
Eagle Harbor Holdings, LLC: See--
Preston, Dan Alan; and Lutter, Robert Pierce 08583292 Cl. 701-1.
Eagle Industry Co., Ltd.: See--
Arita, Yasuhisa 08579297 Cl. 277-551.
Eames, Andrew: See--
Mirtich, Brian V.; Eames, Andrew; Phillips, Brian S.; Tremblay, II, Robert J.; Keating, John F.; and Whitman, Steven 08582925 Cl. 382-309.
Earnshaw, Mark; Heo, Youn Hyoung; Datsen, Margarita; and Cai, Zhijun, to BlackBerry Limited Handling physical uplink shared channel transmissions 08582522 Cl. 370-329.
Earnshaw, Mark; Fong, Mo-Han; Cai, Zhijun; Xu, Hua; and Heo, Youn Hyoung, to BlackBerry Limited System and method for channel state feedback in carrier aggregation 08582638 Cl. 375-240.
Earth Renaissance Technologies, LLC: See--
Theodore, Marcus G. 08580122 Cl. 210-719.
East Carolina University: See--
Virag, Jitka A. I.; and Dries, Jessica L. 08580739 Cl. 514-16.4.
Easterbrook, Kevin B.: See--
Thomas, William L.; Ellis, Michael D.; Easterbrook, Kevin B.; Reichardt, M. Scott; and Knee, Robert A. 08584184 Cl. 725-91.
Eastman Chemical Company: See--
Kuo, Thauming; and Hall, Phillip Bryan 08580872 Cl. 523-501.
Eastman Kodak Company: See--
Hoff, Joseph W. 08579425 Cl. 347-86.
Pitas, Jeffrey A.; Luther, Richard G.; and Regelsberger, Matthias H. 08583008 Cl. 399-114.
Rapkin, Alan E.; and Sherwood, Walter B. 08582988 Cl. 399-24.
Rudolph, Paul; Bartley, Russell L.; Piatt, Michael J.; and Duke, Ronald J. 08582156 Cl. 358-1.15.
Suchy, Donna P.; and Herrick, Diane M. 08580331 Cl. 427-58.
Xie, Yonglin; Yang, Qing; and Jech, Jr., Joseph 08579427 Cl. 347-89.
Eat Dirt, LLC: See--
Monaco, Dean; and Santo, III, John 08579172 Cl. 224-666.
Eaton Corporation: See--
Fox, Matthew George; and McMillan, Patrick John 08579752 Cl. 475-88.
Maloney, James Gerard; and Samuelson, Eric Alan 08582279 Cl. 361-652.
Ebadollahi, Shahram; Hu, Jianying; Kohn, Martin S.; Lee, Noah; Sorrentino, Robert K.; Sun, Jimeng; and Wang, Fei, to International Business Machines Corporation Mining temporal patterns in longitudinal event data using discrete event matrices and sparse coding 08583586 Cl. 706-53.
Ebara Corporation: See--
Kobayashi, Yoichi 08582122 Cl. 356-630.
eBay Inc.: See--
Ferrandiz, Josep M. 08584122 Cl. 718-101.
Gadiyar, Vivek; Singh, Jogender; and Zenzin, Oleg 08579731 Cl. 473-407.
Granbery, John Hastings 08583933 Cl. 713-179.
Normile, Tom 08579187 Cl. 235-375.
Sundaresan, Neelakantan 08583633 Cl. 707-723.
Ebdon, Deren George; and Peterson, Robert W., to Lipari, Paul A. System and method for managing an object cache 08583871 Cl. 711-125.
Ebe, Hirofumi: See--
Ishimaru, Yasuto; and Ebe, Hirofumi 08581110 Cl. 174-260.
Eberhard, Franz: See--
Baur, Johannes; Härle, Volker; Hahn, Berthold; Weimar, Andreas; Oberschmid, Raimund; Guenther, Ewald Karl Michael; Eberhard, Franz; Richter, Markus; and Strauss, Jörg 08581279 Cl. 257-98.
Eberhard, Wilfrid: See--
Martin, Gerhard Hermann; Eberhard, Wilfrid; and Ummer, Bernd 08583334 Cl. 701-51.
Eberheim, Andreas; Nagel, Thomas; Thieme, Andre; and Zeun, Hendrik, to Endress + Hauser Conducta Gesellschaft für Mess- und Regeltechnik mbH + Co. KG Conductivity sensor with switching between transmitting and receiving coil 08581575 Cl. 324-204.
Eberle, Michael J.; to Vascular Imaging Corporation Optical imaging probe connector 08583218 Cl. 600-478.
Eberle, Thomas: See--
Pan, Junyou; Eberle, Thomas; and Buchholz, Herwig 08581262 Cl. 257-77.
Ebersole, Garrett: See--
Stopek, Joshua; Elachchabi, Amin; Broom, Daniel; Ebersole, Garrett; and Witherell, Ryan 08579924 Cl. 606-151.
Ebert, Detlef; and Hummel, Michael, to Poly-Clip System GmbH & Co. KG Displacer FCA Y 08579682 Cl. 452-48.
Ebert, Todd; Kimmel, Keith D.; and Laurello, Vincent P., to Siemens Energy, Inc. Particle separator in a gas turbine engine 08578720 Cl. 60-806.
Ebihara, Shun-ichi; Ishida, Tsutomu; Koyama, Shoichi; and Matsui, Norio, to Canon Kabushiki Kaisha Recording sheet surface detection apparatus and image forming apparatus 08582116 Cl. 356-600.
Ebihara, Shunichi: See--
Ishida, Tsutomu; Ebihara, Shunichi; Matsui, Norio; and Koyama, Shoichi 08582990 Cl. 399-45.
Ebihara, Tomoyuki; Moriguchi, Kazuma; and Hayashi, Keiichi, to Yanmar Co., Ltd. Mower deck lifting device of ride-on mower 08578687 Cl. 56-17.1.
Ebinuma, Ryosuke: See--
Kagoshima, Kazuhiro; Yanagida, Hiroshi; and Ebinuma, Ryosuke 08579279 Cl. 271-185.
Eby, William H.; to Monsanto Technology LLC Soybean cultivar S110134 08581056 Cl. 800-312.
Eby, William H.; to Monsanto Technology LLC Soybean cultivar 08351577 08581057 Cl. 800-312.
EchoStar Technologies, L.L.C.: See--
Martch, Henry Gregg; Bazata, Michael John; and Mauser, Benjamin Raymond 08583969 Cl. 714-57.
McCarthy, III, Bernard A. 08584178 Cl. 725-80.
Moran, William Norris; Cavanaugh, Michael; and Menon, Anand 08584173 Cl. 725-59.
Taxier, Karen Michelle; and Coburn, Matthew 08582957 Cl. 386-291.
VanDuyn, Luke 08584167 Cl. 725-45.
Eckenberg, Dax: See--
Le Chevalier, Vincent; Geiger, Charles F.; Desai, Rahul Ravindra Mutalik; Joshi, Ashit; Eckenberg, Dax; Richardson, Joshua; and Tworetzky, Brent 08584259 Cl. 726-28.
Eckhart, Lewis V. Golf putter with adjustable head 08579716 Cl. 473-244.
Eckhof, Stephan: See--
Marnay, Theirry; Bertagnoli, Rudolf; Magee, Frank; and Eckhof, Stephan 08579978 Cl. 623-17.15.
Eckhoff, Doug: See--
Finn, Todd; Burdick, Gale; and Eckhoff, Doug 08579539 Cl. 403-390.
Eco Creation International, Inc.: See--
Jeon, Ki Jeong 08581015 Cl. 585-241.
Eco Oxygen Technologies, LLC: See--
Clidence, David A.; and Speece, Richard E. 08580125 Cl. 210-758.
Ecolab USA Inc.: See--
Man, Victor Fuk-Pong; DeNoma, Michael Charles; Killeen, Yvonne Marie; and Lentsch, Steven Eugene 08580727 Cl. 510-340.
Wolf, Boyd; Hohl, Beth; and Leuchten, Elke 08578545 Cl. 15-118.
ECS Holdings, Inc.: See--
Malyala, Rajashekharam V.; and Golden, Stephen J. 08580216 Cl. 423-239.1.
Eda, Yoshie: See--
Chino, Takashi; Gomi, Satoshi; Miyashita, Koichi; Nagasawa, Minoru; and Eda, Yoshie 08581153 Cl. 219-446.1.
Edamitsu, Takashi; Chosokabe, Satoru; Terasaki, Masaya; and Tanaka, Kazuhiro, to Minebea Co., Ltd. Illuminator allowing a wide luminous intensity distribution 08579489 Cl. 362-606.
Edan Instruments, Inc.: See--
Yin, Xin; Yan, Binbin; and Xie, Xicheng 08583203 Cl. 600-340.
Edel, John: See--
Moore, Randall P.; Jackson, Kevin; Baloga, Stephen; Chen, Bobby I. T.; Halley, Berani A. C.; and Edel, John 08580214 Cl. 423-210.
Edelman, Gerald M.: See--
Fleischer, Jason G.; Szatmáry, Botond; Hutson, Donald B.; Moore, Douglas A.; Snook, James A.; Edelman, Gerald M.; and Krichmar, Jeffrey L. 08583286 Cl. 700-259.
Edelson, Lawrence H.; Daly, Michael P.; and Roessig, Trey, to Analog Devices, Inc. Adaptive phase offset controller for multi-channel switching power converter 08581440 Cl. 307-82.
Edgar, Albert D.; Iglehart, David C.; and Yeager, Rick B., to TCMS Transparent Beauty LLC System and method for applying a reflectance modifying agent to change a persons appearance based on a digital image 08582830 Cl. 382-115.
Edge 3 Technologies, Inc.: See--
El Dokor, Tarek; King, Joshua; Cluster, Jordan; and Holmes, James Edwards 08582866 Cl. 382-154.
Edgecast Networks, Inc.: See--
Kim, Hayes; Peters, Robert J; Ruiz, Sergio Leonardo; and Segil, James 08583763 Cl. 709-218.
Peters, Robert J.; Elazary, Lior; and Sakata, Jayson G. 08583769 Cl. 709-221.
Edgenet, Inc.: See--
Clippard, Ric; Kommineni, Rajesh; Rudolph, Brian; and Rudolph, Scott 08582802 Cl. 382-100.
Edgeworth, Jonathan P.: See--
Unwin, Patrick; Macpherson, Julie; Dumitrescu, Ioana; and Edgeworth, Jonathan P. 08580104 Cl. 205-792.
Edholm, Christer; and Göransson, Bo, to Telefonaktiebolaget LM Ericsson (publ) Activation of code multiplexing 08582595 Cl. 370-441.
Edhouse, Mark Jeffrey: See--
Grau, Buket; Gale, David Robert; Musgrave, Sam Anne; Perkins, George McGee; Edhouse, Mark Jeffrey; Graham, Marc; and Kadamus, Christopher 08579849 Cl. 604-9.
Edie, Jason A.; Cooper, Lloyd Guyton Bowers; Dawson, John Caleb; Walker, II, Don Byron; and Windham, Jerrod Bradley, to Warsaw Orthopedic, Inc. Expandable intervertebral spacers and methods of use 08579979 Cl. 623-17.15.
Edilson Sedra B.V.: See--
Van Der Houwen, Gerrit Marinus 08580177 Cl. 264-259.
Edison Junior, LLC: See--
Siminoff, James; and Modestine, John 08578652 Cl. 47-62C.
Edmiston, Daryl R.: See--
Linder, Richard J.; Edmiston, Daryl R.; Johnson, Steven W.; and Schlegel, Karri L. 08579957 Cl. 623-1.11.
Edmonds, Chris: See--
Harding, John; Farley, Thomas; Goone, David; Crowley, Chris; Edmonds, Chris; Rowell, Mark; Sprecher, Jeffrey; Ivanov, Stanislav; and Sternard, Donald F. 08583542 Cl. 705-37.
Edmunds, Andrew: See--
Jeanguenat, André; Hall, Roger Graham; Loiseleur, Olivier; Trah, Stephan; Durieux, Patricia; Edmunds, Andrew; and Stoller, André 08580785 Cl. 514-243.
Edwards, David L.; Kemink, Randall G.; Olson, David C.; Pizzolato, Katie L.; and Torok, John G., to International Business Machines Corporation Customized thermal interface to optimize mechanical loading and thermal conductivity characteristics 08582297 Cl. 361-708.
Edwards, III, Earl E. Portable vehicle roof snow and ice removal apparatus 08578542 Cl. 15-97.3.
Edwards, John K.; Lewis, Blake H.; English, Robert M.; Hamilton, Eric; and Corbett, Peter F., to NetApp, Inc. Extension of write anywhere file system layout 08583892 Cl. 711-203.
Edwards Lifesciences, LLC: See--
Mortier, Todd J.; Schweich, Jr., Cyril J.; Vidlund, Robert M.; Keith, Peter T.; Paulson, Thomas M.; and Kusz, David A. 08579798 Cl. 600-37.
Edwards Limited: See--
Huntley, Graeme 08579596 Cl. 417-87.
Effrat, Jonathan J.: See--
Paskin, Mark A.; Poon, Kelly; Lim, Yew Jin; Wiley, Jon M.; and Effrat, Jonathan J. 08583672 Cl. 707-765.
Egalax—Empia Technology Inc.: See--
Chang, Chin-Fu; Lee, Cheng-Han; Tang, Chi-Hao; and Ho, Shun-Lung 08583401 Cl. 702-150.
Yeh, Shang-Tai; Chen, Jia-Ming; and Ho, Shun-Lung 08581604 Cl. 324-691.
Egami, Shinji: See--
Kinoshita, Hiroaki; Goto, Atsushi; Akiyama, Daisuke; Suga, Takeshi; Egami, Shinji; Tanabe, Makoto; Miyata, Akihito; Takechi, Takuya; and Akai, Masao 08579803 Cl. 600-182.
Egawa, Hiroyuki; and Shimizu, Masahiko, to Fujitsu Limited Communication device and control method 08581791 Cl. 343-703.
Egemo, Robert P.: See--
Shi, Yanwei; and Egemo, Robert P. 08583253 Cl. 607-62.
Egenter, Christian; to E.G.O. Elektro-Geraetebau GmbH Method for operating a heating device of an electric heating appliance having a plurality of heating devices 08581137 Cl. 219-100.
Eggebrecht, Detlev: See--
Diekmeyer, Heinrich; Eggebrecht, Detlev; and Feyerabend, Konrad 08583339 Cl. 701-70.
Eggeling, Christian: See--
Hell, Stefan; Belov, Vladimir N.; Kolmakov, Kirill; Westphal, Volker; Lauterbach, Marcel; Jakobs, Stefan; Wurm, Christian; Eggeling, Christian; and Ringemann, Christian 08580579 Cl. 436-546.
Eggert, Thorsten: See--
Michels, Andreas; Pütz, André; Maurer, Karl-Heinz; Eggert, Thorsten; and Jäger, Karl-Erich 08580549 Cl. 435-197.
Eglin, Paul; Queiras, Nicolas; Barraco, André; and Malburet, Francois, to Eurocopter Method of controlling and regulating the deflection angle of a tailplane in a hybrid helicopter 08583295 Cl. 701-4.
Eguchi, Hiroshi; Higashi, Toshikazu; and Eguchi, Tatsuya, to Konica Minolta Business Technologies, Inc. Image forming apparatus with multi-view display 08582152 Cl. 358-1.15.
Eguchi, Ken: See--
Nakakubo, Toru; Eguchi, Ken; and Watanabe, Mitsuhiro 08580458 Cl. 429-512.
Eguchi, Tatsuya: See--
Eguchi, Hiroshi; Higashi, Toshikazu; and Eguchi, Tatsuya 08582152 Cl. 358-1.15.
Eguchi, Yoshiaki: See--
Fukatani, Takayuki; Yamamoto, Yasutomo; Kawaguchi, Tomohiro; Takada, Masanori; and Eguchi, Yoshiaki 08583883 Cl. 711-161.
Yamamoto, Yasutomo; Iwamura, Takashige; and Eguchi, Yoshiaki 08583864 Cl. 711-112.
Egued, Nelson Alfonso Slow humectation container 08579107 Cl. 206-213.1.
Ehira, Masaya: See--
Takagi, Katsutoshi; Ehira, Masaya; Iwasaki, Yuki; and Goto, Hiroshi 08580093 Cl. 204-298.13.
Ehlinger, James C.; Gilboy, Christopher P.; and Gudelis, Marius J., to AT&T Intellectual Property II, L.P. Method and apparatus for implementing a high-reliability load balanced easily upgradeable packet technology 08582568 Cl. 370-386.
Ehrenberg, Rainer: See--
Westhof, Frank; Hoewelmeyer, Uwe; Loddenkoetter, Manfred; Ehrenberg, Rainer; Kruempelmann, Martin; and Gunschera, Frank 08578850 Cl. 101-247.
Ehrman, John R.; and Greiner, Dan F., to International Business Machines Corporation Parsing-enhacement facility 08583899 Cl. 712-208.
Ehsani, Farzad: See--
Huang, Jun; Kim, Yookyung; Billawala, Youssef; Ehsani, Farzad; and Master, Demitrios 08583416 Cl. 704-3.
Eichelberg, John W.; to Amazon Technologies, Inc. Integrated ventilation system for electronic equipment 08582292 Cl. 361-679.49.
Eichelberger, Kevin D.: See--
Brinkman, Mark J.; Dragonuk, Michael; Eichelberger, Kevin D.; Eichhorn, Chris; Gehlhar, Sarah; Holland, Gregory J.; Josephs, Michael A.; Lubich, Daniel J.; McElroy, Jeffrey L.; Peters, Laron L.; Potrzeba, Duane A.; de Leon, Hector Ramirez; and Souder, Christopher L. 08581080 Cl. 800-320.1.
Eichen, Elliot G.: See--
Olshansky, Robert; Eichen, Elliot G.; Mitsumori, Derek; and Sporel, Eric R. 08582724 Cl. 379-45.
Eichenberger, Alexandre E.: See--
Bondhugula, Uday Kumar; Eichenberger, Alexandre E.; O'Brien, John Kevin P.; Renganarayana, Lakshminarayanan; and Zhao, Yuan 08584103 Cl. 717-136.
Eichenberger, Alexandre E.; Flachs, Brian K.; Johns, Charles R.; and Nutter, Mark R., to International Business Machines Corporation Runtime extraction of data parallelism 08583905 Cl. 712-241.
Eichhorn, Chris: See--
Brinkman, Mark J.; Dragonuk, Michael; Eichelberger, Kevin D.; Eichhorn, Chris; Gehlhar, Sarah; Holland, Gregory J.; Josephs, Michael A.; Lubich, Daniel J.; McElroy, Jeffrey L.; Peters, Laron L.; Potrzeba, Duane A.; de Leon, Hector Ramirez; and Souder, Christopher L. 08581080 Cl. 800-320.1.
Eichhorn, Marc: See--
Pichler, Alexander; Raymond, Pierre; and Eichhorn, Marc 08583575 Cl. 706-15.
Eichhorn, Ole; and Brumme, Anne, to Leica Biosystems Imaging, Inc. Viewing digital slides 08582849 Cl. 382-128.
Eichler, Ben; Wroblewski, Douglas R.; and Tripodi, Joseph, to Zurn Industries, LLC Vandal-proof floor sink strainer 08578523 Cl. 4-292.
Eickmann, Juergen: See--
Buschjohann, Thomas; Eickmann, Juergen; and Kauert, Heiko 08579307 Cl. 280-124.109.
Eid, El-Sayed: See--
Stam, Joseph S.; Pierce, Mark W.; Bechtel, Jon H.; Spence, William R.; Turnbull, Robert R.; and Eid, El-Sayed 08583331 Cl. 701-49.
Eida, Mitsuru: See--
Mizuki, Yumiko; Yabunouchi, Nobuhiro; and Eida, Mitsuru 08580393 Cl. 428-690.
Eidenberger, Robert; Grundmann, Thilo; and Zöllner, Raoul Daniel, to Siemens Aktiengesellschaft Decision making mechanism, method, module, and robot configured to decide on at least one prospective action of the robot 08583284 Cl. 700-246.
Eidson, Mark: See--
Goff, Lonnie Calvin; Conley, Michael; and Eidson, Mark 08581548 Cl. 320-116.
Eiffler, Juergen: See--
Tirtowidjojo, Max M.; Au-Yeung, Patrick H.; Chakraborty, Debashis; Eiffler, Juergen; Groenewald, Heinz; Hirsekorn, Kurt F.; Kokott, Manfred; Kruper, Jr., William J.; Luebbe, Thomas U.; Meemann, Holger; Sexton, Shirley S.; Wenzel, Peter; and Wobser, Marcus 08581012 Cl. 570-160.
Tirtowidjojo, Max M.; Chakraborty, Debashis; Eiffler, Juergen; Hirsekorn, Kurt F.; and Kruper, Jr., William J. 08581011 Cl. 570-159.
Eifrig, Robert O.: See--
Wang, Limin; Yu, Yue; Eifrig, Robert O.; Zhou, Jian; Baylon, David M.; Panusopone, Krit; Fang, Xue; and Luthra, Ajay K. 08582652 Cl. 375-240.16.
Eisai R&D Management Co., Ltd.: See--
Ono, Yuichi; Nakagawa, Yasuko; and Nakatani, Tomoya 08580523 Cl. 435-7.1.
Eisenberg, Andrew Lawrence: See--
Knox, John Michael Page; Landry, David Matthew; Ibrahim, Samir; and Eisenberg, Andrew Lawrence 08582790 Cl. 381-314.
Eisenhandler, Jon; Averill, Richard F.; and Goldfield, Norbert I., to 3M Innovative Properties Company Medical diagnosis derived from patient drug history data 08579811 Cl. 600-300.
Eisensehr, Markus: See--
Aurnhammer, Andreas; Eisensehr, Markus; Hagenauer, Andreas; and Huttenhofer, Manfred 08583285 Cl. 700-255.
Eiting, Thomas: See--
Barreleiro, Paula; Eiting, Thomas; Taden, Andreas; and Erpenbach, Siglinde 08580726 Cl. 510-330.
Eiza, Chie: See--
Shimada, Hirokazu; Toyoda, Yoshimi; Yoshitome, Hideki; Maeda, Satoshi; and Eiza, Chie 08582494 Cl. 370-315.
Eiznhamer, David A.: See--
Zembower, David E.; and Eiznhamer, David A. 08580834 Cl. 514-406.
Eken, Yalcin A.; and Katzin, Peter J., to Hittite Microwave Corporation Logarithmic mean-square power detector 08581574 Cl. 324-140R.
Ekkizogloy, Luke M.: See--
Dybsetter, Gerald L.; and Ekkizogloy, Luke M. 08583395 Cl. 702-119.
Ekkizogloy, Luke M.; Hahin, Jayne C.; Hosking, Lucy G.; and Dybsetter, Gerald L., to Finisar Corporation Inter-transceiver module communication for firmware upgrade 08582974 Cl. 398-135.
Ekkizogloy, Luke M.; and Daghighian, Henry M., to Finisar Corporation Logging mechanism for an intelligent transmitter module 08582978 Cl. 398-182.
Ekladyous, Albert; Kiedaisch, Kevin William; Kumar, Arun; Partch, Thomas William; Wilds, John Wesley; Glasgow, Candace Carolyn; and Abdelnour, Sleiman, to Ford Global Technologies, LLC Vision-based headlamp aiming 08582091 Cl. 356-121.
El Dokor, Tarek; King, Joshua; Cluster, Jordan; and Holmes, James Edwards, to Edge 3 Technologies, Inc. Method and apparatus for disparity computation in stereo images 08582866 Cl. 382-154.
El-Maleh, Khaled Helmi: See--
Mahadevan, Vijay; Pillai, Brijesh; El-Maleh, Khaled Helmi; Shi, Fang; and Raveendran, Vijayalakshmi R. 08582660 Cl. 375-240.25.
El-Moussa, Fadi; and Tay, Hui Min June, to British Telecommunications public limited company Method and apparatus for detecting abnormal traffic in a network 08584236 Cl. 726-23.
Elaasar, Maged E.; to International Business Machines Corporation Computer method and apparatus for chaining of model-to-model transformations 08583413 Cl. 703-22.
Elachchabi, Amin: See--
Stopek, Joshua; Elachchabi, Amin; Broom, Daniel; Ebersole, Garrett; and Witherell, Ryan 08579924 Cl. 606-151.
Elaydi, Abdul: See--
Krishnamoorthy, Ravishanker; Yang, Yun; and Elaydi, Abdul 08582227 Cl. 360-69.
Elazary, Lior: See--
Peters, Robert J.; Elazary, Lior; and Sakata, Jayson G. 08583769 Cl. 709-221.
Elbe, Hans-Ludwig: See--
Dunkel, Ralf; Elbe, Hans-Ludwig; Greul, Jörg Nico; Gayer, Herbert; Seitz, Thomas; Dahmen, Peter; and Wachendorff-Neumann, Ulrike 08580971 Cl. 548-374.1.
Elbert, Lev: See--
Avila, J. Albert; Elbert, Lev; Estes, Andy; Famiglio, Mark; Johnson, Brian; Sackett, Jason; Saul, Russ; Worthington, Norman; Juckett, Baird; Lincoln, Rob; Ruth, Don; and Stipe, Michael 08583430 Cl. 704-235.
ELC Management LLC: See--
Bickford, William R. 08578948 Cl. 132-317.
Cheng, Jing; Chen, Chia-Wen; Schnittger, Steven Francis; and Lu, Ming 08580319 Cl. 424-725.
Elce, Edmund: See--
Knapp, Brian; Elce, Edmund; Bell, Andrew; Burns, Cheryl; Kaiti, Sridevi; Kocher, Brian; Ng, Hendra; Patel, Yogesh; Sakamoto, Masanobu; Wu, Xiaoming; and Zhang, Linda 08580477 Cl. 430-270.1.
Eldering, Charles A.; to Empire Technology Development, LLC Elastomeric wave tactile interface 08581873 Cl. 345-173.
Eldesouki, Munir; Deen, Mohamed Jamal; and Fang, Qiyin, to King Abdulaziz City Science and Technology High-speed analog photon counter and method 08581172 Cl. 250-214A.
EldoLAB Holding B.V.: See--
Welten, Petrus Johannes Maria; and Saes, Marc 08581521 Cl. 315-312.
Electricfil Automotive: See--
Raquin, Stéphane; and Duault, Frédéric 08579634 Cl. 439-31.
Electro Industries/Gauge Tech: See--
Banhegyesi, Tibor 08581169 Cl. 250-208.4.
Electrolux Home Products Corporation, N.V.: See--
Bohac, Jiri; Stahlmann, Rolf; and Lampe, Hansjörg 08578951 Cl. 134-113.
Electrolux Home Products, Inc.: See--
McCollough, Thomas W.; Watts, Russell; Ducharme, David R.; and Maxie, Gerald 08578721 Cl. 62-73.
Electronics and Telecommunications Research Institute: See--
Choi, Chang-Ho 08582575 Cl. 370-392.
Chung, Yun Su; Jung, Sung Uk; Lee, Yongjin; and Moon, Ki Young 08582833 Cl. 382-118.
Hong, Seung Eun; Kim, Kyeongpyo; Kim, Yong Sun; and Lee, Woo Yong 08582603 Cl. 370-474.
Jang, Eun Hye; Cho, Young Jo; Lee, Jae Yeon; Chi, Su Young; and Chun, Byung Tae 08579838 Cl. 601-35.
Jang, In Sung; Lee, Moonsoo; An, Kyoung Hwan; Min, Kyoung-Wook; and Kim, Ju Wan 08583365 Cl. 701-426.
Jeong, Se-Yoon; Choi, Hae-Chul; Seo, Jeong-Il; Beack, Seung-Kwon; Jang, In-Seon; Kim, Jae-Gon; Moon, Kyung-Ae; Jang, Dae-Young; Hong, Jin-Woo; Kim, Jin-Woong; Ahn, Chang-Beom; Oh, Seoung-Jun; Sim, Dong-Gyu; Park, Ho-Chong; Lee, Yung-Lyul; and Jeon, Su-Yeol 08582657 Cl. 375-240.2.
Kim, Hyuk; Jeon, In San; Kim, Seong Min; and Koo, Bon Tae 08583975 Cl. 714-748.
Kim, Won Young; Choi, Won Hyuk; Hur, Sung Jin; and Choi, Wan 08583816 Cl. 709-231.
Kim, Yun-Joo; Lee, Jae-Seung; and Lee, Sok-Kyu 08582489 Cl. 370-312.
Koo, Han-seung; Kwon, Eun-jung; Kim, Soon-choul; Kim, Hee-jeong; Jeong, Young-ho; Kwon, O-hyung; and Lee, Soo-in 08583930 Cl. 713-171.
Lee, Bong-Ho; Lee, Hyun; Lee, Gwang-Soon; Lee, Yong-Hoon; Hur, Namho; Jung, Kwanghee; and Lee, Soo-In 08584190 Cl. 725-118.
Lee, Il-Gu; Choi, Eun-Young; and Lee, Sok-Kyu 08582418 Cl. 370-204.
Moon, Jung Hwan; Kim, Won Ho; and Sohn, Ki Wook 08584101 Cl. 717-133.
Oh, Jong Ee; Cheong, Min Ho; and Lee, Sok Kyu 08582686 Cl. 375-295.
Park, Jonghyurk; and Kang, Seung Youl 08581235 Cl. 257-29.
Park, Manho 08582776 Cl. 380-277.
Park, Soon-gi; Shin, Yeon-seung; Kim, Hyung-sub; Kim, Yeong-jin; Hwang, In-tae; Yoon, Gil-sang; and Lee, Jeong-hwan 08582513 Cl. 370-329.
Park, Sung-Ik; Kim, Heung-Mook; Oh, Wangrok; and Kang, Donghoon 08582689 Cl. 375-301.
Park, Yun Kyung; and Lee, Jeun Woo 08583150 Cl. 455-466.
Seo, Bangwon; Ko, Young Jo; and Ahn, Jae Young 08582678 Cl. 375-267.
Shin, Sung Moon; Kim, Min Taig; Kim, Yeong Jin; and Kim, Dae Sik 08583125 Cl. 455-445.
Son, Jeong Ho 08581689 Cl. 340-4.2.
Elefant, Dan: See--
Dillon, Harrison F.; Elefant, Dan; Day, Anthony G.; Franklin, Scott; and Wittenberg, Jon 08580540 Cl. 435-134.
Element ID, Inc.: See--
Romaine, John E.; and Martin, David L 08581722 Cl. 340-539.13.
Elenbaas, Jacco: See--
Duis, Jeroen Antonius Maria; Rietveld, Jan Willem; and Elenbaas, Jacco 08582945 Cl. 385-137.
Elfner, Axel E.; to International Business Machines Corporation Facilitating the sending of mail from a restricted communications network 08583739 Cl. 709-206.
Elgersma, Michael R.: See--
Hartman, Randolph G.; and Elgersma, Michael R. 08582086 Cl. 356-5.01.
Elhard, Joel D.: See--
Heintz, Amy M.; Christiaen, Anne-Claire; Vijayendran, Bhima Rao; Elhard, Joel D.; Lalgudi, Ramanathan S.; Robbins, Wayne B.; Gupta, Abhishek; and Cafmeyer, Jeffrey 08581158 Cl. 219-553.
Eli Lilly and Company: See--
Allen, John Gordon; Briner, Karin; Galka, Christopher Stanley; Martinez-Grau, Maria Angeles; Reinhard, Matthew Robert; Rodriguez, Michael John; Rothhaar, Roger Ryan; Tidwell, Michael Wade; Victor, Frantz; Zhang, Deyi; Boyd, Steven Armen; Deo, Arundhati S.; Lee, Wai-Man; Siedem, Christopher Stephen; and Singh, Ajay 08580780 Cl. 514-217.01.
Eliasson, Daniel: See--
Dahlén, Erik; and Eliasson, Daniel 08578551 Cl. 15-316.1.
Eliaz, Amir; to MagnaCom Ltd. Low-complexity, highly-spectrally-efficient communications 08582637 Cl. 375-233.
Elite Semiconductor Memory Technology Inc.: See--
Chen, Chung-Zen 08581560 Cl. 323-266.
Elizalde, Oihana; Lucas, Frederic; Steinbrecher, Angelika Maria; and Tuchbreiter, Lydie, to BASF SE High-functionality polyisocyanates containing urethane groups 08580887 Cl. 524-589.
Elkady, Osama; and Ashitani, Tomoji, to Oracle International Corporation Generating merged documents 08582164 Cl. 358-1.18.
Elkasevic, Suad; and Penuel, Michael, to BSH Home Appliances Corporation Exhaust baffle for kitchen appliance 08578924 Cl. 126-21R.
Elkem Solar AS: See--
Friestad, Kenneth 08580036 Cl. 117-206.
Ellery, Lucinda; to Lucinda Ellery, Inc. Method for fabricating hair extensions 08578946 Cl. 132-201.
Ellington, Bryan M.; Lhota, Colleen D.; Loewengruber, Joseph; and Statham, Perry L., to International Business Machines Corporation Multi-scenerio software deployment 08584119 Cl. 717-177.
Elliott, Robert Bartlett; Garkavenko, Olga; Vasconcellos, Alfred; Emerich, Dwaine; and Thanos, Chris, to Fac8Cell Pty Limited Culture and use of cells that secrete liver secretory factors 08580248 Cl. 424-93.7.
Ellis, Brian: See--
Bewlay, Bernard Patrick; Weimer, Michael; McKiever, Joan; and Ellis, Brian 08579013 Cl. 164-529.
Ellis, Charles D.: See--
Rae, Chris L.; Ellis, Charles D.; and Duzak, Jeffrey J. 08584004 Cl. 715-219.
Ellis, Charmine Dental rack and dispenser 08579163 Cl. 222-192.
Ellis, Jeffrey T.: See--
Webler, William E.; Breeding, James D.; Bisson, Brad D.; Mourtada, Firas; Hyde, Gregory M.; Szobota, Stephanie A.; Asongwe, Gabriel; and Ellis, Jeffrey T. 08579967 Cl. 623-2.36.
Ellis, Michael; and Schwartz, Caron, to adidas AG Performance monitoring apparatuses, methods, and computer program products 08579767 Cl. 482-8.
Ellis, Michael D.: See--
Thomas, William L.; Ellis, Michael D.; Easterbrook, Kevin B.; Reichardt, M. Scott; and Knee, Robert A. 08584184 Cl. 725-91.
Ellis, Michael D.; Thomas, William L.; Hassell, Joel G.; Lemmons, Thomas R.; Berezowski, David M.; Knee, Robert A.; and McCoy, Robert H., to United Video Properties, Inc. Interactive television program guide with remote access 08584172 Cl. 725-53.
Ellis-Monaghan, John Joseph: See--
Anderson, Brent A.; Bryant, Andres; Clark, Jr., William F.; Ellis-Monaghan, John Joseph; and Nowak, Edward J. 08580601 Cl. 438-69.
Ellis, Samuel A.; and Hingorani, Kishan G., to Scientific Plastic Products, Inc. Cap with filter and transfer apparatus 08580560 Cl. 435-297.1.
Ellsworth, Jr., Michael J.: See--
Campbell, Levi A.; Chu, Richard C.; Ellsworth, Jr., Michael J.; Iyengar, Madhusudan K.; and Simons, Robert E. 08583290 Cl. 700-282.
Ellsworth, Paul D.: See--
Zaleski, Edmund Joseph; and Ellsworth, Paul D. 08578713 Cl. 60-626.
Ellsworth, Pual P.: See--
Suciu, Rebecca C.; Burrous, Thomas P.; Ellsworth, Pual P.; Stenfors, Alan L.; and Rose, Sidney 08578641 Cl. 40-658.
Elmo Company, Limited: See--
Suda, Yasushi 08582920 Cl. 382-284.
Toguchi, Masaaki; and Horike, Tetsuya 08582964 Cl. 396-77.
Elmore, Jim D.; Corley, Larry Steven; and Hite, Jerry R., to Momentive Specialty Chemicals Inc. Epoxy systems and amine polymer systems and methods for making the same 08580871 Cl. 523-414.
Elmore, Steven W.: See--
Doherty, George A.; Elmore, Steven W.; Hasvold, Lisa A.; Souers, Andrew J.; Tao, Zhi-Fu; Wang, Gary T.; Wang, Le; Mantei, Robert; and Hansen, Todd M. 08580794 Cl. 514-252.18.
Elonsson, Martin: See--
Gustafsson, Trygve; Elonsson, Martin; and Lönkvist, Torbjörn 08579173 Cl. 227-8.
Elpida Memory, Inc.: See--
Hasegawa, Yu; Katagiri, Mitsuaki; Isa, Satoshi; Iwakura, Ken; and Sasaki, Dai 08581417 Cl. 257-777.
Isogai, Satoru; and Kumauchi, Takahiro 08581315 Cl. 257-296.
Koshizuka, Atsuo 08582337 Cl. 365-49.1.
Miyahara, Jiro; and Wu, Nan 08580649 Cl. 438-424.
Nishio, Yoji 08581649 Cl. 327-170.
Sako, Nobuyuki 08580681 Cl. 438-666.
Shibata, Kayoko; Miwa, Hitoshi; and Inoue, Yoshihiko 08584061 Cl. 716-100.
Teramoto, Yuki; and Haraguchi, Yoshinori 08581758 Cl. 341-101.
Elrod, Scott A.: See--
Biegelsen, David K.; Buhler, Steven A.; Elrod, Scott A.; Fitch, John S.; Fork, David K.; Hadimioglu, Babur B.; and Stearns, Richard 08579414 Cl. 347-55.
Elsemore, David Allen; Flynn, Laurie A.; Geng, Jinming; and Crawford, Michael, to IDEXX Laboratories, Inc. Methods, devices, kits and compositions for detecting roundworm 08580518 Cl. 435-7.1.
Elshenawy, Zeinab: See--
Lin, Chun; Dyatkin, Alexey Borisovich; Elshenawy, Zeinab; and Yeager, Walter 08580402 Cl. 428-690.
Elter, Matthias: See--
Hasslmeyer, Erik; Elter, Matthias; Zerfass, Thorsten; and Schlarb, Timo 08582861 Cl. 382-133.
Elumenati, LLC, The: See--
Colucci, D'nardo; McConville, David M.; and Hooker, Clayton C. 08578657 Cl. 52-2.16.
Elwha LLC: See--
Chan, Alistair K.; Deane, Geoffrey F.; Fyke, Aaron; Gross, William; Hyde, Roderick A.; Jung, Edward K. Y.; Kare, Jordin T.; Myhrvold, Nathan P.; Tegreene, Clarence T.; and Wood, Jr., Lowell L. 08581446 Cl. 307-105.
Elz, Ian Gordon; to Telefonaktiebolaget L M Ericsson (publ) Identifying user role in IP multimedia subsystem 08583804 Cl. 709-227.
Elze, Olaf Dietrich; and Sterling, Shawn Finlay Basketball storage system 08579111 Cl. 206-315.9.
Elzinga, D. Blair; to Hewlett-Packard Development Company, L.P. Using an inverted index to produce an answer to a query 08583655 Cl. 707-741.
EMC Corporation: See--
Chen, Xiangping; Ruef, Richard P.; Armangau, Philippe; Owen, Karl M.; and Ku, Mark K. 08583607 Cl. 707-692.
Claudatos, Christopher Hercules; and Andruss, William Dale 08583601 Cl. 707-654.
Don, Arieh; Davidson, James L.; Veprinsky, Alexander; Yochai, Yechiel; and Riordan, Patrick Brian 08584128 Cl. 718-103.
Marshak, Marik; Martin, Owen; Veprinsky, Alex; Naamad, Amnon; Dolan, Sean C.; and Sahin, Adnan 08583838 Cl. 710-18.
Natanzon, Assaf 08583885 Cl. 711-162.
Ofer, Adi; Madnani, Kiran; and Brown, Jeffrey A. 08583861 Cl. 711-112.
Sade, Gilad; and Linnell, Thomas E. 08583865 Cl. 711-113.
EMD Millipore Corporation: See--
Proulx, Stephen; Almasian, Joseph; Renganath, Naren; Tingley, Stephen; and Morrissey, Martin 08579871 Cl. 604-249.
Emerich, Dwaine: See--
Elliott, Robert Bartlett; Garkavenko, Olga; Vasconcellos, Alfred; Emerich, Dwaine; and Thanos, Chris 08580248 Cl. 424-93.7.
Emerson, David E.; Lafreniere, Gary W.; Goergen, Michael S.; and Lando, David C., to CenturyLink Intellectual Property LLC System and method for emergency communications through a set-top box 08584189 Cl. 725-108.
Emerson Electric Co.: See--
Chesack, Gregory J. 08579217 Cl. 241-33.
Hammer, Randall E.; and Hansche, James 08579218 Cl. 241-46.013.
Emerson, Jane F.; to Regents of the University of California, The Collection tubes apparatus, systems, and methods 08580183 Cl. 264-496.
Emmert-Buck, Michael R.: See--
Shapiro, Benjamin; and Emmert-Buck, Michael R. 08579787 Cl. 600-12.
Emmons, Clifford L.: See--
Holsten, Henry E.; Viola, Frank J.; Emmons, Clifford L.; Beardsley, John W.; Heinrich, Russell; and Cullinan, Nicola 08579178 Cl. 227-176.1.
Emond, Jean-Pierre; and Pelletier, William, to Blueye, LLC Method and apparatus for wrapping a shipment 08580369 Cl. 428-131.
Empire Technology Development LLC: See--
Conte, Thomas M. 08582502 Cl. 370-328.
Eldering, Charles A. 08581873 Cl. 345-173.
Ma, Yuchen 08579543 Cl. 404-95.
Miller, Seth 08580479 Cl. 430-270.1.
Seike, Aya 08581426 Cl. 290-1R.
Sjong, Angele 08580337 Cl. 427-203.
Takano, Kosuke; Yoshida, Naofumi; and Kurabayashi, Shuichi 08583452 Cl. 705-2.
Emura, Fabian; and Torres, Rodrigo Systematic chromoendoscopy and chromocolonoscopy as a novel systematic method to examine organs with endoscopic techniques 08579800 Cl. 600-117.
EMW Co., Ltd.: See--
Ryou, Byung Hoon; Sung, Won Mo; and Ji, Jeong Keun 08581796 Cl. 343-787.
Enami, Tsugutomo: See--
Isozu, Masaaki; Enami, Tsugutomo; and Kawano, Shinichi 08584007 Cl. 715-239.
Enbuske, Henrik: See--
Moberg, Peter; Linstrom, Magnus; Englund, Eva; and Enbuske, Henrik 08582514 Cl. 370-329.
EncoreSolar, Inc.: See--
Basol, Bulent M. 08580603 Cl. 438-95.
Endert, Gerold: See--
Essler, Frank; Panzner, Steffen; and Endert, Gerold 08580297 Cl. 424-450.
Endo, Jun; Nakashima, Tetsuya; and Takenaka, Atsuyoshi, to Asahi Glass Company, Limited Glass for substrate, and glass substrate 08580411 Cl. 428-846.9.
Endo, Kyoko: See--
Iida, Koichiro; Endo, Kyoko; Li, Yanjun; Okabe, Kazuki; and Yabe, Masayoshi 08581241 Cl. 257-40.
Endo, Makoto: See--
Tanaka, Hirobumi; Endo, Makoto; Ueda, Satoko; Ueda, Daisuke; Murosawa, Shogo; Yoshida, Daisuke; Ono, Kenta; Ogasawara, Minoru; and Kikuchi, Tatsuya 08582277 Cl. 361-321.4.
Endo, Noboru: See--
Sakamoto, Kenichi; Hoshino, Kazuyoshi; Wakayama, Kojii; Tanabe, Shiro; and Endo, Noboru 08582587 Cl. 370-401.
Endo, Takaaki; and Satoh, Kiyohide, to Canon Kabushiki Kaisha Image processing apparatus, image processing method, and program 08582856 Cl. 382-131.
Endres + Hauser Conducta Gesellschaft für Mess-und Regeltechnik + Co. KG: See--
Mikkelsen, Hakon; and Bernhard, Ralf 08581194 Cl. 250-339.07.
Endress + Hauser Conducta Gesellschaft für Mess- und Regeltechnik mbH + Co., KG: See--
Eberheim, Andreas; Nagel, Thomas; Thieme, Andre; and Zeun, Hendrik 08581575 Cl. 324-204.
Pfauch, Thomas; and Wunderlich, Ingrid 08578798 Cl. 73-866.5.
Endress + Hauser Flowtec AG: See--
Hertel, Martin; and Hocker, Rainer 08578786 Cl. 73-861.22.
Pfau, Axel; Kumar, Vivek; and Badarlis, Anastasios 08583385 Cl. 702-47.
Ener1, Inc.: See--
Hartzog, Chad 08581549 Cl. 320-118.
EnerG2 Technologies, Inc.: See--
Costantino, Henry R.; Feaver, Aaron; and Scott, William D. 08580870 Cl. 523-309.
Energy Recovery, Inc.: See--
Oklejas, Robert A.; Terrasi, Kevin V.; and Oklejas, Michael P. 08579603 Cl. 417-407.
Eng, Lindsay; and Pipkin, Charlie, to BSH Home Applications Corporation Accessory for dishwasher 08579121 Cl. 211-41.9.
Engel, Brett H.: See--
Labonté, André P.; Wise, Richard S.; Li, Ying; and Engel, Brett H. 08580628 Cl. 438-197.
Engel, Klaus Jürgen; Zeitler, Guenter; Baeumer, Christian; Herrmann, Christoph; Wiegert, Jens; Proksa, Roland; Rössl, Ewald; and Steadman Booker, Roger, to Koninklijke Philips N.V. Radiation detector with multiple electrodes on a sensitive layer 08581200 Cl. 250-370.09.
Engelbart, Roger W.; Burpo, Steven J.; and Renieri, Michael P., to Boeing Company, The Controlling cutting of continuously fabricated composite parts with nondestructive evaluation 08583271 Cl. 700-110.
Engels, Michael: See--
Oberboersch, Stefan; Reich, Melanie; Schunk, Stefan; Hees, Sabine; Jostock, Ruth; Engels, Michael; Kless, Achim; Christoph, Thomas; Schiene, Klaus; Germann, Tieno; and Bijsterveld, Edward 08580965 Cl. 546-217.
Engler, Joseph J.; to Rockwell Collins, Inc. Explicit diploid evolutionary control 08583572 Cl. 706-13.
English, Paul: See--
Spurr, Charles L.; Giza, Jim; English, Paul; Hafner, Daniel S.; Patterson, Andrew; and Hafner, Steve 08583485 Cl. 705-14.43.
English, Robert M.: See--
Edwards, John K.; Lewis, Blake H.; English, Robert M.; Hamilton, Eric; and Corbett, Peter F. 08583892 Cl. 711-203.
Englund, Eva: See--
Gunnarsson, Fredrik; Bergman, Johan; and Englund, Eva 08583974 Cl. 714-748.
Moberg, Peter; Linstrom, Magnus; Englund, Eva; and Enbuske, Henrik 08582514 Cl. 370-329.
ENI S.p.A.: See--
Massetti, Felicia; D'Abbieri, Michelangelo; and Nardella, Alessandro 08580106 Cl. 208-179.
Perego, Carlo; Baldiraghi, Franco; Abdo, Suheil Fares; Marker, Terry Louise; and Sabatino, Luigina Maria Flora 08581014 Cl. 585-240.
Ennis, Damien C.: See--
Bigelow, Jr., Robert F.; Ennis, Damien C.; and Khamis, Michael P. 08579699 Cl. 463-21.
Enomoto, Hiromi; to Sharp Kabushiki Kaisha Liquid crystal display device 08582065 Cl. 349-137.
Enomoto, Katsumi; and Maeda, Yasuhiko, to FUJIFILM Corporation Liquid ejection head and image forming apparatus including liquid ejection head 08579418 Cl. 347-71.
Enomoto, Shintaro: See--
Mizuno, Yukitami; Amemiya, Isao; Hirao, Akiko; Takasu, Isao; Sugizaki, Tomoko; Amano, Akio; Shinjo, Yasushi; Sawabe, Tomoaki; and Enomoto, Shintaro 08580403 Cl. 428-690.
Enos, Emily: See--
Dixon, Eleri; Enos, Emily; and Brodmerkle, Scott 08583766 Cl. 709-219.
Enphase Energy, Inc.: See--
Rotzoll, Robert R.; Kapur, Rajan N.; and Patil, Suhas S. 08581441 Cl. 307-82.
Enpulz, L.L.C.: See--
Bennett, James D. 08583612 Cl. 707-694.
Bennett, James D. 08583621 Cl. 707-709.
Enraytek Optoelectronics Co., Ltd.: See--
Chang, Richard Rugin; and Xiao, Deyuan 08580587 Cl. 438-22.
Enright, Jeffery M: See--
Miller, Willis; Zaugg, Matthew R; Block, James; Graef, H Thomas; Ramachandran, Natarajan; Enright, Jeffery M; Douglass, Mark A; Scanlon, Michael; and Blackson, Dale H 08579192 Cl. 235-379.
Enright, Thomas E: See--
Chopra, Naveen; Enright, Thomas E; Chrétien, Michelle N; Keoshkerian, Barkev; and Vanbesien, Daryl W 08581000 Cl. 560-254.
Enriquez, John Mark: See--
Ford, Preston R.; Filipski, Paul D.; Dubois, Christian A.; Enriquez, John Mark; Russel, Robert J.; and Sorber, Kevin K. 08583544 Cl. 705-37.
Ensure Medical, Inc.: See--
Ginn, Richard S. 08579934 Cl. 606-213.
Enthermics Medical Systems, Inc.: See--
Hansen, William J.; Van Essen, Adam; and Smith, Terence T. 08581152 Cl. 219-406.
ENTrigue Surgical, Inc.: See--
Larson, Michael C. 08579179 Cl. 227-177.1.
Entropic Communications, Inc.: See--
Wu, Zong Liang; Lee, Ronald B.; and Ozturk, Yusuf 08582576 Cl. 370-392.
Entry Point, LLC: See--
Peterson, C. Robert; and Herbert, Thomas F. 08582580 Cl. 370-395.5.
Environment Recovery Equipment: See--
Hines, David 08580123 Cl. 210-744.
EnvisionIT, LLC: See--
Wood, Mark Andrew; Preston, Kevin Russell; and Weiser, Douglas 08583519 Cl. 705-34.
EOSpace, Inc.: See--
Thaniyavarn, Suwat 08582927 Cl. 385-2.
Epaud, David; and Lesbats, Fabrice, to Faurecia Sièges d'Automobile Vehicle seat 08579374 Cl. 297-334.
Epcos AG: See--
Feiertag, Gregor; Krueger, Hans; Leidl, Anton; and Stelzl, Alois 08580613 Cl. 438-109.
Leidl, Anton; Pahl, Wolfgang; and Wolff, Ulrich 08582788 Cl. 381-173.
Epistar Corporation: See--
Hsieh, Min-Hsun; Wang, Pai-Hsiang; Hsu, Ta-Cheng; and Su, Yeung-Sy 08581093 Cl. 136-256.
Epizyme, Inc.: See--
Olhava, Edward James; Chesworth, Richard; Kuntz, Kevin Wayne; Richon, Victoria M.; Pollock, Roy Macfarlane; and Daigle, Scott Richard 08580762 Cl. 514-46.
Epler, John E.: See--
Dupont, Frederic; and Epler, John E. 08581229 Cl. 257-13.
Epp, Anton: See--
Kuhl, Larry; Epp, Anton; and Bentz, Greg 08583176 Cl. 455-557.
Eppendorf AG: See--
Alexandre, Isabelle; Koehn, Heinz; Remacle, Jose; and De Roeck, Sven 08580499 Cl. 435-6.1.
Epple, Klaus: See--
Reitan, Oeyvind; and Epple, Klaus 08579858 Cl. 604-151.
Epshteyn, Lev; Lloyd, Zachary Erik; Tunali, Haluk Burcin; Belomestnykh, Olga Sergeyevna; and Saviano, Steven, to Google Inc. Javascript application programming interfaces for independently compiled javascript binaries 08584105 Cl. 717-140.
Epstein, Kenneth A.; Griffith, Richard F.; and Campbell, Alan B., to 3M Innovative Properties Company Optical film having microreplicated structures and methods 08579492 Cl. 362-626.
Equinix, Inc.: See--
Waldrop, Craig Alan; Youn, Sukwan; Patterson, Lane Gordon; and Felbinger, Kirk 08583503 Cl. 705-26.1.
Equiza, Maria Alejandra: See--
Francko, David; Wilson, Kenneth G.; Li, Qingshun Quinn; and Equiza, Maria Alejandra 08580708 Cl. 504-118.
Erceg, Vinko: See--
Fischer, Matthew James; Amini, Peiman; Erceg, Vinko; Lauer, Joseph Paul; and Kim, Joonsuk 08582485 Cl. 370-312.
Erdodi, Gabor: See--
Kennedy, Joseph P.; Erdodi, Gabor; and Kang, Jungmee 08580900 Cl. 525-453.
Eren, Rachel: See--
Dagan, Shlomo; Eren, Rachel; Misra, Hemant Kumar; Gowan, Jr., Walter G.; and O'Connor, Sandra 08580256 Cl. 424-130.1.
Erickson, Mark K.: See--
Cho, Yong K.; Erickson, Mark K.; and Zielinski, Todd M. 08579824 Cl. 600-483.
Ericson, Mårten: See--
Hannu, Hans; Ericson, Mårten; and Synnergren, Per 08582451 Cl. 370-252.
Ericsson Television Inc.: See--
Dasher, Charles; and Phillips, Chris 08584177 Cl. 725-62.
Eriksson, Anders; to Telefonaktiebolaget L M Ericsson (publ) Method and arrangement for delivering electronic state message information 08583826 Cl. 709-245.
Ermolov, Vladimir: See--
Pasanen, Pirjo; Ermolov, Vladimir; Oksanen, Markku Anttoni; Voutilainen, Martti; and Seppala, Eira 08581672 Cl. 332-115.
Erneta, Modesto: See--
Jamiolkowski, Dennis D.; Erneta, Modesto; and DiLuccio, Robert 08580307 Cl. 424-489.
Erno, Daniel: See--
Lokhandwalla, Murtuza; Haran, Kiruba Sivasubramaniam; Erno, Daniel; and Zirin, Robert 08581464 Cl. 310-156.12.
Ernst, Alexander: See--
Wallner, Herbert; Ernst, Alexander; Haug, Jens; Freyhardt, Sabine; and Woessner, Stefan 08581458 Cl. 310-68B.
Ernst, Fabian Edgar; and Varekamp, Christiaan, to Koninklijke Philipse N.V. Unit for and method of segmentation using average homogeneity 08582882 Cl. 382-173.
Ernst, Gregory R. Oil filter change method and apparatus 08578975 Cl. 141-86.
Ernst, Holger; Femmer, Uwe; Heitmann, Sonja; and Kruempelmann, Thomas, to Miele & Cie. KG Control method for a cooktop and cooktop for carrying out said method 08581159 Cl. 219-622.
Erol, Berna; Berkner, Kathrin; Hull, Jonathan J.; and Hart, Peter E., to Ricoh Co., Ltd. Methods for scanning, printing, and copying multimedia thumbnails 08584042 Cl. 715-838.
Erpenbach, Siglinde: See--
Barreleiro, Paula; Eiting, Thomas; Taden, Andreas; and Erpenbach, Siglinde 08580726 Cl. 510-330.
Ertle, Thomas D.: See--
Ma, Songtao; Toepke, Eric; Ryan, Mike R.; Jenkins, Randall W.; Ramachandran, Natarajan; Ertle, Thomas D.; Crews, Tim; Miller, Willis; Billett, Nick; Shepley, Steven; Krzic, Dave; and Cogan, Victor A. 08579191 Cl. 235-379.
Ervin, Eric N: See--
White, Henry S; White, Ryan J; and Ervin, Eric N 08581605 Cl. 324-693.
ESAB Group, Inc., The: See--
Severance, Jr., Wayne Stanley 08581139 Cl. 219-121.59.
Esaka, Naoki: See--
Tanizawa, Yoshimichi; Esaka, Naoki; and Shibata, Tsutomu 08583794 Cl. 709-225.
Esbensen, Peter K.; to Hartford Fire Insurance Company Code generation based on spreadsheet data models 08583530 Cl. 705-36R.
Escarpit, Olivier; to Airbus Operations S.A.S. Device for blind fixation 08579567 Cl. 411-43.
ESCO Corporation: See--
Ollinger, IV, Charles G; Snyder, Chris D; and Kreitzberg, John S 08578637 Cl. 37-453.
Eshedkaner, Rotem: See--
Nemet, Yaron; Eshedkaner, Rotem; and Brand, Ephraim 08579193 Cl. 235-383.
Eshita, Yoshiyuki: See--
Isobe, Tsutomu; Eshita, Yoshiyuki; Kato, Kazuhiko; Wakasa, Masanobu; Manago, Kenji; Nakanishi, Kuniyuki; and Tanji, Noriyuki 08580234 Cl. 424-57.
Esko-Graphics Imaging GmbH: See--
Sievers, Wolfgang 08578854 Cl. 101-467.
Eslambolchi, Hossein: See--
Croak, Marian; and Eslambolchi, Hossein 08582590 Cl. 370-401.
ESM Technologies, LLC: See--
DeVore, Dale Paul; and Long, Frank Daniel 08580315 Cl. 424-581.
Espasa, Cesar Fernandez: See--
Rodriguez, Jose Miguel; West, Matthew James; and Espasa, Cesar Fernandez 08581600 Cl. 324-539.
Espejel, Daniel; and Sill, Kathleen Dierdre, to Bank of America Corporation Method and apparatus for evaluating statistical significance over time 08583695 Cl. 707-798.
Esposito, Pierandrea: See--
Tonon, Giancarlo; Orsini, Gaetano; Sergi, Mauro; Schrepfer, Rodolfo; and Esposito, Pierandrea 08580733 Cl. 514-7.2.
Esseghir, Mohamed: See--
Patel, Rajen M.; Wu, Shaofu; Bernius, Mark T.; Esseghir, Mohamed; McGee, Robert L.; Mazor, Michael H.; and Naumovitz, John 08581094 Cl. 136-259.
Essigmann, Kurt; to Telefonaktiebolaget L M Ericsson (publ) Dual mode mobile terminal access to a wireless communication network 08583172 Cl. 455-552.1.
Essilor International (Compagnie Generale d'Optique): See--
Calixte, Laurent; Guilloux, Cyril; and Poulain, Isabelle 08579436 Cl. 351-159.42.
Essler, Frank; Panzner, Steffen; and Endert, Gerold, to Marina Biotech, Inc. Components for producing amphoteric liposomes 08580297 Cl. 424-450.
Essner, Jeffrey: See--
Blake, Alan; Crockett, Richard; Essner, Jeffrey; Hackett, Perry; and Nasevicius, Aidas 08581025 Cl. 800-20.
Estes, Andy: See--
Avila, J. Albert; Elbert, Lev; Estes, Andy; Famiglio, Mark; Johnson, Brian; Sackett, Jason; Saul, Russ; Worthington, Norman; Juckett, Baird; Lincoln, Rob; Ruth, Don; and Stipe, Michael 08583430 Cl. 704-235.
Estes, Michael J.: See--
Boock, Robert; Rixman, Monica A.; Zhang, Huashi; Estes, Michael J.; and Lawrence, Kristina 08583204 Cl. 600-345.
Estrada Gonzalez, Jorge Luis: See--
Lagos Lehuede, Patricio Clemente; Feuntes Fuentealba, Ricardo Armando; and Estrada Gonzalez, Jorge Luis 08580089 Cl. 204-229.7.
Estrada, Herbert: See--
Brown, Gregor J.; Augenstein, Donald R.; and Estrada, Herbert 08578971 Cl. 138-44.
Estrate, Evan A. Paintball hopper with integrated imaging system 08578920 Cl. 124-51.1.
Esurance Insurance Services, Inc.: See--
Harris, Frederick Miles; Srinivasan, Deepak Kumar; Swift, Philip James; and Sykes, Paul David 08583320 Cl. 701-36.
ETEL S.A.: See--
Mathia, Michel; Froidevaux, Claude; and Sudan, Jacques-André 08581536 Cl. 318-560.
Etemad-Gilbertson, Bijan: See--
Winston, Jr., William M.; Wright, S. Kirk; Han, May; Breault, Lyne; Lin, Jie; Etemad-Gilbertson, Bijan; Knuehl, Christine; Gyuris, Jeno; and Horwitz, Arnold 08580930 Cl. 530-388.23.
Eternal Chemical Co., Ltd.: See--
Chen, Shinn-Horng; Chen, Ruei-Tang; and Su, Che-Wei 08580401 Cl. 428-690.
Wu, Ting-Yuang; Wang, Hsung-Hsing; and Wang, Yi-Chia 08580372 Cl. 428-156.
Ethertronics, Inc.: See--
Desclos, Laurent; Shamblin, Jeffrey; and Matsumori, Barry 08581789 Cl. 343-702.
Ethicon Endo-Surgery, Inc.: See--
Moreno, Jr., Cesar E.; Minnelli, Patrick J.; Gilker, Thomas A.; Mumaw, Daniel J.; Mollere, Rebecca J.; Tanguay, Randall; Franer, Paul T.; Duke, Daniel H.; and Bookbinder, Mark J. 08579807 Cl. 600-203.
Robertson, Galen C.; Miller, Matthew C.; and Malaviya, Prasanna 08579928 Cl. 606-169.
Smith, Kevin W.; Palmer, Matthew A.; Kline, Korey Robert; and Deville, Derek Dee 08579176 Cl. 227-175.1.
Vakharia, Omar J.; Long, Gary L.; Bally, Kurt R.; and Zwolinski, Andrew M. 08579897 Cl. 606-52.
Ethicon, Inc.: See--
Comolli, James; and Yeadon, Stephen C. 08580192 Cl. 422-22.
Hinrichs, Eric; and Maurer, Robert E. 08581143 Cl. 219-121.71.
Jamiolkowski, Dennis D.; Erneta, Modesto; and DiLuccio, Robert 08580307 Cl. 424-489.
Nering, Robert; Cohn, Simon; Cardinale, Michael; Fuchs, Richard P.; Daniel, Matthew David; Jarrett, Jeremy David; Thornton, Race Eric; and Griffin, Carl Edward 08579920 Cl. 606-143.
Priewe, Joerg 08579990 Cl. 623-23.72.
Tracey, Michael R.; and DiUbaldi, Anthony 08583256 Cl. 607-71.
Ethiraju, Rajashekaran E.: See--
Chintada, Suresh Kumar; Ethiraju, Rajashekaran E.; Maiti, Rupak K.; Pazhyannur, Rajesh; and T, Satyanarayana 08583107 Cl. 455-432.1.
Eto, Shingo: See--
Ota, Hirofumi; Miyamoto, Koichi; and Eto, Shingo 08583335 Cl. 701-58.
Ettorre, Donato: See--
Cervone, Alessio; Collotta, Ivano Salvatore; Coppo, Paolo; Ettorre, Donato; Fodrini, Maurizio; and Turolla, Maura 08583437 Cl. 704-258.
Etzioni, Zohar: See--
Meir, Gil; Etzioni, Zohar; Lifshitz, Gadi; and Kor, Liah 08583779 Cl. 709-224.
Eun, Jong-moon; and Kim, Tae-hyun, to Samsung Electronics Co., Ltd. Supply roller of developing device for image forming apparatus and method of manufacturing the same 08579775 Cl. 492-53.
Eurocopter: See--
Eglin, Paul; Queiras, Nicolas; Barraco, André; and Malburet, Francois 08583295 Cl. 701-4.
Herpin, Gilles 08579587 Cl. 416-1.
Manfredotti, Thomas; and Chemin, Jerome 08579589 Cl. 416-52.
European Aeronautic Defence and Space Company Eads France: See--
Aspas Puertolas, Jesus 08581103 Cl. 174-251.
European Community, Represented by The European Commission, The: See--
Tanev, Hristo Tanev 08583420 Cl. 704-9.
Evan, Michael J.; Levine, Jonathan D.; and Pangrazio, III, Donald M., to Xerox Corporation Automated encryption and password protection for downloaded documents 08584213 Cl. 726-5.
Evangelista, Ramon: See--
Banik, Utpal; Evangelista, Ramon; and Gan, We-Xing 08580524 Cl. 435-7.1.
Evans, D. Clayton; to Callaway Golf Company Golf club head with adjustable weighting 08579724 Cl. 473-334.
Evans, Gregory M.: See--
Issa, Alfredo C.; Evans, Gregory M.; and Amidon, Christopher M. 08583555 Cl. 705-50.
Evans, Harry: See--
Kennedy, Bain; Ives-Halperin, Kenneth; Yang, James; Evans, Harry; and Abrams, Michael David 08584225 Cl. 726-10.
Evans, Paul: See--
Reardon, John P.; Paskach, Thomas J.; and Evans, Paul 08580019 Cl. 96-150.
Evans, Robert E.; Hartman, Anthony L.; Suchter, Richard A.; and Lefebvre, Gilles, to Sakura Finetek U.S.A., Inc. Traceability for automated staining system 08580568 Cl. 436-50.
Evans, Scott: See--
Zadno-Azizi, Gholam-Reza; Evans, Scott; Vargas, Luis; and Portney, Valdemar 08579970 Cl. 623-6.13.
EvapTech, Inc.: See--
Abeln, Travis W.; and Muder, Mark A. 08578680 Cl. 52-745.2.
Eveland, Renee A.: See--
Gieselman, Matthew D.; Pudelski, John K.; Eveland, Renee A.; and Preston, Adam J. 08581006 Cl. 564-434.
Everett, Philip A: See--
Croot, Christopher M; Linney, Trevor P; Everett, Philip A; Cook, John W; and Pickering, Ashley 08582460 Cl. 370-252.
Everez Systems Limited: See--
O'Shaughnessy, Gerald E.; Spirin, Vladimir; Ivlev, Alexei; Karash, Oskar; and Medvedev, Denis 08584022 Cl. 715-752.
Evergrand Holdings Limited: See--
Shen, Yu-Nung 08581490 Cl. 313-506.
Evers, Andreas: See--
Kallus, Christopher; Broenstrup, Mark; Evers, Andreas; Globisch, Anja; Schreuder, Herman; and Wagner, Michael 08580777 Cl. 514-183.
Eves, Matthew: See--
Davidson, Aaron Samuel; Hitchcock, Robin Garth; Eves, Matthew; Worboys, David John; and Lynch, Susan Robyn 08578935 Cl. 128-206.24.
Evonik Degussa GmbH: See--
Dowe, Andreas; Goering, Rainer; Bollmann, Sonja; and Baumann, Franz-Erich 08580899 Cl. 525-433.
Frank, Markus; Loeker, Frank; Paepen, Dirk; and Smith, Scott 08580953 Cl. 536-123.1.
Steiger, Juergen; Merkulov, Alexey; Fruehling, Dennis; Hoppe, Arne; and Brausch, Nicole 08580989 Cl. 556-1.
Evonik Goldschmidt GmbH: See--
Haensel, Rene; Giessler-Blank, Sabine; and Kempka, Stefan 08580225 Cl. 423-567.1.
Evonik Oxeno GmbH: See--
Kaizik, Alfred; Fridag, Dirk; Lueken, Hans-Gerd; and Bueschken, Wilfried 08581008 Cl. 568-461.
Evotec AG: See--
Hinnah, Silke; Lambrü, Dagmar; Dröge, Sonja; Jäger, Stefan; Gall, Karsten; Stürmer, Werner; and Schäfer, Michaela 08580577 Cl. 436-501.
Ewington, Craig Leslie: See--
McCurdy, Daniel; McGraw, IV, William Harrison; and Ewington, Craig Leslie 08584113 Cl. 717-170.
Exelis Inc.: See--
Nish, Randall William; and Vogel, Jason Jon 08579023 Cl. 166-134.
Experian Information Solutions, Inc.: See--
Achanta, Venkat R. 08583593 Cl. 707-602.
ExploraMed NC6, LLC: See--
Makower, Joshua; Goldfarb, Eric; and Ferdinand, Arthur 08579837 Cl. 601-6.
Extreme Networks, Inc.: See--
Lu, Zihong; Meier, Richard A.; Shah, Sunil P.; and Nagarajan, Raj 08583833 Cl. 709-251.
ExxonMobil Chemical Patents Inc.: See--
Crowther, Donna J.; Jiang, Peijun; and Kolb, Rainer 08580902 Cl. 526-160.
Porter, John R. 08580120 Cl. 210-670.
Tsou, Andy Haishung; Soeda, Yoshihiro; Measmer, Matthew Brian; Stokes, James Peter; Kirino, Yoshiaki; and Sullivan, Arthur Joseph 08580877 Cl. 524-271.
Weber, Jörg F. W.; and Meredith, James O. 08581007 Cl. 568-402.
ExxonMobil Research and Engineering Company: See--
Minhas, Bhupender S.; and Cody, Ian A. 08580018 Cl. 96-108.
Novak, William J.; Cole, Kathryn Y.; Hanks, Patrick L.; and Hilbert, Timothy L. 08580108 Cl. 208-254R.
Eye Therapies LLC: See--
Horn, Gerald 08580787 Cl. 514-249.
Eyraud, Richard: See--
Stephanick, James; Bradford, Ethan R.; Van Meurs, Pim; Eyraud, Richard; and Longé, Michael R. 08583440 Cl. 704-270.
Ezaki, Takeshi: See--
Fukushima, Hiroto; Miura, Tomonori; Tsukanaka, Yasuhiko; and Ezaki, Takeshi 08579679 Cl. 451-56.
Ezerzer, Ran: See--
Margulies, Edwin Kenneth; Borodow, Eli Ben; Ezerzer, Ran; Aljane, Ali; Seebauer, William Scott; and Yahmadi, Imed 08583466 Cl. 705-7.26.