NOTE--Arranged in accordance with the first significant character or word of the name
(in accordance with city and telephone directory practice).

E I du Pont de Nemours and Company: See--
Dhawan, Rajiv; Hargis, Annalisa; and Ritter, Joachim C 08580910 Cl. 528-186.
Hung, Ming-Hong; Ameduri, Bruno; and Kostov, Georgi 08580897 Cl. 525-326.3.
Peng, Sheng; Yake, Allison Mary; and Iaconelli, Cheryl Lynn 08580715 Cl. 507-205.
Zahr, George Elias 08580386 Cl. 428-413.
Zhao, Ruofei; Yin, Guangjun; and Ye, Changming 08580377 Cl. 428-336.
E Ink Corporation: See--
Walls, Michael D.; Feick, Jason D.; and Whitesides, Thomas H. 08582196 Cl. 359-296.
e-Vision Smart Optics, Inc.: See--
Blum, Ronald D.; and Kokonaski, William 08579435 Cl. 351-159.39.
E. I. du Pont de Nemours and Company: See--
McBride, Kevin E; Lassner, Michael W; Looger, Loren L; and McGonigle, Brian 08580556 Cl. 435-252.3.
Russell, William Richard; and Schultz, John Anthony 08580915 Cl. 528-395.
E. I. DuPont de Nemours and Company: See--
Kourtakis, Kostantinos 08580389 Cl. 428-532.
E.G.O. Elektro-Geraetebau GmbH: See--
Egenter, Christian 08581137 Cl. 219-100.
E2 LLC: See--
Grau, Buket; Gale, David Robert; Musgrave, Sam Anne; Perkins, George McGee; Edhouse, Mark Jeffrey; Graham, Marc; and Kadamus, Christopher 08579849 Cl. 604-9.
Eadon, George: See--
Kolovski, Vladimir; Wu, Zhe; and Eadon, George 08583589 Cl. 706-55.
Eagle Harbor Holdings, LLC: See--
Preston, Dan Alan; and Lutter, Robert Pierce 08583292 Cl. 701-1.
Eagle Industry Co., Ltd.: See--
Arita, Yasuhisa 08579297 Cl. 277-551.
Eames, Andrew: See--
Mirtich, Brian V.; Eames, Andrew; Phillips, Brian S.; Tremblay, II, Robert J.; Keating, John F.; and Whitman, Steven 08582925 Cl. 382-309.
Earnshaw, Mark; Heo, Youn Hyoung; Datsen, Margarita; and Cai, Zhijun, to BlackBerry Limited Handling physical uplink shared channel transmissions 08582522 Cl. 370-329.
Earnshaw, Mark; Fong, Mo-Han; Cai, Zhijun; Xu, Hua; and Heo, Youn Hyoung, to BlackBerry Limited System and method for channel state feedback in carrier aggregation 08582638 Cl. 375-240.
Earth Renaissance Technologies, LLC: See--
Theodore, Marcus G. 08580122 Cl. 210-719.
East Carolina University: See--
Virag, Jitka A. I.; and Dries, Jessica L. 08580739 Cl. 514-16.4.
Easterbrook, Kevin B.: See--
Thomas, William L.; Ellis, Michael D.; Easterbrook, Kevin B.; Reichardt, M. Scott; and Knee, Robert A. 08584184 Cl. 725-91.
Eastman Chemical Company: See--
Kuo, Thauming; and Hall, Phillip Bryan 08580872 Cl. 523-501.
Eastman Kodak Company: See--
Hoff, Joseph W. 08579425 Cl. 347-86.
Pitas, Jeffrey A.; Luther, Richard G.; and Regelsberger, Matthias H. 08583008 Cl. 399-114.
Rapkin, Alan E.; and Sherwood, Walter B. 08582988 Cl. 399-24.
Rudolph, Paul; Bartley, Russell L.; Piatt, Michael J.; and Duke, Ronald J. 08582156 Cl. 358-1.15.
Suchy, Donna P.; and Herrick, Diane M. 08580331 Cl. 427-58.
Xie, Yonglin; Yang, Qing; and Jech, Jr., Joseph 08579427 Cl. 347-89.
Eat Dirt, LLC: See--
Monaco, Dean; and Santo, III, John 08579172 Cl. 224-666.
Eaton Corporation: See--
Fox, Matthew George; and McMillan, Patrick John 08579752 Cl. 475-88.
Maloney, James Gerard; and Samuelson, Eric Alan 08582279 Cl. 361-652.
Ebadollahi, Shahram; Hu, Jianying; Kohn, Martin S.; Lee, Noah; Sorrentino, Robert K.; Sun, Jimeng; and Wang, Fei, to International Business Machines Corporation Mining temporal patterns in longitudinal event data using discrete event matrices and sparse coding 08583586 Cl. 706-53.
Ebara Corporation: See--
Kobayashi, Yoichi 08582122 Cl. 356-630.
eBay Inc.: See--
Ferrandiz, Josep M. 08584122 Cl. 718-101.
Gadiyar, Vivek; Singh, Jogender; and Zenzin, Oleg 08579731 Cl. 473-407.
Granbery, John Hastings 08583933 Cl. 713-179.
Normile, Tom 08579187 Cl. 235-375.
Sundaresan, Neelakantan 08583633 Cl. 707-723.
Ebdon, Deren George; and Peterson, Robert W., to Lipari, Paul A. System and method for managing an object cache 08583871 Cl. 711-125.
Ebe, Hirofumi: See--
Ishimaru, Yasuto; and Ebe, Hirofumi 08581110 Cl. 174-260.
Eberhard, Franz: See--
Baur, Johannes; Härle, Volker; Hahn, Berthold; Weimar, Andreas; Oberschmid, Raimund; Guenther, Ewald Karl Michael; Eberhard, Franz; Richter, Markus; and Strauss, Jörg 08581279 Cl. 257-98.
Eberhard, Wilfrid: See--
Martin, Gerhard Hermann; Eberhard, Wilfrid; and Ummer, Bernd 08583334 Cl. 701-51.
Eberheim, Andreas; Nagel, Thomas; Thieme, Andre; and Zeun, Hendrik, to Endress + Hauser Conducta Gesellschaft für Mess- und Regeltechnik mbH + Co. KG Conductivity sensor with switching between transmitting and receiving coil 08581575 Cl. 324-204.
Eberle, Michael J.; to Vascular Imaging Corporation Optical imaging probe connector 08583218 Cl. 600-478.
Eberle, Thomas: See--
Pan, Junyou; Eberle, Thomas; and Buchholz, Herwig 08581262 Cl. 257-77.
Ebersole, Garrett: See--
Stopek, Joshua; Elachchabi, Amin; Broom, Daniel; Ebersole, Garrett; and Witherell, Ryan 08579924 Cl. 606-151.
Ebert, Detlef; and Hummel, Michael, to Poly-Clip System GmbH & Co. KG Displacer FCA Y 08579682 Cl. 452-48.
Ebert, Todd; Kimmel, Keith D.; and Laurello, Vincent P., to Siemens Energy, Inc. Particle separator in a gas turbine engine 08578720 Cl. 60-806.
Ebihara, Shun-ichi; Ishida, Tsutomu; Koyama, Shoichi; and Matsui, Norio, to Canon Kabushiki Kaisha Recording sheet surface detection apparatus and image forming apparatus 08582116 Cl. 356-600.
Ebihara, Shunichi: See--
Ishida, Tsutomu; Ebihara, Shunichi; Matsui, Norio; and Koyama, Shoichi 08582990 Cl. 399-45.
Ebihara, Tomoyuki; Moriguchi, Kazuma; and Hayashi, Keiichi, to Yanmar Co., Ltd. Mower deck lifting device of ride-on mower 08578687 Cl. 56-17.1.
Ebinuma, Ryosuke: See--
Kagoshima, Kazuhiro; Yanagida, Hiroshi; and Ebinuma, Ryosuke 08579279 Cl. 271-185.
Eby, William H.; to Monsanto Technology LLC Soybean cultivar S110134 08581056 Cl. 800-312.
Eby, William H.; to Monsanto Technology LLC Soybean cultivar 08351577 08581057 Cl. 800-312.
EchoStar Technologies, L.L.C.: See--
Martch, Henry Gregg; Bazata, Michael John; and Mauser, Benjamin Raymond 08583969 Cl. 714-57.
McCarthy, III, Bernard A. 08584178 Cl. 725-80.
Moran, William Norris; Cavanaugh, Michael; and Menon, Anand 08584173 Cl. 725-59.
Taxier, Karen Michelle; and Coburn, Matthew 08582957 Cl. 386-291.
VanDuyn, Luke 08584167 Cl. 725-45.
Eckenberg, Dax: See--
Le Chevalier, Vincent; Geiger, Charles F.; Desai, Rahul Ravindra Mutalik; Joshi, Ashit; Eckenberg, Dax; Richardson, Joshua; and Tworetzky, Brent 08584259 Cl. 726-28.
Eckhart, Lewis V. Golf putter with adjustable head 08579716 Cl. 473-244.
Eckhof, Stephan: See--
Marnay, Theirry; Bertagnoli, Rudolf; Magee, Frank; and Eckhof, Stephan 08579978 Cl. 623-17.15.
Eckhoff, Doug: See--
Finn, Todd; Burdick, Gale; and Eckhoff, Doug 08579539 Cl. 403-390.
Eco Creation International, Inc.: See--
Jeon, Ki Jeong 08581015 Cl. 585-241.
Eco Oxygen Technologies, LLC: See--
Clidence, David A.; and Speece, Richard E. 08580125 Cl. 210-758.
Ecolab USA Inc.: See--
Man, Victor Fuk-Pong; DeNoma, Michael Charles; Killeen, Yvonne Marie; and Lentsch, Steven Eugene 08580727 Cl. 510-340.
Wolf, Boyd; Hohl, Beth; and Leuchten, Elke 08578545 Cl. 15-118.
ECS Holdings, Inc.: See--
Malyala, Rajashekharam V.; and Golden, Stephen J. 08580216 Cl. 423-239.1.
Eda, Yoshie: See--
Chino, Takashi; Gomi, Satoshi; Miyashita, Koichi; Nagasawa, Minoru; and Eda, Yoshie 08581153 Cl. 219-446.1.
Edamitsu, Takashi; Chosokabe, Satoru; Terasaki, Masaya; and Tanaka, Kazuhiro, to Minebea Co., Ltd. Illuminator allowing a wide luminous intensity distribution 08579489 Cl. 362-606.
Edan Instruments, Inc.: See--
Yin, Xin; Yan, Binbin; and Xie, Xicheng 08583203 Cl. 600-340.
Edel, John: See--
Moore, Randall P.; Jackson, Kevin; Baloga, Stephen; Chen, Bobby I. T.; Halley, Berani A. C.; and Edel, John 08580214 Cl. 423-210.
Edelman, Gerald M.: See--
Fleischer, Jason G.; Szatmáry, Botond; Hutson, Donald B.; Moore, Douglas A.; Snook, James A.; Edelman, Gerald M.; and Krichmar, Jeffrey L. 08583286 Cl. 700-259.
Edelson, Lawrence H.; Daly, Michael P.; and Roessig, Trey, to Analog Devices, Inc. Adaptive phase offset controller for multi-channel switching power converter 08581440 Cl. 307-82.
Edgar, Albert D.; Iglehart, David C.; and Yeager, Rick B., to TCMS Transparent Beauty LLC System and method for applying a reflectance modifying agent to change a persons appearance based on a digital image 08582830 Cl. 382-115.
Edge 3 Technologies, Inc.: See--
El Dokor, Tarek; King, Joshua; Cluster, Jordan; and Holmes, James Edwards 08582866 Cl. 382-154.
Edgecast Networks, Inc.: See--
Kim, Hayes; Peters, Robert J; Ruiz, Sergio Leonardo; and Segil, James 08583763 Cl. 709-218.
Peters, Robert J.; Elazary, Lior; and Sakata, Jayson G. 08583769 Cl. 709-221.
Edgenet, Inc.: See--
Clippard, Ric; Kommineni, Rajesh; Rudolph, Brian; and Rudolph, Scott 08582802 Cl. 382-100.
Edgeworth, Jonathan P.: See--
Unwin, Patrick; Macpherson, Julie; Dumitrescu, Ioana; and Edgeworth, Jonathan P. 08580104 Cl. 205-792.
Edholm, Christer; and Göransson, Bo, to Telefonaktiebolaget LM Ericsson (publ) Activation of code multiplexing 08582595 Cl. 370-441.
Edhouse, Mark Jeffrey: See--
Grau, Buket; Gale, David Robert; Musgrave, Sam Anne; Perkins, George McGee; Edhouse, Mark Jeffrey; Graham, Marc; and Kadamus, Christopher 08579849 Cl. 604-9.
Edie, Jason A.; Cooper, Lloyd Guyton Bowers; Dawson, John Caleb; Walker, II, Don Byron; and Windham, Jerrod Bradley, to Warsaw Orthopedic, Inc. Expandable intervertebral spacers and methods of use 08579979 Cl. 623-17.15.
Edilson Sedra B.V.: See--
Van Der Houwen, Gerrit Marinus 08580177 Cl. 264-259.
Edison Junior, LLC: See--
Siminoff, James; and Modestine, John 08578652 Cl. 47-62C.
Edmiston, Daryl R.: See--
Linder, Richard J.; Edmiston, Daryl R.; Johnson, Steven W.; and Schlegel, Karri L. 08579957 Cl. 623-1.11.
Edmonds, Chris: See--
Harding, John; Farley, Thomas; Goone, David; Crowley, Chris; Edmonds, Chris; Rowell, Mark; Sprecher, Jeffrey; Ivanov, Stanislav; and Sternard, Donald F. 08583542 Cl. 705-37.
Edmunds, Andrew: See--
Jeanguenat, André; Hall, Roger Graham; Loiseleur, Olivier; Trah, Stephan; Durieux, Patricia; Edmunds, Andrew; and Stoller, André 08580785 Cl. 514-243.
Edwards, David L.; Kemink, Randall G.; Olson, David C.; Pizzolato, Katie L.; and Torok, John G., to International Business Machines Corporation Customized thermal interface to optimize mechanical loading and thermal conductivity characteristics 08582297 Cl. 361-708.
Edwards, III, Earl E. Portable vehicle roof snow and ice removal apparatus 08578542 Cl. 15-97.3.
Edwards, John K.; Lewis, Blake H.; English, Robert M.; Hamilton, Eric; and Corbett, Peter F., to NetApp, Inc. Extension of write anywhere file system layout 08583892 Cl. 711-203.
Edwards Lifesciences, LLC: See--
Mortier, Todd J.; Schweich, Jr., Cyril J.; Vidlund, Robert M.; Keith, Peter T.; Paulson, Thomas M.; and Kusz, David A. 08579798 Cl. 600-37.
Edwards Limited: See--
Huntley, Graeme 08579596 Cl. 417-87.
Effrat, Jonathan J.: See--
Paskin, Mark A.; Poon, Kelly; Lim, Yew Jin; Wiley, Jon M.; and Effrat, Jonathan J. 08583672 Cl. 707-765.
Egalax—Empia Technology Inc.: See--
Chang, Chin-Fu; Lee, Cheng-Han; Tang, Chi-Hao; and Ho, Shun-Lung 08583401 Cl. 702-150.
Yeh, Shang-Tai; Chen, Jia-Ming; and Ho, Shun-Lung 08581604 Cl. 324-691.
Egami, Shinji: See--
Kinoshita, Hiroaki; Goto, Atsushi; Akiyama, Daisuke; Suga, Takeshi; Egami, Shinji; Tanabe, Makoto; Miyata, Akihito; Takechi, Takuya; and Akai, Masao 08579803 Cl. 600-182.
Egawa, Hiroyuki; and Shimizu, Masahiko, to Fujitsu Limited Communication device and control method 08581791 Cl. 343-703.
Egemo, Robert P.: See--
Shi, Yanwei; and Egemo, Robert P. 08583253 Cl. 607-62.
Egenter, Christian; to E.G.O. Elektro-Geraetebau GmbH Method for operating a heating device of an electric heating appliance having a plurality of heating devices 08581137 Cl. 219-100.
Eggebrecht, Detlev: See--
Diekmeyer, Heinrich; Eggebrecht, Detlev; and Feyerabend, Konrad 08583339 Cl. 701-70.
Eggeling, Christian: See--
Hell, Stefan; Belov, Vladimir N.; Kolmakov, Kirill; Westphal, Volker; Lauterbach, Marcel; Jakobs, Stefan; Wurm, Christian; Eggeling, Christian; and Ringemann, Christian 08580579 Cl. 436-546.
Eggert, Thorsten: See--
Michels, Andreas; Pütz, André; Maurer, Karl-Heinz; Eggert, Thorsten; and Jäger, Karl-Erich 08580549 Cl. 435-197.
Eglin, Paul; Queiras, Nicolas; Barraco, André; and Malburet, Francois, to Eurocopter Method of controlling and regulating the deflection angle of a tailplane in a hybrid helicopter 08583295 Cl. 701-4.
Eguchi, Hiroshi; Higashi, Toshikazu; and Eguchi, Tatsuya, to Konica Minolta Business Technologies, Inc. Image forming apparatus with multi-view display 08582152 Cl. 358-1.15.
Eguchi, Ken: See--
Nakakubo, Toru; Eguchi, Ken; and Watanabe, Mitsuhiro 08580458 Cl. 429-512.
Eguchi, Tatsuya: See--
Eguchi, Hiroshi; Higashi, Toshikazu; and Eguchi, Tatsuya 08582152 Cl. 358-1.15.
Eguchi, Yoshiaki: See--
Fukatani, Takayuki; Yamamoto, Yasutomo; Kawaguchi, Tomohiro; Takada, Masanori; and Eguchi, Yoshiaki 08583883 Cl. 711-161.
Yamamoto, Yasutomo; Iwamura, Takashige; and Eguchi, Yoshiaki 08583864 Cl. 711-112.
Egued, Nelson Alfonso Slow humectation container 08579107 Cl. 206-213.1.
Ehira, Masaya: See--
Takagi, Katsutoshi; Ehira, Masaya; Iwasaki, Yuki; and Goto, Hiroshi 08580093 Cl. 204-298.13.
Ehlinger, James C.; Gilboy, Christopher P.; and Gudelis, Marius J., to AT&T Intellectual Property II, L.P. Method and apparatus for implementing a high-reliability load balanced easily upgradeable packet technology 08582568 Cl. 370-386.
Ehrenberg, Rainer: See--
Westhof, Frank; Hoewelmeyer, Uwe; Loddenkoetter, Manfred; Ehrenberg, Rainer; Kruempelmann, Martin; and Gunschera, Frank 08578850 Cl. 101-247.
Ehrman, John R.; and Greiner, Dan F., to International Business Machines Corporation Parsing-enhacement facility 08583899 Cl. 712-208.
Ehsani, Farzad: See--
Huang, Jun; Kim, Yookyung; Billawala, Youssef; Ehsani, Farzad; and Master, Demitrios 08583416 Cl. 704-3.
Eichelberg, John W.; to Amazon Technologies, Inc. Integrated ventilation system for electronic equipment 08582292 Cl. 361-679.49.
Eichelberger, Kevin D.: See--
Brinkman, Mark J.; Dragonuk, Michael; Eichelberger, Kevin D.; Eichhorn, Chris; Gehlhar, Sarah; Holland, Gregory J.; Josephs, Michael A.; Lubich, Daniel J.; McElroy, Jeffrey L.; Peters, Laron L.; Potrzeba, Duane A.; de Leon, Hector Ramirez; and Souder, Christopher L. 08581080 Cl. 800-320.1.
Eichen, Elliot G.: See--
Olshansky, Robert; Eichen, Elliot G.; Mitsumori, Derek; and Sporel, Eric R. 08582724 Cl. 379-45.
Eichenberger, Alexandre E.: See--
Bondhugula, Uday Kumar; Eichenberger, Alexandre E.; O'Brien, John Kevin P.; Renganarayana, Lakshminarayanan; and Zhao, Yuan 08584103 Cl. 717-136.
Eichenberger, Alexandre E.; Flachs, Brian K.; Johns, Charles R.; and Nutter, Mark R., to International Business Machines Corporation Runtime extraction of data parallelism 08583905 Cl. 712-241.
Eichhorn, Chris: See--
Brinkman, Mark J.; Dragonuk, Michael; Eichelberger, Kevin D.; Eichhorn, Chris; Gehlhar, Sarah; Holland, Gregory J.; Josephs, Michael A.; Lubich, Daniel J.; McElroy, Jeffrey L.; Peters, Laron L.; Potrzeba, Duane A.; de Leon, Hector Ramirez; and Souder, Christopher L. 08581080 Cl. 800-320.1.
Eichhorn, Marc: See--
Pichler, Alexander; Raymond, Pierre; and Eichhorn, Marc 08583575 Cl. 706-15.
Eichhorn, Ole; and Brumme, Anne, to Leica Biosystems Imaging, Inc. Viewing digital slides 08582849 Cl. 382-128.
Eichler, Ben; Wroblewski, Douglas R.; and Tripodi, Joseph, to Zurn Industries, LLC Vandal-proof floor sink strainer 08578523 Cl. 4-292.
Eickmann, Juergen: See--
Buschjohann, Thomas; Eickmann, Juergen; and Kauert, Heiko 08579307 Cl. 280-124.109.
Eid, El-Sayed: See--
Stam, Joseph S.; Pierce, Mark W.; Bechtel, Jon H.; Spence, William R.; Turnbull, Robert R.; and Eid, El-Sayed 08583331 Cl. 701-49.
Eida, Mitsuru: See--
Mizuki, Yumiko; Yabunouchi, Nobuhiro; and Eida, Mitsuru 08580393 Cl. 428-690.
Eidenberger, Robert; Grundmann, Thilo; and Zöllner, Raoul Daniel, to Siemens Aktiengesellschaft Decision making mechanism, method, module, and robot configured to decide on at least one prospective action of the robot 08583284 Cl. 700-246.
Eidson, Mark: See--
Goff, Lonnie Calvin; Conley, Michael; and Eidson, Mark 08581548 Cl. 320-116.
Eiffler, Juergen: See--
Tirtowidjojo, Max M.; Au-Yeung, Patrick H.; Chakraborty, Debashis; Eiffler, Juergen; Groenewald, Heinz; Hirsekorn, Kurt F.; Kokott, Manfred; Kruper, Jr., William J.; Luebbe, Thomas U.; Meemann, Holger; Sexton, Shirley S.; Wenzel, Peter; and Wobser, Marcus 08581012 Cl. 570-160.
Tirtowidjojo, Max M.; Chakraborty, Debashis; Eiffler, Juergen; Hirsekorn, Kurt F.; and Kruper, Jr., William J. 08581011 Cl. 570-159.
Eifrig, Robert O.: See--
Wang, Limin; Yu, Yue; Eifrig, Robert O.; Zhou, Jian; Baylon, David M.; Panusopone, Krit; Fang, Xue; and Luthra, Ajay K. 08582652 Cl. 375-240.16.
Eisai R&D Management Co., Ltd.: See--
Ono, Yuichi; Nakagawa, Yasuko; and Nakatani, Tomoya 08580523 Cl. 435-7.1.
Eisenberg, Andrew Lawrence: See--
Knox, John Michael Page; Landry, David Matthew; Ibrahim, Samir; and Eisenberg, Andrew Lawrence 08582790 Cl. 381-314.
Eisenhandler, Jon; Averill, Richard F.; and Goldfield, Norbert I., to 3M Innovative Properties Company Medical diagnosis derived from patient drug history data 08579811 Cl. 600-300.
Eisensehr, Markus: See--
Aurnhammer, Andreas; Eisensehr, Markus; Hagenauer, Andreas; and Huttenhofer, Manfred 08583285 Cl. 700-255.
Eiting, Thomas: See--
Barreleiro, Paula; Eiting, Thomas; Taden, Andreas; and Erpenbach, Siglinde 08580726 Cl. 510-330.
Eiza, Chie: See--
Shimada, Hirokazu; Toyoda, Yoshimi; Yoshitome, Hideki; Maeda, Satoshi; and Eiza, Chie 08582494 Cl. 370-315.
Eiznhamer, David A.: See--
Zembower, David E.; and Eiznhamer, David A. 08580834 Cl. 514-406.
Eken, Yalcin A.; and Katzin, Peter J., to Hittite Microwave Corporation Logarithmic mean-square power detector 08581574 Cl. 324-140R.
Ekkizogloy, Luke M.: See--
Dybsetter, Gerald L.; and Ekkizogloy, Luke M. 08583395 Cl. 702-119.
Ekkizogloy, Luke M.; Hahin, Jayne C.; Hosking, Lucy G.; and Dybsetter, Gerald L., to Finisar Corporation Inter-transceiver module communication for firmware upgrade 08582974 Cl. 398-135.
Ekkizogloy, Luke M.; and Daghighian, Henry M., to Finisar Corporation Logging mechanism for an intelligent transmitter module 08582978 Cl. 398-182.
Ekladyous, Albert; Kiedaisch, Kevin William; Kumar, Arun; Partch, Thomas William; Wilds, John Wesley; Glasgow, Candace Carolyn; and Abdelnour, Sleiman, to Ford Global Technologies, LLC Vision-based headlamp aiming 08582091 Cl. 356-121.
El Dokor, Tarek; King, Joshua; Cluster, Jordan; and Holmes, James Edwards, to Edge 3 Technologies, Inc. Method and apparatus for disparity computation in stereo images 08582866 Cl. 382-154.
El-Maleh, Khaled Helmi: See--
Mahadevan, Vijay; Pillai, Brijesh; El-Maleh, Khaled Helmi; Shi, Fang; and Raveendran, Vijayalakshmi R. 08582660 Cl. 375-240.25.
El-Moussa, Fadi; and Tay, Hui Min June, to British Telecommunications public limited company Method and apparatus for detecting abnormal traffic in a network 08584236 Cl. 726-23.
Elaasar, Maged E.; to International Business Machines Corporation Computer method and apparatus for chaining of model-to-model transformations 08583413 Cl. 703-22.
Elachchabi, Amin: See--
Stopek, Joshua; Elachchabi, Amin; Broom, Daniel; Ebersole, Garrett; and Witherell, Ryan 08579924 Cl. 606-151.
Elaydi, Abdul: See--
Krishnamoorthy, Ravishanker; Yang, Yun; and Elaydi, Abdul 08582227 Cl. 360-69.
Elazary, Lior: See--
Peters, Robert J.; Elazary, Lior; and Sakata, Jayson G. 08583769 Cl. 709-221.
Elbe, Hans-Ludwig: See--
Dunkel, Ralf; Elbe, Hans-Ludwig; Greul, Jörg Nico; Gayer, Herbert; Seitz, Thomas; Dahmen, Peter; and Wachendorff-Neumann, Ulrike 08580971 Cl. 548-374.1.
Elbert, Lev: See--
Avila, J. Albert; Elbert, Lev; Estes, Andy; Famiglio, Mark; Johnson, Brian; Sackett, Jason; Saul, Russ; Worthington, Norman; Juckett, Baird; Lincoln, Rob; Ruth, Don; and Stipe, Michael 08583430 Cl. 704-235.
ELC Management LLC: See--
Bickford, William R. 08578948 Cl. 132-317.
Cheng, Jing; Chen, Chia-Wen; Schnittger, Steven Francis; and Lu, Ming 08580319 Cl. 424-725.
Elce, Edmund: See--
Knapp, Brian; Elce, Edmund; Bell, Andrew; Burns, Cheryl; Kaiti, Sridevi; Kocher, Brian; Ng, Hendra; Patel, Yogesh; Sakamoto, Masanobu; Wu, Xiaoming; and Zhang, Linda 08580477 Cl. 430-270.1.
Eldering, Charles A.; to Empire Technology Development, LLC Elastomeric wave tactile interface 08581873 Cl. 345-173.
Eldesouki, Munir; Deen, Mohamed Jamal; and Fang, Qiyin, to King Abdulaziz City Science and Technology High-speed analog photon counter and method 08581172 Cl. 250-214A.
EldoLAB Holding B.V.: See--
Welten, Petrus Johannes Maria; and Saes, Marc 08581521 Cl. 315-312.
Electricfil Automotive: See--
Raquin, Stéphane; and Duault, Frédéric 08579634 Cl. 439-31.
Electro Industries/Gauge Tech: See--
Banhegyesi, Tibor 08581169 Cl. 250-208.4.
Electrolux Home Products Corporation, N.V.: See--
Bohac, Jiri; Stahlmann, Rolf; and Lampe, Hansjörg 08578951 Cl. 134-113.
Electrolux Home Products, Inc.: See--
McCollough, Thomas W.; Watts, Russell; Ducharme, David R.; and Maxie, Gerald 08578721 Cl. 62-73.
Electronics and Telecommunications Research Institute: See--
Choi, Chang-Ho 08582575 Cl. 370-392.
Chung, Yun Su; Jung, Sung Uk; Lee, Yongjin; and Moon, Ki Young 08582833 Cl. 382-118.
Hong, Seung Eun; Kim, Kyeongpyo; Kim, Yong Sun; and Lee, Woo Yong 08582603 Cl. 370-474.
Jang, Eun Hye; Cho, Young Jo; Lee, Jae Yeon; Chi, Su Young; and Chun, Byung Tae 08579838 Cl. 601-35.
Jang, In Sung; Lee, Moonsoo; An, Kyoung Hwan; Min, Kyoung-Wook; and Kim, Ju Wan 08583365 Cl. 701-426.
Jeong, Se-Yoon; Choi, Hae-Chul; Seo, Jeong-Il; Beack, Seung-Kwon; Jang, In-Seon; Kim, Jae-Gon; Moon, Kyung-Ae; Jang, Dae-Young; Hong, Jin-Woo; Kim, Jin-Woong; Ahn, Chang-Beom; Oh, Seoung-Jun; Sim, Dong-Gyu; Park, Ho-Chong; Lee, Yung-Lyul; and Jeon, Su-Yeol 08582657 Cl. 375-240.2.
Kim, Hyuk; Jeon, In San; Kim, Seong Min; and Koo, Bon Tae 08583975 Cl. 714-748.
Kim, Won Young; Choi, Won Hyuk; Hur, Sung Jin; and Choi, Wan 08583816 Cl. 709-231.
Kim, Yun-Joo; Lee, Jae-Seung; and Lee, Sok-Kyu 08582489 Cl. 370-312.
Koo, Han-seung; Kwon, Eun-jung; Kim, Soon-choul; Kim, Hee-jeong; Jeong, Young-ho; Kwon, O-hyung; and Lee, Soo-in 08583930 Cl. 713-171.
Lee, Bong-Ho; Lee, Hyun; Lee, Gwang-Soon; Lee, Yong-Hoon; Hur, Namho; Jung, Kwanghee; and Lee, Soo-In 08584190 Cl. 725-118.
Lee, Il-Gu; Choi, Eun-Young; and Lee, Sok-Kyu 08582418 Cl. 370-204.
Moon, Jung Hwan; Kim, Won Ho; and Sohn, Ki Wook 08584101 Cl. 717-133.
Oh, Jong Ee; Cheong, Min Ho; and Lee, Sok Kyu 08582686 Cl. 375-295.
Park, Jonghyurk; and Kang, Seung Youl 08581235 Cl. 257-29.
Park, Manho 08582776 Cl. 380-277.
Park, Soon-gi; Shin, Yeon-seung; Kim, Hyung-sub; Kim, Yeong-jin; Hwang, In-tae; Yoon, Gil-sang; and Lee, Jeong-hwan 08582513 Cl. 370-329.
Park, Sung-Ik; Kim, Heung-Mook; Oh, Wangrok; and Kang, Donghoon 08582689 Cl. 375-301.
Park, Yun Kyung; and Lee, Jeun Woo 08583150 Cl. 455-466.
Seo, Bangwon; Ko, Young Jo; and Ahn, Jae Young 08582678 Cl. 375-267.
Shin, Sung Moon; Kim, Min Taig; Kim, Yeong Jin; and Kim, Dae Sik 08583125 Cl. 455-445.
Son, Jeong Ho 08581689 Cl. 340-4.2.
Elefant, Dan: See--
Dillon, Harrison F.; Elefant, Dan; Day, Anthony G.; Franklin, Scott; and Wittenberg, Jon 08580540 Cl. 435-134.
Element ID, Inc.: See--
Romaine, John E.; and Martin, David L 08581722 Cl. 340-539.13.
Elenbaas, Jacco: See--
Duis, Jeroen Antonius Maria; Rietveld, Jan Willem; and Elenbaas, Jacco 08582945 Cl. 385-137.
Elfner, Axel E.; to International Business Machines Corporation Facilitating the sending of mail from a restricted communications network 08583739 Cl. 709-206.
Elgersma, Michael R.: See--
Hartman, Randolph G.; and Elgersma, Michael R. 08582086 Cl. 356-5.01.
Elhard, Joel D.: See--
Heintz, Amy M.; Christiaen, Anne-Claire; Vijayendran, Bhima Rao; Elhard, Joel D.; Lalgudi, Ramanathan S.; Robbins, Wayne B.; Gupta, Abhishek; and Cafmeyer, Jeffrey 08581158 Cl. 219-553.
Eli Lilly and Company: See--
Allen, John Gordon; Briner, Karin; Galka, Christopher Stanley; Martinez-Grau, Maria Angeles; Reinhard, Matthew Robert; Rodriguez, Michael John; Rothhaar, Roger Ryan; Tidwell, Michael Wade; Victor, Frantz; Zhang, Deyi; Boyd, Steven Armen; Deo, Arundhati S.; Lee, Wai-Man; Siedem, Christopher Stephen; and Singh, Ajay 08580780 Cl. 514-217.01.
Eliasson, Daniel: See--
Dahlén, Erik; and Eliasson, Daniel 08578551 Cl. 15-316.1.
Eliaz, Amir; to MagnaCom Ltd. Low-complexity, highly-spectrally-efficient communications 08582637 Cl. 375-233.
Elite Semiconductor Memory Technology Inc.: See--
Chen, Chung-Zen 08581560 Cl. 323-266.
Elizalde, Oihana; Lucas, Frederic; Steinbrecher, Angelika Maria; and Tuchbreiter, Lydie, to BASF SE High-functionality polyisocyanates containing urethane groups 08580887 Cl. 524-589.
Elkady, Osama; and Ashitani, Tomoji, to Oracle International Corporation Generating merged documents 08582164 Cl. 358-1.18.
Elkasevic, Suad; and Penuel, Michael, to BSH Home Appliances Corporation Exhaust baffle for kitchen appliance 08578924 Cl. 126-21R.
Elkem Solar AS: See--
Friestad, Kenneth 08580036 Cl. 117-206.
Ellery, Lucinda; to Lucinda Ellery, Inc. Method for fabricating hair extensions 08578946 Cl. 132-201.
Ellington, Bryan M.; Lhota, Colleen D.; Loewengruber, Joseph; and Statham, Perry L., to International Business Machines Corporation Multi-scenerio software deployment 08584119 Cl. 717-177.
Elliott, Robert Bartlett; Garkavenko, Olga; Vasconcellos, Alfred; Emerich, Dwaine; and Thanos, Chris, to Fac8Cell Pty Limited Culture and use of cells that secrete liver secretory factors 08580248 Cl. 424-93.7.
Ellis, Brian: See--
Bewlay, Bernard Patrick; Weimer, Michael; McKiever, Joan; and Ellis, Brian 08579013 Cl. 164-529.
Ellis, Charles D.: See--
Rae, Chris L.; Ellis, Charles D.; and Duzak, Jeffrey J. 08584004 Cl. 715-219.
Ellis, Charmine Dental rack and dispenser 08579163 Cl. 222-192.
Ellis, Jeffrey T.: See--
Webler, William E.; Breeding, James D.; Bisson, Brad D.; Mourtada, Firas; Hyde, Gregory M.; Szobota, Stephanie A.; Asongwe, Gabriel; and Ellis, Jeffrey T. 08579967 Cl. 623-2.36.
Ellis, Michael; and Schwartz, Caron, to adidas AG Performance monitoring apparatuses, methods, and computer program products 08579767 Cl. 482-8.
Ellis, Michael D.: See--
Thomas, William L.; Ellis, Michael D.; Easterbrook, Kevin B.; Reichardt, M. Scott; and Knee, Robert A. 08584184 Cl. 725-91.
Ellis, Michael D.; Thomas, William L.; Hassell, Joel G.; Lemmons, Thomas R.; Berezowski, David M.; Knee, Robert A.; and McCoy, Robert H., to United Video Properties, Inc. Interactive television program guide with remote access 08584172 Cl. 725-53.
Ellis-Monaghan, John Joseph: See--
Anderson, Brent A.; Bryant, Andres; Clark, Jr., William F.; Ellis-Monaghan, John Joseph; and Nowak, Edward J. 08580601 Cl. 438-69.
Ellis, Samuel A.; and Hingorani, Kishan G., to Scientific Plastic Products, Inc. Cap with filter and transfer apparatus 08580560 Cl. 435-297.1.
Ellsworth, Jr., Michael J.: See--
Campbell, Levi A.; Chu, Richard C.; Ellsworth, Jr., Michael J.; Iyengar, Madhusudan K.; and Simons, Robert E. 08583290 Cl. 700-282.
Ellsworth, Paul D.: See--
Zaleski, Edmund Joseph; and Ellsworth, Paul D. 08578713 Cl. 60-626.
Ellsworth, Pual P.: See--
Suciu, Rebecca C.; Burrous, Thomas P.; Ellsworth, Pual P.; Stenfors, Alan L.; and Rose, Sidney 08578641 Cl. 40-658.
Elmo Company, Limited: See--
Suda, Yasushi 08582920 Cl. 382-284.
Toguchi, Masaaki; and Horike, Tetsuya 08582964 Cl. 396-77.
Elmore, Jim D.; Corley, Larry Steven; and Hite, Jerry R., to Momentive Specialty Chemicals Inc. Epoxy systems and amine polymer systems and methods for making the same 08580871 Cl. 523-414.
Elmore, Steven W.: See--
Doherty, George A.; Elmore, Steven W.; Hasvold, Lisa A.; Souers, Andrew J.; Tao, Zhi-Fu; Wang, Gary T.; Wang, Le; Mantei, Robert; and Hansen, Todd M. 08580794 Cl. 514-252.18.
Elonsson, Martin: See--
Gustafsson, Trygve; Elonsson, Martin; and Lönkvist, Torbjörn 08579173 Cl. 227-8.
Elpida Memory, Inc.: See--
Hasegawa, Yu; Katagiri, Mitsuaki; Isa, Satoshi; Iwakura, Ken; and Sasaki, Dai 08581417 Cl. 257-777.
Isogai, Satoru; and Kumauchi, Takahiro 08581315 Cl. 257-296.
Koshizuka, Atsuo 08582337 Cl. 365-49.1.
Miyahara, Jiro; and Wu, Nan 08580649 Cl. 438-424.
Nishio, Yoji 08581649 Cl. 327-170.
Sako, Nobuyuki 08580681 Cl. 438-666.
Shibata, Kayoko; Miwa, Hitoshi; and Inoue, Yoshihiko 08584061 Cl. 716-100.
Teramoto, Yuki; and Haraguchi, Yoshinori 08581758 Cl. 341-101.
Elrod, Scott A.: See--
Biegelsen, David K.; Buhler, Steven A.; Elrod, Scott A.; Fitch, John S.; Fork, David K.; Hadimioglu, Babur B.; and Stearns, Richard 08579414 Cl. 347-55.
Elsemore, David Allen; Flynn, Laurie A.; Geng, Jinming; and Crawford, Michael, to IDEXX Laboratories, Inc. Methods, devices, kits and compositions for detecting roundworm 08580518 Cl. 435-7.1.
Elshenawy, Zeinab: See--
Lin, Chun; Dyatkin, Alexey Borisovich; Elshenawy, Zeinab; and Yeager, Walter 08580402 Cl. 428-690.
Elter, Matthias: See--
Hasslmeyer, Erik; Elter, Matthias; Zerfass, Thorsten; and Schlarb, Timo 08582861 Cl. 382-133.
Elumenati, LLC, The: See--
Colucci, D'nardo; McConville, David M.; and Hooker, Clayton C. 08578657 Cl. 52-2.16.
Elwha LLC: See--
Chan, Alistair K.; Deane, Geoffrey F.; Fyke, Aaron; Gross, William; Hyde, Roderick A.; Jung, Edward K. Y.; Kare, Jordin T.; Myhrvold, Nathan P.; Tegreene, Clarence T.; and Wood, Jr., Lowell L. 08581446 Cl. 307-105.
Elz, Ian Gordon; to Telefonaktiebolaget L M Ericsson (publ) Identifying user role in IP multimedia subsystem 08583804 Cl. 709-227.
Elze, Olaf Dietrich; and Sterling, Shawn Finlay Basketball storage system 08579111 Cl. 206-315.9.
Elzinga, D. Blair; to Hewlett-Packard Development Company, L.P. Using an inverted index to produce an answer to a query 08583655 Cl. 707-741.
EMC Corporation: See--
Chen, Xiangping; Ruef, Richard P.; Armangau, Philippe; Owen, Karl M.; and Ku, Mark K. 08583607 Cl. 707-692.
Claudatos, Christopher Hercules; and Andruss, William Dale 08583601 Cl. 707-654.
Don, Arieh; Davidson, James L.; Veprinsky, Alexander; Yochai, Yechiel; and Riordan, Patrick Brian 08584128 Cl. 718-103.
Marshak, Marik; Martin, Owen; Veprinsky, Alex; Naamad, Amnon; Dolan, Sean C.; and Sahin, Adnan 08583838 Cl. 710-18.
Natanzon, Assaf 08583885 Cl. 711-162.
Ofer, Adi; Madnani, Kiran; and Brown, Jeffrey A. 08583861 Cl. 711-112.
Sade, Gilad; and Linnell, Thomas E. 08583865 Cl. 711-113.
EMD Millipore Corporation: See--
Proulx, Stephen; Almasian, Joseph; Renganath, Naren; Tingley, Stephen; and Morrissey, Martin 08579871 Cl. 604-249.
Emerich, Dwaine: See--
Elliott, Robert Bartlett; Garkavenko, Olga; Vasconcellos, Alfred; Emerich, Dwaine; and Thanos, Chris 08580248 Cl. 424-93.7.
Emerson, David E.; Lafreniere, Gary W.; Goergen, Michael S.; and Lando, David C., to CenturyLink Intellectual Property LLC System and method for emergency communications through a set-top box 08584189 Cl. 725-108.
Emerson Electric Co.: See--
Chesack, Gregory J. 08579217 Cl. 241-33.
Hammer, Randall E.; and Hansche, James 08579218 Cl. 241-46.013.
Emerson, Jane F.; to Regents of the University of California, The Collection tubes apparatus, systems, and methods 08580183 Cl. 264-496.
Emmert-Buck, Michael R.: See--
Shapiro, Benjamin; and Emmert-Buck, Michael R. 08579787 Cl. 600-12.
Emmons, Clifford L.: See--
Holsten, Henry E.; Viola, Frank J.; Emmons, Clifford L.; Beardsley, John W.; Heinrich, Russell; and Cullinan, Nicola 08579178 Cl. 227-176.1.
Emond, Jean-Pierre; and Pelletier, William, to Blueye, LLC Method and apparatus for wrapping a shipment 08580369 Cl. 428-131.
Empire Technology Development LLC: See--
Conte, Thomas M. 08582502 Cl. 370-328.
Eldering, Charles A. 08581873 Cl. 345-173.
Ma, Yuchen 08579543 Cl. 404-95.
Miller, Seth 08580479 Cl. 430-270.1.
Seike, Aya 08581426 Cl. 290-1R.
Sjong, Angele 08580337 Cl. 427-203.
Takano, Kosuke; Yoshida, Naofumi; and Kurabayashi, Shuichi 08583452 Cl. 705-2.
Emura, Fabian; and Torres, Rodrigo Systematic chromoendoscopy and chromocolonoscopy as a novel systematic method to examine organs with endoscopic techniques 08579800 Cl. 600-117.
EMW Co., Ltd.: See--
Ryou, Byung Hoon; Sung, Won Mo; and Ji, Jeong Keun 08581796 Cl. 343-787.
Enami, Tsugutomo: See--
Isozu, Masaaki; Enami, Tsugutomo; and Kawano, Shinichi 08584007 Cl. 715-239.
Enbuske, Henrik: See--
Moberg, Peter; Linstrom, Magnus; Englund, Eva; and Enbuske, Henrik 08582514 Cl. 370-329.
EncoreSolar, Inc.: See--
Basol, Bulent M. 08580603 Cl. 438-95.
Endert, Gerold: See--
Essler, Frank; Panzner, Steffen; and Endert, Gerold 08580297 Cl. 424-450.
Endo, Jun; Nakashima, Tetsuya; and Takenaka, Atsuyoshi, to Asahi Glass Company, Limited Glass for substrate, and glass substrate 08580411 Cl. 428-846.9.
Endo, Kyoko: See--
Iida, Koichiro; Endo, Kyoko; Li, Yanjun; Okabe, Kazuki; and Yabe, Masayoshi 08581241 Cl. 257-40.
Endo, Makoto: See--
Tanaka, Hirobumi; Endo, Makoto; Ueda, Satoko; Ueda, Daisuke; Murosawa, Shogo; Yoshida, Daisuke; Ono, Kenta; Ogasawara, Minoru; and Kikuchi, Tatsuya 08582277 Cl. 361-321.4.
Endo, Noboru: See--
Sakamoto, Kenichi; Hoshino, Kazuyoshi; Wakayama, Kojii; Tanabe, Shiro; and Endo, Noboru 08582587 Cl. 370-401.
Endo, Takaaki; and Satoh, Kiyohide, to Canon Kabushiki Kaisha Image processing apparatus, image processing method, and program 08582856 Cl. 382-131.
Endres + Hauser Conducta Gesellschaft für Mess-und Regeltechnik + Co. KG: See--
Mikkelsen, Hakon; and Bernhard, Ralf 08581194 Cl. 250-339.07.
Endress + Hauser Conducta Gesellschaft für Mess- und Regeltechnik mbH + Co., KG: See--
Eberheim, Andreas; Nagel, Thomas; Thieme, Andre; and Zeun, Hendrik 08581575 Cl. 324-204.
Pfauch, Thomas; and Wunderlich, Ingrid 08578798 Cl. 73-866.5.
Endress + Hauser Flowtec AG: See--
Hertel, Martin; and Hocker, Rainer 08578786 Cl. 73-861.22.
Pfau, Axel; Kumar, Vivek; and Badarlis, Anastasios 08583385 Cl. 702-47.
Ener1, Inc.: See--
Hartzog, Chad 08581549 Cl. 320-118.
EnerG2 Technologies, Inc.: See--
Costantino, Henry R.; Feaver, Aaron; and Scott, William D. 08580870 Cl. 523-309.
Energy Recovery, Inc.: See--
Oklejas, Robert A.; Terrasi, Kevin V.; and Oklejas, Michael P. 08579603 Cl. 417-407.
Eng, Lindsay; and Pipkin, Charlie, to BSH Home Applications Corporation Accessory for dishwasher 08579121 Cl. 211-41.9.
Engel, Brett H.: See--
Labonté, André P.; Wise, Richard S.; Li, Ying; and Engel, Brett H. 08580628 Cl. 438-197.
Engel, Klaus Jürgen; Zeitler, Guenter; Baeumer, Christian; Herrmann, Christoph; Wiegert, Jens; Proksa, Roland; Rössl, Ewald; and Steadman Booker, Roger, to Koninklijke Philips N.V. Radiation detector with multiple electrodes on a sensitive layer 08581200 Cl. 250-370.09.
Engelbart, Roger W.; Burpo, Steven J.; and Renieri, Michael P., to Boeing Company, The Controlling cutting of continuously fabricated composite parts with nondestructive evaluation 08583271 Cl. 700-110.
Engels, Michael: See--
Oberboersch, Stefan; Reich, Melanie; Schunk, Stefan; Hees, Sabine; Jostock, Ruth; Engels, Michael; Kless, Achim; Christoph, Thomas; Schiene, Klaus; Germann, Tieno; and Bijsterveld, Edward 08580965 Cl. 546-217.
Engler, Joseph J.; to Rockwell Collins, Inc. Explicit diploid evolutionary control 08583572 Cl. 706-13.
English, Paul: See--
Spurr, Charles L.; Giza, Jim; English, Paul; Hafner, Daniel S.; Patterson, Andrew; and Hafner, Steve 08583485 Cl. 705-14.43.
English, Robert M.: See--
Edwards, John K.; Lewis, Blake H.; English, Robert M.; Hamilton, Eric; and Corbett, Peter F. 08583892 Cl. 711-203.
Englund, Eva: See--
Gunnarsson, Fredrik; Bergman, Johan; and Englund, Eva 08583974 Cl. 714-748.
Moberg, Peter; Linstrom, Magnus; Englund, Eva; and Enbuske, Henrik 08582514 Cl. 370-329.
ENI S.p.A.: See--
Massetti, Felicia; D'Abbieri, Michelangelo; and Nardella, Alessandro 08580106 Cl. 208-179.
Perego, Carlo; Baldiraghi, Franco; Abdo, Suheil Fares; Marker, Terry Louise; and Sabatino, Luigina Maria Flora 08581014 Cl. 585-240.
Ennis, Damien C.: See--
Bigelow, Jr., Robert F.; Ennis, Damien C.; and Khamis, Michael P. 08579699 Cl. 463-21.
Enomoto, Hiromi; to Sharp Kabushiki Kaisha Liquid crystal display device 08582065 Cl. 349-137.
Enomoto, Katsumi; and Maeda, Yasuhiko, to FUJIFILM Corporation Liquid ejection head and image forming apparatus including liquid ejection head 08579418 Cl. 347-71.
Enomoto, Shintaro: See--
Mizuno, Yukitami; Amemiya, Isao; Hirao, Akiko; Takasu, Isao; Sugizaki, Tomoko; Amano, Akio; Shinjo, Yasushi; Sawabe, Tomoaki; and Enomoto, Shintaro 08580403 Cl. 428-690.
Enos, Emily: See--
Dixon, Eleri; Enos, Emily; and Brodmerkle, Scott 08583766 Cl. 709-219.
Enphase Energy, Inc.: See--
Rotzoll, Robert R.; Kapur, Rajan N.; and Patil, Suhas S. 08581441 Cl. 307-82.
Enpulz, L.L.C.: See--
Bennett, James D. 08583612 Cl. 707-694.
Bennett, James D. 08583621 Cl. 707-709.
Enraytek Optoelectronics Co., Ltd.: See--
Chang, Richard Rugin; and Xiao, Deyuan 08580587 Cl. 438-22.
Enright, Jeffery M: See--
Miller, Willis; Zaugg, Matthew R; Block, James; Graef, H Thomas; Ramachandran, Natarajan; Enright, Jeffery M; Douglass, Mark A; Scanlon, Michael; and Blackson, Dale H 08579192 Cl. 235-379.
Enright, Thomas E: See--
Chopra, Naveen; Enright, Thomas E; Chrétien, Michelle N; Keoshkerian, Barkev; and Vanbesien, Daryl W 08581000 Cl. 560-254.
Enriquez, John Mark: See--
Ford, Preston R.; Filipski, Paul D.; Dubois, Christian A.; Enriquez, John Mark; Russel, Robert J.; and Sorber, Kevin K. 08583544 Cl. 705-37.
Ensure Medical, Inc.: See--
Ginn, Richard S. 08579934 Cl. 606-213.
Enthermics Medical Systems, Inc.: See--
Hansen, William J.; Van Essen, Adam; and Smith, Terence T. 08581152 Cl. 219-406.
ENTrigue Surgical, Inc.: See--
Larson, Michael C. 08579179 Cl. 227-177.1.
Entropic Communications, Inc.: See--
Wu, Zong Liang; Lee, Ronald B.; and Ozturk, Yusuf 08582576 Cl. 370-392.
Entry Point, LLC: See--
Peterson, C. Robert; and Herbert, Thomas F. 08582580 Cl. 370-395.5.
Environment Recovery Equipment: See--
Hines, David 08580123 Cl. 210-744.
EnvisionIT, LLC: See--
Wood, Mark Andrew; Preston, Kevin Russell; and Weiser, Douglas 08583519 Cl. 705-34.
EOSpace, Inc.: See--
Thaniyavarn, Suwat 08582927 Cl. 385-2.
Epaud, David; and Lesbats, Fabrice, to Faurecia Sièges d'Automobile Vehicle seat 08579374 Cl. 297-334.
Epcos AG: See--
Feiertag, Gregor; Krueger, Hans; Leidl, Anton; and Stelzl, Alois 08580613 Cl. 438-109.
Leidl, Anton; Pahl, Wolfgang; and Wolff, Ulrich 08582788 Cl. 381-173.
Epistar Corporation: See--
Hsieh, Min-Hsun; Wang, Pai-Hsiang; Hsu, Ta-Cheng; and Su, Yeung-Sy 08581093 Cl. 136-256.
Epizyme, Inc.: See--
Olhava, Edward James; Chesworth, Richard; Kuntz, Kevin Wayne; Richon, Victoria M.; Pollock, Roy Macfarlane; and Daigle, Scott Richard 08580762 Cl. 514-46.
Epler, John E.: See--
Dupont, Frederic; and Epler, John E. 08581229 Cl. 257-13.
Epp, Anton: See--
Kuhl, Larry; Epp, Anton; and Bentz, Greg 08583176 Cl. 455-557.
Eppendorf AG: See--
Alexandre, Isabelle; Koehn, Heinz; Remacle, Jose; and De Roeck, Sven 08580499 Cl. 435-6.1.
Epple, Klaus: See--
Reitan, Oeyvind; and Epple, Klaus 08579858 Cl. 604-151.
Epshteyn, Lev; Lloyd, Zachary Erik; Tunali, Haluk Burcin; Belomestnykh, Olga Sergeyevna; and Saviano, Steven, to Google Inc. Javascript application programming interfaces for independently compiled javascript binaries 08584105 Cl. 717-140.
Epstein, Kenneth A.; Griffith, Richard F.; and Campbell, Alan B., to 3M Innovative Properties Company Optical film having microreplicated structures and methods 08579492 Cl. 362-626.
Equinix, Inc.: See--
Waldrop, Craig Alan; Youn, Sukwan; Patterson, Lane Gordon; and Felbinger, Kirk 08583503 Cl. 705-26.1.
Equiza, Maria Alejandra: See--
Francko, David; Wilson, Kenneth G.; Li, Qingshun Quinn; and Equiza, Maria Alejandra 08580708 Cl. 504-118.
Erceg, Vinko: See--
Fischer, Matthew James; Amini, Peiman; Erceg, Vinko; Lauer, Joseph Paul; and Kim, Joonsuk 08582485 Cl. 370-312.
Erdodi, Gabor: See--
Kennedy, Joseph P.; Erdodi, Gabor; and Kang, Jungmee 08580900 Cl. 525-453.
Eren, Rachel: See--
Dagan, Shlomo; Eren, Rachel; Misra, Hemant Kumar; Gowan, Jr., Walter G.; and O'Connor, Sandra 08580256 Cl. 424-130.1.
Erickson, Mark K.: See--
Cho, Yong K.; Erickson, Mark K.; and Zielinski, Todd M. 08579824 Cl. 600-483.
Ericson, Mårten: See--
Hannu, Hans; Ericson, Mårten; and Synnergren, Per 08582451 Cl. 370-252.
Ericsson Television Inc.: See--
Dasher, Charles; and Phillips, Chris 08584177 Cl. 725-62.
Eriksson, Anders; to Telefonaktiebolaget L M Ericsson (publ) Method and arrangement for delivering electronic state message information 08583826 Cl. 709-245.
Ermolov, Vladimir: See--
Pasanen, Pirjo; Ermolov, Vladimir; Oksanen, Markku Anttoni; Voutilainen, Martti; and Seppala, Eira 08581672 Cl. 332-115.
Erneta, Modesto: See--
Jamiolkowski, Dennis D.; Erneta, Modesto; and DiLuccio, Robert 08580307 Cl. 424-489.
Erno, Daniel: See--
Lokhandwalla, Murtuza; Haran, Kiruba Sivasubramaniam; Erno, Daniel; and Zirin, Robert 08581464 Cl. 310-156.12.
Ernst, Alexander: See--
Wallner, Herbert; Ernst, Alexander; Haug, Jens; Freyhardt, Sabine; and Woessner, Stefan 08581458 Cl. 310-68B.
Ernst, Fabian Edgar; and Varekamp, Christiaan, to Koninklijke Philipse N.V. Unit for and method of segmentation using average homogeneity 08582882 Cl. 382-173.
Ernst, Gregory R. Oil filter change method and apparatus 08578975 Cl. 141-86.
Ernst, Holger; Femmer, Uwe; Heitmann, Sonja; and Kruempelmann, Thomas, to Miele & Cie. KG Control method for a cooktop and cooktop for carrying out said method 08581159 Cl. 219-622.
Erol, Berna; Berkner, Kathrin; Hull, Jonathan J.; and Hart, Peter E., to Ricoh Co., Ltd. Methods for scanning, printing, and copying multimedia thumbnails 08584042 Cl. 715-838.
Erpenbach, Siglinde: See--
Barreleiro, Paula; Eiting, Thomas; Taden, Andreas; and Erpenbach, Siglinde 08580726 Cl. 510-330.
Ertle, Thomas D.: See--
Ma, Songtao; Toepke, Eric; Ryan, Mike R.; Jenkins, Randall W.; Ramachandran, Natarajan; Ertle, Thomas D.; Crews, Tim; Miller, Willis; Billett, Nick; Shepley, Steven; Krzic, Dave; and Cogan, Victor A. 08579191 Cl. 235-379.
Ervin, Eric N: See--
White, Henry S; White, Ryan J; and Ervin, Eric N 08581605 Cl. 324-693.
ESAB Group, Inc., The: See--
Severance, Jr., Wayne Stanley 08581139 Cl. 219-121.59.
Esaka, Naoki: See--
Tanizawa, Yoshimichi; Esaka, Naoki; and Shibata, Tsutomu 08583794 Cl. 709-225.
Esbensen, Peter K.; to Hartford Fire Insurance Company Code generation based on spreadsheet data models 08583530 Cl. 705-36R.
Escarpit, Olivier; to Airbus Operations S.A.S. Device for blind fixation 08579567 Cl. 411-43.
ESCO Corporation: See--
Ollinger, IV, Charles G; Snyder, Chris D; and Kreitzberg, John S 08578637 Cl. 37-453.
Eshedkaner, Rotem: See--
Nemet, Yaron; Eshedkaner, Rotem; and Brand, Ephraim 08579193 Cl. 235-383.
Eshita, Yoshiyuki: See--
Isobe, Tsutomu; Eshita, Yoshiyuki; Kato, Kazuhiko; Wakasa, Masanobu; Manago, Kenji; Nakanishi, Kuniyuki; and Tanji, Noriyuki 08580234 Cl. 424-57.
Esko-Graphics Imaging GmbH: See--
Sievers, Wolfgang 08578854 Cl. 101-467.
Eslambolchi, Hossein: See--
Croak, Marian; and Eslambolchi, Hossein 08582590 Cl. 370-401.
ESM Technologies, LLC: See--
DeVore, Dale Paul; and Long, Frank Daniel 08580315 Cl. 424-581.
Espasa, Cesar Fernandez: See--
Rodriguez, Jose Miguel; West, Matthew James; and Espasa, Cesar Fernandez 08581600 Cl. 324-539.
Espejel, Daniel; and Sill, Kathleen Dierdre, to Bank of America Corporation Method and apparatus for evaluating statistical significance over time 08583695 Cl. 707-798.
Esposito, Pierandrea: See--
Tonon, Giancarlo; Orsini, Gaetano; Sergi, Mauro; Schrepfer, Rodolfo; and Esposito, Pierandrea 08580733 Cl. 514-7.2.
Esseghir, Mohamed: See--
Patel, Rajen M.; Wu, Shaofu; Bernius, Mark T.; Esseghir, Mohamed; McGee, Robert L.; Mazor, Michael H.; and Naumovitz, John 08581094 Cl. 136-259.
Essigmann, Kurt; to Telefonaktiebolaget L M Ericsson (publ) Dual mode mobile terminal access to a wireless communication network 08583172 Cl. 455-552.1.
Essilor International (Compagnie Generale d'Optique): See--
Calixte, Laurent; Guilloux, Cyril; and Poulain, Isabelle 08579436 Cl. 351-159.42.
Essler, Frank; Panzner, Steffen; and Endert, Gerold, to Marina Biotech, Inc. Components for producing amphoteric liposomes 08580297 Cl. 424-450.
Essner, Jeffrey: See--
Blake, Alan; Crockett, Richard; Essner, Jeffrey; Hackett, Perry; and Nasevicius, Aidas 08581025 Cl. 800-20.
Estes, Andy: See--
Avila, J. Albert; Elbert, Lev; Estes, Andy; Famiglio, Mark; Johnson, Brian; Sackett, Jason; Saul, Russ; Worthington, Norman; Juckett, Baird; Lincoln, Rob; Ruth, Don; and Stipe, Michael 08583430 Cl. 704-235.
Estes, Michael J.: See--
Boock, Robert; Rixman, Monica A.; Zhang, Huashi; Estes, Michael J.; and Lawrence, Kristina 08583204 Cl. 600-345.
Estrada Gonzalez, Jorge Luis: See--
Lagos Lehuede, Patricio Clemente; Feuntes Fuentealba, Ricardo Armando; and Estrada Gonzalez, Jorge Luis 08580089 Cl. 204-229.7.
Estrada, Herbert: See--
Brown, Gregor J.; Augenstein, Donald R.; and Estrada, Herbert 08578971 Cl. 138-44.
Estrate, Evan A. Paintball hopper with integrated imaging system 08578920 Cl. 124-51.1.
Esurance Insurance Services, Inc.: See--
Harris, Frederick Miles; Srinivasan, Deepak Kumar; Swift, Philip James; and Sykes, Paul David 08583320 Cl. 701-36.
ETEL S.A.: See--
Mathia, Michel; Froidevaux, Claude; and Sudan, Jacques-André 08581536 Cl. 318-560.
Etemad-Gilbertson, Bijan: See--
Winston, Jr., William M.; Wright, S. Kirk; Han, May; Breault, Lyne; Lin, Jie; Etemad-Gilbertson, Bijan; Knuehl, Christine; Gyuris, Jeno; and Horwitz, Arnold 08580930 Cl. 530-388.23.
Eternal Chemical Co., Ltd.: See--
Chen, Shinn-Horng; Chen, Ruei-Tang; and Su, Che-Wei 08580401 Cl. 428-690.
Wu, Ting-Yuang; Wang, Hsung-Hsing; and Wang, Yi-Chia 08580372 Cl. 428-156.
Ethertronics, Inc.: See--
Desclos, Laurent; Shamblin, Jeffrey; and Matsumori, Barry 08581789 Cl. 343-702.
Ethicon Endo-Surgery, Inc.: See--
Moreno, Jr., Cesar E.; Minnelli, Patrick J.; Gilker, Thomas A.; Mumaw, Daniel J.; Mollere, Rebecca J.; Tanguay, Randall; Franer, Paul T.; Duke, Daniel H.; and Bookbinder, Mark J. 08579807 Cl. 600-203.
Robertson, Galen C.; Miller, Matthew C.; and Malaviya, Prasanna 08579928 Cl. 606-169.
Smith, Kevin W.; Palmer, Matthew A.; Kline, Korey Robert; and Deville, Derek Dee 08579176 Cl. 227-175.1.
Vakharia, Omar J.; Long, Gary L.; Bally, Kurt R.; and Zwolinski, Andrew M. 08579897 Cl. 606-52.
Ethicon, Inc.: See--
Comolli, James; and Yeadon, Stephen C. 08580192 Cl. 422-22.
Hinrichs, Eric; and Maurer, Robert E. 08581143 Cl. 219-121.71.
Jamiolkowski, Dennis D.; Erneta, Modesto; and DiLuccio, Robert 08580307 Cl. 424-489.
Nering, Robert; Cohn, Simon; Cardinale, Michael; Fuchs, Richard P.; Daniel, Matthew David; Jarrett, Jeremy David; Thornton, Race Eric; and Griffin, Carl Edward 08579920 Cl. 606-143.
Priewe, Joerg 08579990 Cl. 623-23.72.
Tracey, Michael R.; and DiUbaldi, Anthony 08583256 Cl. 607-71.
Ethiraju, Rajashekaran E.: See--
Chintada, Suresh Kumar; Ethiraju, Rajashekaran E.; Maiti, Rupak K.; Pazhyannur, Rajesh; and T, Satyanarayana 08583107 Cl. 455-432.1.
Eto, Shingo: See--
Ota, Hirofumi; Miyamoto, Koichi; and Eto, Shingo 08583335 Cl. 701-58.
Ettorre, Donato: See--
Cervone, Alessio; Collotta, Ivano Salvatore; Coppo, Paolo; Ettorre, Donato; Fodrini, Maurizio; and Turolla, Maura 08583437 Cl. 704-258.
Etzioni, Zohar: See--
Meir, Gil; Etzioni, Zohar; Lifshitz, Gadi; and Kor, Liah 08583779 Cl. 709-224.
Eun, Jong-moon; and Kim, Tae-hyun, to Samsung Electronics Co., Ltd. Supply roller of developing device for image forming apparatus and method of manufacturing the same 08579775 Cl. 492-53.
Eurocopter: See--
Eglin, Paul; Queiras, Nicolas; Barraco, André; and Malburet, Francois 08583295 Cl. 701-4.
Herpin, Gilles 08579587 Cl. 416-1.
Manfredotti, Thomas; and Chemin, Jerome 08579589 Cl. 416-52.
European Aeronautic Defence and Space Company Eads France: See--
Aspas Puertolas, Jesus 08581103 Cl. 174-251.
European Community, Represented by The European Commission, The: See--
Tanev, Hristo Tanev 08583420 Cl. 704-9.
Evan, Michael J.; Levine, Jonathan D.; and Pangrazio, III, Donald M., to Xerox Corporation Automated encryption and password protection for downloaded documents 08584213 Cl. 726-5.
Evangelista, Ramon: See--
Banik, Utpal; Evangelista, Ramon; and Gan, We-Xing 08580524 Cl. 435-7.1.
Evans, D. Clayton; to Callaway Golf Company Golf club head with adjustable weighting 08579724 Cl. 473-334.
Evans, Gregory M.: See--
Issa, Alfredo C.; Evans, Gregory M.; and Amidon, Christopher M. 08583555 Cl. 705-50.
Evans, Harry: See--
Kennedy, Bain; Ives-Halperin, Kenneth; Yang, James; Evans, Harry; and Abrams, Michael David 08584225 Cl. 726-10.
Evans, Paul: See--
Reardon, John P.; Paskach, Thomas J.; and Evans, Paul 08580019 Cl. 96-150.
Evans, Robert E.; Hartman, Anthony L.; Suchter, Richard A.; and Lefebvre, Gilles, to Sakura Finetek U.S.A., Inc. Traceability for automated staining system 08580568 Cl. 436-50.
Evans, Scott: See--
Zadno-Azizi, Gholam-Reza; Evans, Scott; Vargas, Luis; and Portney, Valdemar 08579970 Cl. 623-6.13.
EvapTech, Inc.: See--
Abeln, Travis W.; and Muder, Mark A. 08578680 Cl. 52-745.2.
Eveland, Renee A.: See--
Gieselman, Matthew D.; Pudelski, John K.; Eveland, Renee A.; and Preston, Adam J. 08581006 Cl. 564-434.
Everett, Philip A: See--
Croot, Christopher M; Linney, Trevor P; Everett, Philip A; Cook, John W; and Pickering, Ashley 08582460 Cl. 370-252.
Everez Systems Limited: See--
O'Shaughnessy, Gerald E.; Spirin, Vladimir; Ivlev, Alexei; Karash, Oskar; and Medvedev, Denis 08584022 Cl. 715-752.
Evergrand Holdings Limited: See--
Shen, Yu-Nung 08581490 Cl. 313-506.
Evers, Andreas: See--
Kallus, Christopher; Broenstrup, Mark; Evers, Andreas; Globisch, Anja; Schreuder, Herman; and Wagner, Michael 08580777 Cl. 514-183.
Eves, Matthew: See--
Davidson, Aaron Samuel; Hitchcock, Robin Garth; Eves, Matthew; Worboys, David John; and Lynch, Susan Robyn 08578935 Cl. 128-206.24.
Evonik Degussa GmbH: See--
Dowe, Andreas; Goering, Rainer; Bollmann, Sonja; and Baumann, Franz-Erich 08580899 Cl. 525-433.
Frank, Markus; Loeker, Frank; Paepen, Dirk; and Smith, Scott 08580953 Cl. 536-123.1.
Steiger, Juergen; Merkulov, Alexey; Fruehling, Dennis; Hoppe, Arne; and Brausch, Nicole 08580989 Cl. 556-1.
Evonik Goldschmidt GmbH: See--
Haensel, Rene; Giessler-Blank, Sabine; and Kempka, Stefan 08580225 Cl. 423-567.1.
Evonik Oxeno GmbH: See--
Kaizik, Alfred; Fridag, Dirk; Lueken, Hans-Gerd; and Bueschken, Wilfried 08581008 Cl. 568-461.
Evotec AG: See--
Hinnah, Silke; Lambrü, Dagmar; Dröge, Sonja; Jäger, Stefan; Gall, Karsten; Stürmer, Werner; and Schäfer, Michaela 08580577 Cl. 436-501.
Ewington, Craig Leslie: See--
McCurdy, Daniel; McGraw, IV, William Harrison; and Ewington, Craig Leslie 08584113 Cl. 717-170.
Exelis Inc.: See--
Nish, Randall William; and Vogel, Jason Jon 08579023 Cl. 166-134.
Experian Information Solutions, Inc.: See--
Achanta, Venkat R. 08583593 Cl. 707-602.
ExploraMed NC6, LLC: See--
Makower, Joshua; Goldfarb, Eric; and Ferdinand, Arthur 08579837 Cl. 601-6.
Extreme Networks, Inc.: See--
Lu, Zihong; Meier, Richard A.; Shah, Sunil P.; and Nagarajan, Raj 08583833 Cl. 709-251.
ExxonMobil Chemical Patents Inc.: See--
Crowther, Donna J.; Jiang, Peijun; and Kolb, Rainer 08580902 Cl. 526-160.
Porter, John R. 08580120 Cl. 210-670.
Tsou, Andy Haishung; Soeda, Yoshihiro; Measmer, Matthew Brian; Stokes, James Peter; Kirino, Yoshiaki; and Sullivan, Arthur Joseph 08580877 Cl. 524-271.
Weber, Jörg F. W.; and Meredith, James O. 08581007 Cl. 568-402.
ExxonMobil Research and Engineering Company: See--
Minhas, Bhupender S.; and Cody, Ian A. 08580018 Cl. 96-108.
Novak, William J.; Cole, Kathryn Y.; Hanks, Patrick L.; and Hilbert, Timothy L. 08580108 Cl. 208-254R.
Eye Therapies LLC: See--
Horn, Gerald 08580787 Cl. 514-249.
Eyraud, Richard: See--
Stephanick, James; Bradford, Ethan R.; Van Meurs, Pim; Eyraud, Richard; and Longé, Michael R. 08583440 Cl. 704-270.
Ezaki, Takeshi: See--
Fukushima, Hiroto; Miura, Tomonori; Tsukanaka, Yasuhiko; and Ezaki, Takeshi 08579679 Cl. 451-56.
Ezerzer, Ran: See--
Margulies, Edwin Kenneth; Borodow, Eli Ben; Ezerzer, Ran; Aljane, Ali; Seebauer, William Scott; and Yahmadi, Imed 08583466 Cl. 705-7.26.