US 11,818,468 B2
Methods and apparatus for shear correction in image projections
David Newman, San Diego, CA (US); and Daryl Stimm, Encinitas, CA (US)
Assigned to GoPro, Inc., San Mateo, CA (US)
Filed by GoPro, Inc., San Mateo, CA (US)
Filed on Aug. 10, 2022, as Appl. No. 17/818,792.
Application 17/818,792 is a continuation of application No. 17/139,395, filed on Dec. 31, 2020, granted, now 11,470,250.
Claims priority of provisional application 62/955,950, filed on Dec. 31, 2019.
Prior Publication US 2022/0385811 A1, Dec. 1, 2022
Int. Cl. H04N 23/698 (2023.01); H04N 23/90 (2023.01); G06T 3/40 (2006.01); H04N 5/262 (2006.01)
CPC H04N 23/698 (2023.01) [G06T 3/4038 (2013.01); H04N 5/2628 (2013.01); H04N 23/90 (2023.01)] 20 Claims
OG exemplary drawing
 
1. A method for correcting shear in image projections, comprising:
performing a first one-dimensional stitch in a first dimension on a first image and a second image to create a partially stitched image, the first one-dimensional stitch comprising searching for a first matching set of pixels in the second image to a first set of pixels along the first dimension of the first image to determine a first stitch line and combining the first image and the second image along the first stitch line such that pixels of the first image are only stretched along the first dimension to align with the first matching set of pixels of the second image to create the partially stitched image;
determining a critical location within the partially stitched image, where the critical location comprises an area of the partially stitched image that has objects within a threshold capture distance; and
performing a second one-dimensional stitch on the partially stitched image in a second dimension orthogonal to the first dimension based on the critical location, the second one-dimensional stitch comprising searching for a second matching set of pixels in the second image to a third set of pixels along the second dimension of the first image to determine a second stitch line and combining the first image and the second image along the second stitch line such that pixels of the first image are only stretched along the second dimension to align the second matching set of pixels of the second image.