US 11,818,333 B2
Imaging device, imaging system, and failure detection method
Keita Sasaki, Kanagawa (JP); Naoki Kawazu, Kanagawa (JP); Masaki Murozuka, Kanagawa (JP); and Yuichi Motohashi, Kanagawa (JP)
Assigned to Sony Semiconductor Solutions Corporation, Kanagawa (JP)
Appl. No. 17/417,216
Filed by Sony Semiconductor Solutions Corporation, Kanagawa (JP)
PCT Filed Dec. 19, 2019, PCT No. PCT/JP2019/049817
§ 371(c)(1), (2) Date Jun. 22, 2021,
PCT Pub. No. WO2020/149094, PCT Pub. Date Jul. 23, 2020.
Claims priority of application No. 2019-006177 (JP), filed on Jan. 17, 2019.
Prior Publication US 2022/0060682 A1, Feb. 24, 2022
Int. Cl. H04N 17/00 (2006.01); H04N 7/18 (2006.01); H04N 25/75 (2023.01); H04N 25/702 (2023.01); H04N 25/71 (2023.01)
CPC H04N 17/002 (2013.01) [H04N 7/183 (2013.01); H04N 25/702 (2023.01); H04N 25/745 (2023.01); H04N 25/75 (2023.01)] 13 Claims
OG exemplary drawing
 
1. An imaging device comprising:
a pixel array including a plurality of pixels;
a scanning control section that controls scanning of the plurality of pixels;
a readout control section that controls reading of the plurality of pixels;
a first waveform generation part that generates a plurality of control signals for controlling of at least one of the scanning control section or the readout control section;
a second waveform generation part that generates a plurality of reference signals; and
a failure detection section that detects a failure of the first waveform generation part or the second waveform generation part on a basis of comparison between the plurality of control signals and the plurality of reference signals, wherein
the first waveform generation part includes a first register section that outputs a plurality of set values, and a first timing generation section that outputs the plurality of control signals on a basis of the plurality of set values, and
the second waveform generation part includes a second timing generation section that outputs the plurality of reference signals on a basis of the plurality of set values.