US 11,816,873 B2
Image analysis device, image analysis method, and program
Yuji Masuda, Tokyo (JP); Megumi Sekino, Tokyo (JP); Hironobu Yoshikawa, Tokyo (JP); David Christopher Berends, Princeton, NJ (US); Michael Anthony Isnardi, Princeton, NJ (US); and Yuzheng Zhang, Princeton, NJ (US)
Assigned to Shiseido Company, Ltd., Tokyo (JP)
Appl. No. 17/273,960
Filed by SHISEIDO COMPANY, LTD., Tokyo (JP)
PCT Filed Sep. 4, 2019, PCT No. PCT/JP2019/034708
§ 371(c)(1), (2) Date Mar. 5, 2021,
PCT Pub. No. WO2020/050296, PCT Pub. Date Mar. 12, 2020.
Claims priority of provisional application 62/727,994, filed on Sep. 6, 2018.
Prior Publication US 2021/0334575 A1, Oct. 28, 2021
Int. Cl. G06V 10/141 (2022.01); G06T 7/90 (2017.01); G06V 10/56 (2022.01)
CPC G06V 10/141 (2022.01) [G06T 7/90 (2017.01); G06V 10/56 (2022.01); G06T 2207/30196 (2013.01)] 11 Claims
OG exemplary drawing
 
1. An image analysis device comprising:
an image capturing unit that captures a subject;
a light emitting unit that emits light to the subject;
a sensor unit that senses an inclination of the image capturing unit relative to the subject;
a control unit that causes the image capturing unit to capture an image of the subject while controlling light emission of the light emitting unit; and
a determination unit that, based on a positional relationship of the image capturing unit and the light emitting unit and the inclination, determines a measurement region spaced apart by a predetermined distance from a reflection region corresponding to a position in the image where a light from the light emitting unit regularly reflects at the subject.