US 11,816,766 B2
Super-resolution X-ray shadowgraph system and imaging method therefor
LeiFeng Cao, Shenzhen (CN); Jian Yu, Shenzhen (CN); Xue Wang, Shenzhen (CN); Jialing Deng, Shenzhen (CN); Dikai Li, Shenzhen (CN); Yanmeng Dai, Shenzhen (CN); Chunhui Zhang, Shenzhen (CN); Cangtao Zhou, Shenzhen (CN); and Shuangchen Ruan, Shenzhen (CN)
Assigned to SHENZHEN TECHNOLOGY UNIVERSITY, Shenzhen (CN)
Filed by Shenzhen Technology University, Shenzhen (CN)
Filed on Mar. 20, 2023, as Appl. No. 18/123,387.
Claims priority of application No. 202210306053.0 (CN), filed on Mar. 25, 2022.
Prior Publication US 2023/0306658 A1, Sep. 28, 2023
Int. Cl. G06T 11/00 (2006.01); G01N 23/04 (2018.01); G01N 23/083 (2018.01)
CPC G06T 11/006 (2013.01) [G01N 23/04 (2013.01); G01N 23/083 (2013.01); G01N 2223/401 (2013.01); G06T 2210/41 (2013.01)] 6 Claims
OG exemplary drawing
 
1. A super-resolution X-ray shadowgraph system, wherein the super-resolution X-ray shadowgraph system comprises: an X-ray source, a sample stage, an X-ray detector and an image reconstruction device, sequentially arranged in that order; and
geometric centers of the X-ray source, the sample stage, and the X-ray detector are collinear; the geometric center of the sample stage is provided with a through hole for placing a testing sample, the X-ray source is configured to provide X-rays, and the X-rays are capable of penetrating the sample stage to form a first image on the X-ray detector, the image reconstruction device is configured to obtain the first image and to perform an image reconstruction on the first image to obtain a second image; and a gap is defined between the through hole and the testing sample.