US 11,815,997 B2
Memory controllers, memory systems, and memory modules
Suhun Lim, Suwon-si (KR); Kijun Lee, Seoul (KR); Myungkyu Lee, Seoul (KR); Eunchul Kwon, Suwon-si (KR); Hoyoun Kim, Seoul (KR); and Jongmin Lee, Hanam-si (KR)
Assigned to SAMSUNG ELECTRONICS CO., LTD., Suwon-si (KR)
Filed by SAMSUNG ELECTRONICS CO., LTD., Suwon-si (KR)
Filed on Jul. 26, 2022, as Appl. No. 17/814,964.
Claims priority of application No. 10-2021-0153988 (KR), filed on Nov. 10, 2021; and application No. 10-2022-0003176 (KR), filed on Jan. 10, 2022.
Prior Publication US 2023/0147227 A1, May 11, 2023
Int. Cl. H03M 13/00 (2006.01); G06F 11/10 (2006.01); G06F 11/07 (2006.01); G06F 17/16 (2006.01); H03M 13/15 (2006.01)
CPC G06F 11/1068 (2013.01) [G06F 11/076 (2013.01); G06F 11/0772 (2013.01); G06F 17/16 (2013.01); H03M 13/1575 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A memory controller configured to control a memory module including a plurality of data chips, a first parity chip and a second parity chip, the memory controller comprising:
an error correction code (ECC) engine;
a central processing unit (CPU) configured to control the ECC engine; and
an error managing circuit,
wherein the ECC engine is configured to:
during a read operation, perform an ECC decoding on a read codeword set from the memory module to generate a first syndrome and a second syndrome associated with a correctable error in a user data set included in the read codeword set;
correct the correctable error based on the first syndrome and the second syndrome; and
provide the second syndrome to the error managing circuit, and
wherein the error managing circuit is configured to:
accumulate second syndromes associated with a plurality of correctable errors and obtained through a plurality of read operations as a plurality of second syndromes;
store the plurality of second syndromes;
compare the plurality of second syndromes with an error pattern set; and
predict an occurrence of an uncorrectable error associated with the correctable error in a memory region of the plurality of data chips based on the comparison.