US 11,815,673 B2
Method and system for mapping objects on unknown specimens
Matthew C. Putman, Brooklyn, NY (US); John B. Putman, Celebration, FL (US); John Cruickshank, Brooklyn, NY (US); Julie Orlando, Akron, OH (US); Adele Frankel, New York, NY (US); and Brandon Scott, New York, NY (US)
Assigned to Nanotronics Imaging, Inc., Cuyahoga Falls, OH (US)
Filed by Nanotronics Imaging, Inc., Cuyahoga Falls, OH (US)
Filed on May 16, 2022, as Appl. No. 17/663,599.
Application 17/663,599 is a continuation of application No. 17/066,012, filed on Oct. 8, 2020, granted, now 11,333,876.
Application 17/066,012 is a continuation of application No. 16/583,925, filed on Sep. 26, 2019, granted, now 10,809,516, issued on Oct. 20, 2020.
Application 16/583,925 is a continuation of application No. 16/164,990, filed on Oct. 19, 2018, granted, now 10,481,379, issued on Nov. 19, 2019.
Prior Publication US 2022/0276481 A1, Sep. 1, 2022
This patent is subject to a terminal disclaimer.
Int. Cl. G02B 21/36 (2006.01); G02B 21/00 (2006.01); G06T 7/73 (2017.01); G06V 20/69 (2022.01)
CPC G02B 21/365 (2013.01) [G02B 21/0032 (2013.01); G02B 21/361 (2013.01); G06T 7/73 (2017.01); G06V 20/69 (2022.01)] 17 Claims
OG exemplary drawing
 
1. A method comprising:
receiving, by a computing system, a scan of a substrate using a microscope inspection system, the substrate comprising one or more objects;
for each object on the substrate, classifying, by an artificial intelligence model of the computing system, a type corresponding to the object;
for each object on the substrate, identifying, by the computing system, an initial object position on the substrate; and
predicting, by the artificial intelligence model, a future position of each object on the substrate and an anticipated amount of deformity for each object at the future position based on the type of object and the initial object position.